IS42S32200L
IS45S32200L
512K Bits x 32 Bits x 4 Banks (64-MBIT)
SYNCHRONOUS DYNAMIC RAM
FEATURES
• Clock frequency: 200, 166, 143, 133 MHz
• Fully synchronous; all signals referenced to a
positive clock edge
• Internal bank for hiding row access/precharge
OCTOBER 2019
OVERVIEW
ISSI's 64Mb Synchronous DRAM IS42/45S32200L is
organized as 524,288 bits x 32-bit x 4-bank for improved
performance.The synchronous DRAMs achieve high-speed
data transfer using pipeline architecture. All inputs and
outputs signals refer to the rising edge of the clock input.
• Single 3.3V power supply
• LVTTL interface
• Programmable burst length:
(1, 2, 4, 8, full page)
• Programmable burst sequence:
Sequential/Interleave
• Self refresh modes
• 4096 refresh cycles every 16ms (A2 grade) or
64ms (Commercia, Industrial, A1 grade)
• Random column address every clock cycle
• Programmable CAS latency (2, 3 clocks)
• Burst read/write and burst read/single write
operations capability
KEY TIMING PARAMETERS
Parameter
-5 -6 -7 Unit
Clk Cycle Time
CAS Latency = 3
5
6
7
ns
CAS Latency = 2
7.5 7.5 7.5
ns
Clk Frequency
CAS Latency = 3
200 166 143 Mhz
CAS Latency = 2
133 133 133 Mhz
Access Time from Clock
CAS Latency = 3
4.8 5.4 5.4
ns
CAS Latency = 2
5.4 5.4 5.4
ns
• Burst termination by burst stop and precharge
command
OPTIONS
• Packages:
86-pin TSOP-II
90-ball TF-BGA
• Operating temperature range:
Commercial (0oC to + 70oC)
Industrial (-40oC to + 85oC)
Automotive Grade, A1 (-40oC to + 85oC)
Automotive Grade, A2: (-40oC to +105oC)
Copyright © 2019 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without
notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such applications unless Integrated Silicon
Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
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Rev. A2
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IS42S32200L, IS45S32200L
GENERAL DESCRIPTION
The 64Mb SDRAM is a high speed CMOS, dynamic
random-access memory designed to operate in 3.3V
memory systems containing 67,108,864 bits. Internally
configured as a quad-bank DRAM with a synchronous
interface. Each 16,777,216-bit bank is organized as 2,048
rows by 256 columns by 32 bits.
The 64Mb SDRAM includes an AUTO REFRESH MODE,
and a power-saving, power-down mode. All signals are
registered on the positive edge of the clock signal, CLK.
All inputs and outputs are LVTTL compatible.
The 64Mb SDRAM has the ability to synchronously burst
data at a high data rate with automatic column-address
generation, the ability to interleave between internal banks
to hide precharge time and the capability to randomly
change column addresses on each clock cycle during
burst access.
A self-timed row precharge initiated at the end of the burst
sequence is available with the AUTO PRECHARGE function
enabled. Precharge one bank while accessing one of the
other three banks will hide the precharge cycles and provide
seamless, high-speed, random-access operation.
SDRAM read and write accesses are burst oriented starting
at a selected location and continuing for a programmed
number of locations in a programmed sequence. The
registration of an ACTIVE command begins accesses,
followed by a READ or WRITE command. The ACTIVE
command in conjunction with address bits registered are
used to select the bank and row to be accessed (BA0,
BA1 select the bank; A0-A10 select the row). The READ
or WRITE commands in conjunction with address bits
registered are used to select the starting column location
for the burst access.
Programmable READ or WRITE burst lengths consist of
1, 2, 4 and 8 locations or full page, with a burst terminate
option.
FUNCTIONAL BLOCK DIAGRAM
DQM0-3
DATA IN
BUFFER
COMMAND
DECODER
&
CLOCK
GENERATOR
32
11
DQ 0-31
SELF
REFRESH
A10
CONTROLLER
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
BA0
BA1
32
REFRESH
CONTROLLER
MODE
REGISTER
32
VDD/VDDQ
DATA OUT
BUFFER
GND/GNDQ
32
11
MULTIPLEXER
REFRESH
COUNTER
ROW
ADDRESS
LATCH
11
11
COLUMN
ADDRESS LATCH
ROW
ADDRESS
BUFFER
ROW DECODER
CLK
CKE
CS
RAS
CAS
WE
2048
2048
2048
2048
MEMORY CELL
ARRAY
BANK 0
SENSE AMP I/O GATE
256
(x 32)
BANK CONTROL LOGIC
BURST COUNTER
COLUMN
ADDRESS BUFFER
2
COLUMN DECODER
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Rev. A2
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IS42S32200L, IS45S32200L
PIN CONFIGURATIONS
86 pin TSOP - Type II for x32
VDD
1
86
VSS
DQ0
2
85
DQ15
VDDQ
3
84
VSSQ
DQ1
4
83
DQ14
DQ2
5
82
DQ13
VSSQ
6
81
VDDQ
DQ3
7
80
DQ12
DQ4
8
79
DQ11
VDDQ
9
78
VSSQ
DQ5
10
77
DQ10
DQ6
11
76
DQ9
VSSQ
12
75
VDDQ
DQ7
13
74
DQ8
NC
14
73
NC
VDD
15
72
VSS
DQM0
16
71
DQM1
WE
17
70
NC
CAS
18
69
NC
RAS
19
68
CLK
CS
20
67
CKE
NC
21
66
A9
BA0
22
65
A8
BA1
23
64
A7
A10
24
63
A6
A0
25
62
A5
A1
26
61
A4
A2
27
60
A3
DQM2
28
59
DQM3
VDD
29
58
VSS
NC
30
57
NC
DQ16
31
56
DQ31
VSSQ
32
55
VDDQ
DQ17
33
54
DQ30
DQ18
34
53
DQ29
VDDQ
35
52
VSSQ
DQ19
36
51
DQ28
DQ20
37
50
DQ27
VSSQ
38
49
VDDQ
DQ21
39
48
DQ26
DQ22
40
47
DQ25
VDDQ
41
46
VSSQ
DQ23
42
45
DQ24
VDD
43
44
VSS
PIN DESCRIPTIONS
A0-A10
A0-A7
BA0, BA1
DQ0 to DQ31
CLK
CKE
Row Address Input
Column Address Input
Bank Select Address
Data I/O
System Clock Input
Clock Enable
CS
Chip Select
RAS
Row Address Strobe Command
CAS
Column Address Strobe Command
WE
DQM0-DQM3
Vdd
Vss
Vddq
Vssq
NC
Write Enable
x32 Input/Output Mask
Power
Ground
Power Supply for I/O Pin
Ground for I/O Pin
No Connection
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Rev. A2
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IS42S32200L, IS45S32200L
PIN CONFIGURATION
PACKAGE CODE: B 90 BALL TF-BGA (Top View) (8.00 mm x 13.00 mm Body, 0.8 mm Ball Pitch)
1 2 3 4 5 6 7 8 9
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
DQ26 DQ24
VSS
VDD DQ23 DQ21
DQ28 VDDQ VSSQ
VDDQ VSSQ DQ19
VSSQ DQ27 DQ25
DQ22 DQ20 VDDQ
VSSQ DQ29 DQ30
DQ17 DQ18 VDDQ
VDDQ DQ31
NC
NC
DQ16 VSSQ
VSS DQM3
A3
A2
DQM2 VDD
A4
A5
A6
A10
A0
A1
A7
A8
NC
NC
BA1
NC
CLK
CKE
A9
BA0
CS
RAS
DQM1
NC
NC
CAS
WE DQM0
VSS
VDD
DQ7 VSSQ
VSSQ DQ10 DQ9
DQ6
DQ5 VDDQ
VSSQ DQ12 DQ14
DQ1
DQ3 VDDQ
VDDQ DQ8
DQ11 VDDQ VSSQ
DQ13 DQ15
VSS
VDDQ VSSQ DQ4
VDD
DQ0
DQ2
PIN DESCRIPTIONS
A0-A10
A0-A7
BA0, BA1
DQ0 to DQ31
CLK
CKE
Row Address Input
Column Address Input
Bank Select Address
Data I/O
System Clock Input
Clock Enable
CS
Chip Select
RAS
Row Address Strobe Command
CAS
Column Address Strobe Command
4
WE
DQM0-DQM3
Vdd
Vss
Vddq
Vssq
NC
Write Enable
x32 Input/Output Mask
Power
Ground
Power Supply for I/O Pin
Ground for I/O Pin
No Connection
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
PIN FUNCTIONS
Symbol
A0-A10
Pin No. (TSOP)
Type
25 to 27
Input Pin
60 to 66
24
Function (In Detail)
Address Inputs: A0-A10 are sampled during the ACTIVE
command (row-address A0-A10) and READ/WRITE command (A0-A7
with A10 defining auto precharge) to select one location out of the memory array
in the respective bank. A10 is sampled during a PRECHARGE command to determine if all banks are to be precharged (A10 HIGH) or bank selected by
BA0, BA1 (LOW). The address inputs also provide the op-code during a LOAD
MODE REGISTER command.
BA0, BA1
22,23
Input Pin
Bank Select Address: BA0 and BA1 defines which bank the ACTIVE, READ, WRITE
or PRECHARGE command is being applied.
CAS
18
Input Pin
CAS, in conjunction with the RAS and WE, forms the device command. See the
"Command Truth Table" for details on device commands.
CKE
67
Input Pin
The CKE input determines whether the CLK input is enabled. The next rising edge
of the CLK signal will be valid when is CKE HIGH and invalid when LOW. When CKE
is LOW, the device will be in either power-down mode, clock suspend mode, or self
refresh mode. CKE is an asynchronous input.
CLK
68
Input Pin
CLK is the master clock input for this device. Except for CKE, all inputs to this device
are acquired in synchronization with the rising edge of this pin.
CS
20
Input Pin The CS input determines whether command input is enabled within the device.
Command input is enabled when CS is LOW, and disabled with CS is HIGH. The
device remains in the previous state when CS is HIGH.
DQ0 to 2, 4, 5, 7, 8, 10,11,13
DQ Pin
DQ0 to DQ15 are DQ pins. DQ through these pins can be controlled in byte units
DQ31 74,76,77,79,80,82,83,85
using the DQM0-DQM3 pins
45,47,48,50,51,53,54,56
31,33,34,36,37,39,40,42
DQM0
16,28,59,71
Input Pin
DQMx control thel ower and upper bytes of the DQ buffers. In read mode,
DQM3
the output buffers are place in a High-Z state. During a WRITE cycle the input data
is masked. When DQMx is sampled HIGH and is an input mask signal for write
accesses and an output enable signal for read accesses. DQ0 through DQ7 are
controlled by DQM0. DQ8 throughDQ15 are controlled by DQM1. DQ16 through
DQ23 are controlled by DQM2. DQ24 through DQ31 are controlled by DQM3.
RAS
19
Input Pin
RAS, in conjunction with CAS and WE, forms the device command. See the "Command Truth Table" item for details on device commands.
17
Input Pin
WE, in conjunction with RAS and CAS, forms the device command. See the "Com WE
mand Truth Table" item for details on device commands.
Vddq
3,9,35,41,49,55,75,81 Supply Pin Vddq is the output buffer power supply.
Vdd
1,15,29,43
Supply Pin Vdd is the device internal power supply.
GNDq 6,12,32,38,46,52,78,84 Supply Pin GNDq is the output buffer ground.
GND
44,58,72,86
Supply Pin GND is the device internal ground.
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Rev. A2
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IS42S32200L, IS45S32200L
READ
AUTO PRECHARGE does not apply except in full-page
burst mode. Upon completion of the READ or WRITE
burst, a precharge of the bank/row that is addressed is
automatically performed.
The READ command selects the bank from BA0, BA1 inputs
and starts a burst read access to an active row. Inputs
A0-A7 provides the starting column location. When A10 is
HIGH, this command functions as an AUTO PRECHARGE
command. When the auto precharge is selected, the row
being accessed will be precharged at the end of the READ
burst. The row will remain open for subsequent accesses
when AUTO PRECHARGE is not selected. DQ’s read
data is subject to the logic level on the DQM inputs two
clocks earlier. When a given DQM signal was registered
HIGH, the corresponding DQ’s will be High-Z two clocks
later. DQ’s will provide valid data when the DQM signal
was registered LOW.
This command executes the AUTO REFRESH operation.
The row address and bank to be refreshed are automatically
generated during this operation. The stipulated period (trc) is
required for a single refresh operation, and no other commands can be executed during this period. This command
is executed at least 4096 times every tref. During an AUTO
REFRESH command, address bits are “Don’t Care”. This
command corresponds to CBR Auto-refresh.
WRITE
SELF REFRESH
A burst write access to an active row is initiated with the
WRITE command. BA0, BA1 inputs selects the bank,
and the starting column location is provided by inputs
A0-A7. Whether or not AUTO-PRECHARGE is used is
determined by A10.
The row being accessed will be precharged at the end of
the WRITE burst, if AUTO PRECHARGE is selected. If
AUTO PRECHARGE is not selected, the row will remain
open for subsequent accesses.
A memory array is written with corresponding input data
on DQ’s and DQM input logic level appearing at the same
time. Data will be written to memory when DQM signal is
LOW. When DQM is HIGH, the corresponding data inputs
will be ignored, and a WRITE will not be executed to that
byte/column location.
During the SELF REFRESH operation, the row address to
be refreshed, the bank, and the refresh interval are generated automatically internally. SELF REFRESH can be
used to retain data in the SDRAM without external clocking,
even if the rest of the system is powered down. The SELF
REFRESH operation is started by dropping the CKE pin
from HIGH to LOW. During the SELF REFRESH operation
all other inputs to the SDRAM become “Don’t Care”.The
device must remain in self refresh mode for a minimum
period equal to tras or may remain in self refresh mode
for an indefinite period beyond that.The SELF-REFRESH
operation continues as long as the CKE pin remains LOW
and there is no need for external control of any other pins.
The next command cannot be executed until the device
internal recovery period (trc) has elapsed. Once CKE
goes HIGH, the NOP command must be issued (minimum
of two clocks) to provide time for the completion of any
internal refresh in progress. After the self-refresh, since it
is impossible to determine the address of the last row to
be refreshed, an AUTO-REFRESH should immediately be
performed for all addresses.
PRECHARGE
The PRECHARGE command is used to deactivate the
open row in a particular bank or the open row in all banks.
BA0, BA1 can be used to select which bank is precharged
or they are treated as “Don’t Care”. A10 determined
whether one or all banks are precharged. After executing this command, the next command for the selected
banks(s) is executed after passage of the period tRP, which
is the period required for bank precharging. Once a bank
has been precharged, it is in the idle state and must be
activated prior to any READ or WRITE commands being
issued to that bank.
AUTO REFRESH COMMAND
BURST TERMINATE
The BURST TERMINATE command forcibly terminates
the burst read and write operations by truncating either
fixed-length or full-page bursts and the most recently
registered READ or WRITE command prior to the BURST
TERMINATE.
AUTO PRECHARGE
COMMAND INHIBIT
The AUTO PRECHARGE function ensures that the precharge is initiated at the earliest valid stage within a burst.
This function allows for individual-bank precharge without
requiring an explicit command. A10 to enables the AUTO
PRECHARGE function in conjunction with a specific READ
or WRITE command. For each individual READ or WRITE
command, auto precharge is either enabled or disabled.
NO OPERATION
6
COMMAND INHIBIT prevents new commands from being
executed. Operations in progress are not affected, apart
from whether the CLK signal is enabled
When CS is low, the NOP command prevents unwanted
commands from being registered during idle or wait
states.
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Rev. A2
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IS42S32200L, IS45S32200L
LOAD MODE REGISTER
During the LOAD MODE REGSITER command the mode
register is loaded from A0-A10. This command can only
be issued when all banks are idle.
ACTIVE COMMAND
When the ACTIVE COMMAND is activated, BA0, BA1
inputs selects a bank to be accessed, and the address
inputs on A0-A10 selects the row. Until a PRECHARGE
command is issued to the bank, the row remains open
for accesses.
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Rev. A2
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IS42S32200L, IS45S32200L
TRUTH TABLE – COMMANDS AND DQM OPERATION(1)
FUNCTION
CS RAS CAS WE DQM
ADDR DQs
COMMAND INHIBIT (NOP)
H X X X X
X
X
NO OPERATION (NOP)
L
H
H
H
X
X
X
ACTIVE (Select bank and activate row)(3)
L
L
H
H
X Bank/Row X
READ (Select bank/column, start READ burst)(4)
L H L H
L/H(8)
Bank/Col X
(4)
(8)
WRITE (Select bank/column, start WRITE burst)
L H L L
L/H
Bank/Col Valid
BURST TERMINATE
L H H L X
X
Active
PRECHARGE (Deactivate row in bank or banks)(5)
L L H L X
Code
X
(6,7)
AUTO REFRESH or SELF REFRESH L L L H X
X
X
(Enter self refresh mode)
LOAD MODE REGISTER(2)
L L L L X
Op-Code
X
(8)
Write Enable/Output Enable — — — —
L —
Active
Write Inhibit/Output High-Z(8) — — — —
H —
High-Z
NOTES:
1. CKE is HIGH for all commands except SELF REFRESH.
2. A0-A10 define the op-code written to the mode register.
3. A0-A10 provide row address, and BA0, BA1 determine which bank is made active.
4. A0-A7 (x32) provide column address; A10 HIGH enables the auto precharge feature (nonpersistent), while A10 LOW disables
auto precharge; BA0, BA1 determine which bank is being read from or written to.
5. A10 LOW: BA0, BA1 determine the bank being precharged. A10 HIGH: All banks precharged and BA0, BA1 are “Don’t Care.”
6. AUTO REFRESH if CKE is HIGH, SELF REFRESH if CKE is LOW.
7. Internal refresh counter controls row addressing; all inputs and DQs are “Don’t Care” except for CKE.
8. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay).
8
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IS42S32200L, IS45S32200L
TRUTH TABLE – CKE (1-4)
CURRENT STATE
Power-Down
Self Refresh
Clock Suspend
Power-Down(5)
Self Refresh(6)
Clock Suspend(7)
All Banks Idle
All Banks Idle
Reading or Writing
COMMANDn
X
X
X
COMMAND INHIBIT or NOP
COMMAND INHIBIT or NOP
X
COMMAND INHIBIT or NOP
AUTO REFRESH
VALID
ACTIONn
Maintain Power-Down
Maintain Self Refresh
Maintain Clock Suspend
Exit Power-Down
Exit Self Refresh
Exit Clock Suspend
Power-Down Entry
Self Refresh Entry
Clock Suspend Entry
CKEn-1 CKEn
L
L
L
L
L
L
L
H
L
H
L
H
H
L
H
L
H
L
See TRUTH TABLE – CURRENT STATE BANK n, COMMAND TO BANK n H
H
NOTES:
1. CKEn is the logic state of CKE at clock edge n; CKEn-1 was the state of CKE at the previous clock edge.
2. Current state is the state of the SDRAM immediately prior to clock edge n.
3. COMMANDn is the command registered at clock edge n, and ACTONn is a result of COMMANDn.
4. All states and sequences not shown are illegal or reserved.
5. Exiting power-down at clock edge n will put the device in the all banks idle state in time for clock edge n+1 (provided that tcks is
met).
6. Exiting self refresh at clock edge n will put the device in all banks idle state once txsr is met. COMMAND INHIBIT or NOP
commands should be issued on clock edges occurring during the txsr period. A minimum of two NOP commands must be sent
during txsr period.
7. After exiting clock suspend at clock edge n, the device will resume operation and recognize the next command at clock edge
n+1.
TRUTH TABLE – CURRENT STATE BANK n, COMMAND TO BANK n (1-6)
CURRENT STATE COMMAND (ACTION)
Any
COMMAND INHIBIT (NOP/Continue previous operation)
NO OPERATION (NOP/Continue previous operation)
Idle
ACTIVE (Select and activate row)
AUTO REFRESH(7)
LOAD MODE REGISTER(7)
PRECHARGE(11)
Row Active
READ (Select column and start READ burst)(10)
WRITE (Select column and start WRITE burst)(10)
PRECHARGE (Deactivate row in bank or banks)(8)
Read
READ (Select column and start new READ burst)(10)
(Auto
WRITE (Select column and start WRITE burst)(10)
Precharge
PRECHARGE (Truncate READ burst, start PRECHARGE)(8)
Disabled)
BURST TERMINATE(9)
Write
READ (Select column and start READ burst)(10)
(Auto
WRITE (Select column and start new WRITE burst)(10)
Precharge
PRECHARGE (Truncate WRITE burst, start PRECHARGE)(8)
Disabled)
BURST TERMINATE(9)
CS RAS CAS WE
H X X X
L H H H
L
L
H
H
L L L H
L L L L
L L H L
L H L H
L H L L
L L H L
L H L H
L H L L
L L H L
L H H L
L H L H
L H L L
L L H L
L H H L
NOTE:
1. This table applies when CKE n-1 was HIGH and CKE n is HIGH (see Truth Table - CKE) and after txsr has been met (if the
previous state was SELF REFRESH).
2. This table is bank-specific, except where noted; i.e., the current state is for a specific bank and the commands shown are those
allowed to be issued to that bank when in that state. Exceptions are covered in the notes below.
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IS42S32200L, IS45S32200L
3. Current state definitions:
Idle: The bank has been precharged, and trp has been met.
Row Active: A row in the bank has been activated, and trcd has been met. No data bursts/accesses and no register
accesses are in progress.
Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
4. The following states must not be interrupted by a command issued to the same bank. COMMAND INHIBIT or NOP commands,
or allowable commands to the other bank should be issued on any clock edge occurring during these states. Allowable commands to the other bank are determined by its current state and CURRENT STATE BANK n truth tables.
Precharging: Starts with registration of a PRECHARGE command and ends when trp is met. Once trp is met, the bank
will be in the idle state.
Row Activating: Starts with registration of an ACTIVE command and ends when trcd is met. Once trcd is met, the bank will
be in the row active state.
Read w/Auto
Precharge Enabled: Starts with registration of a READ command with auto precharge enabled and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
Write w/Auto
Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
5. The following states must not be interrupted by any executable command; COMMAND INHIBIT or NOP commands must be
applied on each positive clock edge during these states.
Refreshing: Starts with registration of an AUTO REFRESH command and ends when trc is met. Once trc is met, the
SDRAM will be in the all banks idle state.
Accessing Mode
Register: Starts with registration of a LOAD MODE REGISTER command and ends when tmrd has been met. Once
tmrd is met, the SDRAM will be in the all banks idle state.
Precharging All: Starts with registration of a PRECHARGE ALL command and ends when trp is met. Once trp is met, all
banks will be in the idle state.
6. All states and sequences not shown are illegal or reserved.
7. Not bank-specific; requires that all banks are idle.
8. May or may not be bank-specific; if all banks are to be precharged, all must be in a valid state for precharging.
9. Not bank-specific; BURST TERMINATE affects the most recent READ or WRITE burst, regardless of bank.
10. READs or WRITEs listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and
READs or WRITEs with auto precharge disabled.
11. Does not affect the state of the bank and acts as a NOP to that bank.
10
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IS42S32200L, IS45S32200L
TRUTH TABLE – CURRENT STATE BANK n, COMMAND TO BANK m (1-6)
CURRENT STATE COMMAND (ACTION)
Any
COMMAND INHIBIT (NOP/Continue previous operation)
NO OPERATION (NOP/Continue previous operation)
Idle
Any Command Otherwise Allowed to Bank m
Row
ACTIVE (Select and activate row)
Activating,
READ (Select column and start READ burst)(7)
Active, or
WRITE (Select column and start WRITE burst)(7)
Precharging
PRECHARGE
Read
ACTIVE (Select and activate row)
(Auto
READ (Select column and start new READ burst)(7,10)
Precharge
WRITE (Select column and start WRITE burst)(7,11)
Disabled) PRECHARGE(9)
Write
ACTIVE (Select and activate row)
(Auto
READ (Select column and start READ burst)(7,12)
Precharge
WRITE (Select column and start new WRITE burst)
Disabled) PRECHARGE(9)
Read
ACTIVE (Select and activate row)
(With Auto
READ (Select column and start new READ burst)(7,8,14)
Precharge)
WRITE (Select column and start WRITE burst)(7,8,15)
PRECHARGE(9)
Write
ACTIVE (Select and activate row)
(With Auto
READ (Select column and start READ burst)(7,8,16)
Precharge)
WRITE (Select column and start new WRITE burst)(7,8,17)
PRECHARGE(9)
(7,13)
CS RAS CAS WE
H
X
X
X
L
H
H
H
X X X X
L
L
H
H
L H L H
L H L L
L L H L
L
L
H
H
L H L H
L H L L
L L H L
L
L
H
H
L H L H
L H L L
L L H L
L
L
H
H
L H L H
L H L L
L L H L
L
L
H
H
L H L H
L H L L
L L H L
NOTE:
1. This table applies when CKE n-1 was HIGH and CKE n is HIGH (Truth Table - CKE) and after txsr has been met (if the previous state was self refresh).
2. This table describes alternate bank operation, except where noted; i.e., the current state is for bank n and the commands
shown are those allowed to be issued to bank m (assuming that bank m is in such a state that the given command is allowable). Exceptions are covered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and trp has been met.
Row Active: A row in the bank has been activated, and trcd has been met. No data bursts/accesses and no register
accesses are in progress.
Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been terminated.
Read w/Auto
Precharge Enabled: Starts with registration of a READ command with auto precharge enabled, and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
Write w/Auto
Precharge Enabled: Starts with registration of a WRITE command with auto precharge enabled, and ends when trp has been
met. Once trp is met, the bank will be in the idle state.
4. AUTO REFRESH, SELF REFRESH and LOAD MODE REGISTER commands may only be issued when all banks are idle.
5. A BURST TERMINATE command cannot be issued to another bank; it applies to the bank represented by the current state
only.
6. All states and sequences not shown are illegal or reserved.
7. READs or WRITEs to bank m listed in the Command (Action) column include READs or WRITEs with auto precharge enabled
and READs or WRITEs with auto precharge disabled.
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8. CONCURRENT AUTO PRECHARGE: Bank n will initiate the AUTO PRECHARGE command when its burst has been interrupted by bank m’s burst.
9. Burst in bank n continues as initiated.
10. For a READ without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt
the READ on bank n, CAS latency later (Consecutive READ Bursts).
11. For a READ without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered (READ to WRITE). DQM should be used one clock prior to the WRITE command to
prevent bus contention.
12. For a WRITE without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt
the WRITE on bank n when registered (WRITE to READ), with the data-out appearing CAS latency later. The last valid WRITE
to bank n will be data-in registered one clock prior to the READ to bank m.
13. For a WRITE without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when registered (WRITE to WRITE). The last valid WRITE to bank n will be data-in registered one
clock prior to the READ to bank m.
14. For a READ with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the
READ on bank n, CAS latency later. The PRECHARGE to bank n will begin when the READ to bank m is registered (Fig CAP
1).
15. For a READ with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt
the READ on bank n when registered. DQM should be used two clocks prior to the WRITE command to prevent bus contention.
The PRECHARGE to bank n will begin when the WRITE to bank m is registered (Fig CAP 2).
16. For a WRITE with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt
the WRITE on bank n when registered, with the data-out appearing CAS latency later. The PRECHARGE to bank n will begin
after tWR is met, where twr begins when the READ to bank m is registered. The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m (Fig CAP 3).
17. For a WRITE with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt
the WRITE on bank n when registered. The PRECHARGE to bank n will begin after twr is met, where t WR begins when the
WRITE to bank m is registered. The last valid WRITE to bank n will be data registered one clock prior to the WRITE to bank m
(Fig CAP 4).
12
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FUNCTIONAL DESCRIPTION
Initialization
The 64Mb SDRAMs 512K x 32 x 4 banks) are quad-bank
DRAMs which operate at 3.3V and include a synchronous
interface (all signals are registered on the positive edge of
the clock signal, CLK). Each of the 16,777,216-bit banks is
organized as 2,048 rows by 256 columns by 32bits.
Read and write accesses to the SDRAM are burst oriented;
accesses start at a selected location and continue for
a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an ACTIVE command which is then followed by a READ or WRITE
command. The address bits registered coincident with the
ACTIVE command are used to select the bank and row to
be accessed (BA0 and BA1 select the bank, A0-A10 select the
row).The address bits (A0-A7) registered coincident with the
READ or WRITE command are used to select the starting
column location for the burst access.
Prior to normal operation, the SDRAM must be initialized. The following sections provide detailed information
covering device initialization, register definition, command
descriptions and device operation.
SDRAMs must be powered up and initialized in a
predefined manner.
The 64M SDRAM is initialized after the power is applied to
Vdd and Vddq (simultaneously) and the clock is stable.
A 100µs delay is required prior to issuing any command
other than a COMMAND INHIBIT or a NOP. The COMMAND
INHIBIT or NOP may be applied during the 100us period and
continue should at least through the end of the period.
With at least one COMMAND INHIBIT or NOP command
having been applied, a PRECHARGE command should
be applied once the 100µs delay has been satisfied. All
banks must be precharged. This will leave all banks
in an idle idle state where two AUTO REFRESH cycles
must be performed. After the AUTO REFRESH cycles are
complete, the SRDRAM is then ready for mode register
programming.
The mode register should be loaded prior to applying
any operational command because it will power up in an
unknown state.
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REGISTER DEFINITION
Mode Register
Mode register bits M0-M2 specify the burst length, M3
specifies the type of burst (sequential or interleaved), M4- M6
specify the CAS latency, M7 and M8 specify the operating
mode, M9 specifies the WRITE burst mode, and M10 and
M11 and M12 are reserved for future use.
The mode register must be loaded when all banks are
idle, and the controller must wait the specified time before
initiating the subsequent operation.Violating either of these
requirements will result in unspecified operation.
The mode register is used to define the specific mode
of operation of the SDRAM. This definition includes the
selection of a burst length, a burst type, a CAS\ latency,
an operating mode and a write burst mode, as shown in
MODE REGISTER DEFINITION.
The mode register is programmed via the LOAD MODE
REGISTER command and will retain the stored information
until it is programmed again or the device loses power.
MODE REGISTER DEFINITION
BA0,1
0
(1)
A10/AP
0
A9
A8
A7
A6
A5
A4
(1)
A3
A2
A1
A0
Address Bus
Burst Type
M3Type
0
1
Sequential
Interleaved
Burst Length
M2 M1 M0
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Sequential
Interleave
1
2
4
8
Reserved
Reserved
Reserved
Full Page
1
2
4
8
Reserved
Reserved
Reserved
Reserved
Latency Mode
M6 M5 M4
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
CAS Latency
Reserved
Reserved
2
3
Reserved
Reserved
Reserved
Reserved
MRS
M8 M7
MRS
0
—
Mode Register Set
All Other States Reserved
0
—
Write Burst Mode
M9
0
1
14
Mode
Burst Write
Single-Bit Write
Note:
1. Maintain low during Mode Register Set.
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Burst Length
Read and write accesses to the SDRAM are burst oriented,
with the burst length being programmable, as shown in
MODE REGISTER DEFINITION. The burst length determines the maximum number of column locations that can
be accessed for a given READ or WRITE command. Burst
lengths of 1, 2, 4 or 8 locations are available for both the
sequential and the interleaved burst types, and a full-page
burst is available for the sequential type. The full-page
burst is used in conjunction with the BURST TERMINATE
command to generate arbitrary burst lengths.
Reserved states should not be used, as unknown operation
or incompatibility with future versions may result.
When a READ or WRITE command is issued, a block of
columns equal to the burst length is effectively selected. All
accesses for that burst take place within this block, mean-
ing that the burst will wrap within the block if a boundary
is reached. The block is uniquely selected by A1-A7 (x32)
when the burst length is set to two; by A2-A7 (x32) when
the burst length is set to four; and by A3-A7 (x32) when the
burst length is set to eight. The remaining (least significant)
address bit(s) is (are) used to select the starting location
within the block. Full-page bursts wrap within the page if
the boundary is reached.
Burst Type
Accesses within a given burst may be programmed to be
either sequential or interleaved; this is referred to as the
burst type and is selected via bit M3.
The ordering of accesses within a burst is determined by
the burst length, the burst type and the starting column
address, as shown in BURST DEFINITION table.
BURST DEFINITION
Burst Starting Column
Order of Accesses Within a Burst
Length
Address
Type = Sequential
Type = Interleaved
A0
2
0
0-1 0-1
1
1-0
1-0
A1 A0
0 0
0-1-2-3
0-1-2-3
4
0
1 1-2-3-0 1-0-3-2
1 0
2-3-0-1
2-3-0-1
1 1
3-0-1-2
3-2-1-0
A2 A1 A0
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7
0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6
0
1
0
2-3-4-5-6-7-0-1
2-3-0-1-6-7-4-5
8
0
1
1
3-4-5-6-7-0-1-2
3-2-1-0-7-6-5-4
1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3
1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2
1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1
1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Full
n = A0-A7
Cn, Cn + 1, Cn + 2
Not Supported
Page
Cn + 3, Cn + 4...
(y)
(location 0-y)
…Cn - 1,
Cn…
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CAS Latency
Operating Mode
The CAS latency is the delay, in clock cycles, between
the registration of a READ command and the availability of
the first piece of output data. The latency can be set to two or
three clocks.
If a READ command is registered at clock edge n, and
the latency is m clocks, the data will be available by clock
edge n + m. The DQs will start driving as a result of the
clock edge one cycle earlier (n + m - 1), and provided that
the relevant access times are met, the data will be valid by
clock edge n + m. For example, assuming that the clock
cycle time is such that all relevant access times are met,
if a READ command is registered at T0 and the latency
is programmed to two clocks, the DQs will start driving
after T1 and the data will be valid by T2, as shown in CAS
Latency diagrams. The Allowable Operating Frequency
table indicates the operating frequencies at which each
CAS latency setting can be used.
Reserved states should not be used as unknown operation
or incompatibility with future versions may result.
The normal operating mode is selected by setting M7 and M8
to zero; the other combinations of values for M7 and M8 are
reserved for future use and/or test modes. The programmed
burst length applies to both READ and WRITE bursts.
Test modes and reserved states should not be used because unknown operation or incompatibility with future
versions may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0-M2
applies to both READ and WRITE bursts; when M9 = 1,
the programmed burst length applies to READ bursts, but
write accesses are single-location (nonburst) accesses.
CAS Latency
Allowable Operating Frequency (MHz)
Speed
-5
-6
-7
CAS Latency = 2
133
133
133
CAS Latency = 3
200
166
143
CAS Latency
T0
T1
T2
T3
READ
NOP
NOP
CLK
COMMAND
tAC
DOUT
DQ
tOH
tLZ
CAS Latency - 2
T0
T1
T2
T3
T4
READ
NOP
NOP
NOP
CLK
COMMAND
tAC
DOUT
DQ
tLZ
tOH
CAS Latency - 3
DON'T CARE
UNDEFINED
16
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OPERATION
Activating Specific Row Within Specific Bank
BANK/ROW ACTIVATION
Before any READ or WRITE commands can be issued
to a bank within the SDRAM, a row in that bank must be
“opened.” This is accomplished via the ACTIVE command,
which selects both the bank and the row to be activated
(see Activating Specific Row Within Specific Bank).
After opening a row (issuing an ACTIVE command), a READ
or WRITE command may be issued to that row, subject to
the trcd specification. Minimum trcd should be divided by
the clock period and rounded up to the next whole number
to determine the earliest clock edge after the ACTIVE
command on which a READ or WRITE command can be
entered. For example, a trcd specification of 20ns with a
125 MHz clock (8ns period) results in 2.5 clocks, rounded
to 3. This is reflected in the following example, which covers any case where 2 < [trcd (MIN)/tck] ≤ 3. (The same
procedure is used to convert other specification limits from
time units to clock cycles).
A subsequent ACTIVE command to a different row in the
same bank can only be issued after the previous active
row has been “closed” (precharged). The minimum time
interval between successive ACTIVE commands to the
same bank is defined by trc.
CLK
CKE
HIGH
CS
RAS
CAS
WE
A0-A10
ROW ADDRESS
BA0, BA1
BANK ADDRESS
A subsequent ACTIVE command to another bank can be
issued while the first bank is being accessed, which results
in a reduction of total row-access overhead. The minimum
time interval between successive ACTIVE commands to
different banks is defined by trrd.
Example: Meeting trcd (MIN) when 2 < [trcd (min)/tck] ≤ 3
T0
T1
T2
ACTIVE
NOP
NOP
T3
T4
CLK
COMMAND
READ or
WRITE
tRCD
DON'T CARE
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READS
READ bursts are initiated with a READ command, as
shown in the READ COMMAND diagram.
The starting column and bank addresses are provided with
the READ command, and auto precharge is either enabled or
disabled for that burst access. If auto precharge is enabled,
the row being accessed is precharged at the completion of
the burst. For the generic READ commands used in the following illustrations, auto precharge is disabled.
During READ bursts, the valid data-out element from the
starting column address will be available following the
CAS latency after the READ command. Each subsequent
data-out element will be valid by the next positive clock
edge. The CAS Latency diagram shows general timing
for each possible CAS latency setting.
Upon completion of a burst, assuming no other commands
have been initiated, the DQs will go High-Z. A full-page burst
will continue until terminated. (At the end of the page, it will
wrap to column 0 and continue.)
Data from any READ burst may be truncated with a subsequent READ command, and data from a fixed-length
READ burst may be immediately followed by data from a
READ command. In either case, a continuous flow of data
can be maintained. The first data element from the new
burst follows either the last element of a completed burst
or the last desired data element of a longer burst which
is being truncated.
The new READ command should be issued x cycles before
the clock edge at which the last desired data element is
valid, where x equals the CAS latency minus one. This is
shown in Consecutive READ Bursts for CAS latencies of
two and three; data element n + 3 is either the last of a
burst of four or the last desired of a longer burst. The 64Mb
SDRAM uses a pipelined architecture and therefore does
not require the 2n rule associated with a prefetch architecture. A READ command can be initiated on any clock cycle
following a previous READ command. Full-speed random
read accesses can be performed to the same bank, as
shown in Random READ Accesses, or each subsequent
READ may be performed to a different bank.
Data from any READ burst may be truncated with a subsequent WRITE command, and data from a fixed-length
READ burst may be immediately followed by data from a
WRITE command (subject to bus turnaround limitations).
The WRITE burst may be initiated on the clock edge immediately following the last (or last desired) data element
from the READ burst, provided that DQ contention can be
avoided. In a given system design, there may be a possibility that the device driving the input data will go Low-Z
before the SDRAM DQs go High-Z. In this case, at least
a single-cycle delay should occur between the last read
data and the WRITE command.
18
READ COMMAND
CLK
CKE
HIGH
CS
RAS
CAS
WE
A0-A7
COLUMN ADDRESS
A8, A9
AUTO PRECHARGE
A10
NO PRECHARGE
BA0, BA1
BANK ADDRESS
The DQM input is used to avoid DQ contention, as shown in
Figures RW1 and RW2. The DQM signal must be asserted
(HIGH) at least two clocks prior to the WRITE command
(DQM latency is two clocks for output buffers) to suppress
data-out from the READ. Once the WRITE command is
registered, the DQs will go High-Z (or remain High-Z),
regardless of the state of the DQM signal, provided the
DQM was active on the clock just prior to the WRITE
command that truncated the READ command. If not, the
second WRITE will be an invalid WRITE. For example, if
DQM was LOW during T4 in Figure RW2, then the WRITEs
at T5 and T7 would be valid, while the WRITE at T6 would
be invalid.
The DQM signal must be de-asserted prior to the WRITE
command (DQM latency is zero clocks for input buffers)
to ensure that the written data is not masked. Figure RW1
shows the case where the clock frequency allows for bus
contention to be avoided without adding a NOP cycle,
and Figure RW2 shows the case where the additional
NOP is needed.
A fixed-length READ burst may be followed by, or truncated
with, a PRECHARGE command to the same bank (provided
that auto precharge was not activated), and a full-page burst
may be truncated with a PRECHARGE command to the
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same bank.The PRECHARGE command should be issued
x cycles before the clock edge at which the last desired
data element is valid, where x equals the CAS latency
minus one. This is shown in the READ to PRECHARGE
diagram for each possible CAS latency; data element n +
3 is either the last of a burst of four or the last desired of
a longer burst. Following the PRECHARGE command, a
subsequent command to the same bank cannot be issued
until trp is met. Note that part of the row precharge time is
hidden during the access of the last data element(s).
In the case of a fixed-length burst being executed to
completion, a PRECHARGE command issued at the
optimum time (as described above) provides the same
operation that would result from the same fixed-length
burst with auto precharge. The disadvantage of the PRE-
CHARGE command is that it requires that the command
and address buses be available at the appropriate time to
issue the command; the advantage of the PRECHARGE
command is that it can be used to truncate fixed-length
or full-page bursts.
Full-page READ bursts can be truncated with the BURST
TERMINATE command, and fixed-length READ bursts
may be truncated with a BURST TERMINATE command,
provided that auto precharge was not activated.The BURST
TERMINATE command should be issued x cycles before
the clock edge at which the last desired data element is
valid, where x equals the CAS latency minus one. This is
shown in the READ Burst Termination diagram for each
possible CAS latency; data element n + 3 is the last desired
data element of a longer burst.
CAS Latency
T0
T1
T2
T3
READ
NOP
NOP
CLK
COMMAND
tAC
DOUT
DQ
tOH
tLZ
CAS Latency - 2
T0
T1
T2
T3
T4
READ
NOP
NOP
NOP
CLK
COMMAND
tAC
DOUT
DQ
tLZ
tOH
CAS Latency - 3
DON'T CARE
UNDEFINED
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Consecutive READ Bursts
T0
T1
T2
T3
T4
T5
T6
READ
NOP
NOP
NOP
READ
NOP
NOP
DOUT n+3
DOUT b
CLK
COMMAND
x =1 cycle
BANK,
COL n
ADDRESS
BANK,
COL b
DQ
DOUT n
DOUT n+1
DOUT n+2
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
T4
READ
NOP
NOP
NOP
READ
T5
T6
T7
NOP
NOP
NOP
DOUT n+3
DOUT b
CLK
COMMAND
x = 2 cycles
ADDRESS
BANK,
COL n
BANK,
COL b
DQ
DOUT n
DOUT n+1
DOUT n+2
CAS Latency - 3
DON'T CARE
20
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Random READ Accesses
T0
T1
T2
T3
T4
T5
COMMAND
READ
READ
READ
READ
NOP
NOP
ADDRESS
BANK,
COL n
BANK,
COL b
BANK,
COL m
BANK,
COL x
CLK
DQ
DOUT n
DOUT b
DOUT m
DOUT x
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
T4
T5
T6
COMMAND
READ
READ
READ
READ
NOP
NOP
NOP
ADDRESS
BANK,
COL n
BANK,
COL b
BANK,
COL m
BANK,
COL x
CLK
DQ
DOUT n
DOUT b
DOUT m
DOUT x
CAS Latency - 3
DON'T CARE
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IS42S32200L, IS45S32200L
RW1 - READ to WRITE
T0
T1
T2
T3
T4
COMMAND
READ
NOP
NOP
NOP
ADDRESS
BANK,
COL n
CLK
DQM
WRITE
BANK,
COL b
tHZ
DOUT n
DQ
DIN b
tDS
CAS Lantency 3
DON'T CARE
RW2 - READ to WRITE With Extra Clock Cycle
T0
T1
T2
T3
T4
T5
COMMAND
READ
NOP
NOP
NOP
NOP
WRITE
ADDRESS
BANK,
COL n
CLK
DQM
BANK,
COL b
tHZ
DOUT n
DQ
DIN b
tDS
CAS Lantency 3
22
DON'T CARE
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READ to PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
tRP
COMMAND
READ
NOP
NOP
NOP
NOP
PRECHARGE
NOP
ACTIVE
x = 1 cycle
ADDRESS
BANK a,
COL n
BANK
(a or all)
DQ
DOUT n
DOUT n+1
BANK a,
ROW
DOUT n+2
DOUT n+3
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
tRP
COMMAND
READ
NOP
NOP
NOP
NOP
PRECHARGE
NOP
ACTIVE
x = 2 cycles
ADDRESS
BANK,
COL n
BANK,
COL b
DQ
DOUT n
DOUT n+1
BANK a,
ROW
DOUT n+2
DOUT n+3
CAS Latency - 3
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com 23
Rev. A2
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IS42S32200L, IS45S32200L
READ Burst Termination
T0
T1
T2
T3
T4
READ
NOP
NOP
NOP
T5
T6
NOP
NOP
CLK
COMMAND
BURST
TERMINATE
x = 1 cycle
BANK a,
COL n
ADDRESS
DQ
DOUT n
DOUT n+1
DOUT n+2
DOUT n+3
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
READ
NOP
NOP
NOP
T4
T5
T6
T7
NOP
NOP
NOP
CLK
COMMAND
BURST
TERMINATE
x = 2 cycles
ADDRESS
BANK,
COL n
DQ
DOUT n
DOUT n+1
DOUT n+2
DOUT n+3
CAS Latency - 3
DON'T CARE
24
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Rev. A2
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IS42S32200L, IS45S32200L
WRITEs
WRITE bursts are initiated with a WRITE command, as
shown in WRITE Command diagram.
WRITE Command
CLK
CKE
HIGH
CS
RAS
CAS
WE
A0-A7
COLUMN ADDRESS
A8, A9
AUTO PRECHARGE
A10
NO PRECHARGE
BA0, BA1
BANK ADDRESS
The starting column and bank addresses are provided with
the WRITE command, and auto precharge is either enabled
or disabled for that access. If auto precharge is enabled,
the row being accessed is precharged at the completion of
the burst. For the generic WRITE commands used in the
following illustrations, auto precharge is disabled.
During WRITE bursts, the first valid data-in element will be
registered coincident with the WRITE command. Subsequent
data elements will be registered on each successive positive clock edge. Upon completion of a fixed-length burst,
assuming no other commands have been initiated, the
DQs will remain High-Z and any additional input data will
be ignored (see WRITE Burst). A full-page burst will continue until terminated. (At the end of the page, it will wrap
to column 0 and continue.)
Data for any WRITE burst may be truncated with a subsequent WRITE command, and data for a fixed-length WRITE
burst may be immediately followed by data for a WRITE
command. The new WRITE command can be issued on
any clock following the previous WRITE command, and the
data provided coincident with the new command applies to
the new command.
An example is shown in WRITE to WRITE diagram. Data
n + 1 is either the last of a burst of two or the last desired
of a longer burst. The 64Mb SDRAM uses a pipelined
architecture and therefore does not require the 2n rule associated with a prefetch architecture. A WRITE command
can be initiated on any clock cycle following a previous
WRITE command. Full-speed random write accesses within
a page can be performed to the same bank, as shown in
Random WRITE Cycles, or each subsequent WRITE may
be performed to a different bank.
Data for any WRITE burst may be truncated with a subsequent READ command, and data for a fixed-length WRITE
burst may be immediately followed by a subsequent READ
command. Once the READ com mand is registered, the
data inputs will be ignored, and WRITEs will not be executed. An example is shown in WRITE to READ. Data n
+ 1 is either the last of a burst of two or the last desired
of a longer burst.
Data for a fixed-length WRITE burst may be fol lowed
by, or truncated with, a PRECHARGE command to the
same bank (provided that auto precharge was not activated), and a full-page WRITE burst may be truncated
with a PRECHARGE command to the same bank. The
PRECHARGE command should be issued twr after the
clock edge at which the last desired input data element
is registered. The auto precharge mode requires a twr of
at least one clock plus time, regardless of frequency. In
addition, when truncating a WRITE burst, the DQM signal
must be used to mask input data for the clock edge prior
to, and the clock edge coincident with, the PRECHARGE
command. An example is shown in the WRITE to PRECHARGE diagram. Data n+1 is either the last of a burst
of two or the last desired of a longer burst. Following the
PRECHARGE command, a subsequent command to the
same bank cannot be issued until trp is met.
In the case of a fixed-length burst being executed to completion, a PRECHARGE command issued at the optimum
time (as described above) provides the same operation that
would result from the same fixed-length burst with auto
precharge.The disadvantage of the PRECHARGE command
is that it requires that the command and address buses be
available at the appropriate time to issue the command; the
advantage of the PRECHARGE command is that it can be
used to truncate fixed-length or full-page bursts.
Fixed-length or full-page WRITE bursts can be truncated
with the BURST TERMINATE command. When truncating a WRITE burst, the input data applied coincident with
the BURST TERMINATE command will be ignored. The
last data written (provided that DQM is LOW at that time)
will be the input data applied one clock previous to the
BURST TERMINATE command. This is shown in WRITE
Burst Termination, where data n is the last desired data
element of a longer burst.
Integrated Silicon Solution, Inc. — www.issi.com 25
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
WRITE Burst
T0
T1
T2
T3
COMMAND
WRITE
NOP
NOP
NOP
ADDRESS
BANK,
COL n
CLK
DQ
DIN n
DIN n+1
Burst length = 2 DQM ix low.
DON'T CARE
WRITE to WRITE
T0
T1
T2
COMMAND
WRITE
NOP
WRITE
ADDRESS
BANK,
COL n
CLK
DQ
BANK,
COL b
DIN n
DIN n+1
DIN b
DQMx is low. Each Write Command
DON'T CARE
may be to any bank.
Random WRITE Cycles
T0
T1
T2
T3
COMMAND
WRITE
WRITE
WRITE
WRITE
ADDRESS
BANK,
COL n
BANK,
COL b
BANK,
COL m
BANK,
COL x
DIN b
DIN m
DIN x
CLK
DQ
DIN n
DQMx is low. Each Write Command
may be to any bank.
26
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
WRITE to READ
T0
T1
T2
T3
T4
T5
COMMAND
WRITE
NOP
READ
NOP
NOP
NOP
ADDRESS
BANK,
COL n
DOUT b
DOUT b+1
CLK
DQ
BANK,
COL b
DIN n
DIN n+1
DON'T CARE
WRITE to PRECHARGE (twr = 1 CLK (tck ≥ twr)
T0
T1
T2
T3
T4
T5
T6
CLK
DQM
tRP
COMMAND
WRITE
ADDRESS
BANK a,
COL n
NOP
PRECHARGE
BANK
(a or all)
NOP
NOP
ACTIVE
NOP
BANK a,
ROW
tWR
DQ
DIN n
DIN n+1
DON'T CARE
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Rev. A2
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IS42S32200L, IS45S32200L
WRITE to PRECHARGE (twr = 2 CLK (twr > tck)
T0
T1
T2
T3
T4
T5
T6
CLK
DQM
tRP
COMMAND
WRITE
ADDRESS
BANK a,
COL n
NOP
NOP
PRECHARGE
NOP
BANK
(a or all)
NOP
ACTIVE
BANK a,
ROW
tWR
DQ
DIN n
DIN n+1
DON'T CARE
WRITE Burst Termination
T0
T1
T2
COMMAND
WRITE
BURST
TERMINATE
NEXT
COMMAND
ADDRESS
BANK,
COL n
CLK
DQ
DIN n
(ADDRESS)
(DATA)
DON'T CARE
28
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Rev. A2
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IS42S32200L, IS45S32200L
PRECHARGE Command
PRECHARGE
The PRECHARGE command (see figure) is used to deactivate the open row in a particular bank or the open row in
all banks.The bank(s) will be available for a subsequent row
access some specified time (trp) after the PRECHARGE
command is issued. Input A10 determines whether one or
all banks are to be precharged, and in the case where only
one bank is to be precharged, inputs BA0, BA1 select the
bank. When all banks are to be precharged, inputs BA0,
BA1 are treated as “Don’t Care.” Once a bank has been
precharged, it is in the idle state and must be activated
prior to any READ or WRITE commands being issued to
that bank.
CLK
CKE
HIGH
CS
RAS
CAS
WE
A0-A9
ALL BANKS
A10
POWER-DOWN
Power-down occurs if CKE is registered LOW coincident
with a NOP or COMMAND INHIBIT when no accesses
are in progress. If power-down occurs when all banks are
idle, this mode is referred to as precharge power-down;
if power-down occurs when there is a row active in either
bank, this mode is referred to as active power-down.
Entering power-down deactivates the input and output
buffers, excluding CKE, for maximum power savings while
in standby. The device may not remain in the power-down
state longer than the refresh period (tref) since no refresh
operations are performed in this mode.
The power-down state is exited by registering a NOP or
COMMAND INHIBIT and CKE HIGH at the desired clock
edge (meeting tcks). See figure below.
BANK SELECT
BA0, BA1
BANK ADDRESS
POWER-DOWN
CLK
≥ tCKS
tCKS
CKE
COMMAND
NOP
All banks idle
NOP
Input buffers gated off
Enter power-down mode
Exit power-down mode
ACTIVE
tRCD
tRAS
tRC
DON'T CARE
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
CLOCK SUSPEND
Clock suspend mode occurs when a column access/burst
is in progress and CKE is registered LOW. In the clock
suspend mode, the internal clock is deactivated, “freezing”
the synchronous logic.
For each positive clock edge on which CKE is sampled
LOW, the next internal positive clock edge is suspended.
Any command or data present on the input pins at the time
of a suspended internal clock edge is ignored; any data
present on the DQ pins remains driven; and burst counters
are not incremented, as long as the clock is suspended.
(See following examples.)
Clock suspend mode is exited by registering CKE HIGH;
the internal clock and related operation will resume on the
subsequent positive clock edge.
Clock Suspend During WRITE Burst
T0
T1
NOP
WRITE
T2
T3
T4
T5
NOP
NOP
DIN n+1
DIN n+2
CLK
CKE
INTERNAL
CLOCK
COMMAND
BANK a,
COL n
ADDRESS
DQ
DIN n
Burst Length 4 or greater DQM is low.
DON'T CARE
Clock Suspend During READ Burst
T0
T1
T2
COMMAND
READ
NOP
NOP
ADDRESS
BANK a,
COL n
T3
T4
T5
T6
NOP
NOP
NOP
CLK
CKE
INTERNAL
CLOCK
DQ
DOUT n
CAS Latency=2. Burst Length =4 or greater. DQM is low.
30
DOUT n+1
DOUT n+2
DOUT n+3
DON'T CARE
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Rev. A2
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IS42S32200L, IS45S32200L
BURST READ/SINGLE WRITE
SDRAMs support CONCURRENT AUTO PRECHARGE.
Four cases where CONCURRENT AUTO PRECHARGE
occurs are defined below.
The burst read/single write mode is entered by programming
the write burst mode bit (M9) in the mode register to a logic
1. In this mode, all WRITE commands result in the access
of a single column location (burst of one), regardless of
the programmed burst length. READ commands access
columns according to the programmed burst length and
sequence, just as in the normal mode of operation (M9
= 0).
READ with Auto Precharge
1. Interrupted by a READ (with or without auto precharge):
A READ to bank m will interrupt a READ on bank n,
CAS latency later. The PRECHARGE to bank n will
begin when the READ to bank m is registered.
2. Interrupted by a WRITE (with or without auto precharge):
A WRITE to bank m will interrupt a READ on bank n
when registered. DQM should be used two clocks prior
to the WRITE command to prevent bus contention. The
PRECHARGE to bank n will begin when the WRITE to
bank m is registered.
CONCURRENT AUTO PRECHARGE
An access command (READ or WRITE) to another bank
while an access command with auto precharge enabled is
executing is not allowed by SDRAMs, unless the SDRAM
supports CONCURRENT AUTO PRECHARGE. ISSI
Fig CAP 1 - READ With Auto Precharge interrupted by a READ
T0
T1
T2
T3
T4
T5
T6
T7
NOP
NOP
NOP
NOP
CLK
NOP
COMMAND
BANK n
READ - AP
BANK n
Page Active
NOP
READ - AP
BANK m
READ with Burst of 4
Interrupt Burst, Precharge
Idle
tRP - BANK n
Internal States
BANK m
Page Active
READ with Burst of 4
BANK n,
COL a
ADDRESS
tRP - BANK m
Precharge
BANK m,
COL b
DQ
DOUT a
DOUT a+1
DOUT b
DOUT b+1
CAS Latency - 3 (BANK n)
DON'T CARE
CAS Latency - 3 (BANK m)
Fig CAP 2 - READ With Auto Precharge interrupted by a WRITE
T0
T1
T2
T3
NOP
NOP
NOP
T4
T5
T6
T7
NOP
NOP
NOP
CLK
COMMAND
Read - AP
BANK n
BANK n
Internal States
READ with Burst of 4
Interrupt Burst, Precharge
Page Active
BANK m
ADDRESS
WRITE - AP
BANK m
tRP - BANK n
Page Active
tRP - BANK m
WRITE with Burst of 4
BANK n,
COL a
Idle
Write-Back
BANK m,
COL b
DQM
DOUT a
DQ
CAS Latency - 3 (BANK n)
DIN b
DIN b+1
DIN b+2
DIN b+3
DON'T CARE
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IS42S32200L, IS45S32200L
WRITE with Auto Precharge
4. Interrupted by a WRITE (with or without auto precharge):
AWRITE to bank m will interrupt a WRITE on bank n when
registered. The PRECHARGE to bank n will begin after
twr is met, where twr begins when the WRITE to bank
m is registered. The last valid data WRITE to bank n
will be data registered one clock prior to a WRITE to
bank m.
3. Interrupted by a READ (with or without auto precharge):
A READ to bank m will interrupt a WRITE on bank n
when registered, with the data-out appearing CAS latency
later. The PRECHARGE to bank n will begin after twr
is met, where twr begins when the READ to bank m is
registered. The last valid WRITE to bank n will be data-in
registered one clock prior to the READ to bank m.
Fig CAP 3 - WRITE With Auto Precharge interrupted by a READ
T0
T1
T2
T3
T4
T5
T6
T7
NOP
NOP
NOP
NOP
CLK
NOP
COMMAND
BANK n
WRITE - AP
BANK n
Page Active
NOP
READ - AP
BANK m
WRITE with Burst of 4
Interrupt Burst, Write-Back
Precharge
tWR - BANK n
tRP - BANK n
Internal States
BANK m
Page Active
READ with Burst of 4
BANK n,
COL a
ADDRESS
DQ
DIN a
tRP - BANK m
Precharge
BANK m,
COL b
DIN a+1
DOUT b
DOUT b+1
CAS Latency - 3 (BANK m)
DON'T CARE
Fig CAP 4 - WRITE With Auto Precharge interrupted by a WRITE
T0
T1
T2
T3
NOP
NOP
T4
T5
T6
T7
NOP
NOP
NOP
CLK
NOP
COMMAND
BANK n
WRITE - AP
BANK n
Page Active
WRITE with Burst of 4
WRITE - AP
BANK m
Interrupt Burst, Write-Back
tWR - BANK n
Internal States
BANK m
ADDRESS
DQ
Page Active
WRITE with Burst of 4
BANK n,
COL a
DIN a
Precharge
tRP - BANK n
tRP - BANK m
Write-Back
BANK m,
COL b
DIN a+1
DIN a+2
DIN b
DIN b+1
DIN b+2
DIN b+3
DON'T CARE
32
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Rev. A2
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IS42S32200L, IS45S32200L
ABSOLUTE MAXIMUM RATINGS(1)
Symbol Parameters
Vdd max
Maximum Supply Voltage
Vddq max
Maximum Supply Voltage for Output Buffer
Vin
Input Voltage
Vout
Output Voltage
Pd max
Allowable Power Dissipation
Ics Output Shorted Current
Topr
Operating Temperature
Com.
Ind.
A1:
A2:
Tstg
Storage Temperature
Rating Unit
–1.0 to +4.6
V
–1.0 to +4.6
V
–1.0 to +4.6
V
–1.0 to +4.6
V
1
W
50
mA
0 to +70 °C
–40 to +85
–40 to +85
–40 to +105
–55 to +150
°C
DC RECOMMENDED OPERATING CONDITIONS(2,5)
(Ta = 0°C to +70°C for Com. grade. Ta = -40°C to +85°C for Ind. and A1 grade, Ta = -40°C to +105°C for A2 grade)
Symbol Parameter
Vdd, Vddq
Supply Voltage
Vih
Input High Voltage(3)
Vil
Input Low Voltage(4)
Min. Typ. Max. Unit
3.0 3.3 3.6 V
2.0 — Vdd + 0.3
V
-0.3 — +0.8 V
CAPACITANCE CHARACTERISTICS(2, 6) (At Ta = 0 to +25°C, Vdd = Vddq = 3.3 ± 0.3V, f = 1 MHz)
Symbol
Cin1
Cin2
CI/O
Parameter
Input Capacitance: (CLK)
Input Capacitance: (All other input only pins)
Data Input/Output Capacitance: DQ0-DQ31
Typ. Max. Unit
—
4
pF
—
4
pF
—
6
pF
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.
2. All voltages are referenced to GND.
3. Vih (max) = Vddq + 1.2V with a pulse width ≤ 3 ns. The pluse width cannot be greater than one third of the cycle rate.
4. Vil (min) = GND – 1.2V with a pulse < 3 ns. The pluse width cannot be greater than one third of the cycle rate.
5. An initial pause of 100us is required after power up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (Vdd and VddQ must be powered up simultaneously. GND and GNDQ must be at same potential.) The two
AUTO REFRESH command wake-ups should be repeated anytime the tref refresh requirement is exceeded.
6. The parameter is characterized.
THERMAL RESISTANCE
Package
Substrate
Theta-ja
(Airflow = 0m/s)
Theta-ja
(Airflow = 1m/s)
Theta-ja
(Airflow = 2m/s)
Theta-jc
Units
TSOP2(86)
4-layer
85.4
78.4
74.4
15.0
C/W
BGA(90)
4-layer
47.0
41.7
39.0
8.6
C/W
Integrated Silicon Solution, Inc. — www.issi.com 33
Rev. A2
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IS42S32200L, IS45S32200L
DC ELECTRICAL CHARACTERISTICS 1 (Recommended Operation Conditions unless otherwise noted.)
Symbol Parameter
Test Condition
-5 -6 -7
Unit
(1)
Idd1
Operating Current
One bank active, CL = 3, BL = 1,
80
70
65
mA
tclk = tclk (min), trc = trc (min)
Idd2p
Precharge Standby Current CKE ≤ Vil (max), tck = 15ns
2
2
2
mA
(In Power-Down Mode)
Idd2ps
Precharge Standby Current CKE ≤ Vil (max), CLK ≤ Vil (max)
2 2 2 mA
(In Power-Down Mode)
(2)
Idd2n Precharge Standby Current CS ≥ Vdd - 0.2V, CKE ≥ Vih (min)
16 16 16 mA
(In Non Power-Down Mode) tck = 15ns
Idd2ns
Precharge Standby Current CS ≥ Vdd - 0.2V, CKE ≥ Vih (min) or
10
10
10
mA
(In Non Power-Down Mode) CKE ≤ Vil (max), All inputs stable
(2)
Idd3n Active Standby Current
CS ≥ Vdd - 0.2V, CKE ≥ Vih (min)
22 22 22 mA
(In Non Power-Down Mode) tck = 15ns
Idd3ns
Active Standby Current
CS ≥ Vdd - 0.2V, CKE ≥ Vih (min) or
15
15
15
mA
(In Non Power-Down Mode) CKE ≤ Vil (max), All inputs stable
Idd3p
Active Standby Current
CKE ≤ Vil (max), tck = 15ns
6
6
6
mA
(Power-Down Mode)
Idd3ps
Active Standby Current
CKE ≤ Vil (max), CLK ≤ Vil (max)
6 6 6 mA
(Power-Down Mode)
Idd4
Operating Current
All banks active, BL = 4, CL = 3,
110
100
90
mA
tck = tck (min)
Idd5
Auto-Refresh Current
trc = trc (min), tclk = tclk (min)
100
90
85
mA
Idd6
Self-Refresh Current
CKE ≤ 0.2V
2
2
2
mA
Notes:
1. Idd (max) is specified at the output open condition.
2. Input signals are changed one time during 30ns.
DC ELECTRICAL CHARACTERISTICS 2 (Recommended Operation Conditions unless otherwise noted.)
Symbol Parameter
Iil
Input Leakage Current
Iol
Output Leakage Current
Voh
Output High Voltage Level
Vol
Output Low Voltage Level
34
Test Condition
0V ≤ Vin ≤ Vdd, with pins other than
the tested pin at 0V
Output is disabled, 0V ≤ Vout ≤ Vdd,
Ioh = -2mA
Iol = 2mA
Min
-5
-5
2.4
—
Max Unit
5
µA
5
—
0.4
µA
V
V
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Rev. A2
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IS42S32200L, IS45S32200L
AC ELECTRICAL CHARACTERISTICS (1,2,3)
Symbol Parameter
Condition
tck3
Clock Cycle Time
CAS Latency = 3
tck2
CAS Latency = 2
tac3
Access Time From CLK(4)
CAS Latency = 3
tac2
CAS Latency = 2
tch
CLK HIGH Level Width
tcl
CLK LOW Level Width
toh3
Output Data Hold Time
CAS Latency = 3
toh2
Output Data Hold Time
CAS Latency = 2
tlz
Output LOW Impedance Time
thz3
Output HIGH Impedance Time(5) CAS Latency = 3
thz2
CAS Latency = 2
tds
Input Data Setup Time
tdh
Input Data Hold Time
tas
Address Setup Time
tah
Address Hold Time
tcks
CKE Setup Time
tckh
CKE Hold Time
tcka
CKE to CLK Recovery Delay Time
tcms
Command Setup Time (CS, RAS, CAS, WE, DQM)
tcmh
Command Hold Time (CS, RAS, CAS, WE, DQM)
trc
Command Period (REF to REF / ACT to ACT)
tras
Command Period (ACT to PRE)
trp
Command Period (PRE to ACT)
trcd
Active Command To Read / Write Command Delay Time
trrd
Command Period (ACT [0] to ACT[1])
-5 -6 -7
Min. Max.
Min. Max.
Min. Max. Units
5 —
6 —
7 —
ns
7.5 —
7.5 —
7.5 —
ns
— 4.8
— 5.4
— 5.4
ns
— 5.4
— 5.4
— 5.4
ns
2 —
2.5 —
2.5 —
ns
2 —
2.5 —
2.5 —
ns
2.2 —
2.5 —
2.5 —
ns
2.5 —
2.5 —
2.5 —
ns
0 —
0 —
0 —
ns
— 4.8
— 5.4
— 5.4
ns
— 5.4
— 5.4
— 5.4
ns
1.5 —
1.5 —
1.5 —
ns
0.8 —
0.8 —
0.8 —
ns
1.5 —
1.5 —
1.5 —
ns
0.8 —
0.8 —
0.8 —
ns
1.5 —
1.5 —
1.5 —
ns
0.8 —
0.8 —
0.8 —
ns
1CLK+3 —
1CLK+3 —
1CLK+3 —
ns
1.5 —
1.5 —
1.5 —
ns
0.8 —
0.8 —
0.8 —
ns
55 —
60 —
70 —
ns
38.7 120K
42 120K
42 120K ns
15 —
18 —
20 —
ns
15 —
18 —
20 —
ns
10 —
12 —
14 —
ns
Integrated Silicon Solution, Inc. — www.issi.com 35
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
AC ELECTRICAL CHARACTERISTICS (1,2,3)
-5 -6 -7
Symbol Parameter
Condition Min. Max. Min. Max.
Min. Max.
Units
tdpl3
Input Data To Precharge
CAS Latency = 3 2CLK —
2CLK —
2CLK — ns
Command Delay time
tdpl2
CAS Latency = 2 2CLK —
2CLK —
2CLK — ns
tdal3
Input Data To Active / Refresh CAS Latency = 3 2CLK+trp — 2CLK+trp —
2CLK+trp — ns
Command Delay time (During Auto-Precharge)
tdal2
CAS Latency = 2 2CLK+trp — 2CLK+trp —
2CLK+trp —
ns
tt
Transition Time(2) 0.3 1.2 0.3 1.2
0.3 1.2 ns
twr
Write Recovery Time 1CLK+5ns — 1CLK+6ns — 1CLK+7ns — tck
txsr
Exit Self Refresh to Active Time(6) 60 — 66 —
77 — ns
o
tref
Refresh Cycle Time (4096) Ta ≤ 70 C Com, Ind, — 64
— 64
— 64 ms
A1, A2
Ta ≤ 85oC Ind,A1,A2
— — — 64
— 64 ms
Ta > 85oC
A2 — — — 16
— 16 ms
Notes:
1. An initial pause of 100us is required after power up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (Vdd and Vddq must be powered up simultaneously. GND and GNDQ must be at same potential.) The two
AUTO REFRESH command wake-ups should be repeated anytime the tref refresh requirement is exceeded.
2. Measured with tt = 0.5 ns.
3. The reference level is 1.5V when measuring input signal timing. Rise/fall times are measured between Vih (min.) and Vil (max.).
4. Access time is measured at 1.5V with the load shown in the figure that follows.
5. The time thz (max.) is defined as the time required for the output voltage to transition by ± 200 mV from Voh (min.) or Vol (max.)
when the output is in the high impedance state.
6. CLK must be toggled a minimum of two times during this period.
36
Integrated Silicon Solution, Inc. — www.issi.com
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
OPERATING FREQUENCY / LATENCY RELATIONSHIPS(1)
SYMBOL PARAMETER
CONDITION -5 -6 -7 UNITS
—
Clock Cycle Time
5
6
7
ns
1
1
1
—
Operating Frequency
CL=3
200 166 143 MHz
tccd
READ/WRITE command to READ/WRITE command
1
1
1
cycle
tcked
CKE to clock disable or power-down entry mode
1
1
1
cycle
tped
CKE to clock enable or power-down exit setup mode
1
1
1
cycle
tdqd
DQM to input data delay
0
0
0
cycle
tdqm
DQM to data mask during WRITEs
0
0
0
cycle
tdqz
DQM to data high-impedance during READs
2
2
2
cycle
tdwd
WRITE command to input data delay
0
0
0
cycle
tdal
Data-in to ACTIVE command
CL=3
5
5
5
cycle
CL=2
4 4
4
tdpl
Data-in to PRECHARGE command
2
2
2
cycle
tbdl
Last data-in to burst STOP command
1
1
1
cycle
tcdl
Last data-in to new READ/WRITE command
1
1
1
cycle
trdl
Last data-in to PRECHARGE command
2
2
2
cycle
tmrd
LOAD MODE REGISTER command
2
2
2
cycle
to ACTIVE or REFRESH command
troh
Data-out to high-impedance from
CL = 3
3
3
3
cycle
PRECHARGE command
CL = 2
2
2
2
Note:
1. If CL = 2, the minimum tck2 is 7.5.
AC TEST CONDITIONS (Input/Output Reference Level: 1.4V)
Input Load
Output Load
tCK
tCH
tCL
3V
50 Ω
CLK 1.4V
0V
tCMS
I/O
tCMH
+1.4V
3V
30 pF
INPUT 1.4V
0V
tAC
tOH
OUTPUT
1.4V
1.4V
Integrated Silicon Solution, Inc. — www.issi.com 37
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
INITIALIZE AND LOAD MODE REGISTER(1)
T0
CLK
T1
tCK
Tn+1
tCH
To+1
tCL
Tp+1
Tp+2
Tp+3
tCKS tCKH
CKE
tCMS tCMH
tCMS tCMH
tCMS tCMH
NOP
PRECHARGE
AUTO
REFRESH
COMMAND
NOP
AUTO
REFRESH
NOP
Load MODE
REGISTER
NOP
ACTIVE
DQM0-DQM3
tAS tAH
A0-A9
ALL BANKS
A10
CODE
tAS tAH
ROW
CODE
ROW
SINGLE BANK
BA0, BA1
BANK
ALL BANKS
DQ
T
Power-up: VCC
and CLK stable
tRP
Precharge
all banks
tRFC
AUTO REFRESH
tRFC
AUTO REFRESH
tMRD
Program MODE REGISTER
DON'T CARE
T = 100µs Min.
Notes:
1. If CS is High at clock High time, all commands applied are NOP.
2. The Mode Register may be loaded prior to the Auto-Refresh cycles, if desired.
3. JEDEC and PC100 specify three clocks.
4. Outputs are guaranteed High-Z after the command is issued.
38
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
POWER-DOWN MODE CYCLE
T0
T1
tCK
CLK
tCKS tCKH
T2
tCL
Tn+1
Tn+2
tCH
tCKS
tCKS
CKE
tCMS tCMH
COMMAND
PRECHARGE
NOP
NOP
NOP
ACTIVE
DQM0-DQM3
A0-A9
A10
BA0, BA1
DQ
ROW
ALL BANKS
ROW
SINGLE BANK
tAS tAH
BANK
BANK
High-Z
Two clock cycles
Precharge all
active banks
All banks idle, enter
power-down mode
Input buffers gated
off while in
power-down mode
All banks idle
Exit power-down mode
DON'T CARE
CAS latency = 2, 3
Integrated Silicon Solution, Inc. — www.issi.com 39
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
CLOCK SUSPEND MODE
T0
CLK
tCK
T1
tCKS tCKH
tCL
T2
tCH
T3
T4
T5
T6
NOP
NOP
NOP
T7
T8
T9
tCKS tCKH
CKE
tCMS tCMH
COMMAND
READ
NOP
NOP
WRITE
NOP
tCMS tCMH
DQM0-DQM3
A0-A9
A10
BA0, BA1
tAS tAH
COLUMN m(2)
tAS tAH
COLUMN n
tAS tAH
BANK
BANK
tAC
DQ
tAC
DOUT m
tLZ
tHZ
DOUT m+1
tDS
tDH
DIN N
DIN N +1
tOH
DON'T CARE
UNDEFINED
CAS latency = 2, burst length = 2
40
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
AUTO-REFRESH CYCLE
T0
CLK
tCK
T1
tCL
T2
Tn+1
tCH
To+1
tCKS tCKH
CKE
tCMS tCMH
PRECHARGE
COMMAND
NOP
Auto
Refresh
NOP
Auto
Refresh
NOP
ACTIVE
DQM0-DQM3
A0-A9
ROW
ALL BANKS
A10
ROW
SINGLE BANK
BA0, BA1
DQ
BANK
BANK(s)
tAS tAH
High-Z
tRP
tRFC
tRFC
DON'T CARE
CAS latency = 2, 3
Integrated Silicon Solution, Inc. — www.issi.com 41
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
SELF-REFRESH CYCLE
T0
T1
tCK
CLK
T2
tCH
tCKS tCKH
Tn+1
To+1
To+2
tCL
tCKS
≥ tRAS
CKE
tCKS
tCMS tCMH
COMMAND
PRECHARGE
NOP
Auto
Refresh
NOP
NOP
Auto
Refresh
DQM0-DQM3
A0-A9
A10
BA0, BA1
DQ
ALL BANKS
SINGLE BANK
tAS tAH
BANK
High-Z
tXSR
tRP
Precharge all
active banks
Enter self
refresh mode
CLK stable prior to exiting
Exit self refresh mode
self refresh mode
(Restart refresh time base)
DON'T CARE
Note:
1. Self-Refresh Mode is not supported for A2 grade with Ta > 85oC.
42
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
READ WITHOUT AUTO PRECHARGE
T0
tCK
CLK
T1
tCL
T2
tCH
T3
T4
T5
T6
T7
T8
NOP
ACTIVE
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
NOP
PRECHARGE
tCMS tCMH
DQM0-DQM3
tAS
tAH
A0-A9
ROW
tAS tAH
A10
ROW
tAS tAH
DISABLE AUTO PRECHARGE
SINGLE BANK
BANK
BANK
BANK
BA0, BA1
ROW
COLUMN m
ALL BANKS
ROW
tAC
DQ
tRCD
tRAS
tRC
tLZ
CAS Latency
BANK
tAC
DOUT m
tAC
DOUT m+1
tAC
DOUT m+2
tHZ
DOUT m+3
tOH
tOH
tOH
tOH
DON'T CARE
tRP
UNDEFINED
CAS latency = 2, Burst Length = 4
Integrated Silicon Solution, Inc. — www.issi.com 43
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
READ WITH AUTO PRECHARGE
T0
tCK
CLK
T1
tCL
T2
T3
tCH
T4
T5
T6
T7
T8
NOP
ACTIVE
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
NOP
NOP
tCMS tCMH
DQM0-DQM3
tAS
A0-A9
tAH
COLUMN m)
ROW
tAS tAH
A10
ROW
tAS tAH
BA0, BA1
BANK
ROW
ENABLE AUTO PRECHARGE
ROW
BANK
BANK
tAC
DQ
tRCD
tRAS
tRC
tLZ
CAS Latency
tAC
DOUT m
tAC
DOUT m+1
tAC
DOUT m+2
tHZ
DOUT m+3
tOH
tOH
tOH
tOH
tRP
DON'T CARE
UNDEFINED
CAS latency = 2, Burst Length = 4
44
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
SINGLE READ WITHOUT AUTO PRECHARGE
T0
tCK
CLK
T1
tCL
T2
tCH
T3
T4
T5
T6
T7
T8
ACTIVE
NOP
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
PRECHARGE
NOP
tCMS tCMH
DQM0-DQM3
tAS
A0-A9
A10
BA0, BA1
tAH
ROW
tAS tAH
ROW
COLUMN m
ALL BANKS
ROW
ROW
tAS tAH
DISABLE AUTO PRECHARGE
BANK
BANK
SINGLE BANK
BANK
tAC
DQ
BANK
tOH
DOUT m
tRCD
tRAS
tRC
tLZ
CAS Latency
tHZ
DON'T CARE
tRP
UNDEFINED
CAS latency = 2, Burst Length = 1
Integrated Silicon Solution, Inc. — www.issi.com 45
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
SINGLE READ WITH AUTO PRECHARGE
T0
tCK
CLK
T1
tCL
T2
tCH
T3
T4
T5
T6
T7
NOP
NOP
T8
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
NOP
NOP
READ
ACTIVE
NOP
tCMS tCMH
DQM0-DQM3
tAS
A0-A9,
A10
BA0, BA1
tAH
ROW
tAS tAH
ROW
COLUMN m
ENABLE AUTO PRECHARGE
ROW
ROW
tAS tAH
BANK
BANK
BANK
tOH
tAC
DQ
DOUT m
tRCD
tRAS
tRC
tHZ
CAS Latency
tRP
DON'T CARE
UNDEFINED
CAS latency = 2, Burst Length = 1
46
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
ALTERNATING BANK READ ACCESSES
T0
CLK
tCK
T1
tCL
T2
tCH
T3
T4
T5
T6
T7
T8
NOP
READ
NOP
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
ACTIVE
ACTIVE
tCMS tCMH
DQM0-DQM3
tAS tAH
A0-A9
A10
BA0, BA1
ROW
tAS tAH
COLUMN m
COLUMN b(2)
ROW
ENABLE AUTO PRECHARGE
ROW
ENABLE AUTO PRECHARGE
ROW
tAS tAH
ROW
BANK 0
BANK 0
BANK 3
tLZ
DQ
ROW
BANK 3
tOH
tOH
DOUT m
tAC
tRCD - BANK 0
tRRD
tOH
DOUT m+1
tAC
BANK 0
tAC
tOH
DOUT m+2
tOH
DOUT m+3
tAC
tAC
tRP - BANK 0
CAS Latency - BANK 0
tRCD - BANK 3
DOUT b
tAC
tRCD - BANK 0
CAS Latency - BANK 3
tRAS - BANK 0
tRC - BANK 0
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com 47
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
READ - FULL-PAGE BURST
T0
tCK
CLK
T1
tCL
T2
tCH
T3
T4
T5
T6
Tn+1
NOP
NOP
NOP
Tn+2
Tn+3
Tn+4
NOP
NOP
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
BURST TERM
tCMS tCMH
DQM0-DQM3
A0-A9,
A10
BA0, BA1
tAS
tAH
ROW
tAS tAH
COLUMN m
ROW
tAS tAH
BANK
BANK
tAC
DQ
tLZ
tRCD
CAS Latency
tAC
DOUT m
tOH
tAC
DOUT m+1
tAC
DOUT m+2
tOH
each row (x32) has
256 locations
tOH
Full page
completion
48
tAC
DOUT m-1
tAC
DOUT m
tHZ
DOUT m+1
tOH
tOH
tOH
DON'T CARE
Full-page burst not self-terminating.
Use BURST TERMINATE command.
UNDEFINED
Integrated Silicon Solution, Inc. — www.issi.com
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
READ - DQM OPERATION
T0
tCK
CLK
T1
tCL
T2
T3
T4
T5
T6
T7
T8
NOP
NOP
NOP
NOP
NOP
NOP
tCH
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
READ
tCMS tCMH
DQM0-DQM3
tAS
tAH
A0-A9
ROW
tAS tAH
A10
ROW
tAS tAH
DISABLE AUTO PRECHARGE
BANK
BANK
BA0, BA1
COLUMN m
ENABLE AUTO PRECHARGE
tAC
DQ
tLZ
tRCD
CAS Latency
tOH
DOUT m
tHZ
tAC
tLZ
tOH
DOUT m+2
tAC
tOH
DOUT m+3
tHZ
DON'T CARE
UNDEFINED
CAS Latency = 2, Burst Length = 4
Integrated Silicon Solution, Inc. — www.issi.com 49
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
WRITE - WITHOUT AUTO PRECHARGE
T0
CLK
tCK
T1
tCL
T2
tCH
T3
T4
T5
T6
NOP
NOP
NOP
T7
T8
tCKS tCKH
CKE
tCMS tCMH
ACTIVE
COMMAND
NOP
WRITE
PRECHARGE
NOP
ACTIVE
tCMS tCMH
DQM0-DQM3
tAS tAH
A0-A9
A10
ROW
tAS tAH
COLUMN m
ROW
tAS tAH
BA0, BA1
ROW
ALL BANKS
ROW
SINGLE BANK
DISABLE AUTO PRECHARGE
BANK
BANK
tDS
DQ
tDH
DIN m
tRCD
tRAS
tRC
BANK
tDS tDH
DIN m+1
tDS tDH
DIN m+2
tDS
BANK
tDH
DIN m+3
tWR
tRP
DON'T CARE
Burst Length = 4
50
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
WRITE - WITH AUTO PRECHARGE
T0
CLK
tCK
T1
T2
tCL
tCH
T3
T4
T5
T6
T7
T8
T9
NOP
NOP
NOP
NOP
NOP
NOP
ACTIVE
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
WRITE
tCMS tCMH
DQM0-DQM3
A0-A9
A10
BA0, BA1
tAS tAH
ROW
tAS tAH
ROW
COLUMN m
ENABLE AUTO PRECHARGE
ROW
tAS tAH
ROW
BANK
BANK
tDS
DQ
tDH
DIN m
tRCD
tRAS
tRC
BANK
tDS tDH
DIN m+1
tDS tDH
DIN m+2
tDS
tDH
DIN m+3
tWR
tRP
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com 51
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
SINGLE WRITE - WITHOUT AUTO PRECHARGE
T0
tCK
CLK
T1
tCL
T2
tCH
T3
T4
NOP
NOP
T5
T6
T7
T8
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
WRITE
PRECHARGE
NOP
ACTIVE
NOP
tCMS tCMH
DQM0-DQM3
tAS tAH
A0-A9
A10
BA0, BA1
ROW
tAS tAH
COLUMN m
ROW
ALL BANKS
ROW
tAS tAH
ROW
SINGLE BANK
DISABLE AUTO PRECHARGE
BANK
BANK
BANK
BANK
tDS tDH
DQ
DIN m
tRCD
tRAS
tRC
52
tWR
tRP
DON'T CARE
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Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
SINGLE WRITE - WITH AUTO PRECHARGE
T0
tCK
CLK
T1
tCL
T2
tCH
T3
T4
T5
T6
T7
NOP
NOP
NOP
T8
T9
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
NOP
NOP
WRITE
ACTIVE
NOP
tCMS tCMH
DQM0-DQM3
A0-A9
A10
BA0, BA1
tAS
tAH
ROW
tAS tAH
COLUMN m
ROW
ENABLE AUTO PRECHARGE
ROW
tAS tAH
ROW
BANK
BANK
tDS
DQ
BANK
tDH
DIN m
tRCD
tRAS
tRC
tWR
tRP
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com 53
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
ALTERNATING BANK WRITE ACCESS
T0
tCK
CLK
T1
T2
tCL
tCH
T3
T4
T5
T6
T7
T8
T9
NOP
NOP
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
WRITE
NOP
ACTIVE
NOP
WRITE
ACTIVE
tCMS tCMH
DQM0-DQM3
A0-A9
A10
BA0, BA1
tAS tAH
ROW
tAS tAH
COLUMN m
COLUMN b
ROW
ENABLE AUTO PRECHARGE
ROW
tAS tAH
ROW
ENABLE AUTO PRECHARGE
ROW
BANK 0
BANK 0
tDS
DQ
tDH
DIN m
tRCD - BANK 0
tRRD
tRAS - BANK 0
tRC - BANK 0
ROW
BANK 1
tDS tDH
DIN m+1
BANK 1
tDS
tDS tDH
DIN m+2
tDH
DIN m+3
tDS
tDH
DIN b
tWR - BANK 0
tRCD - BANK 1
BANK 0
tDS
tDH
DIN b+1
tDS
tDH
DIN b+2
tRP - BANK 0
tDS
tDH
DIN b+3
tRCD - BANK 0
tWR - BANK 1
DON'T CARE
54
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Rev. A2
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IS42S32200L, IS45S32200L
WRITE - FULL PAGE BURST
T0
T1
tCK
CLK
T2
tCL
T3
T4
T5
Tn+1
Tn+2
NOP
NOP
NOP
NOP
BURST TERM
tCH
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
WRITE
NOP
tCMS tCMH
DQM0-DQM3
tAS
A0-A9
A10
BA0, BA1
tAH
ROW
tAS tAH
COLUMN m
ROW
tAS tAH
BANK
BANK
tDS
DQ
tDH
DIN m
tRCD
tDS
tDH
DIN m+1
tDS
tDH
DIN m+2
tDS
tDH
DIN m+3
tDS
tDH
tDS
tDH
DIN m-1
256 locations
within same row
Full page completed
Full-page burst does not
self-terminate. Can use
BURST TERMINATE
to stop.
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com 55
Rev. A2
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IS42S32200L, IS45S32200L
WRITE - DQM OPERATION
T0
T1
T2
tCK
CLK
tCL
T3
T4
T5
T6
T7
NOP
NOP
NOP
NOP
NOP
tCH
tCKS tCKH
CKE
tCMS tCMH
COMMAND
ACTIVE
NOP
WRITE
tCMS tCMH
DQM0-DQM3
tAS tAH
A0-A9
A10
BA0, BA1
ROW
tAS tAH
COLUMN m
ENABLE AUTO PRECHARGE
ROW
tAS tAH
DISABLE AUTO PRECHARGE
BANK
BANK
tDS
DQ
DIN m
tRCD
56
tDH
tDS tDH
tDS
tDH
DIN m+2
DIN m+3
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
ORDERING INFORMATION
Commercial Range: 0°C to +70°C
Frequency
Speed (ns)
200 MHz
5
166 MHz
6
143 MHz
7
Order Part No.
IS42S32200L-5TL
IS42S32200L-5BL
IS42S32200L-6TL
IS42S32200L-6BL
IS42S32200L-7TL
IS42S32200L-7BL
Package
400-mil TSOP II, Lead-free
90-ball BGA, Lead-free
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
Order Part No.
IS42S32200L-6TLI
IS42S32200L-6BLI
IS42S32200L-6BI
IS42S32200L-7TLI
IS42S32200L-7BLI
Package
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
90-ball BGA, Leaded
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
Industrial Range: -40°C to +85°C
Frequency
Speed (ns)
166 MHz
6
143 MHz
7
ORDERING INFORMATION
Automotive Range (A1): -40°C to +85°C
Frequency
Speed (ns)
166 MHz
6
143 MHz
7
Order Part No.
IS45S32200L-6TLA1
IS45S32200L-6BLA1
IS45S32200L-7TLA1
IS45S32200L-7BLA1
IS45S32200L-7BA1
Package
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
90-ball BGA, Leaded
Automotive Range (A2): -40°C to +105°C
Frequency
Speed (ns)
166 MHz
6
143 MHz
7
Order Part No.
IS45S32200L-6TLA2
IS45S32200L-6BLA2
IS45S32200L-7TLA2
IS45S32200L-7BLA2
Package
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
400-mil TSOP II, Lead free
90-ball BGA, Lead-free
Integrated Silicon Solution, Inc. — www.issi.com 57
Rev. A2
10/16/2019
IS42S32200L, IS45S32200L
Θ
NOTE :
1. Controlling dimension : mm
Θ
2. Dimension D and E1 do not include mold protrusion .
3. Dimension b does not include dambar protrusion/intrusion.
09/26/2006
4. Formed leads shall be planar with respect to one another within 0.1mm
at the seating plane after final test.
Package Outline
Rev. A2
10/16/2019
Integrated Silicon Solution, Inc. — www.issi.com
58
IS42S32200L, IS45S32200L
Integrated Silicon Solution, Inc. — www.issi.com 59
Rev. A2
10/16/2019
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