PRODUCT SPECIFICATION
TITLE
SERIAL ATA SIGNAL CONNECTOR / 1.27mm PITCH
1.0 SCOPE
This Product Specification covers the mechanical, electrical and environmental performances
requirements and test methods for Serial-ATA connector series products.
2.0 APPLICABLE DOCUMENTS AND SPECIFICATIONS
The following documents form a part of this specification to the extent specified herewith. In
the event of conflict between the requirements of the specification and the product drawing, the
product drawing shall take precedence. In the event of conflict between the requirements of the
specification and the referenced documents, this specification shall take precedence.
2.1 EIA 364 Test Methods for Electronic and Electrical Component Parts
2.2 Serial ATA / High Speed Serialized at Attachment Specification
3.0 MATERIAL SPECIFICATIONS
3.1 Design and Construction
Connector shall be of the design, construction and physical dimensions specified on the
applicable sales drawing.
3.2 Materials
a) Contacts: Refer to respective Molex sales drawings
b) Housing: Refer to respective Molex sales drawings
c) Plating: Refer to respective Molex sales drawings
4.0 PERFORMANCE AND TEST DESCRIPTION
4.1 Performance requirement:
Connector shall be designed to meet the electrical, mechanical and environmental
performances requirements specified in 5.0
4.2 VOLTAGE:
15V DC
4.3 CURRENT:
1.5A DC @25˚C
4.4 TEMPERATURE
Operating Temperature Range:
Storage Temperature Range:
REVISION:
D
ECR/ECN INFORMATION:
EC No:
SH2009-0135
DATE:
2009/03/13
DOCUMENT NUMBER:
PS-67490-001
-35˚C to +85˚C (Without loss function)
-35˚C to +85˚C (Without loss function)
TITLE:
SHEET No.
SERIAL ATA SIGNAL CONNECTOR
1.27mm PITCH
CREATED / REVISED BY:
XJSONG 2009/03/13
CHECKED BY:
1 of 6
APPROVED BY:
Stary Song 2009/03/13 Harvey Wang 2009/03/13
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1). DOC
PRODUCT SPECIFICATION
5.0 Test Requirements and Procedures.
5.1 ELECTRICAL REQUIREMENTS
DESCRIPTION
TEST CONDITION
REQUIREMENT
5.1.1
Insulation
Resistance
EIA 364-21
After 500 VDC for 1 minute, measure the
insulation resistance between the adjacent
contacts of mated and unmated connector
assemblies.
5.1.2
Dielectric
Withstanding
Voltage
EIA 364-20 Method B
Test between adjacent contacts of mated
and unmated connector assemblies.
5.1.3
Contact
Resistance
(LLCR)
5.1.4
Mated connector
impedance
EIA 364-23
Subject mated contacts assembled in
housing to 20 mV maximum open circuit at
100 mA maximum.
1000 Mega ohms MINIMUM
The dielectric shall withstand
500 VAC for 1 minute sea level
1. Initially 30 milliohms Max.
2. Resistance increased 15
milliohms Max. after stress
1). Set the Time Domain Reflectometer
(TDR) pulsers in differential mode with a
positive going (V+) and a negative going
pulse (V-). Define a reflected differential
trace: Vdiff = V+ - V2). With the TDR connected to the risetime
reference trace, verify an input risetime
of 70 ps (measured 20% - 80% Vp).
Filting may be used to slow the system
down (see NOTE 2)
3). Connect the TDR to the sample
measurement traces. Calibrate the
instrument and system (see NOTE 3).
4). Measure and record the maximum and
minimum values of the near end
connector impedance.
100 ohm +/- 15%
1. Mount the connector to a test PCB
2. Wire power pins P2 and P3 in parallel
for power
5.1.5
REVISION:
D
Contact current
rating
(Power segment)
The temperature rise above
3. Wire ground pins P5 and P6 in parallel for ambient shall not exceed 30
°C at any point in the
return
4. Supply 6A total DC current to the power
connector when contact
pins in parallel, returning from the parallel positions are powered. The
ground pins (p5 and P6)
ambient condition is still air
5. Record temperature rise when thermal at 25 °C.
equilibrium is reached
ECR/ECN INFORMATION:
EC No:
SH2009-0135
DATE:
2009/03/13
DOCUMENT NUMBER:
PS-67490-001
1.5A per pin MINIMUM.
TITLE:
SHEET No.
SERIAL ATA SIGNAL CONNECTOR
1.27mm PITCH
CREATED / REVISED BY:
XJSONG 2009/03/13
CHECKED BY:
2 of 6
APPROVED BY:
Stary Song 2009/03/13 Harvey Wang 2009/03/13
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1). DOC
PRODUCT SPECIFICATION
NOTES1. Time domain measurement equipment allows for delay adjustment of the pulses so launch times can
be synchronized. Frequency domain equipment will require the use of phase matched fixturing .The
fixturing skew should be verified to be
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