DSEP 2x35-06C
HiPerDynFREDTM Epitaxial Diode
IFAV = 2x35 A
VRRM = 600 V
trr
= 20 ns
with soft recovery
Preliminary Data
VRRM
V
V
600
600
SOT-227 B,
miniBLOC
Type
DSEP 2x 35-06C
Test Conditions
Maximum Ratings
IFRMS
IFAVM
IFRM
TC = 100°C; rectangular, d = 0.5
tP < 10 µs; rep. rating, pulse width limited by TVJM
100
35
tbd
IFSM
TVJ = 45°C; tp = 10 ms (50 Hz), sine
300
EAS
TVJ = 25°C; non-repetitive
IAS = 3 A; L = 180 µH
1.2
IAR
VA = 1.5·VR typ.; f = 10 kHz; repetitive
TC = 25°C
VISOL
50/60 Hz, RMS, IISOL ≤ 1 mA
Md
mounting torque (M4)
terminal connection torque (M4)
Weight
typical
Symbol
Test Conditions
No
t
①
fo
r
Ptot
A
mJ
0.3
A
-40...+150
150
-40...+150
°C
°C
°C
210
W
2500
V~
ne
w
TVJ
TVJM
Tstg
A
A
A
de
Symbol
1.1-1.5/9-13
1.1-1.5/9-13
30
Nm/lb.in.
Nm/lb.in.
g
Characteristic Values
typ.
max.
VR = VRRM; TVJ = 25°C
TVJ = 150°C
0.25
1.0
mA
mA
VF ②
IF = 35 A;
1.97
2.50
V
V
RthJC
RthCH
0.6
with heatsink compound
0.1
K/W
K/W
trr
IF = 1 A; -di/dt = 300 A/µs;
VR = 30 V; TVJ = 25°C
20
ns
IRM
VR = 100 V; IF = 50 A; -diF/dt = 100 A/µs
TVJ = 100°C
4.5
IR
TVJ = 125°C
TVJ = 25°C
7.0
Pulse test: ① Pulse Width = 5 ms, Duty Cycle < 2.0 %
② Pulse Width = 300 µs, Duty Cycle < 2.0 %
Features
si
gn
VRSM
A
• International standard package miniBLOC
• Isolation voltage 2500 V~
• UL registered E 72873
• 2 independent FRED in 1 package
• Planar passivated chips
• Very short recovery time
• Extremely low switching losses
• Low IRM-values
• Soft recovery behaviour
Applications
• Antiparallel diode for high frequency
switching devices
• Antisaturation diode
• Snubber diode
• Free wheeling diode in converters
and motor control circuits
• Rectifiers in switch mode power
supplies (SMPS)
• Inductive heating
• Uninterruptible power supplies (UPS)
• Ultrasonic cleaners and welders
Advantages
• Avalanche voltage rated for reliable
operation
• Soft reverse recovery for low EMI/RFI
• Low IRM reduces:
- Power dissipation within the diode
- Turn-on loss in the commutating switch
Dimensions see Outlines.pdf
Recommended replacement:
2x DPH30IS600HI
IXYS reserves the right to change limits, test conditions and dimensions.
© 2003 IXYS All rights reserved
319
Data according to IEC 60747 and per diode unless otherwise specified
20080317a
1-1
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