74441-0001

TEST SUMMARY SMALL FORM-FACTOR PLUGGABLE (SFP) AND Z-AXIS PLUGGABLE CONNECTOR 1.0 SCOPE This Product Specification covers the 0.80 mm (.031inch) centerline (pitch) printed circuit board (PCB) connector series with 15 micro-inches gold plating. 2.0 PRODUCT DESCRIPTION 2.1 PRODUCT NAME AND SERIES NUMBER(S) Product Name Series Number Small Form-factor pluggable 74441 Z -Axis pluggable 74441 2.2 DIMENSIONS, MATERIALS, PLATINGS AND MARKINGS See the appropriate Sales Drawing (SD-74441-001) for information on dimensions, material, platings and markings. 2.3 SAFETY AGENCY APPROVALS UL file: E29179 CSA file: 1310648 3.0 APPLICABLE DOCUMENTS AND SPECIFICATIONS The SFP product conforms to the Small Form-factor Pluggable (SFP) Multi-source agreement (MSA). The Z-axis pluggable connector (70 circuit) conforms to the Xenpak MSA. The Z-axis pluggable connector (30 circuit) conforms to the XFP MSA. 4.0 QUALIFICATION Laboratory conditions and sample selection are in accordance with EIA-364. REVISION: A ECR/ECN INFORMATION: TITLE: EC No: UCP2003-0715 DATE: 2002 / 10 / 31 DOCUMENT NUMBER: TS-74441-002 TEST SUMMARY FOR SMALL FORM-FACTOR AND Z-AXIS PLUGGABLE CONNECTORS SHEET No. 1 of 5 CREATED / REVISED BY: CHECKED BY: APPROVED BY: K. SWEENEY M. BANAKIS M. BANAKIS TEMPLATE FILENAME: TEST_SUMMARY[SIZE_A](V.1).DOC TEST SUMMARY 5.0 PERFORMANCE 5.1 NORMAL FORCE Force Displacement Curve (at maximum displacement) Lower Terminal Upper Terminal 140 Force (grams) 120 100 80 60 40 20 0 0 0.002 0.004 0.006 0.008 0.01 0.012 0.014 Displacement (in) REVISION: A ECR/ECN INFORMATION: TITLE: EC No: UCP2003-0715 DATE: 2002 / 10 / 31 DOCUMENT NUMBER: TS-74441-002 TEST SUMMARY FOR SMALL FORM-FACTOR AND Z-AXIS PLUGGABLE CONNECTORS SHEET No. 2 of 5 CREATED / REVISED BY: CHECKED BY: APPROVED BY: K. SWEENEY M. BANAKIS M. BANAKIS TEMPLATE FILENAME: TEST_SUMMARY[SIZE_A](V.1).DOC TEST SUMMARY 5.2 MEHANICAL TESTING 1 (THERMAL AGING) ITEM DESCRIPTION TREATMENT REQUIREMENT 1 Contact Resistance (Low Level) 4 point dry circuit method Initial 44.22 mΩ 32.48 mΩ 47.76 mΩ 2 Durability 20 cycles No Damage No Visual or Dimensional Change 3 Contact Resistance (Low Level) 4 point dry circuit method 10 milliohms MAXIMUM* 4 Thermal Aging 115 °C for 432 hours per EIA-364-17B Method A No damage 5 Contact Resistance (Low Level) 4 point dry circuit method 10 milliohms MAXIMUM* 6 Reseating 7 Contact Resistance (Low Level) No Damage 4 point dry circuit method 10 milliohms MAXIMUM* MEAN -0.12 mΩ MINIMUM MAXIMUM -1.20 mΩ 0.84 mΩ No visual or Dimensional Change 0.33 mΩ -0.50 mΩ 3.24 mΩ No Visual or Dimensional Change 0.33 mΩ -0.50 mΩ 3.24 mΩ *Change from initial REVISION: A ECR/ECN INFORMATION: TITLE: EC No: UCP2003-0715 DATE: 2002 / 10 / 31 DOCUMENT NUMBER: TS-74441-002 TEST SUMMARY FOR SMALL FORM-FACTOR AND Z-AXIS PLUGGABLE CONNECTORS SHEET No. 3 of 5 CREATED / REVISED BY: CHECKED BY: APPROVED BY: K. SWEENEY M. BANAKIS M. BANAKIS TEMPLATE FILENAME: TEST_SUMMARY[SIZE_A](V.1).DOC TEST SUMMARY 5.3 MEHANICAL TESTING 2 (VIBRATION) ITEM DESCRIPTION TREATMENT REQUIREMENT MEAN MINIMUM MAXIMUM 1 Contact Resistance (Low Level) 4 point dry circuit method Initial 43.63 mΩ 23.10 mΩ 61.91 mΩ 2 Durability 20 cycles No Damage No Visual or Dimensional Change 3 Contact Resistance (Low Level) 4 point dry circuit method 10 milliohms MAXIMUM* 4 Temperature Life 115 °C for 192 hours per EIA-364-17B Method A No damage No visual or Dimensional Change 5 Contact Resistance (Low Level) 4 point dry circuit method 10 milliohms MAXIMUM* -0.08 mΩ -11.06 mΩ 3.06 mΩ 6 Random Vibration EIA 364-28 Condition VIID 15-500 Hz 15 min in each axis No Discontinuity Discontinuity < 1 microsecond 7 Contact Resistance (Low Level) 4 point dry circuit method 10 milliohms MAXIMUM* 0.02 mΩ 0.14 mΩ -5.72 mΩ -5.64 mΩ 4.02 mΩ 1.03 mΩ *Change from initial REVISION: A ECR/ECN INFORMATION: TITLE: EC No: UCP2003-0715 DATE: 2002 / 10 / 31 DOCUMENT NUMBER: TS-74441-002 TEST SUMMARY FOR SMALL FORM-FACTOR AND Z-AXIS PLUGGABLE CONNECTORS SHEET No. 4 of 5 CREATED / REVISED BY: CHECKED BY: APPROVED BY: K. SWEENEY M. BANAKIS M. BANAKIS TEMPLATE FILENAME: TEST_SUMMARY[SIZE_A](V.1).DOC TEST SUMMARY 5.4 ENVIRONMENTAL TESTING ITEM DESCRIPTION 1 Contact Resistance (Low Level) 2 Durability 3 Contact Resistance (Low Level) 4 Temperature Life 5 Contact Resistance (Low Level) 6 Mixed Flowing Gas 7 Contact Resistance (Low Level) 8 Thermal Disturbance 9 Contact Resistance (Low Level) 10 Reseating 11 Contact Resistance (Low Level) REVISION: A TREATMENT REQUIREMENT MEAN 4 point dry circuit method Initial 2.26 mΩ 20 cycles 5 cycles w/ measurement plug 15 cycles w/ cycling plug 85 °C for 300 hours per EIA-364-17B Method A 20 days mated per EIA-364-1000.01 No damage 4.27 mΩ -0.18 mΩ 1.30 mΩ No visual or Dimensional Change 4 point dry circuit method 10 milliohms MAXIMUM* 0.37 mΩ -0.67 mΩ 2.72 mΩ No visual or Dimensional Change 4 point dry circuit method 10 milliohms MAXIMUM* 1.57 mΩ -2.79 mΩ 10.76 mΩ 15 °C – 85 °C No Damage 30 minute dwell 10 cycles No Visual or Dimensional Change 4 point dry circuit method 10 milliohms MAXIMUM* 1.22 mΩ 25 mate/unmate cycles No Damage DATE: 2002 / 10 / 31 -1.84 mΩ 3.26 mΩ No Visual or Dimensional Change 4 point dry circuit method 10 milliohms MAXIMUM* 3.40 mΩ EC No: UCP2003-0715 TS-74441-002 No damage 0.03 mΩ No Visual or Dimensional Change 4 point dry circuit method 10 milliohms MAXIMUM* 0.57 mΩ ECR/ECN INFORMATION: TITLE: DOCUMENT NUMBER: No Damage MINIMUM MAXIMUM 1.08 mΩ TEST SUMMARY FOR SMALL FORM-FACTOR AND Z-AXIS PLUGGABLE CONNECTORS 6.21 mΩ SHEET No. 5 of 5 CREATED / REVISED BY: CHECKED BY: APPROVED BY: K. SWEENEY M. BANAKIS M. BANAKIS TEMPLATE FILENAME: TEST_SUMMARY[SIZE_A](V.1).DOC