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APTM120DA30T1G

APTM120DA30T1G

  • 厂商:

    MICROSEMI(美高森美)

  • 封装:

    SP1

  • 描述:

    MOSFET N-CH 1200V 31A SP1

  • 数据手册
  • 价格&库存
APTM120DA30T1G 数据手册
APTM120DA30T1G Boost chopper MOSFET Power Module 5 6 11 VDSS = 1200V RDSon = 300mΩ typ @ Tj = 25°C ID = 31A @ Tc = 25°C Application CR1 3 4 • • • NTC AC and DC motor control Switched Mode Power Supplies Power Factor Correction Features • Power MOS 8™ MOSFETs - Low RDSon - Low input and Miller capacitance - Low gate charge - Avalanche energy rated - Very rugged Very low stray inductance Internal thermistor for temperature monitoring High level of integration Q2 9 10 1 2 12 • • • Benefits • • • • • • Outstanding performance at high frequency operation Direct mounting to heatsink (isolated package) Low junction to case thermal resistance Solderable terminals both for power and signal for easy PCB mounting Low profile RoHS Compliant Pins 1/2 ; 3/4 ; 5/6 must be shorted together Absolute maximum ratings Symbol VDSS ID IDM VGS RDSon PD IAR Parameter Drain - Source Breakdown Voltage Continuous Drain Current Pulsed Drain current Gate - Source Voltage Drain - Source ON Resistance Maximum Power Dissipation Avalanche current (repetitive and non repetitive) Tc = 25°C Tc = 80°C Max ratings 1200 31 23 195 ±30 360 657 25 Unit V A V mΩ W A December, 2007 1–5 APTM120DA30T1G – Rev 0 Tc = 25°C These Devices are sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed. See application note APT0502 on www.microsemi.com www.microsemi.com APTM120DA30T1G All ratings @ Tj = 25°C unless otherwise specified Electrical Characteristics Symbol Characteristic IDSS RDS(on) VGS(th) IGSS Zero Gate Voltage Drain Current Drain – Source on Resistance Gate Threshold Voltage Gate – Source Leakage Current Test Conditions Tj = 25°C VDS =1200V VGS = 0V Tj = 125°C VGS = 10V, ID = 25A VGS = VDS, ID = 2.5mA VGS = ±30 V Min Typ Max 100 500 360 5 ±100 Unit µA mΩ V nA 3 300 4 Dynamic Characteristics Symbol Ciss Coss Crss Qg Qgs Qgd Td(on) Tr Td(off) Tf Characteristic Input Capacitance Output Capacitance Reverse Transfer Capacitance Total gate Charge Gate – Source Charge Gate – Drain Charge Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Test Conditions VGS = 0V VDS = 25V f = 1MHz VGS = 10V VBus = 600V ID = 25A Resistive switching @ 25°C VGS = 15V VBus = 800V ID = 25A RG = 2.2Ω Min Typ 14560 1340 172 560 90 265 100 60 315 90 ns nC Max Unit pF Chopper diode ratings and characteristics Symbol Characteristic VRRM Maximum Peak Repetitive Reverse Voltage IRM IF VF trr Qrr Maximum Reverse Leakage Current DC Forward Current Diode Forward Voltage IF = 60A IF = 120A IF = 60A IF = 60A VR = 800V di/dt =200A/µs Test Conditions VR=1200V Tj = 25°C Tj = 125°C Tc = 80°C Min 1200 Typ Max 100 500 Unit V µA A Reverse Recovery Time Reverse Recovery Charge Tj = 125°C Tj = 25°C Tj = 125°C Tj = 25°C Tj = 125°C 60 2.5 3 1.8 265 350 560 2890 3 V ns nC Symbol Characteristic RthJC VISOL TJ TSTG TC Torque Wt Junction to Case Thermal Resistance Operating junction temperature range Storage Temperature Range Operating Case Temperature Mounting torque Package Weight Transistor Diode Min Typ Max 0.19 0.9 150 125 100 4.7 80 Unit °C/W V °C N.m g RMS Isolation Voltage, any terminal to case t =1 min, I isol ID(on)xRDS(on)MAX 250µs pulse test @ < 0.5 duty cycle TJ=125°C 3 2.5 2 1.5 1 0.5 0 25 50 75 100 125 150 VGS=10V ID=25A 30 20 TJ=25°C 10 0 0 1 2 3 4 5 6 TJ, Junction Temperature (°C) Gate Charge vs Gate to Source VGS, Gate to Source Voltage (V) Capacitance vs Drain to Source Voltage 100000 VDS=600V VGS, Gate to Source Voltage 12 C, Capacitance (pF) 10 8 6 4 2 0 0 100 200 300 400 500 600 VDS=960V ID=25A TJ=25°C VDS=240V Ciss 10000 1000 Coss 100 Crss 10 0 50 100 150 200 December, 2007 4–5 APTM120DA30T1G – Rev 0 Gate Charge (nC) VDS, Drain to Source Voltage (V) www.microsemi.com APTM120DA30T1G Typical Diode Performance Curve Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration 1 Thermal Impedance (°C/W) 0.9 0.8 0.7 0.6 0.5 0.4 0.2 0.3 0.1 0.05 0.0001 0.001 Single Pulse 0 0.00001 0.01 0.1 1 10 Rectangular Pulse Duration (Seconds) Forward Current vs Forward Voltage trr, Reverse Recovery Time (ns) 150 IF, Forward Current (A) 125 100 75 50 25 0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 VF, Anode to Cathode Voltage (V) QRR, Reverse Recovery Charge (µC) QRR vs. Current Rate Charge 6 5 4 3 2 1 0 30 A TJ=125°C VR=800V Trr vs. Current Rate of Charge 400 TJ=125°C VR=800V 300 120 A TJ=125°C 200 60 A TJ=25°C 100 0 0 200 400 600 30 A 800 1000 1200 -diF/dt (A/µs) IRRM vs. Current Rate of Charge IRRM, Reverse Recovery Current (A) 7 50 40 30 20 10 0 0 200 400 600 800 1000 1200 -diF/dt (A/µs) TJ=125°C VR=800V 120 A 60 A 30 A 120 A 60 A 0 200 400 600 800 1000 1200 -diF/dt (A/µs) Capacitance vs. Reverse Voltage 400 Max. Average Forward Current vs. Case Temp. 100 80 IF(AV) (A) 60 40 20 0 Duty Cycle = 0.5 TJ=175°C C, Capacitance (pF) 300 100 0 1 10 100 VR, Reverse Voltage (V) 1000 25 50 75 100 125 150 175 Microsemi reserves the right to change, without notice, the specifications and information contained herein Microsemi's products are covered by one or more of U.S patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583 4,748,103 5,283,202 5,231,474 5,434,095 5,528,058 and foreign patents. U.S and Foreign patents pending. All Rights Reserved. www.microsemi.com 5–5 APTM120DA30T1G – Rev 0 Case Temperature (ºC) December, 2007 200
APTM120DA30T1G 价格&库存

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