M45PE40-VMP6G

M45PE40 4-Mbit, page-erasable serial flash memory with byte-alterability and a 75 MHz SPI bus interface Features ■ SPI bus compatible serial interface ■ 75 MHz clock rate (maximum) ■ 2.7 V to 3.6 V single supply voltage ■ 4-Mbit page-erasable flash memory ■ Page size: 256 bytes: – Page write in 11 ms (typical) – Page program in 0.8 ms (typical) – Page erase in 10 ms (typical) ■ Sector erase (64 Kbytes) ■ Hardware write protection of the bottom sector (64 Kbytes) ■ Electronic signature – JEDEC standard two-byte signature (4013h) – Unique ID code (UID) with 16 bytes readonly, available upon customer request only in the T9HX process ■ Deep power-down mode 1 µA (typical) ■ More than 100 000 write cycles ■ More than 20 years data retention ■ Packages – ECOPACK® (RoHS compliant) May 2008 VFQFPN8 (MP) 6 × 5 mm (MLP8) SO8W (MW) 208 mils width SO8N (MN) 150 mils width Rev 9 1/49 www.numonyx.com 1 Contents M45PE40 Contents 1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 2 Signal descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.1 Serial data output (Q) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.2 Serial data input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.3 Serial Clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.4 Chip Select (S) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.5 Reset (Reset) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.6 Write Protect (W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.7 VCC supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.8 VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 3 SPI modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 4 Operating features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.1 Sharing the overhead of modifying data . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.2 An easy way to modify data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.3 A fast way to modify data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.4 Polling during a write, program or erase cycle . . . . . . . . . . . . . . . . . . . . . 13 4.5 Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.6 Active power, standby power and deep power-down modes . . . . . . . . . . 13 4.7 Status register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 4.8 Protection modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 5 Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 6 Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 6.1 Write Enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.2 Write disable (WRDI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.3 Read identification (RDID) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 6.4 Read status register (RDSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 6.4.1 2/49 WIP bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 M45PE40 Contents 6.4.2 WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 6.5 Read data bytes (READ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 6.6 Read data bytes at higher speed (FAST_READ) . . . . . . . . . . . . . . . . . . . 23 6.7 Page write (PW) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 6.8 Page program (PP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 6.9 Page erase (PE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 6.10 Sector erase (SE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 6.11 Deep power-down (DP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 6.12 Release from deep power-down (RDP) . . . . . . . . . . . . . . . . . . . . . . . . . . 31 7 Power-up and power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 8 Initial delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 9 Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 10 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 11 Package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 12 Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 13 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 3/49 List of tables M45PE40 List of tables Table 1. Table 2. Table 3. Table 4. Table 5. Table 6. Table 7. Table 8. Table 9. Table 10. Table 11. Table 12. Table 13. Table 14. Table 15. Table 16. Table 17. Table 18. Table 19. Table 20. Table 21. 4/49 Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Instruction set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Read identification (RDID) data-out sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Status register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Power-up timing and VWI threshold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 AC measurement conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 DC characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 AC characteristics (25 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 AC characteristics (33 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 AC characteristics (50 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 AC characteristics (75 MHz operation, T9HX (0.11 µm) process) . . . . . . . . . . . . . . . . . . . 40 Reset conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 VFQFPN8 (MLP8) 8-lead very thin dual flat package no lead, 6 × 5 mm, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 SO8 wide – 8 lead plastic small outline, 208 mils body width, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45 SO8N – 8 lead plastic small outline, 150 mils body width, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 M45PE40 List of figures List of figures Figure 1. Figure 2. Figure 3. Figure 4. Figure 5. Figure 6. Figure 7. Figure 8. Figure 9. Figure 10. Figure 11. Figure 12. Figure 13. Figure 14. Figure 15. Figure 16. Figure 17. Figure 18. Figure 19. Figure 20. Figure 21. Figure 22. Figure 23. Figure 24. Figure 25. Figure 26. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 VFQFPN and SO connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Bus master and memory devices on the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 SPI modes supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Write enable (WREN) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Write disable (WRDI) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Read identification (RDID) instruction sequence and data-out sequence . . . . . . . . . . . . . 20 Read status register (RDSR) instruction sequence and data-out sequence . . . . . . . . . . . 21 Read data bytes (READ) instruction sequence and data-out sequence . . . . . . . . . . . . . . 22 Read data bytes at higher speed (FAST_READ) instruction sequence and data-out sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Page write (PW) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Page program (PP) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 Page erase (PE) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 Sector erase (SE) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 Deep power-down (DP) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Release from deep power-down (RDP) instruction sequence . . . . . . . . . . . . . . . . . . . . . . 31 Power-up timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 AC measurement I/O waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 Serial input timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Write protect setup and hold timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Output timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Reset AC waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 VFQFPN8 (MLP8) 8-lead very thin dual flat package no lead, 6 × 5 mm, package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 SO8 wide – 8 lead plastic small outline, 208 mils body width, package outline . . . . . . . . . 45 SO8N – 8 lead plastic small outline, 150 mils body width, package outline . . . . . . . . . . . . 46 5/49 Description 1 M45PE40 Description The M45PE40 is a 4-Mbit (512 Kbit x8 bit) serial paged flash memory accessed by a high speed SPI-compatible bus. The memory can be written or programmed 1 to 256 bytes at a time, using the page write or page program instruction. The page write instruction consists of an integrated page erase cycle followed by a page program cycle. The memory is organized as 8 sectors, each containing 256 pages. Each page is 256 bytes wide. Thus, the whole memory can be viewed as consisting of 2048 pages, or 524288 bytes. The memory can be erased a page at a time, using the page erase instruction, or a sector at a time, using the sector erase instruction. Important note This datasheet details the functionality of the M45PE40 devices, based on the previous T7X process or based on the current T9HX process (available since August 2007). Delivery of parts operating with a maximum clock rate of 75 MHz starts from week 8 of 2008. Figure 1. Logic diagram VCC D Q C S M45PE40 W Reset VSS AI04040C 6/49 M45PE40 Description Table 1. Signal names Signal name Function Direction C Serial Clock Input D Serial data input Input Q Serial data output Output S Chip Select Input W Write Protect Input Reset Reset Input VCC Supply voltage VSS Ground Figure 2. VFQFPN and SO connections M45PE40 D C Reset S 1 2 3 4 8 7 6 5 Q VSS VCC W AI04041D 1. There is an exposed central pad on the underside of the VFQFPN package. This is pulled, internally, to VSS, and must not be allowed to be connected to any other voltage or signal line on the PCB. 2. See Section 11: Package mechanical for package dimensions, and how to identify pin-1. 7/49 Signal descriptions 2 Signal descriptions 2.1 Serial data output (Q) M45PE40 This output signal is used to transfer data serially out of the device. Data is shifted out on the falling edge of Serial Clock (C). 2.2 Serial data input (D) This input signal is used to transfer data serially into the device. It receives instructions, addresses, and the data to be programmed. Values are latched on the rising edge of Serial Clock (C). 2.3 Serial Clock (C) This input signal provides the timing of the serial interface. Instructions, addresses, or data present at serial data input (D) are latched on the rising edge of Serial Clock (C). Data on serial data output (Q) changes after the falling edge of Serial Clock (C). 2.4 Chip Select (S) When this input signal is High, the device is deselected and serial data output (Q) is at high impedance. Unless an internal read, program, erase or write cycle is in progress, the device will be in the standby power mode (this is not the deep power-down mode). Driving Chip Select (S) Low selects the device, placing it in the active power mode. After power-up, a falling edge on Chip Select (S) is required prior to the start of any instruction. 2.5 Reset (Reset) The Reset (Reset) input provides a hardware reset for the memory. In this mode, the outputs are high impedance. When Reset (Reset) is driven High, the memory is in the normal operating mode. When Reset (Reset) is driven Low, the memory will enter the reset mode, provided that no internal operation is currently in progress. Driving Reset (Reset) Low while an internal operation is in progress has no effect on that internal operation (a write cycle, program cycle, or erase cycle). 2.6 Write Protect (W) This input signal puts the device in the hardware protected mode, when Write Protect (W) is connected to VSS, causing the first 256 pages of memory to become read-only by protecting them from write, program and erase operations. When Write Protect (W) is connected to VCC, the first 256 pages of memory behave like the other pages of memory. 8/49 M45PE40 2.7 Signal descriptions VCC supply voltage VCC is the supply voltage. 2.8 VSS ground VSS is the reference for the VCC supply voltage. 9/49 SPI modes 3 M45PE40 SPI modes These devices can be driven by a microcontroller with its SPI peripheral running in either of the two following modes: ● CPOL=0, CPHA=0 ● CPOL=1, CPHA=1 For these two modes, input data is latched in on the rising edge of Serial Clock (C), and output data is available from the falling edge of Serial Clock (C). The difference between the two modes, as shown in Figure 4, is the clock polarity when the bus master is in standby mode and not transferring data: ● C remains at 0 for (CPOL=0, CPHA=0) ● C remains at 1 for (CPOL=1, CPHA=1) Figure 3. Bus master and memory devices on the SPI bus VSS VCC R SDO SPI interface with (CPOL, CPHA) = (0, 0) or (1, 1) SDI SCK VCC C Q D VSS SPI bus master SPI memory device R CS3 VCC C Q D R VCC C Q D VSS SPI memory device VSS SPI memory device R CS2 CS1 S W Reset S W Reset S W Reset AI12836c 1. The Write Protect (W) signal should be driven, High or Low as appropriate. Figure 3 shows an example of three devices connected to an MCU, on an SPI bus. Only one device is selected at a time, so only one device drives the serial data output (Q) line at a time, the other devices are high impedance. Resistors R (represented in Figure 3) ensure that the M45PE40 is not selected if the bus master leaves the S line in the high impedance state. As the bus master may enter a state where all inputs/outputs are in high impedance at the same time (for example, when the bus master is reset), the clock line (C) must be connected to an external pull-down resistor so that, when all inputs/outputs become high impedance, the S line is pulled High while the C line is pulled Low (thus ensuring that S and C do not become High at the same time, and so, that the tSHCH requirement is met). The typical value of R is 100 kΩ, assuming that the time constant R*Cp (Cp = parasitic capacitance of the bus line) is shorter than the time during which the bus master leaves the SPI bus in high impedance. 10/49 M45PE40 SPI modes Example: Cp = 50 pF, that is R*Cp = 5 µs the application must ensure that the bus master never leaves the SPI bus in the high impedance state for a time period shorter than 5 µs. Figure 4. SPI modes supported CPOL CPHA 0 0 C 1 1 C D Q MSB MSB AI01438B 11/49 Operating features 4 Operating features 4.1 Sharing the overhead of modifying data M45PE40 To write or program one (or more) data bytes, two instructions are required: write enable (WREN), which is one byte, and a page write (PW) or page program (PP) sequence, which consists of four bytes plus data. This is followed by the internal cycle (of duration tPW or tPP). To share this overhead, the page write (PW) or page program (PP) instruction allows up to 256 bytes to be programmed (changing bits from 1 to 0) or written (changing bits to 0 or 1) at a time, provided that they lie in consecutive addresses on the same page of memory. 4.2 An easy way to modify data The page write (PW) instruction provides a convenient way of modifying data (up to 256 contiguous bytes at a time), and simply requires the start address, and the new data in the instruction sequence. The page write (PW) instruction is entered by driving Chip Select (S) Low, and then transmitting the instruction byte, three address bytes (A23-A0) and at least one data byte, and then driving Chip Select (S) High. While Chip Select (S) is being held Low, the data bytes are written to the data buffer, starting at the address given in the third address byte (A7-A0). When Chip Select (S) is driven High, the write cycle starts. The remaining, unchanged, bytes of the data buffer are automatically loaded with the values of the corresponding bytes of the addressed memory page. The addressed memory page then automatically put into an erase cycle. Finally, the addressed memory page is programmed with the contents of the data buffer. All of this buffer management is handled internally, and is transparent to the user. The user is given the facility of being able to alter the contents of the memory on a byte-by-byte basis. For optimized timings, it is recommended to use the page write (PW) instruction to write all consecutive targeted bytes in a single sequence versus using several page write (PW) sequences with each containing only a few bytes (see Section 6.7: Page write (PW), Table 14: AC characteristics (50 MHz operation), and Table 15: AC characteristics (75 MHz operation, T9HX (0.11 µm) process)). 12/49 M45PE40 4.3 Operating features A fast way to modify data The page program (PP) instruction provides a fast way of modifying data (up to 256 contiguous bytes at a time), provided that it only involves resetting bits to ‘0’ that had previously been set to ‘1’. This might be: ● when the designer is programming the device for the first time ● when the designer knows that the page has already been erased by an earlier page erase (PE) or sector erase (SE) instruction. This is useful, for example, when storing a fast stream of data, having first performed the erase cycle when time was available ● when the designer knows that the only changes involve resetting bits to ‘0’ that are still set to ‘1’. When this method is possible, it has the additional advantage of minimizing the number of unnecessary erase operations, and the extra stress incurred by each page. For optimized timings, it is recommended to use the page program (PP) instruction to program all consecutive targeted bytes in a single sequence versus using several page program (PP) sequences with each containing only a few bytes (see Section 6.8: Page program (PP), Table 14: AC characteristics (50 MHz operation), and Table 15: AC characteristics (75 MHz operation, T9HX (0.11 µm) process)). 4.4 Polling during a write, program or erase cycle A further improvement in the write, program or erase time can be achieved by not waiting for the worst case delay (tPW, tPP, tPE, or tSE). The write in progress (WIP) bit is provided in the status register so that the application program can monitor its value, polling it to establish when the previous cycle is complete. 4.5 Reset An internal power on reset circuit helps protect against inadvertent data writes. Addition protection is provided by driving Reset (Reset) Low during the power-on process, and only driving it High when VCC has reached the correct voltage level, VCC(min). 4.6 Active power, standby power and deep power-down modes When Chip Select (S) is Low, the device is selected, and in the active power mode. When Chip Select (S) is High, the device is deselected, but could remain in the active power mode until all internal cycles have completed (program, erase, write). The device then goes in to the standby power mode. The device consumption drops to ICC1. The deep power-down mode is entered when the specific instruction (the deep power-down (DP) instruction) is executed. The device consumption drops further to ICC2. The device remains in this mode until another specific instruction (the release from deep power-down and read electronic signature (RES) instruction) is executed. All other instructions are ignored while the device is in the deep power-down mode. This can be used as an extra software protection mechanism, when the device is not in active use, to protect the device from inadvertent write, program or erase instructions. 13/49 Operating features 4.7 M45PE40 Status register The status register contains two status bits that can be read by the read status register (RDSR) instruction. See Section 6.4: Read status register (RDSR) for a detailed description of the status register bits. 4.8 Protection modes The environments where non-volatile memory devices are used can be very noisy. No SPI device can operate correctly in the presence of excessive noise. To help combat this, the M45PE40 features the following data protection mechanisms: ● Power on reset and an internal timer (tPUW) can provide protection against inadvertent changes while the power supply is outside the operating specification ● Program, erase and write instructions are checked that they consist of a number of clock pulses that is a multiple of eight, before they are accepted for execution ● All instructions that modify data must be preceded by a write enable (WREN) instruction to set the write enable latch (WEL) bit. This bit is returned to its reset state by the following events: – 14/49 Power-up – Reset (Reset) driven Low – Write disable (WRDI) instruction completion – Page write (PW) instruction completion – Page program (PP) instruction completion – Page erase (PE) instruction completion – Sector erase (SE) instruction completion ● The hardware protected mode is entered when Write Protect (W) is driven Low, causing the first 256 pages of memory to become read-only. When write protect (W) is driven High, the first 256 pages of memory behave like the other pages of memory ● The Reset (Reset) signal can be driven Low to protect the contents of the memory during any critical time, not just during power-up and power-down ● In addition to the low power consumption feature, the deep power-down mode offers extra software protection from inadvertent write, program and erase instructions while the device is not in active use. M45PE40 5 Memory organization Memory organization The memory is organized as: ● 2048 pages (256 bytes each) ● 524288 bytes (8 bits each) ● 8 sectors (512 Kbits, 65536 bytes each). Each page can be individually: ● programmed (bits are programmed from 1 to 0) ● erased (bits are erased from 0 to 1) ● written (bits are changed to either 0 or 1) The device is page or sector erasable (bits are erased from 0 to 1). Table 2. Memory organization Sector Address range 7 70000h 7FFFFh 6 60000h 6FFFFh 5 50000h 5FFFFh 4 40000h 4FFFFh 3 30000h 3FFFFh 2 20000h 2FFFFh 1 10000h 1FFFFh 0 00000h 0FFFFh 15/49 Memory organization Figure 5. M45PE40 Block diagram Reset W High voltage generator Control logic S C D I/O shift register Q Address register and counter Status register 256-byte data buffer Y decoder 7FFFFh 10000h First 256 pages can be made read-only 00000h 000FFh 256 bytes (page size) X decoder AI04042B 16/49 M45PE40 6 Instructions Instructions All instructions, addresses and data are shifted in and out of the device, most significant bit first. Serial data input (D) is sampled on the first rising edge of Serial Clock (C) after Chip Select (S) is driven Low. Then, the one-byte instruction code must be shifted in to the device, most significant bit first, on serial data input (D), each bit being latched on the rising edges of Serial Clock (C). The instruction set is listed in Table 3. Every instruction sequence starts with a one-byte instruction code. Depending on the instruction, this might be followed by address bytes, or by data bytes, or by both or none. In the case of a read data bytes (READ), read data bytes at higher speed (Fast_Read) or read status register (RDSR) instruction, the shifted-in instruction sequence is followed by a data-out sequence. Chip Select (S) can be driven High after any bit of the data-out sequence is being shifted out. In the case of a page write (PW), page program (PP), page erase (PE), sector erase (SE), write enable (WREN), write disable (WRDI), deep power-down (DP) or release from deep power-down (RDP) instruction, Chip Select (S) must be driven High exactly at a byte boundary, otherwise the instruction is rejected, and is not executed. That is, Chip Select (S) must driven High when the number of clock pulses after Chip Select (S) being driven Low is an exact multiple of eight. All attempts to access the memory array during a write cycle, program cycle or erase cycle are ignored, and the internal write cycle, program cycle or erase cycle continues unaffected. Table 3. Instruction Instruction set Description One-byte instruction code Address bytes Dummy bytes Data bytes WREN Write enable 0000 0110 06h 0 0 0 WRDI Write disable 0000 0100 04h 0 0 0 RDID Read identification 1001 1111 9Fh 0 0 1 to 3 RDSR Read status register 0000 0101 05h 0 0 1 to ∞ READ Read data bytes 0000 0011 03h 3 0 1 to ∞ Read data bytes at higher speed 0000 1011 0Bh 3 1 1 to ∞ PW Page write 0000 1010 0Ah 3 0 1 to 256 PP Page program 0000 0010 02h 3 0 1 to 256 PE Page erase 1101 1011 DBh 3 0 0 SE Sector erase 1101 1000 D8h 3 0 0 DP Deep power-down 1011 1001 B9h 0 0 0 RDP Release from deep power-down 1010 1011 ABh 0 0 0 FAST_READ 17/49 Instructions 6.1 M45PE40 Write Enable (WREN) The write enable (WREN) instruction (Figure 6) sets the write enable latch (WEL) bit. The write enable latch (WEL) bit must be set prior to every page write (PW), page program (PP), page erase (PE), and sector erase (SE) instruction. The write enable (WREN) instruction is entered by driving Chip Select (S) Low, sending the instruction code, and then driving Chip Select (S) High. Figure 6. Write enable (WREN) instruction sequence S 0 1 2 3 4 5 6 7 C Instruction D High Impedance Q AI02281E 6.2 Write disable (WRDI) The write disable (WRDI) instruction (Figure 7) resets the write enable latch (WEL) bit. The write disable (WRDI) instruction is entered by driving Chip Select (S) Low, sending the instruction code, and then driving Chip Select (S) High. The write enable latch (WEL) bit is reset under the following conditions: ● Power-up ● Write disable (WRDI) instruction completion ● Page write (PW) instruction completion ● Page program (PP) instruction completion ● Page erase (PE) instruction completion ● Sector erase (SE) instruction completion Figure 7. Write disable (WRDI) instruction sequence S 0 1 2 3 4 5 6 7 C Instruction D High Impedance Q AI03750D 18/49 M45PE40 6.3 Instructions Read identification (RDID) The read identification (RDID) instruction allows to read the device identification data: ● Manufacturer identification (1 byte) ● Device identification (2 bytes) ● A unique ID code (UID) (17 bytes, of which 16 available upon customer request)(a). The manufacturer identification is assigned by JEDEC, and has the value 20h for Numonyx. The device identification is assigned by the device manufacturer, and indicates the memory type in the first byte (40h), and the memory capacity of the device in the second byte (13h). The UID contains the length of the following data in the first byte (set to 10h), and 16 bytes of the optional customized factory data (CFD) content. The CFD bytes are read-only and can be programmed with customers data upon their demand. If the customers do not make requests, the devices are shipped with all the CFD bytes programmed to zero (00h). Any read identification (RDID) instruction while an erase or program cycle is in progress, is not decoded, and has no effect on the cycle that is in progress. The device is first selected by driving Chip Select (S) Low. Then, the 8-bit instruction code for the instruction is shifted in. After this, the 24-bit device identification, stored in the memory, the 8-bit CFD length followed by 16 bytes of CFD content will be shifted out on serial data output (Q). Each bit is shifted out during the falling edge of Serial Clock (C). The instruction sequence is shown in Figure 8. The read identification (RDID) instruction is terminated by driving Chip Select (S) High at any time during data output. When Chip Select (S) is driven High, the device is put in the standby power mode. Once in the standby power mode, the device waits to be selected, so that it can receive, decode and execute instructions. Table 4. Read identification (RDID) data-out sequence UID(1) Device identification Manufacturer identification 20h Memory type Memory capacity CFD length CFD content 40h 13h 10h 16 bytes 1. The unique ID code is available only in the T9HX process (see Important note on page 6). a. The 17 bytes of unique ID code are available only in the T9HX process (see Important note on page 6). 19/49 Instructions Figure 8. M45PE40 Read identification (RDID) instruction sequence and data-out sequence S 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 28 29 30 31 C Instruction D Manufacturer identification UID Device identification High Impedance Q 15 14 13 MSB MSB 3 2 1 0 MSB AI06809c 1. The unique ID code is available only in the T9HX process (see Important note on page 6). 20/49 M45PE40 6.4 Instructions Read status register (RDSR) The read status register (RDSR) instruction allows the status register to be read. The status register may be read at any time, even while a program, erase or write cycle is in progress. When one of these cycles is in progress, it is recommended to check the write in progress (WIP) bit before sending a new instruction to the device. It is also possible to read the status register continuously, as shown in Figure 9. The status bits of the status register are as follows: 6.4.1 WIP bit The write in progress (WIP) bit indicates whether the memory is busy with a write, program or erase cycle. When set to ‘1’, such a cycle is in progress, when reset to ‘0’ no such cycle is in progress. 6.4.2 WEL bit The write enable latch (WEL) bit indicates the status of the internal write enable latch. When set to ‘1’ the internal write enable latch is set, when set to ‘0’ the internal write enable latch is reset and no write, program or erase instruction is accepted. Table 5. Status register format b7 b0 0 0 0 0 0 (1) 0 WIP(1) WEL 1. WEL and WIP are volatile read-only bits (WEL is set and reset by specific instructions; WIP is automatically set and reset by the internal logic of the device). Figure 9. Read status register (RDSR) instruction sequence and data-out sequence S 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 C Instruction D Status register out Status register out High Impedance Q 7 MSB 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 MSB AI02031E 21/49 Instructions 6.5 M45PE40 Read data bytes (READ) The device is first selected by driving Chip Select (S) Low. The instruction code for the read data bytes (READ) instruction is followed by a 3-byte address (A23-A0), each bit being latched-in during the rising edge of Serial Clock (C). Then the memory contents, at that address, is shifted out on serial data output (Q), each bit being shifted out, at a maximum frequency fR, during the falling edge of Serial Clock (C). The instruction sequence is shown in Figure 10. The first byte addressed can be at any location. The address is automatically incremented to the next higher address after each byte of data is shifted out. The whole memory can, therefore, be read with a single read data bytes (READ) instruction. When the highest address is reached, the address counter rolls over to 000000h, allowing the read sequence to be continued indefinitely. The read data bytes (READ) instruction is terminated by driving Chip Select (S) High. Chip Select (S) can be driven High at any time during data output. Any read data bytes (READ) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. Figure 10. Read data bytes (READ) instruction sequence and data-out sequence S 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39 C Instruction 24-bit address 23 22 21 D 3 2 1 0 MSB Data out 1 High Impedance Q 7 6 5 4 3 Data out 2 2 1 0 7 MSB AI03748D 1. Address bits A23 to A19 are don’t care. 22/49 M45PE40 6.6 Instructions Read data bytes at higher speed (FAST_READ) The device is first selected by driving Chip Select (S) Low. The instruction code for the read data bytes at higher speed (FAST_READ) instruction is followed by a 3-byte address (A23A0) and a dummy byte, each bit being latched-in during the rising edge of Serial Clock (C). Then the memory contents, at that address, is shifted out on serial data output (Q), each bit being shifted out, at a maximum frequency fC, during the falling edge of Serial Clock (C). The instruction sequence is shown in Figure 11. The first byte addressed can be at any location. The address is automatically incremented to the next higher address after each byte of data is shifted out. The whole memory can, therefore, be read with a single read data bytes at higher speed (FAST_READ) instruction. When the highest address is reached, the address counter rolls over to 000000h, allowing the read sequence to be continued indefinitely. The read data bytes at higher speed (FAST_READ) instruction is terminated by driving Chip Select (S) High. Chip Select (S) can be driven High at any time during data output. Any read data bytes at higher speed (FAST_READ) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. Figure 11. Read data bytes at higher speed (FAST_READ) instruction sequence and data-out sequence S 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 C Instruction 24-bit address 23 22 21 D 3 2 1 0 High Impedance Q S 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 C Dummy byte D 7 6 5 4 3 2 1 0 DATA OUT 2 DATA OUT 1 Q 7 MSB 6 5 4 3 2 1 0 7 MSB 6 5 4 3 2 1 0 7 MSB AI04006 1. Address bits A23 to A19 are don’t care. 23/49 Instructions 6.7 M45PE40 Page write (PW) The page write (PW) instruction allows bytes to be written in the memory. Before it can be accepted, a write enable (WREN) instruction must previously have been executed. After the write enable (WREN) instruction has been decoded, the device sets the write enable latch (WEL). The page write (PW) instruction is entered by driving Chip Select (S) Low, followed by the instruction code, three address bytes and at least one data byte on serial data input (D). The rest of the page remains unchanged if no power failure occurs during this write cycle. The page write (PW) instruction performs a page erase cycle even if only one byte is updated. If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data exceeding the addressed page boundary wrap round, and are written from the start address of the same page (the one whose 8 least significant address bits (A7-A0) are all zero). Chip Select (S) must be driven Low for the entire duration of the sequence. The instruction sequence is shown in Figure 12. If more than 256 bytes are sent to the device, previously latched data are discarded and the last 256 data bytes are guaranteed to be written correctly within the same page. If less than 256 data bytes are sent to device, they are correctly written at the requested addresses without having any effects on the other bytes of the same page. For optimized timings, it is recommended to use the page write (PW) instruction to write all consecutive targeted bytes in a single sequence versus using several page write (PW) sequences with each containing only a few bytes (see Table 14: AC characteristics (50 MHz operation) and Table 15: AC characteristics (75 MHz operation, T9HX (0.11 µm) process)). Chip Select (S) must be driven High after the eighth bit of the last data byte has been latched in, otherwise the page write (PW) instruction is not executed. As soon as Chip Select (S) is driven High, the self-timed page write cycle (whose duration is tPW) is initiated. While the page write cycle is in progress, the status register may be read to check the value of the write in progress (WIP) bit. The write in progress (WIP) bit is 1 during the self-timed page write cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the write enable latch (WEL) bit is reset. A page write (PW) instruction applied to a page that is hardware protected is not executed. Any page write (PW) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. 24/49 M45PE40 Instructions Figure 12. Page write (PW) instruction sequence S 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39 C Instruction 24-bit address 23 22 21 D Data byte 1 3 2 1 0 7 6 5 4 3 2 1 0 MSB MSB S 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 C Data byte 2 D Data byte 3 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 MSB MSB Data byte n 7 6 5 4 3 2 1 0 MSB AI04045 1. Address bits A23 to A19 are don’t care. 2. 1 ≤ n ≤ 256. 25/49 Instructions 6.8 M45PE40 Page program (PP) The page program (PP) instruction allows bytes to be programmed in the memory (changing bits from 1 to 0, only). Before it can be accepted, a write enable (WREN) instruction must previously have been executed. After the write enable (WREN) instruction has been decoded, the device sets the write enable latch (WEL). The page program (PP) instruction is entered by driving Chip Select (S) Low, followed by the instruction code, three address bytes and at least one data byte on serial data input (D). If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data exceeding the addressed page boundary wrap round, and are programmed from the start address of the same page (the one whose 8 least significant address bits (A7-A0) are all zero). Chip Select (S) must be driven Low for the entire duration of the sequence. The instruction sequence is shown in Figure 13. If more than 256 bytes are sent to the device, previously latched data are discarded and the last 256 data bytes are guaranteed to be programmed correctly within the same page. If less than 256 data bytes are sent to device, they are correctly programmed at the requested addresses without having any effects on the other bytes of the same page. For optimized timings, it is recommended to use the page program (PP) instruction to program all consecutive targeted bytes in a single sequence versus using several page program (PP) sequences with each containing only a few bytes (see Table 14: AC characteristics (50 MHz operation) and Table 15: AC characteristics (75 MHz operation, T9HX (0.11 µm) process)). Chip Select (S) must be driven High after the eighth bit of the last data byte has been latched in, otherwise the page program (PP) instruction is not executed. As soon as Chip Select (S) is driven High, the self-timed page program cycle (whose duration is tPP) is initiated. While the page program cycle is in progress, the status register may be read to check the value of the write in progress (WIP) bit. The write in progress (WIP) bit is 1 during the self-timed page program cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the write enable latch (WEL) bit is reset. A page program (PP) instruction applied to a page that is hardware protected is not executed. Any page program (PP) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. 26/49 M45PE40 Instructions Figure 13. Page program (PP) instruction sequence S 0 1 2 3 4 5 6 7 8 9 10 28 29 30 31 32 33 34 35 36 37 38 39 C Instruction 24-bit address 23 22 21 D Data byte 1 3 2 1 0 7 6 5 4 3 2 1 0 MSB MSB S 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 C Data byte 2 D Data byte 3 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 MSB MSB Data byte n 7 6 5 4 3 2 1 0 MSB AI04044 1. Address bits A23 to A19 are don’t care. 2. 1 ≤ n ≤ 256. 27/49 Instructions 6.9 M45PE40 Page erase (PE) The page erase (PE) instruction sets to ‘1’ (FFh) all bits inside the chosen page. Before it can be accepted, a write enable (WREN) instruction must previously have been executed. After the write enable (WREN) instruction has been decoded, the device sets the write enable latch (WEL). The page erase (PE) instruction is entered by driving Chip Select (S) Low, followed by the instruction code, and three address bytes on serial data input (D). Any address inside the page is a valid address for the page erase (PE) instruction. Chip Select (S) must be driven Low for the entire duration of the sequence. The instruction sequence is shown in Figure 14. Chip Select (S) must be driven High after the eighth bit of the last address byte has been latched in, otherwise the page erase (PE) instruction is not executed. As soon as Chip Select (S) is driven High, the self-timed page erase cycle (whose duration is tPE) is initiated. While the page erase cycle is in progress, the status register may be read to check the value of the write in progress (WIP) bit. The write in progress (WIP) bit is 1 during the self-timed page erase cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the write enable latch (WEL) bit is reset. A page erase (PE) instruction applied to a page that is hardware protected is not executed. Any page erase (PE) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. Figure 14. Page erase (PE) instruction sequence S 0 1 2 3 4 5 6 7 8 9 29 30 31 C Instruction D 24-bit address 23 22 2 1 0 MSB AI04046 1. Address bits A23 to A19 are don’t care. 28/49 M45PE40 6.10 Instructions Sector erase (SE) The sector erase (SE) instruction sets to ‘1’ (FFh) all bits inside the chosen sector. Before it can be accepted, a write enable (WREN) instruction must previously have been executed. After the write enable (WREN) instruction has been decoded, the device sets the write enable latch (WEL). The sector erase (SE) instruction is entered by driving Chip Select (S) Low, followed by the instruction code, and three address bytes on serial data input (D). Any address inside the sector (see Table 2) is a valid address for the sector erase (SE) instruction. Chip Select (S) must be driven Low for the entire duration of the sequence. The instruction sequence is shown in Figure 15. Chip Select (S) must be driven High after the eighth bit of the last address byte has been latched in, otherwise the sector erase (SE) instruction is not executed. As soon as Chip Select (S) is driven High, the self-timed sector erase cycle (whose duration is tSE) is initiated. While the sector erase cycle is in progress, the status register may be read to check the value of the write in progress (WIP) bit. The write in progress (WIP) bit is 1 during the self-timed sector erase cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the write enable latch (WEL) bit is reset. A sector erase (SE) instruction applied to a sector that contains a page that is hardware protected is not executed. Any sector erase (SE) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. Figure 15. Sector erase (SE) instruction sequence S 0 1 2 3 4 5 6 7 8 9 29 30 31 C Instruction D 24-bit address 23 22 2 1 0 MSB AI03751D 1. Address bits A23 to A19 are don’t care. 29/49 Instructions 6.11 M45PE40 Deep power-down (DP) Executing the deep power-down (DP) instruction is the only way to put the device in the lowest consumption mode (the deep power-down mode). It can also be used as an extra software protection mechanism, while the device is not in active use, since in this mode, the device ignores all write, program and erase instructions. Driving Chip Select (S) High deselects the device, and puts the device in the standby power mode (if there is no internal cycle currently in progress). But this mode is not the deep power-down mode. The deep power-down mode can only be entered by executing the deep power-down (DP) instruction, to reduce the standby current (from ICC1 to ICC2, as specified in Table 11). Once the device has entered the deep power-down mode, all instructions are ignored except the release from deep power-down (RDP) instruction. This releases the device from this mode. The deep power-down mode automatically stops at power-down, and the device always powers-up in the standby power mode. The deep power-down (DP) instruction is entered by driving Chip Select (S) Low, followed by the instruction code on serial data input (D). Chip Select (S) must be driven Low for the entire duration of the sequence. The instruction sequence is shown in Figure 16. Chip Select (S) must be driven High after the eighth bit of the instruction code has been latched in, otherwise the deep power-down (DP) instruction is not executed. As soon as Chip Select (S) is driven High, it requires a delay of tDP before the supply current is reduced to ICC2 and the deep power-down mode is entered. Any deep power-down (DP) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. Figure 16. Deep power-down (DP) instruction sequence S 0 1 2 3 4 5 6 7 tDP C Instruction D Standby mode Deep power-down mode AI03753D 30/49 M45PE40 6.12 Instructions Release from deep power-down (RDP) Once the device has entered the deep power-down mode, all instructions are ignored except the release from deep power-down (RDP) instruction. Executing this instruction takes the device out of the deep power-down mode. The release from deep power-down (RDP) instruction is entered by driving Chip Select (S) Low, followed by the instruction code on serial data input (D). Chip Select (S) must be driven Low for the entire duration of the sequence. The instruction sequence is shown in Figure 17. The release from deep power-down (RDP) instruction is terminated by driving Chip Select (S) High. Sending additional clock cycles on Serial Clock (C), while Chip Select (S) is driven Low, cause the instruction to be rejected, and not executed. After Chip Select (S) has been driven High, followed by a delay, tRDP, the device is put in the standby power mode. Chip Select (S) must remain High at least until this period is over. The device waits to be selected, so that it can receive, decode and execute instructions. Any release from deep power-down (RDP) instruction, while an erase, program or write cycle is in progress, is rejected without having any effects on the cycle that is in progress. Figure 17. Release from deep power-down (RDP) instruction sequence S 0 1 2 3 4 5 6 7 tRDP C Instruction D High Impedance Q Deep power-down mode Standby mode AI06807 31/49 Power-up and power-down 7 M45PE40 Power-up and power-down At power-up and power-down, the device must not be selected (that is Chip Select (S) must follow the voltage applied on VCC) until VCC reaches the correct value: ● VCC(min) at power-up, and then for a further delay of tVSL ● VSS at power-down A safe configuration is provided in Section 3: SPI modes. To avoid data corruption and inadvertent write operations during power up, a power on reset (POR) circuit is included. The logic inside the device is held reset while VCC is less than the power on reset (POR) threshold voltage, VWI – all operations are disabled, and the device does not respond to any instruction. Moreover, the device ignores all write enable (WREN), page write (PW), page program (PP), page erase (PE) and sector erase (SE) instructions until a time delay of tPUW has elapsed after the moment that VCC rises above the VWI threshold. However, the correct operation of the device is not guaranteed if, by this time, VCC is still below VCC(min). No write, program or erase instructions should be sent until the later of: ● tPUW after VCC passed the VWI threshold ● tVSL after VCC passed the VCC(min) level These values are specified in Table 6. If the delay, tVSL, has elapsed, after VCC has risen above VCC(min), the device can be selected for read instructions even if the tPUW delay is not yet fully elapsed. As an extra protection, the Reset (Reset) signal can be driven Low for the whole duration of the power-up and power-down phases. At power-up, the device is in the following state: ● The device is in the standby power mode (not the deep power-down mode). ● The write enable latch (WEL) bit is reset. ● The write in progress (WIP) bit is reset. Normal precautions must be taken for supply rail decoupling, to stabilize the VCC supply. Each device in a system should have the VCC rail decoupled by a suitable capacitor close to the package pins (generally, this capacitor is of the order of 100 nF). At power-down, when VCC drops from the operating voltage, to below the power on reset (POR) threshold voltage, VWI, all operations are disabled and the device does not respond to any instruction (the designer needs to be aware that if a power-down occurs while a write, program or erase cycle is in progress, some data corruption can result). 32/49 M45PE40 Power-up and power-down Figure 18. Power-up timing VCC VCC(max) Program, erase and write commands are rejected by the device Chip selection not allowed VCC(min) tVSL Reset state of the device Read access allowed Device fully accessible VWI tPUW time AI04009C Table 6. Power-up timing and VWI threshold Symbol Parameter Min Max Unit tVSL(1) VCC(min) to S low 30 tPUW(1) Time delay before the first write, program or erase instruction 1 10 ms 1.5 2.5 V VWI (1) Write inhibit voltage µs 1. These parameters are characterized only, over the temperature range –40 °C to +85 °C. 33/49 Initial delivery state 8 M45PE40 Initial delivery state The device is delivered with the memory array erased: all bits are set to ‘1’ (each byte contains FFh). All usable status register bits are 0. 9 Maximum ratings Stressing the device outside the ratings listed in Table 7: Absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and operation of the device at these, or any other conditions outside those indicated in the operating sections of this specification, is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 7. Absolute maximum ratings Symbol Parameter TSTG Storage temperature TLEAD Lead temperature during soldering VIO Input and output voltage (with respect to ground) VCC Supply voltage VESD Electrostatic discharge voltage (human body model) Min Max Unit –65 150 °C See note (1) (2) °C –0.6 VCC + 0.6 V –0.6 4.0 V –2000 2000 V 1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly), the Numonyx ECOPACK® 7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS) 2002/95/EU. 2. JEDEC Std JESD22-A114A (C1 = 100 pF, R1 = 1500 Ω, R2 = 500 Ω). 34/49 M45PE40 10 DC and AC parameters DC and AC parameters This section summarizes the operating and measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and AC characteristics tables that follow are derived from tests performed under the measurement conditions summarized in the relevant tables. Designers should check that the operating conditions in their circuit match the measurement conditions when relying on the quoted parameters. Table 8. Operating conditions Symbol VCC TA Table 9. Symbol CL Parameter Min Max Unit Supply voltage 2.7 3.6 V Ambient operating temperature –40 85 °C Max Unit AC measurement conditions Parameter Min Load capacitance 30 Input rise and fall times pF 5 ns Input pulse voltages 0.2VCC to 0.8VCC V Input and output timing reference voltages 0.3VCC to 0.7VCC V 1. Output Hi-Z is defined as the point where data out is no longer driven. Figure 19. AC measurement I/O waveform Input levels Input and output timing reference levels 0.8VCC 0.7VCC 0.3VCC 0.2VCC AI00825B Table 10. Symbol COUT CIN Capacitance(1) Parameter Output capacitance (Q) Input capacitance (other pins) Test condition Min Max Unit VOUT = 0 V 8 pF VIN = 0 V 6 pF 1. Sampled only, not 100% tested, at TA = 25 °C and a frequency of 33 MHz. 35/49 DC and AC parameters Table 11. Symbol DC characteristics Parameter Test condition (in addition to those in Table 8) Min Max Unit ILI Input leakage current ±2 µA ILO Output leakage current ±2 µA ICC1 Standby current (standby and reset modes) S = VCC, VIN = VSS or VCC 50 µA ICC2 Deep power-down current S = VCC, VIN = VSS or VCC 10 µA C = 0.1VCC / 0.9.VCC at 33 MHz, Q = open 6 ICC3 36/49 M45PE40 Operating current (FAST_READ) mA C = 0.1VCC / 0.9.VCC at 75 MHz, Q = open 12 ICC4 Operating current (PW) S = VCC 15 mA ICC5 Operating current (SE) S = VCC 15 mA VIL Input low voltage – 0.5 0.3VCC V VIH Input high voltage 0.7VCC VCC+0.4 V VOL Output low voltage IOL = 1.6 mA 0.4 V VOH Output high voltage IOH = –100 µA VCC–0.2 V M45PE40 DC and AC parameters Table 12. AC characteristics (25 MHz operation) Test conditions specified in Table 8 and Table 9 Symbol fC Alt Parameter Min fC Clock frequency for the following instructions: FAST_READ, PW, PP, PE, SE, DP, RDP, WREN, WRDI, RDSR, RDID Clock frequency for read instructions fR Typ Max Unit D.C. 25 MHz D.C. 20 MHz tCH(1) tCLH Clock High time 18 ns tCL(1) tCLL Clock Low time 18 ns 0.03 V/ns S active setup time (relative to C) 10 ns S not active hold time (relative to C) 10 ns Clock slew rate tSLCH tCSS tCHSL (2) (peak to peak) tDVCH tDSU Data in setup time 5 ns tCHDX tDH Data in hold time 5 ns tCHSH S active hold time (relative to C) 10 ns tSHCH S not active setup time (relative to C) 10 ns 200 ns tSHSL tCSH S deselect time tSHQZ(2) tDIS Output disable time 15 ns tCLQV tV Clock Low to Output Valid 15 ns tCLQX tHO Output hold time 0 ns tWHSL Write protect setup time 50 ns tSHWL Write protect hold time 100 ns tDP(2) S to deep power-down 3 µs tRDP(2) S High to standby power mode 30 µs 25 ms 0.4+ n*0.8/256 5 ms Page write cycle time (256 bytes) tPW(3) Page write cycle time (n bytes) Page program cycle time (256 bytes) tPP(3) Page program cycle time (n bytes) 11 10.2+ n*0.8/256 1.2 tPE Page erase cycle time 10 20 ms tSE Sector erase cycle time 1 5 s 1. tCH + tCL must be greater than or equal to 1/ fC(max). 2. Value guaranteed by characterization, not 100% tested in production. 3. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one sequence including all the bytes versus several sequences of only a few bytes (1 ≤ n ≤ 256). 37/49 DC and AC parameters Table 13. M45PE40 AC characteristics (33 MHz operation) 33 MHz only available for products marked since week 40 of 2005(1) Test conditions specified in Table 8 and Table 9 Symbol fC Alt Parameter Min fC Clock frequency for the following instructions: FAST_READ, PW, PP, PE, SE, DP, RDP, WREN, WRDI, RDSR, RDID Clock frequency for read instructions fR Typ Max Unit D.C. 33 MHz D.C. 20 MHz tCH(2) tCLH Clock High time 13 ns tCL(2) tCLL Clock Low time 13 ns 0.03 V/ns S active setup time (relative to C) 10 ns S not active hold time (relative to C) 10 ns (3) Clock slew rate tSLCH tCSS tCHSL (peak to peak) tDVCH tDSU Data in setup time 3 ns tCHDX tDH Data in hold time 5 ns tCHSH S active hold time (relative to C) 5 ns tSHCH S not active setup time (relative to C) 5 ns 200 ns tSHSL tCSH S deselect time tSHQZ(3) tDIS Output disable time 12 ns tCLQV tV Clock Low to Output Valid 12 ns tCLQX tHO Output hold time 0 ns tTHSL Top Sector Lock setup time 50 ns tSHTL Top Sector Lock hold time 100 ns tDP (3) tRDP(3) S to deep power-down 3 µs S High to standby power mode 30 µs 25 ms 0.4+ n*0.8/256 5 ms Page write cycle time (256 bytes) tPW(4) Page write cycle time (n bytes) 11 10.2+ n*0.8/256 Page program cycle time (256 bytes) tPP(4) Page program cycle time (n bytes) 1.2 tPE Page erase cycle time 10 20 ms tSE Sector erase cycle time 1 5 s 1. Details of how to find the date of marking are given in application note, AN1995. 2. tCH + tCL must be greater than or equal to 1/ fC. 3. Value guaranteed by characterization, not 100% tested in production. 4. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one sequence including all the bytes versus several sequences of only a few bytes (1 ≤ n ≤ 256). 38/49 M45PE40 Table 14. DC and AC parameters AC characteristics (50 MHz operation)(1) 50 MHz preliminary data for T9HX technology(2) Test conditions specified in Table 8 and Table 9 Symbol Alt fC fC fR tCH(3) tCL(3) Parameter Typ Max Unit Clock frequency for the following instructions: FAST_READ, PW, PP, PE, SE, DP, RDP, WREN, WRDI, RDSR, RDID D.C. 50 MHz Clock frequency for read instructions D.C. 33 MHz tCLH Clock High time 9 ns tCLL Clock Low time 9 ns 0.1 V/ns S active setup time (relative to C) 5 ns S not active hold time (relative to C) 5 ns (4) Clock slew rate tSLCH Min tCSS tCHSL (peak to peak) tDVCH tDSU Data in setup time 2 ns tCHDX tDH Data in hold time 5 ns tCHSH S active hold time (relative to C) 5 ns tSHCH S not active setup time (relative to C) 5 ns 100 ns tSHSL tCSH S deselect time tSHQZ(4) tDIS Output disable time 8 ns tCLQV tV Clock Low to Output Valid 8 ns tCLQX tHO Output hold time 0 ns tWHSL Write protect setup time 50 ns tSHWL Write protect hold time 100 ns tDP(4) tRDP(4) tRLRH(4) S to deep power-down 3 µs S High to standby mode 30 µs tRST Reset pulse width 10 µs tRHSL tREC Reset recovery time 3 µs tSHRH Chip should have been deselected before Reset is de-asserted 10 ns tPW(5) Page write cycle time (256 bytes) 11 23 ms Page program cycle time (256 bytes) 0.8 3 ms tPP(5) Page program cycle time (n bytes) int(n/8) × 0.025 tPE Page erase cycle time 10 20 ms tSE Sector erase cycle time 1 5 s 1. Preliminary data. 2. Delivery of parts in T9HX process started from July 2007. 3. tCH + tCL must be greater than or equal to 1/ fC. 4. Value guaranteed by characterization, not 100% tested in production. 5. n = number of bytes to program. int(A) corresponds to the upper integer part of A. Examples: int(1/8) = 1, int(16/8) = 2, int(17/8) = 3. 39/49 DC and AC parameters Table 15. M45PE40 AC characteristics (75 MHz operation, T9HX (0.11 µm) process(1))(2) Test conditions specified in Table 8 and Table 9 Symbol Alt Parameter Min fC fC Clock frequency for the following instructions: FAST_READ, PW, PP, PE, SE, DP, RDP, WREN, WRDI, RDSR, RDID Clock frequency for read instructions fR Typ Max Unit D.C. 75 MHz D.C. 33 MHz tCH(3) tCLH Clock High time 6 ns tCL(3) tCLL Clock Low time 6 ns 0.1 V/ns S active setup time (relative to C) 5 ns S not active hold time (relative to C) 5 ns Clock slew tSLCH tCSS tCHSL rate(4) (peak to peak) tDVCH tDSU Data in setup time 2 ns tCHDX tDH Data in hold time 5 ns tCHSH S active hold time (relative to C) 5 ns tSHCH S not active setup time (relative to C) 5 ns 100 ns tSHSL tCSH S deselect time tSHQZ(4) tDIS Output disable time 8 ns tCLQV tV Clock Low to Output valid 8 ns tCLQX tHO Output hold time 0 ns tWHSL (5) Write protect setup time 20 ns tSHWL (5) Write protect hold time 100 ns tDP (4) tRDP(4) tW tPW(6) tPP(6) S to deep power-down 3 µs S High to standby mode 30 µs Write status register cycle time 3 15 ms Page write cycle time (256 bytes) 11 23 ms Page program cycle time (256 bytes) 0.8 3 ms Page program cycle time (n bytes) int(n/8) × 0.025(7) tPE Page erase cycle time 10 20 ms tSE Sector erase cycle time 1.5 5 s tSSE Subsector erase cycle time 80 150 ms 1. See Important note on page 6. 2. Details of how to find the technology process in the marking are given in AN1995, see also Section 12: Ordering information. 3. tCH + tCL must be greater than or equal to 1/ fC. 4. Value guaranteed by characterization, not 100% tested in production. 5. Only applicable as a constraint for a WRSR instruction when SRWD is set to ‘1’. 6. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one sequence including all the bytes versus several sequences of only a few bytes (1 ≤ n ≤ 256). 7. int(A) corresponds to the upper integer part of A. For instance, int(12/8) = 2, int(32/8) = 4 int(15.3) =16. 40/49 M45PE40 DC and AC parameters Figure 20. Serial input timing tSHSL S tCHSL tSLCH tCHSH tSHCH C tDVCH tCHCL tCHDX tCLCH LSB IN MSB IN D High Impedance Q AI01447C Figure 21. Write protect setup and hold timing W tSHWL tWHSL S C D High Impedance Q AI07439 Figure 22. Output timing S tCH C tCLQV tCLQX tCLQV tCL tSHQZ tCLQX LSB OUT Q tQLQH tQHQL D ADDR.LSB IN AI01449e 41/49 DC and AC parameters Table 16. M45PE40 Reset conditions Test conditions specified in Table 8 and Table 9 Symbol Alt tRLRH(1) tRST tSHRH Parameter Conditions Min Typ Max Unit Reset pulse width 10 µs Chip should have been Chip Select High to deselected before Reset is Reset High de-asserted 10 ns 1. Value guaranteed by characterization, not 100% tested in production. Figure 23. Reset AC waveforms S tSHRH Reset tRHSL tRLRH AI06808 42/49 M45PE40 Package mechanical In order to meet environmental requirements, Numonyx offers these devices in ECOPACK® packages. ECOPACK® packages are lead-free. The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. Figure 24. VFQFPN8 (MLP8) 8-lead very thin dual flat package no lead, 6 × 5 mm, package outline A D aaa C A R1 D1 E1 E2 e bbb E M C A B B 2x b 0.10 C B aaa C B 11 Package mechanical 0.10 C A D2 θ L A2 ddd A A1 A3 C 70-ME 1. Drawing is not to scale. 43/49 Package mechanical Table 17. M45PE40 VFQFPN8 (MLP8) 8-lead very thin dual flat package no lead, 6 × 5 mm, package mechanical data millimeters inches Symbol A Typ Min Max Typ Min Max 0.85 0.80 1.00 0.033 0.031 0.039 0.00 0.05 0.000 0.002 0.014 0.020 0.126 0.142 A1 44/49 A2 0.65 0.026 A3 0.20 0.007 b 0.40 D 6.00 0.236 D1 5.75 0.226 D2 3.40 E 5.00 0.197 E1 4.75 0.187 E2 4.00 3.80 4.30 0.157 0.150 0.169 e 1.27 – – 0.050 – – R1 0.10 0.00 0.004 0.000 L 0.60 0.50 0.024 0.020 0.35 3.20 0.48 3.60 0.75 0.016 0.134 0.029 Θ 12° 12° aaa 0.15 0.006 bbb 0.10 0.004 ddd 0.05 0.002 M45PE40 Package mechanical Figure 25. SO8 wide – 8 lead plastic small outline, 208 mils body width, package outline A2 A c b CP e D N E E1 1 A1 k L 6L_ME 1. Drawing is not to scale. Table 18. SO8 wide – 8 lead plastic small outline, 208 mils body width, package mechanical data millimeters inches Symbol Typ Min A Max Typ Min 2.50 Max 0.098 A1 0.00 0.25 0.000 0.010 A2 1.51 2.00 0.059 0.079 b 0.40 0.35 0.51 0.016 0.014 0.020 c 0.20 0.10 0.35 0.008 0.004 0.014 CP 0.10 0.004 D 6.05 0.238 E 5.02 6.22 0.198 0.245 E1 7.62 8.89 0.300 0.350 – – – – k 0° 10° 0° 10° L 0.50 0.80 0.020 0.031 N 8 e 1.27 0.050 8 45/49 Package mechanical M45PE40 Figure 26. SO8N – 8 lead plastic small outline, 150 mils body width, package outline h x 45˚ A2 A c ccc b e 0.25 mm GAUGE PLANE D k 8 E1 E 1 A1 L L1 SO-A 1. Drawing is not to scale. Table 19. SO8N – 8 lead plastic small outline, 150 mils body width, package mechanical data millimeters inches Symbol Typ Min A Typ Min 1.75 Max 0.069 A1 0.10 A2 1.25 b 0.28 0.48 0.011 0.019 c 0.17 0.23 0.007 0.009 ccc 0.25 0.004 0.010 0.049 0.10 0.004 D 4.90 4.80 5.00 0.193 0.189 0.197 E 6.00 5.80 6.20 0.236 0.228 0.244 E1 3.90 3.80 4.00 0.154 0.150 0.157 e 1.27 – – 0.050 – – h 0.25 0.50 0.010 0.020 k 0° 8° 0° 8° L 0.40 1.27 0.016 0.050 L1 46/49 Max 1.04 0.041 M45PE40 12 Ordering information Ordering information Table 20. Ordering information scheme Example: M45PE40 – V MP 6 T G Device type M45PE = page-erasable serial flash memory Device function 40 = 4-Mbit (512 Kbits ×8) Operating voltage V = VCC = 2.7 V to 3.6 V Package MW = SO8W (208 mils width) MN = SO8N (150 mils width)(1) MP = VFQFPN8 6 × 5 mm (MLP8) Device grade 6 = Industrial temperature range, –40 to 85 °C. Device tested with standard test flow Option blank = standard packing T = tape and reel packing Plating technology P or G = ECOPACK® (RoHS compliant) 1. Package available only in T9HX technology. Note: For a list of available options (speed, package, etc.), for further information on any aspect of this device, or when ordering parts operating at 75 MHz (0.11 µm technology, process digit ‘4’), please contact your nearest Numonyx sales office. 47/49 Revision history 13 M45PE40 Revision history Table 21. Document revision history Date Version 04-Dec-2003 1.2 23-Jan-2004 2 SO16 pin-out corrected. 31-Mar-2004 3 Soldering temperature information clarified for RoHS compliant devices. Device grade information clarified. 05-Aug-2004 4 Device grade information further clarified. 5 Document status promoted from preliminary data to datasheet. Minor text changes. Notes 1 and 2 removed from Table 20: Ordering information scheme. SO16 package removed and SO8 wide package added. 6 Added Table 13: AC characteristics (33 MHz operation). An easy way to modify data, A fast way to modify data, Page write (PW) and Page program (PP) sections updated to explain optimal use of page write and page program instructions. Updated ICC3 values in Table 11: DC characteristics. Updated Table 20: Ordering information scheme. ECOPACK® information added. 18-Jan-2007 7 50 MHz frequency added. VCC supply voltage and VSS ground descriptions added. Figure 3: Bus master and memory devices on the SPI bus updated and explanatory paragraph added. At power-up The write in progress (WIP) bit is reset. VIO max modified in Table 7: Absolute maximum ratings. tRLRH, tRHSL and tSHSR removed from Table 12: AC characteristics (25 MHz operation) and Table 16: Reset conditions added. SO8N package added, SO8W and VFQFPN package specifications updated (see Section 11: Package mechanical). Blank option removed below Plating technology in Table 20: Ordering information scheme. 10-Dec-2007 8 Applied Numonyx branding. 9 Removed ‘low voltage’ from the title. Updated the value for the maximum clock frequency (from 50 to 75 MHz) throughout the document. Added: Table 15: AC characteristics (75 MHz operation, T9HX (0.11 µm) process) and ECOPACK® text in Section 11: Package mechanical. Modified: Table 11: DC characteristics, Figure 3: Bus master and memory devices on the SPI bus, and Section 6.3: Read identification (RDID). 11-Jan-2005 4-Oct-2005 14-May-2008 48/49 Changes Initial release. M45PE40 Please Read Carefully: INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH NUMONYX™ PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN NUMONYX'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, NUMONYX ASSUMES NO LIABILITY WHATSOEVER, AND NUMONYX DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF NUMONYX PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. Numonyx products are not intended for use in medical, life saving, life sustaining, critical control or safety systems, or in nuclear facility applications. Numonyx may make changes to specifications and product descriptions at any time, without notice. Numonyx, B.V. may have patents or pending patent applications, trademarks, copyrights, or other intellectual property rights that relate to the presented subject matter. The furnishing of documents and other materials and information does not provide any license, express or implied, by estoppel or otherwise, to any such patents, trademarks, copyrights, or other intellectual property rights. Designers must not rely on the absence or characteristics of any features or instructions marked “reserved” or “undefined.” Numonyx reserves these for future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them. Contact your local Numonyx sales office or your distributor to obtain the latest specifications and before placing your product order. Copies of documents which have an order number and are referenced in this document, or other Numonyx literature may be obtained by visiting Numonyx's website at http://www.numonyx.com. Numonyx StrataFlash is a trademark or registered trademark of Numonyx or its subsidiaries in the United States and other countries. *Other names and brands may be claimed as the property of others. Copyright © 11/5/7, Numonyx, B.V., All Rights Reserved. 49/49