LT1007CDWF

DICE/DWF SPECIFICATION LT1007 Low Noise, High Speed Precision Op Amp 6 7 4 PAD FUNCTION 1. 2. 3. 4. 5. 6. 7. 8. VOS TRIM –IN +IN V– NO CONNECT OUT V+ VOS TRIM DIE CROSS REFERENCE LTC Finished Part Number LT1007C LT1007C Order Part Number LT1007CDICE LT1007CDWF* 3 Please refer to LTC standard product data sheet for other applicable product information. *DWF = DICE in wafer form. 8 2 Backside (substrate) is an alloyed gold layer. Connect to V– 1 99mils × 83mils, 12mils thick L, LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners. DICE/DWF ELECTRICAL TEST LIMITS SYMBOL VOS IOS IB CMRR PSRR AVOL VOUT SR IS PARAMETER Input Offset Voltage Input Offset Current Input Bias Current Input Voltage Range Common Mode Rejection Ratio Power Supply Rejection Ratio Large-Signal Voltage Gain Maximum Output Voltage Swing Slew Rate Supply Current VCM = ±11 CONDITIONS (Note 1) VS = ±15V, VCM = 0V, TA = 25°C. MIN MAX 60 50 ±55 ±11.0 110 106 5 3.5 ±12.5 ±10.5 1.7 4.7 UNITS μV nA nA V dB dB V/μV V/μV V V V/μs mA VS = ±4V to ±18V RL ≥ 2k, VO = ±12V RL ≥ 1k, VO = ±10V RL ≥ 2k RL ≥ 600Ω RL ≥ 2k Note 1: Input offset voltage measurements are performed by automatic equipment, approximately 0.5 seconds after application of power. 1007dice/dwffa Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 1 DICE/DWF SPECIFICATION LT1007 Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. 1007dice/dwffa 2 Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● I.D.No. 66-13-1007 • LT 1009 REV A • PRINTED IN USA www.linear.com © LINEAR TECHNOLOGY CORPORATION 2009