LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
LED ARRAY
LG2040-W59R14
DATA SHEET
DOC. NO : REV. DATE
QW0905-LG2040-W59R14
:B : 04 - Jul. - 2007
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LG2040-W59R14 Page 1/4
Package Dimensions
3.0 4.0
4.2
5.2
IF
+Vcc Vcc=12Volts
□0.5
17.0±2.0 TYP
RL
RL=1200ohms ±20%
25.0 ±0.5 47.0 ±2.0
Pyrocondensation Cannula VF IF= Vcc-VF RL
5.0
+
-
LG2040-PF
3.0 4.0
4.2
5.2
1.5MAX
25.0MIN
□0.5
TYP 1.0MIN 2.54TYP
+
-
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LG2040-W59R14 Page 2/4
Absolute Maximum Ratings at Ta=25℃
Ratings Parameter Symbol G Forward voltage Reverse voltage Operating Temperature Storage Temperature VF Vr Topr Tstg 12 15 -40 ~ +85 -40 ~ +100 V V UNIT
℃ ℃
Typical Electrical & Optical Characteristics (Ta=25℃)
PART NO
MATERIAL Emitted
COLOR
Peak Spectral Forward Luminous Reverse Viewing wave halfwidth current intensity current angle (mA) (mcd) (uA) 2θ 1/2 length △λnm @ 12V @12V VR=15V (deg) λPnm
Lens
Green Diffused
Min. Max. Min. Typ. 565 30 6.0 12 8.0 20
Max. 100 36
LG2040-W59R14 GaP
Green
Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LG2040-W59R14 Page 3/4
Typical Electro-Optical Characteristics Curve
G CHIP
Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current
3.5
1000
Forward Current(mA)
100 10 1.0
Relative Intensity Normalize @20mA
3.0 2.5 2.0 1.5 1.0 0.5 0.0
0.1 1.0 2.0 3.0 4.0 5.0
1.0
10
100
1000
Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature
Forward Current(mA) Fig.4 Relative Intensity vs. Temperature
3.0
Forward Voltage@20mA Normalize @25 ℃
Relative Intensity@20mA Normalize @25 ℃
-40 -20 0 20 40 60 80 100
1.2 1.1 1.0 0.9 0.8
2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 100
Ambient Temperature( ℃)
Ambient Temperature( ℃)
Fig.5 Relative Intensity vs. Wavelength
Relative Intensity@20mA
1.0
0.5
0.0 500 550 600 650
Wavelength (nm)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LG2040-W59R14 Page 4/4
Reliability Test:
Test Item
Test Condition
1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs)
Description
This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed.
Reference Standard
MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1
Operating Life Test
High Temperature Storage Test
1.Ta=105℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of high temperature for hours.
MIL-STD-883:1008 JIS C 7021: B-10
Low Temperature Storage Test
1.Ta=-40℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.
JIS C 7021: B-12
High Temperature High Humidity Test
1.Ta=65℃±5℃ 2.RH=90%~95% 3.t=240hrs±2hrs
The purpose of this test is the resistance of the device under tropical for hours.
MIL-STD-202:103B JIS C 7021: B-11
Thermal Shock Test
1.Ta=105℃±5℃&-40℃±5℃ (10min) (10min) 2.total 10 cycles
The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire.
MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011
Solder Resistance Test
1.T.Sol=260℃±5℃ 2.Dwell time= 10±1sec.
MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2
Solderability Test
1.T.Sol=230℃±5℃ 2.Dwell time=5±1sec
This test intended to see soldering well performed or not.
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