M25P128 Serial Flash Embedded Memory
Features
M25P128 Serial Flash Embedded
Memory with 54 MHz SPI Bus Interface
Features
• Electronic signature
– JEDEC-standard 2-byte signature (2018h)
• More than 100,000 PROGRAM/ERASE cycles per
sector
• More than 20 years data retention
• Automotive-grade parts available
• Packages (RoHS-compliant)
– VFDFPN8 (MLP8) 8mm x 6mm (Package code:
ME)
– SO16W 300 mils (Package code: MF)
•
•
•
•
•
•
SPI bus-compatible serial interface
128Mb Flash memory
54 MHz clock frequency (maximum)
2.7V to 3.6V single supply voltage
VPP = 9V for fast program/erase mode (optional)
Page program (up to 256 bytes) in
– 0.5ms (TYP)
– 0.4ms (TYP with V PP = 9V)
• Erase capability
– Sector erase: 2Mb
– Bulk erase: 128Mb
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
M25P128 Serial Flash Embedded Memory
Features
Contents
Functional Description ..................................................................................................................................... 5
Signal Descriptions ........................................................................................................................................... 7
SPI Modes ........................................................................................................................................................ 8
Operating Features ......................................................................................................................................... 10
Page Programming ..................................................................................................................................... 10
Sector Erase, Bulk Erase .............................................................................................................................. 10
Polling during a Write, Program, or Erase Cycle ............................................................................................ 10
Fast Program/Erase Mode ........................................................................................................................... 10
Active Power and Standby Power ................................................................................................................. 10
Status Register ............................................................................................................................................ 11
Data Protection by Protocol ........................................................................................................................ 11
Software Data Protection ............................................................................................................................ 11
Hardware Data Protection .......................................................................................................................... 11
Hold Condition .......................................................................................................................................... 12
Configuration and Memory Map ..................................................................................................................... 13
Memory Configuration and Block Diagram .................................................................................................. 13
Memory Map – 128Mb Density ....................................................................................................................... 14
Command Set Overview ................................................................................................................................. 15
WRITE ENABLE .............................................................................................................................................. 17
WRITE DISABLE ............................................................................................................................................. 18
READ IDENTIFICATION ................................................................................................................................. 19
READ STATUS REGISTER ................................................................................................................................ 20
WIP Bit ...................................................................................................................................................... 21
WEL Bit ...................................................................................................................................................... 21
Block Protect Bits ....................................................................................................................................... 21
SRWD Bit ................................................................................................................................................... 21
WRITE STATUS REGISTER .............................................................................................................................. 22
READ DATA BYTES ......................................................................................................................................... 24
READ DATA BYTES at HIGHER SPEED ............................................................................................................ 25
PAGE PROGRAM ............................................................................................................................................ 26
SECTOR ERASE .............................................................................................................................................. 27
BULK ERASE .................................................................................................................................................. 28
Power-Up/Down and Supply Line Decoupling ................................................................................................. 29
Power-Up Timing and Write Inhibit Voltage Threshold Specifications ............................................................... 30
Initial Delivery Status ..................................................................................................................................... 31
Maximum Ratings and Operating Conditions .................................................................................................. 32
Electrical Characteristics ................................................................................................................................ 33
AC Characteristics .......................................................................................................................................... 34
Package Information ...................................................................................................................................... 39
Device Ordering Information .......................................................................................................................... 41
Standard Parts ............................................................................................................................................ 41
Revision History ............................................................................................................................................. 42
Rev. A – 11/16 ............................................................................................................................................. 42
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M25P128 Serial Flash Embedded Memory
Features
List of Figures
Figure 1: Logic Diagram ................................................................................................................................... 5
Figure 2: Pin Connections: VDFPN ................................................................................................................... 5
Figure 3: Pin Connections: SO .......................................................................................................................... 6
Figure 4: SPI Modes Supported ........................................................................................................................ 8
Figure 5: Bus Master and Memory Devices on the SPI Bus ................................................................................. 9
Figure 6: Hold Condition Activation ............................................................................................................... 12
Figure 7: Block Diagram ................................................................................................................................ 13
Figure 8: WRITE ENABLE Command Sequence .............................................................................................. 17
Figure 9: WRITE DISABLE Command Sequence ............................................................................................. 18
Figure 10: READ IDENTIFICATION Command Sequence ................................................................................ 19
Figure 11: READ STATUS REGISTER Command Sequence .............................................................................. 20
Figure 12: Status Register Format ................................................................................................................... 20
Figure 13: WRITE STATUS REGISTER Command Sequence ............................................................................. 22
Figure 14: READ DATA BYTES Command Sequence ........................................................................................ 24
Figure 15: READ DATA BYTES at HIGHER SPEED Command Sequence ........................................................... 25
Figure 16: PAGE PROGRAM Command Sequence ........................................................................................... 26
Figure 17: SECTOR ERASE Command Sequence ............................................................................................. 27
Figure 18: BULK ERASE Command Sequence ................................................................................................. 28
Figure 19: Power-Up Timing .......................................................................................................................... 30
Figure 20: AC Measurement I/O Waveform ..................................................................................................... 34
Figure 21: Serial Input Timing ........................................................................................................................ 36
Figure 22: Write Protect Setup and Hold during WRSR when SRWD = 1 Timing ................................................ 37
Figure 23: Hold Timing .................................................................................................................................. 37
Figure 24: Output Timing .............................................................................................................................. 38
Figure 25: V PPH Timing .................................................................................................................................. 38
Figure 26: VFDFPN8 (MLP8) 8mm x 6mm – Package Code: ME ....................................................................... 39
Figure 27: SO16W 300 mils Body Width – Package Code: MF ........................................................................... 40
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M25P128 Serial Flash Embedded Memory
Features
List of Tables
Table 1: Signal Descriptions ............................................................................................................................. 7
Table 2: Protected Area Sizes .......................................................................................................................... 11
Table 3: Sectors 63:0 ...................................................................................................................................... 14
Table 4: Command Set Codes ........................................................................................................................ 16
Table 5: READ IDENTIFICATION Data Out Sequence ..................................................................................... 19
Table 6: Status Register Protection Modes ...................................................................................................... 23
Table 7: Power-Up Timing and V WI Threshold ................................................................................................. 30
Table 8: Absolute Maximum Ratings .............................................................................................................. 32
Table 9: Operating Conditions ....................................................................................................................... 32
Table 10: DC Current Specifications ............................................................................................................... 33
Table 11: DC Voltage Specifications ................................................................................................................ 33
Table 12: AC Measurement Conditions ........................................................................................................... 34
Table 13: Capacitance .................................................................................................................................... 34
Table 14: AC Specifications ............................................................................................................................ 35
Table 15: AC Specifications, Command Times ................................................................................................ 36
Table 16: Part Number Information Scheme ................................................................................................... 41
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M25P128 Serial Flash Embedded Memory
Functional Description
Functional Description
The M25P128 is a 128Mb (16Mb x 8) serial Flash memory device with advanced write
protection mechanisms accessed by a high speed SPI-compatible bus. The device supports high-performance commands for clock frequency up to 54 MHz.
The memory can be programmed 1 to 256 bytes at a time using the PAGE PROGRAM
command. It is organized as 64 sectors, each containing 1024 pages. Each page is 256
bytes wide. Memory can be viewed either as 65,536 pages or as 16,777,216 bytes.
An enhanced fast program/erase mode is available to speed up operations in factory
environment. The device enters this mode whenever the V PPH voltage is applied to the
W#/VPP pin.
The entire memory can be erased using the BULK ERASE command, or it can be erased
one sector at a time using the SECTOR ERASE command.
To meet environmental requirements, Micron offers these devices in lead-free and
RoHS compliant packages.
Figure 1: Logic Diagram
VCC
DQ0
DQ1
C
S#
W#/VPP
HOLD#
VSS
Figure 2: Pin Connections: VDFPN
Note:
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S#
1
8
VCC
DQ1
2
7
HOLD#
W#/VPP
3
6
C
VSS
4
5
DQ0
1. There is an exposed central pad on the underside of the MLP8 package that is pulled internally to VSS, and must not be connected to any other voltage or signal line on the
PCB. The Package Mechanical section provides information on package dimensions and
how to identify pin 1.
5
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M25P128 Serial Flash Embedded Memory
Functional Description
Figure 3: Pin Connections: SO
Notes:
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HOLD#
1
16
C
VCC
2
15
DQ0
DNU
3
14
DNU
DNU
4
13
DNU
DNU
5
12
DNU
DNU
6
11
DNU
S#
7
10
VSS
DQ1
8
9
W#/VPP
1. DNU = Don't Use
2. The Package Information section provides information on package dimensions and how
to identify pin 1.
6
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© 2016 Micron Technology, Inc. All rights reserved.
M25P128 Serial Flash Embedded Memory
Signal Descriptions
Signal Descriptions
Table 1: Signal Descriptions
Signal
Type
DQ1
Output
Serial data: The DQ1 output signal is used to transfer data serially out of the device.
Data is shifted out on the falling edge of the serial clock (C).
DQ0
Input
Serial data: The DQ0 input signal is used to transfer data serially into the device. It
receives commands, addresses, and the data to be programmed. Values are latched on
the rising edge of the serial clock (C).
C
Input
Clock: The C input signal provides the timing of the serial interface. Commands, addresses, or data present at serial data input (DQ0) is latched on the rising edge of the
serial clock (C). Data on DQ1 changes after the falling edge of C.
S#
Input
Chip select: When the S# input signal is HIGH, the device is deselected and DQ1 is at
high impedance. Unless an internal PROGRAM, ERASE, or WRITE STATUS REGISTER cycle is in progress, the device will be in the standby power mode. Driving S# LOW enables the device, placing it in the active power mode. After power-up, a falling edge on
S# is required prior to the start of any command.
HOLD#
Input
Hold: The HOLD# signal is used to pause any serial communications with the device
without deselecting the device. During the hold condition, DQ1 is High-Z. DQ0 and C
are "Don’t Care." To start the hold condition, the device must be selected, with S#
driven LOW.
W#/VPP
Input
Write protect: The W#/VPP signal is both a control input and a power supply pin. The
two functions are selected by the voltage range applied to the pin. If the W#/VPP input
is kept in a low voltage range (0 V to VCC) the pin is seen as a control input. The W#
input signal is used to freeze the size of the area of memory that is protected against
program or erase commands as specified by the values in BP2, BP1, and BP0 bits of the
Status Register. VPP acts as an additional power supply if it is in the range of VPPH, as
defined in the AC Measurement Conditions table. Avoid applying VPPH to the W#/VPP
pin during a BULK ERASE operation.
VCC
Power
Device core power supply: Source voltage.
VSS
Ground
DNU
–
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Description
Ground: Reference for the VCC supply voltage.
Do not use.
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M25P128 Serial Flash Embedded Memory
SPI Modes
SPI Modes
These devices can be driven by a microcontroller with its serial peripheral interface
(SPI) running in either of the following two SPI modes:
• CPOL = 0, CPHA = 0
• CPOL = 1, CPHA = 1
For these two modes, input data is latched in on the rising edge of serial clock (C), and
output data is available from the falling edge of C.
The difference between the two modes is the clock polarity when the bus master is in
standby mode and not transferring data:
• C remains at 0 for (CPOL = 0, CPHA = 0)
• C remains at 1 for (CPOL = 1, CPHA = 1)
Figure 4: SPI Modes Supported
CPOL
CPHA
0
0
C
1
1
C
DQ0
MSB
MSB
DQ1
Because only one device is selected at a time, only one device drives the serial data output (DQ1) line at a time, while the other devices are High-Z. An example of three devices connected to an MCU on an SPI bus is shown here.
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M25P128 Serial Flash Embedded Memory
SPI Modes
Figure 5: Bus Master and Memory Devices on the SPI Bus
VSS
VCC
R
SDO
SPI interface with
(CPOL, CPHA) =
(0, 0) or (1, 1)
SDI
SCK
VCC
C
DQ1 DQ0
SPI Bus Master
SPI memory
device
R
CS3
CS2
DQ1
DQ0
SPI memory
device
R
VCC
C
VSS
R
DQ1 DQ0
VSS
SPI memory
device
CS1
S#
Notes:
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VCC
C
VSS
W#
HOLD#
S#
W#
HOLD#
S#
W#
HOLD#
1. WRITE PROTECT (W#) and HOLD# should be driven HIGH or LOW as appropriate.
2. Resistors (R) ensure that the memory device is not selected if the bus master leaves the
S# line High-Z.
3. The bus master may enter a state where all I/O are High-Z at the same time; for example, when the bus master is reset. Therefore, C must be connected to an external pulldown resistor so that when all I/O are High-Z, S# is pulled HIGH while C is pulled LOW.
This ensures that S# and C do not go HIGH at the same time and that the tSHCH requirement is met.
4. The typical value of R is 100kΩ, assuming that the time constant R × Cp (Cp = parasitic
capacitance of the bus line) is shorter than the time during which the bus master leaves
the SPI bus High-Z.
5. Example: Given that Cp = 50pF (R × Cp = 5μs), the application must ensure that the bus
master never leaves the SPI bus High-Z for a time period shorter than 5μs.
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M25P128 Serial Flash Embedded Memory
Operating Features
Operating Features
Page Programming
To program one data byte, two commands are required: WRITE ENABLE, which is one
byte, and a PAGE PROGRAM sequence, which is four bytes plus data. This is followed by
the internal PROGRAM cycle of duration tPP. To spread this overhead, the PAGE PROGRAM command allows up to 256 bytes to be programmed at a time (changing bits
from 1 to 0), provided they lie in consecutive addresses on the same page of memory. To
optimize timings, it is recommended to use the PAGE PROGRAM command to program
all consecutive targeted bytes in a single sequence than to use several PAGE PROGRAM
sequences with each containing only a few bytes.
Sector Erase, Bulk Erase
The PAGE PROGRAM command allows bits to be reset from 1 to 0. Before this can be
applied, the bytes of memory need to have been erased to all 1s (FFh). This can be achieved a sector at a time using the SECTOR ERASE command, or throughout the entire
memory using the BULK ERASE command. This starts an internal ERASE cycle of duration tSSE, tSE, or tBE. The ERASE command must be preceded by a WRITE ENABLE
command.
Polling during a Write, Program, or Erase Cycle
An improvement in the time to complete the following commands can be achieved by
not waiting for the worst case delay (tW, tPP, tSE, or tBE).
• WRITE STATUS REGISTER
• PROGRAM
• ERASE (SECTOR ERASE, BULK ERASE)
The write in progress (WIP) bit is provided in the status register so that the application
program can monitor this bit in the status register, polling it to establish when the previous WRITE cycle, PROGRAM cycle, or ERASE cycle is complete.
Fast Program/Erase Mode
The fast program/erase mode is used to speed up programming/erasing. The device enters this mode during the PAGE PROGRAM, SECTOR ERASE, or BULK ERASE operations
whenever a voltage equal to V PPH is applied to the W#/V PP pin.
The use of this mode requires specific operating conditions in addition to the normal
ones (VCC must be within the normal operating range):
• The voltage applied to the W#/V PP pin must be equal to V PPH
• Ambient temperature, T A must be 25 °C ±10 °C
• The cumulated time during which W#/V PP is at V PPH should be less than 80 hours
Active Power and Standby Power
When chip select (S#) is LOW, the device is selected, and in the active power mode.
When S# is HIGH, the device is deselected, but could remain in the active power mode
until all internal cycles have completed (PROGRAM, ERASE, WRITE STATUS REGIS-
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M25P128 Serial Flash Embedded Memory
Operating Features
TER). The device then goes in to the standby power mode. The device consumption
drops to ICC1.
Status Register
The status register contains a number of status and control bits that can be read or set
(as appropriate) by specific commands. For a detailed description of the status register
bits, see READ STATUS REGISTER section.
Data Protection by Protocol
Nonvolatile memory is used in environments that can include excessive noise. The following capabilities help protect data in these noisy environments.
Power on reset and an internal timer (tPUW) can provide protection against inadvertent
changes while the power supply is outside the operating specification.
WRITE, PROGRAM, and WRITE STATUS REGISTER commands are checked before they
are accepted for execution to ensure they consist of a number of clock pulses that is a
multiple of eight.
All commands that modify data must be preceded by a WRITE ENABLE command to set
the write enable latch (WEL) bit.
Software Data Protection
Memory can be configured as read-only using the block protect bits (BP2, BP1, BP0) as
shown in the Protected Area Sizes table.
Hardware Data Protection
Hardware data protection is implemented using the write protect signal applied on the
W# pin. This freezes the status register in a read-only mode. In this mode, the block protect (BP) bits and the status register write disable bit (SRWD) are protected.
Table 2: Protected Area Sizes
Status Register Content
Memory Content
BP Bit 2
BP Bit 1
BP Bit 0
0
0
0
none
All sectors (sectors 0 to 63)
0
0
1
Upper 64th (sector 63, 2Mb)
Lower 63/64ths (sectors 0 to 62)
0
1
0
Upper 32nd (sectors 62 and 63, 4Mb)
Lower 31/32nds (sectors 0 to 61)
0
1
1
Upper 16th (sectors 60 and 63, 8Mb)
Lower 15/16ths (sectors 0 to 59)
1
0
0
Upper 8th (sectors 56 to 63, 16Mb)
Lower 7/8ths (sectors 0 to 55)
1
0
1
Upper 4th (sectors 48 to 63, 32Mb)
Lower 3/4ths (sectors 0 to 47)
1
1
0
Upper half (sectors 32 to 63, 64Mb)
Lower half (sectors 0 to 31)
1
1
1
All sectors (sectors 0 to 63, 128Mb)
none
Note:
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Protected Area
Unprotected Area
1. 0 0 0 = unprotected area (sectors): The device is ready to accept a BULK ERASE command
only if all block protect bits (BP2, BP1, BP0) are 0.
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M25P128 Serial Flash Embedded Memory
Operating Features
Hold Condition
The HOLD# signal is used to pause any serial communications with the device without
resetting the clocking sequence. However, taking this signal LOW does not terminate
any WRITE STATUS REGISTER, PROGRAM, or ERASE cycle that is currently in progress.
To enter the hold condition, the device must be selected, with S# LOW. The hold condition starts on the falling edge of the HOLD# signal, if this coincides with serial clock (C)
being LOW. The hold condition ends on the rising edge of the HOLD# signal, if this coincides with C being LOW. If the falling edge does not coincide with C being LOW, the
hold condition starts after C next goes LOW. Similarly, if the rising edge does not coincide with C being LOW, the hold condition ends after C next goes LOW.
During the hold condition, DQ1 is HIGH impedance while DQ0 and C are "Don’t Care."
Typically, the device remains selected with S# driven LOW for the duration of the hold
condition. This ensures that the state of the internal logic remains unchanged from the
moment of entering the hold condition. If S# goes HIGH while the device is in the hold
condition, the internal logic of the device is reset. To restart communication with the
device, it is necessary to drive HOLD# HIGH, and then to drive S# LOW. This prevents
the device from going back to the hold condition.
Figure 6: Hold Condition Activation
C
HOLD#
HOLD condition (standard use)
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HOLD condition (nonstandard use)
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M25P128 Serial Flash Embedded Memory
Configuration and Memory Map
Configuration and Memory Map
Memory Configuration and Block Diagram
Each page of memory can be individually programmed; bits are programmed from 1 to
0. The device is sector or bulk-erasable, but not page-erasable; bits are erased from 0 to
1. The memory is configured as follows:
• 16,777,216 bytes (8 bits each)
• 64 sectors (2Mb, 262,144 bytes each)
• 65,536 pages (256 bytes each)
Figure 7: Block Diagram
HOLD#
W#/VPP
High Voltage
Generator
Control Logic
64 OTP bytes
S#
C
DQ0
I/O Shift Register
DQ1
Address Register
and Counter
Status
Register
256 Byte
Data Buffer
Y Decoder
FFFFFFh
00000h
000FFh
256 bytes (page size)
X Decoder
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M25P128 Serial Flash Embedded Memory
Memory Map – 128Mb Density
Memory Map – 128Mb Density
Table 3: Sectors 63:0
Address Range
Sector
Start
End
63
FC0000h
FFFFFFh
62
F80000h
FBFFFFh
⋮
⋮
⋮
48
C00000h
C3FFFFh
47
BC0000h
BFFFFFh
⋮
⋮
⋮
32
800000h
83FFFFh
31
7C0000h
7FFFFFh
⋮
⋮
⋮
16
400000h
43FFFFh
15
3C0000h
3FFFFFh
⋮
⋮
⋮
0
000000h
03FFFFh
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M25P128 Serial Flash Embedded Memory
Command Set Overview
Command Set Overview
All commands, addresses, and data are shifted in and out of the device, most significant
bit first.
Serial data inputs DQ0 and DQ1 are sampled on the first rising edge of serial clock (C)
after chip select (S#) is driven LOW. Then, the one-byte command code must be shifted
in to the device, most significant bit first, on DQ0 and DQ1, each bit being latched on
the rising edges of C.
Every command sequence starts with a one-byte command code. Depending on the
command, this command code might be followed by address or data bytes, by address
and data bytes, or by neither address or data bytes. For the following commands, the
shifted-in command sequence is followed by a data-out sequence. S# can be driven
HIGH after any bit of the data-out sequence is being shifted out.
•
•
•
•
READ DATA BYTES (READ)
READ DATA BYTES at HIGHER SPEED
READ STATUS REGISTER
READ IDENTIFICATION
For the following commands, S# must be driven HIGH exactly at a byte boundary. That
is, after an exact multiple of eight clock pulses following S# being driven LOW, S# must
be driven HIGH. Otherwise, the command is rejected and not executed.
•
•
•
•
•
•
PAGE PROGRAM
SECTOR ERASE
BULK ERASE
WRITE STATUS REGISTER
WRITE ENABLE
WRITE DISABLE
All attempts to access the memory array are ignored during a WRITE STATUS REGISTER
command cycle, a PROGRAM command cycle, or an ERASE command cycle. In addition, the internal cycle for each of these commands continues unaffected.
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M25P128 Serial Flash Embedded Memory
Command Set Overview
Table 4: Command Set Codes
Command Name
Bytes
One-Byte
Command Code
Address
Dummy
Data
WRITE ENABLE
0000
0110
06h
0
0
0
WRITE DISABLE
0000
0100
04h
0
0
0
READ IDENTIFICATION
1001
1111
9Fh
0
0
1 to 20
1001
1110
9Eh
READ STATUS REGISTER
0000
0101
05h
0
0
1 to ∞
WRITE STATUS REGISTER
0000
0001
01h
0
0
1
READ DATA BYTES
0000
0011
03h
3
0
1 to ∞
READ DATA BYTES at HIGHER SPEED
0000
1011
0Bh
3
1
1 to ∞
PAGE PROGRAM
0000
0010
02h
3
0
1 to 256
SECTOR ERASE
1101
1000
D8h
3
0
0
BULK ERASE
1100
0111
C7h
0
0
0
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M25P128 Serial Flash Embedded Memory
WRITE ENABLE
WRITE ENABLE
The WRITE ENABLE command sets the write enable latch (WEL) bit.
The WEL bit must be set before execution of every PROGRAM, ERASE, and WRITE command.
The WRITE ENABLE command is entered by driving chip select (S#) LOW, sending the
command code, and then driving S# HIGH.
Figure 8: WRITE ENABLE Command Sequence
0
1
2
3
4
5
6
7
C
S#
Command bits
DQ[0]
0
0
0
0
0
LSB
1
1
0
MSB
DQ1
High-Z
Don’t Care
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M25P128 Serial Flash Embedded Memory
WRITE DISABLE
WRITE DISABLE
The WRITE DISABLE command resets the write enable latch (WEL) bit.
The WRITE DISABLE command is entered by driving chip select (S#) LOW, sending the
command code, and then driving S# HIGH.
The WEL bit is reset under the following conditions:
•
•
•
•
•
Power-up
Completion of any ERASE operation
Completion of any PROGRAM operation
Completion of any WRITE STATUS REGISTER operation
Completion of WRITE DISABLE operation
Figure 9: WRITE DISABLE Command Sequence
0
1
2
3
4
5
6
7
C
S#
Command bits
DQ[0]
0
0
0
0
0
LSB
1
0
0
MSB
DQ1
High-Z
Don’t Care
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M25P128 Serial Flash Embedded Memory
READ IDENTIFICATION
READ IDENTIFICATION
The READ IDENTIFICATION command reads the following device identification data:
• Manufacturer identification (1 byte): This is assigned by JEDEC.
• Device identification (2 bytes): This is assigned by device manufacturer; the first byte
indicates memory type and the second byte indicates device memory capacity.
Table 5: READ IDENTIFICATION Data Out Sequence
Device Identification
Manufacturer
Identification
Memory Type
Memory Capacity
20h
20h
18h
A READ IDENTIFICATION command is not decoded while an ERASE or PROGRAM cycle is in progress and has no effect on a cycle in progress.
The device is first selected by driving chip select (S#) LOW. Then the 8-bit command
code is shifted in and the 24-bit device identification that is stored in the memory is
shifted out on serial data output (DQ1). Each bit is shifted out during the falling edge of
serial clock (C).
The READ IDENTIFICATION command is terminated by driving S# HIGH at any time
during data output. When S# is driven HIGH, the device is put in the standby power
mode and waits to be selected so that it can receive, decode, and execute commands.
Figure 10: READ IDENTIFICATION Command Sequence
0
7
16
15
8
31
32
C
LSB
Command
DQ0
MSB
LSB
LSB
DQ1
High-Z
DOUT
DOUT
DOUT
MSB
DOUT
MSB
Manufacturer
identification
LSB
DOUT
DOUT
MSB
Device
identification
UID
Don’t Care
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M25P128 Serial Flash Embedded Memory
READ STATUS REGISTER
READ STATUS REGISTER
The READ STATUS REGISTER command allows the status register to be read. The status
register may be read at any time, even while a PROGRAM, ERASE, or WRITE STATUS
REGISTER cycle is in progress. When one of these cycles is in progress, it is recommended to check the write in progress (WIP) bit before sending a new command to the device. It is also possible to read the status register continuously.
Figure 11: READ STATUS REGISTER Command Sequence
0
7
8
9
10
11
12
13
14
15
C
LSB
Command
DQ0
MSB
LSB
DQ1
DOUT
High-Z
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
MSB
Don’t Care
Figure 12: Status Register Format
b7
SRWD
b0
0
BP2
0
BP1
BP0
WEL
WIP
status register write protect
block protect bits
write enable latch bit
write in progress bit
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M25P128 Serial Flash Embedded Memory
READ STATUS REGISTER
WIP Bit
The write in progress (WIP) bit indicates whether the memory is busy with a WRITE
STATUS REGISTER cycle, a PROGRAM cycle, or an ERASE cycle. When the WIP bit is set
to 1, a cycle is in progress; when the WIP bit is set to 0, a cycle is not in progress.
WEL Bit
The write enable latch (WEL) bit indicates the status of the internal write enable latch.
When the WEL bit is set to 1, the internal write enable latch is set; when the WEL bit is
set to 0, the internal write enable latch is reset and no WRITE STATUS REGISTER, PROGRAM, or ERASE command is accepted.
Block Protect Bits
The block protect bits are non-volatile. They define the size of the area to be software
protected against PROGRAM and ERASE commands. The block protect bits are written
with the WRITE STATUS REGISTER command.
When one or more of the block protect bits is set to 1, the relevant memory area, as defined in the Protected Area Sizes table, becomes protected against PAGE PROGRAM and
SECTOR ERASE commands. The block protect bits can be written provided that the
hardware protected mode has not been set. The BULK ERASE command is executed only if all block protect bits are 0.
SRWD Bit
The status register write disable (SRWD) bit is operated in conjunction with the write
protect (W#/VPP) signal. When the SRWD bit is set to 1 and W#/V PP is driven LOW, the
device is put in the hardware protected mode. In the hardware protected mode, the
non-volatile bits of the status register (SRWD, and the block protect bits) become readonly bits and the WRITE STATUS REGISTER command is no longer accepted for execution.
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M25P128 Serial Flash Embedded Memory
WRITE STATUS REGISTER
WRITE STATUS REGISTER
The WRITE STATUS REGISTER command allows new values to be written to the status
register. Before the WRITE STATUS REGISTER command can be accepted, a WRITE ENABLE command must have been executed previously. After the WRITE ENABLE command has been decoded and executed, the device sets the write enable latch (WEL) bit.
The WRITE STATUS REGISTER command is entered by driving chip select (S#) LOW,
followed by the command code and the data byte on serial data input (DQ0). The
WRITE STATUS REGISTER command has no effect on b6, b5, b4, b1, and b0 of the status register. The status register b6, b5, and b4 are always read as "0". S# must be driven
HIGH after the eighth bit of the data byte has been latched in. If not, the WRITE STATUS
REGISTER command is not executed.
Figure 13: WRITE STATUS REGISTER Command Sequence
0
7
8
9
10
11
12
13
15
14
C
LSB
Command
DQ0
MSB
LSB
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
MSB
As soon as S# is driven HIGH, the self-timed WRITE STATUS REGISTER cycle is initiated; its duration is tW. While the WRITE STATUS REGISTER cycle is in progress, the status register may still be read to check the value of the write in progress (WIP) bit. The
WIP bit is 1 during the self-timed WRITE STATUS REGISTER cycle, and is 0 when the
cycle is completed. Also, when the cycle is completed, the WEL bit is reset.
The WRITE STATUS REGISTER command allows the user to change the values of the
block protect bits (BP2, BP1, BP0). Setting these bit values defines the size of the area
that is to be treated as read-only, as defined in the Protected Area Sizes table.
The WRITE STATUS REGISTER command also allows the user to set and reset the status
register write disable (SRWD) bit in accordance with the write protect (W#/VPP) signal.
The SRWD bit and the W#/V PP signal allow the device to be put in the hardware protected (HPM) mode. The WRITE STATUS REGISTER command is not executed once the
HPM is entered. The options for enabling the status register protection modes are summarized here.
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M25P128 Serial Flash Embedded Memory
WRITE STATUS REGISTER
Table 6: Status Register Protection Modes
Memory Content
W#/VPP
Signal
SRWD
Bit
Protection
Mode (PM)
Status Register
Write Protection
Protected
Area
Unprotected
Area
1
0
Commands not
accepted
Commands
accepted
1, 2, 3
0
1
1
Software
protected mode
(SPM)
Software protection
0
0
1
Hardware
protected mode
(HPM)
Hardware protection
Commands not
accepted
Commands
accepted
3, 4, 5,
Notes:
Notes
1. Software protection: status register is writable (SRWD, BP2, BP1, and BP0 bit values can
be changed) if the WRITE ENABLE command has set the WEL bit.
2. PAGE PROGRAM, SECTOR ERASE, and BULK ERASE commands are not accepted.
3. PAGE PROGRAM and SECTOR ERASE commands can be accepted.
4. Hardware protection: status register is not writable (SRWD, BP2, BP1, and BP0 bit values
cannot be changed).
5. PAGE PROGRAM, SECTOR ERASE, and BULK ERASE commands are not accepted.
When the SRWD bit of the status register is 0 (its initial delivery state), it is possible to
write to the status register provided that the WEL bit has been set previously by a WRITE
ENABLE command, regardless of whether the W#/V PP signal is driven HIGH or LOW.
When the status register SRWD bit is set to 1, two cases need to be considered depending on the state of the W#/V PP signal:
• If the W#/V PP signal is driven HIGH, it is possible to write to the status register provided that the WEL bit has been set previously by a WRITE ENABLE command.
• If the W#/V PP signal is driven LOW, it is not possible to write to the status register even
if the WEL bit has been set previously by a WRITE ENABLE command. Therefore, attempts to write to the status register are rejected, and are not accepted for execution.
The result is that all the data bytes in the memory area that have been put in SPM by
the status register block protect bits (BP2, BP1, BP0) are also hardware protected
against data modification.
Regardless of the order of the two events, the HPM can be entered in either of the following ways:
• Setting the status register SRWD bit after driving the W#/V PP signal LOW
• Driving the W#/V PP signal LOW after setting the status register SRWD bit.
The only way to exit the HPM is to pull the W#/V PP signal HIGH. If the W#/V PP signal is
permanently tied HIGH, the HPM can never be activated. In this case, only the SPM is
available, using the status register block protect bits (BP2, BP1, BP0).
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M25P128 Serial Flash Embedded Memory
READ DATA BYTES
READ DATA BYTES
The device is first selected by driving chip select (S#) LOW. The command code for
READ DATA BYTES is followed by a 3-byte address (A23-A0), each bit being latched-in
during the rising edge of serial clock (C). Then the memory contents at that address is
shifted out on serial data output (DQ1), each bit being shifted out at a maximum frequency fR during the falling edge of C.
The first byte addressed can be at any location. The address is automatically incremented to the next higher address after each byte of data is shifted out. Therefore, the entire
memory can be read with a single READ DATA BYTES command. When the highest address is reached, the address counter rolls over to 000000h, allowing the read sequence
to be continued indefinitely.
The READ DATA BYTES command is terminated by driving S# HIGH. S# can be driven
HIGH at any time during data output. Any READ DATA BYTES command issued while
an ERASE, PROGRAM, or WRITE cycle is in progress is rejected without any effect on
the cycle that is in progress.
Figure 14: READ DATA BYTES Command Sequence
0
7
8
Cx
C
LSB
MSB
DQ1
A[MIN]
Command
DQ[0]
A[MAX]
DOUT
High-Z
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
LSB
DOUT
DOUT
MSB
Don’t Care
Note:
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1. Cx = 7 + (A[MAX] + 1).
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M25P128 Serial Flash Embedded Memory
READ DATA BYTES at HIGHER SPEED
READ DATA BYTES at HIGHER SPEED
The device is first selected by driving chip select (S#) LOW. The command code for the
READ DATA BYTES at HIGHER SPEED command is followed by a 3-byte address (A23A0) and a dummy byte, each bit being latched-in during the rising edge of serial clock
(C). Then the memory contents at that address are shifted out on serial data output
(DQ1) at a maximum frequency fC, during the falling edge of C.
The first byte addressed can be at any location. The address is automatically incremented to the next higher address after each byte of data is shifted out. Therefore, the entire
memory can be read with a single READ DATA BYTES at HIGHER SPEED command.
When the highest address is reached, the address counter rolls over to 000000h, allowing the read sequence to be continued indefinitely.
The READ DATA BYTES at HIGHER SPEED command is terminated by driving S# HIGH.
S# can be driven HIGH at any time during data output. Any READ DATA BYTES at
HIGHER SPEED command issued while an ERASE, PROGRAM, or WRITE cycle is in
progress is rejected without any effect on the cycle that is in progress.
Figure 15: READ DATA BYTES at HIGHER SPEED Command Sequence
0
7
8
Cx
C
LSB
A[MIN]
Command
DQ0
MSB
DQ1
A[MAX]
DOUT
High-Z
DOUT
DOUT
DOUT
DOUT
DOUT
DOUT
LSB
DOUT
DOUT
MSB
Dummy cycles
Note:
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Don’t Care
1. Cx = 7 + (A[MAX] + 1).
25
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M25P128 Serial Flash Embedded Memory
PAGE PROGRAM
PAGE PROGRAM
The PAGE PROGRAM command allows bytes in the memory to be programmed, which
means the bits are changed from 1 to 0. Before a PAGE PROGRAM command can be accepted a WRITE ENABLE command must be executed. After the WRITE ENABLE command has been decoded, the device sets the write enable latch (WEL) bit.
The PAGE PROGRAM command is entered by driving chip select (S#) LOW, followed by
the command code, three address bytes, and at least one data byte on serial data input
(DQ0).
If the eight least significant address bits (A7-A0) are not all zero, all transmitted data that
goes beyond the end of the current page are programmed from the start address of the
same page; that is, from the address whose eight least significant bits (A7-A0) are all
zero. S# must be driven LOW for the entire duration of the sequence.
If more than 256 bytes are sent to the device, previously latched data are discarded and
the last 256 data bytes are guaranteed to be programmed correctly within the same
page. If less than 256 data bytes are sent to device, they are correctly programmed at the
requested addresses without any effects on the other bytes of the same page.
For optimized timings, it is recommended to use the PAGE PROGRAM command to
program all consecutive targeted bytes in a single sequence rather than to use several
PAGE PROGRAM sequences, each containing only a few bytes.
S# must be driven HIGH after the eighth bit of the last data byte has been latched in.
Otherwise the PAGE PROGRAM command is not executed.
As soon as S# is driven HIGH, the self-timed PAGE PROGRAM cycle is initiated; the cycles's duration is tPP. While the PAGE PROGRAM cycle is in progress, the status register
may be read to check the value of the write in progress (WIP) bit. The WIP bit is 1 during
the self-timed PAGE PROGRAM cycle, and 0 when the cycle is completed. At some unspecified time before the cycle is completed, the write enable latch (WEL) bit is reset.
A PAGE PROGRAM command is not executed if it applies to a page protected by the
block protect bits BP2, BP1, and BP0.
Figure 16: PAGE PROGRAM Command Sequence
0
7
8
Cx
C
LSB
A[MIN]
LSB
DIN
Command
DQ[0]
MSB
A[MAX]
Note:
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DIN
DIN
DIN
DIN
DIN
DIN
DIN
DIN
MSB
1. Cx = 7 + (A[MAX] + 1).
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M25P128 Serial Flash Embedded Memory
SECTOR ERASE
SECTOR ERASE
The SECTOR ERASE command sets to 1 (FFh) all bits inside the chosen sector. Before
the SECTOR ERASE command can be accepted, a WRITE ENABLE command must have
been executed previously. After the WRITE ENABLE command has been decoded, the
device sets the write enable latch (WEL) bit.
The SECTOR ERASE command is entered by driving chip select (S#) LOW, followed by
the command code, and three address bytes on serial data input (DQ0). Any address inside the sector is a valid address for the SECTOR ERASE command. S# must be driven
LOW for the entire duration of the sequence.
S# must be driven HIGH after the eighth bit of the last address byte has been latched in.
Otherwise the SECTOR ERASE command is not executed. As soon as S# is driven HIGH,
the self-timed SECTOR ERASE cycle is initiated; the cycle's duration is tSE. While the
SECTOR ERASE cycle is in progress, the status register may be read to check the value of
the write in progress (WIP) bit. The WIP bit is 1 during the self-timed SECTOR ERASE
cycle, and is 0 when the cycle is completed. At some unspecified time before the cycle is
completed, the WEL bit is reset.
A SECTOR ERASE command is not executed if it applies to a sector that is hardware or
software protected.
Figure 17: SECTOR ERASE Command Sequence
0
7
8
Cx
C
LSB
DQ0
MSB
Note:
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A[MIN]
Command
A[MAX]
1. Cx = 7 + (A[MAX] + 1).
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M25P128 Serial Flash Embedded Memory
BULK ERASE
BULK ERASE
The BULK ERASE command sets all bits to 1 (FFh). Before the BULK ERASE command
can be accepted, a WRITE ENABLE command must have been executed previously. After the WRITE ENABLE command has been decoded, the device sets the write enable
latch (WEL) bit.
The BULK ERASE command is entered by driving chip select (S#) LOW, followed by the
command code on serial data input (DQ0). S# must be driven LOW for the entire duration of the sequence.
S# must be driven HIGH after the eighth bit of the command code has been latched in.
Otherwise the BULK ERASE command is not executed. As soon as S# is driven HIGH,
the self-timed BULK ERASE cycle is initiated; the cycle's duration is tBE. While the BULK
ERASE cycle is in progress, the status register may be read to check the value of the write
In progress (WIP) bit. The WIP bit is 1 during the self-timed BULK ERASE cycle, and is 0
when the cycle is completed. At some unspecified time before the cycle is completed,
the WEL bit is reset.
The BULK ERASE command is executed only if all block protect (BP2, BP1, BP0) bits are
0. The BULK ERASE command is ignored if one or more sectors are protected.
Figure 18: BULK ERASE Command Sequence
0
7
C
LSB
Command
DQ0
MSB
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M25P128 Serial Flash Embedded Memory
Power-Up/Down and Supply Line Decoupling
Power-Up/Down and Supply Line Decoupling
At power-up and power-down, the device must not be selected; that is, chip select (S#)
must follow the voltage applied on V CC until V CC reaches the correct value:
• VCC,min at power-up, and then for a further delay of tVSL
• VSS at power-down
A safe configuration is provided in the SPI Modes section.
To avoid data corruption and inadvertent WRITE operations during power-up, a poweron-reset (POR) circuit is included. The logic inside the device is held reset while V CC is
less than the POR threshold voltage, V WI – all operations are disabled, and the device
does not respond to any instruction. Moreover, the device ignores the following instructions until a time delay of tPUW has elapsed after the moment that V CC rises above the
VWI threshold:
•
•
•
•
•
WRITE ENABLE
PAGE PROGRAM
SECTOR ERASE
BULK ERASE
WRITE STATUS REGISTER
However, the correct operation of the device is not guaranteed if, by this time, V CC is still
below V CC.min. No WRITE STATUS REGISTER, PROGRAM, or ERASE instruction should
be sent until:
• tPUW after V CC has passed the V WI threshold
• tVSL after V CC has passed the V CC,min level
If the time, tVSL, has elapsed, after V CC rises above V CC,min, the device can be selected
for READ instructions even if the tPUW delay has not yet fully elapsed.
VPPH must be applied only when V CC is stable and in the V CC,min to V CC,max voltage
range.
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M25P128 Serial Flash Embedded Memory
Power-Up Timing and Write Inhibit Voltage Threshold Specifications
Figure 19: Power-Up Timing
VCC
VCC,max
PROGRAM, ERASE, and WRITE commands are rejected by the device
Chip selection not allowed
VCC,min
t
RESET state
of the
device
VSL
READ access allowed
Device fully
accessible
VWI
t
PUW
Time
After power-up, the device is in the following state:
• Standby power mode
• Write enable latch (WEL) bit is reset
Normal precautions must be taken for supply line decoupling to stabilize the V CC supply. Each device in a system should have the V CC line decoupled by a suitable capacitor
close to the package pins; generally, this capacitor is of the order of 0.1µF.
At power-down, when V CC drops from the operating voltage to below the POR threshold
voltage V WI, all operations are disabled and the device does not respond to any instruction.
Note: If power-down occurs while a WRITE, PROGRAM, or ERASE cycle is in progress,
some data corruption may result.
Power-Up Timing and Write Inhibit Voltage Threshold Specifications
Table 7: Power-Up Timing and VWI Threshold
Symbol
tVSL
tPUW
VWI
Parameter
Min
Max
Unit
VCC,min to S# LOW
200
–
μs
Time delay to WRITE instruction
400
–
μs
Write Inhibit voltage
1.5
2.5
V
Note:
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1. Parameters are characterized only.
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M25P128 Serial Flash Embedded Memory
Initial Delivery Status
Initial Delivery Status
The device is delivered as the following:
• Memory array erased: all bits are set to 1 (each byte contains FFh)
• Status register contains 00h (all status register bits are 0)
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M25P128 Serial Flash Embedded Memory
Maximum Ratings and Operating Conditions
Maximum Ratings and Operating Conditions
Note: Stressing the device beyond the absolute maximum ratings may cause permanent
damage to the device. These are stress ratings only and operation of the device beyond
any specification or condition in the operating sections of this datasheet is not recommended. Exposure to absolute maximum rating conditions for extended periods may
affect device reliability.
Table 8: Absolute Maximum Ratings
Symbol
Parameter
Min
Max
Units
TSTG
Storage temperature
–65
150
°C
VIO
Input and output voltage (with respect to
ground)
–0.5
VCC + 0.6
V
VCC
Supply voltage
–0.2
4.0
V
VPP
FAST PROGRAM and ERASE voltage
–0.2
10.0
V
VESD
Electrostatic discharge voltage (Human Body
model)
–2000
2000
V
Notes:
Notes
1
2
1. The minimum voltage may reach the value of –2V for no more than 20ns during transitions; the maximum may reach the value of VCC + 2V for no more than 20ns during transitions.
2. The VESD signal: JEDEC Std JESD22-A114A (C1 = 100pF, R1 = 1500Ω, R2 = 500Ω).
Table 9: Operating Conditions
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply voltage
2.7
–
3.6
V
VPPH
Supply voltage on W#/VPP pin for FAST PROGRAM and ERASE
8.5
–
9.5
V
Ambient operating temperature
–40
85
°C
Ambient operating temperature for FAST
PROGRAM and ERASE
15
25
35
°C
TA
TAVPP
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M25P128 Serial Flash Embedded Memory
Electrical Characteristics
Electrical Characteristics
Table 10: DC Current Specifications
Note 1 applies to the entire table.
Symbol Parameter
Test Conditions
Min
Max
Units
ILI
Input leakage current
–
–
±2
µA
ILO
Output leakage current
–
–
±2
µA
ICC1
Standby current
S# = VCC, VIN = VSS or VCC
–
100
µA
ICC3
Operating current (READ)
C = 0.1 VCC/0.9 VCC at 50 MHz,
DQ1 = Open
–
6
mA
C = 0.1 VCC/0.9 VCC at 20 MHz,
DQ1 = Open
–
4
mA
Notes
ICC4
Operating current
(PAGE PROGRAM)
S# = VCC
–
20
mA
ICC5
Operating current
(WRITE STATUS REGISTER)
S# = VCC
–
20
mA
ICC6
Operating current
(SECTOR ERASE)
S# = VCC
–
20
mA
ICC7
Operating current
(BULK ERASE)
S# = VCC
–
20
mA
ICCPP
Operating current
(FAST PROGRAM/ERASE)
S# = VCC, Vpp = VPPH
–
20
mA
1
IPP
VPP operating current
(FAST PROGRAM/ERASE)
S# = VCC, Vpp = VPPH
–
20
mA
1
Note:
1. Characterized only.
Table 11: DC Voltage Specifications
Symbol
Parameter
Test Conditions
Min
Max
Units
VIL
Input LOW voltage
–
–0.5
0.3 VCC
V
VIH
Input HIGH voltage
–
0.7 VCC
VCC + 0.2
V
VOL
Output LOW voltage
IOL = 1.6mA
–
0.4
V
VOH
Output HIGH voltage
IOH = –100µA
VCC – 0.2
–
V
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
33
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M25P128 Serial Flash Embedded Memory
AC Characteristics
AC Characteristics
In the following AC specifications, output High-Z is defined as the point where data out
is no longer driven.
Table 12: AC Measurement Conditions
Symbol
CL
Parameter
Min
Max
Unit
30
30
pF
–
5
ns
Input pulse voltages
0.2 VCC
0.8 VCC
V
Input timing reference voltages
0.3 VCC
0.7 VCC
V
VCC/2
VCC/2
V
Load capacitance
Input rise and fall times
Output timing reference voltages
Figure 20: AC Measurement I/O Waveform
Input levels
Input and output
timing reference levels
0.8VCC
0.7VCC
0.5VCC
0.2VCC
0.3VCC
Table 13: Capacitance
Symbol Parameter
COUT
CIN
Output capacitance (DQ1)
Input capacitance (other pins)
Note:
CCMTD-1718347970-10412
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Test condition
Min
Max
Unit
Notes
VOUT = 0 V
–
8
pF
1
VIN = 0 V
–
6
pF
1. Values are sampled only, not 100% tested, at TA = 25°C and a frequency of 20 MHz.
34
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M25P128 Serial Flash Embedded Memory
AC Characteristics
Table 14: AC Specifications
Symbol
Alt.
Parameter
Min
Typ
Max
Unit
Notes
fC
fC
Clock frequency for all commands (except READ)
D.C.
–
54
MHz
1
fR
–
Clock frequency for READ command
D.C.
–
33
MHz
1
tCH
tCLH
Clock HIGH time
9
–
–
ns
2
tCL
tCLL
Clock LOW time
9
–
–
ns
2
tCLCH
–
Clock rise time (peak to peak)
0.1
–
–
V/ns
3, 4
Clock fall time (peak to peak)
3, 4
tCHCL
–
tSLCH
tCSS
tCHSL
0.1
–
–
V/ns
S# active setup time (relative to C)
4
–
–
ns
S# not active hold time (relative to C)
4
–
–
ns
tDVCH
tDSU
Data In setup time
2
–
–
ns
tCHDX
tDH
Data In hold time
3
–
–
ns
tCHSH
–
S# active hold time (relative to C)
4
–
–
ns
tSHCH
–
S# not active setup time (relative to C)
4
–
–
ns
tSHSL
tCSH
S# deselect time
50
–
–
ns
tSHQZ
tDIS
Output disable time
–
–
8
ns
tCLQV
tV
Clock LOW to output valid
–
–
8
ns
tCLQX
tHO
Output hold time
1
–
–
ns
tHLCH
–
HOLD# setup time (relative to C)
4
–
–
ns
tCHHH
–
HOLD# hold time (relative to C)
4
–
–
ns
tHHCH
–
HOLD# setup time (relative to C)
4
–
–
ns
tCHHL
–
HOLD# hold time (relative to C)
4
–
–
ns
tHHQX
tLZ
HOLD# to output Low-Z
–
–
8
ns
3
tHLQZ
tHZ
HOLD# to output High-Z
–
–
8
ns
3
tWHSL
–
Write protect setup time
20
–
–
ns
5
tSHWL
–
Write protect hold time
100
–
–
ns
5
tVPPHSL
–
Enhanced program supply voltage HIGH to chip select
LOW
200
–
–
ns
6
Notes:
CCMTD-1718347970-10412
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3
D.C. stands for direct current. (fC = 0)
The tCH and tCL signal values must be greater than or equal to 1/fC.
Signal values are guaranteed by characterization, not 100% tested in production.
Signal clock rise and fall time values are expressed as a slew rate.
Signal values are only applicable as a constraint for a WRITE STATUS REGISTER command
when SRWD bit is set at 1.
6. VPPH should be kept at a valid level until the PROGRAM or ERASE operation has completed and its result (success or failure) is known.
1.
2.
3.
4.
5.
35
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M25P128 Serial Flash Embedded Memory
AC Characteristics
Table 15: AC Specifications, Command Times
Symbol
tW
Parameter
Min
Typ
Max
Units
1.3
15
ms
Notes
WRITE STATUS REGISTER cycle time
–
tPP
PAGE PROGRAM cycle time (256 bytes)
–
0.5
5
ms
1
tPP
PAGE PROGRAM cycle time (n bytes)
–
int (n/8) x
0.015
5
ms
1, 2
tPP
PAGE PROGRAM cycle time (VPP = VPPH,
256 bytes)
–
0.4
5
ms
1, 3
tSE
SECTOR ERASE cycle time
–
1.6
3 (after 10K
ERASE cycles)
5 (after 50K
ERASE cycles)
6 (after 100K
ERASE cycles)
s
tSE
SECTOR ERASE cycle time (VPP = VPPH)
–
1.6
3 (after 10K
ERASE cycles)
5 (after 50K
ERASE cycles)
6 (after 100K
ERASE cycles)
s
tBE
BULK ERASE cycle time
–
130
250
s
tBE
BULK ERASE cycle time (VPP = VPPH)
–
130
250
s
Notes:
1. When using the PAGE PROGRAM command to program consecutive bytes, optimized
timings are obtained in one sequence that includes all the bytes rather than in several
sequences of only a few bytes (1 < n < 256).
2. int(A) corresponds to the upper integer part of A. For example, int(12/8) = 2 and
int(32/8) = 4.
3. Signal values are guaranteed by characterization, not 100% tested in production.
Figure 21: Serial Input Timing
tSHSL
S#
tCHSL
tSLCH
tCHSH
tSHCH
C
tDVCH
tCHCL
tCHDX
DQ0
DQ1
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tCLCH
LSB IN
MSB IN
high impedance
36
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© 2016 Micron Technology, Inc. All rights reserved.
M25P128 Serial Flash Embedded Memory
AC Characteristics
Figure 22: Write Protect Setup and Hold during WRSR when SRWD = 1 Timing
W#/VPP
tSHWL
tWHSL
S#
C
DQ0
high impedance
DQ1
Figure 23: Hold Timing
S#
tHLCH
tHHCH
tCHHL
C
tCHHH
tHLQZ
tHHQX
DQ1
DQ0
HOLD#
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
37
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
M25P128 Serial Flash Embedded Memory
AC Characteristics
Figure 24: Output Timing
S#
tCH
C
tCLQV
tCLQV
tCLQX
tCL
tSHQZ
tCLQX
LSB OUT
DQ1
tQLQH
tQHQL
DQ0
ADDRESS
LSB IN
Figure 25: VPPH Timing
end of command
(identified by WIP polling)
S#
C
DQ0
VPPH
VPP
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
tVPPHSL
38
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© 2016 Micron Technology, Inc. All rights reserved.
M25P128 Serial Flash Embedded Memory
Package Information
Package Information
Figure 26: VFDFPN8 (MLP8) 8mm x 6mm – Package Code: ME
4.80 TYP
aaa C
6.00 TYP
Pin 1 ID R 0.20
(NE - 1) × 1.27 TYP
B
aaa C
Pin 1 ID
Ø0.3
0.50 -0.05
+0.10
8
1
7
2
6
3
5
4
5.16 TYP
0.2
MIN
1.27
TYP
+0.08
0.40 -0.05
eee M C A B
fff M C
8.00 TYP
A
bbb C
ddd C
0.85 TYP/
1 MAX
0.05 MAX
Note:
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
1. Drawing is not to scale.
39
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
M25P128 Serial Flash Embedded Memory
Package Information
Figure 27: SO16W 300 mils Body Width – Package Code: MF
10.30 ±0.20
16
h x 45°
9
0.23 MIN/
0.32 MAX
10.00 MIN/
10.65 MAX
7.50 ±0.10
1
8
0° MIN/8° MAX
2.5 ±0.15
0.1 Z
0.33 MIN/
0.51 MAX
1.27 TYP
Note:
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
0.20 ±0.1
0.40 MIN/
1.27 MAX
Z
1. h = 0.25mm MIN, 0.75mm MAX
40
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© 2016 Micron Technology, Inc. All rights reserved.
M25P128 Serial Flash Embedded Memory
Device Ordering Information
Device Ordering Information
Standard Parts
For further information on line items not listed here or on any aspect of this device,
contact your nearest representative.
Table 16: Part Number Information Scheme
Part Number
Category
Category Details
Device type
M25P = Serial Flash memory for code storage
Density
128 = 128Mb (16Mb x 8)
Operating voltage
V = VCC = 2.7V to 3.6V
Package
ME = VFDFPN8 8mm x 6mm (MLP8)
MF = SO16W (300 mils width)
Device grade
6 = Industrial temperature range: –40°C to 85°C. Device tested with standard test flow.
Packing option
– = Standard packing
T = Tape and reel packing
Plating technology
P or G = RoHS-compliant
Lithography
B = 65nm SLC
Note:
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
1. The category of second Level Interconnect is marked on the package and on the inner
box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to
soldering conditions are also marked on the inner box label.
41
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
M25P128 Serial Flash Embedded Memory
Revision History
Revision History
Rev. A – 11/16
• Initial Micron rebrand.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-4000
www.micron.com/products/support Sales inquiries: 800-932-4992
Micron and the Micron logo are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization sometimes occur.
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
42
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
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