Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Features
NAND Flash Memory
Serial Peripheral Interface (SPI)
MT29F1G01ABAFDSF, MT29F1G01ABAFD12, MT29F1G01ABAFDWB
Features
• Device initialization
– Automatic device initialization after power-up
• Security
– Blocks 7:0 are valid when shipped from factory with
ECC enabled
– Software write protection with lock register
– Hardware write protection to freeze BP bits
– Lock tight to freeze BP bits during one power cycle
• Permanent block lock protection
– OTP Space: 10 pages one-time programmable
NAND Flash memory area
• Operating voltage range
– VCC = 2.7–3.6V
• Operating temperature
– Industrial: –40°C to +85°C
• Quality and reliability
– Data retention: JESD47H-compliant; see qualification report
– Additional: Uncycled data retention: 10 years 24/7
@85°C
– Endurance: 100,000 PROGRAM/ERASE cycles
• Package
– 6-pin SOP, 300 mils
– 8-pin U-PDFN, 8mm x 6mm x 0.65mm (MLP8)
– 24-ball T-PBGA, 05/6mm x 8mm (5 x 5 array)
• Single-level cell (SLC) technology
• 1Gb density
• Organization
– Page size x1: 2176 bytes (2048 + 128 bytes)
– Block size: 64 pages (128K + 8K bytes)
– Plane size: 1Gb (1 plane, 1024 blocks per plane)
• Standard and extended SPI-compatible serial bus interface
– Instruction, address on 1 pin; data out on 1, 2, or 4
pins
– Instruction on 1 pin; address, data out on 2 or 4 pins
– Instruction, address on 1 pin; data in on 1 or 4 pins
• User-selectable internal ECC supported
– 8 bits/sector
• Array performance
– 133 MHz clock frequency (MAX)
– Page read: 25µs (MAX) with on-die ECC disabled;
70µs (MAX) with on-die ECC enabled
– Page program: 200µs (TYP) with on-die ECC disabled; 220µs (TYP) with on-die ECC enabled
– Block erase: 2ms (TYP)
• Advanced features
– Read page cache mode
– Read unique ID
– Read parameter page
CCMTD-816717818-10392
m78a_1gb_3v_nand_spi.pdf Rev. H 02/22
1
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2022 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Features
Part Numbering Information
Micron NAND Flash devices are available in different configurations and densities. Verify valid part
numbers by using Micron’s part catalog search at www.micron.com. To compare features and specifications by device type, visit www.micron.com/products. Contact the factory for devices not found.
Figure 1: Part Number Chart
MT 29F 2G 01
A
B
A
G
D
12
IT
ES
:F
Micron Technology
Design Revision (shrink)
Product Family
Production Status
29F = NAND Flash memory
Blank = Production
ES = Engineering sample
Density
Special Options
xG = xGb
Blank
Device Width
Operating Temperature Range
x = x bits
IT = Industrial (–40°C to +85°C)
AAT = Automotive (–40°C to +105°C)
Level
A = SLC
Speed Grade
Blank if no speed grade is defined
Classification
B = Discrete, 1 chip select
Package Code
Operating Voltage Range
SF = 16-pin SOP (300 mils)
WB = 8-pin U-PDFN (8mm x 6mm x 0.65mm)
12 = 24-ball T-PBGA (6mm x 8mm)
A = 3.3V (2.7–3.6V)
B = 1.8V (1.7–1.95V)
Interface
Generation Feature Set
CCMTD-816717818-10392
m78a_1gb_3v_nand_spi.pdf Rev. H 02/22
D = SPI
2
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2022 Micron Technology, Inc. All rights reserved.
Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Contents
Important Notes and Warnings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Pin Assignments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Pin Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Memory Mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Array Organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Bus Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
SPI Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
SPI Protocols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
SPI NAND Command Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
RESET Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
WRITE Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
WRITE ENABLE (06h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
WRITE DISABLE (04h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
READ Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
PAGE READ (13h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
READ FROM CACHE x1 (03h or 0Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
READ FROM CACHE x2 (3Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
READ FROM CACHE x4 (6Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
READ FROM CACHE Dual I/O (BBh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
READ FROM CACHE Quad I/O (EBh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
READ PAGE CACHE RANDOM (30h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
READ PAGE CACHE LAST (3Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
READ ID (9Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Parameter Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Parameter Page Data Structure Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Unique ID Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Program Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
PAGE PROGRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
PROGRAM LOAD x1 (02h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
PROGRAM EXECUTE (10h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
RANDOM DATA PROGRAM x1 (84h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
PROGRAM LOAD x4 (32h) and PROGRAM LOAD RANDOM DATA x4 (34h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
INTERNAL DATA MOVE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Block Erase Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Features Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
GET FEATURE (0Fh) and SET FEATURE (1Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Feature Settings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Security – Volatile Block Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Security – Block Protection Bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Security – Hardware Write Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Security – Device Lock Tight . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Permanent Block Lock Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
PROTECTION Command (2Ch) Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Permanent Block Lock Protection Disable Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Security – One Time Programmable (OTP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Enable OTP Access . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
OTP Configuration States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
OTP Protection and Program Prevention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Exit OTP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
CCMTD-816717818-10392
m78a_1gb_3v_nand_spi.pdf Rev. H 02/22
3
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2022 Micron Technology, Inc. All rights reserved.
Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
ECC Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Error Management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
SPI NOR Read Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Power-Up and Power-Down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Package Dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Package Dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Package Dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. H – 02/22 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. G – 11/16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. F – 10/16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. E – 06/16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. D – 05/16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. C – 01/16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. B – 09/15 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Rev. A – 06/15 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
CCMTD-816717818-10392
m78a_1gb_3v_nand_spi.pdf Rev. H 02/22
4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2022 Micron Technology, Inc. All rights reserved.
Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
List of Figures
Figure 1: Part Number Chart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Figure 2: Functional Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Figure 3: 8-Pin, U-PDFN (Top View). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Figure 4: 16-Pin, SOP2 (Top View). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Figure 5: 24-Ball T-PBGA, 5 x 5 (Balls Down) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Figure 6: Memory Map. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Figure 7: Array Organization. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Figure 8: SPI Modes Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Figure 9: RESET (FFh) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Figure 10: WRITE ENABLE (06h) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 11: WRITE DISABLE (04h) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 12: PAGE READ (13h) Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Figure 13: READ FROM CACHE (03h or 0Bh) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Figure 14: READ FROM CACHE x2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Figure 15: READ FROM CACHE x4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Figure 16: READ FROM CACHE Dual I/O . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Figure 17: READ FROM CACHE Quad I/O. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Figure 18: READ PAGE CACHE RANDOM Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Figure 19: READ ID (9Fh) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Figure 20: PROGRAM LOAD (02h) Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Figure 21: PROGRAM EXECUTE (10h) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Figure 22: PROGRAM LOAD RANDOM DATA (84h) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Figure 23: PROGRAM LOAD x4 (32h) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Figure 24: BLOCK ERASE (D8h) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Figure 25: GET FEATURE (0Fh) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 26: SET FEATURE (1Fh) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 27: PROTECT Command Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Figure 28: Read from Cache (03h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Figure 29: Fast Read from Cache (0Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Figure 30: SPI Power-Up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Figure 31: Automatic Device Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
Figure 32: AC Measurement I/O Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Figure 33: WP# Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Figure 34: Serial Input Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 35: Serial Output Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 36: 16-pin SOP (300 mils body width) – Package Code: SF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Figure 37: 8-pin U-PDFN (MLP8) 8mm x 6mm x 0.65mm – Package Code: WB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Figure 38: 24-Pin T-PBGA (5 x 5 Ball Grid Array) 6mm x 8mm – Package Code: 12 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
CCMTD-816717818-10392
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2022 Micron Technology, Inc. All rights reserved.
Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
List of Tables
Table 1: SPI Pin Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Table 2: SPI NAND Command Set. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Table 3: READ ID Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Table 4: Parameter Table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Table 5: Feature Address Settings and Data Bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Table 6: Block Lock Register Block Protection Bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 7: Configuration Registers for Security . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Table 8: Status Register Bit Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Table 9: ECC Status Register Bit Descriptions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 10: ECC Protection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 11: Error Management Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Table 12: Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 13: Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 14: AC Measurement Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 15: Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 16: DC Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Table 17: AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Table 18: PROGRAM/READ/ERASE Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
CCMTD-816717818-10392
m78a_1gb_3v_nand_spi.pdf Rev. H 02/22
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2022 Micron Technology, Inc. All rights reserved.
Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Important Notes and Warnings
Important Notes and Warnings
Micron Technology, Inc. ("Micron") reserves the right to make changes to information published in this document,
including without limitation specifications and product descriptions. This document supersedes and replaces all
information supplied prior to the publication hereof. You may not rely on any information set forth in this document
if you obtain the product described herein from any unauthorized distributor or other source not authorized by
Micron.
Automotive Applications. Products are not designed or intended for use in automotive applications unless specifically designated by Micron as automotive-grade by their respective data sheets. Distributor and customer/distributor shall assume the sole risk and liability for and shall indemnify and hold Micron harmless against all claims,
costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of
product liability, personal injury, death, or property damage resulting directly or indirectly from any use of
non-automotive-grade products in automotive applications. Customer/distributor shall ensure that the terms and
conditions of sale between customer/distributor and any customer of distributor/customer (1) state that Micron
products are not designed or intended for use in automotive applications unless specifically designated by Micron
as automotive-grade by their respective data sheets and (2) require such customer of distributor/customer to
indemnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys'
fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage
resulting from any use of non-automotive-grade products in automotive applications.
Critical Applications. Products are not authorized for use in applications in which failure of the Micron component
could result, directly or indirectly in death, personal injury, or severe property or environmental damage ("Critical
Applications"). Customer must protect against death, personal injury, and severe property and environmental
damage by incorporating safety design measures into customer's applications to ensure that failure of the Micron
component will not result in such harms. Should customer or distributor purchase, use, or sell any Micron component for any critical application, customer and distributor shall indemnify and hold harmless Micron and its subsidiaries, subcontractors, and affiliates and the directors, officers, and employees of each against all claims, costs,
damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of product
liability, personal injury, or death arising in any way out of such critical application, whether or not Micron or its
subsidiaries, subcontractors, or affiliates were negligent in the design, manufacture, or warning of the Micron
product.
Customer Responsibility. Customers are responsible for the design, manufacture, and operation of their systems,
applications, and products using Micron products. ALL SEMICONDUCTOR PRODUCTS HAVE INHERENT
FAILURE RATES AND LIMITED USEFUL LIVES. IT IS THE CUSTOMER'S SOLE RESPONSIBILITY TO DETERMINE
WHETHER THE MICRON PRODUCT IS SUITABLE AND FIT FOR THE CUSTOMER'S SYSTEM, APPLICATION, OR
PRODUCT. Customers must ensure that adequate design, manufacturing, and operating safeguards are included in
customer's applications and products to eliminate the risk that personal injury, death, or severe property or environmental damages will result from failure of any semiconductor component.
Limited Warranty. In no event shall Micron be liable for any indirect, incidental, punitive, special or consequential
damages (including without limitation lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges) whether or not such damages are based on tort, warranty, breach
of contract or other legal theory, unless explicitly stated in a written agreement executed by Micron's duly authorized representative.
CCMTD-816717818-10392
m78a_1gb_3v_nand_spi.pdf Rev. H 02/22
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Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
General Description
General Description
Serial peripheral interface (SPI) NAND is an SLC NAND Flash memory device that provides a
cost-effective nonvolatile memory storage solution where pin count must be kept to a minimum. It is
also an alternative solution to SPI NOR, offering superior write performance and cost per bit over SPI
NOR. The hardware interface creates a low pin-count device with a standard pinout that remains the
same from one density to another and supports future upgrades to higher densities without board
redesign.
The serial electrical interface follows the industry-standard serial peripheral interface. New command
protocols and registers are defined for SPI operation. The command set resembles common SPI-NOR
command sets, modified to handle NAND specific functions and additional new features.
New features include user-selectable internal ECC and first page auto-load on power-up. SPI NAND
Flash devices have six signal lines plus VCC and ground (GND). The signal lines are SCK (serial clock),
SI, SO (for command/response and data input/output), and control signals CS, HOLD#, WP#. This
hardware interface creates a low pin-count device with a standard pinout that remains the same from
one density to another, supporting future upgrades to higher densities without board redesign.
Each block of the serial NAND Flash device is divided into 64 programmable pages, each page
consisting of 2176 bytes. Each page is further divided into a 2048-byte data storage region and a
128-byte spare area. The 128-byte area is typically used for memory and error management functions.
With internal ECC enabled as the default after power on, ECC code is generated internally when a page
is written to the memory core. The ECC code is stored in the spare area of each page. When a page is
read to the cache register, the ECC code is calculated again and compared with the stored value. Errors
are corrected if necessary. The device either outputs corrected data or returns an ECC error status. The
internal ECC can be configured off after device initialization. Contact Micron representative if ECC is
required to be default off after power on.
The first eight blocks are valid when shipped from factory. Security functions are also provided
including software block protection: Lock tight and hardware protection modes avoid array data
corruption.
CCMTD-816717818-10392
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Architecture
Architecture
The devices use an industry-standard NAND Flash memory core organized by page/block. The standard parallel NAND Flash electrical interface and I/O logic are replaced by an SPI interface. The new
command protocol set is a modification of the SPI NOR command set available in the industry. The
modifications are specifically to handle functions related to NAND Flash architecture. The interface
supports page and random read/write and internal data move functions. The device also includes an
internal ECC feature.
Data is transferred to or from the NAND Flash memory array, page-by-page, to a cache register and a
data register. The cache register is closest to I/O control circuits and acts as a data buffer for the I/O
data; the data register is closest to the memory array and acts as a data buffer for the NAND Flash
memory array operation.
The NAND Flash memory array is programmed and read in page-based operations; it is erased in
block-based operations. The cache register functions as the buffer memory to enable random data
READ/WRITE operations. These devices also use a new SPI status register that reports the status of
device operation.
Figure 2: Functional Block Diagram
SCK
SI/
IO0
SO/
IO1
CS#
HOLD#/
IO3
WP#/
IO2
Serial NAND controller
Cache and data
registers
VCC
VSS
NAND
memory
core
ECC and status
registers
CCMTD-816717818-10392
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Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Pin Assignments
Pin Assignments
Figure 3: 8-Pin, U-PDFN (Top View)
CS#
1
8
VCC
SO/IO1
2
7
HOLD#/IO3
WP#/IO2
3
6
SCK
VSS
4
5
SI/IO0
Figure 4: 16-Pin, SOP2 (Top View)
HOLD#/IO3
1
16
SCK
VCC
2
15
SI/IO0
DNU
3
14
NC
NC
4
13
NC
NC
5
12
NC
NC
6
11
NC
CS#
7
10
VSS
SO/IO1
8
9
WP#/IO2
Figure 5: 24-Ball T-PBGA, 5 x 5 (Balls Down)
1
2
3
4
5
NC
NC
NC
NC
NC
SCK
VSS
VCC
NC
DNU
CS#
NC
WP#/IO2
NC
NC
S0/IO1
S1/IO0
HOLD#/IO3
NC
NC
NC
NC
NC
NC
A
B
C
D
E
CCMTD-816717818-10392
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Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Pin Descriptions
Pin Descriptions
Table 1: SPI Pin Descriptions
Symbol
Type
Description
CS#
Input
Chip select: Places the device in active power mode when driven LOW. Deselects the
device and places SO at High-Z when HIGH. After power-up, the device requires a falling
edge on CS# before any command can be written.
The device goes into standby mode when no PROGRAM, ERASE, or WRITE STATUS REGISTER operation is in progress.
In the case of write-type instructions, CS# must be driven HIGH after a whole sequence is
completed. Single command and address sequences and array-based operations are registered on CS#.
SCK
Input
Serial clock: Provides serial interface timing. Latches commands, addresses, and data on
SI on the rising edge of SCK. Triggers output on SO after the falling edge of SCK. While
CS# is HIGH, keep SCK at VCC or GND (determined by mode 0 or mode 3). Do not begin
toggling SCK until after CS# is driven LOW.
WP#
Input
Write protect: When LOW, prevents overwriting block lock bits (BP[3:0] and TB) if the
block register write disable (BRWD) bit is set.
WP# must not be driven by the host during a x4 READ operation. If the device is deselected, this pin defaults as an input pin.
HOLD#
Input
Hold: Hold functionality is disabled by default except the special part numbers. Contact
Micron Sales representatives for details. When enabled, the external pull-up resistor is
necessary to avoid accidental operation being placed on hold.
HOLD# pauses any serial communication with the device without deselecting it. To start
the HOLD condition, the device must be selected, with CS# driven LOW. During HOLD status (HOLD# driven LOW), SO is High-Z and all inputs at SI and SCK are ignored. Hold mode
starts at the falling edge of HOLD#, provided SCK is also LOW. If SCK is HIGH when HOLD#
goes LOW, hold mode is kicked off at the next falling edge of SCK. Similarly, hold mode is
exited at the rising edge of HOLD#, provided SCK is also LOW. If SCK is HIGH, hold mode
ends after the next falling edge of SCK. HOLD# must not be driven by the host during the
x4 READ operation.
SI/IO0, SO/IO1,
IO2, IO3
I/O
Serial I/O: The bidirectional I/O signals transfer address, data, and command information.
The device latches commands, addresses, and data on the rising edge of SCK, and data is
shifted out on the falling edge of the SCK. If the device is deselected, IO[0,2] defaults as
an input pin and IO[1,3] defaults as an output pin.
SI must not be driven by the host during x2 or x4 READ operations.
VCC
Supply
VCC: Supply voltage
VSS
Supply
VSS: Ground
DNU
–
Do not use: Must be grounded or left floating.
NC
–
No connect: Not internal connection; can be driven or floated.
CCMTD-816717818-10392
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Micron Confidential and Proprietary
1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Memory Mapping
Memory Mapping
Figure 6: Memory Map
Blocks
RA[15:6]
0
1
Pages
RA[5:0]
0
1
Bytes
CA[11:0]
0
1
2
• • • • • • • • • • • • 1023
• • • • • •
2
63
• • • • • • • • • • • • • • • • • • • • • • • • 2175
Note: 1. The 12-bit column address is capable of addressing from 0 to 4095 bytes; however, only bytes 0 through 2175 are
valid. Bytes 2176 through 4095 of each page are “out of bounds,” do not exist in the device, and cannot be addressed.
Array Organization
Figure 7: Array Organization
Logical Unit (LUN)
2176 bytes
Cache Registers
2048
128
Data Registers
2048
128
8-bit data
1 page = (2K + 128) bytes
1 block = (2K + 128) bytes x 64 pages
= (128K + 8K) bytes
1024 blocks per plane
2048 blocks per LUN
1 Block
1 LUN = (128K + 8K) bytes x 1024 blocks
= 1088Mb
CCMTD-816717818-10392
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Bus Operation
Bus Operation
SPI Modes
The device can be driven by a microcontroller with its SPI running in either of two modes depending
on clock polarity (CPOL) and clock phase (CPHA) settings:
• CPOL = 0, CPHA = 0 (Mode 0)
• CPOL = 1, CPHA = 1 (Mode 3)
Input data is latched in on the rising edge of SCK, and output data is available from the falling edge of
SCK for both modes.
The difference between the two modes, shown here, is the clock polarity when the bus master is in
standby mode and not transferring data.
• SCK remains at 0 for CPOL = 0, CPHA = 0 (Mode 0)
• SCK remains at 1 for CPOL = 1, CPHA = 1 (Mode 3)
Figure 8: SPI Modes Timing
CPOL CPHA
0
0
SCK
1
1
SCK
SI
MSB
LSB
MSB
SO
LSB
CS#
Notes: 1. While CS# is HIGH, keep SCK at VCC or GND (determined by mode 0 or mode 3). Do not begin toggling SCK until
after CS# is driven LOW.
2. All timing diagrams shown in this data sheet are mode 0.
SPI Protocols
Standard SPI: Command, address, and data are transmitted on a single data line. Input on SI is latched
in on the rising edge of SCK. Output on SO is available on the falling edge of SCK.
Extended SPI: An extension of the standard SPI protocol. Command and address are transmitted on a
single data line through SI. Data are transmitted on two or four data lines, IO[3:0], depending on the
command.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
SPI NAND Command Definitions
SPI NAND Command Definitions
Table 2: SPI NAND Command Set
Command
Op Code
Address Dummy
Bytes
Bytes
Data
Bytes
Comments
RESET
FFh
0
0
0
Reset the device
GET FEATURES
0Fh
1
0
1
Get features
SET FEATURES
1Fh
1
0
1
Set features
READ ID
9Fh
0
1
2
Read device ID
PAGE READ
13h
3
0
0
Array read
READ PAGE CACHE RANDOM
30h
3
0
0
Cache read
READ PAGE CACHE LAST
3Fh
0
0
0
Ending of cache read
READ FROM CACHE x1
03h, 0Bh
2
1
1 to 2176 Output cache data at column address
READ FROM CACHE x2
3Bh
2
1
1 to 2176 Output cache data on IO[1:0]
READ FROM CACHE x4
6Bh
2
1
1 to 2176 Output cache data on IO[3:0]
READ FROM CACHE Dual
I/O
BBh
2
1
1 to 2176 Input address/Output cache data on IO[1:0]
READ FROM CACHE Quad
I/O
EBh
2
2
1 to 2176 Input address/Output cache data on IO[3:0]
WRITE ENABLE
06h
0
0
0
Sets the WEL bit in the status register to 1;
required to enable operations that change the
content of the memory array
WRITE DISABLE
04h
0
0
0
Clears the WEL bit in the status register to 0;
required to disable operations that change the
content of the memory array
BLOCK ERASE
D8h
3
0
0
Block erase
PROGRAM EXECUTE
10h
3
0
0
Array program
PROGRAM LOAD x1
02h
2
0
1 to 2176 Load program data into cache register on SI
PROGRAM LOAD x4
32h
2
0
1 to 2176 Load program data into cache register on SO[3:0]
PROGRAM LOAD RANDOM DATA x1
84h
2
0
1 to 2176 Overwrite cache register with input data on SI
PROGRAM LOAD RANDOM DATA x4
34h
2
0
1 to 2176 Overwrite cache register with input data on
SO[3:0]
PERMANENT BLOCK LOCK
PROTECTION
2Ch
3
0
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Permanently protect a specific group of blocks
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
RESET Operation
RESET Operation
The RESET (FFh) command is used to put the memory device into a known condition and to abort the
command sequence in progress. READ, PROGRAM, and ERASE commands can be aborted while the
device is in the busy state. Once the RESET command is issued to the device, it will take tRST to reset.
During this period, the GET FEATURE command could be issued to monitor the status (OIP) except for
the stacked devices. While the device is busy after sending the RESET Command, READ ID command
can be issued to read the device ID. For the stacked devices, no command should be issued until tRST.
The contents of the memory location being programmed or the block being erased are no longer valid.
The first page data of block 0 is auto-loaded to the cache register. For dual die, Die 0 is selected as
default and the first page of block 0 is loaded to the cache
All other status register bits will be cleared. The ECC status register bits will be updated after a reset.
The configuration register bits CFG[2:0] will be cleared after a reset. All the other configuration register
bits will not be reset. The block lock register bits will not be cleared after reset until the device is power
cycled or is written to by SET FEATURE command.
Figure 9: RESET (FFh) Timing
0
1
2
3
4
5
6
7
SCK
Command (FFh)
CS#
OFh or 9Fh
SI
SO
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
WRITE Operations
WRITE Operations
WRITE ENABLE (06h)
The WRITE ENABLE (06h) command sets the WEL bit in the status register to 1. Write enable is
required in the following operations that change the contents of the memory array:
• PAGE PROGRAM
• OTP AREA PROGRAM
• BLOCK ERASE
Figure 10: WRITE ENABLE (06h) Timing
0
1
2
3
4
5
6
7
SCK
CS#
Command (06h)
SI
WRITE DISABLE (04h)
The WRITE DISABLE (04h) command clears the WEL bit in the status register to 0, disabling the
following operations:
• PAGE PROGRAM
• OTP AREA PROGRAM
• BLOCK ERASE
Figure 11: WRITE DISABLE (04h) Timing
0
1
2
3
4
5
6
7
SCK
CS#
Command (04h)
SI
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ Operations
PAGE READ (13h)
The PAGE READ (13h) command transfers data from the NAND Flash array to the cache register. It
requires a 24-bit address consisting of 7 dummy bits and a 17-bit block/page address (8 dummy bits
followed by an 16-bit block/page address for 1Gb). After the block/page address is registered, the
device starts the transfer from the main array to the cache register. During this data transfer busy time
of tRD, the GET FEATURES command can be issued to monitor the operation.
Following successful completion of PAGE READ, the READ FROM CACHE command must be issued
to read data out of cache. The command sequence is as follows to transfer data from array to output:
• 13h (PAGE READ command to cache)
• 0Fh (GET FEATURES command to read the status)
• 03h or 0Bh (READ FROM CACHE)
• 3Bh (READ FROM CACHE x2)
• 6Bh (READ FROM CACHE x4)
• BBh (READ FROM CACHE Dual I/O)
• EBh (READ FROM CACHE Quad I/O)
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
Figure 12: PAGE READ (13h) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
SCK
CS#
Command (13h)
Address bits
23
SI
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
High-Z
SO
1
23
24
25
26
27
28
29
30
0
31
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
1
0
SCK
CS#
t CS
Address bits
SI
8
7
6
5
4
3
2
1
Status register address (C0h)
GET FEATURE (0Fh)
7
0
6
5
4
3
2
MSB
High-Z
SO
1
13
2
14
15
1
0
16
17
18
19
20
21
22
23
SCK
CS#
SI 2
Status register data out
0
7
SO
6
0
MSB
5
4
3
2
Status register data out
1
0
7
6
4
3
2
1
0
MSB
2
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ FROM CACHE x1 (03h or 0Bh)
The READ FROM CACHE x1 command enables sequentially reading one or more data bytes from the
cache buffer. The command is initiated by driving CS# LOW, shifting in command opcode 03h/0Bh,
followed by a 16 bit column address and 8-bit dummy clocks. Both the commands run at fast mode.
Data is returned from the addressed cache buffer, MSB first, on SO at the falling edge of SCK. The
address is automatically incremented to the next higher address after each byte of data is shifted out,
enabling a continuous stream of data. This command is completed by driving CS# HIGH.
Figure 13: READ FROM CACHE (03h or 0Bh) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
SCK
CS#
Command (03h or 0Bh)
12-bit column address
3 dummy bits
0
SI
0
0
12
11
10
9
8
7
6
5
1 dummy byte
4
3
2
1
0
MSB
Plane select
High-Z
SO
1
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
17431...
17439
SCK
CS#
1 dummy byte
SI
High-Z
0
Data out 2176
Data out 1
SO
High-Z
7
6
5
4
3
MSB
2
1
0
7
6
5
4
3
2
1
0
MSB
1
Don’t Care
Note: 1. Plane select is a dummy bit for 1Gb devices.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ FROM CACHE x2 (3Bh)
The READ FROM CACHE x2 (3Bh) command is similar to READ FROM CACHE x1 (03h or 0Bh) except
that data is output on the following two pins, enabling data transfer at twice the rate: IO0(SI) and
IO1(SO).
Figure 14: READ FROM CACHE x2
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
SCK
CS#
3 dummy bits
Command (3Bh)
0
SI
0
12-bit column address
0
12
Plane select
11
10
9
8
7
6
5
4
1 dummy byte
3
2
1
0
MSB
High-Z
SO
1
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
8727...
8735
SCK
CS#
1 dummy byte
SI
High-Z
SO
High-Z
1
SI switches from input to output
6
4
2
0
6
4
2
0
6
4
2
0
6
4
2
0
7
5
3
1
7
5
3
1
7
5
3
1
7
5
3
1
Data out 1
Data out 2
Data out 2175
Data out 2176
Note: 1. Plane select is a dummy bit for 1Gb devices.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ FROM CACHE x4 (6Bh)
The READ FROM CACHE x4 (6Bh) command is similar to READ FROM CACHE x1 command, but with
the capability to output data across four data lines.
Figure 15: READ FROM CACHE x4
0
SCK
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
CS#
Command
12-bit column address
3 dummy bits
SI/
IO0
0
0
0
12
11
10
9
8
7
6
5
4
1 dummy byte
3
2
1
0
MSB
Plane select
SO/
IO1
High-Z
WP#/
IO2
High-Z
HOLD#/
IO3
High-Z
1
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
SCK
CS#
1 dummy byte
SI/
IO0
High-Z
SO/
IO1
High-Z
WP#/
IO2
High-Z
HOLD#/
IO3
High-Z
SI switches from input to output
4
0
4
0
4
0
4
0
4
5
1
5
1
5
1
5
1
5
6
2
6
2
6
2
6
2
6
7
3
7
3
7
3
7
3
7
Byte 1
Byte 2
Byte 3
Byte 4
1
Note: 1. Plane select is a dummy bit for 1Gb devices.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ FROM CACHE Dual I/O (BBh)
The READ FROM CACHE Dual I/O (BBh) command enables improved random access while maintaining two IO pins, IO0 and IO1. It is similar to the READ FROM CACHE x2 (3Bh) command but with
capability to input either the column address or the dummy clocks two bits per clock, thereby reducing
command overhead. Refer to the Electrical Specifications for the supported frequency.
Figure 16: READ FROM CACHE Dual I/O
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
SCK
Command (BBh)
CS#
Plane select
SI
IO0
12
SO
IO1
4 dummy cycles
data out 1
10
8
6
4
2
0
6
4
2
11
9
7
5
3
1
7
5
3
3 dummy
bits
12-bit column address
8717
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38 . . . . . . 8716
8719
8718
8721
8720
8723
8722
8724
SCK
CS#
data out 2
data out 1
data out 3
data out 4
data out 2175
data out x
data out 2176
SI
IO0
0
6
4
2
0
6
4
2
0
6
4
2
0
6
4
2
0
6
4
2
0
6
4
2
0
6
SO
IO1
1
7
5
3
1
7
5
3
1
7
5
3
1
7
5
3
1
7
5
3
1
7
5
3
1
6
Don’t Care
Note: 1. Plane select is a dummy bit for 1Gb devices.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ FROM CACHE Quad I/O (EBh)
The READ FROM CACHE Quad I/O (EBh) command is similar to the READ FROM CACHE Dual I/O
(BBh) command except that address and data bits are input and output through four pins: IO0, IO1,
IO2, and IO3. The quad I/O dramatically reduces command overhead, enabling faster random access
to the cache buffer. Refer to the Electrical Specifications for the supported frequency.
Figure 17: READ FROM CACHE Quad I/O
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
SCK
data
out 1
Command
CS#
Plane select
S1
IO0
data
out 2
data
out 3
data
out 4
4 dummy cycles
8
4
0
4
0
4
0
4
0
4
S0
IO1
9
5
1
5
1
5
1
5
1
5
WP#
IO2
10
6
2
6
2
6
2
6
2
6
HOLD#
IO3
11
7
3
7
3
7
3
7
3
7
12
3 dummy
bits
12-bit
column address
4364
23
24
25
26
27 . .
. . 4363
4366
4365
4367
SCK
data
out 4
data
out 5
data
out 5
data
out x
data
out
2175
CS#
SI
IO0
data
out
2176
4
0
4
0
4
0
4
0
4
0
4
SO
IO1
1
5
1
5
1
5
1
5
1
5
1
5
WP#
IO2
2
6
2
6
2
6
2
6
2
6
2
6
HOLD#
IO3
3
7
3
7
3
7
3
7
3
7
3
7
Don’t Care
Note: 1. Plane select is a dummy bit for 1Gb devices.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ PAGE CACHE RANDOM (30h)
The READ PAGE CACHE RANDOM (30h) command reads the specified block and page into the data
register while the previous page is output from the cache register. This command is accepted by the die
when it is ready (OIP = 0, CRBSY = 0). This command is used to improve the read throughput as follows:
1. 13h – PAGE READ to cache
2. 0Fh – GET FEATURE command to the read status until OIP status bit is changed from 1 to 0
3. 30h – READ PAGE CACHE RANDOM command to transfer data from data register to cache register
and kick off the next page transfer from array to data register
4. 0Fh – GET FEATURE command to read the status until OIP status bit is changed from 1 to 0
5. 03h, 0Bh, 3Bh, 6Bh, BBh, or EBh – READ FROM CACHE TO OUTPUT command
6. 0Fh – GET FEATURE command to read the status until CRBSY = 0
7. Repeat step 3 to step 6 to read out all expected pages until last page
8. 3Fh – READ PAGE CACHE LAST command to end the read page cache sequence and copy a last page
from the data register to the cache register
9. 0Fh – GET FEATURE command to read the status until OIP status bit is changed from 1 to 0
10.03h, 0Bh, 3Bh, 6Bh, BBh, or EBh – READ FROM CACHE TO OUTPUT command to read out last page
from cache register to output
The READ PAGE CACHE RANDOM command requires a 24-bit address consisting of 8 dummy bits
followed by a 16-bit block/page address for 1Gb device or 7 dummy bits followed by a 17-bit
block/page address for 2Gb or higher devices. After the block/page addresses are registered, the device
starts to transfer data from data register to cache register for tRCBSY. AftertRCBSY, OIP bit (through
GET FEATURE command to check this status bit) goes to 0 from 1, indicating that the cache register is
available and that the specified page in the READ PAGE CACHE RANDOM command is copying from
the the Flash array to the data register. At this point, data can be output from the cache register beginning at the column address specified by READ FROM CACHE commands. The status register CRBSY
bit value remains at 1, indicating that the specified page in READ PAGE CACHE RANDOM command
is copying from the Flash array to the data register; CRBSY returns to 0 to indicating the copying from
array is completed. During tRCBSY, the error check and correction is also performed.
Note:With an on-die ECC-enabled die, ECC is executed after data is transferred from the data register
to the cache register; Therefore, tRCBSY includes this ECC time, which must be factored in when
checking the OIP status.
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SO
SI
CS#
SCK
SO
SI
CS#
SCK
SO
SI
CS#
SCK
SO
SI
CS#
SCK
7
MSB
7
MSB
2
6
6
5
5
0
0
4
4
2
2
30h
3
13h
3
1
2
3
2
Page Y data 2
3
Page x data 2
1
1
1
1
4
4
0
0
5
6
7
MSB
7
MSB
5
6
6
6
7
5
5
23
8
23
7
4
4
22
9
22
8
3
3
21
10
21
9
2
2
20
11
20
10
12
13
18
18
17
1
1
0
0
14
17
13
Page x data n
19
Page y
12
19
Page x
11
16
15
16
14
28
3
15
3
29
2
28
2
0
1
0
30
29
1
1
1
31
0
30
Figure 18: READ PAGE CACHE RANDOM Sequence
2
2
3
4
30h
3
tRCBSY
4
tRD
5
5
3Fh
Read page cache last
0
31
6
0
6
7
2
8
23
Page Z
7
1
22
9
03h
3
10
11
20
5
tRCBSY
21
4
12
19
6
7
0
26
1
27
03h
4
8
3
9
6
28
2
10
7
29
1
8
0
31
12
11
30
11
1
22
29
24
7
MSB
30
tRCBSY
0
23
30
6
31
0
7
6
6
7
32
5
0
7
Page Z data 1
03h
1
31
MSB
Dummy byte
25
29
1
2
0
7
6
Page Z data 2
8
3
30
Page x data 1
4
1
31
0
0
7
7
2
7
6
MSB
6
1
Don’t Care
0
Page Z data n
0
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2022 Micron Technology, Inc. All rights reserved.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
READ Operations
READ PAGE CACHE LAST (3Fh)
The READ PAGE CACHE LAST (3Fh) command ends the READ PAGE CACHE RANDOM sequence and
copies a page from the data register to the cache register. This command is accepted by the die when
it is ready (OIP = 0, CRBSY = 0). After this command is issued, the status register bit OIP goes HIGH and
the device is busy (CRBSY = 0, OIP = 1) for tRCBSY. Address is not applied in this command sequence.
When data is completely copied to cache register, OIP goes LOW and READ FROM CACHE commands
could be issued to output data.
READ ID (9Fh)
READ ID reads the 2-byte identifier code programmed into the device, which includes ID and device
configuration data as shown in the table below.
Table 3: READ ID Table
Byte
Description
7
6
5
4
3
2
1
0
Value
Byte 0
Manufacturer ID (Micron)
0
0
1
0
1
1
0
0
2Ch
Byte 1
1Gb 3.3V Device ID
0
0
0
1
0
1
0
0
14h
Byte 1
2Gb 3.3V Device ID
0
0
1
0
0
1
0
0
24h
Byte 1
4Gb 3.3V Device ID
0
0
1
1
0
1
1
0
36h
Byte 1
8Gb 3.3V Device ID
0
1
0
0
0
1
1
0
46h
Figure 19: READ ID (9Fh) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
0
0
0
16
17
18
19
20
21
22
23
24
25
SCK
CS#
Dummy byte
Command (9Fh)
0
SI
0
0
0
0
Manufacturer ID
High-Z
SO
Device ID
7
6
MSB
23
24
25
26
27
28
29
30
1
31
SCK
CS#
SI
Device ID
SO
7
6
5
4
3
2
1
0
MSB
Don’t Care
1
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Parameter Page
Parameter Page
The following command flow must be issued by the memory controller to access the parameter page
contained within Micron SPI devices:
1. 1Fh – SET FEATURE command with a feature address of B0h and data value for CFG[2:0] = 010b (to
access OTP/Parameter/Unique ID pages).
2. 13h – PAGE READ command with a block/page address of 0x01h, and then check the status of the
read completion using the GET FEATUR ES (0Fh) command with a feature address of C0h.
3. 03h – READ FROM CACHE command with an address of 0x00h to read the data out of the NAND
device (see the following Parameter Page Data Structure table for a description of the contents of the
parameter page).
4. 1Fh – SET FEATURE command with a feature address of B0h and data value of 00h to exit the parameter page reading.
Parameter Page Data Structure Table
Table 4: Parameter Table
Byte
Description
Value (hex)
0-3
Parameter page signature
4Fh, 4Eh, 46h, 49h
4-5
Revision number
00h
6-7
Feature support
00h
8-9
Optional commands support
06h, 00h
10-31
Reserved
00h
32-43
Device manufacturer
4Dh, 49h, 43h, 52h, 4Fh, 4Eh, 20h, 20h, 20h, 20h, 20h, 20h
44-63
Device model: MT29F1G01ABAFDSF
4Dh, 54h, 32h, 39h, 46h, 31h, 47h, 30h, 31h, 41h, 42h, 41h, 46h,
44h, 53h, 46h, 20h, 20h, 20h, 20h
44-63
Device model: MT29F1G01ABAFD12
4Dh, 54h, 32h, 39h, 46h, 31h, 47h, 30h, 31h, 41h, 42h, 41h, 46h,
44h, 31h, 32h, 20h, 20h, 20h, 20h
44-63
Device model: MT29F1G01ABAFDWB
4Dh, 54h, 32h, 39h, 46h, 31h, 47h, 30h, 31h, 41h, 42h, 41h, 46h,
44h, 57h, 42h, 20h, 20h, 20h, 20h
64
Manufacturer ID
2Ch
65-66
Date code
00h
67-79
Reserved
00h
80-83
Number of data bytes per page
00h, 08h, 00h, 00h
84-85
Number of spare bytes per page
80h, 00h
86-89
Number of data bytes per partial page
00h, 02h, 00h, 00h
90-91
Number of spare bytes per partial page
20h, 00h
92-95
Number of pages per block
40h, 00h, 00h, 00h
96-99
Number of blocks per unit
00h, 04h, 00h, 00h
100
Number of logical units
01h
101
Number of address cycles
00h
102
Number of bits per cell
01h
103-104
Bad blocks maximum per unit
14h, 00h
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Unique ID Page
Table 4: Parameter Table (Continued)
Byte
Description
Value (hex)
105-106
Block endurance
01h, 05h
107
Guaranteed valid blocks at beginning of
target
08h
108-109
Block endurance for guaranteed valid
blocks
00h
110
Number of programs per page
04h
111
Partial programming attributes
00h
112
Number of ECC bits
00h
113
Number of interleaved address bits
00h
114
Interleaved operation attributes
00h
115-127
Reserved
00h
128
I/O pin capacitance
08h
129-130
Timing mode support
00h
131-132
Program cache timing
00h
133-134
t
58h, 02h
135-136
t
10h, 27h
137-138
tR
139-140
tCCS
141-163
Reserved
00h
164-165
Vendor-specific revision number
00h
166-179
Vendor specific
00h, 00h, 00h, 00h, 00h, 00h, 00h, 00h, 00h, 02h, 02h, B0h, 0Ah,
B0h
180-247
Reserved
00h
248
ECC maximum correct ability
08h
249
Die select feature
00h
250-253
Reserved
00h
254-255
Integrity CRC
Set at Test
256-512
2nd copy of the parameter table
513-768
3rd copy of the parameter table
769-2048
Additional redundant parameter pages
PROG maximum page program time
ERS maximum block erase time
maximum page read time
minimum
46h, 00h
00h
Unique ID Page
The following command flow must be issued by the memory controller to access the unique ID page
contained within the device:
1. Issue a SET FEATURE (1Fh) command on a feature address of B0h and data value of 40h (Access to
OTP, Parameter, Unique ID pages, ECC disable).
2. Issue a PAGE READ (13h) command on a block/page address of 0x00h, and then poll the status
register OIP bit until device ready using the GET FEATURE (0Fh) command issued on a feature
address of C0h.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Unique ID Page
3. Issue a READ FROM CACHE (03h) command on an address of 0x00h to read the unique ID data out
of the NAND device.
4. To exit reading the unique ID page, issue a SET FEATURE (1Fh) command with a feature address of
B0h and data value of 10h or 00h (main array READ, ECC enable/disable).
The device stores 16 copies of the unique ID data. Each copy is 32 bytes: the first 16 bytes are unique
data, and the second 16 bytes are the complement of the first 16 bytes. The host should XOR the first
16 bytes with the second 16 bytes. If the result is 16 bytes of FFh, that copy of the unique ID data is
correct. If a non-FFh result is returned, the host can repeat the XOR operation on a subsequent copy of
the unique ID data.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Program Operations
Program Operations
PAGE PROGRAM
A PAGE PROGRAM operation sequence enables the host to input 1 byte to 2176 bytes of data within a
page to a cache register, and moves the data from the cache register to the specified block and page
address in the array. Only four partial-page programs are allowed on a single page. If more than 2176
bytes are loaded, then those additional bytes are ignored by the cache register.
The page program sequence is as follows:
• 06h (WRITE ENABLE command)
• 02h (PROGRAM LOAD command)
• 10h (PROGRAM EXECUTE command)
• 0Fh (GET FEATURES command to read the status)
PROGRAM LOAD x1 (02h)
Prior to performing the PROGRAM LOAD operation, a WRITE ENABLE (06h) command must be
issued. As with any command that changes the memory contents, the WRITE ENABLE command must
be executed in order to set the WEL bit. WRITE ENABLE is followed by a PROGRAM LOAD (02h)
command. The PROGRAM LOAD command consists of an 8-bit op code, followed by 3 dummy bits,
followed by a plane select (if available) and a 12-bit column address, and then the data bytes to be
programmed. The data bytes are loaded into a cache register that is 2176 bytes long. Only four
partial-page programs are allowed on a single page. If more than 2176 bytes are loaded, those additional bytes are ignored by the cache register. The command sequence ends when CS# goes from LOW
to HIGH.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Program Operations
Figure 20: PROGRAM LOAD (02h) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
SCK
CS#
3 dummy bits
Command (02h)
SI
0
0
0
12-bit column address
12
11
10
9
8
7
6
5
4
Data byte 1
3
2
1
0
7
6
MSB
Plane select
1
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
17424…
17431
SCK
CS#
Data byte 1
SI
7
6
5
4
3
Data byte 2
2
1
0
7
6
5
4
3
Data byte 2176
2
1
0
7
6
5
4
3
2
1
0
Don’t Care
1
Note: 1. Plane select is a dummy bit in 1Gb device.
PROGRAM EXECUTE (10h)
The PROGRAM EXECUTE command consists of an 8-bit op code, followed by a 24-bit address. After
the page/block address is registered, the device starts the transfer from the cache register to the main
array and is busy for tPROG time. During this busy time, the status register can be polled to monitor the
status of the operation (refer to the status register section). When the operation completes successfully,
the next series of data can be loaded with the PROGRAM LOAD command.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Program Operations
Figure 21: PROGRAM EXECUTE (10h) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
SCK
CS#
Command (10h)
Address bits
23
SI
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
High-Z
SO
1
23
24
25
26
27
28
29
30
0
31
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
SCK
CS#
GET FFEATURE (0Fh)
Address bits
SI
7
6
5
4
3
2
1
Status register address (C0h)
0
7
6
5
4
3
2
1
0
MSB
High-Z
SO
2
1
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
1
0
SCK
CS#
Status register address
SI
2
1
0
Status register data out
Status register data out
SO
High-Z
7
6
5
4
3
2
1
0
7
MSB
6
5
4
3
2
MSB
2
Don’t Care
RANDOM DATA PROGRAM x1 (84h)
The RANDOM DATA PROGRAM operation programs or replaces data in a page with existing data. The
random data program sequence is as follows:
• 06h (WRITE ENABLE command)
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Program Operations
• 84h (PROGRAM LOAD RANDOM DATA command)
• 10h (PROGRAM EXECUTE command)
• 0Fh (GET FEATURES command to read the status)
The PROGRAM LOAD RANDOM DATA x1 (84h) operation is similar to PROGRAM LOAD x1 (02h). The
difference is that PROGRAM LOAD X1command will reset the cache buffer to an all FFh value, while
PROGRAM LOAD RANDOM DATA X1command will only update the data bytes that are specified by
the command input sequence, and the rest of data in the cache buffer will remain unchanged. If the
random data is not sequential, then another PROGRAM LOAD RANDOM DATA x1 (84h) command
must be issued with a new column address. After the data is loaded, a PROGRAM EXECUTE (10h)
command can be issued to start the programming operation.
Figure 22: PROGRAM LOAD RANDOM DATA (84h) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
SCK
CS#
Command (84h)
12-bit column address
3 dummy bits
0
SI
0
0
12
11
10
9
8
7
6
5
4
Data byte 1
3
2
1
0
7
6
MSB
Plane select
23
24
25
26
27
28
29
30
31
32
33
34
35
36
1
37
38
39
17424…
17431
SCK
CS#
Data byte 1
SI
7
6
5
4
3
Data byte 2
2
1
0
7
6
5
4
3
Data byte 2176
2
1
0
7
6
5
4
3
2
1
0
1
Don’t Care
Note: 1. Plane select is a dummy bit in 1Gb device.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Program Operations
PROGRAM LOAD x4 (32h) and PROGRAM LOAD RANDOM DATA x4 (34h)
The PROGRAM LOAD x4 (32h) and RANDOM DATA x4 (34h) is similar to PROGRAM LOAD x1 (02h)
command and RANDOM DATA x1 (84h), but with the capability to input the data across four data lines.
Figure 23: PROGRAM LOAD x4 (32h) Timing
0
1
2
3
4
5
6
7
8
9
10
20
21
22
23
24
25
26
27
28
29
43
44
45
46
47
SCK
CS#
Dummy bits and plane select1
Command (32h)
column address bits A[11:0]
IO0
15
14
13
3
2
1
0
4
0
4
0
4
0
0
4
0
4
0
0
4
0
4
0
IO1
5
1
5
1
5
1
1
5
1
5
1
1
5
1
5
1
IO2
6
2
6
2
6
2
2
6
2
6
2
2
6
2
6
2
IO3
7
3
7
3
7
3
3
7
3
7
3
3
7
3
7
3
Byte 1
Byte 2
Byte 11
Byte 12
Byte 2175 Byte 2176
Don’t Care
Note: 1. Number of dummy bits are different for the different densities, and plane select is not available in 1Gb. Plane select is a dummy bit in 1Gb device.
INTERNAL DATA MOVE
The INTERNAL DATA MOVE command programs or replaces data in a page with existing data. The
internal data move command sequence is as follows:
• 13h (PAGE READ command to cache)
• 06h (WRITE ENABLE command)
• 84h (PROGRAM LOAD RANDOM DATA command)
• 10h (PROGRAM EXECUTE command)
• 0Fh (GET FEATURES command to read the status)
Note:If the random data is not sequential, another PROGRAM LOAD RANDOM DATA (84h) command
must be issued with the new column address.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Block Erase Operations
Block Erase Operations
The BLOCK ERASE (D8h) command is used to erase at the block level. The blocks are organized as 64
pages per block, 2176 bytes per page (2048 + 128 bytes). Each block is 136KB. The BLOCK ERASE
command (D8h) operates on one block at a time. The command sequence for the BLOCK ERASE operation is as follows:
• 06h (WRITE ENABLE command)
• D8h (BLOCK ERASE command)
• 0Fh (GET FEATURES command to read the status register)
Prior to performing the BLOCK ERASE operation, a WRITE ENABLE (06h) command must be issued.
As with any command that changes the memory contents, the WRITE ENABLE command must be
executed in order to set the WEL bit. If the WRITE ENABLE command is not issued, then the rest of the
erase sequence is ignored. A WRITE ENABLE command must be followed by a BLOCK ERASE (D8h)
command. This command requires a 24-bit address consisting of dummy bits followed by a valid block
address. After the address is registered, the control logic automatically controls timing and ERASE and
VERIFY operations. The device is busy fortERS time during the BLOCK ERASE operation. The GET
FEATURES (0Fh) command can be used to monitor the status of the operation. (See the following
figure.)
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Block Erase Operations
Figure 24: BLOCK ERASE (D8h) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
SCK
CS#
Command (D8h)
Address bits
SI
23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
High-Z
SO
1
23
24
26
25
27
28
29
30
0
31
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
SCK
CS#
Address bits
SI
7
6
5
4
GET FEATURE (0Fh)
3
2
1
Status register address (C0h)
0
6
7
5
4
3
2
1
0
MSB
High-Z
SO
2
1
12
13
14
15
16
17
18
19
20
21
22
23
SCK
CS#
SI
2
1
0
Status register data out
Status register data out
SO
High-Z
7
6
5
4
3
2
1
0
7
MSB
2
CCMTD-816717818-10392
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5
4
3
2
1
0
MSB
Don’t Care
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Features Operations
Features Operations
GET FEATURE (0Fh) and SET FEATURE (1Fh)
The GET FEATURE (0Fh) and SET FEATURE (1Fh) commands either monitor the device status or alter
the device configuration from the default at power-on. These commands use a 1-byte feature address
to determine which feature is to be read or modified. Features such as OTP protect, block locking, SPI
NOR like protocol configuration, and ECC correction can be managed by setting specific bits in feature
addresses. Typically, the status register at feature address C0h is read to check the device status, except
WEL, which is a writable bit with the WRITE ENABLE (06h) command.
When a feature is set, it remains active until the device is power cycled or the feature is written to.
Unless specified otherwise, when the device is set, it remains set even if a RESET (FFh) command is
issued. CFG[2:0] will be cleared to 000 after a reset and the device is back to normal operation.
Figure 25: GET FEATURE (0Fh) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
2
1
15
16
17
18
19
20
21
22
23
SCK
CS#
1 byte address
Command (0Fh)
7
SI
6
5
4
3
0
MSB
SO
Data byte
High-Z
7
6
5
4
3
2
1
0
MSB
Don’t Care
Figure 26: SET FEATURE (1Fh) Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
SCK
CS#
1 byte address
Command (1Fh)
SI
7
6
5
4
MSB
3
Data byte
2
1
0
7
6
5
4
3
2
1
0
MSB
Don’t Care
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Feature Settings
Feature Settings
Table 5: Feature Address Settings and Data Bits
Register
Feature
Address
Feature Data Bits
7
6
5
4
3
2
1
0
Notes
Block lock
Address = A0h;
Access = R/W
BRWD
BP3
BP2
BP1
BP0
TB
WP#/HOLD#
Disable
–
1, 2
Configuration
Address = B0h;
Access = R/W
CFG2
CFG1
LOT_EN
ECC_EN
–
–
CFG0
–
1
Status
Address = C0h;
Access = R
CRBSY
ECCS2
ECCS1
ECCS0
P_Fail
E_Fail
WEL
OIP
1
Die select
Address = D0h;
Access = R/W
–
DS0
–
–
–
–
–
–
3
Notes: 1. See the corresponding register bit description in Security Features, ECC Protection, Status Register, and Read
Protocol – Similar to SPI NOR sections.
2. When the WP#/HOLD# disable bit is at the default value of 0, and with BRWD set to 1 and WP# LOW, block lock
registers [7:2] cannot be changed.
3. Die Select only available in 4Gb or greater stacked die devices .
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Security – Volatile Block Protection
Security – Volatile Block Protection
The block lock feature protects the entire device or ranges of device blocks from the PROGRAM and
ERASE operations. The SET FEATURE command must be issued to alter the state of block protection.
After power-up, the device is in the locked state by default; block lock register bits BP[3:0] and TB are
1. Reset will not modify the block protection state. When a PROGRAM/ERASE command is issued to a
locked block, a status register P_Fail bit or E_Fail bit will be set to indicate the operation failure.
The following command sequence unlocks all blocks after power-up: The SET FEATURE REGISTER
WRITE (1Fh) operation is issued, followed by the feature address (A0h). Then, 00h is issued on data bits
to unlock all blocks.
Security – Block Protection Bits
Table 6: Block Lock Register Block Protection Bits
TB
BP3
BP2
BP1
BP0
Protected
Portion
Protected Blocks
0
0
0
0
0
None – all
unlocked
None
0
0
0
0
1
Upper 1/1024
locked
1023
0
0
0
1
0
Upper 1/512
locked
1022:1023
0
0
0
1
1
Upper 1/256
locked
1020:1023
0
0
1
0
0
Upper 1/128
locked
1016:1023
0
0
1
0
1
Upper 1/64 locked
1008:1023
0
0
1
1
0
Upper 1/32 locked
992:1023
0
0
1
1
1
Upper 1/16 locked
960:1023
0
1
0
0
0
Upper 1/8 locked
896:1023
0
1
0
0
1
Upper 1/4 locked
768:1023
0
1
0
1
0
Upper 1/2 locked
512:1023
1
0
0
0
0
All unlocked
None
All locked
0:1023
All others
1
0
0
0
1
Lower 1/1024
locked
0
1
0
0
1
0
Lower 1/512
locked
0:1
1
0
0
1
1
Lower 1/256
locked
0:3
1
0
1
0
0
Lower 1/128
locked
0:7
1
0
1
0
1
Lower 1/64 locked
0:15
1
0
1
1
0
Lower 1/32 locked
0:31
1
0
1
1
1
Lower 1/16 locked
0:63
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Security – Hardware Write Protection
Table 6: Block Lock Register Block Protection Bits (Continued)
TB
BP3
BP2
BP1
BP0
Protected
Portion
Protected Blocks
1
1
0
0
0
Lower 1/8 locked
0:127
1
1
0
0
1
Lower 1/4 locked
0:255
1
1
0
1
0
Lower 1/2 locked
0:511
1
1
1
1
1
All locked
(default)
0:1023
Security – Hardware Write Protection
Hardware write protection prevents the block protection state from hardware modifications.
In order to utilize this feature, SET FEATURE command is issued on the feature address A0h and
WP#/HOLD# disable bit state is set to 0.
The BRWD bit is operated in conjunction with WP#/HOLD# disable bit. When BRWD is set to 1 and
WP# is LOW, none of the other block lock register bits [7:2] can be set. The block lock state cannot be
changed, regardless of what is unlocked or locked. Also, when the WP#/HOLD# disable bit is set to 1,
the hardware protected mode is disabled. The default value of BRWD and WP#/HOLD# disable bits =
0 after power up.
Security – Device Lock Tight
The lock tight (LOT) mode prevents the block protection state from software modifications. After it is
enabled, this mode cannot be disabled by a software command. Also, BP, TB, and BRWD bits are
protected from further software changes. Only another power cycle can disable the lock tight mode.
The following command sequence enables the lock tight mode: The SET FEATURE REGISTER WRITE
(1Fh) operation is issued, followed by the feature address (B0h). Then, data bits are set to enable LOT
(LOT_EN bit = 1).
When the hardware write protection mode is disabled during quad or ×4 mode, lock tight can be used
to prevent a block protection state change.
Permanent Block Lock Protection
48 blocks per die (0 to 47) can be permanently locked using PROTECT command. The PROTECT
command provides nonvolatile, irreversible protection of up to twelve groups (48 blocks). Implementation of the protection is group-based, which means that a minimum of one group (4 blocks) is
protected when the PROTECT command is issued. Because block protection is nonvolatile, a
power-on or power-off sequence does not affect the block status after the PROTECT command is
issued. The device is shipped from the factory with no blocks protected so that users can program or
erase the blocks before issuing the PROTECT command. Block protection is also irreversible in that
when protection is enabled by issuing the PROTECT command, the protected blocks can no longer be
programmed or erased. If permanent lock is disabled, PROTECT command would be ignored. As with
any command that changes the memory contents, the WRITE ENABLE must be executed. If this
command is not issued, then the protection command is ignored. WRITE ENABLE must be followed
by a PROTECTION command (2Ch).
The following PROTECT sequence is used:
• 06h (WRITE ENABLE)
• 2Ch (PERMANENT BLOCK LOCK PROTECTION)
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Security – One Time Programmable (OTP)
• 24-bit address (see the PROTECTION Command Details)
• After tPROG time, use GET FEATURE command (0Fh) with feature address C0h to verify P_Fail bit
Figure 27: PROTECT Command Cycle
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 28 29 30 31
SCK
CS#
tPROG
Page Y
SI
2Ch
23 22
21 20 19 18 17 16
3
2
1
0
SO
Don’t Care
PROTECTION Command (2Ch) Details
To enable protection, the PROTECTION command consists of an 8-bit command code, followed by a
24-bit address (7 dummy bits and an 17-bit page/ block address). Row address bits 11, 10, 9, 8 (named
as Y) input the targeted block group information. Where Y defines the group of blocks to be protected.
There are 12 Groups Y where Y = 0000b-1011b:
• Y = 0000 protects Group0 = blks 0, 1, 2, 3.
• Y = 0001 protects Group1 = blks 4, 5, 6, 7.
• ......
• Y = 1011 protects Group11 = blks 44, 45, 46, 47.
After tPROG, the targeted block groups are protected. Upon PROTECT operation failure, the status
register reports a value of 0Ch (P_FAIL = 1 and WEL = 1). Upon PROTECT operation success, the status
register reports a value of 00h.
Note:There is no status register to check the PROTECT status of a block or a group. A permanent blocks
table should be maintained and updated after a group is protected.
Permanent Block Lock Protection Disable Mode
This mode disables the ability to accept the PROTECTION command. Running this command
sequence ensures no more groups can ever be permanently locked.
The following disable PROTECT sequence is used
• SET FEATURE command (1Fh) with B0h mode and data value C2h
• 06h (WRITE ENABLE)
• 10h (Execute with block/page address as 0)
• After tPROG time, use GET FEATURE command (0Fh) with feature address C0h to verify P_Fail bit
Security – One Time Programmable (OTP)
This device offers a protected, one-time programmable NAND Flash memory area. Ten full pages per
die are available, and the entire range is guaranteed. Customers can choose how to use the OTP area,
such as programming serial numbers or other data for permanent storage. The OTP area can't be
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Security – One Time Programmable (OTP)
erased. When ECC is enabled, data written in the OTP area is ECC protected. Besides some additional
configuration bits are described in this section.
Enable OTP Access
OTP access needs to be enabled in order to read and write to the OTP region. When the die is in OTP
operation mode, all subsequent page program or page read commands are applied to the OTP area.
SET FEATURES command (1Fh) with feature address B0h and data 50h (OTP operation mode with ECC
enabled ) or 40h (OTP operation mode with ECC disabled ) are used to enable the OTP access.
After OTP access is enabled, the following sequence is used to program one or more pages
• WRITE ENABLE command (06h)
• PROGRAM EXECUTE command (10h) with the row address of page (OTP page address range
02h-0Bh)
• Verify until OIP bit not busy using GET FEATURE command (0Fh) with feature address C0h
• Using GET FEATURE command (0Fh) with feature address C0h, verify if P_FAIL bit is 0 for the successful operation.
After OTP access is enabled, the following sequence is used to read one or more pages
• PAGE READ command (13h) with the page address (02h-0Bh)
• Verify until OIP bit is not busy using GET FEATURE command (0Fh) with feature address C0h
• Page data using READ FROM CACHE command (03h).
OTP Configuration States
To check the status of OTP data protect, SPI NOR read enable, or permanent block Lock protection, the
following sequence is used
• SET FEATURES command (1Fh) with feature address B0h and data (C0h for OTP data protect bit, 82h
for NOR read protocol enable bit, C2h for permanent block lock disable bit)
• PAGE READ command (13h) with address 0
• Verify until OIP bit not busy using GET FEATURE command (0Fh) with feature address C0h
• READ FROM CACHE command (03h) with address 0
• Expect the read from cache data all 1 for the mode disabled or all 0 for enabled.
Note: Configuration status of CFG[2:0] can be read using GET FEATURE command (0Fh) with feature
address B0h.
OTP Protection and Program Prevention
This mode is used to prevent further programming of the pages in the OTP area. To protect and prevent
programming the OTP area, the following sequence is used
•
•
•
•
SET FEATURES command (1Fh) with feature address B0h and data C0h (CFG[2:0] = 110b)
WRITE ENABLE command (06h)
PROGRAM EXECUTE command (10h) with the row address 00h
Verify until OIP bit not busy and P_FAIL bit 0 using GET FEATURE command (0Fh) with status register address C0h.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Security – One Time Programmable (OTP)
Exit OTP
To exit from OTP operation mode and return the device to normal array operation mode, the SET
FEATURES command (1Fh) is issued. This is followed by setting the feature address = B0h and data
CFG[2:0] = 000b. Last, the RESET (FFh) command is issued.
Table 7: Configuration Registers for Security
CFG2
CFG1
CFG0
0
0
0
Normal operation
0
1
0
Access OTP area/Parameter/Unique ID
1
1
0
Access to OTP data protection bit to lock OTP area
1
0
1
Access to SPI NOR read protocol enable mode
1
1
1
Access to permanent block lock protection disable mode
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Status Register
Status Register
The device has an 8-bit status register that software can read during the device operation. All bits are
read-only register except WEL, which could be changed by WRITE DISABLE (04h) and WRITE ENABLE
(06h) commands. None of bits can be changed by SET FEATURE (1Fh) command. The status register
can be read by issuing the GET FEATURE (0Fh) command, followed by the feature address (C0h). The
status register will output the status of the operation.
Table 8: Status Register Bit Descriptions
Bit
Bit Name
7
Cache read busy
(CRBSY)
This bit is set (CRBSY = 1) when READ PAGE CACHE RANDOM command is executing; this
bit remains a 1 until the page specified at READ PAGE CACHE RANDOM command is transferred from array to data register. When the bit is 0, the device is in the ready state and
background READ PAGE CACHE operation is completed.
RESET command is acceptable during CRBSY = 1 and could halt background READ PAGE
CACHE operation and download first page at block 0 into cache register at default.
6
ECC status register
(ECCS2)
5
ECC status register
(ECCS1)
4
ECC status register
(ECCS0)
See ECC Protection for the ECC status definition.
ECC status is set to 000b either following a RESET or at the beginning of the READ. It is
then updated after the device completes a valid READ operation.
ECC status is invalid if ECC is disabled (via a SET FEATURE command to get access the configuration register).
After a power-up RESET, ECC status is set to reflect the contents of block 0, page 0.
3
Program fail
(P_Fail)
2
Erase fail
(E_Fail)
Indicates that an erase failure has occurred (E_Fail = 1). This bit will also be set if the user
attempts to erase a locked region or if the ERASE operation fails.
This bit is cleared (E_Fail = 0) at the start of the BLOCK ERASE command sequence or a
RESET command.
1
Write enable latch
(WEL)
Indicates the current status of the write enable latch (WEL) and must be set (WEL = 1)
prior to issuing a PROGRAM EXECUTE or BLOCK ERASE command. It is set by issuing the
WRITE ENABLE command.
WEL can also be cleared (WEL = 0) by issuing the WRITE DISABLE command or a successful
PROGRAM/ERASE operation.
0
Description
Indicates that a program failure has occurred (P_Fail = 1). This bit will also be set if the
user attempts to program a locked or protected region, including the OTP area.
This bit is cleared during the PROGRAM EXECUTE command sequence or a RESET command (P_Fail = 0).
Operation in progress This bit is set (OIP = 1 ) when a PROGRAM EXECUTE, PAGE READ, READ PAGE CACHE LAST,
(OIP)
BLOCK ERASE, READ PAGE CACHE RANDOM (within tRCBSY to wait for cache register
readiness), RESET command, or a power-up initialization is executing; the device is busy.
When the bit is 0, the interface is in the ready state.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
ECC Protection
ECC Protection
The device offers an 8-bit data corruption protection by offering internal ECC to obtain the data integrity. The internal ECC can be enabled or disabled by setting the ECC_EN bit in the configuration
register. ECC is enabled after device power-up by default. The READ and PROGRAM commands
operate with internal ECC by default. Reset will not change the existing configuration. To
enable/disable ECC after power on, perform the following command sequence:
• Issue the SET FEATURES command (1Fh)
• Issue configuration register address (B0h)
• Then: To enable ECC, set bit 4 (ECC enable) to 1; To disable ECC, clear bit 4 (ECC enable) to 0
During a PROGRAM operation, the device calculates an expected ECC code on the ECC-protected
bytes in the cache register, before the page is written to the NAND Flash array. The ECC code is stored
in the spare area of the page.
During a READ operation, the page data is read from the array to the cache register, where the ECC
code is calculated and compared with the expected ECC code value read from the array. If a 1–8-bit
error is detected, the error is corrected in the cache register. Only corrected data is output on the I/O
bus. The ECC status register bit indicates whether or not the error correction is successful. The table
below describes the ECC protection scheme used throughout a page.
Note:The unique ID and parameter page are not ECC-protected areas. Multiple copies are provided for
parameter page to obtain the data integrity. XOR method is provided for unique ID to verify the data.
With internal ECC, users must accommodate the following (details provided in table below):
• Spare area definitions
• WRITEs are supported for main and spare areas (user meta data I and II). WRITEs to the ECC area are
prohibited
When using partial-page programming, the following conditions must both be met:
• In the main user area and user meta data area I, single partial-page programming operations must
be used
• Within a page, a maximum of four partial-page programming operations can be performed
Table 9: ECC Status Register Bit Descriptions
Bit 2
Bit 1
Bit 0
Description
0
0
0
No errors
0
0
1
1-3 bit errors detected and corrected
0
1
0
Bit errors greater than 8 bits detected and not corrected
0
1
1
4-6 bit errors detected and corrected. Indicates data refreshment might be taken
1
0
1
7-8 bit errors detected and corrected. Indicates data refreshment must be taken to guarantee
data retention
Others
Reserved
Table 10: ECC Protection
Max Byte
Address
Min Byte
Address
ECC
Protected
Area
Description
1FFh
000h
Yes
Main 0
User Main data 0
3FFh
200h
Yes
Main 1
User Main data 1
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
ECC Protection
Table 10: ECC Protection (Continued)
Max Byte
Address
Min Byte
Address
ECC
Protected
Area
Description
5FFh
400h
Yes
Main 2
User Main data 2
7FFh
600h
Yes
Main 3
User Main data 3
803h
800h
No
Spare 0
Reserved (bad block data)
807h
804h
No
Spare 1
User meta data II
80Bh
808h
No
Spare 2
User meta data II
80Fh
80Ch
No
Spare 3
User meta data II
813h
810h
No
Spare 0
User meta data II
817h
814h
No
Spare 1
81Bh
818h
No
Spare 2
81Fh
81Ch
No
Spare 3
827h
820h
Yes
Spare 0
82Fh
828h
Yes
Spare 1
837h
830h
Yes
Spare 2
83Fh
838h
Yes
Spare 3
84Fh
840h
Yes
Spare 0
ECC for Main/Spare 0
85Fh
850h
Yes
Spare 1
ECC for Main/Spare 1
86Fh
860h
Yes
Spare 2
ECC for Main/Spare 2
87Fh
870h
Yes
Spare 3
ECC for Main/Spare 3
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Error Management
Error Management
This NAND Flash device is specified to have the minimum number of valid blocks (NVB) of the total
available blocks per die shown in the table below. This means the devices may have blocks that are
invalid when shipped from the factory. An invalid block is one that contains at least one page that has
more bad bits than can be corrected by the minimum required ECC. Additional bad blocks may
develop with use. However, the total number of available blocks will not fall below NVB during the
endurance life of the product.
Although NAND Flash memory devices may contain bad blocks, they can be used reliably in systems
that provide bad-block management and error-correction algorithms. This ensures data integrity.
Internal circuitry isolates each block from other blocks, so the presence of a bad block does not affect
the operation of the rest of the NAND Flash array.
NAND Flash devices are shipped from the factory erased. The factory identifies invalid blocks before
shipping by attempting to program the bad-block mark into every location in the first page of each
invalid block. It may not be possible to program every location in an invalid block with the bad-block
mark. However, the first spare area location in each bad block is guaranteed to contain the bad-block
mark. This method is compliant with ONFI factory defect mapping requirements. See the following
table for the bad-block mark.
System software should initially check the first spare area location for non-FFh data on the first page
of each block prior to performing any program or erase operations on the NAND Flash device. A
bad-block table can then be created, enabling system software to map around these areas. Factory
testing is performed under worst-case conditions. Because invalid blocks may be marginal, it may not
be possible to recover the bad-block marking if the block is erased.
Table 11: Error Management Details
Description
Requirement
Minimum number of valid blocks (NVB)
1004
Total available blocks
1024
First spare area location in the first page of each block
Byte 2048
Value programmed for bad block at the first byte of spare area
00h
Minimum required ECC
8-bit ECC per sector (544) bytes of data
Minimum ECC with internal ECC enabled
8-bit ECC per 512 bytes (user data) + 8 bytes
(Spare) + 16 bytes (ECC data)
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
SPI NOR Read Configuration
SPI NOR Read Configuration
Some chipset vendors may have already designed in SPI NOR IP to support system boot; address allocation on clock cycle in SPI NAND read from cache protocol will cause incompatibility. To be drop-in
compatible to SPI NOR read protocol, this device offers an alternative solution to implement 03h/0Bh
commands, as are done with SPI NOR. Refer to the Electrical Specifications for detail timing requirement. This solution would be enabled using the following command sequence:
• SET FEATURE command (1Fh) with feature address B0h and CFG bits[2:0] = 101b (access SPI NOR
read protocol enable mode)
• WRITE ENABLE command (06h)
• PROGRAM EXECUTE command (10h) with block/page address all 0
• GET FEATURE command (0Fh) with status register address C0h to check until device is ready (OIP
bit clear) and verify that P_FAIL bit is not set
• SET FEATURE command (1Fh) with feature address B0h and CFG bits[2:0] = 000b (return to normal
operation mode)
• GET FEATURE command (0Fh) at address B0h and CFG bits[2:0] = 101b to verify all 0; all 1 indicates
SPI NOR mode not enabled.
It is a nonvolatile configuration setting and power cycle will not recover it back to SPI NAND default
mode. The rest of the SPI NAND commands still work in this configuration.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
SPI NOR Read Configuration
Figure 28: Read from Cache (03h)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
SCK
11 dummy bits
12-bit column
address
Plane select
(bit 12)
Command (03h)
CS#
12
SI
11
10
9
SO
1
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
16,919
16,927
SCK
CS#
SI
12-bit column address
7
8
7
6
5
4
3
2
1
0
data out 1
SO
7
6
5
4
3
data out 2176
2
1
0
7
6
5
4
3
2
1
0
7
6
1
Don’t Care
Note: 1. SPI NOR compatible. Plane select bit not available in 1Gb device and can be used as a dummy bit.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
SPI NOR Read Configuration
Figure 29: Fast Read from Cache (0Bh)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
SCK
11 dummy bits
12-bit column
address
Plane select
(bit 12)
Command (0Bh)
CS#
12
SI
11
10
9
SO
1
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
SCK
CS#
SI
12-bit column address
7
8
7
6
5
4
3
1 dummy byte
2
1
data out 1
0
SO
7
6
5
4
3
2
1
1
0
7
6
Don’t Care
Note: 1. SPI NOR compatible. Plane select bit not available in 1Gb device and can be used as a dummy bit.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Power-Up and Power-Down
Power-Up and Power-Down
During the power-up and power-down, the device must not be selected; that is, CS# must follow the
voltage applied on VCC until VCC reaches the correct values: VCC, min at power-up and VSS at
power-down. Micron NAND Flash devices are designed to prevent data corruption during power transitions. VCC is internally monitored. After the device VCC has reached the VCC, min, GET FEATURE
command can be issued to poll the status register (OIP) before the first access. Normal precautions
must be taken for supply line decoupling to stabilize the VCC supply. Each device in a system should
have the VCC line decoupled by a suitable capacitor (recommended 4.7µF + 0.1µF) close to the package
pins.
Note: For power cycle testing, the system must not initiate the power-up sequence until VCC drops
down to 0V.
Figure 30: SPI Power-Up
VCC
VCC,max
Chip selection not allowed
VCC,min
Chip
reset
VWI
tPOR
Polling allowed
Device fully accessible
Status register OIP bit 0
Time
This device supports default device initialization that does not require RESET (FFh) command. When
device VCC has reached the write inhibit voltage, the device automatically starts the initialization. At
default setting, first page data is automatically loaded into cache register. During the initialization, GET
FEATURE command can be issued to poll the status register (OIP) before the first access; Or, the first
access can occur 1.25ms (for 3.3V) or 2ms (for 1.8V) after VCC reaches VCC,min.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Power-Up and Power-Down
Figure 31: Automatic Device Initialization
Mode 3
SCK
Mode 0
VCC,min = 1.7V
VCC
WP#
Power-up: 1st page
autoload = 1.25ms1
CS#
SI
SO
Read from cache (03h, 3Bh, or 6Bh)
High-Z
Don’t Care
Notes: 1. A = 1.25ms for 3.3V, 2ms for 1.8V.
2. B = 2.7V for 3.3V, 1.7V for 1.8V.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Electrical Specifications
Electrical Specifications
Stresses greater than those listed can cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions above values in this specification is not guaranteed. Exposure to absolute maximum rating conditions for extended periods can
affect reliability.
Table 12: Absolute Maximum Ratings
Parameter
Symbol
Min
Max
Unit
Supply voltage (SPI)
VCC
–0.6
4.6
V
I/O voltage
VCC
–0.6
4.6
V
Operating temperature (ambient)
TA
–40
85
Storage temperature
TS
–65
150
°C
°C
Notes: 1. During infrequent, nonperiodic transitions and for periods less than 20ns, voltage potential between VSS and VCC
may undershoot to –2.0V or overshoot to VCC_MAX + 2.0V.
Table 13: Operating Conditions
Parameter
Symbol
Min
Typ
Max
Unit
Supply voltage
VCC
2.7
3.3
3.6
V
Ambient operating temperature (industrial)
TA
–40
25
85
°C
Table 14: AC Measurement Conditions
Parameter
Symbol
Min
Max
Unit
30/10
pF
Load Capacitance
CL
Input rise and fall time
–
–
5
ns
Input rise and fall time (>100 MHz)
–
–
1.5
ns
Input pulse voltage1
–
0.2 VCC
0.8 VCC
V
Input timing reference voltages
–
0.3 VCC
0.7 VCC
V
Output timing reference voltages
–
VCC/2
V
Notes: 1. These are Min/Max specifications for dual/quad operations.
Figure 32: AC Measurement I/O Waveform
I/O timing
reference levels
Input levels
0.8 VCC
0.7 VCC
0.5 VCC
0.3 VCC
0.2 VCC
Table 15: Capacitance
Description
Symbol
Test
Conditions
Min
Max
Unit
CIN
VOUT = 0V
–
9
pF
Input/output capacitance (IO0, IO1, IO2, IO3)
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Electrical Specifications
Table 15: Capacitance (Continued)
Description
Symbol
Test
Conditions
Min
Max
Unit
CIN
VIN = 0V
–
9
pF
Input capacitance (other pins)
Notes: 1. These parameters are verified in device characterization and are not 100% tested.
2. The value includes the silicon and package together.
Table 16: DC Characteristics
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Input high voltage
VIH
–
–
VCC + 0.4
V
Input low voltage
VIL
–
0.7 × VCC
–0.5
–
V
Output high voltage
VOH
IOH = –100µA
VCC - 0.2
–
0.3 × VCC
–
V
Output low voltage
VOL
IOL = 1.6mA
–
–
0.4
V
Input leakage current
ILI
–
–
–
Output leakage current
ILO
–
–
–
±10
Sequential READ current,
3.3V Vcc(x1)
ICC2
SCK = 0.1VCC / 0.9VCC at
133MHz, SO = open
±10
µA
TBD
mA
Continuous Read, 3.3v
Vcc (x1)
ICC2
SCK = 0.1VCC / 0.9VCC at 133
MHz
TBD
mA
Page read current
ICC3
–
–
25
35
mA
Program current
ICC4
–
–
20
25
mA
Erase current
ICC5
–
–
20
25
mA
Standby current
ICC1
CE# = VCC; VIN = VSS or VCC
–
15
50
µA
µA
Notes: 1. Typical values are given for TA = 25 °C.
2. These parameters are verified in device characterization and are not 100% tested.
3. Continuous read currents is average current measured over any complete block read. No Load, random data
pattern.
Table 17: AC Characteristics
Parameter
Clock
Symbol
frequency1, 2
Min
Max
Unit
C
–
133
MHz
f
Clock LOW time
t
WL
3.375
–
ns
Clock HIGH time
tWH
3.375
–
ns
Clock LOW time (SPI NOR read 03h mode at 20 MHz)
tWL
22.5
–
ns
Clock HIGH time (SPI NOR read 03h mode at 20 MHz)
t
WH
22.5
–
ns
Clock rise time
tCRT
1.3
–
V/ns
Clock fall time
t
CFT
1.3
tCS
30
–
ns
tCSS/tCSH
3.375
–
ns
Command deselect time
Chip select# active setup/hold time relative to SCK
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V/ns
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Electrical Specifications
Table 17: AC Characteristics (Continued)
Parameter
Symbol
Min
Max
Unit
Chip select# non-active setup/hold time relative to SCK
tCSH
2.5
–
ns
Output disable time
tDIS
–
6
ns
Data input setup time
tSUDAT
2.5
–
ns
Data input hold time
tHDDAT
1.75
–
ns
Clock LOW to output valid (30pF)
t
V
–
6
ns
Clock LOW to output valid (10pF)
tV
–
5
ns
Clock LOW to output valid (similar to SPI NOR 20 MHz read 30pF)
tV
–
30
ns
Clock LOW to output valid (similar to SPI NOR 20 MHz read 10pF)
tV
–
28
ns
Output hold time (30pF)
tHO
2
–
ns
Output hold time (10pF)
t
1.5
–
ns
Output hold time (SPI NOR similar to 20 MHz read 30pF)
t
HO
0
–
ns
Output hold time (SPI NOR similar to 20 MHz read 10pF)
tHO
0
–
ns
WP# hold time
tWPH
100
–
ns
WP# setup time
tWPS
20
–
ns
HO
Notes: 1. Read from Cache Dual I/O (BBh) and Quad I/O (EBh) can run up to 108 MHz.
2. When read protocol similar to SPI NOR is enabled, Read from Cache 03h command can run up to 20 MHz, while
read from Cache 0Bh command can run up to 133 MHz.
Table 18: PROGRAM/READ/ERASE Characteristics
Parameter
BLOCK ERASE operation time (128KB)
PROGRAM PAGE operation time (ECC disabled)
Symbol
Typ
Max
Unit
tERS
2
10
ms
tPROG
200
600
220
600
µs
–
25
46
70
–
5
40
50
tPOR
–
1.25
ms
VWI
–
2.5
V
RST1
–
30/35/525
–
75/80/570
µs
–
4
PROGRAM PAGE operation time (ECC enabled)
Page read time (ECC disabled)
tRD
Page read time (ECC enabled)
Data transfer time from data register to cache register (internal ECC disabled)
tRCBSY
Data transfer time from data register to cache register (internal ECC enabled)
Power-on reset time (device initialization) from VCC MIN
Write inhibit voltage
Reset time for READ, PROGRAM, and ERASE operations (internal ECC disabled)
t
Reset time for READ, PROGRAM, and ERASE operations (internal ECC enabled)
Number of partial-page programming operations supported
NOP2
µs
µs
µs
µs
–
Notes: 1. For first RESET condition after power-up, tRST will be 1.25ms maximum. For stacked die, no command should be
issued during this time.
2. In the main user area and in user meta data area I, single partial-page programming operations must be used.
Within a page, the user can perform a maximum of four partial-page programming operations.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Electrical Specifications
Figure 33: WP# Timing
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
SCK
CS#
Command (1Fh)
Address (A0h)
7
SI
6
5
MSB
tWPS
4
3
Data byte
2
1
0
7
6
5
4
3
2
MSB
WP#
1
17
18
19
20
21
22
23
SCK
CS#
Data byte
SI
6
5
4
3
2
1
0
tWPH
WP#
1
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Electrical Specifications
Figure 34: Serial Input Timing
tCSH
tCSS
tCSH
tCFT
tCSS
tCRT
SCK
tCS
CS#
tHDDAT
tSUDAT
MSB
SI
SO
LSB
High-Z
Don’t Care
Figure 35: Serial Output Timing
tWL
tWH
SCK
CS#
tHO
SO
tV
tHO
High-Z
tDIS
LSB OUT
Don’t Care
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Package Dimensions
Package Dimensions
Figure 36: 16-pin SOP (300 mils body width) – Package Code: SF
0.5 ±0.25 X 45°
10.3 ±0.2
2.5 ±0.15
16X 0.2 ±0.1
0.1 A
0.275 ±0.045
16X 0.42 ±0.09
See Detail A
1.27 TYP
16
9
Plating material composition: PPF
(0.003μm–0.015μm Au, 0.02μm–0.15μm Pd,
0.5μm–2.0μm Ni).
Plastic package material: epoxy novolac.
10.3 ±0.2
7.5 ±0.1
Pin 1 ID
1
Package width and length do not
include mold protrusion. Allowable
protrusion is 0.25 per side.
8
0.25 gage plane
Seating plane
0.2 ±0.1
(for reference
only)
0.83 ±0.44
Detail A
Note: 1. All dimensions are in millimeters.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Package Dimensions
Package Dimensions
Figure 37: 8-pin U-PDFN (MLP8) 8mm x 6mm x 0.65mm – Package Code: WB
Note: 1. All dimensions are in millimeters.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Package Dimensions
Package Dimensions
Figure 38: 24-Pin T-PBGA (5 x 5 Ball Grid Array) 6mm x 8mm – Package Code: 12
Note: 1. All dimensions are in millimeters.
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1Gb 3.3V x1, x2, x4: SPI NAND Flash Memory
Revision History
Revision History
Rev. H – 02/22
• Updated Package Dimensions figures
Rev. G – 11/16
• Updated Table 11 for a typo
• Updated Power-up and Power-down section
Rev. F – 10/16
• Updated legal status to Production
• Updated AC Characteristics table for NOR 03h cache read mode
Rev. E – 06/16
•
•
•
•
•
Added uncycled data retention
Updated PROGRAM/ERASE cycle to 100,000
Updated byte 105 and 106 of the parameter table for P/E of 100,000
Added permanent block lock
Revised OTP section
Rev. D – 05/16
•
•
•
•
Updated error management table
Replaced W9 package with WB UDFN
Updated the parameter page data
Updated IO capacitance to 9pF
Rev. C – 01/16
•
•
•
•
•
Updated functional block diagram
Updated the parameter table
Updated electrical specifications per characterization data
Updated read x4 timing diagram
Updated read and program timing diagrams to reflect 2Gb and 1Gb dummy bits
Rev. B – 09/15
• Updates to ensure consistency with NAND technology
Rev. A – 06/15
• Initial release
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006
208-368-4000, micron.com/support
Micron and the Micron logo are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization sometimes
occur.
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