PD-90010
IRF7809AV
• • • • • N-Channel Application-Specific MOSFETs Ideal for CPU Core DC-DC Converters Low Conduction Losses Low Switching Losses Minimizes Parallel MOSFETs for high current applications
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Description This new device employs advanced HEXFET Power MOSFET technology to achieve an unprecedented balance of on-resistance and gate charge. The reduced conduction and switching losses make it ideal for high efficiency DC-DC converters that power the latest generation of microprocessors. The IRF7809AV has been optimized for all parameters that are critical in synchronous buck converters including RDS(on), gate charge and Cdv/dt-induced turn-on immunity. The IRF7809AV offers particulary low RDS(on) and high Cdv/dt immunity for synchronous FET applications. The package is designed for vapor phase, infra-red, convection, or wave soldering techniques. Power dissipation of greater than 2W is possible in a typical PCB mount application.
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SO-8
T o p V ie w
DEVICE CHARACTERISTICS
IRF7809AV RDS(on) QG Qsw Qoss 7.0mΩ 41nC 14nC 30nC
Absolute Maximum Ratings Parameter Drain-Source Voltage Gate-Source Voltage Continuous Drain or Source Current (VGS ≥ 4.5V) Pulsed Drain Current Power Dissipation TA = 25°C TL = 90°C Junction & Storage Temperature Range Continuous Source Current (Body Diode) Pulsed Source Current Thermal Resistance Parameter Maximum Junction-to-Ambient Maximum Junction-to-Lead RθJA RθJL Max. 50 20 Units °C/W °C/W TJ, TSTG IS ISM TA = 25°C TL = 90°C IDM PD Symbol VDS VGS ID IRF7809A V 30 ±12 13.3 14.6 100 2.5 3.0 –55 to 150 2.5 50 °C A W A Units V
10/26/00
IRF7809AV
Electrical Characteristics
Parameter Drain-to-Source Breakdown Voltage Static Drain-Source on Resistance Gate Threshold Voltage Drain-Source Leakage Current BVDSS RDS(on) VGS(th) IDSS 1.0 30 150 IGSS QG QG QGS1 QGS2 QGD Qsw Qoss RG td (on) tr td tf Ciss Coss – – –
(off)
Min 30
Typ – 7.0
Max – 9.0
Units V mΩ V
Conditions VGS = 0V, ID = 250µA VGS = 4.5V, ID = 15A VDS = VGS,ID = 250µA VDS = 24V, VGS = 0 VDS = 24V, VGS = 0, Tj = 100°C VGS = ±12V VGS=5V, ID=15A, VDS=20V VGS = 5V, VDS< 100mV VDS = 20V, ID = 15A
Current*
µA nA
Gate-Source Leakage Current* Total Gate Chg Cont FET Total Gate Chg Sync FET Pre-Vth Gate-Source Charge Post-Vth Gate-Source Charge Gate to Drain Charge Switch Chg(Qgs2 + Qgd) Output Charge* Gate Resistance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Input Capacitance Output Capacitance
±100 41 36 7.0 2.3 12 14 30 1.5 14 36 96 10 3780 1060 130 – – – 21 45 62 54
nC ID=15A, VDS=16V VDS = 16V, VGS = 0 Ω VDD = 16V, ID = 15A ns VGS = 5V Clamped Inductive Load
pF
VDS = 16V, VGS = 0
Reverse Transfer Capacitance Crss
Source-Drain Rating & Characteristics
Parameter Diode Forward Voltage* Reverse Recovery Charge Reverse Recovery Charge (with Parallel Schottky) VSD Qrr Qrr(s) 120 Min Typ Max 1.3 Units V nC Conditions IS = 15A, VGS = 0V di/dt ~ 700A/µs VDS = 16V, VGS = 0V, IS = 15A 150 nC di/dt = 700A/µs (with 10BQ040) VDS = 16V, VGS = 0V, IS = 15A
Notes:
Repetitive rating; pulse width limited by max. junction temperature. Pulse width ≤ 400 µs; duty cycle ≤ 2%. When mounted on 1 inch square copper board, t < 10 sec. Typ = measured - Qoss Typical values measured at VGS = 4.5V, IF = 15A.
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IRF7809AV
1000
VGS 10V 4.5V 3.7V 3.5V 3.3V 3.0V 2.7V BOTTOM 2.5V TOP
1000
I D , Drain-to-Source Current (A)
100
I D , Drain-to-Source Current (A)
VGS 10V 4.5V 3.7V 3.5V 3.3V 3.0V 2.7V BOTTOM 2.5V TOP
100
2.5V
20µs PULSE WIDTH TJ = 150 ° C
1 10 100
2.5V
20µs PULSE WIDTH TJ = 25 ° C
1 10 100
10 0.1
10 0.1
VDS , Drain-to-Source Voltage (V)
VDS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
1000
2.0
ID = 15A
R DS(on) , Drain-to-Source On Resistance (Normalized)
I D , Drain-to-Source Current (A)
1.5
100
1.0
TJ = 150 ° C
TJ = 25 ° C
V DS = 15V 20µs PULSE WIDTH 2.6 2.8 3.0 3.2 3.4
0.5
10 2.4
0.0 -60 -40 -20
VGS = 10V
0 20 40 60 80 100 120 140 160
VGS , Gate-to-Source Voltage (V)
TJ , Junction Temperature ( °C)
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance Vs. Temperature
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IRF7809AV
6000
5000
VGS , Gate-to-Source Voltage (V)
VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd
10
ID = 15A VDS = 20V
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C, Capacitance (pF)
4000
Ciss
3000
6
4
2000
Coss
1000
2
0 1
Crss
10 100 0 0 10 20 30 40 50 60 70
VDS , Drain-to-Source Voltage (V)
Q G , Total Gate Charge (nC)
Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage
1000
1000
ISD , Reverse Drain Current (A)
OPERATION IN THIS AREA LIMITED BY RDS(on)
TJ = 150 ° C
I D , Drain Current (A)
100
100
10us
10
100us
TJ = 25 ° C
1
10
1ms
0.1 0.2
V GS = 0 V
0.6 1.0 1.4 1.8 2.2
1 0.1
TA = 25 ° C TJ = 150 ° C Single Pulse
1 10
10ms
100
VSD ,Source-to-Drain Voltage (V)
VDS , Drain-to-Source Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
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IRF7809AV
16
VDS VGS
RD
D.U.T.
+
I D , Drain Current (A)
12
RG
- VDD
10V
8
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
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VDS 90%
0 25 50 75 100 125 150
TC , Case Temperature
( °C)
10% VGS
td(on) tr t d(off) tf
Fig 9. Maximum Drain Current Vs. Case Temperature
Fig 10b. Switching Time Waveforms
100
D = 0.50
Thermal Response (Z thJA )
10
0.20 0.10 0.05
1
0.02 0.01 P DM t1
0.1
SINGLE PULSE (THERMAL RESPONSE) Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJA + TA 0.0001 0.001 0.01 0.1 1 10
t2
0.01 0.00001
100
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
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IRF7809AV
R DS (on) , Drain-to-Source On Resistance ( Ω )
R DS(on) , Drain-to -Source On Resistance ( Ω )
0.008
0.012
VGS = 4.5V 0.007
0.010
0.006
ID = 15A
0.008
VGS = 10V
0.005 0 20 40 60 80 100 120 ID , Drain Current (A)
0.006 2.5 3.0 3.5 4.0 4.5
VGS, Gate -to -Source Voltage (V)
Fig 12. On-Resistance Vs. Drain Current
Current Regulator Same Type as D.U.T.
Fig 13. On-Resistance Vs. Gate Voltage
50KΩ 12V .2µF .3µF
VGS
QGS
D.U.T. + V - DS
QG QGD
500
EAS , Single Pulse Avalanche Energy (mJ)
VG
VGS
3mA
TOP
400
Charge
IG ID
BOTTOM
ID 6.7A 9.5A 15A
Current Sampling Resistors
Fig 13a&b. Basic Gate Charge Test Circuit and Waveform
300
200
15V
V (B R )D S S tp VD S L DRIVER
100
RG 20 V IAS tp
D.U .T IA S 0.0 1 Ω
+ V - DD
0 25 50 75 100 125 150
A
Starting TJ , Junction Temperature ( °C)
Fig 14a&b. Unclamped Inductive Test circuit and Waveforms
Fig 14c. Maximum Avalanche Energy Vs. Drain Current
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IRF7809AV
SO-8 Package Details
D -B -
D IM
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IN C H E S M IN .0532 .0040 .014 .0 075 .1 89 .150 MAX .0688 .0098 .018 .0 098 .1 96 .157
M IL LIM E T E R S M IN 1 .35 0 .10 0 .36 0 .19 4 .80 3 .81 M AX 1 .75 0 .25 0 .46 0.25 4.98 3 .99
A
6 5 H 0.2 5 (.0 10 ) M AM
5
8 E -A -
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A1 B C D E e e1 H K
0 .10 (.00 4) L 8X 6 C 8X
1
2
3
4
e 6X
e1 A
θ
θ
K x 45 °
.050 B A S IC .025 B A S IC .2 284 .011 0 .16 0° .2 440 .019 .050 8°
1.2 7 B A S IC 0.6 35 B A S IC 5 .80 0 .28 0 .41 0° 6.20 0 .48 1.27 8°
-CB 8X 0 .25 (.01 0) A1 M CASBS
L θ
R E CO M M E ND E D F O O TP R IN T 0 .72 (.02 8 ) 8X
N O TE S : 1 . D IM EN SIO N IN G AN D TO L ER A NC IN G P ER AN S I Y1 4.5 M -198 2. 2 . C O N TRO L LIN G D IM EN SIO N : IN C H . 3 . D IM EN SIO N S A RE SH O W N IN M ILLIM E TE R S (IN C HE S). 4 . O U TLIN E CO N F O RM S TO JED E C O U TLINE M S -0 12 AA . 5 D IM E NS IO N D O ES N O T IN C LU D E M O LD PR O TR US IO N S M O LD P R O TR U SIO NS N O T TO EXCE ED 0 .2 5 (.00 6). 6 D IM E NS IO N S IS TH E LE N G TH O F L EA D FO R SO L DE R IN G TO A SU B STRA TE..
6 .46 ( .25 5 )
1 .78 (.07 0) 8X
1.27 ( .0 50 ) 3X
SO-8 Part Marking
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IRF7809AV
SO-8 Tape and Reel
T E R M IN A L N UM B E R 1
1 2 .3 ( .4 8 4 ) 1 1 .7 ( .4 6 1 )
8 .1 ( .31 8 ) 7 .9 ( .31 2 )
F E E D D IRE C T IO N
NOTES: 1 . C O N T R O L L IN G D IM E N S IO N : M IL L IM E T E R . 2 . A L L D IM E N S IO N S A R E S H O W N IN M IL L IM E T E R S (IN C H E S ). 3 . O U T L IN E C O N F O R M S T O E IA -4 8 1 & E IA -5 4 1 .
3 30 .00 ( 12 .9 9 2 ) M A X.
1 4.4 0 ( .5 6 6 ) 1 2.4 0 ( .4 8 8 ) N O TES : 1 . CO N T R O L L IN G DIM E N S IO N : M IL L IME T E R . 2 . O UT L IN E C O N F O R M S T O E IA -4 8 1 & E IA -54 1 .
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