ACS374K

ACS374MS April 1995 Radiation Hardened Octal D Flip-Flop, Three-State Pinouts 20 LEAD CERAMIC DUAL-IN-LINE MIL-STD-1835 DESIGNATOR CDIP2-T20, LEAD FINISH C TOP VIEW OE Q0 D0 D1 Q1 1 2 3 4 5 6 7 8 9 20 VCC 19 Q7 18 D7 17 D6 16 Q6 15 Q5 14 D5 13 D4 12 Q4 11 CP Features • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose 300K RAD (Si) • Single Event Upset (SEU) Immunity 80 MEV-cm2/mg • Dose Rate Upset >1011 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any Conditions • Military Temperature Range: -55oC to +125oC Q2 D2 D3 • Significant Power Reduction Compared to ALSTTL Logic • DC Operating Voltage Range: 4.5V to 5.5V • Input Logic Levels - VIL = 30% of VCC Max - VIH = 70% of VCC Min • Input Current ≤1µA at VOL, VOH Q3 GND 10 20 LEAD CERAMIC FLATPACK MIL-STD-1835 DESIGNATOR CDFP4-F20, LEAD FINISH C TOP VIEW OE Q0 D0 D1 Q1 Q2 D2 D3 Q3 GND 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 VCC Q7 D7 D6 Q6 Q5 D5 D4 Q4 CP Description The Intersil ACS374MS is a radiation hardened octal D-type flipflop with three-state outputs. The eight edge-triggered flip-flops enter data into their registers on the low to high transition of clock (CP). The Output Enable (OEN) controls the three-state outputs and is independent of the register operation. When the OEN is high, the outputs will be in the high impedance state. The ACS374MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of the radiation hardened, high-speed, CMOS/SOS Logic Family. Ordering Information PART NUMBER ACS374DMSR ACS374KMSR ACS374D/Sample ACS374K/Sample ACS374HMSR TEMPERATURE RANGE -55oC to +125oC -55oC to +125oC +25oC +25oC +25oC SCREENING LEVEL Intersil Class S Equivalent Intersil Class S Equivalent Sample Sample Die PACKAGE 20 Lead SBDIP 20 Lead Ceramic Flatpack 20 Lead SBDIP 20 Lead Ceramic Flatpack Die Truth Table INPUTS OE L L L H H = High Level L = Low Level Q0 X = Immaterial Z = High Impedance X X CP Dn H L X X OUTPUTS Qn H L Q0 Z Functional Diagram 1 OF 8 FF D COMMON CONTROLS CP D Q OE Q CP = Transition from Low to High Level = the level of Q before the indicated input conditions were established OE CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999 Spec Number 1 518820 File Number 3997 Specifications ACS374MS Absolute Maximum Ratings Supply Voltage (VCC). . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +6.0V Input Voltage Range . . . . . . . . . . . . . . . . . . . . . .-0.5V to VCC +0.5V DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . . ±10mA DC Drain Current, Any One Output . . . . . . . . . . . . . . . . . . . . . . .±50mA Storage Temperature Range (TSTG) . . . . . . . . . . . -65oC to +150oC Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . . +265oC Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1 (All Voltages Reference to VSS) Reliability Information Thermal Impedance θJA θJC DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72oC/W 24oC/W Flatpack . . . . . . . . . . . . . . . . . . . . . . . . . . 107oC/W 28oC/W Maximum Package Power Dissipation at +125oC DIP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.7W Flatpack . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5W Maximum Device Power Dissipation. . . . . . . . . . . . . . . . . . .(TBD)W Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 Gates CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation. Operating Conditions Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . . 10ns/V Max Operating Temperature Range (TA) . . . . . . . . . . . . -55oC to +125oC Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . VCC to 70% of VCC Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . .0V to 30% of VCC TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS GROUP A SUBGROUPS 1 2, 3 Output Current (Source) IOH VCC = VIH = 4.5V, VOUT = VCC -0.4V, VIL = 0V, (Note 2) VCC = VIH = 4.5V, VOUT = 0.4V, VIL = 0V, (Note 2) VCC = 5.5V, VIH = 3.85V VIL = 1.65V, IOH = -50µA VCC = 4.5V, VIH = 3.15V, VIL = 1.35V, IOH = -50µA Output Voltage Low VOL VCC = 5.5V, VIH = 3.85V VIL = 1.65V, IOH = 50µA VCC = 4.5V, VIH = 3.15V, VIL = 1.35V, IOH = 50µA Input Leakage Current Three-State Output Leakage Current Noise Immunity Functional Test NOTES: 1. All voltages referenced to device GND. 2. Force/measure functions may be interchanged. 3. For functional tests, VO ≥4.0V is recognized as a logic “1”, and VO ≤0.5V is recognized as a logic “0”. IIN VCC = 5.5V, VIN = VCC or GND VCC = 5.5V, Force Voltage = 0V or VCC VCC = 4.5V, VIH = 3.15V, VIL = 1.35V, (Note 3) 1 2, 3 1 2, 3 1, 2, 3 LIMITS TEMPERATURE +25oC +125oC, -55oC +25oC +125oC, -55oC +25oC +125oC, -55oC +25oC, +125oC, -55oC +25oC, +125oC, -55oC +25oC, +125oC, -55oC +25oC, +125oC, -55oC +25oC +125oC, -55oC +25oC +125oC, -55oC +25oC, +125oC, -55oC MIN -12 -8 12 8 VCC -0.1 MAX 20 400 UNITS µA µA mA mA mA mA V PARAMETER Supply Current SYMBOL ICC (NOTE 1) CONDITIONS VCC = 5.5V, VIN = VCC or GND Output Current (Sink) IOL Output Voltage High VOH 1, 2, 3 VCC -0.1 - V 1, 2, 3 - 0.1 V 1, 2, 3 - 0.1 ±0.5 ±1.0 ±1 ±35 - V µA µA µA µA V 1 2, 3 - IOZ 1 2, 3 FN 7, 8A, 8B Spec Number 2 518820 Specifications ACS374MS TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS GROUP A SUBGROUPS 9 10, 11 TPLH1 VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V 9 10, 11 TPZL1 9 10, 11 TPZH1 9 10, 11 TPLZ1 9 10, 11 TPHZ1 9 10, 11 NOTES: 1. All voltages referenced to device GND. 2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns. TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS LIMITS PARAMETER Capacitance Power Dissipation Input Capacitance SYMBOL CPD CONDITIONS VCC = 5.0V, VIH = 5.0V, VIL = 0V, f = 1MHz VCC = 5.0V, VIH = 5.0V, VIL = 0V, f = 1MHz VCC = 5.0V, VIH = 5.0V, VIL = 0V, f = 1MHz VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V NOTE 1 TEMP +25oC +125oC 1 +25oC +125oC 1 +25oC +125oC 1 +25oC +125oC 1 +25oC +125oC 1 +25oC +125oC 1 +25oC +125oC MIN 4.5 5 3.5 4 3.5 4 0 0 TYP 25 30 MAX 10 10 20 20 100 100 UNITS pF pF pF pF pF pF ns ns ns ns ns ns MHz MHz LIMITS TEMPERATURE +25oC +125oC, -55oC +25oC +125oC, -55oC +25oC +125oC, -55oC +25oC +125oC, -55oC +25oC +125oC, -55oC +25oC +125oC, -55oC MIN 2 2 2 2 2 2 2 2 2 2 2 2 MAX 14 17 16 20 15 19 16 20 15 19 15 19 UNITS ns ns ns ns ns ns ns ns ns ns ns ns PARAMETER Propagation Delay SYMBOL TPHL1 (NOTES 1, 2) CONDITIONS VCC = 4.5V, VIH = 4.5V, VIL = 0V CIN Output Capacitance COUT Pulse Width Time TW Setup Time TSU Hold Time TH Maximum Frequency CP NOTE: FMAX 1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics. Spec Number 3 518820 Specifications ACS374MS TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS RAD LIMITS PARAMETER Supply Current Output Current (Source) SYMBOL ICC IOH (NOTE 1) CONDITIONS VCC = 5.5V, VIN = VCC or GND VCC = VIH = 4.5V, VOUT = VCC -0.4V, VIL = 0 VCC = VIH = 4.5V, VOUT = 0.4V, VIL = 0 VCC = 5.5V, VIH = 3.85V, VIL = 1.65V, IOH = -50µA VCC = 4.5V, VIH = 3.15V, VIL = 1.35V, IOH = -50µA Output Voltage Low VOL VCC = 5.5V, VIH = 3.85V, VIL = 1.65V, IOH = 50µA VCC = 4.5V, VIH = 3.15V, VIL = 1.35V, IOH = 50µA Input Leakage Current Three-State Output Leakage Current Noise Immunity Functional Test Propagation Delay IIN IOZ VCC = 5.5V, VIN = VCC or GND VCC = 5.5V, Force Voltage = 0V or VCC VCC = 4.5V, VIH = 3.15V, VIL = 1.35V, (Note 2) VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V VCC = 4.5V, VIH = 4.5V, VIL = 0V TEMP +25oC +25oC MIN -8 MAX 400 UNITS µA mA Output Current (Sink) IOL +25oC 8 - mA Output Voltage High VOH +25oC VCC -0.1 - V +25oC VCC -0.1 - V +25oC - 0.1 V +25oC - 0.1 V +25oC +25oC - ±1 ±35 µA µA FN +25oC - - V TPHL1 TPLH1 TPZL1 TPZH1 TPLZ1 TPHZ1 +25oC +25oC +25oC +25oC +25oC +25oC 2 2 2 2 2 2 17 20 19 20 19 19 ns ns ns ns ns ns NOTES: 1. All voltages referenced to device GND. 2. For functional tests, VO ≥4.0V is recognized as a logic “1”, and VO ≤0.5V is recognized as a logic “0”. TABLE 5. DELTA PARAMETERS (+25oC) (NOTE1) DELTA LIMIT ±4.0 ±200 ±15 PARAMETER Supply Current Three-State Leakage Current Output Current NOTE: ICC IOZ IOL/IOH SYMBOL UNITS µA nA % 1. All delta calculations are referenced to 0 hour readings or pre-life readings. Spec Number 4 518820 Specifications ACS374MS TABLE 6. APPLICABLE SUBGROUPS CONFORMANCE GROUP Initial Test (Preburn-In) Interim Test 1 (Postburn-In) Interim Test 2 (Postburn-In) PDA Interim Test 3 (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005. METHOD 100%/5004 100%/5004 100%/5004 100%/5004 100%/5004 100%/5004 100%/5004 Sample/5005 Sample/5005 Sample/5005 Sample/5005 GROUP A SUBGROUPS 1, 7, 9 1, 7, 9 1, 7, 9 1, 7, 9, Deltas 1, 7, 9 1, 7, 9, Deltas 2, 3, 8A, 8B, 10, 11 1, 2, 3, 7, 8A, 8B, 9, 10, 11 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas 1, 7, 9 1, 7, 9 Subgroups 1, 2, 3, 9, 10, 11 ICC, IOL/H, IOZL/H READ AND RECORD ICC, IOL/H, IOZL/H ICC, IOL/H, IOZL/H ICC, IOL/H, IOZL/H TABLE 7. TOTAL DOSE IRRADIATION TEST CONFORMANCE GROUP Group E Subgroup 2 NOTE: 1. Except FN test which will be performed 100% Go/No-Go. METHOD 5005 PRE RAD 1, 7, 9 POST RAD Table 4 READ AND RECORD PRE RAD 1, 9 POST RAD Table 4 (Note 1) TABLE 8. BURN-IN TEST CONNECTIONS (+125oC < TA < 139oC) OSCILLATOR OPEN STATIC BURN-IN 1 (Note 1) STATIC BURN-IN 2 (Note 1) DYNAMIC BURN-IN (Note 1) NOTE: 1. Each pin except VCC and GND will have a series resistor of 500Ω ±5%. 1, 10 2, 5, 6, 9, 12, 15, 16, 19 20 11 3, 4, 7, 8, 13, 14, 17, 18 10 2, 5, 6, 9, 12, 15, 16, 19 1, 3, 4, 7, 8, 11, 13, 14, 17, 18, 20 1, 3, 4, 7, 8, 10, 11, 13, 14, 17, 18 2, 5, 6, 9, 12, 15, 16, 19 20 GROUND 1/2 VCC = 3V ±0.5V VCC = 6V ±0.5V 50kHz 25kHz TABLE 9. IRRADIATION TEST CONNECTIONS (TA = +25oC, ±5oC) FUNCTION Irradiation Circuit (Note 1) NOTE: 1. Each pin except VCC and GND will have a series resistor of 47kΩ ±5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures. OPEN 2, 5, 6, 9, 12, 15, 16, 19 GROUND 10 VCC = 5V ±0.5V 1, 3, 4, 7, 8, 11, 13, 14, 17, 18, 20 Spec Number 5 518820 ACS374MS Intersil - Space Products MS Screening Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Nondestructive Bond Pull Method 2023 100% Internal Visual Inspection Method 2010 100% Temperature Cycling Method 1010 Condition C (-65o to +150oC) 100% Constant Acceleration 100% PIND Testing 100% External Visual Inspection 100% Serialization 100% Initial Electrical Test 100% Static Burn-In 1 Method 1015, 24 Hours at +125oC Min 100% Interim Electrical Test 1 (Note 1) NOTES: 1. Failures from interim electrical tests 1 and 2 are combined for determining PDA (PDA = 5% for subgroups 1, 7, 9 and delta failures combined, PDA = 3% for subgroup 7 failures). Interim electrical tests 3 PDA (PDA = 5% for subgroups 1, 7, 9 and delta failures combined, PDA = 3% for subgroup 7 failures). 2. These steps are optional, and should be listed on the purchase order if required. 3. Data Package Contents: Cover Sheet (P.O. Number, Customer Number, Lot Date Code, Intersil Number, Lot Number, Quantity). Certificate of Conformance (as found on shipper). Lot Serial Number Sheet (Good Unit(s) Serial Number and Lot Number). Variables Data (All Read, Record, and delta operations). Group A Attributes Data Summary. Wafer Lot Acceptance Report (Method 5007) to include reproductions of SEM photos. NOTE: SEM photos to include percent of step coverage. X-Ray Report and Film, including penetrometer measurements. GAMMA Radiation Report with initial shipment of devices from the same wafer lot; containing a Cover Page, Disposition, RAD Dose, Lot Number, Test Package, Spec Number(s), Test Equipment, etc. Irradiation Read and Record data will be on file at Intersil. 100% Static Burn-In 2 Method 1015, 24 Hours at +125oC Min 100% Interim Electrical Test 2 (Note 1) 100% Dynamic Burn-In Method 1015, 240 Hours at +125oC or 180 Hours at +135oC 100% Interim Electrical Test 3 (Note 1) 100% Final Electrical Test 100% Fine and Gross Seal Method 1014 100% Radiographics Method 2012 (2 Views) 100% External Visual Method 2009 Group A (All Tests) Method 5005 (Class S) Group B (Optional) Method 5005 (Class S) (Note 2) Group D (Optional) Method 5005 (Class S) (Note 2) CSI and/or GSI (Optional) (Note 2) Data Package Generation (Note 3) Propagation Delay Timing Diagram and Load Circuit DUT VIH VS VSS TPLH TPHL VOH VS VOL OUTPUT INPUT CL 50pF TEST POINT RL 500Ω AC VOLTAGE LEVELS PARAMETER VCC VIH VS VIL GND ACS 4.50 4.50 2.25 0 0 UNITS V V V V V Spec Number 6 518820 ACS374MS Pulse Width, Setup, Hold Timing Diagram Positive Edge Trigger and AC Load Circuit INPUT VIH VS VIL TSU INPUT CP VIH VS VIL TH TW TW DUT CL 50pF TEST POINT RL 500Ω PULSE WIDTH, SETUP, HOLD VOLTAGE LEVELS PARAMETER ACS UNITS TH = HOLD TIME TSU = SETUP TIME TW = PULSE WIDTH VCC VIH VS VIL GND 4.50 4.50 2.25 0 0 V V V V V Three-State High Timing Diagram and Load Circuit VIH VS VSS TPZH VOH VT VOZ OUTPUT VW TPHZ INPUT DUT CL 50pF TEST POINT RL 500Ω PULSE WIDTH, SETUP, HOLD VOLTAGE LEVELS PARAMETER ACS UNITS VCC VIH VS VT VW GND 4.50 4.50 2.25 2.25 3.60 0 V V V V V V Three-State Low Timing Diagram and Load Circuit VIH VS VSS TPZL VOZ VT VOL OUTPUT VW TPLZ DUT CL 50pF INPUT VCC RL 500Ω TEST POINT PULSE WIDTH, SETUP, HOLD VOLTAGE LEVELS PARAMETER ACS UNITS VCC VIH VS VT VW GND 4.50 4.50 2.25 2.25 0.90 0 V V V V V V Spec Number 7 518820 ACS374MS Die Characteristics DIE DIMENSIONS: 102 mils x 102 mils 2,600mm x 2,600mm METALLIZATION: Type: AlSiCu Metal 1 Thickness: 6.75kÅ (Min), 8.25kÅ (Max) Metal 2 Thickness: 9kÅ (Min), 11kÅ (Max) GLASSIVATION: Type: SiO2 Thickness: 8kÅ ±1kÅ DIE ATTACH: Material: Silver Glass or JM 7000 after 7/1/95 WORST CASE CURRENT DENSITY: < 2.0 x 105A/cm2 BOND PAD SIZE: > 4.3 mils x 4.3 mils > 110µm x 110µm Metallization Mask Layout ACS374MS D0 (3) Q0 (2) OE (1) VCC (20) Q7 (19) D7 (18) D1 (4) (17) D6 Q1 (5) (16) Q6 NC NC NC NC Q2 (6) (15) Q5 D2 (7) (14) D5 (8) D3 (9) Q3 (10) GND (11) CP (12) Q4 (13) D4 All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification. Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site http://www.intersil.com Spec Number 8 518820