MX29F002T

MX29F002/002N T/B 2M-BIT [256K x 8] CMOS FLASH MEMORY FEATURES • • • 262,144x 8 only Fast access time: 55/70/90/120ns Low power consumption - 30mA maximum active current(5MHz) - 1uA typical standby current Programming and erasing voltage 5V ± 10% Command register architecture - Byte Programming (7us typical) - Sector Erase (16K-Byte x1, 8K-Byte x 2, 32K-Byte x1, and 64K-Byte x 3) Auto Erase (chip & sector) and Auto Program - Automatically erase any combination of sectors or the whole chip with Erase Suspend capability. - Automatically programs and verifies data at specified address Erase Suspend/Erase Resume - Suspends an erase operation to read data from, or program data to, a sector that is not being erased, then resumes the erase operation. Status Reply - Data polling & Toggle bit for detection of program and erase cycle completion. Sector protection - Hardware method to disable any combination of sectors from program or erase operations - Sector protect/unprotect for 5V only system or 5V/12V system 100,000 minimum erase/program cycles Latch-up protected to 100mA from -1 to VCC+1V Boot Code Sector Architecture - T = Top Boot Sector - B = Bottom Boot Sector Hardware RESET pin(only for 29F002T/B) - Resets internal state machine to read mode Low VCC write inhibit is equal to or less than 3.2V Package type: - 32-pin PDIP - 32-pin PLCC - 32-pin TSOP (Type 1) 20 years data retention • • • • • • • • • • • • • GENERAL DESCRIPTION The MX29F002T/B is a 2-mega bit Flash memory organized as 256K bytes of 8 bits only. MXIC's Flash memories offer the most cost-effective and reliable read/write nonvolatile random access memory. The MX29F002T/B is packaged in 32-pin PDIP,PLCC and 32-pin TSOP(I). It is designed to be reprogrammed and erased in-system or instandard EPROM programmers. The standard MX29F002T/B offers access time as fast as 55ns, allowing operation of high-speed microprocessors without wait states. To eliminate bus contention, the MX29F002T/B has separate chip enable (CE) and output enable (OE) controls. MXIC's Flash memories augment EPROM functionality with in-circuit electrical erasure and programming. The MX29F002T/B uses a command register to manage this functionality. The command register allows for 100% TTL level control inputs and fixed power supply levels during erase and programming, while maintaining maximum EPROM compatibility. MXIC's Flash technology reliably stores memory contents even after 100,000 erase and program cycles. The MXIC cell is designed to optimize the erase and programming mechanisms. In addition, the combination of advanced tunnel oxide processing and low internal electric fields for erase and programming operations produces reliable cycling. The MX29F002T/B uses a 5.0V ± 10% VCC supply to perform the High Reliability Erase and auto Program/Erase algorithms. The highest degree of latch-up protection is achieved with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamps on address and data pin from -1V to VCC + 1V. P/N: PM0547 1 REV. 1.5, MAR. 28, 2005 MX29F002/002N T/B PIN CONFIGURATIONS 32 PDIP RESET A16 A15 A12 A7 A6 A5 A4 A3 A2 A1 A0 Q0 Q1 Q2 GND 32 TSOP (TYPE 1) NC on MX29F002NT/B 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 VCC WE A17 A14 A13 A8 A9 A11 OE A10 CE Q7 Q6 Q5 Q4 Q3 A11 A9 A8 A13 A14 A17 WE VCC (NC on MX29F002NT/B) RESET A16 A15 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE A10 CE Q7 Q6 Q5 Q4 Q3 GND Q2 Q1 Q0 A0 A1 A2 A3 MX29F002T/B MX29F002T/B (NORMAL TYPE) 32 PLCC NC on MX29F002NT/B RESET VCC A12 A15 A16 A17 WE SECTOR STRUCTURE A17~A0 3FFFFH 3BFFFH A14 A13 A8 A9 9 16 K-BYTE (BOOT SECTOR) 8 K-BYTE K-BYTE K-BYTE K-BYTE K-BYTE K-BYTE A7 A6 A5 A4 A3 A2 A1 A0 Q0 5 4 1 32 30 29 39FFFH 8 37FFFH 2FFFFH 64 1FFFFH 64 0FFFFH 64 00000H 32 MX29F002T/B 25 A11 OE A10 CE 13 14 Q1 Q2 VSS 17 Q3 Q4 Q5 21 20 Q6 Q7 MX29F002T Sector Architecture A17~A0 3FFFFH 64 2FFFFH 64 1FFFFH 0FFFFH 07FFFH 05FFFH 03FFFH 00000H 8 8 K-BYTE K-BYTE 64 32 K-BYTE K-BYTE K-BYTE K-BYTE PIN DESCRIPTION SYMBOL A0~A17 Q0~Q7 CE WE RESET OE VCC GND PIN NAME Address Input Data Input/Output Chip Enable Input Write Enable Input Hardware Reset Pin/Sector Protect Unlock Output Enable Input Power Supply Pin (+5V) Ground Pin 16 K-BYTE (BOOT SECTOR) MX29F002B Sector Architecture P/N: PM0547 REV. 1.5, MAR. 28, 2005 2 MX29F002/002N T/B BLOCK DIAGRAM WRITE WE OE WP RESET CONTROL INPUT LOGIC HIGH VOLTAGE MACHINE (WSM) PROGRAM/ERASE STATE X-DECODER MX29F002 FLASH ARRAY ARRAY ADDRESS LATCH A0~A17 AND BUFFER STATE REGISTER SENSE AMPLIFIER Y-DECODER Y-PASS GATE SOURCE HV COMMAND DATA DECODER PGM DATA HV COMMAND DATA LATCH PROGRAM DATA LATCH Q0-Q7 I/O BUFFER P/N: PM0547 REV. 1.5, MAR. 28, 2005 3 MX29F002/002N T/B AUTOMATIC PROGRAMMING The MX29F002T/B is byte programmable using the Automatic Programming algorithm. The Automatic Programming algorithm does not require the system to time out or verify the data programmed. The typical chip programming time of the MX29F002T/B at room temperature is less than 3.5 seconds. cally pre-program and verify the entire array. Then the device automatically times the erase pulse width, verifies the erase, and counts the number of sequences. A status bit similar to DATA polling and status bit toggling between consecutive read cycles provides feedback to the user as to the status of the programming operation. Commands are written to the command register using standard microprocessor write timings. Register contents serve as inputs to an internal state-machine which controls the erase and programming circuitry. During write cycles, the command register internally latches address and data needed for the programming and erase operations. During a system write cycle, addresses are latched on the falling edge, and data are latched on the rising edge of WE . MXIC's Flash technology combines years of EPROM experience to produce the highest levels of quality, reliability, and cost effectiveness. The MX29F002T/B electrically erases all bits simultaneously using Fowler-Nordheim tunneling. The bytes are programmed one byte at a time using the EPROM programming mechanism of hot electron injection. During a program cycle, the state-machine will control the program sequences and command register will not respond to any command set. During a Sector Erase cycle, the command register will only respond to Erase Suspend command. After Erase Suspend is completed, the device stays in read mode. After the state machine has completed its task, it will allow the command register to respond to its full command set. AUTOMATIC CHIP ERASE Typical erasure at room temperature is accomplished in less than 3 seconds. The device is erased using the Automatic Erase algorithm. The Automatic Erase algorithm automatically programs the entire array prior to electrical erase. The timing and verification of electrical erase are internally controlled by the device. AUTOMATIC SECTOR ERASE The MX29F002T/B is sector(s) erasable using MXIC's Auto Sector Erase algorithm. Sector erase modes allow sectors of the array to be erased in one erase cycle. The Automatic Sector Erase algorithm automatically programs the specified sector(s) prior to electrical erase. The timing and verification of electrical erase are internally controlled by the device. AUTOMATIC PROGRAMMING ALGORITHM MXIC's Automatic Programming algorithm requires the user to only write a program set-up commands include 2 unlock write cycle and A0H and a program command (program data and address). The device automatically times the programming pulse width, verifies the program, and counts the number of sequences. A status bit similar to DATA polling and a status bit toggling between consecutive read cycles, provides feedback to the user as to the status of the programming operation. AUTOMATIC ERASE ALGORITHM MXIC's Automatic Erase algorithm requires the user to write commands to the command register using standard microprocessor write timings. The device will automati- P/N: PM0547 REV. 1.5, MAR. 28, 2005 4 MX29F002/002N T/B TABLE 1. SOFTWARE COMMAND DEFINITIONS Command Bus Cycle Reset Read Read Silicon ID Sector Protect Verification Program Chip Erase Sector Erase Sector Erase Suspend Sector Erase Resume Unlock for sector protect/unprotect Note: 1. ADI = Address of Device identifier; A1=0,A0 =0 for manufacture code,A1=0, A0 =1 for device code (Refer to Table 3). DDI = Data of Device identifier : C2H for manufacture code, 00B0h/0034h for device code. X = X can be VIL or VIH RA=Address of memory location to be read. RD=Data to be read at location RA. 2. PA = Address of memory location to be programmed. PD = Data to be programmed at location PA. SA = Address to the sector to be erased. 3.The system should generate the following address patterns: 555H or 2AAH to Address A0~A10. Address bit A11~A17=X=Don't care for all address commands except for Program Address (PA) and Sector Address (SA). Write Sequence may be initiated with A11~A17 in either state. 4.For Sector Protect Verification Operation : If read out data is 01H, it means the sector has been protected. If read out data is 00H, it means the sector is still not being protected. 4 6 6 1 1 6 555H AAH 555H AAH 555H AAH XXXH B0H XXXH 30H 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H 555H 20H 2AAH 55H 2AAH 55H 2AAH 55H 555H A0H 555H 80H 555H 80H 1 1 4 4 First Bus Cycle Addr Data XXXH F0H RA RD 2AAH 55H 2AAH 55H 555H 90H 555H 90H ADI (SA) DDI 00H Second Bus Cycle Addr Data Third Bus Cycle Addr Data Fourth Bus Cycle Addr Data Fifth Bus Cycle Addr Data Sixth Bus Cycle Addr Data 555H AAH 555H AAH (X02H) 01H PA PD 2AAH 2AAH 55H 555H 10H 55H SA 30H 555H AAH 555H AAH COMMAND DEFINITIONS Device operations are selected by writing specific address and data sequences into the command register. Writing incorrect address and data values or writing them in the improper sequence will reset the device to the read mode. Table 1 defines the valid register command sequences. Note that the Erase Suspend (B0H) and Erase Resume (30H) commands are valid only while the Sector Erase operation is in progress. Either of the two reset command sequences will reset the device(when applicable). P/N: PM0547 REV. 1.5, MAR. 28, 2005 5 MX29F002/002N T/B TABLE 2. MX29F002T/B BUS OPERATION Pins Mode Read Silicon ID Manufacturer Code(1) Read Silicon ID Device Code(1) Read Standby Output Disable Write Sector Protect with 12V system(6) Chip Unprotect with 12V system(6) Verify Sector Protect with 12V system Sector Protect without 12V system (6) Chip Unprotect without 12V system (6) Verify Sector Protect/Unprotect without 12V system (7) Reset X X X X X X X HIGH Z L L H X H X H Code(5) L H L X X H H X L H L X X L H X L L H X H X VID(2) Code(5) L VID(2) L X X H VID(2) X L H L L L L X H H VID(2) H X H L L A0 X X A0 X A1 X X A1 X A6 X X A6 L A9 X X A9 VID(2) DOUT HIGH Z HIGH Z DIN(3) X L L H H L X VID(2) B0h/34h L L H L L X VID(2) C2H CE OE WE A0 A1 A6 A9 Q0~Q7 NOTES: 1. Manufacturer and device codes may also be accessed via a command register write sequence. Refer to Table 1. 2. VID is the Silicon-ID-Read high voltage, 11.5V to 12.5V. 3. Refer to Table 1 for valid Data-In during a write operation. 4. X can be VIL or VIH. 5. Code=00H means unprotected. Code=01H means protected. A17~A13=Sector address for sector protect. 6. Refer to sector protect/unprotect algorithm and waveform. Must issue "unlock for sector protect/unprotect" command before "sector protect/unprotect without 12V system" command. 7. The "verify sector protect/unprotect without 12V system" is only following "Sector protect/unprotect without 12V system" command. P/N: PM0547 REV. 1.5, MAR. 28, 2005 6 MX29F002/002N T/B READ/RESET COMMAND The read or reset operation is initiated by writing the read/ reset command sequence into the command register. Microprocessor read cycles retrieve array data. The device remains enabled for reads until the command register contents are altered. If program-fail or erase-fail happen, the write of F0H will reset the device to abort the operation. A valid command must then be written to place the device in the desired state. SET-UP AUTOMATIC CHIP/SECTOR ERASE COMMANDS Chip erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command 80H. Two more "unlock" write cycles are then followed by the chip erase command 10H. The Automatic Chip Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Chip Erase. Upon executing the Automatic Chip Erase, the device will automatically program and verify the entire memory for an all-zero data pattern. When the device is automatically verified to contain an all-zero pattern, a selftimed chip erase and verify begin. The erase and verify operations are completed when the data on Q7 is "1" at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations. When using the Automatic Chip Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array(no erase verify command is required). If the Erase operation was unsuccessful, the data on Q5 is "1" (see Table 4), indicating the erase operation exceed internal timing limit. The automatic erase begins on the rising edge of the last WE pulse in the command sequence and terminates when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode. SILICON-ID-READ COMMAND Flash memories are intended for use in applications where the local CPU alters memory contents. As such, manufacturer and device codes must be accessible while the device resides in the target system. PROM programmers typically access signature codes by raising A9 to a high voltage. However, multiplexing high voltage onto address lines is not generally desired system design practice. The MX29F002T/B contains a Silicon-ID-Read operation to supplement traditional PROM programming methodology. The operation is initiated by writing the read silicon ID command sequence into the command register. Following the command write, a read cycle with A1=VIL, A0=VIL retrieves the manufacturer code of C2H. A read cycle with A1=VIL, A0=VIH returns the device code of B0h for MX29F002T, 34h for MX29F002B. TABLE 3. EXPANDED SILICON ID CODE Pins Code Manufacture code Device code for MX29F002T Device code for MX29F002B Sector Protection Verification A0 VIL VIH VIH X X A1 VIL VIL VIL VIH VIH Q7 1 1 0 0 0 Q6 1 0 0 0 0 Q5 0 1 1 0 0 Q4 0 1 1 0 0 Q3 0 0 0 0 0 Q2 0 0 1 0 0 Q1 1 0 0 0 0 Q0 0 0 0 1 0 Code(Hex) C2H B0h 34h 01H (Protected) 00H (Unprotected) P/N: PM0547 REV. 1.5, MAR. 28, 2005 7 MX29F002/002N T/B SET-UP AUTOMATIC COMMANDS SECTOR ERASE The Automatic Sector Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Set-up Sector Erase command and Automatic Sector Erase command. Upon executing the Automatic Sector Erase command, the device will automatically program and verify the sector(s) memory for an all-zero data pattern. The system does not require to provide any control or timing during these operations. When the sector(s) is automatically verified to contain an all-zero pattern, a self-timed sector erase and verification begin. The erase and verification operations are complete when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode. The system does not required to provide any control or timing during these operations. When using the Automatic Sector Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array (no erase verify command is required). Sector erase is a sixbus cycle operation. There are two "unlock" write cycles. These are followed by writing the set-up command-80H. Two more "unlock" write cycles are then followed by the sector erase command-30H. The sector address is latched on the falling edge of WE, while the command(data) is latched on the rising edge of WE. Sector addresses selected are loaded into internal register on the sixth falling edge of WE. Each successive sector load cycle started by the falling edge of WE must begin within 30us from the rising edge of the preceding WE. Otherwise, the loading period ends and internal auto sector erase cycle starts. (Monitor Q3 to determine if the sector erase timer window is still open, see section Q3, Sector Erase Timer.) Any command other than Sector Erase (30H) or Erase Suspend (BOH) during the time-out period resets the device to read mode. the Sector Erase time-out immediately terminates the time-out period and suspends the erase operation. After this command has been executed, the command register will initiate erase suspend mode. The state machine will return to read mode automatically after suspend is ready. At this time, state machine only allows the command register to respond to the Read Memory Array, Erase Resume and Program commands. The system can determine the status of the program operation using the Q7 or Q6 status bits, just as in the standard program operation. After an erase-suspended program operation is complete, the system can once again read array data within nonsuspended sectors. ERASE SUSPEND This command is only valid while the state machine is executing Automatic Sector Erase operation, and therefore will only be responded during Automatic Sector Erase operation. Writing the Erase Suspend command during P/N: PM0547 REV. 1.5, MAR. 28, 2005 8 MX29F002/002N T/B TABLE 4. WRITE OPERATION STATUS Status Q7 Note1 Byte Program in Auto Program Algorithm Auto Erase Algorithm Erase Suspend Read In Progress Erase Suspended Mode (Erase Suspended Sector) Erase Suspend Read (Non-Erase Suspended Sector) Erase Suspend Program Byte Program in Auto Program Algorithm Exceeded Auto Erase Algorithm Time Limits Erase Suspend Program Q7 Q7 0 Q7 Toggle Toggle Toggle Toggle 0 1 1 1 N/A N/A 1 N/A N/A No Toggle Toggle N/A Data Q7 0 1 Toggle Toggle No Toggle Data Data Data Data Q6 Q5 Note2 0 0 0 N/A 1 N/A No Toggle Toggle Toggle Q3 Q2 Note: 1. Q7 and Q2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 2. Q5 switches to '1' when an Auto Program or Auto Erase operation has exceeded the maximum timing limits. See "Q5:Exceeded Timing Limits " for more information. P/N: PM0547 REV. 1.5, MAR. 28, 2005 9 MX29F002/002N T/B ERASE RESUME This command will cause the command register to clear the suspend state and return back to Sector Erase mode but only if an Erase Suspend command was previously issued. Erase Resume will not have any effect in all other conditions. Another Erase Suspend command can be written after the chip has resumed erasing. fourth WE pulse of the four write pulse sequences for automatic program. While the Automatic Erase algorithm is in operation, Q7 will read "0" until the erase operation is competed. Upon completion of the erase operation, the data on Q7 will read "1". The Data Polling feature is valid after the rising edge of the sixth WE pulse of six write pulse sequences for automatic chip/sector erase. The Data Polling feature is active during Automatic Program/ Erase algorithm or sector erase time-out.(see section Q3 Sector Erase Timer) SET-UP AUTOMATIC PROGRAM COMMANDS To initiate Automatic Program mode, a three-cycle command sequence is required. There are two "unlock" write cycles. These are followed by writing the Automatic Program command A0H. Once the Automatic Program command is initiated, the next WE pulse causes a transition to an active programming operation. Addresses are latched on the falling edge, and data are internally latched on the rising edge of the WE pulse. The rising edge of WE also begins the programming operation. The system does not require to provide further controls or timings. The device will automatically provide an adequate internally generated program pulse and verify margin. If the program operation was unsuccessful, the data on Q5 is "1", indicating the program operation exceed internal timing limit. The automatic programming operation is completed when the data read on Q6 stops toggling for two consecutive read cycles and the data on Q7 and Q6 are equivalent to data written to these two bits, at which time the device returns to the Read mode(no program verify command is required). Q6:Toggle BIT I The MX29F002T/B features a "Toggle Bit" as a method to indicate to the host system that the Auto Program/Erase algorithms are either in progress or completed. During an Automatic Program or Erase algorithm operation, successive read cycles to any address cause Q6 to toggle. The system may use either OE or CE to control the read cycles. When the operation is complete, Q6 stops toggling. After an erase command sequence is written, if all sectors selected for erasing are protected, Q6 toggles and returns to reading array data. If not all selected sectors are protected, the Automatic Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. The system can use Q6 and Q2 together to determine whether a sector is actively erasing or is erase suspended. When the device is actively erasing (that is, the Automatic Erase algorithm is in progress), Q6 toggling. When the device enters the Erase Suspend mode, Q6 stops toggling. However, the system must also use Q2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use Q7(see the subsection on Q7:Data Polling). If a program address falls within a protected sector, Q6 toggles for approximately 2 us after the program command sequence is written, then returns to reading array data. Q6 also toggles during the erase-suspend-program mode, and stops toggling once the Automatic Program algorithm is complete. The Write Operation Status table shows the outputs for Toggle Bit I on Q6. Refer to the toggle bit algorithm. REV. 1.5, MAR. 28, 2005 WRITE OPERATION STATUS DATA POLLING-Q7 The MX29F002T/B also features Data Polling as a method to indicate to the host system that the Automatic Program or Erase algorithms are either in progress or completed. While the Automatic Programming algorithm is in operation, an attempt to read the device will produce the complement data of the data last written to Q7. Upon completion of the Automatic Program Algorithm an attempt to read the device will produce the true data last written to Q7. The Data Polling feature is valid after the rising edge of the P/N: PM0547 10 MX29F002/002N T/B Q2:Toggle Bit II The "Toggle Bit II" on Q2, when used with Q6, indicates whether a particular sector is actively erasing (that is, the Automatic Erase algorithm is in process), or whether that sector is erase-suspended. Toggle Bit I is valid after the rising edge of the final WE pulse in the command sequence. Q2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE or CE to control the read cycles.) But Q2 cannot distinguish whether the sector is actively erasing or is erase-suspended. Q6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sectors and mode information. Refer to Table 4 to compare outputs for Q2 and Q6. system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of the toggle bit algorithm flow chart). Q5 Exceeded Timing Limits Q5 will indicate if the program or erase time has exceeded the specified limits(internal pulse count). Under these conditions Q5 will produce a "1". This time-out condition which indicates that the program or erase cycle was not successfully completed. Data Polling and Toggle Bit are the only operating functions of the device under this condition. If this time-out condition occurs during sector erase operation, it specifies that a particular sector is bad and it may not be reused. However, other sectors are still functional and may be used for the program or erase operation. The device must be reset to use other sectors. Write the Reset command sequence to the device, and then execute program or erase command sequence. This allows the system to continue to use the other active sectors in the device. If this time-out condition occurs during the chip erase operation, it specifies that the entire chip is bad or combination of sectors are bad. If this time-out condition occurs during the byte programming operation, it specifies that the entire sector containing that byte is bad and this sector maynot be reused, (other sectors are still functional and can be reused). The Q5 time-out condition may also appear if a user tries to program a non blank location without erasing. In this case the device locks out and never completes the Automatic Algorithm operation. Hence, the system never reads a valid data on Q7 bit and Q6 never stops toggling. Once the Device has exceeded timing limits, the Q5 bit will indicate a "1". Please note that this is not a device failure condition since the device was incorrectly used. Reading Toggle Bits Q6/ Q2 Refer to the toggle bit algorithm for the following discussion. Whenever the system initially begins reading toggle bit status, it must read Q7-Q0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on Q7-Q0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of Q5 is high (see the section on Q5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as Q5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that system initially determines that the toggle bit is toggling and Q5 has not gone high. The system may continue to monitor the toggle bit and Q5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the P/N: PM0547 REV. 1.5, MAR. 28, 2005 11 MX29F002/002N T/B Q3 Sector Erase Timer After the completion of the initial sector erase command sequence the sector erase time-out will begin. Q3 will remain low until the time-out is complete. Data Polling and Toggle Bit are valid after the initial sector erase command sequence. If Data Polling or the Toggle Bit indicates the device has been written with a valid erase command, Q3 may be used to determine if the sector erase timer window is still open. If Q3 is high ("1") the internally controlled erase cycle has begun; attempts to write subsequent commands to the device will be ignored until the erase operation is completed as indicated by Data Polling or Toggle Bit. If Q3 is low ("0"), the device will accept additional sector erase commands. To insure the command has been accepted, the system software should check the status of Q3 prior to and following each subsequent sector erase command. If Q3 were high on the second status check, the command may not have been accepted. LOGICAL INHIBIT Writing is inhibited by holding any one of OE = VIL, CE = VIH or WE = VIH. To initiate a write cycle CE and WE must be a logical zero while OE is a logical one. POWER SUPPLY DECOUPLING In order to reduce power switching effect, each device should have a 0.1uF ceramic capacitor connected between its VCC and GND. SECTOR PROTECTION WITH 12V SYSTEM The MX29F002T/B features hardware sector protection. This feature will disable both program and erase operations for these sectors protected. To activate this mode, the programming equipment must force VID on address pin A9 and control pin OE, (suggest VID = 12V) A6 = VIL and CE = VIL.(see Table 2) Programming of the protection circuitry begins on the falling edge of the WE pulse and is terminated on the rising edge. Please refer to sector protect algorithm and waveform. To verify programming of the protection circuitry, the programming equipment must force VID on address pin A9 ( with CE and OE at VIL and WE at VIH. When A1=1, it will produce a logical "1" code at device output Q0 for a protected sector. Otherwise the device will produce 00H for the unprotected sector. In this mode, the addresses, except for A1, are in "don't care" state. Address locations with A1 = VIL are reserved to read manufacturer and device codes.(Read Silicon ID) It is also possible to determine if the sector is protected in the system by writing a Read Silicon ID command. Performing a read operation with A1=VIH, it will produce a logical "1" at Q0 for the protected sector. DATA PROTECTION The MX29F002T/B is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transition. During power up the device automatically resets the state machine in the Read mode. In addition, with its control register architecture, alteration of the memory contents only occurs after successful completion of specific command sequences. The device also incorporates several features to prevent inadvertent write cycles resulting from VCC power-up and power-down transition or system noise. WRITE PULSE "GLITCH" PROTECTION Noise pulses of less than 5ns(typical) on CE or WE will not initiate a write cycle. P/N: PM0547 REV. 1.5, MAR. 28, 2005 12 MX29F002/002N T/B Temporary Sector Unprotect Operation (For 29F002T/B only) Start RESET = VID (Note 1) Perform Erase or Program Operation Operation Completed RESET = VIH Temporary Sector Unprotect Completed(Note 2) Note : 1. All protected sectors are temporary unprotected. VID=11.5V~12.5V 2. All previously protected sectors are protected again. P/N: PM0547 REV. 1.5, MAR. 28, 2005 13 MX29F002/002N T/B TEMPORARY SECTOR UNPROTECT Parameter Std. Description tVIDR tRSP Note: Not 100% tested VID Rise and Fall Time (See Note) RESET Setup Time for Temporary Sector Unprotect Test Setup All Speed Options Min Min 500 4 Unit ns us Temporary Sector Unprotect Timing Diagram (For 29F002T/B only) 12V RESET 0 or 5V Program or Erase Command Sequence 0 or 5V tVIDR tVIDR CE WE tRSP P/N: PM0547 REV. 1.5, MAR. 28, 2005 14 MX29F002/002N T/B AC CHARACTERISTICS Parameter Std tREADY tRP1 tRP2 tRH Note: Not 100% tested Description RESET PIN Low (Not During Automatic Algorithms) to Read or Write (See Note) RESET Pulse Width (During Automatic Algorithms) RESET High Time Before Read(See Note) MIN MIN 10 500 0 us ns ns RESET Pulse Width (NOT During Automatic Algorithms) MIN Test Setup All Speed Options MAX 500 Unit ns RESET TIMING WAVEFORM (For 29F002T/B only) CE, OE tRH RESET tRP2 tReady Reset Timing NOT during Automatic Algorithms RESET tRP1 Reset Timing during Automatic Algorithms P/N: PM0547 REV. 1.5, MAR. 28, 2005 15 MX29F002/002N T/B CHIP UNPROTECT WITH 12V SYSTEM The MX29F002T/B also features the chip unprotect mode, so that all sectors are unprotected after chip unprotect is completed to incorporate any changes in the code. It is recommended to protect all sectors before activating chip unprotect mode. To activate this mode, the programming equipment must force VID on control pin OE and address pin A9. The CE pins must be set at VIL. Pins A6 must be set to VIH.(see Table 2) Refer to chip unprotect algorithm and waveform for the chip unprotect algorithm. The unprotection mechanism begins on the falling edge of the WE pulse and is terminated on the rising edge. It is also possible to determine if the chip is unprotected in the system by writing the Read Silicon ID command. Performing a read operation with A1=VIH, it will produce 00H at data outputs(Q0-Q7) for an unprotected sector. It is noted that all sectors are unprotected after the chip unprotect algorithm is completed. ABSOLUTE MAXIMUM RATINGS RATING Ambient Operating Temperature Storage Temperature Applied Input Voltage Applied Output Voltage VCC to Ground Potential A9 VALUE 0oC to 70oC -65oC to 125oC -0.5V to 7.0V -0.5V to 7.0V -0.5V to 7.0V -0.5V to 13.5V NOTICE: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect reliability. NOTICE: Specifications contained within the following tables are subject to change. SECTOR PROTECTION WITHOUT 12V SYSTEM The MX29F002T/B also feature a hardware sector protection method in a system without 12V power supply. The programming equipment do not need to supply 12 volts to protect sectors. The details are shown in sector protect algorithm and waveform. CHIP UNPROTECT WITHOUT 12V SYSTEM The MX29F002T/B also feature a hardware chip unprotection method in a system without 12V power supply. The programming equipment do not need to supply 12 volts to unprotect all sectors. The details are shown in chip unprotect algorithm and waveform. POWER-UP SEQUENCE The MX29F002T/B powers up in the Read only mode. In addition, the memory contents may only be altered after successful completion of a two-step command sequence. Vpp and Vcc power up sequence is not required. P/N: PM0547 REV. 1.5, MAR. 28, 2005 16 MX29F002/002N T/B DC/AC Operating Conditions for Read/Programming/Erase Operation -55 0oC to 70oC 5V±5% MX29F002/002N -70 -90 0oC to 70oC 0oC to 70oC -40oC to 85oC -40oC to 85oC 5V±10% 5V±10% -12 0oC to 70oC -40oC to 85oC 5V±10% Operating Temperature Vcc Power Supply Commercial Industrial CAPACITANCE TA = 25oC, f = 1.0 MHz SYMBOL CIN1 CIN2 COUT PARAMETER Input Capacitance Control Pin Capacitance Output Capacitance MIN. TYP MAX. 8 12 12 UNIT pF pF pF CONDITIONS VIN = 0V VIN = 0V VOUT = 0V READ OPERATION DC CHARACTERISTICS SYMBOL ILI ILO ISB1 ISB2 ICC1 ICC2 VIL VIH VOL VOH1 VOH2 Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage(TTL) Output High Voltage(CMOS) 2.4 VCC-0.4 -0.3(NOTE 1) 2.0 Operating VCC current PARAMETER Input Leakage Current Output Leakage Current Standby VCC current 1 MIN. TYP MAX. 1(Note 3) 10 1 5 50 0.8 VCC + 0.3 0.45 UNIT uA uA mA uA mA V V V V V IOL = 2.1mA IOH = -2mA IOH = -100uA, VCC=VCC MIN NOTES: 1. VIL min. = -1.0V for pulse width is equal to or less than 50 ns. VIL min. = -2.0V for pulse width is equal to or less than 20 ns. 2. VIH max. = VCC + 1.5V for pulse width is equal to or less than 20 ns. If VIH is over the specified maximum value, read operation cannot be guaranteed. 3. ILI=10uA for Industrial grade. 4. ICC1=45mA for Industrial grade. CONDITIONS VIN = GND to VCC VOUT = GND to VCC CE = VIH CE = VCC + 0.3V IOUT = 0mA, f=5MHz IOUT = 0mA, f=10MHz 30(Note 4) mA P/N: PM0547 REV. 1.5, MAR. 28, 2005 17 MX29F002/002N T/B AC CHARACTERISTICS 29F002T/B-55 SYMBOL tACC tCE tOE tDF tOH PARAMETER Address to Output Delay CE to Output Delay OE to Output Delay OE High to Output Float (Note1) Address to Output hold 0 0 29F002T/B-90 SYMBOL tACC tCE tOE tDF tOH PARAMETER Address to Output Delay CE to Output Delay OE to Output Delay OE High to Output Float (Note1) Address to Output hold 0 0 NOTE: 1. tDF is defined as the time at which the output achieves the open circuit condition and data is no longer driven. MIN. MAX. 90 90 40 30 0 0 MIN. MAX. 55 55 25 20 0 0 29F002T/B-12 MIN. MAX. 120 120 50 30 UNIT ns ns ns ns ns CONDITIONS CE=OE=VIL OE=VIL CE=VIL CE=VIL CE=OE=VIL 29F002T/B-70 MIN. MAX. 70 70 30 20 UNIT ns ns ns ns ns CONDITION CE=OE=VIL OE=VIL CE=VIL CE=VIL CE=OE=VIL TEST CONDITIONS: • Input pulse levels: 0.45V/2.4V for 70ns max., 0V/3V for 55ns • Input rise and fall times: < 10ns for 70ns max. < 5ns for 55ns • Output load: 1 TTL gate + 100pF (Including scope and jig) for 70ns max. 1 TTL gate + 50pF (Including scope and jig) for 55ns speed grade • Reference levels for measuring timing: 0.8V, 2.0V for 70ns max. : 1.5V for 55ns READ TIMING WAVEFORMS VIH A0~17 VIL ADD Valid tCE VIH CE VIL WE VIH VIL VIH VIL tACC tOH tOE tDF OE DATA Q0~7 VOH VOL HIGH Z DATA Valid HIGH Z P/N: PM0547 REV. 1.5, MAR. 28, 2005 18 MX29F002/002N T/B COMMAND PROGRAMMING/DATA PROGRAMMING/ERASE OPERATION DC CHARACTERISTICS SYMBOL ICC1 (Read) ICC2 ICC3 (Program) ICC4 (Erase) ICCES NOTES: 1. VIL min. = -0.6V for pulse width is equal to or less than 20ns. 2. If VIH is over the specified maximum value, programming operation cannot be guaranteed. 3. ICCES is specified with the device de-selected. If the device is read during erase suspend mode, current draw is the sum of ICCES and ICC1 or ICC2. 4. All current are in RMS unless otherwise noted. 5. ICC1(Read)=45mA for Industrial Grade. VCC Erase Suspend Current 2 PARAMETER Operating VCC Current MIN. TYP MAX. 50 50 50 UNIT mA mA mA mA CONDITIONS IOUT=0mA, f=5MHz IOUT=0mA, F=10MHz In Programming In Erase CE=VIH, Erase Suspended 30(Note 5) mA P/N: PM0547 REV. 1.5, MAR. 28, 2005 19 MX29F002/002N T/B AC CHARACTERISTICS 29F002T/B-55(NOTE 2) SYMBOL tOES tCWC tCEP tCEPH1 tCEPH2 tAS tAH tDS tDH tCESC tDF tAETC tAETB tAVT PARAMETER OE setup time Command programming cycle WE programming pulse width WE programming pulse width High WE programming pulse width High Address setup time Address hold time Data setup time Data hold time CE setup time before command write Output disable time (Note 1) Total erase time in auto chip erase Total erase time in auto sector erase Total programming time in auto verify (Byte Program time) MIN. 0 70 45 20 20 0 45 20 0 0 MAX. UNIT ns ns ns ns ns ns ns ns ns ns 20 3(TYP.) 1(TYP.) 7 24 8 210 ns s s us tBAL tCH tCS tVLHT tOESP tWPP1 tWPP2 Sector address load time CE Hold Time CE setup to WE going low Voltage Transition Time OE Setup Time to WE Active Write pulse width for sector protect Write pulse width for sector unprotect 100 0 0 4 4 10 12 us ns ns us us us ms NOTES: 1. tDF defined as the time at which the output achieves the open circuit condition and data is no longer driven. 2. The test conditin of MX29F002T/B-55 : VCC=5V ± 5%,CL=50pf,VIH/VIL=3.0V/0V VOH/VOL=1.5V/1.5V,IOL=2mA,IOH=-2mA TA= 0oC TO 70oC P/N: PM0547 REV. 1.5, MAR. 28, 2005 20 MX29F002/002N T/B AC CHARACTERISTICS 29F002T/B-70 29F002T/B-90 29F002T/B-12 SYMBOL tOES tCWC tCEP tCEPH1 tCEPH2 tAS tAH tDS tDH tCESC tDF tAETC tAETB tAVT PARAMETER OE setup time Command programming cycle WE programming pulse width WE programming pulse width High WE programming pulse width High Address setup time Address hold time Data setup time Data hold time CE setup time before command write Output disable time (Note 1) Total erase time in auto chip erase Total erase time in auto sector erase Total programming time in auto verify (Byte Program time) MIN. 0 70 45 20 20 0 45 30 0 0 MAX. MIN. 0 90 45 20 20 0 45 45 0 0 30 MAX. MIN. 0 120 50 20 20 0 50 50 0 0 40 MAX. UNIT ns ns ns ns ns ns ns ns ns ns 40 3(TYP.) 1(TYP.) 7 24 8 210 ns s s us 3(TYP.) 24 1(TYP.) 8 7 210 3(TYP.) 1(TYP.) 7 24 8 210 tBAL tCH tCS tVLHT tOESP tWPP1 tWPP2 Sector address load time CE Hold Time CE setup to WE going low Voltage Transition Time OE Setup Time to WE Active Write pulse width for sector protect Write pulse width for sector unprotect 100 0 0 4 4 10 12 100 0 0 4 4 10 12 100 0 0 4 4 10 12 us ns ns us us us ms NOTES: 1. tDF defined as the time at which the output achieves the open circuit condition and data is no longer driven. P/N: PM0547 REV. 1.5, MAR. 28, 2005 21 MX29F002/002N T/B SWITCHING TEST CIRCUITS DEVICE UNDER TEST 1.6K ohm +5V CL 1.2K ohm DIODES=IN3064 OR EQUIVALENT CL=100pF Including jig capacitance CL=50pF for MX29F002T/B-55 SWITCHING TEST WAVEFORMS(I) for speed grade 70ns max. 2.4V 2.0V 2.0V TEST POINTS 0.8V 0.45V INPUT 0.8V OUTPUT AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0". Input pulse rise and fall times are equal to or less than 20ns. SWITCHING TEST WAVEFORMS(II) for speed grade 55ns(MX29F002T/B-55) 3.0V 1.5V TEST POINTS 1.5V OUTPUT 0V INPUT AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0". Input pulse rise and fall times are < 5ns. P/N: PM0547 REV. 1.5, MAR. 28, 2005 22 MX29F002/002N T/B COMMAND WRITE TIMING WAVEFORM VCC 5V ADD A0~17 VIH ADD Valid VIL tAS tAH WE VIH VIL tOES tCEPH1 tCWC tCEP CE VIH VIL tCS tCH OE VIH VIL VIH tDS tDH DATA Q0-7 DIN VIL P/N: PM0547 REV. 1.5, MAR. 28, 2005 23 MX29F002/002N T/B AUTOMATIC PROGRAMMING TIMING WAVEFORM One byte data is programmed. Verify in fast algorithm and additional programming by external control are not required because these operations are executed automatically by internal control circuit. Programming completion can be verified by DATA polling and toggle bit checking after automatic verification starts. Device outputs DATA during programming and DATA after programming on Q7.(Q6 is for toggle bit; see toggle bit, DATA polling, timing waveform) AUTOMATIC PROGRAMMING TIMING WAVEFORM Vcc 5V A11~A17 ADD Valid A0~A10 WE 555H 2AAH 555H ADD Valid tAS tAH tCWC tCEPH1 tAVT tCESC CE tCEP OE tDS Q0~Q1,Q2 ,Q4(Note 1) Q7 Command In Command #AAH Command In Command #55H Command In Command #A0H Data In tDH Command In Command In Data In DATA tDF Command In DATA polling DATA DATA (Q0~Q7) Notes: (1). Q6:Toggle bit, Q5:Tin=Timing-limit bit, Q3: Time-out bit tOE P/N: PM0547 REV. 1.5, MAR. 28, 2005 24 MX29F002/002N T/B AUTOMATIC PROGRAMMING ALGORITHM FLOWCHART START Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data A0H Address 555H Write Program Data/Address Toggle Bit Checking Q6 not Toggled YES NO Invalid Command NO Verify Byte Ok YES NO Auto Program Completed Q5 = 1 YES . Reset Auto Program Exceed Timing Limit P/N: PM0547 REV. 1.5, MAR. 28, 2005 25 MX29F002/002N T/B TOGGLE BIT ALGORITHM START Read Q7~Q0 Read Q7~Q0 (Note 1) Toggle Bit Q6 =Toggle? YES NO NO Q5=1? YES Read Q7~Q0 Twice (Note 1,2) Toggle Bit Q6 =Toggle? YES Program/Erase Operation Not Complete, Write Reset Command Program/Erase Operation Complete Note: 1. Read toggle bit Q6 twice to determine whether or not it is toggle. See test. 2. Recheck toggle bit Q6 because it may stop toggling as Q5 changes to "1". See test. P/N: PM0547 REV. 1.5, MAR. 28, 2005 26 MX29F002/002N T/B AUTOMATIC CHIPE RASETIMING WAVEFORM All data in chip are erased. External erase verify is not required because data is erased automatically by internal control circuit. Erasure completion can be verified by DATA polling and toggle bit checking after automatic erase starts. Device outputs 0 during erasure and 1 after erasure on Q7.(Q6 is for toggle bit; see toggle bit, DATA polling, timing waveform) AUTOMATIC CHIP ERASE TIMING WAVEFORM Vcc 5V A11~A17 A0~A10 WE 555H 2AAH 555H 555H 2AAH 555H tAS tAH tCWC tCEPH1 tAETC CE tCEP OE tDS tDH Q0,Q1, Q4(Note 1) Q7 Command In Command #AAH Command In Command #55H Command In Command #80H Command In Command #AAH Command In Command #55H Command In Command #10H Command In Command In Command In Command In Command In Command In DATA polling (Q0~Q7) Notes: (1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit, Q2: Toggle bit P/N: PM0547 REV. 1.5, MAR. 28, 2005 27 MX29F002/002N T/B AUTOMATIC CHIP ERASE ALGORITHM FLOWCHART START Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 80H Address 555H Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 10H Address 555H Toggle Bit Checking Q6 not Toggled YES NO Invalid Command NO DATA Polling Q7 = 1 YES NO Q5 = 1 . Auto Chip Erase Completed YES Reset Auto Chip Erase Exceed Timing Limit P/N: PM0547 REV. 1.5, MAR. 28, 2005 28 MX29F002/002N T/B AUTOMATIC SECTOR ERASE TIMING WAVEFORM Sector data indicated by A13 to A17 are erased. External erase verification is not required because data are erased automatically by internal control circuit. Erasure completion can be verified by DATA polling and toggle bit checking after automatic erase starts. Device outputs 0 during erasure and 1 after erasure on Q7.(Q6 is for toggle bit; see toggle bit, DATA polling, timing waveform) AUTOMATIC SECTOR ERASE TIMING WAVEFORM Vcc 5V A13~A17 Sector Address0 Sector Address1 Sector Addressn A0~A10 555H tAS tAH 2AAH 555H 555H 2AAH tCWC WE tCEPH1 tBAL tAETB CE tCEP OE tDS tDH Q0,Q1, Q4(Note 1) Command In Command In Command In Command In Command In Command In Command In Command In DATA polling Q7 Command In Command In Command In Command In Command In Command In Command In Command #30H Command In Command #30H Command #AAH Command #55H Command #80H Command #AAH Command #55H Command #30H (Q0~Q7) Notes: (1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit, Q2: Toggle bit P/N: PM0547 REV. 1.5, MAR. 28, 2005 29 MX29F002/002N T/B AUTOMATIC SECTOR ERASE ALGORITHM FLOWCHART START Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 80H Address 555H Write Data AAH Address 555H Write Data 55H Address 2AAH Write Data 30H Sector Address Toggle Bit Checking Q6 Toggled ? NO Invalid Command YES Load Other Sector Addrss If Necessary (Load Other Sector Address) Last Sector to Erase YES NO Time-out Bit Checking Q3=1 ? NO YES NO Toggle Bit Checking Q6 not Toggled YES NO DATA Polling Q7 = 1 Q5 = 1 YES Reset Auto Sector Erase Completed Auto Sector Erase Exceed Timing Limit P/N: PM0547 REV. 1.5, MAR. 28, 2005 30 MX29F002/002N T/B ERASE SUSPEND/ERASE RESUME FLOWCHART START Write Data B0H Toggle Bit checking Q6 not toggled YES Read Array or Program NO Reading or Programming End YES Write Data 30H NO Continue Erase . . Another Erase Suspend ? YES NO P/N: PM0547 REV. 1.5, MAR. 28, 2005 31 MX29F002/002N T/B TIMING WAVEFORM FOR SECTOR PROTECTION FOR SYSTEM WITH 12V A1 A6 12V 5V A9 tVLHT Verify 12V 5V OE tVLHT tWPP 1 tVLHT WE tOESP CE Data tOE 01H F0H A17-A13 Sector Address P/N: PM0547 REV. 1.5, MAR. 28, 2005 32 MX29F002/002N T/B TIMING WAVEFORM FOR CHIP UNPROTECTION FOR SYSTEM WITH 12V A1 12V 5V A9 tVLHT A6 Verify 12V 5V OE tVLHT tWPP 2 tVLHT WE tOESP CE Data tOE 00H F0H P/N: PM0547 REV. 1.5, MAR. 28, 2005 33 MX29F002/002N T/B SECTOR PROTECTION ALGORITHM FOR SYSTEM WITH 12V START Set Up Sector Addr (A17,A16,A15,A14,A13) PLSCNT=1 OE=VID,A9=VID,CE=VIL A6=VIL Activate WE Pulse Time Out 10us Set WE=VIH, CE=OE=VIL A9 should remain VID No Read from Sector Addr=SA, A1=1 PLSCNT=32? No Data=01H? . Yes Device Failed Protect Another Sector? Yes Remove VID from A9 Write Reset Command Sector Protection Complete P/N: PM0547 REV. 1.5, MAR. 28, 2005 34 MX29F002/002N T/B CHIP UNPROTECTION ALGORITHM FOR SYSTEM WITH 12V START Protect All Sectors PLSCNT=1 Set OE=A9=VID CE=VIL,A6=1 Activate WE Pulse Time Out 12ms Increment PLSCNT Set OE=CE=VIL A9=VID,A1=1 Set Up First Sector Addr Read Data from Device No Increment Sector Addr Data=00H? No PLSCNT=1000? Yes No Yes Device Failed All sectors have been verified? Yes Remove VID from A9 Write Reset Command Chip Unprotect Complete * It is recommended before unprotect the whole chip, all sectors should be protected in advance. P/N: PM0547 REV. 1.5, MAR. 28, 2005 35 MX29F002/002N T/B TIMING WAVEFORM FOR SECTOR PROTECTION FOR SYSTEM WITHOUT 12V A1 A6 Toggle bit polling Verify 5V OE tCEP WE * See the following Note! CE Data Don't care (Note 2) tOE 01H F0H A17-A13 Sector Address Note1: Must issue "unlock for sector protect/unprotect" command before sector protection for a system without 12V provided. Note2: Except F0H P/N: PM0547 REV. 1.5, MAR. 28, 2005 36 MX29F002/002N T/B TIMING WAVEFORM FOR CHIP UNPROTECTION FOR SYSTEM WITHOUT 12V A1 A6 Toggle bit polling Verify 5V OE tCEP WE * See the following Note! CE Data Don't care (Note 2) tOE 00H F0H Note1: Must issue "unlock for sector protect/unprotect" command before sector unprotection for a system without 12V provided. Note2: Except F0H P/N: PM0547 REV. 1.5, MAR. 28, 2005 37 MX29F002/002N T/B SECTOR PROTECTION ALGORITHM FOR SYSTEM WITHOUT 12V START PLSCNT=1 Write "unlock for sector protect/unprotect" Command(Table1) Set Up Sector Addr (A17,A16,A15,A14,A13) OE=VIH,A9=VIH CE=VIL,A6=VIL Activate WE Pulse to start Data don't care Toggle bit checking Q6 not Toggled Yes Increment PLSCNT Set CE=OE=VIL A9=VIH No No Read from Sector Addr=SA, A1=1 No PLSCNT=32? Data=01H? Yes Device Failed Yes . Protect Another Sector? No Write Reset Command Yes Sector Protection Complete P/N: PM0547 REV. 1.5, MAR. 28, 2005 38 MX29F002/002N T/B CHIP UNPROTECTION ALGORITHM FOR SYSTEM WITHOUT 12V START Protect All Sectors PLSCNT=1 Write "unlock for sector protect/unprotect" Command (Table 1) Set OE=A9=VIH CE=VIL,A6=1 Activate WE Pulse to start Data don't care No Toggle bit checking Q6 not Toggled Yes Set OE=CE=VIL A9=VIH,A1=1 Increment PLSCNT Set Up First Sector Addr Read Data from Device No Increment Sector Addr Data=00H? No PLSCNT=1000? Yes No Yes Device Failed All sectors have been verified? Yes Write Reset Command Chip Unprotect Complete * It is recommended before unprotect the whole chip, all sectors should be protected in advance. P/N: PM0547 REV. 1.5, MAR. 28, 2005 39 MX29F002/002N T/B ID CODE READ TIMING WAVEFORM MODE VCC 5V VID ADD A9 VIH VIL ADD AD tACC tACC A1 VIH VIL ADD A2-A8 A10-A17 CE VIH VIL VIH VIL WE VIH VIL tCE OE VIH VIL tOE tDF tOH tOH VIH DATA Q0-Q7 DATA OUT VIL DATA OUT B0h/34h C2H P/N: PM0547 REV. 1.5, MAR. 28, 2005 40 MX29F002/002N T/B ORDERING INFORMATION PLASTIC PACKAGE PART NO. MX29F002TPC-55 MX29F002TPC-70 MX29F002TPC-90 MX29F002TPC-12 MX29F002TTC-55 MX29F002TTC-70 MX29F002TTC-90 MX29F002TTC-12 MX29F002TQC-55 MX29F002TQC-70 MX29F002TQC-90 MX29F002TQC-12 MX29F002BPC-55 MX29F002BPC-70 MX29F002BPC-90 MX29F002BPC-12 MX29F002BTC-55 MX29F002BTC-70 MX29F002BTC-90 MX29F002BTC-12 MX29F002BQC-55 MX29F002BQC-70 MX29F002BQC-90 MX29F002BQC-12 MX29F002NTPC-55 MX29F002NTPC-70 MX29F002NTPC-90 MX29F002NTPC-12 MX29F002NTTC-55 Access Time (ns) 55 70 90 120 55 70 90 120 55 70 90 120 55 70 90 120 55 70 90 120 55 70 90 120 55 70 90 120 55 Operating Current (mA) 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 Standby Current MAX.(uA) 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 Temperature Range 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0oC~70oC 0oC~70oC 0oC~70oC 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0oC~70oC 0oC~70oC 0oC~70oC 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC o o o o o o o o o o o o o o o o o o o o PACKAGE 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin TSOP (Normal Type) P/N: PM0547 REV. 1.5, MAR. 28, 2005 41 MX29F002/002N T/B PART NO. MX29F002NTTC-70 MX29F002NTTC-90 MX29F002NTTC-12 MX29F002NTQC-55 MX29F002NTQC-70 MX29F002NTQC-90 MX29F002NTQC-12 MX29F002NBPC-55 MX29F002NBPC-70 MX29F002NBPC-90 MX29F002NBPC-12 MX29F002NBTC-55 MX29F002NBTC-70 MX29F002NBTC-90 MX29F002NBTC-12 MX29F002NBQC-55 MX29F002NBQC-70 MX29F002NBQC-90 MX29F002NBQC-12 MX29F002TPI-70 MX29F002TPI-90 MX29F002TPI-12 MX29F002TTI-70 MX29F002TTI-90 MX29F002TTI-12 IMX29F002TQI-70 MX29F002TQI-90 MX29F002TQI-12 IMX29F002BPI-70 MX29F002BPI-90 MX29F002BPI-12 Access Time (ns) 70 90 120 55 70 90 120 55 70 90 120 55 70 90 120 55 70 90 120 70 90 120 70 90 120 70 90 120 70 90 120 Operating Current (mA) 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 45 45 45 45 45 45 45 45 45 45 45 45 Standby Current MAX.(uA) 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 Temperature Range 0oC~70oC 0 C~70 C 0 C~70 C 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0oC~70oC 0 C~70 C 0oC~70oC -40 C~85 C -40oC~85oC -40 C~85 C -40oC~85oC -40oC~85oC -40oC~85oC -40oC~85oC -40 C~85 C -40oC~85oC -40 C~85 C -40oC~85oC -40 C~85 C o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o PACKAGE 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP P/N: PM0547 REV. 1.5, MAR. 28, 2005 42 MX29F002/002N T/B PART NO. IMX29F002BTI-70 MX29F002BTI-90 MX29F002BTI-12 MX29F002BQI-70 MX29F002BQI-90 MX29F002BQI-12 MX29F002NTPI-70 MX29F002NTPI-90 MX29F002NTPI-12 MX29F002NTTI-70 MX29F002NTTI-90 MX29F002NTTI-12 MX29F002NTQI-70 MX29F002NTQI-90 MX29F002NTQI-12 MX29F002NBPI-70 MX29F002NBPI-90 MX29F002NBPI-12 MX29F002NBTI-70 MX29F002NBTI-90 MX29F002NBTI-12 MX29F002NBQI-70 MX29F002NBQI-90 MX29F002NBQI-12 Access Time (ns) 70 90 120 70 90 120 70 90 120 70 90 120 70 90 120 70 90 120 70 90 120 70 90 120 Operating Current (mA) 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 45 Standby Current MAX.(uA) 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 Temperature Range -40oC~85oC -40 C~85 C -40 C~85 C -40 C~85 C -40oC~85oC -40 C~85 C -40oC~85oC -40 C~85 C -40oC~85oC -40 C~85 C -40 C~85 C -40 C~85 C -40 C~85 C -40oC~85oC -40 C~85 C -40oC~85oC -40 C~85 C -40oC~85oC -40 C~85 C -40 C~85 C -40 C~85 C -40 C~85 C -40oC~85oC -40 C~85 C o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o PACKAGE 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC 32 Pin PDIP 32 Pin PDIP 32 Pin PDIP 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin TSOP (Normal Type) 32 Pin PLCC 32 Pin PLCC 32 Pin PLCC P/N: PM0547 REV. 1.5, MAR. 28, 2005 43 MX29F002/002N T/B PART NO. MX29F002TTC-70G MX29F002TTC-90G MX29F002BTC-70G MX29F002BTC-90G MX29F002TQC-70G MX29F002TQC-90G MX29F002BQC-70G MX29F002BQC-90G MX29F002TPC-70G MX29F002TPC-90G MX29F002BPC-70G MX29F002BPC-90G MX29F002TPI-70G MX29F002TPI-90G MX29F002BPI-70G MX29F002BPI-90G Access Time (ns) 70 90 70 90 70 90 70 90 70 90 70 90 70 90 70 90 Operating Current (mA) 30 30 30 30 30 30 30 30 30 30 30 30 45 45 45 45 Standby Current MAX.(uA) 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 Temperature Range 0oC~70oC 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C -40 C~85 C -40 C~85 C -40 C~85 C -40 C~85 C o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o PACKAGE 32 Pin TSOP (Pb-free) 32 Pin TSOP (Pb-free) 32 Pin TSOP (Pb-free) 32 Pin TSOP (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) P/N: PM0547 REV. 1.5, MAR. 28, 2005 44 MX29F002/002N T/B PART NO. Access Time (ns) 70 90 70 90 70 90 70 90 70 90 70 90 Operating Current (mA) 30 30 30 30 30 30 30 30 30 30 30 30 Standby Current MAX.(uA) 5 5 5 5 5 5 5 5 5 5 5 5 Temperature Range 0oC~70oC 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C 0 C~70 C o o o o o o o o o o o o o o o o o o o o o o PACKAGE 32 Pin TSOP (Pb-free) 32 Pin TSOP (Pb-free) 32 Pin TSOP (Pb-free) 32 Pin TSOP (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PLCC (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) 32 Pin PDIP (Pb-free) MX29F002NTTC-70G MX29F002NTTC-90G MX29F002NBTC-70G MX29F002NBTC-90G MX29F002NTQC-70G MX29F002NTQC-90G MX29F002NBQC-70G MX29F002NBQC-90G MX29F002NTPC-70G MX29F002NTPC-90G MX29F002NBPC-70G MX29F002NBPC-90G P/N: PM0547 REV. 1.5, MAR. 28, 2005 45 MX29F002/002N T/B ERASE AND PROGRAMMING PERFORMANCE(1) PARAMETER Sector Erase Time Chip Erase Time Byte Programming Time Chip Programming Time Erase/Program Cycles 100,000 MIN. LIMITS TYP.(2) 1 3 7 3.5 MAX.(3) 8 24 210 10.5 UNITS s s us sec Cycles Note: 1.Not 100% Tested, Excludes external system level over head. 2.Typical values measured at 25° C, 5V. 3.Maximum values measured at 25° C, 4.5V. LATCH-UP CHARACTERISTICS MIN. Input Voltage with respect to GND on all pins except I/O pins Input Voltage with respect to GND on all I/O pins Current Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time. -1.0V -1.0V -100mA MAX. 13.5V Vcc + 1.0V +100mA DATA RETENTION PARAMETER Data Retention Time MIN. 20 UNIT Years P/N: PM0547 REV. 1.5, MAR. 28, 2005 46 MX29F002/002N T/B PACKAGE INFORMATION P/N: PM0547 REV. 1.5, MAR. 28, 2005 47 MX29F002/002N T/B P/N: PM0547 REV. 1.5, MAR. 28, 2005 48 MX29F002/002N T/B P/N: PM0547 REV. 1.5, MAR. 28, 2005 49 MX29F002/002N T/B REVISION HISTORY Revision Description 1.0 1.Removed "Advanced Information" datasheet marking and contain information on products in full production 2.The modification summary of Revision 0.9.8 to Revision 1.0: 2-1.Program/erase cycle times:10K cycles-->100K cycles 2-2.To add data retention 20 years 2-3.To add industrial grade range from "Read Mode" to "Full Range" 2-4.To remove A9 from "timing waveform for sector protection for system without 12V" To remove A9 from "timing waveform for chip unprotection for system without 12V" 2-5.Multi-sector erase time-out:30ms-->30us, tBAL:80us-->100us Modified "Package Information" 1. Corrected typing error 1. Changed part no. from MX29F002/002N to MX29F002/002NT/B 1. Added Pb-free option for PDIP package 1. Added Pb-free option for all commercial-grade package with 70ns & 90ns Page P1 Date DEC/27/1999 P1,46 P1,46 P17,19,21,41-43 P36 P37 P8,20,21 P45~47 All All P43 P44,45 1.1 1.2 1.3 1.4 1.5 JUN/14/2001 JUN/11/2002 NOV/11/2002 NOV/08/2004 MAR/28/2005 P/N: PM0547 REV. 1.5, MAR. 28, 2005 50 MX29F002/002N T/B MACRONIX INTERNATIONAL CO., LTD. Headquarters: TEL:+886-3-578-6688 FAX:+886-3-563-2888 Europe Office : TEL:+32-2-456-8020 FAX:+32-2-456-8021 Hong Kong Office : TEL:+86-755-834-335-79 FAX:+86-755-834-380-78 Japan Office : Kawasaki Office : TEL:+81-44-246-9100 FAX:+81-44-246-9105 Osaka Office : TEL:+81-6-4807-5460 FAX:+81-6-4807-5461 Singapore Office : TEL:+65-6346-5505 FAX:+65-6348-8096 Taipei Office : TEL:+886-2-2509-3300 FAX:+886-2-2509-2200 MACRONIX AMERICA, INC. TEL:+1-408-262-8887 FAX:+1-408-262-8810 http : //www.macronix.com MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.