PD - 94449
HEXFET® POWER MOSFET THRU-HOLE (TO-257AA)
IRF7Y1405CM 55V, N-CHANNEL
Product Summary
Part Number
IRF7Y1405CM BVDSS
55V
RDS(on) ID 0.0153Ω 18A*
Seventh Generation HEXFET® power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon unit area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. These devices are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits.
TO-257AA
Features:
n n n n n n n
Low RDS(on) Avalanche Energy Ratings Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Light Weight
Absolute Maximum Ratings
Parameter
ID @ VGS = 10V, TC = 25°C ID @ VGS = 10V, TC = 100°C IDM PD @ TC = 25°C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current ➀ Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy ➁ Avalanche Current ➀ Repetitive Avalanche Energy ➀ Peak Diode Recovery dv/dt ➂ Operating Junction Storage Temperature Range Lead Temperature Weight * Current is limited by package For footnotes refer to the last page 18* 18* 72 100 0.8 ±20 308 18 10 1.8 -55 to 150 300 (0.063in./1.6mm from case for 10s) 4.3 (Typical)
Units A
W
W/°C
V mJ A mJ V/ns
o
C
g
www.irf.com
1
05/31/02
IRF7Y1405CM
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter
BVDSS Drain-to-Source Breakdown Voltage ∆ BV DSS/ ∆ T J Temperature Coefficient of Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS Zero Gate Voltage Drain Current
Min
55 — — 2.0 36 — — — — — — — — — — — —
Typ Max Units
— 0.057 — — — — — — — — — — — — — — 6.8 — — 0.0153 4.0 — 25 250 100 -100 200 40 80 20 90 250 150 — V V/°C Ω V S( ) µA
Ω
Test Conditions
VGS = 0V, ID = 250µA Reference to 25°C, ID = 1.0mA VGS = 10V, ID = 18A ➃ VDS = VGS, ID = 250µA VDS =15V, IDS = 18A ➃ VDS = 55V ,VGS=0V VDS = 44V, VGS = 0V, TJ=125°C VGS = 20V VGS = -20V VGS =10V, ID = 18A VDS = 44V VDD = 28V, ID = 18A, VGS = 10V, RG = 2.5Ω
IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf LS + LD
Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (‘Miller’) Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Inductance
nA nC
ns
nH
l Ciss C oss C rss
Input Capacitance Output Capacitance Reverse Transfer Capacitance
— — —
5080 1300 300
— — —
pF
Measured from drain lead (6mm/ 0.25in. from package ) to source lead (6mm/0.25in. from pacakge VGS = 0V, VDS = 25V f = 1.0MHz
Source-Drain Diode Ratings and Characteristics
Parameter
IS ISM VSD t rr QRR ton Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) ➀ Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
Min Typ Max Units
— — — — — — — — — — 18* 72 1.3 100 350
Test Conditions
A
V ns nC Tj = 25°C, IS = 18A, VGS = 0V ➃ Tj = 25°C, IF = 18A, di/dt ≤ 100A/µs VDD ≤ 25V ➃
Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
* Current is limited by package
Thermal Resistance
Parameter
RthJC Junction-to-Case
Min Typ Max Units
— — 1.25
°C/W
Test Conditions
Note: Corresponding Spice and Saber models are available on the G&S Website. For footnotes refer to the last page
2
www.irf.com
IRF7Y1405CM
1000
VGS 15V 10V 7.0V 5.0V 4.5V 4.3V 4.0V BOTTOM 3.7V TOP
1000
VGS 15V 10V 7.0V 5.0V 4.5V 4.3V 4.0V BOTTOM 3.7V TOP
ID, Drain-to-Source Current (A)
100
ID, Drain-to-Source Current (A)
100
10
10
1
3.7V 20µs PULSE WIDTH
Tj = 150°C 1 0.1 1 10 100
3.7V
0.1 0.1 1 20µs PULSE WIDTH Tj = 25°C 10 100
VDS, Drain-to-Source Voltage (V)
VDS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
100
2.0
T J = 150°C
R DS(on) , Drain-to-Source On Resistance (Normalized)
ID = 18A
ID, Drain-to-Source Current (Α )
1.5
10
T J = 25°C
1.0
1
0.5
VDS = 25V 15 20µs PULSE WIDTH
0.1 3.6 3.8 4.0 4.2 4.4 4.6 4.8 5.0 5.2
0.0 -60 -40 -20
VGS = 10V
0 20 40 60 80 100 120 140 160
VGS, Gate-to-Source Voltage (V)
TJ , Junction Temperature( °C)
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance Vs. Temperature
www.irf.com
3
IRF7Y1405CM
8000
VGS , Gate-to-Source Voltage (V)
C, Capacitance (pF)
6000
VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd
20
ID = 18A
16
Ciss
VDS = 44V VDS = 27V VDS = 11V
12
4000
C oss
2000
8
C rss
0 1 10 100
4
0 0 60
FOR TEST CIRCUIT SEE FIGURE 13
180 120 240
VDS , Drain-to-Source Voltage (V)
QG , Total Gate Charge (nC)
Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage
100
100 T J = 150°C
OPERATION IN THIS AREA LIMITED BY RDS(on)
ISD , Reverse Drain Current ( Α )
ID, Drain-to-Source Current (A)
10 T J = 25°C
100µs
10
1ms
1
0.1 0.2 0.4 0.6 0.8 1.0 1.2
VGS = 0V 1.4 1.6 1.8
Tc = 25°C Tj = 150°C Single Pulse 1 1 10
10ms
100
1000
VSD , Source-to-Drain Voltage ( V )
VDS , Drain-toSource Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
4
www.irf.com
IRF7Y1405CM
70
LIMITED BY PACKAGE
60
V DS VGS RG
RD
D.U.T.
+
I D , Drain Current (A)
50
-V DD
40
VGS
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
30
20
Fig 10a. Switching Time Test Circuit
VDS 90%
10
0 25 50 75 100 125 150
TC , Case Temperature ( ° C)
10% VGS
td(on) tr t d(off) tf
Fig 9. Maximum Drain Current Vs. Case Temperature
Fig 10b. Switching Time Waveforms
10
Thermal Response (Z thJC )
1 D = 0.50 0.20 0.10 0.1 0.05 0.02 0.01
SINGLE PULSE (THERMAL RESPONSE) 0.0001 0.001 0.01
0.01 0.00001
Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.1
P DM t1 t2 1
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com
5
IRF7Y1405CM
800
EAS , Single Pulse Avalanche Energy (mJ)
1 5V
600
ID 8.0A 11.4A BOTTOM 18A TOP
VD S
L
D R IV E R
RG
D .U .T.
IA S
400
+ V - DD
A
VGS 20V
tp
0 .0 1 Ω
200
Fig 12a. Unclamped Inductive Test Circuit
V (B R )D S S tp
0 25 50 75 100 125 150
Starting TJ , Junction Temperature ( ° C)
Fig 12c. Maximum Avalanche Energy Vs. Drain Current
IAS
Fig 12b. Unclamped Inductive Waveforms
Current Regulator Same Type as D.U.T.
50KΩ 12V .2µF .3µF
QG
10V
QGS VG QGD
VGS
3mA
D.U.T.
+ V - DS
IG
ID
Charge
Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform
Fig 13b. Gate Charge Test Circuit
6
www.irf.com
IRF7Y1405CM
Footnotes:
Repetitive Rating; Pulse width limited by
maximum junction temperature. VDD = 25 V, Starting TJ = 25°C, L= 1.9 mH Peak IAS = 18A, VGS =10V, RG= 25Ω
ISD ≤ 18A, di/dt ≤ 230 A/µs, Pulse width ≤ 300 µs; Duty Cycle ≤ 2%
VDD ≤ 55V, TJ ≤ 150°C
Case Outline and Dimensions — TO-257AA
A 10.66 [.420] 10.42 [.410] 3X Ø 3.81 [.150] 3.56 [.140] 5.08 [.200] 4.83 [.190] 0.13 [.005] 1.14 [.045] 0.89 [.035]
13.63 [.537] 13.39 [.527]
16.89 [.665] 16.39 [.645] 10.92 [.430] 10.42 [.410] 1 2 3
B
C 15.88 [.625] 12.70 [.500]
0.71 [.028] MAX.
2.54 [.100] 2X 3X Ø
0.88 [.035] 0.64 [.025] CA B
3.05 [.120]
Ø 0.50 [.020]
NOTES : 1. 2. 3. 4. DIMENS IONING & TOLERANCING PER ANS I Y14.5M-1994. CONTROLLING DIMENS ION: INCH. DIMENS IONS ARE S HOWN IN MILLIMET ERS [INCHES ]. OUT LINE CONFORMS TO JEDEC OUTLINE T O-257AA.
P IN AS S IGNME NT S
1 = GAT E 2 = DRAIN 3 = S OURCE
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 05/02
www.irf.com
7