HiPerFETTM
Power MOSFETs
Single Die MOSFET
IXFN 340N07
VDSS
ID25
RDS(on)
= 70 V
= 340 A
Ω
=
4 mΩ
trr
≤ 200 ns
D
N-Channel Enhancement Mode
Avalanche Rated, High dv/dt, Low trr
G
S
S
Symbol
Test Conditions
Maximum Ratings
VDSS
TJ = 25°C to 150°C
70
V
VDGR
TJ = 25°C to 150°C; RGS = 1 MΩ
70
V
VGS
Continuous
±20
V
VGSM
Transient
±30
V
ID25
IL(RMS)
TC = 25°C, Chip capability
Terminal current limit
340
100
A
A
IDM
IAR
TC = 25°C, pulse width limited by TJM
TC = 25°C
1360
200
A
A
EAR
TC = 25°C
64
mJ
EAS
TC = 25°C
4
J
dv/dt
IS ≤ IDM, di/dt ≤ 100 A/μs, VDD ≤ VDSS,
TJ ≤ 150°C, RG = 2 Ω
10
V/ns
PD
TC = 25°C
700
W
TJ
TJM
-55 ... +150
150
°C
°C
Tstg
-55 ... +150
°C
2500
3000
V~
V~
VISOL
50/60 Hz, RMS
IISOL ≤ 1 mA
Md
Mounting torque
Terminal connection torque
t = 1 min
t=1s
S
G
1.5/13 Nm/lb.in.
1.5/13 Nm/lb.in.
Weight
miniBLOC, SOT-227 B (IXFN)
E153432
30
g
S
D
G = Gate
S = Source
D = Drain
Either Source terminal at miniBLOC can be used
as Main or Kelvin Source
Features
• International standard package
• miniBLOC, with Aluminium nitride
isolation
• Low RDS (on) HDMOSTM process
• Rugged polysilicon gate cell structure
• Unclamped Inductive Switching (UIS)
rated
• Low package inductance
• Fast intrinsic Rectifier
Applications
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
VDSS
VGS = 0 V, ID = 3 mA
70
VGH(th)
VDS = VGS, ID = 8 mA
2.0
IGSS
VGS = ±20 VDC, VDS = 0
IDSS
VDS = VDSS
VGS = 0 V
RDS(on)
V GS = 10 V, ID = 100A
Pulse test, t ≤ 300 μs,
duty cycle d ≤ 2 %
© 2004 IXYS All rights reserved
TJ = 25°C
TJ = 125°C
V
4.0
V
±200
nA
100
2
μA
mA
4
mΩ
• DC-DC converters
• Battery chargers
• Switched-mode and resonant-mode
power supplies
• DC choppers
• Temperature and lighting controls
• Linear current regulators
Advantages
• Easy to mount
• Space savings
• High power density
DS98547D(05/04)
IXFN 340N07
Symbol
gfs
Test Conditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min.
typ. max.
VDS = 10 V; ID = 60A, pulse test
80
Ciss
Coss
98
S
12200
pF
7100
pF
Crss
VGS = 0 V, VDS = 25 V, f = 1 MHz
3340
pF
td(on)
100
ns
95
ns
200
ns
33
ns
tr
VGS = 10 V, VDS = 0.5 • VDSS, ID = 100A
td(off)
RG = 1 Ω (External)
M4 screws (4x) supplied
Dim.
tf
Qg(on)
Qgs
miniBLOC, SOT-227 B
VGS = 10 V, VDS = 50 V, ID = 100A
Qgd
490
nC
72
nC
266
nC
RthJC
0.18
RthCK
0.05
Source-Drain Diode
K/W
K/W
Millimeter
Min.
Max.
Inches
Min.
Max.
A
B
31.50
7.80
31.88
8.20
1.240
0.307
1.255
0.323
C
D
4.09
4.09
4.29
4.29
0.161
0.161
0.169
0.169
E
F
4.09
14.91
4.29
15.11
0.161
0.587
0.169
0.595
G
H
30.12
38.00
30.30
38.23
1.186
1.496
1.193
1.505
J
K
11.68
8.92
12.22
9.60
0.460
0.351
0.481
0.378
L
M
0.76
12.60
0.84
12.85
0.030
0.496
0.033
0.506
N
O
25.15
1.98
25.42
2.13
0.990
0.078
1.001
0.084
P
Q
4.95
26.54
5.97
26.90
0.195
1.045
0.235
1.059
R
S
3.94
4.72
4.42
4.85
0.155
0.186
0.174
0.191
T
U
24.59
-0.05
25.07
0.1
0.968
-0.002
0.987
0.004
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
Symbol
Test Conditions
IS
VGS = 0 V
ISM
Repetitive;
pulse width limited by TJM
VSD
IF = 100A, VGS = 0 V,
Pulse test, t ≤ 300 μs, duty cycle d ≤ 2 %
trr
QRM
IRM
IF = 50A, -di/dt = 100 A/μs, VR = 50V TJ = 25°C
100
1.4
8
340
A
1360
A
1.2
V
200
ns
μC
A
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by
one or moreof the following U.S. patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,306,728 B1 6,534,343
6,259,123 B1 6,404,065 B1 6,583,505
6,683,344
6,710,405B2
IXFN 340N07
Fig. 1. Output Characteristics
@ 25 Deg. C
Fig. 2. Output Characteristics
@ 125 Deg. C
240
240
VGS=10V
9V
8V
7V
160
6V
120
5V
80
160
0
0
0.6
0.9
V DS - Volts
1.2
5V
80
40
0.3
0
1.5
5
1.6
RDS(ON) - Normalized
1.8
RDS(ON) - Ohm
4.5
ID=200A
3.5
ID=100A
1.2
1.6
2
1.4
1.2
ID=200A
1
ID=100A
0.8
2.5
2
-50
0.6
-25
0
25
50
75
100
125
150
-50
-25
TJ - Degrees Centigrade
0
25
50
75
100 125 150
TJ - Degrees Centigrade
Fig. 6. Temperature dependence of
Breakdown & Threshold Voltage
Fig. 5. RDS(ON) Normalized to I L(RMS)
Value vs. I D
1.2
BVDSS & VGS(TH) - Normalized
1.6
TJ=125 °C
1.5
RDS(ON) - Normalized
0.8
Fig. 4. RDS(ON) Normalized to I L(RMS)
Value vs. Junction Temperature
5.5
3
0.4
VDS - Volts
Fig. 3. Temperature Dependence of
RDS(ON)
4
6V
120
40
0
VGS=10V
9V
8V
7V
200
ID - Amperes
ID - Amperes
200
1.4
1.3
1.2
1.1
TJ=25 °C
1
VGS(TH)
BVDSS
1.1
1
0.9
0.8
0.7
0.9
0
50
100
150
ID - Amperes
© 2004 IXYS All rights reserved
200
250
-50
-25
0
25
50
75
100 125 150
TJ - Degrees Centigrade
IXFN 340N07
Fig. 8. Transconductance
Fig. 7. Input Admittance
180
250
150
GFS - Siemens
ID - Amperes
200
150
TJ= -40 °C
100
25 °C
120
90
60
125 °C
50
TJ=25°
30
0
0
2.5
3
3.5
4
4.5
5
5.5
6
0
40
VGS - Volts
200
240
Fig. 10. Gate Charge
-240
10
-200
8
VDS=50V
-160
-120
V GS - Volts
IS - Amperes
Fig. 9. Source Current vs. Source-ToDrain Voltage
80
120
160
ID - Amperes
TJ=125 °C
-80
TJ=25°C
6
4
2
-40
0
-0.4
ID=100A
IG=10mA
0
-0.5
-0.6
-0.7
-0.8
-0.9
0
-1
VSD - Volts
100
200
300
400
500
QG - nanoCoulom bs
Fig. 11. Capacitance
Fig. 12. Transient Thermal Resistance
1
100000
R(TH)JC - (ºC/W)
Capacitance - pF
f=100kHz
Ciss
10000
Coss
Crss
0.1
0.01
0.001
1000
0
10
20
VDS - Volts
30
40
IXYS reserves the right to change limits, test conditions, and dimensions.
1
10
100
Pulse Width - milliseconds
1000
IXFN 340N07
Fig. 13. Forward-Bias Safe
Operating Area
10,000
TC = 25ºC
TJ = 150ºC
R DS(on) Limit
I D - Amperes
1,000
100µs
1ms
100
10ms
DC
10
1
© 2004 IXYS All rights reserved
10
VD S - Volts
100
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