PolarHVTM HiPerFET
Power MOSFET
IXFH 26N50P
IXFV 26N50P
IXFV 26N50PS
VDSS =
ID25 =
RDS(on) ≤
≤
trr
N-Channel Enhancement Mode
Avalanche Rated
Fast Intrinsic Diode
Symbol
Test Conditions
VDSS
TJ = 25° C to 150° C
500
V
VDGR
TJ = 25° C to 150° C; RGS = 1 MΩ
500
V
Maximum Ratings
VGSS
Continuos
± 30
V
VGSM
Transient
± 40
V
ID25
TC = 25° C
26
A
IDM
TC = 25° C, pulse width limited by TJM
78
A
IAR
TC = 25° C
26
A
EAR
TC = 25° C
40
mJ
EAS
TC = 25° C
1.0
J
dv/dt
IS ≤ IDM, di/dt ≤ 100 A/µs, VDD ≤ VDSS,
TJ ≤150° C, RG = 4 Ω
10
V/ns
PD
TC = 25° C
400
W
-55 ... +150
150
-55 ... +150
°C
°C
°C
300
260
°C
°C
TJ
TJM
Tstg
TL
TSOLD
1.6 mm (0.062 in.) from case for 10 s
Plastic body for 10 s
Md
Mounting torque
(TO-247)
FC
Mounting force
(PLUS220)
Weight
TO-247
PLUS220 & PLUS220SMD
Symbol
Test Conditions
(TJ = 25° C, unless otherwise specified)
11..65/2.5..15
N/lb
6
5
g
g
Characteristic Values
Min. Typ.
Max.
VGS = 0 V, ID = 250 µA
500
VGS(th)
VDS = VGS, ID = 4 mA
3.0
IGSS
VGS = ±30 VDC, VDS = 0
IDSS
VDS = VDSS
VGS = 0 V
RDS(on)
VGS = 10 V, ID = 0.5 ID25
Pulse test, t ≤300 µs, duty cycle d ≤ 2 %
TJ = 125° C
TO-247 (IXFH)
D (TAB)
PLUS220 (IXFV)
G
D
D (TAB)
S
PLUS220SMD (IXFV_S)
1.13/10 Nm/lb.in.
BVDSS
© 2006 IXYS All rights reserved
500 V
26 A
230 m Ω
200 ns
V
5.5
V
±100
nA
25
250
µA
µA
230
mΩ
G
D (TAB)
S
G = Gate
S = Source
D = Drain
TAB = Drain
Features
l
International standard packages
l
Fast intrinsic diode
l
Unclamped Inductive Switching (UIS)
rated
l
Low package inductance
- easy to drive and to protect
Advantages
Easy to mount
l
Space savings
l
High power density
l
DS99276E(12/05)
IXFH 26N50P
Symbol
Test Conditions
Characteristic Values
(TJ = 25° C, unless otherwise specified)
Min. Typ. Max.
26
S
3600
pF
370
pF
Crss
40
pF
td(on)
20
ns
gfs
VDS = 20 V; ID = 0.5 ID25, pulse test
Ciss
Coss
16
VGS = 0 V, VDS = 25 V, f = 1 MHz
IXFV 26N50P
IXFV 26N50PS
TO-247 AD (IXFH) Outline
1
2
Terminals:
1 - Gate
2 - Drain
3 - Source
Tab - Drain
3
tr
VGS = 10 V, VDS = 0.5 ID25
25
ns
td(off)
RG = 4 Ω (External)
58
ns
tf
20
ns
Dim.
Qg(on)
60
nC
20
nC
A
A1
A2
4.7
2.2
2.2
5.3
2.54
2.6
.185
.087
.059
.209
.102
.098
25
nC
b
b1
b2
1.0
1.65
2.87
1.4
2.13
3.12
.040
.065
.113
.055
.084
.123
C
D
E
.4
20.80
15.75
.8
21.46
16.26
.016
.819
.610
.031
.845
.640
e
L
L1
5.20
19.81
5.72
20.32
4.50
0.205
.780
0.225
.800
.177
∅P
Q
3.55
5.89
3.65
6.40
.140
0.232
.144
0.252
R
S
4.32
6.15
5.49
BSC
.170
242
.216
BSC
Qgs
VGS = 10 V, VDS = 0.5 VDSS, ID = 0.5 ID25
Qgd
0.31 ° C/W
RthJC
RthCS
(TO-247, PLUS220)
° C/W
0.21
Source-Drain Diode
Characteristic Values
(TJ = 25° C, unless otherwise specified)
Min. Typ. Max.
Symbol
Test Conditions
IS
VGS = 0 V
26
A
ISM
Repetitive
104
A
VSD
IF = IS, VGS = 0 V,
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
1.5
V
trr
IF = 25A, -di/dt = 100 A/µs
200
ns
QRM
IRM
VR = 100V, VGS = 0 V
0.6
6
Millimeter
Min.
Max.
PLUS220 (IXFV) Outline
µC
Α
PLUS220SMD (IXFV_S) Outline
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by 4,835,592
one or moreof the following U.S. patents: 4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
Inches
Min.
Max.
6,404,065 B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
6,727,585
6,759,692
6,771,478 B2
IXFH 26N50P
Fig. 1. Output Characteristics
@ 25ºC
Fig. 2. Extended Output Characteristics
@ 25ºC
60
26
V GS = 10V
8V
7V
24
22
50
45
I D - Amperes
18
I D - Amperes
V GS = 10V
8V
55
20
16
14
12
6V
10
7V
40
35
30
25
20
8
6
15
4
10
2
6V
5
5V
0
5V
0
0
1
2
3
4
5
6
7
0
3
6
9
15
18
21
24
27
30
Fig. 4. R DS(on) Normalized to ID = 13A Value
v s. Junction Temperature
Fig. 3. Output Characteristics
@ 125ºC
26
3.1
V GS = 10V
7V
24
22
V GS = 10V
2.8
2.5
18
R DS(on) - Normalized
20
I D - Amperes
12
V DS - Volts
V DS - Volts
6V
16
14
12
10
8
6
5V
2.2
I D = 26A
1.9
1.6
I D = 13A
1.3
1
4
0.7
2
0
0.4
0
2
4
6
8
10
12
14
-50
16
-25
V DS - Volts
0
25
50
75
100
125
150
T J - Degrees Centigrade
Fig. 5. R DS(on) Normalized to ID = 13A Value
v s. Drain Current
Fig. 6. Maximum Drain Current v s.
Case Temperature
30
3.2
3
V GS = 10V
25
TJ = 125ºC
2.8
2.6
2.4
I D - Amperes
R DS(on) - Normalized
IXFV 26N50P
IXFV 26N50PS
2.2
2
1.8
1.6
20
15
10
1.4
TJ = 25ºC
1.2
5
1
0.8
0
0
5
10
15
20
25
30
35
I D - Amperes
© 2006 IXYS All rights reserved
40
45
50
55
60
-50
-25
0
25
50
75
T J - Degrees Centigrade
100
125
150
IXFH 26N50P
Fig. 8. Transconductance
50
45
45
40
40
35
35
g f s - Siemens
I D - Amperes
Fig. 7. Input Admittance
50
30
TJ = 125ºC
25ºC
- 40ºC
25
IXFV 26N50P
IXFV 26N50PS
20
TJ = - 40ºC
25ºC
125ºC
30
25
20
15
15
10
10
5
5
0
0
3.5
4
4.5
5
5.5
6
6.5
7
0
5
10
15
20
V GS - Volts
25
30
35
40
45
50
55
60
60
65
I D - Amperes
Fig. 9. Forward Voltage Drop of
Intrinsic Diode
Fig. 10. Gate Charge
80
10
V DS = 250V
9
70
I D = 13A
8
I G = 10mA
60
I S - Amperes
7
V GS - Volts
50
40
30
TJ = 125ºC
6
5
4
3
20
2
10
TJ = 25ºC
1
0
0
0.4
0.5
0.6
0.7
0.8
0.9
1
1.1
0
5
10
V SD - Volts
15
20
25
30
35
40
45
50
55
Q G - NanoCoulombs
Fig. 12. Forward-Bias Safe Operating Area
Fig. 11. Capacitance
100
10,000
f = 1 MHz
Capacitance - PicoFarads
RDS(on) Limit
C iss
25µs
I D - Amperes
1,000
C oss
100µs
10
1ms
100
10ms
DC
TJ = 150ºC
C rss
TC = 25ºC
10
1
0
5
10
15
20
25
30
35
40
V DS - Volts
IXYS reserves the right to change limits, test conditions, and dimensions.
10
100
V DS - Volts
1000
IXFH 26N50P
IXFV 26N50P
IXFV 26N50PS
Fig. 13. Maximum Transient Thermal Resistance
R (th)JC - ºC / W
1.000
0.100
0.010
0.0001
0.001
0.01
Pulse W idth - Seconds
© 2006 IXYS All rights reserved
0.1
1
10
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