MT29F2G16ABAEAWP-IT:E

Micron Technology, Inc. 8000 S. Federal Way PO Box 6 Boise, ID United States 83707-0006 Product Change Notice Micron PCN: 31053 Date: 11/19/2013 Type Of Change: Manufacturing Site Change Title of Change: 34nm SLC NAND Fab Site Transition from Utah (USA-Fab2) to Virginia (USA-Fab6) Description of Change: Fabrication of Micron's 1Gb 34nm (M68A, M68M), 2Gb 34nm (M69A), 4Gb 34nm (M60A), 8Gb 34nm (M61A), 16Gb 34nm (M62B) will move from Utah (USA-Fab2) to Virginia (USA-Fab6). Transition out of the Fab2 in Utah will be complete by June, 2014 Reason for Change: Optimization of Manufacturing Efficiency Contact Information: AMERICAS: ARAVIND RAMAMOORTHY ARAMAMO@MICRON.COM EMEA: MAURIZIO BELTRAMELLO MBELTRAM@MICRON.COM ASIA-PACIFIC: JINGWEN YANG JYANG@MICRON.COM JAPAN: DAIGO TOYAMA DTOYAMA@MICRON.COM Product Affected: All 34nm SLC NAND Flash:  1Gb 34nm (M68A, M68M),  2Gb 34nm (M69A),  4/8Gb/16Gb 34nm (M60A),  8Gb 34nm (M61A),  16/32/64/128Gb 34nm (M62B).  eUSB Parts Affected Micron Part Numbers 1Gb - M68A MT29F1G01AAADDH4:D MT29F1G01AAADDH4-IT:D MT29F1G01AAADDH4-ITX:D MT29F1G08ABADAH4:D MT29F1G08ABADAH4-E:D MT29F1G08ABADAH4-IT:D MT29F1G08ABADAH4-ITE:D MT29F1G08ABADAH4-ITX:D MT29F1G08ABADAM68A3WC1 MT29F1G08ABADAWP:D 1Gb - M68M MT29F1G08ABAEAH4:E MT29F1G08ABAEAH4-IT:E MT29F1G08ABAEAH4-ITX:E MT29F1G08ABAEAM68M3WC1 MT29F1G08ABAEAWP:E MT29F1G08ABAEAWP-IT:E MT29F1G08ABAEAWP-ITX:E MT29F1G08ABADAWP-E:D MT29F1G08ABADAWP-IT:D MT29F1G08ABADAWP-ITE:D MT29F1G08ABADAWP-ITX:D MT29F1G08ABBDAGE-IT:D MT29F1G08ABBDAH4:D MT29F1G08ABBDAH4-IT:D MT29F1G08ABBDAH4-ITE:D MT29F1G08ABBDAH4-ITX:D MT29F1G08ABBDAHC:D MT29F1G08ABBDAHC-IT:D MT29F1G08ABBDAM68A3WC1 MT29F1G08ABBDAMD-IT:D MT29F1G16ABBDAH4:D MT29F1G16ABBDAH4-IT:D MT29F1G16ABBDAH4-ITX:D MT29F1G16ABBDAHC:D MT29F1G16ABBDAHC-IT:D MT29F1G16ABBDAM68A3WC1 MT29F1G16ABBDAMD-IT:D MT29F1G08ABBEAH4:E MT29F1G08ABBEAH4-IT:E MT29F1G08ABBEAH4-ITX:E MT29F1G08ABBEAHC:E MT29F1G08ABBEAHC-IT:E MT29F1G08ABBEAM68M3WC1 MT29F1G08ABBEAMD-IT:E MT29F1G16ABBEAH4:E MT29F1G16ABBEAH4-IT:E MT29F1G16ABBEAH4-ITX:E MT29F1G16ABBEAHC:E MT29F1G16ABBEAHC-IT:E MT29F1G16ABBEAM68M3WC1 MT29F1G16ABBEAMD-IT:E Note: Per JEDEC Standard JESD46-C Section 3.2.3; lack of acknowledgment of this PCN within 30 days constitutes acceptance of change 1 of 3 Micron Confidential and Proprietary Information 2Gb MT29F2G01AAAEDH4:E MT29F2G08ABAEAM69A3WC1 MT29F2G08ABBEAM69A3WC1 MT29F2G01AAAEDH4-IT:E MT29F2G08ABAEAWP:E MT29F2G16ABAEAM69A3WC1 MT29F2G01AAAEDH4-ITX:E MT29F2G08ABAEAWP-E:E MT29F2G16ABAEAWP:E MT29F2G01AAAEDHC:E MT29F2G08ABAEAWP-IT:E MT29F2G16ABAEAWP-IT:E MT29F2G01AAAEDHC-IT:E MT29F2G08ABAEAWP-ITX:E MT29F2G16ABBEAH4:E MT29F2G08ABAEAH4:E MT29F2G08ABBEAH4:E MT29F2G16ABBEAH4-IT:E MT29F2G08ABAEAH4-E:E MT29F2G08ABBEAH4-IT:E MT29F2G16ABBEAHC:E MT29F2G08ABAEAH4-IT:E MT29F2G08ABBEAH4-ITX:E MT29F2G16ABBEAHC-IT:E MT29F2G08ABAEAH4-ITE:E MT29F2G08ABBEAHC:E MT29F2G16ABBEAM69A3WC1 MT29F2G08ABAEAH4-ITX:E MT29F2G08ABBEAHC-IT:E 4Gb MT29F4G01AAADDHC:D MT29F4G08ABADAWP-E:D MT29F4G16ABADAM60A3WC1 MT29F4G01AAADDHC-IT:D MT29F4G08ABADAWP-IT:D MT29F4G16ABADAWP:D MT29F4G01AAADDHC-ITX:D MT29F4G08ABADAWP-ITX:D MT29F4G16ABADAWP-IT:D MT29F4G01AAADDM60A3WC1 MT29F4G08ABBDAH4:D MT29F4G16ABBDAH4:D MT29F4G01AADDEM60A3WC1 MT29F4G08ABBDAH4-IT:D MT29F4G16ABBDAH4-IT:D MT29F4G08ABADAH4:D MT29F4G08ABBDAH4-ITE:D MT29F4G16ABBDAHC:D MT29F4G08ABADAH4-E:D MT29F4G08ABBDAH4-ITX:D MT29F4G16ABBDAHC-IT:D MT29F4G08ABADAH4-IT:D MT29F4G08ABBDAHC:D MT29F4G16ABBDAM60A3WC1 MT29F4G08ABADAH4-ITE:D MT29F4G08ABBDAHC-IT:D MT29F4G16ABBDAWP:D MT29F4G08ABADAH4-ITX:D MT29F4G08ABBDAM60A3WC1 MT29F4G16ABBDAWP-IT:D MT29F4G08ABADAM60A3WC1 MT29F4G16ABADAH4:D MT29F4G08ABADAWP:D MT29F4G16ABADAH4-IT:D 8Gb MT29F8G08ABABAM61A3WC1 MT29F8G08ABCBBH1-12:B MT29F8G08ADBDAH4-IT:D MT29F8G08ABABAWC-IT:B MT29F8G08ABCBBH1-12IT:B MT29F8G16ADADAH4:D MT29F8G08ABABAWP:B MT29F8G08ADADAH4:D MT29F8G16ADADAH4-IT:D MT29F8G08ABABAWP-IT:B MT29F8G08ADADAH4-E:D MT29F8G16ADBDAH4:D MT29F8G08ABABAWP-ITX:B MT29F8G08ADADAH4-IT:D MT29F8G16ADBDAH4-IT:D MT29F8G08ABCBBH1-10:B MT29F8G08ADADAH4-ITE:D MT29F8G08ABCBBH1-10IT:B MT29F8G08ADBDAH4:D 16Gb MT29F16G08ABABAWC:B MT29F16G08ABCBBH1-12P:B MT29F16G08AFABAWP-IT:B MT29F16G08ABABAWP:B MT29F16G08ABEBBM62B3WC1 MT29F16G08AJADAWP:D MT29F16G08ABABAWP-IT:B MT29F16G08AFABAWC:B MT29F16G08AJADAWP-IT:D MT29F16G08ABCBBH1-12:B MT29F16G08AFABAWC-IT:B MT29F16G08ABCBBH1-12IT:B MT29F16G08AFABAWP:B Note: Per JEDEC Standard JESD46-C Section 3.2.3; lack of acknowledgment of this PCN within 30 days constitutes acceptance of change 2 of 3 Micron Confidential and Proprietary Information 32Gb MT29F32G08ADCBBH1-12:B MT29F32G08AECBBH1-12IT:B MT29F32G08AFABAWP:B MT29F32G08AECBBH1-12:B MT29F32G08AECBBH1-12P:B MT29F32G08AFABAWP-IT:B MT29F64G08AJABAWP:B MT29F64G08AKCBBH2-12IT:B MT29F64G08AMCBBH2-12IT:B MT29F64G08AJABAWP-IT:B MT29F64G08AKCBBH2-12P:B MT29F64G08AMCBBH2-12P:B MT29F64G08AJABAWP-P:B MT29F64G08AKCBBH2-12Q:B MT29F64G08AKCBBH2-12:B MT29F64G08AMCBBH2-12:B 64Gb 128Gb MT29F128G08AUCBBH3-12:B MT29F128G08AUCBBH3-12IT:B MT29F128G08AUCBBH3-12P:B MTEDCAE002SAJ-1M2 MTEDCAR004SAJ-1N2IT MTEDCBE016SAJ-1N2 MTEDCAE002SAJ-1M2IT MTEDCAR008SAJ-1N2 MTEDCBE016SAJ-1N2IT MTEDCAE004SAJ-1N2 MTEDCAR008SAJ-1N2IT MTEDCBR002SAJ-1M2 MTEDCAE004SAJ-1N2IT MTEDCAR016SAJ-1N2 MTEDCBR002SAJ-1M2IT MTEDCAE008SAJ-1N2 MTEDCAR016SAJ-1N2IT MTEDCBR004SAJ-1N2 MTEDCAE008SAJ-1N2IT MTEDCBE002SAJ-1M2 MTEDCBR004SAJ-1N2IT MTEDCAE016SAJ-1N2 MTEDCBE002SAJ-1M2IT MTEDCBR008SAJ-1N2 MTEDCAE016SAJ-1N2IT MTEDCBE004SAJ-1N2 MTEDCBR008SAJ-1N2IT MTEDCAR002SAJ-1M2 MTEDCBE004SAJ-1N2IT MTEDCBR016SAJ-1N2 MTEDCAR002SAJ-1M2IT MTEDCBE008SAJ-1N2 MTEDCBR016SAJ-1N2IT MTEDCAR004SAJ-1N2 MTEDCBE008SAJ-1N2IT eUSB Method of Identification: Packing container label: the inner packing container label will change from"Fab2" (Utah-USA) to "Fab6" (VirginiaUSA). Please refer to Micron Customer Service Note-11 for detailed description of inner packing container label (http://download.micron.com/pdf/csnotes/csn11.pdf) Micron Sites Affected: Utah (USA-FAB2) and Virginia (USA-Fab6) 1Gb 34nm (M68A) 1Gb 34nm (M68M) 2Gb 34nm (M69A) 4Gb 34nm (M60A) 2GB eUSB 8Gb (M61A) 4GB/8GB/16GB eUSB 16/32/64/128Gb (M62B) Sample Available: 15-Jan-14 28-Feb-14 15-Jan-14 15-Jan-14 28-Feb-14 31-Dec-13 Qual Data Available: 15-Jan-14 28-Feb-14 15-Jan-14 15-Jan-14 28-Feb-14 Now Product Ship Date: 15-Feb-14 31-Mar-14 17-Feb-14 15-Feb-14 31-Mar-14 31-Jan-14 Product Ship: Transition out of the Fab2 in Utah will be complete by June, 2014. Note: Per JEDEC Standard JESD46-C Section 3.2.3; lack of acknowledgment of this PCN within 30 days constitutes acceptance of change 3 of 3 Micron Confidential and Proprietary Information