IDT71V433S12PFI

32K x 32 3.3V Synchronous SRAM Flow-Through Outputs Features 32K x 32 memory configuration Supports high performance system speed: Commercial and Industrial: — 11 11ns Clock-to-Data Access (50MHz) — 12 12ns Clock-to-Data Access (50MHz) LBO input selects interleaved or linear burst mode Self-timed write cycle with global write control (GW), byte write enable (BWE), and byte writes (BWx) Power down controlled by ZZ input Single 3.3V power supply (+10/-5%) Packaged in a JEDEC Standard 100-pin rectangular plastic thin quad flatpack (TQFP). IDT71V433 x x x x x x x Description The IDT71V433 is a 3.3V high-speed 1,048,576-bit SRAM organized as 32K x 32 with full support of various processor interfaces including the Pentium™ and PowerPC™. The flow-through burst architecture provides cost-effective 2-1-1-1 performance for processors up to 50 MHz. The IDT71V433 SRAM contains write, data-input, address and control registers. There are no registers in the data output path (flowthrough architecture). Internal logic allows the SRAM to generate a self-timed write based upon a decision which can be left until the extreme end of the write cycle. The burst mode feature offers the highest level of performance to the system designer, as the IDT71V433 can provide four cycles of data for a single address presented to the SRAM. An internal burst address counter accepts the first cycle address from the processor, initiating the access sequence. The first cycle of output data will flow-through from the array after a clock-to-data access time delay from the rising clock edge of the same cycle. If burst mode operation is selected (ADV=LOW), the subsequent three cycles of output data will be available to the user on the next three rising clock edges. The order of these three addresses will be defined by the internal burst counter and the LBO input pin. The IDT71V433 SRAM utilizes IDT's high-performance 3.3V CMOS process, and is packaged in a JEDEC Standard 14mm x 20mm 100-pin thin plastic quad flatpack (TQFP). Pin Description A0–A14 CE CS0, CS1 OE GW BWE BW1–BW4 CLK ADV ADSC ADSP LBO ZZ I/O0–I/O31 VDD, VDDQ VSS, VSSQ Address Inputs Chip Enable Chips Selects Output Enable Global Write Enable Byte Write Enable Individual Byte Write Selects Clock Input Burst Address Advance Address Status (Cache Controller) Address Status (Processor) Linear / Interleaved Burst Order Sleep Mode Data Input/Output Co re and I/O Power Supply (3.3V) Array Ground, I/O Ground Input Input Input Input Input Input Input Input Input Input Input Input Input I/O Power Power Synchronous Synchronous Synchronous Asynchronous Synchronous Synchronous Synchronous N/A Synchronous Synchronous Synchronous DC Asynchronous Synchronous N/A N/A 3729 tbl 01 Pentium is a trademark of Intel Corp. PowerPC is a trademark of International Business Machines, Inc. AUGUST 2001 1 DSC-3729/04 ©2000 Integrated Device Technology, Inc. IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Pin Definitions (1) Symbol A0–A14 ADSC Pin Function Address Inputs Address Status (Cache Controller) Address Status (Processor) Burst Address Advance I/O I I Active N/A LOW Description Synchronous Address inputs. The address register is triggered by a combination of the rising edge of CLK and ADSC Low or ADSP Low and C E Low. Synchronous Address Status from Cache Controller. ADSC is an active LOW input that is used to load the address registers with new addresses. ADSC is NOT gated by C E. Synchronous Address Status from Processor. ADSP is an active LOW input that is used to load the address registers with new addresses. ADSP is gated by C E. Sync hrono us Ad dress Adv ance. ADV is an ac tive LOW input that is used to advance the internal burst counter, controlling burst access after the initial address is loaded. When this input is HIGH the burst counter is not incremented; that is, there is no address advance. Synchronous b yte write enable gates the byte write inputs BW1–BW4. If BWE is LOW at the rising edge of CLK then BWX inputs are passed to the next stage in the circuit. A byte write can still be blocked if ADSP is LOW at the rising edge of CLK. If ADSP is HIGH and BWX is LOW at the rising edge of CLK then data will be written to the SRAM. If BWE is HIGH then the byte write inputs are blocked and only GW can initiate a write cycle. Synchronous byte write enables. BW1 controls I/O(7:0), BW2 controls I/O(15:8), etc. Any active byte write causes all outputs to be disabled. ADSP LOW disables all byte writes. BW1–BW4 must meet specified setup and hold times with respect to CLK. Synchronous chip enable. C E is used with CS0 and C S1 to enable the IDT71V433. CE also gates ADSP. This is the clock input. All timing references for the device are made with respect to this input. Synchronous active HIGH chip select. CS 0 is used with C E and C S1 to enable the chip. Synchro nous active LOW chip select. C S1 is used with C E and CS0 to enable the chip. Synchronous global write enable. This input will write all four 8-bit data bytes when LOW on the rising edge of CLK. GW supercedes individual byte write enables. Synchronous data input/output (I/O) pins. Only the data input path is registered and triggered by the rising edge of CLK. Outputs are Flow-Through. When LBO is HIGH the Interleaved Order (Intel) burst sequence is selected. When LBO is LOW the Linear (PowerPC) burst sequence is selected. LBO has an internal pull-up resistor. Asynchronous output e nable. Whe n O E is HIGH the I/O pins are in a highimpedence state. When OE is LOW the data output drivers are enabled if the chip is also selected. 3.3V core power supply inputs. 3.3V I/O power supply inputs. Core ground pins. I/O ground pins. NC pins are not electrically connected to the chip. Asynchronous sleep mode input. ZZ HIGH will gate the CLK internally and power down the IDT71V433 to its lowe st power consumption level. Data retention is guaranteed in Sleep Mode. ZZ has an internal pull-down resistor. 3729 tbl 02 ADSP ADV I I LOW LOW BWE Byte Write Enable I LOW BW1–BW4 Individual Byte Write Enables I LOW CE CLK CS0 CS1 GW I/O0–I/O31 LBO Chip Enable Clock Chip Select 0 Chip Select 1 Global Write Enable Data Input/Output Linear Burst I I I I I I/O I LOW N/A HIGH LOW LOW N/A LOW OE Output Enable I LOW VDD VDDQ VSS VSSQ NC ZZ Power Supply Power Supply Ground Ground No Connect Sleep Mode N/A N/A N/A N/A N/A I N/A N/A N/A N/A N/A HIGH NOTE: 1. All synchronous inputs must meet specified setup and hold times with respect to CLK. 2 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Functional Block Diagram LBO ADV CE Burst Sequence INTERNAL ADDRESS CLK ADSC ADSP CLK EN Binary Counter CLR 2 Burst Logic 15 A0* A1* Q0 Q1 32K x 32 BIT MEMORY ARRAY 2 15 A0–A14 GW BWE BW1 ADDRESS REGISTER Byte 1 Write Register A0, A1 A2–A14 32 32 Byte 1 Write Driver Byte 2 Write Register 8 Byte 2 Write Driver BW2 Byte 3 Write Register 8 Byte 3 Write Driver BW3 Byte 4 Write Register 8 Byte 4 Write Driver BW4 8 CE CS0 CS1 D Q Enable Register DATA INPUT REGISTER CLK EN ZZ OE 32 Powerdown OE OUTPUT BUFFER . I/O0–I/O31 3729 drw 01 3 6.42 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Absolute Maximum DC Ratings(1) Symbol VTERM (2) VTERM TA TBIAS TSTG PT IOUT (3) Rating Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Operating Temperature Temperature Under Bias Storage Temperature Power Dissipation DC Output Current Value –0.5 to +4.6 –0.5 to VDD+0.5 0 to +70 –55 to +125 –55 to +125 1.2 50 Unit V V o o Recommended Operating Temperature and Supply Voltage Grade Commercial Industrial Temperature 0°C to +70°C –40°C to +85°C VSS 0V 0V VDD VDDQ 3.3V+10/-5% 3.3V+10/-5% 3.3V+10/-5% 3.3V+10/-5% 3729 tbl 03 C C C o W mA 3729 tbl 05 Recommended DC Operating Conditions Symbol VDD VDDQ Parameter Core Supply Voltage I/O Supply Voltage Min. 3.135 3.135 0 2.0 (1) (3) Typ. 3.3 3.3 0 ____ ____ Max. 3.63 3.63 0 VDDQ+0.3 0.8 (2) Unit V V V V V 3729 tbl 04 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. VDD, VDDQ and input terminals only. 3. I/O terminals. VSS, VSSQ Ground VIH VIL Input High Voltage Input Low Voltage –0.5 NOTES: 1. VIH and VIL as indicated is for both input and I/O pins. 2. VIH (max) = 6.0V for pulse width less than tCYC/2, once per cycle. 3. VIL (min) = –1.0V for pulse width less than tCYC/2, once per cycle. Capacitance Symbol CIN CI/O (TA = +25°C, f = 1.0MHz, TQFP package) Parameter(1) Input Capacitance I/O Capacitance Conditions VIN = 3dV VOUT = 3dV Max. 4 8 Unit pF pF 3729 tbl 06 NOTE: 1. This parameter is guaranteed by device characterization, but not production tested. 4 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Pin Configuration A6 A7 CE CS0 BW4 BW3 BW2 BW1 CS1 VDD VSS CLK GW BWE OE ADSC ADSP ADV A8 A9 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 NC I/O16 I/O17 VDDQ VSSQ I/O18 I/O19 I/O20 I/O21 VSSQ VDDQ I/O22 I/O23 VSS(1) VDD NC VSS I/O24 I/O25 VDDQ VSSQ I/O26 I/O27 I/O28 I/O29 VSSQ VDDQ I/O30 I/O31 NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 80 79 78 77 76 75 74 73 72 71 70 69 68 67 PK100-1 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 NC I/O15 I/O14 VDDQ VSSQ I/O13 I/O12 I/O11 I/O10 VSSQ VDDQ I/O9 I/O8 VSS NC VDD ZZ(2) I/O7 I/O6 VDDQ VSSQ I/O5 I/O4 I/O3 I/O2 VSSQ VDDQ I/O1 I/O0 NC LBO A5 A4 A3 A2 A1 A0 NC NC VSS VDD NC NC A10 A11 A12 A13 A14 NC NC 3729 drw 02 . Top View TQFP NOTES 1. Pin 14 does not have to be directly connected to VSS as long as the input voltage is ≤ VIL. 2. Pin 64 can be left unconnected and the device will always remain in active mode. 5 6.42 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Synchronous Truth Table(1, 2) Operation Deselected Cycle, Power Down Deselected Cycle, Power Down Deselected Cycle, Power Down Deselected Cycle, Power Down Deselected Cycle, Power Down Read Cycle, Begin Burst Read Cycle, Begin Burst Read Cycle, Begin Burst Read Cycle, Begin Burst Read Cycle, Begin Burst Write Cycle, Begin Burst Write Cycle, Begin Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Write Cycle, Continue Burst Write Cycle, Continue Burst Write Cycle, Continue Burst Write Cycle, Continue Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Write Cycle, Suspend Burst Write Cycle, Suspend Burst Write Cycle, Suspend Burst Write Cycle, Suspend Burst NOTES: 1. L = V IL, H = VIH, X = Don’t Care. 2. ZZ = LOW for this table. 3. OE is an asynchronous input. Address Used None None None None None External External External External External External External Next Next Next Next Next Next Next Next Next Next Next Next Current Current Current Current Current Current Current Current Current Current Current Current CE H L L L L L L L L L L L X X X X H H H H X X H H X X X X H H H H X X H H CS0 X X L X L H H H H H H H X X X X X X X X X X X X X X X X X X X X X X X X CS 1 X H X H X L L L L L L L X X X X X X X X X X X X X X X X X X X X X X X X ADSP X L L X X L L H H H H H H H H H X X X X H H X X H H H H X X X X H H X X ADSC L X X L L X X L L L L L H H H H H H H H H H H H H H H H H H H H H H H H ADV X X X X X X X X X X X X L L L L L L L L L L L L H H H H H H H H H H H H GW X X X X X X X H H H H L H H H H H H H H H L H L H H H H H H H H H L H L BWE X X X X X X X H L L L X H H X X H H X X L X L X H H X X H H X X L X L X BWX X X X X X X X X H H L X X X H H X X H H L X L X X X H H X X H H L X L X OE (3) X X X X X L H L L H X X L H L H L H L H X X X X L H L H L H L H X X X X CLK ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ ↑ I/O Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z DOUT Hi-Z DOUT DOUT Hi-Z DIN DIN DOUT Hi-Z DOUT Hi-Z DOUT Hi-Z DOUT Hi-Z DIN DIN DIN DIN DOUT Hi-Z DOUT Hi-Z DOUT Hi-Z DOUT Hi-Z DIN DIN DIN DIN 3729 tbl 07 6 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Synchronous Write Function Truth Table(1) Operation Read Read Write all Bytes Write all Bytes Write Byte 1 Write Byte 2 Write Byte 3 Write Byte 4 (2) (2) (2) (2) GW H H L H H H H H BWE H L X L L L L L BW1 X H X L L H H H BW2 X H X L H L H H BW3 X H X L H H L H BW4 X H X L H H H L 3729 tbl 08 NOTES: 1. L = V IL, H = VIH, X = Don’t Care. 2. Multiple bytes may be selected during the same cycle. Asynchronous Truth Table(1) Operation Read Read Write Deselected Sleep Mode OE L H X X X ZZ L L L L H I/O Status Data Out (I/O0–I/O31) High-Z High-Z — Data In (I/O0–I/O31) High-Z High-Z Power Active Active Active Standby Sleep 3729 tbl 09 NOTES: 1. L = V IL, H = VIH, X = Don’t Care. 2. Synchronous function pins must be biased appropriately to satisfy operation requirements. Interleaved Burst Sequence Table (LBO=V DD) Sequence 1 A1 First Address Second Address Third Address Fourth Address(1) 0 0 1 1 A0 0 1 0 1 Sequence 2 A1 0 0 1 1 A0 1 0 1 0 Sequence 3 A1 1 1 0 0 A0 0 1 0 1 Sequence 4 A1 1 1 0 0 A0 1 0 1 0 3729 tbl 10 NOTE: 1. Upon completion of the Burst sequence the counter wraps around to its initial state. Linear Burst Sequence Table (LBO=V SS) Sequence 1 A1 First Address Second Address Third Address Fourth Address (1) Sequence 2 A1 0 1 1 0 A0 1 0 1 0 Sequence 3 A1 1 1 0 0 A0 0 1 0 1 Sequence 4 A1 1 0 0 1 A0 1 0 1 0 3729 tbl 11 A0 0 1 0 1 0 0 1 1 NOTE: 1. Upon completion of the Burst sequence the counter wraps around to its initial state. 7 6.42 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range (VDD = 3.3V +10/-5%, Commercial and Industrial Temperature Ranges) Symbol |ILI| |ILI| |ILO| VOL VOH Parameter Input Leakage Current ZZ & LBO Input Leakage Current Output Leakage Current Output Low Voltage Output High Voltage (1) Test Conditions VDD = M ax., VIN = 0V to VDD VDD = M ax., VIN = 0V to VDD CE > VIH or OE > VIH, VOUT = 0V to VDD, VDD = M ax. IOL = 5mA, VDD = M in. IOH = –5mA, VDD = M in. Min. ___ ___ Max. 5 30 5 0.4 ___ Unit µA µA µA V V ___ ___ 2.4 3729 tbl 12 NOTE: 1. The LBO pin will be internally pulled to VDD if it is not actively driven in the application and the ZZ pin will be internally pulled to V SS if not actively driven. DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(1) (VHD = VDDQ–0.2V, VLD = 0.2V) IDT71V433S11 Symbol IDD ISB ISB1 IZZ Parameter Operating Core Power Supply Current Standby Core Power Supply Current Full Standby Core Power Supply Current Full Sleep Mode Core Power Supply Current Test Conditions Device Selected, Outputs Open, VDD = M ax., VDDQ = M ax., VIN > VIH or < VIL, f = fMAX(2) Device Deselected, Outputs Open, VDD = M ax., VDDQ = M ax., VIN > VIH or < VIL, f = fMAX(2) Device Deselected, Outputs Open, VDD = M ax., VDDQ = M ax., VIN > VHD or < VLD, f = 0(2) ZZ > VHD, VDD = M ax. Com'l. 220 45 15 15 Ind. 220 45 15 15 IDT71V433S12 Com'l. 210 40 15 15 Ind. 210 40 15 15 Unit mA mA mA mA 3729 tbl 13 NOTES: 1. All values are maximum guaranteed values. 2. At f = fMAX, inputs are cycling at the maximum frequency of read cycles of 1/tCYC while ADSC = LOW; f=0 means no input lines are changing. AC Test Loads VDDQ/2 +3.3V 50Ω 317Ω DATA OUT DATA OUT Z0 = 50Ω 3729 drw 03 351Ω 5pF* Figure 1. AC Test Load 3729 drw 04 6 5 4 3 ∆tCD (Typical, ns) 2 1 20 30 50 80 100 Capacitance (pF) 200 3729 drw 05 * Including scope and jig capacitance. Figure 2. High-Impedence Test Load (for tOHZ, tCHZ, tOLZ, and tDC1) AC Test Conditions Input Pulse Levels Input Rise/Fall Times Input Timing Reference Levels Output Timing Reference Levels AC Test Load 0 to 3.0V 2ns 1.5V 1.5V See Figures 1 and 2 3729 tbl 14 Figure 3. Lumped Capacitive Load, Typical Derating 8 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges AC Electrical Characteristics (VDD = 3.3V +10/-5%, Commercial and Industrial Temperature Ranges) 71V433S11 Symbol Clock Parameters tCYC tCH tCL (1) 71V433S12 Min. Max. Unit Parameter Min. Max. Clock Cycle Time Clock High Pulse Width Clock Low Pulse Width 20 6 6 ____ ____ ____ 20 6 6 ____ ____ ____ ns ns ns (1) Output Parameters tCD tCDC tCLZ (2) (2) Clock High to Valid Data Clock High to Data Change Clock High to Output Active Clock High to Data High-Z Output Enable Access Time Output Enable Low to Data Active Output Enable High to Data High-Z ____ 11 ____ ____ ____ 12 ____ ____ ns ns ns ns ns ns ns 3 0 3 ____ 3 0 3 ____ tCHZ tOE 6 4 ____ 6 4 ____ tOLZ (2) tOHZ (2) Setup Times tSA tSS tSD tSW tSAV tSC Hold Times tHA tHS tHD tHW tHAV tHC 0 ____ 0 ____ 6 6 Address Setup Time Address Status Setup Time Data in Setup Time Write Setup Time Address Advance Setup Time Chip Enable/Select Setup Time 2.5 2.5 2.5 2.5 2.5 2.5 ____ ____ ____ ____ ____ ____ 2.5 2.5 2.5 2.5 2.5 2.5 ____ ____ ____ ____ ____ ____ ns ns ns ns ns ns Address Hold Time Address Status Hold Time Data In Hold Time Write Hold Time Address Advance Hold Time Chip Enable/Select Hold Time 0.5 0.5 0.5 0.5 0.5 0.5 ____ ____ ____ ____ ____ ____ 0.5 0.5 0.5 0.5 0.5 0.5 ____ ____ ____ ____ ____ ____ ns ns ns ns ns ns Sleep Mode and Configuration Parameters tZZPW tZZR(3) tCFG (4) ZZ Pulse Width ZZ Recovery Time Configuration Set-up Time 100 100 80 ____ ____ ____ 100 100 80 ____ ____ ____ ns ns ns 3729 tbl 15 NOTES: 1. Measured as HIGH above 2.0V and LOW below 0.8V. 2. Transition is measured ±200mV from steady-state. 3. Device must be deselected when powered-up from sleep mode. 4. tCFG is the minimum time required to configure the device based on the LBO input. LBO is a static input and must not change during normal operation. 9 6.42 tCYC CLK tCH tCL tSS tHS ADSP (1) ADSC tHA Ax tSW tHW Ay tSA ADDRESS GW, BWE, BWx tHC tSAVtHAV tSC CE, CS1 Timing Waveform of Read Cycle(1,2) IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs (Note 3) 10 ADV inserts a wait-state ADV tOE tCD tOHZ tCDC O1(Ax) O1(Ay) O2(Ay) OE tOLZ (Burst wraps around to its initial state) tCHZ O3(Ay) O4(Ay) O1(Ay) O2(Ay) DATAOUT Output Disabled Flow-through Read Burst Flow-through Read 3729 drw 06 Commercial and Industrial Temperature Ranges NOTES: 1. O1 (Ax) represents the first output from the external address Ax. O1 (Ay) represents the first output from the external address Ay; O2 (Ay) represents the next output data in the burst sequence of the base address Ay, etc., where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. 2. ZZ input is LOW and LBO is Don’t Care for this cycle. 3. CS0 timing transitions are identical but inverted to the CE and CS1 signals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. . tCYC CLK tCH tCL (2) tSS tHS ADSP tSA tHA Ax tSW tHW Ay Az ADDRESS GW IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs ADV Timing Waveform of Combined Read and Write Cycles(1,2,3) 11 6.42 OE tSD tHD tOE tCD tCLZ tOHZ O1(Ax) I1(Ay) tCDC tOLZ DATAIN DATAOUT O1(Az) O2(Az) O3(Az) O4(Az) Single Read Write Flow-through Burst Read 3729 drw 07 Commercial and Industrial Temperature Ranges NOTES: 1. Device is selected through entire cycle; CE and CS1 are LOW, CS0 is HIGH. 2. ZZ input is LOW and LBO is Don't Care for this cycle. 3. O1 (Ax) represents the first output from the external address Ax. I1 (Ay) represents the first input from the external address Ay. O1 (Az) represents the first output from the external address Az; O2 (Az) represents the next output data in the burst sequence of the base address Az, etc., where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. . tCYC CLK tCH tCL tSS tHS ADSP (1) ADSC tSA tHA Ay BWE is ignored when ADSP initiates burst ADDRESS Ax Az tHW tSW GW tSC tHC CE, CS1 tSAV tHAV IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs (Note 3) Timing Waveform of Write Cycle No. 1 — GW Controlled(1,2,3) 12 (ADV suspends burst) ADV OE tSD I1(Ax) tOHZ I1(Ay) I2(Ay) I2(Ay) (3) tHD DATAIN I3(Ay) I4(Ay) I1(Az) I2(Az) I3(Az) DATAOUT O3(Aw) O4(Aw) 3729 drw 08 Commercial and Industrial Temperature Ranges NOTES: 1. ZZ input is LOW, BWE is HIGH, and LBO is Don’t Care for this cycle. 2. O4 (Aw) represents the final output data in the burst sequence of the base address Aw. I1 (Ax) represents the first input from the external address Ax. I1 (Ay) represents the first input from the external address Ay; I2 (Ay) represents the next input data in the burst sequence of the base address Ay, etc., where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. In the case of input I2(Ay) this data is valid for two cycles because ADV is high and has suspended the burst. 3. CS0 timing transitions are identical but inverted to the CE and CS1 signals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. . tCYC CLK tCH tCL tSS tHS ADSP ADSC tSA tHA Ax BWE is ignored when ADSP initiates burst ADDRESS Ay Az tHW tSW BWE BWx is ignored when ADSP initiates burst tHW tSW BWx tSC tHC IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs CE, CS1 tSAV Timing Waveform of Write Cycle No. 2 — Byte Controlled(1,2,3) 13 6.42 (ADV suspends burst) (Note 3) ADV OE tSD I1(Ax) tOHZ I1(Ay) I2(Ay) I2(Ay) I3(Ay) I4(Ay) I1(Az) tHD DATAIN I2(Az) I3(Az) DATAOUT Single Write O3(Aw) O4(Aw) Burst Write Extended Burst Write Burst Read 3729 drw 09 Commercial and Industrial Temperature Ranges NOTES: 1. ZZ input is LOW, GW is HIGH, and LBO is Don’t Care for this cycle. 2. O4 (Aw) represents the final output data in the burst sequence of the base address Aw. I1 (Ax) represents the first input from the external address Ax. I1 (Ay) represents the first input from the external address Ay; I2 (Ay) represents the next input data in the burst sequence of the base address Ay, etc., where A0 and A1 are advancing for the four word burst in the sequence defined by the state of the LBO input. In the case of input I2(Ay) this data is valid for two cycles because ADV is high and has suspended the burst. 3. CS0 timing transitions are identical but inverted to the CE and CS1 signals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. . tCYC CLK tCH tCL tSS tHS ADSP ADSC tHA Az tSA ADDRESS Ax GW tHC tSC CE, CS1 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs (Note 4) Timing Waveform of Sleep (ZZ) and Power-Down Modes(1,2,3) 14 tOE O1(Ax) ADV OE tOLZ DATAOUT t ZZR tZZPW Single Read Snooze Mode 3729 drw 10 ZZ Commercial and Industrial Temperature Ranges NOTES: 1. Device must power up in deselected mode. 2. LBO input is Don’t Care for this cycle. 3. It is not necessary to retain the state of the input registers throughout the Power-down cycle. 4. CS0 timing transitions are identical but inverted to the CE and CS1 signals. For example, when CE and CS1 are LOW on this waveform, CS0 is HIGH. . IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Non-Burst Read Cycle Timing Waveform CLK ADSP ADSC ADDRESS Av Aw Ax Ay Az GW, BWE, BWx CE, CS1 CS0 OE DATAOUT (Av) (Aw) (Ax) (Ay) 3729 drw 11 . NOTES: 1 ZZ input is LOW, ADV is HIGH, and LBO is Don’t Care for this cycle. 2. (Ax) represents the data for address Ax, etc. 3. For read cycles, ADSP and ADSC function identically and are therefore interchangeable. 15 6.42 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Non-Burst Write Cycle Timing Waveform CLK ADSP ADSC ADDRESS Av Aw Ax Ay Az GW CE, CS1 CS0 DATAIN (Av) (Aw) (Ax) (Ay) (Az) 3729 drw 12 . NOTES: 1. ZZ input is LOW, ADV and OE are HIGH, and LBO is Don't Care for this cycle. 2. (Ax) represents the data for address Ax, etc. 3. Although only GW writes are shown, the functionality of BWE and BWx together is the same as GW. 4. For write cycles, ADSP and ADSC have different limitations. 16 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges 100-Pin Thin Quad Flatpack (TQFP) Package Diagram Outline 17 6.42 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Ordering Information IDT 71V433 Device Type S Power X Speed PF Package X Process/ Temperature Range Blank I PF Commercial (0°C to +70°C) Industrial (–40°C to +85°C) Plastic Thin Quad Flatpack, 100 pin (PK100-1) . 11 12 tCD in nanoseconds PART NUMBER 71V433S11PF 71V433S12PF SPEED IN MEGAHERTZ 50 MHz 50 MHz tCD PARAMETER 11 ns 12 ns CLOCK CYCLE TIME 20 ns 20 ns 3729 drw 13 18 IDT71V433 32K x 32, 3.3V Synchronous SRAM with Flow-Through Outputs Commercial and Industrial Temperature Ranges Datasheet Document History 09/10/99 Pg. 1, 8, 9, 17 Pg. 3–5 Pg. 5 Pg. 11–14 Pg. 18 Pg. 1, 4, 8, 9, 17 Pg. 17 Updated to new format Revised speed offerings to 11 and 12 ns at 50 MHz Adjusted page layout, added extra page Added notes to pin configuration Updated notes Added Datasheet Document History Added Industrial temperature range offerings Added 100pinTQFP Package Diagram Outline Not recommended for new designs Removed “Not recommended for new designs” from the background on the datasheet ` 10/08/99 04/04/00 08/09/00 08/17/01 CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800 345-7015 or 408 727-6116 fax: 408 492-8674 www.idt.com for TECH SUPPORT: sramhelp@idt.com 800 544-7726, x4033 The IDT logo is a registered trademark of Integrated Device Technology, Inc. 19 6.42