BSP321P
SIPMOS® Small-Signal-Transistor
Features • P-Channel • Enhancement mode • Normal level • Avalanche rated • Pb-free lead plating; RoHS compliant • Qualified according to AEC Q101
Product Summary V DS R DS(on),max ID -100 900 -0.98 V mΩ A
PG-SOT-223
Type BSP321P
Package PG-SOT-223
Tape and Reel Information L6327: 1000 pcs/reel
Marking BSP321P
Lead free Yes
Packing Non dry
Maximum ratings, at T j=25 °C, unless otherwise specified Parameter Continuous drain current Symbol Conditions ID T C=25 °C T C=70 °C Pulsed drain current Avalanche energy, single pulse Gate source voltage Power dissipation Operating and storage temperature ESD Class Soldering temperature IEC climatic category; DIN IEC 68-1 I D,pulse E AS V GS P tot T j, T stg JESD22-A114-HBM T C=25 °C T C=25 °C I D=-0.98 A, R GS=25 Ω Value -0.98 -0.79 -3.9 57 ±20 1.8 -55 ... 150 1A (250V to 500V) 260 °C 55/150/56 mJ V W °C Unit A
Rev 1.04
page 1
2011-04-05
BSP321P
Parameter Symbol Conditions min. Thermal characteristics Thermal resistance, junction - ambient minimal footprint, steady state 6 cm2 cooling area1), steady state Values typ. max. Unit
R thJA
-
-
115
-
-
70
Electrical characteristics, at T j=25 °C, unless otherwise specified Static characteristics Drain-source breakdown voltage Gate threshold voltage V (BR)DSS V GS=0 V, I D=-250 µA V GS(th) V DS=V GS,I D=-380 µA V DS=-100 V, V GS=0 V, T j=25 °C V DS=-100 V, V GS=0 V, T j=150 °C Gate-source leakage current Drain-source on-state resistance I GSS R DS(on) V GS=-20 V, V DS=0 V V GS=-10 V, I D=-0.98 A |V DS|>2|I D|R DS(on)max, I D=-0.79 A -100 -2.1 -3.0 -4 V
Zero gate voltage drain current
I DSS
-
-0.1
-1
µA
-
-10 -10 689
-100 -100 900 nA mΩ
Transconductance
g fs
0.6
1.2
-
S
2 Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air.
1)
Rev 1.04
page 2
2011-04-05
BSP321P
Parameter Symbol Conditions min. Dynamic characteristics Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Gate Charge Characteristics 2) Gate to source charge Gate to drain charge Gate charge total Gate plateau voltage Reverse Diode Diode continuous forward current Diode pulse current Diode forward voltage Reverse recovery time Reverse recovery charge IS I S,pulse V SD t rr Q rr V R=50 V, I F=|I S|, di F/dt =100 A/µs V GS=0 V, I F=0.98 A, T j=25 °C T C=25 °C 0.84 47 96 -0.98 -3.9 1.2 V ns nC A Q gs Q gd Qg V plateau V DD=-80 V, I D=0.98 A, V GS=0 to -10 V 1.1 4 9 4.5 1.4 6 12 V nC C iss C oss C rss t d(on) tr t d(off) tf V DD=-50 V, V GS=10 V, I D=-0.98 A, R G=6 Ω V GS=0 V, V DS=-25 V, f =1 MHz 240 62 28 5.9 4.4 16.5 8.5 319 82 42 8.8 6.6 24.7 12.7 ns pF Values typ. max. Unit
2)
See figure 16 for gate charge parameter definition
Rev 1.04
page 3
2011-04-05
BSP321P
1 Power dissipation P tot=f(T C) 2 Drain current I D=f(T C); |V GS|≥10 V
2
1
0.8 1.5
0.6
P tot [W]
1
-I D [A]
0.4 0.2 0 0 40 80 120 160 0 40 80 120 160
0.5
0
T A [°C]
T A [°C]
3 Safe operating area I D=f(V DS); T C=25 °C; D =0 parameter: t p
101
limited by on-state resistance
100 µs
4 Max. transient thermal impedance Z thJC=f(t p) parameter: D =t p/T
102
0.5
0.2
100
1 ms
101
0.1
Z thJS [K/W]
-I D [A]
0.05
10 ms
0.02
10-1
DC
100 ms
100
0.01
single pulse
10-2 10
0
10-1 10
1
10
2
10
3
10-5
10-4
10-3
10-2
10-1
100
101
102
-V DS [V]
t p [s]
Rev 1.04
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2011-04-05
BSP321P
5 Typ. output characteristics I D=f(V DS); T j=25 °C parameter: V GS
4
-10 V -6 V -7 V -5 V
6 Typ. drain-source on resistance R DS(on)=f(I D); T j=25 °C parameter: V GS
2
-4 V -4.5 V
3
1.6
2
R DS(on) [Ω ]
-I D [A]
-5 V
1.2
-6 V
1
-4.5 V
-7 V
0.8
-4 V
-8 V -10 V
0 0 2 4 6 8 10
0.4 0 1 2 3 4
-V DS [V]
-I D [A]
7 Typ. transfer characteristics I D=f(V GS); |V DS|>2|I D|R DS(on)max parameter: T j
4
8 Typ. forward transconductance g fs=f(I D); T j=25 °C
3
3
25 °C
125 °C
2
-I D [A]
2
g fs [S]
1 0 0 2 4 6 8 0 1 2 3 4
1
0
-V GS [V]
-I D [A]
Rev 1.04
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2011-04-05
BSP321P
9 Drain-source on-state resistance R DS(on)=f(T j); I D=-0.98 A; V GS=-10 V 10 Typ. gate threshold voltage V GS(th)=f(T j); V GS=V DS; I D=-380 µA
2.5
5
2 4
min.
R DS(on) [Ω ]
-V GS(th) [V]
1.5
98 %
3
typ.
1
max.
2 0.5
typ.
0 -60 -20 20 60 100 140
1 -60 -20 20 60 100 140
T j [°C]
T j [°C]
11 Typ. capacitances C =f(V DS); V GS=0 V; f =1 MHz
12 Forward characteristics of reverse diode I F=f(V SD) parameter: T j
103
101
150 °C, typ Ciss
25 °C, typ
100
C [pF]
102
I F [A]
150 °C, 98%
Coss
10-1
25 °C, 98%
Crss
101 0 20 40 60 80 100
10-2 0 0.5 1 1.5
-V DS [V]
-V SD [V]
Rev 1.04
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2011-04-05
BSP321P
13 Avalanche characteristics I AS=f(t AV); R GS=25 Ω parameter: T j(start)
100
25 °C
50 V
14 Typ. gate charge V GS=f(Q gate); I D=-0.98 A pulsed parameter: V DD
12
100 °C
10
20 V 80 V
125 °C
8
- VGS [V]
10-1 100 101 102 103
-I AV [A]
6
4
2
0 0 2 4 6 8 10
t AV [µs]
- Qgate [nC]
15 Drain-source breakdown voltage V BR(DSS)=f(T j); I D=-250 µA
16 Gate charge waveforms
120
V GS
115
Qg
110
-V BR(DSS) [V]
105
V g s(th)
100
95
Q g(th) Q gs
-60 -20 20 60 100 140
Q sw Q gd
Q g ate
90
T j [°C]
Rev 1.04
page 7
2011-04-05
BSP321P
Package Outline: PG-SOT-223
Footprint:
Packaging:
Dimensions in mm Rev 1.04 page 8 2011-04-05
BSP321P
Published by Infineon Technologies AG 81726 Munich, Germany © 2010 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office ( www.infineon.com ). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev 1.04
page 9
2011-04-05