DE375-102N12A
RF Power MOSFET
N-Channel Enhancement Mode
Low Qg and Rg
High dv/dt
Nanosecond Switching
50MHz Maximum Frequency
Symbol
Test Conditions
Maximum Ratings
VDSS
TJ = 25°C to 150°C
1000
V
VDGR
TJ = 25°C to 150°C; RGS = 1 MΩ
1000
V
VGS
Continuous
±20
V
VGSM
Transient
±30
V
ID25
Tc = 25°C
12
A
IDM
Tc = 25°C, pulse width limited by TJM
72
A
IAR
Tc = 25°C
12
A
EAR
Tc = 25°C
30
mJ
5
V/ns
dv/dt
IS ≤ IDM, di/dt ≤ 100A/µs, VDD ≤ VDSS,
Tj ≤ 150°C, RG = 0.2Ω
>200
V/ns
940
W
425
W
4.5
W
RthJC
0.16
C/W
RthJHS
0.35
C/W
IS = 0
PDC
PDHS
Tc = 25°C
Derate 3.7W/°C above 25°C
PDAMB
Tc = 25°C
Symbol
Test Conditions
VDSS
VGS = 0 V, ID = 3 ma
VGS(th)
VDS = VGS, ID = 250 µa
IGSS
VGS = ±20 VDC, VDS = 0
IDSS
VDS = 0.8 VDSS TJ = 25°C
TJ = 125°C
VGS = 0
RDS(on)
VGS = 15 V, ID = 0.5ID25
Pulse test, t ≤ 300µS, duty cycle d ≤ 2%
gfs
VDS = 15 V, ID = 0.5ID25, pulse test
min.
1000
4.0
V
4.7
6.7
5.5
V
±100
nA
50
1
µA
mA
1.05
Ω
8.0
S
+175
°C
175
TJM
-55
Tstg
Weight
max.
-55
TJ
TL
typ.
1.6mm (0.063 in) from case for 10 s
=
1000 V
ID25
=
12 A
RDS(on)
≤
1.05 Ω
PDC
=
940 W
DRAIN
GATE
SG1
SG2
SD1
SD2
Features
Characteristic Values
TJ = 25°C unless otherwise specified
VDSS
°C
+175
°C
300
°C
3
g
• Isolated Substrate
− high isolation voltage (>2500V)
− excellent thermal transfer
− Increased temperature and power
•
•
−
−
•
•
•
cycling capability
IXYS advanced low Qg process
Low gate charge and capacitances
easier to drive
faster switching
Low RDS(on)
Very low insertion inductance (
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