PD - 94603
HEXFET® POWER MOSFET THRU-HOLE (Low-ohmic TO-257AA)
IRF7YSZ44VCM 60V, N-CHANNEL
Product Summary
Part Number
IRF7YSZ44VCM BVDSS
60V
RDS(on) ID 0.0195Ω 20A*
Seventh Generation HEXFET® power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon unit area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. These devices are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits.
Low Ohmic TO-257AA
Features:
n n n n n n n
Low RDS(on) Avalanche Energy Ratings Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Light Weight
Absolute Maximum Ratings
Parameter
ID @ VGS = 10V, TC = 25°C ID @ VGS = 10V, TC = 100°C IDM PD @ TC = 25°C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current ➀ Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy ➁ Avalanche Current ➀ Repetitive Avalanche Energy ➀ Peak Diode Recovery dv/dt ➂ Operating Junction Storage Temperature Range Lead Temperature Weight * Current is limited by package For footnotes refer to the last page 20* 20* 80 50 0.4 ±20 71 20 5.0 1.6 -55 to 150 300 (0.063in./1.6mm from case for 10s) 4.3 (Typical)
Units A
W
W/°C
V mJ A mJ V/ns
o
C
g
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IRF7YSZ44VCM
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter
BVDSS Drain-to-Source Breakdown Voltage ∆BV DSS/ ∆ T J Temperature Coefficient of Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage g fs Forward Transconductance IDSS Zero Gate Voltage Drain Current
Min
60 — — 2.0 17 — — — — — — — — — — — —
Typ Max Units
— 0.064 — — — — — — — — — — — — — — 6.8 — — 0.0195 4.0 — 25 250 100 -100 50 18 25 20 120 60 90 — V V/°C Ω V S( ) µA
Ω
Test Conditions
VGS = 0V, ID = 250µA Reference to 25°C, ID = 250µA VGS = 10V, ID = 20A ➃ VDS = VGS, ID = 250µA VDS =15V, IDS = 20A ➃ VDS = 60V ,VGS=0V VDS = 48V, VGS = 0V, TJ=125°C VGS = 20V VGS = -20V VGS =10V, ID = 20A VDS = 48V VDD = 30V, ID = 20A, VGS = 10V, RG = 9.1Ω
IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf LS + LD
Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (‘Miller’) Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Inductance
nA nC
ns
nH
l Ciss C oss C rss
Input Capacitance Output Capacitance Reverse Transfer Capacitance
— — —
1730 375 60
— — —
pF
Measured from drain lead (6mm/ 0.25in. from package ) to source lead (6mm/0.25in. from pacakge VGS = 0V, VDS = 25V f = 1.0MHz
Source-Drain Diode Ratings and Characteristics
Parameter
IS ISM VSD trr QRR ton Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) ➀ Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
Min Typ Max Units
— — — — — — — — — — 20* 80 1.2 105 220
Test Conditions
A
V ns nC Tj = 25°C, IS = 20A, VGS = 0V ➃ Tj = 25°C, IF = 20A, di/dt ≤ 100A/µs VDD ≤ 25V ➃
Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
* Current is limited by package
Thermal Resistance
Parameter
RthJC Junction-to-Case
Min Typ Max
— — 2.5
Units
°C/W
Test Conditions
Note: Corresponding Spice and Saber models are available on the G&S Website. For footnotes refer to the last page
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IRF7YSZ44VCM
1000
ID, Drain-to-Source Current (A)
100
10 4.5V 1 0.1 1 10 100 VDS , Drain-to-Source Voltage (V)
ID, Drain-to-Source Current (A)
VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP
1000
100
VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP
10
4.5V
20µs PULSE WIDTH Tj = 25°C
20µs PULSE WIDTH Tj = 150°C 1 0.1 1 10 100.0 VDS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
100
2.5
TJ = 150°C
R DS(on) , Drain-to-Source On Resistance (Normalized)
I D = 20A
ID , Drain-to-Source Current ( Α )
2.0
TJ = 25°C 10
1.5
1.0
VDS = 25V 20 µs 15 PULSE WIDTH 1.0 4 4.5 5 5.5 6 6.5 7 7.5 8 VGS, Gate-to-Source Voltage (V)
0.5
0.0 -60 -40 -20
VGS = 10V
0 20 40 60 80 100 120 140 160
TJ , Junction Temperature ( °C)
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance Vs. Temperature
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IRF7YSZ44VCM
3000
VGS = 0V, f = 1 MHZ Ciss = C + C , C SHORTED gs gd ds
12 ID = 20A VDS = 48V VDS = 30V VDS= 12V 8
2000
Ciss
1500
VGS, Gate-to-Source Voltage (V)
100
2500
Crss = C gd Coss = C + C ds gd
C, Capacitance (pF)
1000
Coss
4
500
Crss
0 1 10
0 0 5 10 15 20 25 30 35 40
VDS, Drain-to-Source Voltage (V)
QG Total Gate Charge (nC)
Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage
100
1000
OPERATION IN THIS AREA LIMITED BY RDS(on)
ISD , Reverse Drain Current ( Α )
T J = 150°C T J = 25°C 10
ID , Drain-to-Source Current (A)
100
10
100µs 1ms
1 Tc = 25°C Tj = 150°C Single Pulse 0.1 1 10
10ms
VGS = 0V 1.0 0.4 0.6 0.8 1.0 1.2 1.4 1.6 VSD , Source-to-Drain Voltage (V)
100
1000
VDS , Drain-toSource Voltage (V)
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
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IRF7YSZ44VCM
40
LIMITED BY PACKAGE
30
V DS VGS RG
RD
D.U.T.
+
I D , Drain Current (A)
-V DD
VGS
20
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
10
Fig 10a. Switching Time Test Circuit
VDS 90%
0 25 50 75 100 125 150
TC , Case Temperature ( °C)
10% VGS
td(on) tr t d(off) tf
Fig 9. Maximum Drain Current Vs. Case Temperature
Fig 10b. Switching Time Waveforms
10
Thermal Response (Z thJC )
D = 0.50 1 0.20 0.10 0.05 0.1 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE)
0.01 0.00001
Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.1 0.0001 0.001 0.01 1
P DM t1 t2
t1 , Rectangular Pulse Duration (sec)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRF7YSZ44VCM
150
EAS , Single Pulse Avalanche Energy (mJ)
1 5V
120
ID 9.0A 12.6A BOTTOM 20A TOP
VDS
L
D R IV E R
90
RG
2VV 0 GS tp
D .U .T.
IA S
+ V - DD
A
60
0 .0 1 Ω
30
Fig 12a. Unclamped Inductive Test Circuit
V (B R )D SS tp
0 25 50 75 100 125 150
Starting TJ , Junction Temperature ( ° C)
Fig 12c. Maximum Avalanche Energy Vs. Drain Current
IAS
Fig 12b. Unclamped Inductive Waveforms
Current Regulator Same Type as D.U.T.
50KΩ 12V .2µF .3µF
QG
10V
QGS VG QGD
VGS
3mA
D.U.T.
+ V - DS
IG
ID
Charge
Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform
Fig 13b. Gate Charge Test Circuit
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IRF7YSZ44VCM
Footnotes:
Repetitive Rating; Pulse width limited by
maximum junction temperature. VDD = 25 V, Starting TJ = 25°C, L= 0.35mH Peak I AS = 20A, VGS =10V, RG= 25Ω
ISD ≤ 20A, di/dt ≤ 310A/µs, Pulse width ≤ 300 µs; Duty Cycle ≤ 2%
VDD ≤ 60V, TJ ≤ 150°C
Case Outline and Dimensions — Low-ohmic TO-257AA
A 10.66 [.420] 10.42 [.410] 3.81 [.150] 3X Ø 3.56 [.140] 5.08 [.200] 4.83 [.190] 0.13 [.005] 1.14 [.045] 0.89 [.035]
13.63 [.537] 13.39 [.527]
16.89 [.665] 16.39 [.645] 10.92 [.430] 10.42 [.410] 1 2 3
B
C 15.88 [.625] 12.70 [.500]
0.71 [.028] MAX.
2.54 [.100] 2X 3X Ø
0.88 [.035] 0.64 [.025] CA B
3.05 [.120]
Ø 0.50 [.020]
NOT ES : 1. 2. 3. 4. DIMENS IONING & TOLERANCING PE R ANS I Y14.5M-1994. CONTROLLING DIMENS ION: INCH. DIMENS IONS ARE S HOWN IN MILLIME TERS [INCHES ]. OUTLINE CONFORMS TO JEDEC OUTLINE TO-257AA.
P IN AS S IGNME NT S
1 = DRAIN 2 = S OURCE 3 = GATE
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 02/03
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