HS-303RH
TM
Data Sheet
November 2001
File Number
9 046
Radiation Hardened CMOS Dual SPDT Analog Switch
The HS-303RH analog switch is a monolithic device fabricated using Radiation Hardened CMOS technology and the Intersil dielectric isolation process for latch-up free operation. Improved total dose hardness is obtained by layout (thin oxide tabs extending to a channel stop) and processing (hardened gate oxide). This switch offers lowresistance switching performance for analog voltages up to the supply rails. “ON” resistance is low and stays reasonably constant over the full range of operating voltage and current. “ON” resistance also stays reasonably constant when exposed to radiation, being typically 30Ω pre-rad and 35Ω post 100kRAD(Si). Break-before-make switching is controlled by 5V digital inputs.
Features
• QML, Per MIL-PRF-38535 • Radiation Performance - Gamma Dose (γ) 1 x 105 RAD(Si) • No Latch-Up, Dielectrically Isolated Device Islands • Pin for Pin Compatible with Intersil HI-303 Series Analog Switches • Analog Signal Range 15V • Low Leakage . . . . . . . . . . . . . . . . 100nA (Max, Post Rad) • Low rON . . . . . . . . . . . . . . . . . . . . . . 60Ω (Max, Post Rad) • Low Operating Power . . . . . . . . . . 100µA (Max, Post Rad)
Pinouts
HS1-303RH (SBDIP), CDIP2-T14 TOP VIEW
NC S3 1 2 3 4 5 6 7 14 V+ 13 S4 12 D4 11 D2 10 S2 9 IN2 8 V-
Specifications
Specifications for Rad Hard QML devices are controlled by the Defense Supply Center in Columbus (DSCC). The SMD numbers listed below must be used when ordering. Detailed Electrical Specifications for the HS-303RH are contained in SMD 5962-95813. A “hot-link” is provided from our website for downloading
D3 D1 S1 IN1
Ordering Information
ORDERING NUMBER 5962R9581301QCC 5962R9581301QXC 5962R9581301VCC 5962R9581301VXC HS1-303RH/PROTO HS9-303RH/PROTO PART NUMBER HS1-303RH-8 HS9-303RH-8 HS1-303RH-Q HS9-303RH-Q HS1-303RH/PROTO HS9-303RH/PROTO TEMP. RANGE (oC) -55 to 125 -55 to 125 -55 to 125 -55 to 125 -55 to 125 -55 to 125
NC S3 D3 D1 S1 IN1 GND
GND
HS9-303RH (FLATPACK) CDFP3-F14 TOP VIEW
1 2 3 4 5 6 7 14 13 12 11 10 9 8
V+ S4 D4 D2 S2 IN2 V-
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a trademark of Intersil Americas Inc. Copyright © Intersil Americas Inc. 2001. All Rights Reserved
HS-303RH Functional Diagram
SBDIP TRUTH TABLE
IN N P D
LOGIC 0 1
SW1AND SW2 OFF ON
SW3 AND SW4 ON OFF
Die Characteristics
DIE DIMENSIONS: (2130µm x 1930µm x 279µm ±25.4µm) 84 x 76 x 11mils ±1mil METALLIZATION: Type: Al Thickness: 12.5kÅ ±2kÅ SUBSTRATE POTENTIAL: Unbiased (DI) BACKSIDE FINISH: Gold PASSIVATION: Type: Silox (SiO2) Thickness: 8kÅ ±1kÅ WORST CASE CURRENT DENSITY: < 2.0e5 A/cm2 TRANSISTOR COUNT: 76 PROCESS: Metal Gate CMOS, Dielectric Isolation
Metallization Mask Layout
HS-303RH-T
S3 V+ S4
D3
D4
D1
D2
S1
S2
IN1
IN2
NC
All Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems. Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com 2
GND
V-
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