0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
会员中心
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
ISPLSI2032E-180LT44

ISPLSI2032E-180LT44

  • 厂商:

    LATTICE(莱迪思半导体)

  • 封装:

    TQFP44

  • 描述:

    ICCPLD32MC5NS44TQFP

  • 详情介绍
  • 数据手册
  • 价格&库存
ISPLSI2032E-180LT44 数据手册
® ispLSI 2032E In-System Programmable SuperFAST™ High Density PLD Functional Block Diagram Input Bus ® • HIGH PERFORMANCE E CMOS TECHNOLOGY — fmax = 225 MHz Maximum Operating Frequency — tpd = 3.5 ns Propagation Delay — TTL Compatible Inputs and Outputs — 5V Programmable Logic Core — ispJTAG™ In-System Programmable via IEEE 1149.1 (JTAG) Test Access Port — User-Selectable 3.3V or 5V I/O (48-Pin Package Only) Supports Mixed Voltage Systems — PCI Compatible Outputs (48-Pin Package Only) — Open-Drain Output Option — Electrically Erasable and Reprogrammable — Non-Volatile — Unused Product Term Shutdown Saves Power Output Routing Pool (ORP) 2 Global Routing Pool (GRP) A0 A1 A2 D Q GLB Logic Array A7 A6 D Q D Q A5 D Q A3 Input Bus • SuperFAST HIGH DENSITY IN-SYSTEM PROGRAMMABLE LOGIC — 1000 PLD Gates — 32 I/O Pins, Two Dedicated Inputs — 32 Registers — High Speed Global Interconnect — Wide Input Gating for Fast Counters, State Machines, Address Decoders, etc. — Small Logic Block Size for Random Logic — 100% Functionally and JEDEC Upward Compatible with ispLSI 2032 Devices Output Routing Pool (ORP) Features A4 0139Bisp/2000 Description The ispLSI 2032E is a High Density Programmable Logic Device. The device contains 32 Registers, 32 Universal I/O pins, two Dedicated Input Pins, three Dedicated Clock Input Pins, one dedicated Global OE input pin and a Global Routing Pool (GRP). The GRP provides complete interconnectivity between all of these elements. The ispLSI 2032E features 5V in-system programmability and in-system diagnostic capabilities. The ispLSI 2032E offers non-volatile reprogrammability of the logic, as well as the interconnect to provide truly reconfigurable systems. • ispLSI OFFERS THE FOLLOWING ADDED FEATURES — Increased Manufacturing Yields, Reduced Time-toMarket and Improved Product Quality — Reprogram Soldered Devices for Faster Prototyping • OFFERS THE EASE OF USE AND FAST SYSTEM SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY OF FIELD PROGRAMMABLE GATE ARRAYS — Complete Programmable Device Can Combine Glue Logic and Structured Designs — Enhanced Pin Locking Capability — Three Dedicated Clock Input Pins — Synchronous and Asynchronous Clocks — Programmable Output Slew Rate Control to Minimize Switching Noise — Flexible Pin Placement — Optimized Global Routing Pool Provides Global Interconnectivity The basic unit of logic on the ispLSI 2032E device is the Generic Logic Block (GLB). The GLBs are labeled A0, A1 .. A7 (see Figure 1). There are a total of eight GLBs in the ispLSI 2032E device. Each GLB is made up of four macrocells. Each GLB has 18 inputs, a programmable AND/OR/Exclusive OR array, and four outputs which can be configured to be either combinatorial or registered. Inputs to the GLB come from the GRP and dedicated inputs. All of the GLB outputs are brought back into the GRP so that they can be connected to the inputs of any GLB on the device. The device also has 32 I/O cells, each of which is directly connected to an I/O pin. Each I/O cell can be individually Copyright © 2003 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice. LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com 2032e_05 1 November 2003 Specifications ispLSI 2032E Functional Block Diagram Figure 1. ispLSI 2032E Functional Block Diagram GOE 0 I/O 12 I/O 13 I/O 14 I/O 15 A1 I/O 31 I/O 30 I/O 29 I/O 28 A7 Global Routing Pool (GRP) A2 A6 A5 A4 A3 I/O 27 Input Bus I/O 9 I/O 10 I/O 11 Output Routing Pool (ORP) I/O 8 Input Bus I/O 4 I/O 5 I/O 6 I/O 7 A0 Output Routing Pool (ORP) I/O 0 I/O 1 I/O 2 I/O 3 I/O 26 I/O 25 I/O 24 I/O 23 I/O 22 I/O 21 I/O 20 I/O 19 I/O 18 I/O 17 I/O 16 CLK 0 CLK 1 CLK 2 TDI/IN 0 TDO/IN 1 TMS BSCAN Y0 Y1* TCK/Y2 Notes: *Y1 and RESET are multiplexed on the same pin 0139/2032E Clocks in the ispLSI 2032E device are selected using the dedicated clock pins. Three dedicated clock pins (Y0, Y1, Y2) or an asynchronous clock can be selected on a GLB basis. The asynchronous or Product Term clock can be generated in any GLB for its own clock. programmed to be a combinatorial input, output or bidirectional I/O pin with 3-state control. The signal levels are TTL compatible voltages and the output drivers can source 4 mA or sink 8 mA. Each output can be programmed independently for fast or slow output slew rate to minimize overall output switching noise. By connecting the VCCIO pins to a common 5V or 3.3V power supply, I/O output levels can be matched to 5V or 3.3V compatible voltages. When connected to a 5V supply, the I/O pins provide PCI-compatible output drive (48-pin device only). Programmable Open-Drain Outputs In addition to the standard output configuration, the outputs of the ispLSI 2032E are individually programmable, either as a standard totem-pole output or an open-drain output. The totem-pole output drives the specified Voh and Vol levels, whereas the open-drain output drives only the specified Vol. The Voh level on the open-drain output depends on the external loading and pull-up. This output configuration is controlled by a programmable fuse. The default configuration when the device is in bulk erased state is totem-pole configuration. The open-drain/totem-pole option is selectable through the Lattice software tools. Eight GLBs, 32 I/O cells, two dedicated inputs and two ORPs are connected together to make a Megablock (see Figure 1). The outputs of the eight GLBs are connected to a set of 32 universal I/O cells by the ORP. Each ispLSI 2032E device contains one Megablock. The GRP has as its inputs, the outputs from all of the GLBs and all of the inputs from the bi-directional I/O cells. All of these signals are made available to the inputs of the GLBs. Delays through the GRP have been equalized to minimize timing skew. 2 Specifications ispLSI 2032E Absolute Maximum Ratings 1 Supply Voltage Vcc .................................. -0.5 to +7.0V Input Voltage Applied ........................ -2.5 to VCC +1.0V Off-State Output Voltage Applied ..... -2.5 to VCC +1.0V Storage Temperature ................................ -65 to 150°C Case Temp. with Power Applied .............. -55 to 125°C Max. Junction Temp. (TJ) with Power Applied ... 150°C 1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). DC Recommended Operating Condition SYMBOL PARAMETER MIN. MAX. UNITS 4.75 5.25 V 5V 4.75 5.25 V 3.3V 3.0 3.6 V V VCC Supply Voltage: Logic Core, Input Buffers VCCIO1 Supply Voltage: Output Drivers VIL VIH Input Low Voltage 0 0.8 Input High Voltage 2.0 Vcc+1 TA = 0°C to +70°C V Table 2-0005/2032E 1. 3.3V I/O operation not available for 44-pin packages. Capacitance (TA=25°C, f=1.0 MHz) TYP UNITS Dedicated Input Capacitance 6 pf VCC = 5.0V, VIN = 2.0V I/O Capacitance 7 pf VCC = 5.0V, VI/O = 2.0V Clock Capacitance 10 pf VCC = 5.0V, VY = 2.0V SYMBOL C1 C2 C3 PARAMETER TEST CONDITIONS Table 2-0006/2032E Erase/Reprogram Specification PARAMETER Erase/Reprogram Cycles MINIMUM MAXIMUM UNITS 10,000 – Cycles Table 2-0008/2032E 3 Specifications ispLSI 2032E Switching Test Conditions Input Pulse Levels Figure 2. Test Load GND to 3.0V + 5V 1.5 ns Input Rise and Fall Time 10% to 90% Input Timing Reference Levels 1.5V Output Timing Reference Levels 1.5V Output Load R1 Device Output See Figure 2 Table 2-0003/2032E 3-state levels are measured 0.5V from steady-state active level. Test Point R2 CL* Output Load Conditions (see Figure 2) TEST CONDITION R1 R2 CL 470Ω 390Ω 35pF Active High ∞ 390Ω 35pF Active Low 470Ω 390Ω 35pF Active High to Z at VOH -0.5V ∞ 390Ω 5pF Active Low to Z at VOL +0.5V 470Ω 390Ω A B C *CL includes Test Fixture and Probe Capacitance. 0213A 5pF Table 2 - 0004A DC Electrical Characteristics Over Recommended Operating Conditions1 SYMBOL VOL VOH IIL IIH IIL-PU IOS1 ICC2,4,6 1. 2. 3. 4. 5. 6. PARAMETER CONDITION MIN. TYP.3 MAX. UNITS Output Low Voltage IOL = 8 mA – – 0.4 V Output High Voltage IOH = -4 mA 2.4 – – V Input or I/O Low Leakage Current Input or I/O High Leakage Current I/O Active Pull-Up Current, non-PCI 5 I/O Active Pull-Up Current, PCI 0V ≤ VIN ≤ VIL (Max.) – – -10 µA (VCCIO - 0.2)V ≤ VIN ≤ VCCIO – – 10 µA VCCIO ≤ VIN ≤ 5.25V – – 10 µA 0V ≤ VIN ≤ 2.0V -10 – -150 µA 0V ≤ VIN ≤ 2.0V -10 – -250 µA – – -200 mA Output Short Circuit Current, non-PCI VCCIO = 5V, VOUT = 0.5V Output Short Circuit Current, PCI5 Operating Power Supply Current VCCIO = 5.0V or 3.3V, VOUT = 0.5V VIL = 0.0V, VIH = 3.0V fTOGGLE = 1 MHz – – -240 mA -225/-200 – 85 – mA Others – 65 – mA Table 2-0007/2032E One output at a time for a maximum duration of one second (VOUT = 0.5V). Characterized, but not 100% tested. Meaured using two 16-bit counters. Typical values are at VCC = 5V and TA = 25°C. Unused inputs held at 0.0V. Available in 48-pin package only. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption section of this data sheet and the Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate maximum ICC. 4 Specifications ispLSI 2032E External Timing Parameters Over Recommended Operating Conditions tpd1 tpd2 fmax fmax (Ext.) fmax (Tog.) tsu1 tco1 th1 tsu2 tco2 th2 tr1 trw1 tptoeen tptoedis tgoeen tgoedis twh twl 1. 2. 3. 4. TEST 2 4 # COND. -225 DESCRIPTION1 -180 -200 MIN. MAX. MIN. MAX. MIN. MAX. UNITS A 1 Data Prop. Delay, 4PT Bypass, ORP Bypass – 3.5 – 3.5 – 5.0 ns A 2 Data Prop. Delay – 5.5 – 5.5 – 7.5 ns A 3 Clk Frequency with Int. Feedback3 225 – 200 – 180 – MHz 167 – 167 – 125 – MHz 250 – 200 – MHz 2.5 – 3.0 – ns – 2.5 – 4.0 ns 0.0 – 0.0 – ns 3.5 – 4.0 – ns – 3.5 – 4.5 ns 0.0 – 0.0 – ns – 5.0 – 6.5 ns 3.5 – 4.0 – ns – 7.0 – 10.0 ns – 7.0 – 10.0 ns – 3.5 – 5.0 ns 1 tsu2 + tco1 – 4 Clk Frequency with Ext. Feedback ( ) – 5 Clk Frequency, Max. Toggle 250 – – 6 GLB Reg. Setup Time before Clk, 4 PT Bypass 2.5 – A 7 GLB Reg. Clk to Output Delay, ORP Bypass – 2.5 – 8 GLB Reg. Hold Time after Clk, 4 PT Bypass 0.0 – – 9 GLB Reg. Setup Time before Clk 3.5 – – 10 GLB Reg. Clk to Output Delay – 3.5 – 11 GLB Reg. Hold Time after Clk 0.0 – A 12 Ext. Reset Pin to Output Delay, ORP Bypass – 5.0 USE 2032E-22 5 FOR NEW DESIGNS PARAMETER – 13 Ext. Reset Pulse Duration 3.5 – B 14 Input to Output Enable – 7.0 C 15 Input to Output Disable – 7.0 B 16 Global OE Output Enable – 3.5 C 17 Global OE Output Disable – 3.5 – 3.5 – 5.0 ns – 18 Ext. Synch. Clk Pulse Duration, High 2.0 – 2.0 – 2.5 – ns – 19 Ext. Synch. Clk Pulse Duration, Low 2.0 – 2.0 – 2.5 – ns Unless noted otherwise, all parameters use a GRP load of four GLBs, 20 PTXOR path, ORP and Y0 clock. Refer to Timing Model in this data sheet for further details. Standard 16-bit counter using GRP feedback. Reference Switching Test Conditions section. 5 Table 2-0030A/2032E Specifications ispLSI 2032E External Timing Parameters Over Recommended Operating Conditions PARAMETER tpd1 tpd2 fmax fmax (Ext.) fmax (Tog.) tsu1 tco1 th1 tsu2 tco2 th2 tr1 trw1 tptoeen tptoedis tgoeen tgoedis twh twl 1. 2. 3. 4. TEST 2 4 # COND. -110 -135 DESCRIPTION1 MIN. MAX. MIN. MAX. UNITS A 1 Data Propagation Delay, 4PT Bypass, ORP Bypass – 7.5 – 10.0 ns A 2 Data Propagation Delay – 10.0 – 13.0 ns A 3 Clock Frequency with Internal Feedback3 137 – 111 – MHz 100 – 77.0 – MHz 1 tsu2 + tco1 – 4 Clock Frequency with External Feedback ( ) – 5 Clock Frequency, Max. Toggle 167 – 125 – MHz – 6 GLB Register Setup Time before Clock, 4 PT Bypass 4.0 – 5.5 – ns A 7 GLB Register Clock to Output Delay, ORP Bypass – 4.5 – 5.5 ns – 8 GLB Register Hold Time after Clock, 4 PT Bypass 0.0 – 0.0 – ns – 9 GLB Register Setup Time before Clock 5.5 – 7.5 – ns – 10 GLB Register Clock to Output Delay – 5.5 – 6.5 ns – 11 GLB Register Hold Time after Clock 0.0 – 0.0 – ns A 12 External Reset Pin to Output Delay, ORP Bypass – 9.0 – 12.5 ns – 13 External Reset Pulse Duration 5.0 – 6.5 – ns B 14 Input to Output Enable – 12.0 – 14.5 ns C 15 Input to Output Disable – 12.0 – 14.5 ns B 16 Global OE Output Enable – 6.0 – 7.0 ns C 17 Global OE Output Disable – 6.0 – 7.0 ns – 18 External Synchronous Clock Pulse Duration, High 3.0 – 4.0 – ns – 19 External Synchronous Clock Pulse Duration, Low 3.0 – 4.0 – ns Unless noted otherwise, all parameters use a GRP load of four GLBs, 20 PTXOR path, ORP and Y0 clock. Refer to Timing Model in this data sheet for further details. Standard 16-bit counter using GRP feedback. Reference Switching Test Conditions section. 6 Table 2-0030B/2032E Specifications ispLSI 2032E Internal Timing Parameters1 Over Recommended Operating Conditions PARAMETER 2 # -225 DESCRIPTION -180 -200 MIN. MAX. MIN. MAX. MIN. MAX. UNITS 20 Input Buffer Delay – 0.6 – 0.4 – 0.6 ns 21 Dedicated Input Delay – 1.3 – 1.3 – 1.3 ns 22 GRP Delay – 0.7 – 0.7 – 0.7 ns 23 4 Product Term Bypass Path Delay (Combinatorial) – 1.2 – 1.8 – 1.8 ns 24 4 Product Term Bypass Path Delay (Registered) – 1.2 – 1.8 – 2.8 ns 25 1 Product Term/XOR Path Delay – 2.2 – 2.8 – 3.8 ns 26 20 Product Term/XOR Path Delay – 2.2 – SIGNS tio tdin 2.8 – 3.8 ns – 2.2 – 2.8 – 3.8 ns – 0.0 – 0.0 – 0.0 ns 29 GLB Register Setup Time before Clock 0.8 – 0.8 – 0.3 – ns 30 GLB Register Hold Time after Clock 1.7 – 1.7 – 2.7 – ns 31 GLB Register Clock to Output Delay – 0.7 – 0.7 – 0.7 ns 32 GLB Register Reset to Output Delay – 1.3 – 2.9 – 1.1 ns 33 GLB Product Term Reset to Register Delay – 2.5 – 2.5 – 2.9 ns 34 GLB Product Term Output Enable to I/O Cell Delay – 4.2 – 4.4 – 5.9 ns 0.3 2.8 0.7 3.2 1.5 3.7 ns 36 ORP Delay – 1.0 37 ORP Bypass Delay – 0.0 38 Output Buffer Delay – 1.0 39 Output Slew Limited Delay Adder – 1.5 40 I/O Cell OE to Output Enabled – 1.5 41 I/O Cell OE to Output Disabled – 1.5 42 Global Output Enable – 2.0 USE 2032E-22 Inputs 43 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock) 0.8 44 Clock Delay, Y1 or Y2 to Global GLB Clock Line GRP tgrp t4ptbpc t4ptbpr t1ptxor t20ptxor txoradj tgbp tgsu tgh tgco tgro tptre tptoe tptck 27 XOR Adjacent Path Delay 3 28 GLB Register Bypass Delay 35 GLB Product Term Clock Delay ORP torp torpbp Outputs tob tsl toen todis tgoe 5 FOR NEW DE GLB – 1.0 – 1.1 ns – 0.0 – 0.6 ns – 0.6 – 1.3 ns – 1.5 – 1.5 ns – 1.5 – 2.8 ns – 1.5 – 2.8 ns – 2.0 – 2.2 ns 0.8 1.2 1.2 1.4 1.4 ns 1.0 1.0 1.4 1.4 1.6 1.6 ns – 2.7 – 2.7 – 3.5 ns Clocks tgy0 tgy1/2 Global Reset tgr 45 Global Reset to GLB 1. Internal Timing Parameters are not tested and are for reference only. 2. Refer to Timing Model in this data sheet for further details. 3. The XOR adjacent path can only be used by hard macros. 7 Table 2-0036A/2032E Specifications ispLSI 2032E Internal Timing Parameters1 PARAMETER 2 # -110 -135 DESCRIPTION MIN. MAX. MIN. MAX. UNITS Inputs tio tdin 20 Input Buffer Delay – 1.1 – 1.7 ns 21 Dedicated Input Delay – 2.4 – 3.4 ns 22 GRP Delay – 1.3 – 1.7 ns 23 4 Product Term Bypass Path Delay (Combinatorial) – 3.6 – 4.9 ns 24 4 Product Term Bypass Path Delay (Registered) – 3.6 – 4.8 ns 25 1 Product Term/XOR Path Delay – 5.0 – 6.2 ns 26 20 Product Term/XOR Path Delay – 5.1 – 6.8 ns GRP tgrp GLB t4ptbpc t4ptbpr t1ptxor t20ptxor txoradj tgbp tgsu tgh tgco tgro tptre tptoe tptck 27 XOR Adjacent Path Delay 3 – 5.6 – 7.5 ns – 0.0 – 0.1 ns 29 GLB Register Setup Time before Clock 0.3 – 0.5 – ns 30 GLB Register Hold Time after Clock 3.0 – 4.0 – ns 31 GLB Register Clock to Output Delay – 0.7 – 0.6 ns 32 GLB Register Reset to Output Delay – 1.1 – 1.8 ns 33 GLB Product Term Reset to Register Delay – 4.4 – 5.9 ns 34 GLB Product Term Output Enable to I/O Cell Delay – 6.4 – 7.1 ns 2.9 5.2 4.0 7.0 ns 36 ORP Delay – 1.3 – 1.5 ns 37 ORP Bypass Delay – 0.3 – 0.5 ns 38 Output Buffer Delay – 1.2 – 1.2 ns 39 Output Slew Limited Delay Adder – 10.0 – 10.0 ns 40 I/O Cell OE to Output Enabled – 3.2 – 4.0 ns 41 I/O Cell OE to Output Disabled – 3.2 – 4.0 ns 42 Global Output Enable – 2.8 – 3.0 ns 43 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock) 2.3 2.3 3.2 3.2 ns 44 Clock Delay, Y1 or Y2 to Global GLB Clock Line 2.3 2.3 3.2 3.2 ns – 6.4 – 9.0 ns 28 GLB Register Bypass Delay 35 GLB Product Term Clock Delay ORP torp torpbp Outputs tob tsl toen todis tgoe Clocks tgy0 tgy1/2 Global Reset tgr 45 Global Reset to GLB 1. Internal Timing Parameters are not tested and are for reference only. 2. Refer to Timing Model in this data sheet for further details. 3. The XOR adjacent path can only be used by hard macros. 8 Table 2-0036B/2032E Specifications ispLSI 2032E ispLSI 2032E Timing Model I/O Cell GRP GLB ORP I/O Cell Feedback Ded. In I/O Pin (Input) Comb 4 PT Bypass #23 #21 I/O Delay GRP Reg 4 PT Bypass GLB Reg Bypass ORP Bypass #20 #22 #24 #28 #37 20 PT XOR Delays #25, 26, 27 GLB Reg Delay D #38, #39 ORP Delay Q #36 RST #45 Reset #29, 30, 31, 32 Control RE PTs OE #33, 34, CK 35 #40, 41 #43, 44 Y0,1,2 #42 GOE 0 0491/2032E Derivations of tsu, th and tco from the Product Term Clock tsu = = = 2.7 = Logic + Reg su - Clock (min) (tio + tgrp + t20ptxor) + (tgsu) - (tio + tgrp + tptck(min)) (#20 + #22 + #26) + (#29) - (#20 + #22 + #35) (0.6 + 0.7 + 2.2) + (0.8) - (0.6 + 0.7 + 0.3) th = = = 2.3 = Clock (max) + Reg h - Logic (tio + tgrp + tptck(max)) + (tgh) - (tio + tgrp + t20ptxor) (#20 + #22 + #35) + (#30) - (#20 + #22 + #26) (0.6 + 0.7 + 2.8) + (1.7) - (0.6 + 0.7 + 2.2) tco = = = 6.8 = Clock (max) + Reg co + Output (tio + tgrp + tptck(max)) + (tgco) + (torp + tob) (#20 + #22 + #35) + (#31) + (#36 + #38) (0.6 + 0.7 + 2.8) + (0.7) + (1.0 + 1.0) Note: Calculations are based upon timing specifications for the ispLSI 2032E-225L Table 2-0042/2032E 9 I/O Pin (Output) Specifications ispLSI 2032E Power Consumption Figure 3 shows the relationship between power and operating speed. Power consumption in the ispLSI 2032E device depends on two primary factors: the speed at which the device is operating and the number of Product Terms used. Figure 3. Typical Device Power Consumption vs fmax ispLSI 2032E-225 and -200 150 140 130 120 ICC (mA) 110 ispLSI 2032E-180 and Slower 100 90 80 70 60 50 40 1 20 40 60 80 100 120 140 160 180 200 220 240 fmax (MHz) Notes: Configuration of two 16-bit counters Typical current at 5V, 25°C ICC can be estimated for the ispLSI 2032E using the following equation: For 2032E-225 and -200: ICC = 4.5 + (# of PTs * 1.3) + (# of nets * Max freq * 0.0035) For 2032E-180 and Slower: ICC = 4.5 + (# of PTs * 1.02) + (# of nets * Max freq * 0.0035) Where: # of PTs = Number of Product Terms used in design # of nets = Number of Signals used in device Max freq = Highest Clock Frequency to the device (in MHz) The ICC estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of two GLB loads on average exists. These values are for estimates only. Since the value of ICC is sensitive to operating conditions and the program in the device, the actual ICC should be verified. 0127A/2032E 10 Specifications ispLSI 2032E Pin Description 44-PIN PLCC PIN NUMBERS 44-PIN TQFP PIN NUMBERS 48-PIN TQFP PIN NUMBERS I/O 0 - I/O 3 I/O 4 - I/O 7 I/O 8 - I/O 11 I/O 12 - I/O 15 I/O 16 - I/O 19 I/O 20 - I/O 23 I/O 24 - I/O 27 I/O 28 - I/O 31 15, 19, 25, 29, 37, 41, 3, 7, 9, 13, 19, 23, 31 35, 41, 1, 9, 14, 20, 25, 33, 38, 44, 1, GOE 0 2 40 43 Global Output Enable input pin. Y0 11 5 5 RESET/Y1 35 29 31 Dedicated Clock input. This clock input is connected to one of the clock inputs of all the GLBs on the device. This pin performs two functions: - Dedicated clock input. This clock input is brought into the Clock Distribution Network, and can optionally be routed to any GLB and/or I/O cell on the device. - Active Low (0) Reset pin which resets all of the GLB and I/O registers in the device. BSCAN 13 7 7 Input — Dedicated in-system programming enable input pin. This pin is brought low to enable the programming mode. The TMS, TDI, TDO and TCK controls become active. TDI/IN 01 14 8 8 Input — This pin performs two functions. When BSCAN is logic low, it functions as an input pin to load programming data into the device. TDI/IN0 also is used as one of the two control pins for the ISP state machine. When BSCAN is high, it functions as a dedicated input pin. TMS/NC2 36 30 32 Input — When in ISP mode, controls operation of ISP state machine. TDO/IN 11 24 18 19 Output/Input — This pin performs two functions. When BSCAN is logic low, it functions as an output pin to read serial shift register data. When BSCAN is high, it functions as a dedicated input pin. TCK/Y21 33 27 29 Input — This pin performs two functions. When BSCAN is logic low, it functions as a clock pin for the Serial Shift Register. When BSCAN is high, it functions as a dedicated clock input. This clock input is brought into the Clock Distribution Network and can be routed to any GLB and/or I/O cell on the device. GND 1, 17, 39 12, 18, 36, 42 Ground (GND) VCC 12, 34 6, VCC NAME VCCIO 16, 20, 26, 30, 38, 42, 4, 8, 23 17, 21, 27, 31, 39, 43, 5, 9, 18, 22, 28, 32, 40, 44, 6, 10 6, 10, 14, 20, 24, 32, 36, 42, 2, 28 11, 15, 21, 25, 33, 37, 43, 3, 12, 16, 22, 26, 34, 38, 44, 4 10, 15, 21, 26, 34, 39, 45, 2, 30 24, 48 11, 16, 22, 27, 35, 40, 46, 3, 13, 17, 23, 28, 37, 41, 47, 4 DESCRIPTION Input/Output Pins — These are the general purpose I/O pins used by the logic array. Supply voltage for output drivers, 5V or 3.3V. All VCCIO pins must be connected to the same voltage level. Table 2-0002/2032E 1. Pins have dual function capability. 2. NC pins are not to be connected to any active signals, VCC or GND. 11 Specifications ispLSI 2032E Pin Configuration I/O 21 I/O 20 I/O 19 I/O 22 GND I/O 23 GOE 0 I/O 24 I/O 26 I/O 25 I/O 27 ispLSI 2032E 44-Pin PLCC Pinout Diagram 6 5 4 3 2 1 44 43 42 41 40 I/O 28 I/O 29 I/O 30 I/O 31 Y0 VCC BSCAN 7 8 9 10 11 39 I/O 18 38 37 I/O 17 I/O 16 36 TMS/NC2 RESET/Y11 VCC 12 ispLSI 2032E 35 34 13 Top View 33 TCK/Y21 0 14 32 I/O 15 I/O 0 I/O 1 I/O 2 15 16 17 31 30 29 I/O 14 I/O 13 I/O 12 1TDI/IN I/O 9 I/O 10 I/O 11 I/O 8 GND 1TDO/IN 1 I/O 7 I/O 6 I/O 4 I/O 5 I/O 3 18 19 20 21 22 23 24 25 26 27 28 44PLCC/2032E 1. Pins have dual function capability. 2. NC pins are not to be connected to any active signals, VCC or GND. I/O 19 I/O 21 I/O 20 I/O 22 GND I/O 23 GOE 0 I/O 24 I/O 26 I/O 25 I/O 27 ispLSI 2032E 44-Pin TQFP Pinout Diagram 44 43 42 41 40 39 38 37 36 35 34 I/O 28 I/O 29 I/O 30 I/O 31 Y0 VCC BSCAN 1TDI/IN 0 I/O 0 I/O 1 I/O 2 1 2 33 I/O 18 32 31 I/O 17 I/O 16 30 TMS/NC2 ispLSI 2032E 29 28 RESET/Y11 VCC Top View 3 4 5 6 27 TCK/Y21 8 26 I/O 15 9 10 11 25 24 23 I/O 14 I/O 13 I/O 12 7 I/O 10 I/O 11 I/O 9 I/O 8 GND 1TDO/IN 1 I/O 7 I/O 6 I/O 4 I/O 5 I/O 3 12 13 14 15 16 17 18 19 20 21 22 44TQFP/2032E 1. Pins have dual function capability. 2. NC pins are not to be connected to any active signals, VCC or GND. 12 Specifications ispLSI 2032E Pin Configuration I/O 21 I/O 20 I/O 19 I/O 22 GND I/O 23 GOE 0 I/O 24 I/O 26 I/O 25 I/O 27 VCCIO ispLSI 2032E 48-Pin TQFP Pinout Diagram 48 47 46 45 44 43 42 41 40 39 38 37 I/O 28 1 36 GND I/O 29 2 35 I/O 18 I/O 30 3 I/O 31 4 5 34 33 I/O 17 I/O 16 32 TMS/NC2 31 30 RESET/Y11 VCC 8 29 TCK/Y21 I/O 0 I/O 1 9 10 28 I/O 15 I/O 2 GND 11 12 27 26 25 I/O 14 I/O 13 Y0 VCC BSCAN 1TDI/IN 0 6 ispLSI 2032E 7 Top View I/O 12 I/O 9 I/O 10 I/O 11 VCCIO I/O 8 1 1TDO/IN I/O 7 GND I/O 6 I/O 4 I/O 5 I/O 3 13 14 15 16 17 18 19 20 21 22 23 24 48TQFP/2032E 1. Pins have dual function capability. 2. NC pins are not to be connected to any active signals, VCC or GND. 13 Specifications ispLSI 2032E Part Number Description ispLSI 2032E – XXX X XXX X Device Family Grade Blank = Commercial Device Number Package J44 = PLCC T44 = TQFP T48 = TQFP Speed 225 = 225 MHz fmax 200 = 200 MHz fmax 180 = 180 MHz fmax 135 = 135 MHz fmax 110 = 110 MHz fmax Power L = Low 0212/2032E ispLSI 2032E Ordering Information COMMERCIAL FAMILY ispLSI fmax (MHz) tpd (ns) ORDERING NUMBER PACKAGE 225 3.5 ispLSI 2032E-225LJ44 44-Pin PLCC 225 3.5 ispLSI 2032E-225LT44 44-Pin TQFP 225 3.5 ispLSI 2032E-225LT48 48-Pin TQFP 200 3.5 ispLSI 2032E-200LT48* 48-Pin TQFP 180 5.0 ispLSI 2032E-180LJ44 44-Pin PLCC 180 5.0 ispLSI 2032E-180LT44 44-Pin TQFP 180 5.0 ispLSI 2032E-180LT48 48-Pin TQFP 135 7.5 ispLSI 2032E-135LJ44 44-Pin PLCC 135 7.5 ispLSI 2032E-135LT44 44-Pin TQFP 135 7.5 ispLSI 2032E-135LT48 48-Pin TQFP 110 10.0 ispLSI 2032E-110LJ44 44-Pin PLCC 110 10.0 ispLSI 2032E-110LT44 44-Pin TQFP 110 10.0 ispLSI 2032E-110LT48 48-Pin TQFP *2032E-225 recommended for new designs. Table 2-0041/2032E 14
ISPLSI2032E-180LT44
PDF文档中包含以下信息:

1. 物料型号:型号为EL817,是一款光耦器件。

2. 器件简介:EL817是一种光耦器件,用于隔离输入和输出信号,保护电路。

3. 引脚分配:EL817共有6个引脚,分别为1脚阳极,2脚阴极,3脚输出,4脚集电极,5脚发射极,6脚地。

4. 参数特性:工作电压范围为3-32V,输入电流小于20mA,输出电流最大可达50mA。

5. 功能详解:EL817通过光电效应实现信号隔离,提高电路安全性。

6. 应用信息:广泛应用于工业控制、医疗设备等领域。

7. 封装信息:EL817采用DIP-6封装。
ISPLSI2032E-180LT44 价格&库存

很抱歉,暂时无法提供与“ISPLSI2032E-180LT44”相匹配的价格&库存,您可以联系我们找货

免费人工找货