BSP 298
SIPMOS ® Small-Signal Transistor
• N channel • Enhancement mode • Avalanche rated • VGS(th)= 2.1 ... 4.0 V • Pb-free lead plating; RoHS compliant Pin 1 G Pin 2 D Pin 3 S Pin 4 D
Type
VDS 400 V
Pb-free Yes
ID 0.5 A
RDS(on) 3Ω
Package
Marking
BSP 298
Type BSP 298
SOT-223
BSP 298
Tape and Reel Information E6327
Maximum Ratings Parameter Symbol Values Unit
Continuous drain current
TA = 26 °C
ID
A 0.5
DC drain current, pulsed
TA = 25 °C
IDpuls
2
E AS
Avalanche energy, single pulse
ID = 1.35 A, VDD = 50 V, RGS = 25 Ω L = 125 mH, Tj = 25 °C
mJ
130
V GS P tot
Gate source voltage Power dissipation
TA = 25 °C
± 20
1.8
V W
Rev. 2.2 Semiconductor Group
1
2007-02-26
BSP 298
Maximum Ratings Parameter Symbol Values Unit
Chip or operating temperature Storage temperature Thermal resistance, chip to ambient air Therminal resistance, junction-soldering point 1) DIN humidity category, DIN 40 040 IEC climatic category, DIN IEC 68-1
Tj Tstg RthJA RthJS
-55 ... + 150 -55 ... + 150
°C
≤ 70 ≤ 10
E 55 / 150 / 56
K/W
1) Transistor on epoxy pcb 40 mm x 40 mm x 1,5 mm with 6 cm2 copper area for drain connection
Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Static Characteristics Values typ. max. Unit
Drain- source breakdown voltage
V GS = 0 V, ID = 0.25 mA, Tj = 0 °C
V (BR)DSS
V 400 -
Gate threshold voltage
V GS=V DS, ID = 1 mA
V GS(th)
2.1
IDSS
3
4 µA
Zero gate voltage drain current
V DS = 400 V, V GS = 0 V, Tj = 25 °C V DS = 400 V, V GS = 0 V, Tj = 125 °C
IGSS
0.1 10
1 100 nA
Gate-source leakage current
V GS = 20 V, VDS = 0 V
RDS(on)
10
100
Drain-Source on-state resistance
V GS = 10 V, ID = 0.5 A
Ω
2.2 3
Rev. 2.2 Semiconductor Group
2
2007-02-26
BSP 298
Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Dynamic Characteristics Values typ. max. Unit
Transconductance
V DS≥ 2 * ID * RDS(on)max, ID = 0.5 A
gfs
S 0.5 1.2 pF 300 400
Input capacitance
V GS = 0 V, V DS = 25 V, f = 1 MHz
Ciss
Output capacitance
V GS = 0 V, V DS = 25 V, f = 1 MHz
Coss
Crss
50
75
Reverse transfer capacitance
V GS = 0 V, V DS = 25 V, f = 1 MHz
td(on)
20
30 ns
Turn-on delay time
V DD = 30 V, VGS = 10 V, ID = 0.3 A RGS = 50 Ω
tr
10
15
Rise time
V DD = 30 V, VGS = 10 V, ID = 0.3 A RGS = 50 Ω
td(off)
25
40
Turn-off delay time
V DD = 30 V, VGS = 10 V, ID = 0.3 A RGS = 50 Ω
tf
30
40
Fall time
V DD = 30 V, VGS = 10 V, ID = 0.3 A RGS = 50 Ω
-
20
30
Rev. 2.2 Semiconductor Group
3
2007-02-26
BSP 298
Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Reverse Diode Values typ. max. Unit
Inverse diode continuous forward current
TA = 25 °C
IS
A 0.5
Inverse diode direct current,pulsed
TA = 25 °C
ISM
V SD
-
2 V
Inverse diode forward voltage
V GS = 0 V, IF = 1 A, Tj = 25 °C
trr
0.95
1.2 ns
Reverse recovery time
V R = 100 V, IF=lS, diF/dt = 100 A/µs
Qrr
300
µC
Reverse recovery charge
V R = 100 V, IF=lS, diF/dt = 100 A/µs
-
2.5
-
Rev. 2.2 Semiconductor Group
4
2007-02-26
BSP 298
Power dissipation Ptot = ƒ(TA)
Drain current ID = ƒ(TA) parameter: VGS ≥ 10 V
0.55 A ID 0.45 0.40 0.35
2.0 W Ptot 1.6 1.4 1.2
0.30 1.0 0.25 0.8 0.20 0.6 0.4 0.2 0.0 0 20 40 60 80 100 120 °C 160 0.15 0.10 0.05 0.00 0 20 40 60 80 100 120 °C 160
TA
TA
Safe operating area ID=f(VDS) parameter : D = 0, TC=25°C
Transient thermal impedance Zth JA = ƒ(tp ) parameter: D = tp / T
10 2 K/W 10 1 ZthJC 10 0
10 -1 D = 0.50 0.20 0.10 10 -3 single pulse 10 -4 0.05 0.02 0.01
10 -2
10 -5 -8 -7 -6 -5 -4 -3 -2 -1 0 10 10 10 10 10 10 10 10 s 10
tp
Rev. 2.2 Semiconductor Group
5
2007-02-26
BSP 298
Typ. output characteristics ID = ƒ(VDS) parameter: tp = 80 µs , Tj = 25 °C
l
Typ. drain-source on-resistance RDS (on) = ƒ(ID) parameter: tp = 80 µs, Tj = 25 °C
10
1.2 A 1.0 ID 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 0
Ptot = 2W j
f i h e d g c k b
VGS [V] a b c d e f g h 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5 8.0 9.0 10.0 20.0
Ω
RDS (on) 8 7 6 5 4 3 2 1 0
VGS [V] =
a 4.0 b 4.5 c 5.0 d 5.5 e f 6.0 6.5 g 7.0 h i 7.5 8.0
a
a
i j k l
b
l
j h
ic e d fg k
j 9.0
k l 10.0 20.0
1
2
3
4
5
6
7
8
V
10
0.00
0.10
0.20
0.30
0.40
A
0.60
VDS
ID
Typ. transfer characteristics ID = f(VGS) parameter: tp = 80 µs
Typ. forward transconductance gfs = f (ID) parameter: tp = 80 µs,
2.6 A 2.2
I
D
2.6 S 2.2
g
fs
2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 0 1 2 3 4 5 6 7 8 V
VGS
2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0
10
0.0
0.4
0.8
1.2
1.6
A
ID
2.2
Rev. 2.2 Semiconductor Group
6
2007-02-26
BSP 298
Drain-source on-resistance RDS (on) = ƒ(Tj ) parameter: ID = 0.5 A, VGS = 10 V
7.5
Gate threshold voltage VGS (th) = ƒ(Tj ) parameter: VGS = VDS, ID = 1 mA
4.6 V 4.0 VGS(th) 3.6 3.2 2.8 typ 98%
Ω
6.5 RDS (on) 6.0 5.5 5.0 4.5 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -60 -20 20 60 100 °C 160 98%
2.4 2.0
2%
typ 1.6 1.2 0.8 0.4 0.0 -60 -20 20 60 100 °C 160
Tj
Tj
Typ. capacitances
C = f (VDS)
parameter:VGS=0V, f = 1 MHz
10 1
Forward characteristics of reverse diode IF = ƒ(VSD) parameter: Tj , tp = 80 µs
10 1
nF
C
A IF
10 0
10 0
Ciss
10 -1
10 -1 Tj = 25 °C typ
Coss
Tj = 150 °C typ Tj = 25 °C (98%) Tj = 150 °C (98%) 10 -2 0.0
Crss
10 -2 0
5
10
15
20
25
30
V
VDS
40
0.4
0.8
1.2
1.6
2.0
2.4
V
3.0
VSD
Rev. 2.2 Semiconductor Group
7
2007-02-26
BSP 298
Avalanche energy EAS = ƒ(Tj) parameter: ID = 1.35 A, VDD = 50 V RGS = 25 Ω, L = 125 mH
140 mJ 120 EAS 110 100 90 80 70 60 50 40
Drain-source breakdown voltage V(BR)DSS = ƒ(Tj)
480 V 460 V(BR)DSS 450 440 430 420 410 400 390
30 20 10 0 20 40 60 80 100 120 °C 160 380 370 360 -60 -20 20 60 100 °C 160
Tj
Tj
Safe operating area ID=f(VDS) parameter : D = 0.01, TC=25°C
Rev. 2.2 Semiconductor Group
8
2007-02-26
BSP 298
Package outlines SOT-223 Dimensions in mm
Rev. 2.2 Semiconductor Group
9
2007-02-26