MMA002AA
5-20GHz, 20dBm P3dB, 18dB Gain
Wideband Amplifier
Features
• 18dB gain with positive gain slope at 5V
• 19dB gain with positive gain slope at 3.3V
• 19dBm P1dB with 26dBm OIP3 at 5V
• ±1dB power flatness
• Input and Output matched to 50Ω
• 1.35mm x 1.5mm x 0.1mm die size
Applications
• Instrumentation
• Electronic warfare
• Microwave communications
• Radar
P1dB, P3dB & OIP3
Gain & Return Loss
Typical Performance (CW, Typical Device, RF Probe): TA = 25°C, VD1 = VD2 = 5V
Parameter
Min
Typ
Max
Units
Frequency
5
-
20
GHz
Small Signal Gain
17.0
18.5
19.5
dB
Input Return Loss
10
12
14
dB
Output Return Loss
8
13
15
dB
Output Power, P1dB
18.0
19.0
20.5
dBm
Output Power P3dB
19.3
20.0
21.5
dBm
Output IP3
-
26
-
dBm
Drain Current
-
105
-
mA
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Table 1: Absolute Maximum Ratings, Not Simultaneous
Parameter
Value
Drain Voltage (VD1, VD2)
+5.5
V
24
dBm
1501
°C
Operating Ambient Temperature (TA)
-55 to +85
°C
Storage Temperature
-65 to 150
°C
TBD (80 est)
°C/W
Input Power (PIN)
Operating Channel Temperature
Thermal Resistasnce, Channel to Die Backside
1
Units
Caution, ESD
Sensitive Device
MTTF > 10 hours at TC = 150°C
8
Table 2: Specifications (CW, 100% Test): TA = 25°C, VD1 = VD2 = 5V
Parameter
Frequency
IDD
Min
Max
Units
-
-
160
mA
Small Signal Gain
6GHz
13.5
-
dB
Output Power, P1dB
6GHz
17.5
-
dBm
Small Signal Gain
18GHz
16.5
-
dB
Output Power, P1dB
18GHz
17.5
-
dBm
RF Probe Measurement Set-Up With Reference Planes1
TO VDD
100nF CAPACITOR
TO GROUND
100nF CAPACITOR
TO GROUND
100pF CAPACITOR
TO GROUND
100pF CAPACITOR
TO GROUND
RFOUT
RFIN
50 TRANSMISSION LINE
MINIMIZE GAP
1mil Au wire used for
all bonds
1
Reference planes are the same for S-parameter files downloadable on www.microsemi.com/mmics
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Typical Performance, RF Probe
VD1 = VD2 = 5V, IDD = 105mA, TA = 25°C unless otherwise noted
S11 Over Temperature, VDD = 3.3V
S11 Over VDD
S11 Over Temperature, VDD = 5.0V
S22 Over VDD
S22 Over Temperature, VDD = 3.3V
S22 Over Temperature, VDD = 5.0V
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Typical Performance, RF Probe
VD1 = VD2 = 5V, IDD = 105mA, TA = 25°C unless otherwise noted
S21 Over Temperature, VDD = 3.3V
S21 Over VDD
NF Over Temperature, VDD = 3.3V
NF Over Temperature, VDD = 5.0V
NF Over VDD
S21 Over Temperature, VDD = 5.0V
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Typical Performance, RF Probe
VD1 = VD2 = 5V, IDD = 105mA, TA = 25°C unless otherwise noted
P3dB Over VDD
P1dB Over VDD
Power Sweep, VDD = 5.0V
Power Sweep, VDD = 3.3V
OIP3, VDD = 5.0V
OIP3, VDD = 3.3V
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Typical Performance, RF Probe
IMD Sweep, VDD = 3.3V
VD1 = VD2 = 5V, IDD = 105mA, TA = 25°C unless otherwise noted
IMD Sweep, VDD = 5.0V
Power and OIP3, VDD = 3.3V
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Connectorized Test Fixture
With SMK 2.92mm Connectors
VD1 Feedthru
0.1uF
VD2 Feedthru
100pF 100pF
RFIN
0.1uF
RFOUT
1.000
0.950
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Typical Performance, Connectorized Test Fixture
VD1 = VD2 = 5V, IDD = 105mA, TA = 25°C unless otherwise noted
S11 Over Temperature
S22 Over Temperature
S21 Over Temperature
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P3dB Over Temperature
P1dB Over Temperature
NF Over Temperature
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Typical Performance, Connectorized Test Fixture
VD1 = VD2 = 5V, IDD = 105mA, TA = 25°C unless otherwise noted
Power Sweep, -40°C
Power Sweep, +25°C
Power Sweep, +85°C
OIP3, POUT/tone = 0dBm
OIP3, POUT/tone = 3dBm
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OIP3, POUT/tone = 6dBm
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Typical Performance, Connectorized Test Fixture
VD1 = VD2 = 5V, IDD = 105mA, TA = 25°C unless otherwise noted
IMD3 Sweep, -40°C
DC, ID1
Power Sweep, +85°C
IMD3 Sweep, +25°C
DC, ID2
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Chip layout showing pad locations.
All dimensions are in microns. Die thickness is 100 microns. Backside metal is gold, bond pad metal is gold.
Refer to Die Handling Application Note MM-APP-0001 (visit www.microsemi.com/mmics).
1296
971
476
4
3
1350
5
2
6
1
7
1057
579
579
383
383
54
1296
1500
Table 3: Pad Descriptions
Pad #
Description
Pad Dimensions (µm)
1, 4, 7
Ground
100 x 100
2
RFIN, Pad is AC coupled
100 x 190
6
RFOUT, Pad is AC coupled
100 x 190
3
VD1
100 x 100
5
VD2
100 x 100
Biasing
MMA002AA is self-biased. Apply 5V to VD1 and VD2. Bias sequence does
not matter.
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Information contained in this document is proprietary to Microsem. This document may not be modified in any way without the express
written consent of Microsemi. Product processing does not necessarily include testing of all parameters. Microsemi reserves the right to
change the configuration and performance of the product and to discontinue product at any time.
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