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LT1122BMJ8

LT1122BMJ8

  • 厂商:

    LINER

  • 封装:

  • 描述:

    LT1122BMJ8 - Fast Settling, JFET Input Operational Amplifier - Linear Technology

  • 数据手册
  • 价格&库存
LT1122BMJ8 数据手册
LT1122 Fast Settling, JFET Input Operational Amplifier FEATURES s DESCRIPTIO 340ns Typ 540ns Max 60V/µs Min 14MHz 1.2 MHz 60° 600µV Max 75pA Max 600pA Max 40pA Max 150pA Max s s s s s s s s 100% Tested Settling Time to 1mV at Sum Node, 10V Step Tested with Fixed Feedback Capacitor Slew Rate Gain Bandwidth Product Power Bandwidth (20Vp-p) Unity Gain Stable; Phase Margin Input Offset Voltage Input Bias Current 25°C 70°C Input Offset Current 25°C 70°C Low Distortion The LT1122 JFET input operational amplifier combines high speed and precision performance. A unique poly-gate JFET process minimizes gate series resistance and gate-to-drain capacitance, facilitating wide bandwidth performance, without degrading JFET transistor matching. It slews at 80V/µs and settles in 340ns. The LT1122 is internally compensated to be unity gain stable, yet it has a bandwidth of 14MHz at a supply current of only 7mA. Its speed makes the LT1122 an ideal choice for fast settling 12-bit data conversion and acquisition systems. The LT1122 offset voltage of 120µV, and voltage gain of 500,000 also support the 12-bit accurate applications. The input bias current of 10pA and offset current of 4pA combined with its speed allow the LT1122 to be used in such applications as high speed sample and hold amplifiers, peak detectors, and integrators. APPLICATI s s s s s s s s S Fast 12-Bit D/A Output Amplifiers High Speed Buffers Fast Sample and Hold Amplifiers High Speed Integrators Voltage to Frequency Converters Active Filters Log Amplifiers Peak Detectors TYPICAL APPLICATI 12-Bit Voltage Output D/A Converter Large-Signal Response + Cf 2 0mA TO 2mA OR 4mA 3 + – LT1122 6 VOUT 0V TO 10V 5V/DIV 12-BIT CURRENT OUTPUT D/A CONVERTER C f = 5pF TO 17pF (DEPENDING ON D/A CONVERTER USED) LT1122•TA01 200ns/DIV AV = –1 1122 TA07 U UO UO 1 LT1122 ABSOLUTE AXI U RATI GS Operating Temperature Range LT1122AM/BM/CM/DM .................... – 55°C to 125°C LT1122AC/BC/CC/DC/CS/DS .............. – 40°C to 85°C Storage Temperature Range All Devices ....................................... – 65°C to 150°C Supply Voltage .................................................... ± 20V Differential Input Voltage ...................................... ± 40V Input Voltage ........................................................ ± 20V Output Short Circuit Duration .......................... Indefinite Lead Temperature (Soldering, 10 sec.)................. 300°C PACKAGE/ORDER I FOR ATIO TOP VIEW VOS TRIM –IN +IN V– 1 2 3 4 LT1122 8 7 6 5 SPEED BOOST/ OVERCOMP V+ OUT VOS TRIM N8 PACKAGE J8 PACKAGE 8-LEAD PLASTIC DIP 8-LEAD HERMETIC DIP TJMAX = 150°C, θJA = 130°C/W (N8) TJMAX = 175°C, θJA = 100°C/W (J8) ORDER PART NUMBER LT1122AMJ8 LT1122CCJ8 LT1122BMJ8 LT1122DCJ8 LT1122CMJ8 LT1122ACN8 LT1122DMJ8 LT1122BCN8 LT1122ACJ8 LT1122CCN8 LT1122BCJ8 LT1122DCN8 Consult factory for Industrial grade parts. ELECTRICAL CHARACTERISTICS SYMBOL VOS IOS IB VS = ± 15V, TA = 25°C, VCM = 0V unless otherwise noted. (Note 1) LT1122AM/BM LT1122AC/BC MIN TYP MAX 120 4 10 1012 1012 1011 4 60 80 50 600 40 75 PARAMETER Input Offset Voltage Input Offset Current Input Bias Current Input Resistance Differential Common Mode Input Capacitance CONDITIONS VCM = – 10V to + 8V VCM = + 8V to + 11V AV = – 1 + 10V to 0V, – 10V to 0V 100% Tested: A and C Grades to 1mV at Sum Node B and D Grades to 1mV at Sum Node All Grades to 0.5mV at Sum Node VOUT = 20Vp-p VOUT = ± 10V, RL = 2kΩ VOUT = ± 10V, RL = 600Ω VCM = ± 10V (Note 3) VS = ± 10V to ± 18V 0.1Hz to 10Hz fO = 100Hz fO = 10kHz fO = 100Hz, fO = 10kHz 180 130 83 86 SR Slew Rate Settling Time (Note 2) GBW AVOL CMRR PSRR Gain Bandwidth Product Power Bandwidth Large Signal Voltage Gain Common Mode Rejection Ratio Input Voltage Range Power Supply Rejection Ratio Input Noise Voltage Input Noise Voltage Density Input Noise Current Density 2 U U W WW U W TOP VIEW VOS TRIM –IN +IN V– 1 2 3 4 S8 PACKAGE 8-LEAD PLASTIC SOIC LT1122 8 7 6 5 SPEED BOOST/ OVERCOMP V+ OUT VOS TRIM ORDER PART NUMBER LT1122CS8 LT1122DS8 PART MARKING 1122C 1122D TJMAX = 150°C, θJA = 190°C/W LT1122CM/DM LT1122CC/DC LT1122CS/DS MIN TYP MAX 130 5 12 1012 1012 1011 4 75 900 50 100 UNITS µV pA pA Ω Ω Ω pF V/µs 340 350 450 14 1.2 500 250 99 103 3.0 25 14 2 540 350 360 470 13 1.1 150 110 80 ± 10.5 82 450 220 98 ± 11 101 3.3 27 15 2 590 ns ns ns MHz MHz V/mV V/mV dB V dB µVP-P nV/√Hz nV/√Hz fA/√Hz ± 10.5 ± 11 LT1122 ELECTRICAL CHARACTERISTICS SYMBOL VOUT IS VS = ± 15V, TA = 25°C, VCM = 0V unless otherwise noted. LT1122AM/BM LT1122AC/BC MIN TYP MAX ± 12 ± 12.5 ± 11.5 ± 12 7.5 10 ±5 ± 10 ±4 ± 10 ±5 ±4 PARAMETER Output Voltage Swing Supply Current Minimum Supply voltage Offset Adjustment Range CONDITIONS RL = 2kΩ RL = 600Ω (Note 4) RPOT ≥ 10k, Wiper to V+ LT1122CM/DM LT1122CC/DC LT1122CS/DS MIN TYP MAX ± 12 ± 11.5 ± 12.5 ± 12 7.8 11 UNITS V V mA V mV VS = ± 15V, VCM = 0V, 0°C ≤ TA ≤ 70°C, unless otherwise noted. (Note 1) SYMBOL VOS PARAMETER Input Offset Voltage Average Temperature Coefficient of Input Offset Voltage CONDITIONS LT1122AC/BC MIN TYP MAX LT1122CC/DC LT1122CS/DS MIN TYP MAX 400 6 15 90 100 78 80 ± 10 ± 11.5 40 340 96 99 ± 10.8 ± 12.4 65 2000 25 200 800 UNITS µV µV/°C pA pA V/mV dB dB V V V/µs • VOUT = ± 10V, RL ≥ 2kΩ VCM = ± 10V VS = ± 10V to ± 17V RL = 2kΩ AV = – 1 • 350 5 12 80 120 82 84 ± 10 50 380 98 101 ± 10.8 70 1400 18 150 600 IOS IB AVOL CMRR PSRR VOUT SR Input Offset Current Input Bias Current Large Signal Voltage Gain Common Mode Rejection Ratio Power Supply Rejection Ratio Input Voltage Range Output Voltage Swing Slew Rate • • • • • • • • ± 11.5 ± 12.4 VS = ± 15V, VCM = 0V, – 55°C ≤ TA ≤ 125°C, unless otherwise noted. (Note 1) SYMBOL VOS PARAMETER Input Offset Voltage Average Temperature Coefficient of Input Offset Voltage CONDITIONS • • • • • • • • • • LT1122AM/BM MIN TYP MAX 650 6 0.5 6 70 80 83 ± 10 45 230 97 100 ± 10.5 60 2400 18 6 25 LT1122CM/DM MIN TYP MAX 800 7 0.6 7 60 76 78 ± 10 35 200 94 98 ± 10.5 55 3400 25 9 35 UNITS µV µV/°C nA nA V/mV dB dB V V V/µs IOS IB AVOL CMRR PSRR VOUT SR Input Offset Current Input Bias Current Large Signal Voltage Gain Common Mode Rejection Ratio Power Supply Rejection Ratio Input Voltage Range Output Voltage Swing Slew Rate RL = 2kΩ AV = – 1 VOUT = ± 10V, RL ≥ 2kΩ VCM = ± 10V VS = ± 10V to ± 17V ± 11.3 ± 12.1 ± 11.3 ± 12.1 The • denotes the specifications which apply over the full operating temperature range. Note 1: The LT1122 is measured in an automated tester in less than one second after application of power. Depending on the package used, power dissipation, heat sinking, and air flow conditions, the fully warmed up chip temperature can be 10°C to 50°C higher than the ambient temperature. Note 2: Settling time is 100% tested for A and C grades using the settling time test circuit shown. This test is not included in quality assurance sample testing. Note 3: Input voltage range functionality is assured by testing offset voltage at the input voltage range limits to a maximum of 4mV (A, B grades), to 5.7mV (C, D grades). Note 4: Minimum supply voltage is tested by measuring offset voltage to 7mV maximum at ± 5V supplies. Note 5: The LT1122 is not tested and not quality-assurance-sampled at – 40°C and at 85°C. These specifications are guaranteed by design, correlation and/or inference from – 55°C, 0°C, 25°C, 70°C and/or 125°C tests. 3 LT1122 VS = ± 15V, VCM = 0V, – 40°C ≤ TA ≤ 85°C, unless otherwise noted. (Note 5) SYMBOL VOS ELECTRICAL CHARACTERISTICS PARAMETER Input Offset Voltage Average Temperature Coefficient of Input Offset Voltage CONDITIONS • • • • • • • • • • LT1122AC/BC MIN TYP MAX 450 6 30 230 95 80 83 ± 10 45 340 98 100 ± 10.6 65 1900 20 600 2000 LT1122CC/DC LT1122CS/DS MIN TYP MAX 500 7 40 260 80 76 78 ± 10 ± 11.3 35 300 96 98 ± 10.6 ± 12.2 60 2700 28 900 2700 UNITS µV µV/°C pA pA V/mV dB dB V V V/µs IOS IB AVOL CMRR PSRR VOUT SR Input Offset Current Input Bias Current Large Signal Voltage Gain Common Mode Rejection Ratio Power Supply Rejection Ratio Input Voltage Range Output Voltage Swing Slew Rate RL = 2kΩ AV = – 1 VOUT = ± 10V, RL ≥ 2kΩ VCM = ± 10V VS = ± 10V to ± 17V ± 11.3 ± 12.2 Settling Time Test Fixture DEVICE UNDER TEST 5pF +10V (REGULATED) 51 +15V 7 1 4 HA5002 2 5 –15V 8 51 2k 1% 2 2k 1% +15V 7 – LT1122 3 + 4 –15V 6 4 74LS00 GROUND ALL OTHER INPUTS 5 6 1 16 2 15 V IN (MEASURE INPUT PULSE HERE) 5.1k* 1% 3 14 5.1k 1% TTL IN 1 2 4 3 5 LTC201A 13 12 6 11 7 10 8 9 +15V 7 + 3 51 1 8 2 – 2 –15V 79 1N5712 5 HA5002 4 51 SUMMING NODE OUTPUT –10V (REGULATED) +15V 0.1µF NO CONNECTION ON PINS 10, 11, 12, 14, AND 15 1k 6 +15V 7 LT1223 4 1.5k –15V + 1µF TANT SETTLING TIME OUTPUT (20 TIMES SUM NODE OUTPUT) 1N5712 TYPICAL SUPPLY BYPASSING FOR EACH AMP/BUFFER –15V 0.1µF 1µF TANT + *THIS RESISTOR CAN BE ADJUSTED TO NULL OUT ALL OFFSETS AT THE SETTLING TIME OUTPUT. THE AUTOMATED TESTER USES A SEPARATE AUTOZERO CIRCUIT. LT1122•TA02 4 LT1122 TYPICAL PERFOR A CE CHARACTERISTICS Settling Time (Input From –10V to 0V) 1mV/DIV AT SUM NODE 100ns/DIV 1122 G01 1mV/DIV AT SUM NODE 100ns/DIV 1122 G02 1mV/DIV AT SUM NODE Settling Time (Input From 0V to –10V) PEAK TO PEAK OUTPUT SWING (V) 1mV/DIV AT SUM NODE 5V/DIV 100ns/DIV 1122 G04 Voltage Gain vs Frequency 120 100 80 VS = ±15V TA = 25°C 20 100 120 PHASE SHIFT (DEGREES) COMMON-MODE REJECTION RATIO (dB) GAIN (dB) GAIN (dB) 60 40 20 0 –20 –40 1 10 100 1k 10k 100k 1M 10M 100M FREQUENCY (Hz) LT1122•TPC02 UW Settling Time (Input From +10V to 0V) Settling Time (Input From 0V to +10V) 100ns/DIV 1122 G03 Large Signal Response 30 25 20 15 10 5 Undistorted Output Swing vs Frequency VS = ±15V TA = 25°C 200ns/DIV AV = +1 1122 G05 0 100k 1M 10M 100M FREQUENCY (Hz) LT1122•TPC01 Gain, Phase vs Frequency 80 120 100 80 60 40 20 Common Mode Rejection vs Frequency VS = ±15V TA = 25°C 10 140 160 0 VS = ±15V TA = 25°C C L = 15pF 180 200 –10 1M 10M FREQUENCY (Hz) LT1122•TPC03 100M 0 100 1k 10k 100k 1M 10M 100M FREQUENCY (Hz) LT1122•TPC04 5 LT1122 TYPICAL PERFOR A CE CHARACTERISTICS Distribution of Input Offset Voltage 800 3370 UNITS TESTED IN ALL PACKAGES 600 VS = ±15V TA = 25°C (NOT WARMED UP) INPUT BIAS AND OFFSET CURRENTS (pA) 30K 10K 3K 1K 300 100 30 10 3 1 0 25 50 VS = ±15V VCM = 0V BIAS CURRENT INPUT BIAS AND OFFSET CURRENT (pA) NUMBER OF UNITS 400 200 0 –900 –500 –100 100 INPUT OFFSET VOLTAGE (µV) LT1122•TPC05 Warm-up Drift 250 N PACKAGE 150 J PACKAGE 100 100 50 IN STILL AIR (SO PACKAGE SOLDERED ONTO BOARD) 1 0 1 2 3 TIME AFTER POWER ON (MINUTES) LT1122•TPC08 10 1 3 10 30 100 300 1k 3k 10k 0 2 4 6 8 10 NOISE VOLTAGE (1µ V/DIV) 200 VOLTAGE NOISE DENSITY (nV/√Hz) CHANGE IN OFFSET VOLTAGE (µV) VS = ±15V TA = 25°C SO PACKAGE Total Harmonic Distortion + Noise vs Frequency Inverting Gain TOTAL HARMONIC DISTORTION + NOISE (%) TOTAL HARMONIC DISTORTION + NOISE (%) T A = 25°C VS = ±15V Z L = 5k//15pF VO = 7V RMS 0.01 A V = –50 INTERMODULATION DISTORTION (IMD) (%) 0.1 0.001 A V = –10 A V = –1 0.0001 20 100 1k FREQUENCY (Hz) 6 UW 500 LT1122•TPC11 Input Bias and Offset Currents Over Temperature 100K Bias and Offset Currents Over The Common-Mode Range 120 100 80 60 40 20 0 –15 BIAS CURRENT VS = ±15V TA = 25°C (NOT-WARMED UP) OFFSET CURRENT OFFSET CURRENT 900 75 100 125 –10 –5 0 5 10 15 CHIP TEMPERATURE (°C) LT1122•TPC06 COMMON-MODE INPUT VOLTAGE (V) LT1122•TPC07 Noise Spectrum 1000 VS = ±15V TA = 25°C 0.1Hz to 10Hz Noise FREQUENCY (Hz) LT1122•TPC09 TIME (SECONDS) LT1122•TPC10 Total Harmonic Distortion + Noise vs Frequency Non-Inverting Gain 0.1 0.1 Intermodulation Distortion (CCIF Method) vs Frequency LT1122 and LF156* LF156 0.01 VS = ±15V T A = 25°C AV = –10 VO = 7V RMS Z L = 5k//15pF LT1122 0.0001 3k 0.01 A V = +50 AV = +10 0.001 A V = +1 T A = 25°C VS = ±15V Z L = 5k//15pF VO = 7V RMS 1k FREQUENCY (Hz) LT1122•TPC12 0.001 10k 20k 0.0001 20 100 10k 20k 10k FREQUENCY (Hz) 20k *SEE LT1115 DATA SHEET FOR DEFINITION OF CCIF TESTING LT1122•TPC13 LT1122 APPLICATI S I FOR ATIO Settling Time Measurements Settling time test circuits shown on some competitive devices’ data sheets require: 1. A “flat top” pulse generator. Unfortunately, flat top pulse generators are not commercially available. 2. A variable feedback capacitor around the device under test. This capacitor varies over a four to one range. Presumably, as each op amp is measured for settling time, the capacitor is fine tuned to optimize settling time for that particular device. 3. A small inductor load to optimize settling. The LT1122’s settling time is 100% tested in the test circuit shown. No “flat top” pulse generator is required. The test circuit can be readily constructed, using commercially available ICs. Of course, standard high frequency board construction techniques should be followed. All LT1122s are measured with a constant feedback capacitor. No fine tuning is required. Speed Boost/Overcompensation Terminal Pin 8 of the LT1122 can be used to change the input stage operating current of the device. Shorting pin 8 to the positive supply (Pin 7) increases slew rate and bandwidth by about 25%, but at the expense of a reduction in phase margin by approximately 18 degrees. Unity gain capacitive load handling decreases from typically 500pF to 100pF. Conversely, connecting a 15k resistor from pin 8 to ground pulls 1mA out of pin 8 (with V+ = 15V). This reduces slew rate and bandwidth by 25%. Phase margin and capacitive load handling improve; the latter typically increasing to 800pF. High Speed Operation As with most high speed amplifiers, care should be taken with supply decoupling, lead dress and component placement. Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of circuits as described herein will not infringe on existing patent rights. U The power supply connections to the LT1122 must maintain a low impedance to ground over a bandwidth of 20MHz. This is especially important when driving a significant resistive or capacitive load, since all current delivered to the load comes from the power supplies. Multiple high quality bypass capacitors are recommended for each power supply line in any critical application. A 0.1µF ceramic and a 1µF electrolytic capacitor, as shown, placed as close as possible to the amplifier (with short lead lengths to power supply common) will assure adequate high frequency bypassing, in most applications. V+ W U UO + 2 7 – LT1122 3 + 4 6 1µF 0.1µF V– + 1µF 0.1µF LT1122•TA03 When the feedback around the op amp is resistive (RF), a pole will be created with RF, the source resistance and capacitance (RS, CS), and the amplifier input capacitance (CIN ≈ 4pF). In low closed loop gain configurations and with RS and RF in the kilohm range, this pole can create excess phase shift and even oscillation. A small capacitor (CF) in parallel with RF eliminates this problem. With RS (CS + CIN) = RFCF, the effect of the feedback pole is completely removed. CF RF – CIN RS CS + LT1122•TA04 OUTPUT 7 LT1122 TYPICAL APPLICATIONS Quartz Stabilized Oscillator With 9ppm Distortion OUTPUT –15V 4.7k 4kHz J CUT 47k + 430pF 50k 560k DISTORTION TRIM – LT1122 + –15V 1/4 LTC201 Q1 2N3904 100k +15V 1M 560k 20k 1% VIN – LT1122 + + OUTPUT DC = RMS VALUE OF INPUT BANDWIDTH WITH 10Vp-p INPUT = 2MHz PACKAGE DESCRIPTION Please see the 1994 Linear Databook Volume III for package descriptions. 8 U U LT1004 2.5V OUTPUT AMPLITUDE 10 µ F TRIM +15V 4.7k LT1122 LT1010 4.7k 5k + – LT1006 MOUNT IN CLOSE PROXIMITY + – 470 Ω 2k +15V GROUND CRYSTAL CASE = VACTEC VTL5C10 OR CLAIREX CLM410 = 1N4148 LT1122•TA05 Wide-Band, Filtered, Full Wave Rectifier 200k 1% 200k 1% 20k 1% 100k 1% 1k – LT1122 EOUT DC 1µ F 50k LT1122•TA06
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