0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
会员中心
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
APTM120DA30CT1G

APTM120DA30CT1G

  • 厂商:

    MICROSEMI(美高森美)

  • 封装:

    SP1

  • 描述:

    MOSFET N-CH 1200V 31A SP1

  • 数据手册
  • 价格&库存
APTM120DA30CT1G 数据手册
APTM120DA30CT1G Boost chopper MOSFET + SiC chopper diode Power Module 5 6 11 VDSS = 1200V RDSon = 300mΩ typ @ Tj = 25°C ID = 31A @ Tc = 25°C Application • • • AC and DC motor control Switched Mode Power Supplies Power Factor Correction CR1 3 4 Features NTC • Q2 9 10 1 2 Power MOS 8™ MOSFET - Low RDSon - Low input and Miller capacitance - Low gate charge - Avalanche energy rated - Very rugged 12 • SiC Schottky Diode - Zero reverse recovery - Zero forward recovery - Temperature Independent switching behavior - Positive temperature coefficient on VF • • • Benefits • • • • • • Outstanding performance at high frequency operation Direct mounting to heatsink (isolated package) Low junction to case thermal resistance Solderable terminals both for power and signal for easy PCB mounting Low profile RoHS Compliant Max ratings 1200 31 23 195 ±30 360 657 25 Unit V A V mΩ W A Very low stray inductance Internal thermistor for temperature monitoring High level of integration Pins 1/2 ; 3/4 ; 5/6 must be shorted together Absolute maximum ratings Tc = 25°C Tc = 80°C September, 2009 1–5 APTM120DA30CT1G – Rev 0 Symbol VDSS ID IDM VGS RDSon PD IAR Parameter Drain - Source Breakdown Voltage Continuous Drain Current Pulsed Drain current Gate - Source Voltage Drain - Source ON Resistance Maximum Power Dissipation Avalanche current (repetitive and non repetitive) Tc = 25°C These Devices are sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed. See application note APT0502 on www.microsemi.com www.microsemi.com APTM120DA30CT1G All ratings @ Tj = 25°C unless otherwise specified Electrical Characteristics Symbol Characteristic IDSS RDS(on) VGS(th) IGSS Zero Gate Voltage Drain Current Drain – Source on Resistance Gate Threshold Voltage Gate – Source Leakage Current Test Conditions Tj = 25°C VDS =1200V VGS = 0V Tj = 125°C VGS = 10V, ID = 25A VGS = VDS, ID = 2.5mA VGS = ±30 V Min Typ Max 100 500 360 5 ±100 Unit µA mΩ V nA 3 300 4 Dynamic Characteristics Symbol Ciss Coss Crss Qg Qgs Qgd Td(on) Tr Td(off) Tf Characteristic Input Capacitance Output Capacitance Reverse Transfer Capacitance Total gate Charge Gate – Source Charge Gate – Drain Charge Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Test Conditions VGS = 0V VDS = 25V f = 1MHz VGS = 10V VBus = 600V ID = 25A Resistive switching @ 25°C VGS = 15V VBus = 800V ID = 25A RG = 2.2Ω Min Typ 14560 1340 172 560 90 265 100 60 315 90 ns nC Max Unit pF SiC chopper diode ratings and characteristics Symbol Characteristic VRRM Maximum Peak Repetitive Reverse Voltage IRM IF VF QC C Maximum Reverse Leakage Current DC Forward Current Diode Forward Voltage Total Capacitive Charge Total Capacitance IF = 20A Test Conditions VR=1200V Tj = 25°C Tj = 175°C Tc = 100°C Tj = 25°C Tj = 175°C Min 1200 Typ 64 112 20 1.6 2.3 80 192 138 Max 400 2000 1.8 3 Unit V µA A V nC pF IF = 20A, VR = 600V di/dt =1000A/µs f = 1MHz, VR = 200V f = 1MHz, VR = 400V Symbol Characteristic RthJC VISOL TJ TSTG TC Torque Wt Junction to Case Thermal Resistance Operating junction temperature range Storage Temperature Range Operating Case Temperature Mounting torque Package Weight Transistor SiC Diode Min Typ Max 0.19 1 150 125 100 4.7 80 Unit °C/W V °C N.m g RMS Isolation Voltage, any terminal to case t =1 min, I isol ID(on)xRDS(on)MAX 250µs pulse test @ < 0.5 duty cycle TJ=125°C 3 2.5 2 1.5 1 0.5 0 25 50 75 100 125 150 VGS=10V ID=25A 30 20 TJ=25°C 10 0 0 1 2 3 4 5 6 TJ, Junction Temperature (°C) Gate Charge vs Gate to Source VGS, Gate to Source Voltage (V) Capacitance vs Drain to Source Voltage 100000 VDS=600V VGS, Gate to Source Voltage 12 C, Capacitance (pF) 10 8 6 4 2 0 0 100 200 300 400 500 600 VDS=960V ID=25A TJ=25°C VDS=240V Ciss 10000 1000 Coss 100 Crss 10 September, 2009 APTM120DA30CT1G – Rev 0 0 50 100 150 200 Gate Charge (nC) VDS, Drain to Source Voltage (V) www.microsemi.com 4–5 APTM120DA30CT1G Typical SiC Diode Performance Curve Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration 1.2 Thermal Impedance (°C/W) 1 0.8 0.6 0.4 0.2 0.9 0.7 0.5 0.3 0.1 0.05 0 0.00001 0.0001 0.001 Single Pulse 0.01 0.1 1 10 Rectangular Pulse Duration (Seconds) Forward Characteristics Reverse Characteristics 200 TJ=25°C 40 IF Forward Current (A) IR Reverse Current (µA) 30 TJ=75°C 150 20 TJ=125°C 100 TJ=75°C TJ=125°C TJ=175°C TJ=25°C 10 TJ=175°C 50 0 0 0.5 1 1.5 2 2.5 3 3.5 VF Forward Voltage (V) Capacitance vs.Reverse Voltage 0 400 600 800 1000 1200 1400 1600 VR Reverse Voltage (V) 1400 C, Capacitance (pF) 1200 1000 800 600 400 200 0 1 10 100 VR Reverse Voltage 1000 September, 2009 5–5 APTM120DA30CT1G – Rev 0 Microsemi reserves the right to change, without notice, the specifications and information contained herein Microsemi's products are covered by one or more of U.S patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583 4,748,103 5,283,202 5,231,474 5,434,095 5,528,058 6,939,743 7,352,045 5,283,201 5,801,417 5,648,283 7,196,634 6,664,594 7,157,886 6,939,743 7,342,262 and foreign patents. U.S and Foreign patents pending. All Rights Reserved. www.microsemi.com
APTM120DA30CT1G 价格&库存

很抱歉,暂时无法提供与“APTM120DA30CT1G”相匹配的价格&库存,您可以联系我们找货

免费人工找货