Silicon N-Channel
Power MOSFET
CRTM024N03L2-G
General Description :
CRTM024N03L2-G, the silicon N-channel Enhanced
VDMOSFETs, is obtained by the high density Trench
technology which reduce the conduction loss, improve switching
VDSS
30
V
ID( Silicon limited current )
150
A
ID( Package limited current )
60
A
PD
91.9
W
RDS(ON)Typ
1.7
mΩ
performance and enhance the avalanche energy. This device can
be used in load switch and power switch applications. The package
form is PDFN5*6, which accords with the RoHS standard.
Features:
Fast Switching
Low ON Resistance(Rdson≤2 . 2mΩ)
Low Gate Charge
Low Reverse transfer capacitances
100% Single Pulse avalanche energy Test
Applications:
load switch and power switch applications.
Absolute(Tj= 25℃ unless otherwise specified)
Symbol
Parameter
VDSS
Drain-to-Source Voltage
Rating
Units
30
V
150
A
Continuous Drain Current TC = 25 °C( Package limited )
60
A
Continuous Drain Current TC = 100 °C( Package limited )
60
A
Pulsed Drain Current TC = 25 °C
240
A
Gate-to-Source Voltage
±20
V
297.56
mJ
91.9
W
0.735
W/℃
150,–55 to 150
℃
Continuous Drain Current TC = 25 °C
ID
a1
IDM
VGS
EAS
a2
PD
TJ,Tstg
Avalanche Energy
Power Dissipation TC = 25 °C
Derating Factor above 25°C
Operating Junction and Storage Temperature Range
W U X I C H I N A R E S O U R C E S H U A J I N G M I C R O E L E C T R O N I C S C O . , LT D .
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CRTM024N03L2-G
Electrical Characteristics(Tj= 25℃ unless otherwise specified):
OFF Characteristics
Symbol
Parameter
Test Conditions
VDSS
Drain to Source Breakdown Voltage
VGS=0V, ID=250µA
IDSS
Drain to Source Leakage Current
VDS =30V, VGS= 0V,
Tj = 25℃
VDS =24V, VGS= 0V,
Tj = 125℃
IGSS(F)
Gate to Source Forward Leakage
IGSS(R)
Gate to Source Reverse Leakage
Rating
Units
Min.
Typ.
Max.
30
--
--
--
--
1
--
--
100
VGS=20V
--
--
100
nA
VGS =-20V
--
--
-100
nA
V
µA
ON Characteristics
Symbol
Parameter
RDS(ON)
Drain-to-Source On-Resistance
VGS(TH)
Gate Threshold Voltage
Test Conditions
Rating
Units
Min.
Typ.
Max.
VGS=10V,ID=19A
--
1.7
2.2
mΩ
VGS=4.5V,ID=19A
--
2.7
3.4
mΩ
0.8
1.3
1.8
V
VDS = VGS, ID = 250µA
Pulse width tp≤300µs,δ≤2%
Dynamic Characteristics
Symbol
Parameter
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Test Conditions
VGS = 0V VDS =15V
f = 1.0MHz
Rating
Min.
Typ.
Max.
--
3574.73
--
--
538.02
--
--
514.13
--
Units
pF
Source-Drain Diode Characteristics
Symbol
Parameter
IS
Continuous Source Current (Body Diode)
ISM
Maximum Pulsed Current (Body Diode)
VSD
Diode Forward Voltage
Test
Conditions
TC = 25 °C
IS=19A,VGS=0V
Rating
Units
Min.
Typ.
Max.
--
--
60
A
--
--
240
A
--
--
1.2
V
Pulse width tp≤300µs,δ≤2%
Symbol
Parameter
Max.
Units
Rθ JC
Junction-to-Case
1.36
℃/W
Rθ JA
Junction-to-Ambient
100
℃/W
W U X I C H I N A R E S O U R C E S H U A J I N G M I C R O E L E C T R O N I C S C O . , LT D .
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a1
:Calculated continuous current based on maximum allowable junction temperature. Note that current
limitations arising from heating of the device leads may occur with some lead mounting arrangements.
a2
:L=0.5mH, I D=34.5A, Start TJ =25℃
a3
:Recommend soldering temperature defined by IPC/JEDEC J-STD 020
W U X I C H I N A R E S O U R C E S H U A J I N G M I C R O E L E C T R O N I C S C O . , LT D .
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CRTM024N03L2-G
Test Circuit and Waveform
Figure 14. Gate Charge Test Circuit
Figure 16. Resistive Switching Test Circuit
Figure 15. Gate Charge Waveforms
Figure 17. Resistive Switching Waveforms
W U X I C H I N A R E S O U R C E S H U A J I N G M I C R O E L E C T R O N I C S C O . , LT D .
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CRTM024N03L2-G
Figure 18. Diode Reverse Recovery Test Circuit
Figure20.Unclamped Inductive Switching Test Circuit
Figure 19. Diode Reverse Recovery Waveform
Figure21.Unclamped Inductive Switching Waveform
W U X I C H I N A R E S O U R C E S H U A J I N G M I C R O E L E C T R O N I C S C O . , LT D .
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CRTM024N03L2-G
Package Information :
Symbol
A
Dimensions In Millimeters
MIN
MAX
0.700
1.200
A3
0.254REF
D
4.844
5.196
E
5.774
6.326
D1
3.810
4.210
E1
3.375
3.575
D2
4.724
5.076
E2
5.574
5.926
k
1.090
1.490
b
0.250
0.550
e
1.270TYP
L
0.459
0.811
L1
0.424
0.576
H
0.474
0.826
θ
10°
12°
PDFN5×6 Package
W U X I C H I N A R E S O U R C E S H U A J I N G M I C R O E L E C T R O N I C S C O . , LT D .
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CRTM024N03L2-G
The name and content of poisonous and harmful material in products
Hazardous Substance
Pb
Hg
Cr(VI)
PBB
PBDE
DIBP
DEHP
DBP
BBP
≤0.1%
≤0.1%
≤0.1%
≤0.1%
≤0.1%
≤0.1%
≤0.1%
≤0.1%
≤0.1%
Lead Frame
○
○
○
○
○
○
○
○
○
○
Molding
○
○
○
○
○
○
○
○
○
○
Compound
Chip
○
○
○
○
○
○
○
○
○
○
Wire Bonding
○
○
○
○
○
○
○
○
○
○
Solder
×
○
○
○
○
○
○
○
○
○
Limit
Cd
≤
0.01%
○:Means the hazardous material is under the criterion of 2011/65/EU.
Note
×:Means the hazardous material exceeds the criterion of 2011/65/EU.
The plumbum element of solder exist in products presently, but within the allowed range
of Eurogroup’s RoHS.
Warnings
1.
2.
3.
4.
Exceeding the maximum ratings of the device in performance may cause damage to the device,
even the permanent failure, which may affect the dependability of the machine. It is suggested
to be used under 80 percent of the maximum ratings of the device.
When installing the heatsink, please pay attention to the torsional moment and the smoothness
of the heatsink.
VDMOSFETs is the device which is sensitive to the static electricity, it is necessary to protect
the device from being damaged by the static electricity when using it.
This publication is made by Huajing Microelectronics and subject to regular change without
notice.
WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD.
Add: No.14 Liangxi RD. Wuxi, Jiangsu, China Mail:214061
http://www. crhj.com.cn
Tel: +86 0510-85807228 Fax: +86- 0510-85800864
HTU
Marketing Part:
Post:214061
UTH
Tel: +86 0510-81805277/81805336
Fax: +86 0510-85800360/85803016
Application and Service:Post:214061 Tel / Fax:+86- 0510-81805243/81805110
W U X I C H I N A R E S O U R C E S H U A J I N G M I C R O E L E C T R O N I C S C O . , LT D .
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