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IS93C66-3GR

IS93C66-3GR

  • 厂商:

    ISSI(芯成半导体)

  • 封装:

  • 描述:

    IS93C66-3GR - 4,096-BIT SERIAL ELECTRICALLY ERASABLE PROM - Integrated Silicon Solution, Inc

  • 数据手册
  • 价格&库存
IS93C66-3GR 数据手册
IS93C66-3 4,096-BIT SERIAL ELECTRICALLY ERASABLE PROM FEATURES • State-of-the-art architecture — Non-volatile data storage — Low voltage operation: 3.0V (Vcc = 2.7V to 6.0V) — Full TTL compatible inputs and outputs — Auto increment for efficient data dump • Low voltage read operation — Down to 2.7V • Hardware and software write protection — Defaults to write-disabled state at power-up — Software instructions for write-enable/disable • Advanced low voltage CMOS E2PROM technology • Versatile, easy-to-use interface — Self-timed programming cycle — Automatic erase-before-write — Programming status indicator — Word and chip erasable — Stop SK anytime for power savings • Durable and reliable — 10-year data retention after 100K write cycles — 100,000 write cycles — Unlimited read cycles ISSI OVERVIEW ® MARCH 2001 The IS93C66-3 is a low cost 4,096-bit, non-volatile, serial E2PROM. It is fabricated using ISSI's advanced CMOS E2PROM technology. The IS93C66-3 provides efficient non-volatile read/write memory arranged as 256 registers of 16 bits each. Seven 11-bit instructions control the operation of the device, which includes read, write, and mode enable functions. The data out pin (DOUT) indicates the status of the device during in the self-timed non-volatile programming cycle. The self-timed write cycle includes an automatic erasebefore-write capability. To protect against inadvertent writes, the WRITE instruction is accepted only while the chip is in the write enabled state. Data is written in 16 bits per write instruction into the selected register. If Chip Select (CS) is brought HIGH after initiation of the write cycle, the Data Output (DOUT) pin will indicate the READY/BUSY status of the chip. APPLICATIONS The IS93C66-3 is ideal for high-volume applications requiring low power and low density storage. This device uses a low cost, space saving 8-pin package. Candidate applications include robotics, alarm devices, electronic locks, meters and instrumentation settings. FUNCTIONAL BLOCK DIAGRAM DIN INSTRUCTION REGISTER (11 BITS) INSTRUCTION DECODE, CONTROL, AND CLOCK GENERATION DATA REGISTER (16 BITS) DUMMY BIT R/W AMPS DOUT CS ADDRESS REGISTER 1 OF 256 DECODER EEPROM ARRAY (256 X 16) SK WRITE ENABLE HIGH VOLTAGE GENERATOR ISSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors which may appear in this publication. © Copyright 2001, Integrated Silicon Solution, Inc. Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 1 IS93C66-3 PIN CONFIGURATION 8-Pin DIP ISSI PIN CONFIGURATION 8-Pin JEDEC Small Outline “G” ® PIN CONFIGURATION 8-Pin JEDEC Small Outline “GR” CS SK DIN DOUT 1 2 3 4 8 7 6 5 VCC NC NC GND NC VCC CS SK 1 2 3 4 8 7 6 5 NC GND DOUT DIN CS SK DIN DOUT 1 2 3 4 8 7 6 5 VCC NC NC GND PIN DESCRIPTIONS CS SK DIN DOUT NC Vcc GND Chip Select Serial Data Clock Serial Data Input Serial Data Output Not Connected Power Ground ENDURANCE AND DATA RETENTION The IS93C66-3 is designed for applications requiring up to 100,000 programming cycles (WRITE, WRALL, ERASE and ERAL). It provides 10 years of secure data retention, without power after the execution of 100,000 programming cycles. Low Voltage Read The IS93C66-3 has been designed to ensure that data read operations are reliable in low voltage environments. The IS93C66-3 is guaranteed to provide accurate data during read operations with Vcc as low as 2.7V. Auto Increment Read Operations In the interest of memory transfer operation applications, the IS93C66-3 has been designed to output a continuous stream of memory content in response to a single read operation instruction. To utilize this function, the system asserts a read instruction specifying a start location address. Once the 16 bits of the addressed word have been clocked out, the data in consecutively higher address locations (the address “000000” is assumed as the address of “111111") is output. The address will wrap around continuously with CS HIGH until the chip select (CS) control pin is brought LOW. This allows for single instruction data dumps to be executed with a minimum of firmware overhead. DEVICE OPERATION The IS93C66-3 is controlled by seven 11-bit instructions. Instructions are clocked in (serially) on the DIN pin. Each instruction begins with a logical “1” (the start bit). This is followed by the opcode (2 bits), the address field (8 bits), and data, if appropriate. The clock signal (SK) may be halted at any time and the IS93C66-3 will remain in its last state. This allows full static flexibility and maximum power conservation. Read (READ) The READ instruction is the only instruction that outputs serial data on the DOUT pin. After the read instruction and address have been decoded, data is transferred from the selected memory register into a 16-bit serial shift register. (Please note that one logical “0” bit precedes the actual 16-bit output data string.) The output on DOUT changes during the low-to-high transitions of SK (see Figure 3). Write Enable (WEN) The write enable (WEN) instruction must be executed before any device programming (WRITE, WRALL, ERASE, and ERAL) can be done. When Vcc is applied, this device powers up in the write disabled state. The device then 2 Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 IS93C66-3 remains in a write disabled state until a WEN instruction is executed. Thereafter, the device remains enabled until a WDS instruction is executed or until Vcc is removed. (NOTE: Neither the WEN nor the WDS instruction has any effect on the READ instruction.) (See Figure 4.) ISSI Write ® As with the WRITE instruction, if CS is brought HIGH after a minimum wait of 250 ns (tCS), the DOUT pin indicates the READY/BUSY status of the chip (see Figure 6). Disable (WDS) Write (WRITE) The WRITE instruction includes 16 bits of data to be written into the specified register. After the last data bit has been applied to DIN, and before the next rising edge of SK, CS must be brought LOW. The falling edge of CS initiates the self-timed programming cycle. After a minimum wait of 250 ns (5V operation) from the falling edge of CS (tCS), if CS is brought HIGH, DOUT will indicate the READY/BUSY status of the chip: logical “0” means programming is still in progress; logical “1” means the selected register has been written, and the part is ready for another instruction (see Figure 5). (NOTE: The combination of CS HIGH, DIN HIGH and the rising edge of the SK clock, resets the READY/BUSY flag. Therefore, it is important if you want to access the READY/BUSY flag not to reset it through this combination of control signals.) Before a WRITE instruction can be executed, the device must be write enabled (see WEN). The write disable (WDS) instruction disables all programming capabilities. This protects the entire part against accidental modification of data until a WEN instruction is executed. (When Vcc is applied, this part powers up in the write disabled state.) To protect data, a WDS instruction should be executed upon completion of each programming operation. (NOTE: Neither the WEN nor the WDS instruction has any effect on the READ instruction.) (See Figure 7.) Erase Register (ERASE) After the erase instruction is entered, CS must be brought LOW. The falling edge of CS initiates the self-timed internal programming cycle. Bringing CS HIGH after a minimum of tCS, will cause DOUT to indicate the READ/BUSY status of the chip: a logical “0” indicates programming is still in progress; a logical “1” indicates the erase cycle is complete and the part is ready for another instruction (see Figure 8). Write All (WRALL) The write all (WRALL) instruction programs all registers with the data pattern specified in the instruction. While the WRALL instruction is being loaded, the address field becomes a sequence of “Don’t Care” bits (see Figure 6). Erase All (ERAL) Full chip erase is provided for ease of programming. Erasing the entire chip involves setting all bits in the entire memory array to a logical “1” (see Figure 9). INSTRUCTION SET Instruction READ WEN (Write Enable) WRITE WRALL (Write All Registers) WDS (Write Disable) ERASE ERAL (Erase All Registers) Start Bit 1 1 1 1 1 1 1 OP Code 10 00 01 00 00 11 00 Address (A7-A0) 11XXXXXX (A7-A0) 01XXXXXX 00XXXXXX (A7-A0) 10XXXXXX D15-D0(1) D15-D0(1) Input Data Note: 1. If input data is not 16 bits exactly, the last 16 bits will be taken as input data (a word). Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 3 IS93C66-3 ABSOLUTE MAXIMUM RATINGS(1) Symbol VGND TBIAS TBIAS TSTG Parameter Voltage with Respect to GND Temperature Under Bias (IS93C46-3) Temperature Under Bias (IS93C46-3I) Storage Temperature Value –0.3 tp +6.5 0 to +70 –40 to +85 –65 to +125 Unit V °C °C °C ISSI ® Notes: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. OPERATING RANGE Range Commercial Industrial Ambient Temperature 0°C to +70°C –40°C to +85°C VCC 2.7V to 6.0V 2.7V to 6.0V CAPACITANCE Symbol CIN COUT Parameter Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Max. 5 5 Unit pF pF FIGURE 1. AC TEST CONDITIONS +2.08V 800Ω DOUT 100 pF Vcc = 5.0V 4 Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 IS93C66-3 DC ELECTRICAL CHARACTERISTICS TA = 0°C to +70°C for IS93C66-3 and –40°C to +85°C for IS93C66-3I. Symbol VOL VOL1 VOH VOH1 VIH VIL ILI ILO Parameter Output LOW Voltage Output LOW Voltage Output HIGH Voltage Output HIGH Voltage Input HIGH Voltage Input LOW Voltage Input Leakage Output Leakage VIN = 0V to VCC (CS, SK, DIN) VOUT = 0V to VCC, CS = 0V Test Conditions IOL = 10 µA CMOS IOL = 2.1 mA TTL IOH = –10 µA CMOS IOH = –400 µA TTL Vcc 2.7V to 3.3V 4.5V to 5.5V 2.7V to 3.3V 4.5V to 5.5V 2.7V to 3.3V 4.5V to 5.5V 2.7V to 3.3V 4.5V to 5.5V Min. — — VCC – 0.2 2.4 2.4 2 –0.1 –0.1 1 1 ISSI Max. 0.2 0.4 — — V CC VCC 0.6 0.8 1 1 V V V V V V µA µA ® Unit POWER SUPPLY CHARACTERISTICS TA = 0°C to +70°C for IS93C66-3 and –40°C to +85°C for IS93C66-3I. IS93C66-3 Min. Typ. Max. — — — — 0.5 4 2 10 2 6 10 50 IS93C66-3I Min. Typ. Max. — — — — 0.5 4 2 10 2 6 10 50 Symbol ICC ICC ISB Parameter Vcc Operating Supply Current Vcc Operating Supply Current Standby Current Test Conditions CS = VIH, SK = 1 MHz CMOS Input Levels CS = VIH, SK = 1 MHz CMOS Input Levels CS = DIN = SK = 0V Vcc 2.7V to 3.3V 4.5V to 5.5V 2.7V to 3.3V 4.5V to 5.5V Unit mA mA µA Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 5 IS93C66-3 AC ELECTRICAL CHARACTERISTICS TA = 0°C to +70°C for IS93C66-3 and –40°C to +85°C for IS93C66-3. IS93C66-3 Min. Max. 0 0 500 250 1 250 500 250 100 50 200 100 0 0 400 100 — — — — — — — — — — 1 1 — — — — — — — — — — — — — — 500 500 500 500 500 500 200 100 10 10 ISSI Test Conditions Vc c 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V Relative to SK Relative to SK Relative to SK Relative to SK AC Test AC Test AC Test, CL = 100 pF CS = VIL 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V 2.7V to 6.0V 4.5V to 6.0V IS93C66-3I Min. Max. 0 0 500 250 1 250 500 250 100 50 200 100 0 0 400 100 — — — — — — — — — — 1 1 — — — — — — — — — — — — — — 500 500 500 500 500 500 200 100 10 10 ® Symbol fSK tSKH tSKL tCS tCSS tDIS tCSH tDIH tPD1 tPD0 tSV tDF tWP Parameter SK Clock Frequency SK HIGH Time SK LOW Time Minimum CS LOW Time CS Setup Time DIN Setup Time CS Hold Time DIN Hold Time Output Delay to “1” Output Delay to “0” CS to Status Valid CS to DOUT in 3-state Write Cycle Time Unit MHz MHz ns µs ns ns ns ns ns ns ns ns ns ns ns ns ms 6 Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 IS93C66-3 AC WAVEFORMS FIGURE 2. SYNCHRONOUS DATA TIMING ISSI ® CS tCSS SK tDIS DIN tPD0 DOUT (READ) tSV DOUT (WRITE) (WRALL) (ERASE) (ERAL) tDIH tSKH T tSKL tCSH tPD1 tDF tDF STATUS VALID FIGURE 3. READ CYCLE TIMING tCS CS SK DIN 1 1 0 A5 A0 DOUT 0 D15 D0 * *Address Pointer Cycles to the Next Register Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 7 IS93C66-3 FIGURE 4. SYNCHRONOUS DATA TIMING tCS CS ISSI ® SK DIN 1 0 0 1 1 DOUT = 3-state FIGURE 5. WRITE (WRITE) CYCLE TIMING tCS CS SK DIN 1 0 1 A5 A0 D15 D0 tSV DOUT BUSY READY tDF tWP FIGURE 6. WRITE ALL (WRALL) TIMING tCS CS SK DIN 1 0 0 0 1 D15 D0 tSV DOUT BUSY READY tWP 8 Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 IS93C66-3 FIGURE 7. WRITE DISABLE (WDS) CYCLE TIMING tCS CS ISSI ® SK DIN 1 0 0 0 0 DOUT = 3-STATE FIGURE 8. ERASE (REGISTER ERASE) CYCLE TIMING SK tCS CS DIN 1 1 1 A5 A4 A0 tSV DOUT BUSY READY tDF tWP FIGURE 9. ERASE ALL (ERAL) CYCLE TIMING SK tCS CS DIN 1 0 0 1 0 tSV DOUT BUSY READY tDF tWP Note for Figures 8 and 9: After the completion of the instruction (DOUT is in READY status) then it may perform another instruction. If device is in BUSY status (DOUT indicates BUSY status) then performs another instruction would cause device malfunction. Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01 9 IS93C66-3 ORDERING INFORMATION Commercial Range: 0°C to +70°C Speed (MHz) Order Part No. 1 1 1 IS93C66-3P IS93C66-3G IS93C66-3GR Package 300-mil Plastic DIP Small Outline (JEDEC) Small Outline (JEDEC) ISSI ® Industrial Range: –40°C to +85°C Speed (MHz) Order Part No. 1 1 1 IS93C66-3PI IS93C66-3GI IS93C66-3GRI Package 300-mil Plastic DIP Small Outline (JEDEC) Small Outline (JEDEC) ISSI ® Integrated Silicon Solution, Inc. 2231 Lawson Lane Santa Clara, CA 95054 Tel: 1-800-379-4774 Fax: (408) 588-0806 E-mail: sales@issi.com www.issi.com 10 Integrated Silicon Solution, Inc. — 1-800-379-4774 Rev. G 04/26/01
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