n-Channel Power MOSFET
OptiMOS™3 BSB044N08NN3 G
Data Sheet
1.2, 2011-03-07 Preliminary
Industrial & Multimarket
OptiMOS™ Power-MOSFET BSB044N08NN3 G
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Description
OptiMOS™80V products are class leading power MOSFETs for highest power density and energy efficient solutions. Ultra low gate- and output charges together with lowest on state resistance in small footprint packages make OptiMOS™ 80V the best choice for the demanding requirements of switched mode power supplies in Servers, Datacom and Telecom applications but also for motor drives. With almost no parasitic package inductances, the CanPAK allows best controllability of the gate in highly dynamic switching enviroments. This package in addition features best cooling capability through top-side cooling of the metal can. Hence, this packaging technology combined with the OptiMOS silicon enables highest efficiency levels while having mininal space requirements at the same time Features • • • • • • • • • • • • Optimized technology for DC/DC converters 100% avalanche tested Excellent Qg x RDS(on) product (FOM) Qualified according to JEDEC1) for target applications Superior thermal resistance Pb-free plating; RoHS compliant Halogen-free according to IEC61249-2-21 Double sided cooling Compatible with DirectFET® package ST footprint and outline2) N-Channel, normal level Low parasitic inductance Low profile (2|ID|RDS(on)max, ID=30 A µA V Unit Note / Test Condition
VGS=0 V, ID=1 mA VDS=VGS, ID=97 µA VDS=80V, VGS=0 V, Tj=25 °C VDS=80 V, VGS=0 V, Tj=125 °C VGS=20 V, VDS=0 V VGS=10 V, ID=30A
VGS(th) IDSS
IGSS RG
gfs
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Drain-source on-state resistance RDS(on)
Table 5 Parameter
Dynamic characteristics Symbol Min. Values Typ. 4300 1100 38 14 9 26 7 Max. 5700 1450 ns pF Unit Note / Test Condition
Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time
Ciss Coss
Crss
VGS=0 V, VDS=40 V, f=1 MHz VDD=40V, VGS=10 V, ID=30 A, RG= 1.6 Ω
td(on) tr td(off) tf
Preliminary Data Sheet
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Electrical characteristics
Table 6 Parameter
Gate charge characteristics1) Symbol Min. Values Typ. 17 11 17 55 4.6 75 73 99 V nC Max. nC Unit Note / Test Condition
Gate to source charge Gate to drain charge Switching charge Gate charge total Output charge
Qgs Qgd
Qsw
VDD=40 V, ID=30 A, VGS=0 to 10 V
Qg Vplateau
Qoss
VDD=30 V, VGS=0 V
1) See figure 16 for gate charge parameter definition
Table 7 Parameter
Reverse diode characteristics Symbol Min. Is IS,pulse Values Typ. Max. 30 120 0.9 110 55 1.2 V nC ns A Unit Note / Test Condition
Diode continuous forward current Diode pulse current Diode forward voltage Reverse recovery charge Reverse recovery time
TC=25 °C VGS=0 V, IF=30 A, Tj=25 °C VR=40V, IF=Is, diF/dt=400 A/µs
VSD Qrr
trr
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Electrical characteristics diagrams
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Electrical characteristics diagrams
Table 8 1 Power dissipation 2 Drain current
Ptot = f(TC)
Table 9 3 Safe operating area TC=25 °C
ID=f(TC); parameter:VGS
4 Max. transient thermal impedance
ID=f(VDS); Tj=25 °C; D=0; parameter: Tp
Z(thJC)=f(tp); parameter: D=tp/T
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Electrical characteristics diagrams Table 10 5 Typ. output characteristics TC=25 °C 6 Typ. drain-source on-state resistance
ID=f(VDS); Tj=25 °C; parameter: VGS Table 11 7 Typ. transfer characteristics
RDS(on)=f(ID); Tj=25 °C; parameter: VGS
8 Typ. forward transconductance
ID=f(VGS); |VDS|>2|ID|RDS(on)max
gfs=f(ID); Tj=25 °C
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Electrical characteristics diagrams Table 12 9 Drain-source on-state resistance 10 Typ. gate threshold voltage
RDS(on)=f(Tj); ID=30 A; VGS=10 V Table 13 11 Typ. capacitances
VGS(th)=f(Tj); VGS=VDS;
12 Forward characteristics of reverse diode
C=f(VDS); VGS=0 V; f=1 MHz
IF=f(VSD); parameter: Tj
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Electrical characteristics diagrams Table 14 13 Avalanche characteristics 14 Typ. gate charge
IAS=f(tAV); RGS=25 Ω; parameter: Tj(start) Table 15 15 Drain-source breakdown voltage
VGS=f(Qgate); ID=30 A pulsed; parameter: VDD
16 Gate charge waveforms
VBR(DSS)=f(VDS); ID=1 mA
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Package outlines
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Package outlines
Figure 1
Outlines MG-WDSON-2, dimensions in mm/inches
Preliminary Data Sheet
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Package outlines
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Package outlines
Figure 2
Outlines MG-WDSON-2, dimensions in mm/inches 10 1.2, 2011-03-07
Preliminary Data Sheet
OptiMOS™ Power-MOSFET BSB044N08NN3 G
Package outlines
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Package outlines
Preliminary Data Sheet
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OptiMOS™ Power-MOSFET BSB044N08NN3 G
Revision History
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Revision History
Revision History: 2011-03-07, 1.2 Previous Revision: Revision 0.1 1.1 Subjects (major changes since last revision) Release of target data sheet Release of Preliminary data sheet
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Edition 2011-03-07 Published by Infineon Technologies AG 81726 Munich, Germany © 2011 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automotive, aviation and aerospace applications or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support, automotive, aviation and aerospace device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered..
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