L7C109

P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM FEATURES 128K x 8 Static RAM with Chip Select Powerdown, Output Enable and Single or Dual Chip Selects High Speed — to 15 ns maximum Operational Power, -L Version Active: 140 mA at 15 ns Standby: 1 mA max Data Retention at 2 V for Battery Backup Operation Screened to MIL-STD-883, Class B or to SMD 5962-89598 Package Styles Available: 32-pin Ceramic 400mil DIP D12 32-pin Ceramic LCC K11 32-pin Ceramic SO 1 32-pin uad Ceramic LCC KA1 Pin Configuration 32-pin Ceramic DIP 32-pin Ceramic SOJ NC A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 DQ1 DQ2 DQ3 VSS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 VCC A15 CE2 WE A13 A8 A9 A11 OE A10 CE DQ8 DQ7 DQ6 DQ5 DQ4 32-pin Quad CLCC A2 A1 A0 NC VCC A16 NC 32-pin Ceramic LCC NC A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 DQ1 DQ2 DQ3 VSS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 VCC A15 CE2 WE A13 A8 A9 A11 OE A10 CE DQ8 DQ7 DQ6 DQ5 DQ4 4 3 2 1 32 31 30 29 28 27 26 25 24 23 22 21 A7 A6 A5 A4 A3 A2 A1 A0 DQ1 5 6 7 8 9 10 11 12 13 Top View WE A13 A8 A9 A11 OE A10 CE1 DQ8 14 15 16 17 18 19 20 OVERVIEW The L7C108 and L7C109 are high-performance, low-power CMOS static RAMs. The storage circuitry is organized as 131,072 words by 8 bits per word. The 8 Data In and Data Out signals share I/O pins. The L7C108 has a single activelow Chip Enable. The L7C109 has two Chip Enables one active-low . These devices are available in three speeds with maximum access times from 15 ns to 45 ns. Inputs and outputs are TTL compatible. Operation is from a single +5 V power supply. Power consumption is 140 mA -L Version at 15 ns. Data may be retained in inactive storage with a supply voltage as low as 2 V. The L7C108 and L7C109 provide asynchronous unclocked operation with matching access and cycle times. The Chip Enables and a three-state I/O bus with a separate Output Enable control simplify the connection of several chips for increased storage capacity. Memory locations are specified on address pins A0 through A16. For the L7C108, reading from a designated location is accomplished by presenting an address and driving CE1 and OE LOW while WE remains HIGH. For the L7C109, CE1 and OE must be LOW while CE2 and WE are HIGH.The data in the addressed memory location will then appear on the Data Out pins within one access time. The output pins stay in a high-impedance state when CE1 or OE is HIGH, or CE2 L7C109 or WE is LOW. Writing to an addressed location is accomplished when the active-low CE1 and WE inputs are both LOW, and CE2 L7C109 is HIGH. Any of these signals may be used to terminate the write operation. Data In and Data Out signals have the same polarity. Latchup and static discharge protection are provided on-chip. The L7C108 and L7C109 can withstand an injection current of up to 200 mA on any pin without damage. DQ2 DQ3 VSS DQ4 DQ5 DQ6 DQ7 LOGIC Devices Incorporated www.logicdevices.com 1 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM L7C108-109 Block Diagram ROW SELECT ROW ADDRESS 9 128 K x 8 MEMORY ARRAY CE1 WE OE CE2 (L7C109 only) CONTROL COLUMN SELECT & COLUMN SENSE 8 I/O7 - 0 8 COLUMN ADDRESS TRUTH TABLE Mode Standby Standby Standby Standby Read Read Write * Note: for L7C109 only OE X X X X L H X CE1 VIH X VCC - 0.2 V X L L L CE2* X VIL X GND + 0.2 V H H H WE X X X X H H L DQ High - Z High - Z High - Z High - Z POWER Standby ICC2 Standby ICC2 Standby ICC3 Standby ICC3 Active High - Z D Active Active LOGIC Devices Incorporated www.logicdevices.com 2 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM MAXIMUM RATINGS Above which useful life may be impaired (Notes 1, 2) Storage temperature…………………………………………...….……............……-65°C to +150°C Operating ambient temperature………………………………………......….......…-55°C to +125°C Vcc supply voltage with respect to ground…………….…………………….......….-0.5 V to +7.0 V Input signal with respect to ground.………………………….………………..…..…-3.0 V to +7.0 V Signal applied to high impedance output……………………………………........…-3.0 V to +7.0 V Output current into low outputs………………………………………….…......................……25 mA Latchup current….........................……………..…………………………...……................ >200 mA OPERATING CONDITIONS To meet specified electrical and switching characteristics Mode Active, Operation, Military Data Retention, Military Temperature Range (Ambient) -55°C to +125°C -55°C to +125°C Supply Voltage 4.5 V 2.0 V VCC VCC 5.5 V 5.5 V ELECTRICAL CHARACTERISTICS Over Operating Conditions (Note 5) L7C108/109 Symbol Parameter VOH VOL VIH Output High Voltage Output Low Voltage Input High Voltage L7C108/109-L Min 2.4 Test Condition VCC = 4.5V, IOH = -4 mA IOL = 8 mA Min 2.4 Max 0.4 Max Unit V V V 0.4 2.2 Vcc +0.3 -3.0 -10 -10 0.8 +10 +10 25 5 0.75 8 8 2.2 Vcc +0.5 VIL IIx IOZ ICC2 ICC3 ICC4 CIN COUT Input Low Voltage Input Leakage Current Output Leakage Current VCC Current, TTL Standby VCC Current, CMOS Standby VCC Current, Data Retention Input Capacitance Output Capacitance Note 3 GND < VIN < VCC Note 4 Note 7 Note 8 VCC = 2 V Notes 9, 10 Ambient Temp = 25°C, VCC = 5 V Test Fre uency = 1 MHz Note 10 -0.5 -10 -10 0.8 +10 +10 25 10 8 8 V μA μA mA mA mA pF pF L7C108/109 Symbol Parameter ICC1 VCC Current, Active L7C108/109-L 45 15 20 25 35 45 Unit mA Test Condition Note 6 15 140 20 25 35 140 140 135 125 140 140 140 130 125 LOGIC Devices Incorporated www.logicdevices.com 3 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM SWITCHING CHARACTERISTICS Over Operating Range READ CYCLE Notes 5, 11, 12, 22, 23, 24 (ns) L7C108/109 15/15-L 20/20-L 25/25-L Symbol Parameter tAVAV tAV tAV tEL tEL tEH tGL tGL tGH tPU V X V X Z V X Z 35/35-L 45/45-L 35 45 35 3 3 35 3 3 15 15 0 0 15 0 0 20 20 20 45 45 Min Max Min Max Min Max Min Max Min Max 15 15 3 15 3 7 8 0 6 0 0 0 6 0 3 8 10 0 10 3 20 3 10 10 20 20 3 25 25 25 Read Cycle Time Address Valid to Output Valid Notes 13, 14 Address Change to Output Change Chip Enable Low to Output Valid Notes 13, 15 Chip Enable Low to Output Low Z Notes 20, 21 Chip Enable High to Output High Z Notes 20, 21 Output Enable Low to Output Valid Output Enable Low to Output Low Z Notes 20, 21 Output Enable High to Output High Z Notes 20, 21 Input Transition to Power Up Notes 10, 19 READ CYCLE - ADDRESS CONTROLLED Notes 13, 14 tAVAV ADDRESS tAVQV DATA OUT PREVIOUS DATA VALID DATA VALID tAVQX tPU ICC tPD READ CYCLE - CE/OE CONTROLLED NOTES 13, 15 CE tAVAV tELQV tELQX tEHQZ OE tGLQX DATA OUT HIGH IMPEDANCE tGLQV DATA VALID tGHQZ HIGH IMPEDANCE tPU Icc 50% tPD 50% LOGIC Devices Incorporated www.logicdevices.com 4 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM SWITCHING CHARACTERISTICS Over Operating Range READ CYCLE Notes 5, 11, 12, 22, 23, 24 (ns) L7C108/109 15/15-L 20/20-L 25/25-L 35/35-L 45/45-L Symbol tPD tCDR Parameter Operation Recovery Time Notes 10, 19 Chip Enable High to Data Retention Note 10 0 Min Max Min Max Min Max Min Max Min Max 15 0 20 0 25 0 35 0 45 DATA RETENTION Notes 9, 10 DATA RETENTION MODE VCC tCDR CE 4.5 V 4.5 V ≥2V tPD VIH VIH WRITE CYCLE Notes 5, 11, 12, 22, 23, 24 (ns) L7C108/109 15/15-L 20/20-L 25/25-L 35/35-L 45/45-L Symbol tAVAV tELWH tAVWL tAVWH tWHAX tWLWH tDVWH tWHDX tWH tWL X Z Parameter Write Cycle Time Chip Enable Low to End of Write Cycle Address Valid to Beginning of Write Cycle Address Setup to End of Write Cycle Address Hold After End Of Write Write Enable Pulse Width Low Data Setup to End of Write Cycle Data Hold to End of Write Write Enable High to Output Low Z Notes 20, 21 Write Enable Low to Output High Z Notes 20, 21 Min Max Min Max Min Max Min Max Min Max 15 12 0 15 0 12 7 0 5 7 20 12 0 17 0 15 10 0 5 8 25 20 0 20 0 20 12 0 5 10 35 25 0 25 0 30 20 0 5 25 45 35 0 35 0 40 20 0 5 30 LOGIC Devices Incorporated www.logicdevices.com 5 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM SWITCHING CHARACTERISTICS Over Operating Range WRITE CYCLE - WE CONTROLLED Notes 16, 17, 18, 19 tAVAV ADDRESS tELWH CE tAVWH WE tWLWH tDVWH tWLQZ DATA -IN VALID HIGH IMPEDANCE tWHAX tWHDX tWHQX tAVWL DATA IN DATA OUT tPU ICC tPU tPD WRITE CYCLE - CE CONTROLLED Notes 16, 17, 18, 19 tAVAV ADDRESS tAVWL CE tAELWH tAVWH tWHAX tWLWH tDVWH tWHDX WE DATA IN DATA OUT ICC DATA-IN VALID HIGH IMPEDANCE tPU tPD LOGIC Devices Incorporated www.logicdevices.com 6 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM PACKAGE INFORMATION PKG K: 32L CERAMIC DUAL LCC (MD-K11) PIN 1 IDENTIFIER 0.070 ± 0.007 0.082 ± 0.0083 0.825 ± 0.008 0.400 ± 0.005 0.085 ± 0.008 0.050 TYP See detail A 0.055 ± 0.006 0.006 ~ 0.22 TYP 0.025 ± 0.003 0.003 ~ 0.015 0.050 TYP detail A SMD 5962-89598 Case ‘U’ / Ordering Code ‘K’ *All measurements in inches LOGIC Devices Incorporated www.logicdevices.com 7 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM PACKAGE INFORMATION PKG KA: 32L CERAMIC QUAD LCC (MD-KA1) 0.065 ± 0.006 0.450 + 0.008 - 0.005 0.0821 ± 0.0073 0.550 + 0.10 - 0.05 0.020 ± 0.002 0.300 ± 0.005 0.085 ± 0.008 0.050 TYP 0.400 ± 0.005 See detail A 0.008R detail A 0.025 ± 0.003 0.050 ± 0.005 SMD 5962-89598 Case ‘M’ / Ordering Code “KA” *All measurements in inches LOGIC Devices Incorporated www.logicdevices.com 8 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM PACKAGE INFORMATION PKG Y: 32L CERAMIC SOJ (MD-Y1) 0.005 TYP 0.132 ± 0.0203 1 32 0.822 ± 0.008 0.750 ± 0.007 16 17 0.425 ± 0.006 0.445 MAX 0.0205 ± 0.091 0.012 ± 0.0013 0.050 BSC 0.005 MIN 0.010 REF 0.025 ± 0.003 TYP 0.038 TYP 0.025 REF 0.075 REF 0.035 ± 0.010 CHAMFER 0.020 REF 0.035R TYP 0.017 ± 0.002 0.370 ± 0.010 (Note: Case ‘Y’ ships for Case ‘7’ as compatible replacement) SMD 5962-89598 Case ‘Y’ and ‘7’ / Ordering Code ‘Y’ *All measurements in inches LOGIC Devices Incorporated www.logicdevices.com 9 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM PACKAGE INFORMATION PKG D: 32L CERAMIC DIP (MD-D12) 0.135 ± 0.005 0.05 ± 0.0775 0.1471 ± 0.0063 0.100 ± 0.05 TYP 1.600 ± 0.016 0.018 ± 0.002 0.050 ± 0.002 TYP 0.317 ± 0.011 0.378 ± 0.005 0.050 ± 0.010 0.170 ± 0.005 0.22 ± 0.015 Lead Location Guage Plane Seating Plane Base Plane 0.010 + 0.002 - 0.001 0.400 ± 0.005 SMD 5962-89598 Case ‘Z’ / Ordering Code ‘D’ *All measurements in inches LOGIC Devices Incorporated www.logicdevices.com 10 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM SMD Cross Reference Table LOGIC Part # SMD Part # LOGIC Part # SMD Part # L7C109DMB45 L7C109DMB35 L7C109DMB25 L7C109DMB20 L7C109DMB15 L7C109YMB45 L7C109YMB35 L7C109YMB25 L7C109YMB20 L7C109YMB15 L7C109YMB45 L7C109YMB35 L7C109YMB25 L7C109YMB20 L7C109YMB15 L7C109KAMB45 L7C109KAMB35 L7C109KAMB25 L7C109KAMB20 L7C109KAMB15 L7C109KMB45 L7C109KMB35 L7C109KMB25 L7C109KMB20 L7C109KMB15 5962-8959835MZA 5962-8959836MZA 5962-8959837MZA 5962-8959838MZA 5962-8959841MZA 5962-8959835M7A 5962-8959836M7A 5962-8959837M7A 5962-8959838M7A 5962-8959841M7A 5962-8959835MYA 5962-8959836MYA 5962-8959837MYA 5962-8959838MYA 5962-8959841MYA 5962-8959835MMA 5962-8959836MMA 5962-8959837MMA 5962-8959838MMA 5962-8959841MMA 5962-8959835MUA 5962-8959836MUA 5962-8959837MUA 5962-8959838MUA 5962-8959841MUA L7C108DMB45 L7C108DMB35 L7C108DMB25 L7C108DMB20 L7C108DMB15 L7C108YMB45 L7C108YMB35 L7C108YMB25 L7C108YMB20 L7C108YMB15 L7C108YMB45 L7C108YMB35 L7C108YMB25 L7C108YMB20 L7C108YMB15 5962-8959827MZA 5962-8959828MZA 5962-8959829MZA 5962-8959839MZA 5962-8959844MZA 5962-8959827M7A 5962-8959828M7A 5962-8959829M7A 5962-8959839M7A 5962-8959844M7A 5962-8959827MYA 5962-8959828MYA 5962-8959829MYA 5962-8959839MYA 5962-8959844MYA LOGIC Devices Incorporated www.logicdevices.com 11 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM SMD Cross Reference Table LOGIC Part # SMD Part # LOGIC Part # SMD Part # L7C109DMB45L L7C109DMB35L L7C109DMB25L L7C109DMB20L L7C109YMB45L L7C109YMB35L L7C109YMB25L L7C109YMB20L L7C109YMB45L L7C109YMB35L L7C109YMB25L L7C109YMB20L L7C109KAMB45L L7C109KAMB35L L7C109KAMB25L L7C109KAMB20L L7C109KMB45L L7C109KMB35L L7C109KMB25L L7C109KMB20L L7C109FMB20L L7C108DMB45L L7C108DMB35L L7C108DMB25L L7C108DMB20L L7C108DMB15L 5962-8959818MZA 5962-8959819MZA 5962-8959820MZA 5962-8959821MZA 5962-8959818M7A 5962-8959819M7A 5962-8959820M7A 5962-8959821M7A 5962-8959818MYA 5962-8959819MYA 5962-8959820MYA 5962-8959821MYA 5962-8959818MMA 5962-8959819MMA 5962-8959820MMA 5962-8959821MMA 5962-8959818MUA 5962-8959819MUA 5962-8959820MUA 5962-8959821MUA 5962-8959821MTA 5962-8959810MZA 5962-8959811MZA 5962-8959812MZA 5962-8959840MZA 5962-8959848MZA L7C108YMB45L L7C108YMB35L L7C108YMB25L L7C108YMB20L L7C108YMB15L L7C108YAMB45L L7C108YMB35L L7C108YMB25L L7C108YMB20L L7C108YMB15L 5962-8959810M7A 5962-8959811M7A 5962-8959812M7A 5962-8959840M7A 5962-8959848M7A 5962-8959810MYA 5962-8959811MYA 5962-8959812MYA 5962-8959840MYA 5962-8959848MYA LOGIC Devices Incorporated www.logicdevices.com 12 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM ORDERING INFORMATION L 7C 108 D M B 15 L Indicates a LOGIC Devices product SRAM PART NUMBER: 108 = 1M SRAM with single chip enable (available in packages ‘D’ and ‘Y’) 109 = 1M SRAM with dual chip enables (available in ALL packages) PACKAGE CODE: D = 32 pin Sidebrazed DIP 400mil K = 32 pin Ceramic LCC KA = 32 pin Quad Ceramic LCC Y = 32 pin Ceramic SOJ SCREENING LEVEL: M = Military Temperature, -55ºC to +125ºC E = Extended Temperature, -40ºC to +105ºC I = Industrial Temperature, -40ºC to +85ºC COMPLIANCE: B = MIL-STD-883 Compliant SPEED GRADE: [M]: 15/20/25/35/45 [E]: 15/20/25/35/45 [I]: 15/20/25/35/45 LOW POWER OPTION: L = Low Power No Mark Means Standard Power LOGIC Devices Incorporated www.logicdevices.com 13 1M Static RAMs Aug 11, 2010 LDS-L7C108/9-F P RELIMINARY INFORMATION L7C108 L 7C109 128K x 8 Static RAM NOTES 1. Maximum Ratings indicate stress specifications only. Functional operation of these products at values beyond those indicated in the Operating Conditions table is not implied. Exposure to maximum rating conditions for extended periods may affect reliability of the tested device. 2. The products described by this specification include internal circuitry designed to protect the chip from damaging substrate injection currents and accumulations of static charge. Nevertheless, conventional precautions should be observed during storage, handling, and use of these circuits in order to avoid exposure to excessive electrical stress values. 3. This product provides hard clamping of transient undershoot. Input levels below ground will be clamped beginning at –0.6 V. A current in excess of 100 mA is required to reach –2.0 V. The device can withstand indefinite operation with inputs as low as –3 V subject only to power dissipation and bond wire fusing constraints. 4. Tested with GND VOUT VCC. The device is disabled, i.e., CE1 = VCC, CE2 = GND. 5. A series of normalized curves is available to supply the designer with typical DC and AC parametric information for Logic Devices Static RAMs. These curves may be used to determine device characteristics at various temperatures and voltage levels. 6. Tested with all address and data inputs changing at the maximum cycle rate. The device is continuously enabled for reading, i.e., CE1 VIL, CE2 VIH, WE VIH, with outputs disabled, OE VIH. Input pulse levels are 0 to 3.0 V. 7. Tested with outputs open and all address and data inputs stable. The device is continuously disabled, i.e., CE1 VIH, CE2 VIL. 8. Tested with outputs open and all address and data inputs stable. The device is continuously disabled, i.e. CE1 = VCC, CE2 = GND. Input levels are within 0.2 V of VCC or GND. 9. Data retention operation requires that VCC never drop below 2.0V. CE1 must be VCC 0.2 V or CE2 must be 0.2 V. All other inputs must meet VIN VCC - 0.2 V or VIN 0.2 V to ensure full powerdown. For low power version if applicable , this requirement applies only to CE1, CE2, and WE; there are no restrictions on data and address. 10. These parameters are guaranteed but not 100% tested. 11. Test conditions assume input transition times of less than 3 ns, reference levels of 1.5 V, output loading for specified IOL and IOH plus 30 pF Fig. 1a , and input pulse levels of 0 to 3.0 V Fig. 2 . 12. Each parameter is shown as a minimum or maximum value. Input requirements are specified from the point of view of the external system driving the chip. For example, tAVEW is specified as a minimum since the external system must supply at least that much time to meet the worstcase requirements of all parts. Responses from the internal circuitry are specified from the point of view of the device. Access time, for example, is specified as a maximum since worst-case operation of any device always provides data within that time. 13. WE is high for the read cycle. 14. The chip is continuously selected CE1 low, CE2 high . 15. All address lines are valid prior-to or coincident-with the CE1 and CE2 transition to active. 16. The internal write cycle of the memory is defined by the overlap of CE1 and CE2 active and WE low. All three signals must be active to initiate a write. Any signal can terminate a write by going inactive. The address, data, and control input setup and hold times should be referenced to the signal that becomes active last or becomes inactive first. 17. If WE goes low before or concurrent with the latter of CE1 and CE2 going active, the output remains in a high impedance state. 18. If CE1 and CE2 goes inactive before or concurrent with WE going high, the output remains in a high impedance state. 19. Powerup from ICC2 to ICC1 occurs as a result of any of the following conditions: a. Rising edge of CE2 CE1 active or the falling edge of CE1 CE2 active . b. Falling edge of WE CE1, CE2 active . c. Transition on any address line CE1, CE2, active . d. Transition on any data line CE1, CE2, and WE active . The device automatically powers down from ICC1 to ICC2 after tPD has elapsed from any of the prior conditions. This means that power dissipation is dependent on only cycle rate, and is not on Chip Select pulse width. 20. At any given temperature and voltage condition, output disable time is less than output enable time for any given device. 21. Transition is measured ±200 mV from steady state voltage with specified loading in Fig. 1b. This parameter is sampled and not 100% tested. 22. All address timings are referenced from the last valid address line to the first transitioning address line. 23. CE1, CE2, or WE must be inactive during address transitions. 24. This product is a very high speed device and care must be taken during testing in order to realize valid test information. Inadequate attention to setups and procedures can cause a good part to be rejected as faulty. Long high inductance leads that cause supply bounce must be avoided by bringing the VCC and ground planes directly up to the contactor fingers. A 0.01 μF high frequency capacitor is also required between VCC and ground. To avoid signal reflections, proper terminations must be used. Figure 1a. +5 V OUTPUT R 1 4 80 I NCLUDING JIG AND SCOPE 3 0 pF R2 255 Figure 1b. +5 V OUTPUT INCLUDING JIG AND SCOPE R1 480 5 pF R2 255 Figure 2 +3.0 V GND 10% 90% 90% 10%