LA256B-HRFSBKS.X.X-PF 数据手册
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
LED ARRAY
Pb
Lead-Free Parts
LA256B/HRFSBKS.X.X-PF
DATA SHEET
DOC. NO : REV. DATE : :
QW0905- LA256B/HRFSBKS.X.X-PF A 08 - Sep. - 2009
發行
立碁電子
DCC
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA256B/HRFSBKS.X.X-PF Page 1/6
Package Dimensions
Ø
3.35*3 7.00
Ø 3.0*3
HRFSBKS
3.2±0.5
11.6
5.1
X
14.8
X
□0.5TYP
3.5±0.5
SBKS HRF
2.54TYP
1 2 3
2.54TYP
9.85 ±0.5
123
1.ANODE BLUE 2.COMMON CATHODE 3.ANODE RED
LHRFSBKS2392-PF
3.0
5.0
□0.5
TYP 18.0MIN
SBKS HRF
2.0MIN
123
2.0MIN 2.54TYP] 1 2 3 2.54TYP
1.ANODE BLUE 2.COMMON CATHODE 3.ANODE RED
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA256B/HRFSBKS.X.X-PF Page 2/6
Absolute Maximum Ratings at Ta=25 ℃
Ratings Parameter Symbol HRF Forward Current Peak Forward Current Duty 1/10@10KHz Power Dissipation Electrostatic Discharge( * ) Reverse Current @5V Operating Temperature Storage Temperature IF IFP PD ESD Ir Topr Tstg 30 90 75 2000 10 -20 ~ +80 -30 ~ +100 SBKS 30 100 120 500 50 mA mA mW V UNIT
μA ℃ ℃
Static the anti-electrosatic *glove isElectricity or power surge will damageLED.LED. Use of a conductive wrist band or must be properly recommended when handing these All devices, equipment and machinery grounded.
Typical Electrical & Optical Characteristics (Ta=25 ℃)
PART NO
MATERIAL
COLOR
Dominant Spectral wave halfwidth length △λ nm λDnm
Forward voltage @20mA(V)
Luminous Viewing intensity angle @20mA(mcd) 2θ 1/2 (deg)
Emitted AlGaInP LA256B/HRFSBKS.X.X-PF InGaN/SiC Blue Red
Lens
Min. Typ. Max. Min. 630 20 26 1.5 ------3.5 2.4 4.2 160 160
Typ. 300 350 60 60
White Diffused
475
Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA256B/HRFSBKS.X.X-PF Page 3/6
Typical Electro-Optical Characteristics Curve
HRF CHIP
Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current
1000
3.5
Forward Current(mA)
100
Relative Intensity Normalize @20mA
2.0 2.5 3.0
3.0 2.5 2.0 1.5 1.0 0.5 0
10 1.0 0.1 1.0 1.5
1.0
10
100
1000
Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature
1.2
Forward Current(mA) Fig.4 Relative Intensity vs. Temperature
3.0
Forward Voltage@20mA Normalize @25 ℃
Relative Intensity@20mA Normalize@25 ℃
-40 -20 -0 20 40 60 80 100
2.5 2.0 1.5 1.0 0.5 0 -40 -20 -0 20 40 60 80 100
1.1
1.0
0.9 0.8
Ambient Temperature( ℃)
Ambient Temperature( ℃)
Fig.5 Relative Intensity vs. Wavelength
Relative Intensity@20mA
1.0
0.5
0 550 600 650 700
Wavelength (nm)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA256B/HRFSBKS.X.X-PF Page 4/6
Typical Electro-Optical Characteristics Curve
SBK-S CHIP
Fig.1 Forward current vs. Forward Voltage
30 25 20 15 10 5 0 1 2 3 4 5
Fig.2 Relative Intensity vs. Forward Current
Forward Current(mA)
1.5
Relative Intensity Normalize @20mA
1.25 1.0 0.75 0.5 0.25 0 0 5 10 15 20 25 30
Forward Voltage(V)
Forward Current(mA)
Fig.3 Forward Current vs. Temperature
Fig.4 Relative Intensity vs. Wavelength
30 20 10 0 0 25 50 75 100
Relative Intensity@20mA
Forward Current@20mA
40
1.0
0.5
0 380
430
480 480
530
580
630
680
Ambient Temperature( ℃)
Wavelength (nm)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA256B/HRFSBKS.X.X-PF Page 5/6
Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350° C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body)
2.Wave Soldering Profile Dip Soldering Preheat: 120° C Max Preheat time: 60seconds Max Ramp-up 2° C/sec(max) Ramp-Down:-5 ° C/sec(max) Solder Bath:260° C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body)
Temp( ° C) 260° C3sec Max
260°
5° /sec max
120°
2° /sec max
25° 0°
0
Preheat 60 Seconds Max
50
100
150
Time(sec)
Note: 1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO.LA256B/HRFSBKS.X.X-PF Page 6/6
Reliability Test:
Test Item
Test Condition
1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs)
Description
This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed.
Reference Standard
MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1
Operating Life Test
High Temperature Storage Test
1.Ta=105℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of high temperature for hours.
MIL-STD-883:1008 JIS C 7021: B-10
Low Temperature Storage Test
1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.
JIS C 7021: B-12
High Temperature High Humidity Test
1.Ta=65℃±5℃ 2.RH=90%~95% 3.t=240hrs±2hrs
The purpose of this test is the resistance of the device under tropical for hours.
MIL-STD-202:103B JIS C 7021: B-11
Thermal Shock Test
1.Ta=105℃±5℃&-40℃±5℃ (10min) (10min) 2.total 10 cycles
The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire.
MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011
Solder Resistance Test
1.T.Sol=260℃±5℃ 2.Dwell time= 10 ±1sec.
MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1
Solderability Test
1.T.Sol=230℃±5℃ 2.Dwell time=5 ±1sec
This test intended to see soldering well performed or not.
MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2
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