IS61WV25616ALL/ALS
IS61WV25616BLL/BLS
IS64WV25616BLL/BLS
256K x 16 HIGH SPEED ASYNCHRONOUS CMOS STATIC RAM
JULY 2010
DESCRIPTION
The ISSI IS61WV25616Axx/Bxx and IS64WV25616Bxx
FEATURES
HIGH SPEED: (IS61/64WV25616ALL/BLL)
• High-speed access time: 8, 10, 20 ns
• Low Active Power: 85 mW (typical)
• Low Standby Power: 7 mW (typical)
CMOS standby
are high-speed, 4,194,304-bit static RAMs organized as
262,144 words by 16 bits. It is fabricated using ISSI's highperformance CMOS technology. This highly reliable process coupled with innovative circuit design techniques,
yields high-performance and low power consumption devices.
LOW POWER: (IS61/64WV25616ALS/BLS)
• High-speed access time: 25, 35, 45 ns
• Low Active Power: 35 mW (typical)
• Low Standby Power: 0.6 mW (typical)
CMOS standby
• Single power supply
— VDD 1.65V to 2.2V (IS61WV25616Axx)
•
•
•
•
•
When CE is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be
reduced down with CMOS input levels.
— VDD 2.4V to 3.6V (IS61/64WV25616Bxx)
Fully static operation: no clock or refresh required
Three state outputs
Data control for upper and lower bytes
Industrial and Automotive temperature support
Lead-free available
Easy memory expansion is provided by using Chip Enable
and Output Enable inputs, CE and OE. The active LOW
Write Enable (WE) controls both writing and reading of the
memory. A data byte allows Upper Byte (UB) and Lower
Byte (LB) access.
The IS61WV25616Axx/Bxx and IS64WV25616Bxx are
packaged in the JEDEC standard 44-pin TSOP Type II and
48-pin Mini BGA (6mm x 8mm).
FUNCTIONAL BLOCK DIAGRAM
A0-A17
DECODER
256K x 16
MEMORY ARRAY
I/O
DATA
CIRCUIT
COLUMN I/O
VDD
GND
I/O0-I/O7
Lower Byte
I/O8-I/O15
Upper Byte
CE
OE
WE
CONTROL
CIRCUIT
UB
LB
Copyright © 2010 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
1
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
TRUTH TABLE
I/O PIN
I/O0-I/O7
I/O8-I/O15
WE
CE
OE
LB
UB
Not Selected
X
H
X
X
X
High-Z
High-Z
ISB1, ISB2
Output Disabled
H
X
L
L
H
X
X
H
X
H
High-Z
High-Z
High-Z
High-Z
ICC
Read
H
H
H
L
L
L
L
L
L
L
H
L
H
L
L
DOUT
High-Z
DOUT
High-Z
DOUT
DOUT
I CC
Write
L
L
L
L
L
L
X
X
X
L
H
L
H
L
L
DIN
High-Z
DIN
High-Z
DIN
DIN
I CC
Mode
PIN CONFIGURATIONS
44-Pin TSOP (Type II) and SOJ
A0
A1
A2
A3
A4
CE
I/O0
I/O1
I/O2
I/O3
VDD
GND
I/O4
I/O5
I/O6
I/O7
WE
A5
A6
A7
A8
A9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
VDD Current
PIN DESCRIPTIONS
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A17
A16
A15
OE
UB
LB
I/O15
I/O14
I/O13
I/O12
GND
VDD
I/O11
I/O10
I/O9
I/O8
NC
A14
A13
A12
A11
A10
A0-A17
Address Inputs
I/O0-I/O15
Data Inputs/Outputs
CE
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
LB
Lower-byte Control (I/O0-I/O7)
UB
Upper-byte Control (I/O8-I/O15)
NC
No Connection
VDD
Power
GND
Ground
*SOJ package under evaluation.
2
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
PIN CONFIGURATIONS
44-Pin LQFP
1
48-Pin mini BGA (6mm x 8mm)
2
3
4
5
6
A17
A16
A15
A14
A13
A12
A11
A10
OE
UB
LB
1
44 43 42 41 40 39 38 37 36 35 34
33
1
32
2
31
3
30
4
29
5
TOP VIEW
28
6
27
7
26
8
25
9
24
10
23
11
12 13 14 15 16 17 18 19 20 21 22
I/O15
I/O14
I/O13
I/O12
GND
VDD
I/O11
I/O10
I/O9
I/O8
NC
A
LB
OE
A0
A1
A2
N/C
B
I/O8
UB
A3
A4
CE
I/O0
C
I/O9
I/O10
A5
A6
I/O1
I/O2
D
GND
I/O11
A17
A7
I/O3
VDD
E
VDD
I/O12
NC
A16
I/O4
GND
F
I/O14
I/O13
A14
A15
I/O5
I/O6
G
I/O15
NC
A12
A13
WE
I/O7
H
NC
A8
A9
A10
A11
NC
3
4
5
6
WE
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
CE
I/O0
I/O1
I/O2
I/O3
VDD
GND
I/O4
I/O5
I/O6
I/O7
2
7
*LQFP package under evaluation.
8
PIN DESCRIPTIONS
A0-A17
Address Inputs
I/O0-I/O15
Data Inputs/Outputs
CE
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
LB
Lower-byte Control (I/O0-I/O7)
UB
Upper-byte Control (I/O8-I/O15)
NC
No Connection
VDD
Power
GND
Ground
9
10
11
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
3
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
VDD = 3.3V + 5%
Symbol
Parameter
Test Conditions
Min.
Max.
Unit
VOH
Output HIGH Voltage
VDD = Min., IOH = –4.0 mA
2.4
—
V
VOL
Output LOW Voltage
VDD = Min., IOL = 8.0 mA
—
0.4
V
VIH
Input HIGH Voltage
VIL
Input LOW Voltage(1)
2
VDD + 0.3
V
–0.3
0.8
V
ILI
Input Leakage
GND ≤ VIN ≤ VDD
–1
1
µA
ILO
Output Leakage
GND ≤ VOUT ≤ VDD, Outputs Disabled
–1
1
µA
Min.
Max.
Unit
Note:
1. VIL (min.) = –0.3V DC; VIL (min.) = –2.0V AC (pulse width < 10 ns). Not 100% tested.
VIH (max.) = VDD + 0.3V DC; VIH (max.) = VDD + 2.0V AC (pulse width < 10 ns). Not 100% tested.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
VDD = 2.4V-3.6V
Symbol
Parameter
Test Conditions
VOH
Output HIGH Voltage
VDD = Min., IOH = –1.0 mA
1.8
—
V
VOL
Output LOW Voltage
VDD = Min., IOL = 1.0 mA
—
0.4
V
VIH
Input HIGH Voltage
2.0
VDD + 0.3
V
VIL
Input LOW Voltage(1)
–0.3
0.8
V
ILI
Input Leakage
GND ≤ VIN ≤ VDD
–1
1
µA
ILO
Output Leakage
GND ≤ VOUT ≤ VDD, Outputs Disabled
–1
1
µA
Note:
1. VIL (min.) = –0.3V DC; VIL (min.) = –2.0V AC (pulse width < 10 ns). Not 100% tested.
VIH (max.) = VDD + 0.3V DC; VIH (max.) = VDD + 2.0V AC (pulse width < 10 ns). Not 100% tested.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
VDD = 1.65V-2.2V
Symbol
Parameter
Test Conditions
VDD
Min.
Max.
Unit
VOH
Output HIGH Voltage
IOH = -0.1 mA
1.65-2.2V
1.4
—
V
VOL
Output LOW Voltage
IOL = 0.1 mA
1.65-2.2V
—
0.2
V
VIH
VIL(1)
Input HIGH Voltage
1.65-2.2V
1.4
VDD + 0.2
V
Input LOW Voltage
1.65-2.2V
–0.2
0.4
V
ILI
Input Leakage
GND ≤ VIN ≤ VDD
–1
1
µA
ILO
Output Leakage
GND ≤ VOUT ≤ VDD, Outputs Disabled
–1
1
µA
Note:
1. VIL (min.) = –0.3V DC; VIL (min.) = –2.0V AC (pulse width < 10 ns). Not 100% tested.
VIH (max.) = VDD + 0.3V DC; VIH (max.) = VDD + 2.0V AC (pulse width < 10 ns). Not 100% tested.
4
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
AC TEST CONDITIONS
Parameter
Input Pulse Level
Input Rise and Fall Times
Input and Output Timing
and Reference Level (VRef)
Output Load
Unit
(2.4V-3.6V)
0V to 3V
1V/ ns
1.5V
Unit
(3.3V + 10%)
0V to 3V
1V/ ns
1.5V
Unit
(1.65V-2.2V)
0V to 1.8V
1V/ ns
0.9V
See Figures 1 and 2
See Figures 1 and 2
See Figures 1 and 2
1
2
3
AC TEST LOADS
4
319 Ω
ZO = 50Ω
3.3V
50Ω
1.5V
OUTPUT
OUTPUT
30 pF
Including
jig and
scope
Figure 1.
5 pF
Including
jig and
scope
5
353 Ω
6
Figure 2.
7
8
9
10
11
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
5
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
VTERM
VDD
TSTG
PT
Parameter
Terminal Voltage with Respect to GND
VDD Relates to GND
Storage Temperature
Power Dissipation
Value
–0.5 to VDD + 0.5
–0.3 to 4.0
–65 to +150
1.0
Unit
V
V
°C
W
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage
to the device. This is a stress rating only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
CAPACITANCE(1,2)
Symbol
Parameter
CIN
Input Capacitance
CI/O
Input/Output Capacitance
Conditions
Max.
Unit
VIN = 0V
6
pF
VOUT = 0V
8
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: TA = 25°C, f = 1 MHz, VDD = 3.3V.
6
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
HIGH SPEED (IS61WV25616ALL/BLL)
OPERATING RANGE (VDD) (IS61WV25616ALL)
Range
Ambient Temperature
Commercial
0°C to +70°C
Industrial
–40°C to +85°C
Automotive
–40°C to +125°C
VDD
1.65V-2.2V
1.65V-2.2V
1.65V-2.2V
1
Speed
20ns
20ns
20ns
2
OPERATING RANGE (VDD) (IS61WV25616BLL)(1)
Range
Ambient Temperature
Commercial
0°C to +70°C
Industrial
–40°C to +85°C
VDD (8 nS)1
3.3V + 5%
3.3V + 5%
3
VDD (10 nS)1
2.4V-3.6V
2.4V-3.6V
4
Note:
1. When operated in the range of 2.4V-3.6V, the device meets 10ns. When operated in the
range of 3.3V + 5%, the device meets 8ns.
5
OPERATING RANGE (VDD) (IS64WV25616BLL)
Range
Automotive
Ambient Temperature
–40°C to +125°C
VDD (10 nS)
2.4V-3.6V
6
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
-8
Symbol Parameter
ICC
ICC1
VDD Dynamic Operating
Supply Current
Test Conditions
VDD = Max.,
IOUT = 0 mA, f = fMAX
Min.
Max.
Com.
Ind.
Auto.
typ.(2)
—
—
—
50
55
—
7
-10
Min. Max.
—
—
—
-20
Min. Max.
Unit
40
45
65
—
—
—
35
40
60
mA
8
9
25
Operating
Supply Current
VDD = Max.,
IOUT = 0 mA, f = 0
Com.
Ind.
Auto.
—
—
—
35
40
—
—
—
—
35
40
60
—
—
—
30
40
60
mA
ISB1
TTL Standby Current
(TTL Inputs)
VDD = Max.,
VIN = VIH or VIL
CE ≥ VIH, f = 0
Com.
Ind.
Auto.
—
—
—
10
15
—
—
—
—
10
15
30
—
—
—
10
15
30
mA
ISB2
CMOS Standby
Current (CMOS Inputs)
VDD = Max.,
CE ≥ VDD – 0.2V,
VIN ≥ VDD – 0.2V, or
VIN ≤ 0.2V, f = 0
Com.
Ind.
Auto.
typ.(2)
—
—
—
8
9
—
—
—
—
8
9
20
—
—
—
8
9
20
mA
10
11
2
Note:
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical values are measured at VDD = 3.0V, TA = 25oC and not 100% tested.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
12
7
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
LOW POWER (IS61WV25616ALS/BLS)
OPERATING RANGE (VDD) (IS61WV25616ALS)
Range
Ambient Temperature
Commercial
0°C to +70°C
Industrial
–40°C to +85°C
Automotive
–40°C to +125°C
VDD
1.65V-2.2V
1.65V-2.2V
1.65V-2.2V
Speed
45ns
45ns
45ns
OPERATING RANGE (VDD) (IS61WV25616BLS)
Range
Ambient Temperature
Commercial
0°C to +70°C
Industrial
–40°C to +85°C
VDD (25 nS)
2.4V-3.6V
2.4V-3.6V
OPERATING RANGE (VDD) (IS64WV25616BLS)
Range
Automotive
Ambient Temperature
–40°C to +125°C
VDD (35 nS)
2.4V-3.6V
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
Symbol Parameter
ICC
ICC1
VDD Dynamic Operating
Supply Current
-25
Min. Max.
Test Conditions
VDD = Max.,
IOUT = 0 mA, f = fMAX
Com.
Ind.
Auto.
typ.(2)
—
—
—
-35
Min. Max.
-45
Min. Max.
Unit
20
25
50
—
—
—
20
25
50
—
—
—
15
20
40
mA
11
Operating
Supply Current
VDD = Max.,
IOUT = 0 mA, f = 0
Com.
Ind.
Auto.
—
—
—
10
12
20
—
—
—
10
12
20
—
—
—
10
12
20
mA
ISB1
TTL Standby Current
(TTL Inputs)
VDD = Max.,
VIN = VIH or VIL
CE ≥ VIH, f = 0
Com.
Ind.
Auto.
—
—
—
5
7
10
—
—
—
5
7
10
—
—
—
5
7
10
mA
ISB2
CMOS Standby
Current (CMOS Inputs)
VDD = Max.,
CE ≥ VDD – 0.2V,
VIN ≥ VDD – 0.2V, or
VIN ≤ 0.2V, f = 0
Com.
Ind.
Auto.
typ.(2)
—
—
—
1
2
10
—
—
—
1
2
10
—
—
—
1
2
10
mA
0.2
Note:
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical values are measured at VDD = 3.0V, TA = 25oC and not 100% tested.
8
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Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
-8
Symbol
tRC
tAA
tOHA
tACE
tDOE
tHZOE(2)
tLZOE(2)
tHZCE(2
tLZCE(2)
tBA
tHZB(2)
tLZB(2)
tPU
tPD
Parameter
-10
Min. Max.
Min.
Max.
Read Cycle Time
8
—
10
—
ns
Address Access Time
—
8
—
10
ns
Output Hold Time
2.0
—
2.0
—
ns
CE Access Time
—
8
—
10
ns
OE Access Time
—
4.5
—
4.5
ns
OE to High-Z Output
—
3
—
4
ns
OE to Low-Z Output
0
—
0
—
ns
CE to High-Z Output
0
3
0
4
ns
CE to Low-Z Output
3
—
3
—
ns
LB, UB Access Time
—
5.5
—
6.5
ns
LB, UB to High-Z Output
0
3
0
3
ns
LB, UB to Low-Z Output
0
—
0
—
ns
Power Up Time
0
—
0
—
ns
Power Down Time
—
8
—
10
ns
1
Unit
2
3
4
5
6
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to
3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage.
7
8
9
10
11
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
9
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
-20 ns
Min. Max.
-25 ns
Min. Max.
-35 ns
Min. Max.
-45ns
Min. Max.
Symbol
Parameter
Unit
tRC
Read Cycle Time
20
—
25
—
35
—
45
—
ns
tAA
Address Access Time
—
20
—
25
—
35
—
45
ns
tOHA
Output Hold Time
2.5
—
4
—
4
—
7
—
ns
tACE
CE Access Time
—
20
—
25
—
35
—
45
ns
tDOE
OE Access Time
—
8
—
12
—
15
—
20
ns
tHZOE(2)
OE to High-Z Output
0
8
0
8
0
10
0
15
ns
tLZOE(2)
OE to Low-Z Output
0
—
0
—
0
—
0
—
ns
(2
tHZCE
CE to High-Z Output
0
8
0
8
0
10
0
15
ns
(2)
tLZCE
CE to Low-Z Output
3
—
10
—
10
—
15
—
ns
tBA
LB, UB Access Time
—
8
—
25
—
35
—
45
ns
tHZB
LB, UB to High-Z Output
0
8
0
8
0
10
0
15
ns
tLZB
LB, UB to Low-Z Output
0
—
0
—
0
—
0
—
ns
Notes:
1. Test conditions assume signal transition times of 1.5 ns or less, timing reference levels of 1.25V, input pulse levels of 0.4V to
VDD-0.3V and output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. Not 100% tested.
10
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
AC WAVEFORMS
1
READ CYCLE NO. 1(1,2) (Address Controlled) (CE = OE = VIL, UB or LB = VIL)
t RC
2
ADDRESS
t AA
t OHA
t OHA
DOUT
3
DATA VALID
PREVIOUS DATA VALID
READ1.eps
4
5
READ CYCLE NO. 2(1,3)
tRC
6
ADDRESS
tAA
tOHA
OE
7
tHZOE
tDOE
tLZOE
CE
tACE
tHZCE
tLZCE
8
LB, UB
DOUT
VDD
Supply
Current
HIGH-Z
tBA
tLZB
tHZB
tRC
DATA VALID
tPU
50%
tPD
9
ICC
50%
ISB
UB_CEDR2.eps
10
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE, UB, or LB = VIL.
3. Address is valid prior to or coincident with CE LOW transition.
11
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
11
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
WRITE CYCLE SWITCHING CHARACTERISTICS(1,3) (Over Operating Range)
-8
Symbol
Parameter
-10
Min.
Max.
Min.
Max.
Unit
tWC
Write Cycle Time
8
—
10
—
ns
tSCE
CE to Write End
6.5
—
8
—
ns
tAW
Address Setup Time
to Write End
6.5
—
8
—
ns
tHA
Address Hold from Write End
0
—
0
—
ns
tSA
Address Setup Time
0
—
0
—
ns
tPWB
LB, UB Valid to End of Write
6.5
—
8
—
ns
tPWE1
WE Pulse Width
6.5
—
8
—
ns
tPWE2
WE Pulse Width (OE = LOW)
8.0
—
10
—
ns
tSD
Data Setup to Write End
5
—
6
—
ns
tHD
Data Hold from Write End
0
—
0
—
ns
tHZWE(2)
WE LOW to High-Z Output
—
3.5
—
5
ns
tLZWE
WE HIGH to Low-Z Output
2
—
2
—
ns
(2)
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to
3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and UB or LB, and WE LOW. All signals must be in valid states
to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced
to the rising or falling edge of the signal that terminates the write. Shaded area product in development
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
WRITE CYCLE SWITCHING CHARACTERISTICS(1,2) (Over Operating Range)
-20 ns
Min. Max.
-25 ns
Min. Max.
-35 ns
Min. Max.
-45ns
Min. Max.
Symbol
Parameter
tWC
Write Cycle Time
20
—
25
—
35
—
45
—
ns
tSCE
CE to Write End
12
—
18
—
25
—
35
—
ns
tAW
Address Setup Time
to Write End
12
—
15
—
25
—
35
—
ns
tHA
Address Hold from Write End
0
—
0
—
0
—
0
—
ns
tSA
Address Setup Time
0
—
0
—
0
—
0
—
ns
tPWB
LB, UB Valid to End of Write
12
—
18
—
30
—
35
—
ns
tPWE1
WE Pulse Width (OE = HIGH)
12
—
18
—
30
—
35
—
ns
tPWE2
WE Pulse Width (OE = LOW)
17
—
20
—
30
—
35
—
ns
tSD
Data Setup to Write End
9
—
12
—
15
—
20
—
ns
tHD
Data Hold from Write End
0
—
0
—
0
—
0
—
ns
tHZWE(3)
WE LOW to High-Z Output
—
9
—
12
—
20
—
20
ns
tLZWE
WE HIGH to Low-Z Output
3
—
5
—
5
—
5
—
ns
(3)
Unit
1
2
3
4
5
Notes:
1. Test conditions assume signal transition times of 1.5ns or less, timing reference levels of 1.25V, input pulse levels of 0.4V to
VDD-0.3V and output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and UB or LB, and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to
the rising or falling edge of the signal that terminates the write.
6
7
8
9
10
11
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
13
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
AC WAVEFORMS
WRITE CYCLE NO. 1 (CE Controlled, OE is HIGH or LOW) (1 )
t WC
VALID ADDRESS
ADDRESS
t SA
t SCE
t HA
CE
t AW
t PWE1
t PWE2
WE
t PBW
UB, LB
t HZWE
DOUT
t LZWE
HIGH-Z
DATA UNDEFINED
t SD
t HD
DATAIN VALID
DIN
UB_CEWR1.eps
Notes:
1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CE and WE inputs and at least one of
the LB and UB inputs being in the LOW state.
2. WRITE = (CE) [ (LB) = (UB) ] (WE).
WRITE CYCLE NO. 2 (WE Controlled. OE is HIGH During Write Cycle) (1,2)
t WC
ADDRESS
VALID ADDRESS
t HA
OE
CE
LOW
t AW
t PWE1
WE
t SA
t PBW
UB, LB
t HZWE
DOUT
DATA UNDEFINED
t LZWE
HIGH-Z
t SD
DIN
t HD
DATAIN VALID
UB_CEWR2.eps
14
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
AC WAVEFORMS
1
WRITE CYCLE NO. 3 (WE Controlled. OE is LOW During Write Cycle) (1)
t WC
ADDRESS
2
VALID ADDRESS
OE
LOW
CE
LOW
t HA
3
t AW
t PWE2
WE
t SA
t PBW
4
UB, LB
t HZWE
DOUT
t LZWE
HIGH-Z
DATA UNDEFINED
t SD
t HD
5
DATAIN VALID
DIN
UB_CEWR3.eps
6
WRITE CYCLE NO. 4 (LB, UB Controlled, Back-to-Back Write) (1,3)
t WC
ADDRESS
7
t WC
ADDRESS 1
ADDRESS 2
8
OE
t SA
CE
LOW
t HA
t SA
WE
UB, LB
t PBW
t PBW
WORD 1
WORD 2
t HZWE
DOUT
10
t LZWE
HIGH-Z
DATA UNDEFINED
t HD
t SD
DIN
9
t HA
DATAIN
VALID
t HD
t SD
11
DATAIN
VALID
UB_CEWR4.eps
Notes:
1. The internal Write time is defined by the overlap of CE = LOW, UB and/or LB = LOW, and WE = LOW. All signals must be in valid
states to initiate a Write, but any can be deasserted to terminate the Write. The t SA, t HA, t SD, and t HD timing is referenced to the
rising or falling edge of the signal that terminates the Write.
2. Tested with OE HIGH for a minimum of 4 ns before WE = LOW to place the I/O in a HIGH-Z state.
3. WE may be held LOW across many address cycles and the LB, UB pins can be used to control the Write function.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
15
12
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
HIGH SPEED (IS61WV25616ALL/BLL)
DATA RETENTION SWITCHING CHARACTERISTICS (2.4V-3.6V)
Min.
Typ.(1)
Max.
Unit
2.0
—
3.6
V
—
—
2
—
8
9
15
mA
See Data Retention Waveform
0
—
—
ns
See Data Retention Waveform
tRC
—
—
ns
Min.
Typ.(1)
Max.
Unit
1.2
—
3.6
V
—
—
5
—
10
15
mA
Symbol
Parameter
Test Condition
Options
VDR
VDD for Data Retention
See Data Retention Waveform
IDR
Data Retention Current
VDD = 2.0V, CE ≥ VDD – 0.2V
tSDR
tRDR
Data Retention Setup Time
Recovery Time
Com.
Ind.
Auto.
Note 1: Typical values are measured at VDD = 3.0V, TA = 25 C and not 100% tested.
O
DATA RETENTION SWITCHING CHARACTERISTICS (1.65V-2.2V)
Symbol
Parameter
Test Condition
Options
VDR
VDD for Data Retention
See Data Retention Waveform
IDR
Data Retention Current
VDD = 1.2V, CE ≥ VDD – 0.2V
tSDR
tRDR
Data Retention Setup Time
See Data Retention Waveform
0
—
—
ns
Recovery Time
See Data Retention Waveform
tRC
—
—
ns
Com.
Ind.
Note 1: Typical values are measured at VDD = 1.8V, TA = 25 C and not 100% tested.
O
DATA RETENTION WAVEFORM (CE Controlled)
tSDR
Data Retention Mode
tRDR
VDD
VDR
CE
GND
16
CE ≥ VDD - 0.2V
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
LOW POWER (IS61WV25616ALS/BLS)
DATA RETENTION SWITCHING CHARACTERISTICS (2.4V-3.6V)
1
Min.
Typ.(1)
Max.
Unit
2.0
—
3.6
V
—
—
0.2
—
1
2
10
mA
See Data Retention Waveform
0
—
—
ns
See Data Retention Waveform
tRC
—
—
ns
Symbol
Parameter
Test Condition
Options
VDR
VDD for Data Retention
See Data Retention Waveform
IDR
Data Retention Current
VDD = 2.0V, CE ≥ VDD – 0.2V
tSDR
tRDR
Data Retention Setup Time
Recovery Time
Com.
Ind.
Auto.
2
3
Note 1: Typical values are measured at VDD = 3.0V, TA = 25 C and not 100% tested.
O
4
DATA RETENTION SWITCHING CHARACTERISTICS (1.65V-2.2V)
Min.
Typ.(1)
Max.
Unit
1.2
—
3.6
V
—
—
0.2
—
1
2
mA
See Data Retention Waveform
0
—
—
ns
See Data Retention Waveform
tRC
—
—
ns
Symbol
Parameter
Test Condition
Options
VDR
VDD for Data Retention
See Data Retention Waveform
IDR
Data Retention Current
VDD = 1.2V, CE ≥ VDD – 0.2V
tSDR
tRDR
Data Retention Setup Time
Recovery Time
Com.
Ind.
5
6
: Typical values are measured at VDD = 1.8V, TA = 25 C and not 100% tested.
O
7
8
DATA RETENTION WAVEFORM (CE Controlled)
tSDR
Data Retention Mode
9
tRDR
VDD
10
VDR
CE
GND
11
CE ≥ VDD - 0.2V
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
17
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
ORDERING INFORMATION (HIGH SPEED)
Commercial Range: 0°C to +70°C
Voltage Range: 2.4V to 3.6V
Speed (ns)
10 (81)
Order Part No.
Package
IS61WV25616BLL-10TL
TSOP (Type II), Lead-free
Note:
1. Speed = 8ns for VDD = 3.3V + 5%. Speed = 10ns for VDD = 2.4V to 3.6V.
Industrial Range: -40°C to +85°C
Voltage Range: 2.4V to 3.6V
Speed (ns)
1
10 (8 )
Order Part No.
Package
IS61WV25616BLL-10BI
IS61WV25616BLL-10BLI
IS61WV25616BLL-10TI
IS61WV25616BLL-10TLI
48 mini BGA (6mm x 8mm)
48 mini BGA (6mm x 8mm), Lead-free
TSOP (Type II)
TSOP (Type II), Lead-free
Note:
1. Speed = 8ns for VDD = 3.3V + 5%. Speed = 10ns for VDD = 2.4V to 3.6V.
Industrial Range: -40°C to +85°C
Voltage Range: 1.65V to 2.2V
Speed (ns)
20
Order Part No.
Package
IS61WV25616ALL-20BI
IS61WV25616ALL-20TI
IS61WV25616ALL-20TLI
48 mini BGA (6mm x 8mm)
TSOP (Type II)
TSOP (Type II), Lead-free
Automotive Range: -40°C to +125°C
Voltage Range: 2.4V to 3.6V
Speed (ns)
10
18
Order Part No.
Package
IS64WV25616BLL-10BA3
IS64WV25616BLL-10BLA3
IS64WV25616BLL-10CTA3
IS64WV25616BLL-10CTLA3
48 mini BGA (6mm x 8mm)
48 mini BGA (6mm x 8mm), Lead-free
TSOP (Type II), Copper Leadframe
TSOP (Type II), Lead-free, Copper Leadframe
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
ORDERING INFORMATION (LOW POWER)
Industrial Range: -40°C to +85°C
Voltage Range: 2.4V to 3.6V
Speed (ns)
25
1
Order Part No.
Package
IS61WV25616BLS-25TLI
TSOP (Type II), Lead-free
2
Industrial Range: -40°C to +85°C
Voltage Range: 1.65V to 2.2V
Speed (ns)
45
3
Order Part No.
Package
IS61WV25616ALS-45TLI
TSOP (Type II), Lead-free
4
5
6
7
8
9
10
11
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
19
20
08/12/2008
Package Outline
1. CONTROLLING DIMENSION : MM .
2. Reference document : JEDEC MO-207
NOTE :
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
Integrated Silicon Solution, Inc. — www.issi.com
Rev. G
07/15/2010
Package Outline
06/04/2008
3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION/INTRUSION.
2. DIMENSION D AND E1 DO NOT INCLUDE MOLD PROTRUSION.
1. CONTROLLING DIMENSION : MM
NOTE :
IS61WV25616ALL/ALS, IS61WV25616BLL/BLS,
IS64WV25616BLL/BLS
1
2
3
4
5
6
7
8
9
10
11
12
21
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