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1.8 V Digital Temperature
Sensor
CAT34TS00
Description
CAT34TS00 is a low-voltage digital temperature sensor, which
implements the JEDEC JC42.4 specification. CAT34TS00 measures
temperature every 100 ms over a range of −20°C to +125°C, with a
resolution of 12 bits.
The host communicates with the device via the serial I2C / SMBus
Interface, at either 100 kHz or 400 kHz. Temperature readings can be
retrieved via serial interface. Internally, they are compared to high,
low and critical trigger limits stored in device registers. Over or under
limit conditions can be signaled on the open−drain EVENT pin. These
limits, as well as other settings, can be configured via serial interface.
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TDFN8
VP2 SUFFIX
CASE 511AK
PIN CONFIGURATION
•
•
•
•
•
•
•
•
•
JEDEC JC42.4 Compliant Temperature Sensor
Supply Range: 1.7 V to 1.9 V
Temperature Range: −20°C to +125°C
I2C / SMBus Interface
Temperature Sampling Rate: 100 ms max
Temperature Reading Accuracy:
±0.5°C typ for Active Range (+75°C to +95°C)
Schmitt Triggers and Noise Suppression Filters on SCL and SDA
Inputs
2 x 3 x 0.75 mm TDFN Package
These Devices are Pb−Free and are RoHS Compliant
Typical Applications
•
•
•
•
1
A0
Features
VCC
(Top View)
A2
EVENT
SCL
SDA
VSS
TDFN (VP2)
For the location of Pin 1, please consult the
corresponding package drawing.
MARKING DIAGRAM
TDFN8
OTA
A
LL
Y
M
G
Solid State Drives
Graphics Cards
Portable Devices
Process Control Equipment
VCC
A1
OTA
ALL
YM
G
= Specific Device Code
= Assembly Location Code
= Assembly Lot Number (Last Two Digits)
= Production Year (Last Digit)
= Production Month (1 − 9, O, N, D)
= Pb−Free Package
= Pin 1 Indicator
PIN FUNCTIONS
SCL
A2, A1, A0
Pin Name
CAT34TS00
A0, A1, A2
EVENT
SDA
Figure 1. Functional Symbol
Device Address Inputs
VSS
Ground
SDA
Serial Data Input / Output
SCL
Serial Clock Input
EVENT
VSS
Function
Open−drain Event Output
VCC
Power Supply
DAP
Backside Exposed DAP at VSS
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 14 of this data sheet.
© Semiconductor Components Industries, LLC, 2016
December, 2019 − Rev. 3
1
Publication Order Number:
CAT34TS00/D
CAT34TS00
Table 1. ABSOLUTE MAXIMUM RATINGS (Notes 1 and 2)
Rating
Unit
Voltage on any pin (except A0) with respect to Ground (Note 3)
−0.5 to +6.5
V
Voltage on pin A0 with respect to Ground
−0.5 to +10.5
V
Operating Temperature
−45 to +130
°C
Storage Temperature Range
−65 to +150
°C
Parameter
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Refer to ELECTRICAL CHARACTERISTICS, RECOMMENDED OPERATING RANGES and/or APPLICATION INFORMATION for Safe
Operating parameters.
2. For information, please refer to our Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
3. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. SCL and SDA inputs can be raised to the
maximum limit, irrespective of VCC. During transitions, the voltage on any pin may undershoot to no less than −1.5 V or overshoot to no more
than VCC + 1.5 V, for periods of less than 20 ns.
Table 2. TEMPERATURE CHARACTERISTICS
Parameter
Conditions
Temperature Reading Error
Typ
Max
Unit
+75°C ≤ TA ≤ +95°C, active range
±0.5
±1.0
°C
+40°C ≤ TA ≤ +125°C, monitor range
±1.0
±2.0
°C
−20°C ≤ TA ≤ +125°C, sensing range
±1.5
±3.0
°C
12
Bits
ADC Resolution
Temperature Resolution
Conversion Time
Thermal Resistance (Note 4) qJA
Junction−to−Ambient (Still Air)
0.0625
°C
100
ms
92
°C/W
4. Power Dissipation is defined as PJ = (TJ − TA)/qJA, where TJ is the junction temperature and TA is the ambient temperature. The thermal
resistance value refers to the case of a package being used on a standard 2−layer PCB.
Table 3. D.C. OPERATING CHARACTERISTICS (VCC = 1.7 V to 1.9 V, TA = −20°C to +125°C, unless otherwise specified)
Symbol
ICC
Parameter
Test Conditions/Comments
Max
Unit
500
mA
TS shut−down; Bus idle
5
mA
Pin at GND or VCC
2
mA
−0.5
0.3 x VCC
V
0.7 x VCC
VCC + 0.5
V
0.2
V
Supply Current
TS active, Bus idle
Standby Current
ILKG
I/O Pin Leakage Current
VIL
Input Low Voltage
VIH
Input High Voltage
VOL
Output Low Voltage
ISHDN
IOL = 1 mA
Min
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
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2
CAT34TS00
Table 4. A.C. CHARACTERISTICS (VCC = 1.7 V to 1.9 V, TA = −20°C to +125°C)
100 kHz
400 kHz
Min
Max
Min
Max
Units
Clock Frequency
10
100
10
400
kHz
tHIGH
High Period of SCL Clock
4
tLOW
Low Period of SCL Clock
4.7
SMBus SCL Clock Low Timeout
25
Parameter
Symbol
FSCL (Note 5)
tTIMEOUT (Note 6)
0.6
ms
1.3
35
ms
25
35
ms
tR (Note 7)
SDA and SCL Rise Time
1000
300
ns
tF (Note 7)
SDA and SCL Fall Time
300
300
ns
tSU:DAT
Input Data Setup Time
250
100
ns
tSU:STA
START Condition Setup Time
4.7
0.6
ms
tHD:STA
START Condition Hold Time
4
0.6
ms
tSU:STO
STOP Condition Setup Time
4
0.6
ms
4.7
1.3
ms
0
0
ns
tBUF
tHD:DAT
tDH (Note 7)
Ti (Note 7)
tPU (Note 8)
Bus Free Time Between STOP and START
Input Data Hold Time
Output Data Hold Time
120
3450
120
900
ns
Noise Pulse Filtered at SCL and SDA Inputs
50
50
ns
Power-Up Delay to Valid Temperature Recording
100
100
ms
5. Timing reference points are set at 30%, respectively 70% of VCC, as illustrated in Figure 5. Bus loading must be such as to allow meeting
the VIL and VOL as well as all other timing requirements. The minimum clock frequency of 10 kHz is an SMBus recommendation; the minimum
operating clock frequency is limited only by the SMBus time−out. The device also meets the Fast and Standard I2C specifications, except
that Ti and tDH are shorter.
6. For the CAT34TS00, the interface will reset itself and will release the SDA line if the SCL line stays low beyond the tTIMEOUT limit. The time−out
count takes place when SCL is low in the time interval between START and STOP.
7. In a “Wired−OR” system (such as I2C or SMBus), SDA rise time is determined by bus loading. Since each bus pull−down device must be
able to sink the (external) bus pull−up current (in order to meet the VIL and/or VOL limits), it follows that SDA fall time is inherently faster than
SDA rise time. SDA rise time can exceed the standard recommended tR limit, as long as it does not exceed tLOW − tDH − tSU:DAT, where tLOW
and tDH are actual values (rather than spec limits). A shorter tDH leaves more room for a longer SDA tR, allowing for a more capacitive bus
or a larger bus pull−up resistor.
8. The first valid temperature recording can be expected after tPU at nominal supply voltage.
Table 5. PIN CAPACITANCE (TA = 25°C, VCC = 1.9 V, f = 400 kHz)
Symbol
CIN
Parameter
Test Conditions/Comments
Min
Max
Unit
SDA, EVENT Pin Capacitance
VIN = 0
8
pF
Input Capacitance (other pins)
VIN = 0
6
pF
Max
Unit
Table 6. INPUT IMPEDANCE
Symbol
Parameter
Test Conditions
Min
ZEIL
Input Impedance for A0, A1, A2 Pins
VIN < 0.3 * VCC
30
kW
ZEIH
Input Impedance for A0, A1, A2 Pins
VIN > 0.7 * VCC
800
kW
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3
PULL−UP RESISTANCE (kW)
CAT34TS00
VCC
10
RL
300 ns Rise Time
SDA
120 ns Rise Time
1
CL
VSS
0.1
10
100
LOAD CAPACITANCE (pF)
Figure 2. Pull−up Resistance vs. Load Capacitance
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4
CAT34TS00
I2C/SMBus Protocol
The I2C/SMBus uses two ‘wires’, one for clock (SCL) and
one for data (SDA). The two wires are connected to the VCC
supply via pull−up resistors. Master and Slave devices
connect to the bus via their respective SCL and SDA pins.
The transmitting device pulls down the SDA line to
‘transmit’ a ‘0’ and releases it to ‘transmit’ a ‘1’.
Data transfer may be initiated only when the bus is not
busy (see A.C. Characteristics).
During data transfer, the SDA line must remain stable
while the SCL line is HIGH. An SDA transition while SCL
is HIGH will be interpreted as a START or STOP condition
(Figure 3).
Pin Description
SCL: The Serial Clock input pin accepts the Serial Clock
generated by the Master (Host).
SDA: The Serial Data I/O pin receives input data and transmits
data stored in the TS registers. In transmit mode, this pin is
open drain. Data is acquired on the positive edge, and is
delivered on the negative edge of SCL.
A0, A1 and A2: The Address pins accept the device address.
These pins have on−chip pull−down resistors.
EVENT: The open−drain EVENT pin can be programmed
to signal over/under temperature limit conditions.
Power−On Reset (POR)
The CAT34TS00 incorporates Power−On Reset (POR)
circuitry which protects the device against powering up to an
undetermined logic state. As VCC exceeds the POR trigger
level, the device will power up into conversion mode. When
VCC drops below the POR trigger level, the device will
power down into Reset mode.
This bi−directional POR behavior protects CAT34TS00
against brown−out failure following a temporary loss of
power. The POR trigger level is set below the minimum
operating VCC level.
START
The START condition precedes all commands. It consists
of a HIGH to LOW transition on SDA while SCL is HIGH.
The START acts as a ‘wake−up’ call to all Slaves. Absent a
START, a Slave will not respond to commands.
STOP
The STOP condition completes all commands. It consists
of a LOW to HIGH transition on SDA while SCL is HIGH.
The STOP tells the Slave that no more data will be written
to or read from the Slave.
Device Interface
The CAT34TS00 supports the Inter−Integrated Circuit
(I2C) and the System Management Bus (SMBus) data
transmission protocols. These protocols describe serial
communication between transmitters and receivers sharing a
2−wire data bus. Data flow is controlled by a Master device,
which generates the serial clock and the START and STOP
conditions. The CAT34TS00 acts as a Slave device. Master
and Slave alternate as transmitter and receiver. Up to 8
CAT34TS00 devices may be present on the bus
simultaneously, and can be individually addressed by
matching the logic state of the address inputs A0, A1, and A2.
The CAT34TS00 contains eight 16−bit internal registers
which can be accessed for write and read using the
I2C/SMBus protocol.
Device Addressing
The Master initiates data transfer by creating a START
condition on the bus. The Master then broadcasts an 8−bit
serial Slave address. The first 4 bits of the Slave address (the
preamble) are fixed at binary 0011 (3hex). The next 3 bits,
A2, A1 and A0, select one of 8 possible Slave devices. The
last bit, R/W, specifies whether a Read (1) or Write (0)
operation is being performed.
Acknowledge
A matching Slave address is acknowledged (ACK) by the
Slave by pulling down the SDA line during the 9th clock
cycle (Figure 4). After that, the Slave will acknowledge all
data bytes sent to the bus by the Master. When the Slave is
the transmitter, the Master will in turn acknowledge data
bytes in the 9th clock cycle. The Slave will stop transmitting
after the Master does not respond with acknowledge
(NoACK) and then issues a STOP. Bus timing is illustrated
in Figure 5.
SDA
SCL
START BIT
STOP BIT
Figure 3. Start/Stop Timing
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5
CAT34TS00
SCL FROM
MASTER
1
8
9
DATA OUTPUT
FROM TRANSMITTER
DATA OUTPUT
FROM RECEIVER
ACKNOWLEDGE
START
Figure 4. Acknowledge Timing
tF
SCL
tLOW
tR
70%
30%
70%
tSU:STA
SDA IN
tHIGH
tHD:STA
70%
30%
70%
tHD:DAT
70%
30%
tSU:STO
tSU:DAT
70%
30%
30%
70%
70%
tBUF
tDH
70%
SDA OUT
30%
Figure 5. Bus Timing
Read Operations
Write Operations
To write data to one of the internal registers, the Master
creates a START condition on the bus, and then sends out the
appropriate Slave address (with the R/W bit set to ‘0’),
followed by the register address, followed by two data bytes.
The matching Slave will acknowledge the Slave address,
register address and each data byte (Figure 6). The Master
then ends the session by creating a STOP condition on the
bus. The STOP completes the register update.
Immediate Read
A CAT34TS00 presented with a Slave address containing
a ‘1’ in the R/W position will acknowledge the Slave address
and will then start transmitting the content of the register at
the current address pointer location. The Master stops this
transmission by responding with NoACK, followed by a
STOP (Figure 7).
Selective Read
The Read operation can be started from a specific address,
by preceding the Immediate Read sequence with a ‘data less’
Write sequence. The Master sends out a START, Slave
address and register address, but rather than following up
with data (as in a Write operation), the Master then issues
another START and continues with an Immediate Read
sequence (Figure 8).
BUS ACTIVITY:
MASTER
SDA LINE
SLAVE
S
T
A
R
T
TS
SLAVE
ADDRESS
REGISTER
ADDRESS
DATA (MSB)
S
T
O
P
DATA (LSB)
P
S
A
C
K
A
C
K
A
C
K
Figure 6. Temperature Sensor Register Write
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6
A
C
K
CAT34TS00
BUS ACTIVITY:
MASTER
SDA LINE
S
T
A
R
T
TS
SLAVE
ADDRESS
N
OS
AT
CO
KP
A
C
K
P
S
A
C
K
SLAVE
DATA (MSB)
DATA (LSB)
Figure 7. Temperature Sensor Immediate Read
BUS ACTIVITY:
MASTER
SDA LINE
SLAVE
S
T
A
R
T
TS
SLAVE
ADDRESS
S
T
A
R
T
REGISTER
ADDRESS
N
OS
AT
CO
KP
A
C
K
SLAVE
ADDRESS
P
S
S
A
C
K
A
C
K
A
C
K
DATA (MSB)
DATA (LSB)
Figure 8. Temperature Sensor Selective Read
Registers
The CAT34TS00 contains eight 16−bit wide registers
allocated to TS functions, as shown in Table 7. Upon
power−up, the internal address counter points to the
capability register.
Temperature Sensor Operation
The TS component in the CAT34TS00 combines a
Proportional to Absolute Temperature (PTAT) sensor with
a S−D modulator, yielding a 12 bit plus sign digital
temperature representation. The TS runs on an internal
clock, and starts a new conversion cycle at least every
100 ms. The result of the most recent conversion is stored in
the Temperature Data Register (TDR), and remains there
following a TS Shut−Down. Reading from the TDR does
not interfere with the conversion cycle.
The value stored in the TDR is compared against limits
stored in the High Limit Register (HLR), the Low Limit
Register (LLR) and/or Critical Temperature Register
(CTR). If the measured value is outside the alarm limits or
above the critical limit, then the EVENT pin may be
asserted. The EVENT output function is programmable, via
the Configuration Register for interrupt mode, comparator
mode and polarity.
The temperature limit registers can be Read or Written by
the host, via the serial interface. At power−on, all the
(writable) internal registers default to 0x0000, and should
therefore be initialized by the host to the desired values. The
EVENT output starts out disabled (corresponding to
polarity active low); thus preventing irrelevant event bus
activity before the limit registers are initialized. While the
TS is enabled (not shut−down), event conditions are
normally generated by a change in measured temperature as
recorded in the TDR, but limit changes can also trigger
events as soon as the new limit creates an event condition,
i.e. asynchronously with the temperature sampling activity.
In order to minimize the thermal resistance between
sensor and PCB, it is recommended that the exposed
backside die attach pad (DAP) be soldered to the PCB
ground plane.
Capability Register (User Read Only)
This register lists the capabilities of the TS, as detailed in
the corresponding bit map.
Configuration Register (Read/Write)
This register controls the various operating modes of the
TS, as detailed in the corresponding bit map.
Temperature Trip Point Registers (Read/Write)
The CAT34TS00 features 3 temperature limit registers,
the HLR, LLR and CLR mentioned earlier. The
temperature value recorded in the TDR is compared to the
various limit values, and the result is used to activate the
EVENT pin. To avoid undesirable EVENT pin activity, this
pin is automatically disabled at power−up to allow the host
to initialize the limit registers and the converter to complete
the first conversion cycle under nominal supply conditions.
Data format is two’s complement with the LSB representing
0.25°C, as detailed in the corresponding bit maps.
Temperature Data Register (User Read Only)
This register stores the measured temperature, as well as
trip status information. B15, B14, and B13 are the trip status
bits, representing the relationship between measured
temperature and the 3 limit values; these bits are not affected
by EVENT status or by Configuration register settings
regarding EVENT pin. Measured temperature is
represented by bits B12 to B0. Data format is two’s
complement, where B12 represents the sign, B11 represents
128°C, etc. and B0 represents 0.0625°C.
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CAT34TS00
Manufacturer ID Register (Read Only)
Device ID and Revision Register (Read Only)
The manufacturer ID assigned by the PCI−SIG trade
organization to the CAT34TS00 device is fixed at 0x1B09.
This register contains specific device ID and device
revision information.
Table 7. THE TEMPERATURE SENSOR REGISTERS
Register Address
Register Name
Power−On Default
Read/Write
0x00
Capability Register
0x0077
Read
0x01
Configuration Register
0x0000
Read/Write
0x02
High Limit Register
0x0000
Read/Write
0x03
Low Limit Register
0x0000
Read/Write
0x04
Critical Limit Register
0x0000
Read/Write
0x05
Temperature Data Register
Undefined
Read
0x06
Manufacturer ID Register
0x1B09
Read
0x07
Device ID/Revision Register
0x2201
Read
Table 8. CAPABILITY REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
RFU
(Note 9)
RFU
RFU
RFU
RFU
RFU
RFU
RFU
B7
B6
B5
B4
B3
B2
B1
B0
EVSD
TMOUT
X
RANGE
ACC
EVENT
TRES [1:0]
9. RFU stands for Reserved for Future Use
Bit
B15:B8
B7 (Note 10)
Description
Reserved for future use; can not be written; should be ignored; will read as 0
0:
1:
Configuration Register bit 4 is frozen upon Configuration Register bit 8 being set
(i.e. a TS shut−down freezes the EVENT output)
Configuration Register bit 4 is cleared upon Configuration Register bit 8 being set
(i.e. a TS shut−down de−asserts the EVENT output)
B6
0:
1:
Not used
The TS implements SMBus time−out within the range 25 to 35 ms
B5
X:
May be 0 or 1 (Default = 1)
B4:B3
00:
01:
10:
11:
LSB = 0.50°C (9 bit resolution)
LSB = 0.25°C (10 bit)
LSB = 0.125°C (11 bit)
LSB = 0.0625°C (12 bit)
B2
0:
1:
Not used
The temperature monitor can read temperatures below 0°C and sets the sign bit appropriately
B1
0:
1:
Not used
The temperature monitor has ±1°C accuracy over the active range (75°C to 95°C) and ±2°C
accuracy over the monitoring range (40°C to 125°C)
B0
0:
1:
Not used
The device supports interrupt capabilities
10. Configuration Register bit 4 can be cleared (but not set) after Configuration Register bit 8 is set, by writing a “1” to Configuration Register
bit 5 (EVENT output can be de−asserted during TS shut−down periods)
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8
CAT34TS00
Table 9. CONFIGURATION REGISTER
B15
B14
B13
B12
B11
RFU
RFU
RFU
RFU
RFU
B7
B6
B5
B4
B3
B2
B1
B0
TCRIT_LOCK
ALARM_LOCK
CLEAR
EVENT_STS
EVENT_CTRL
TCRIT_ONLY
EVENT_POL
EVENT_MODE
Bit
B15:B11
B10
B9
B8
HYST [1:0]
SHDN
Description
Reserved for future use; can not be written; should be ignored; will read as 0
B10:B9 (Note 11)
00:
01:
10:
11:
Disable hysteresis
Set hysteresis at 1.5°C
Set hysteresis at 3°C
Set hysteresis at 6°C
B8 (Note 15)
0:
1:
Thermal Sensor is enabled; temperature readings are updated at sampling rate
Thermal Sensor is shut down; temperature reading is frozen to value recorded before SHDN
B7 (Note 14)
0:
1:
Critical trip register can be updated
Critical trip register cannot be modified; this bit can be cleared only at POR
B6 (Note 14)
0:
1:
Alarm trip registers can be updated
Alarm trip registers cannot be modified; this bit can be cleared only at POR
B5 (Note 13)
0:
1:
Always reads as 0 (self−clearing)
Writing a 1 to this position clears an event recording in interrupt mode only
B4 (Note 12)
0:
1:
EVENT output pin is not being asserted
EVENT output pin is being asserted
B3 (Note 11)
0:
1:
EVENT output disabled; polarity dependent: open−drain for B1 = 0; grounded for B1 = 1
EVENT output enabled
B2 (Note 17)
0:
1:
event condition triggered by alarm or critical temperature limit crossing
event condition triggered by critical temperature limit crossing only
B1 (Notes 11, 16)
0:
1:
EVENT output active low
EVENT output active high
B0 (Note 11)
0:
1:
Comparator mode
Interrupt mode
11. Cannot be altered (set or cleared) as long as either one of the two lock bits, B6 or B7 is set.
12. This bit is a polarity independent ‘software’ copy of the EVENT pin, i.e. it is under the control of B3. This bit is read−only.
13. Writing a ‘1’ to this bit clears an event condition in Interrupt mode, but has no effect in comparator mode. When read, this bit always returns
0. Once the measured temperature exceeds the critical limit, setting this bit has no effect (see Figure 9).
14. Cleared at power−on reset (POR). Once set, this bit can only be cleared by a POR condition.
15. The TS powers up into active mode, i.e. this bit is cleared at power−on reset (POR). When the TS is shut down the ADC is disabled and the
temperature reading is frozen to the most recently recorded value. The TS cannot be shut down (B8 cannot be set) as long as either one
of the two lock bits, B6 or B7 is set. However, the bit can be cleared at any time.
16. The EVENT output is “open−drain” and requires an external pull−up resistor for either polarity. The “natural” polarity is “active low”, as it allows
“wired−or” operation on the EVENT bus.
17. Cannot be set as long as lock bit B6 is set.
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CAT34TS00
Table 10. HIGH LIMIT REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
0
0
0
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0
0
Table 11. LOW LIMIT REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
0
0
0
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0
0
Table 12. TCRIT LIMIT REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
0
0
0
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0
0
Table 13. TEMPERATURE DATA REGISTER
B15
B14
B13
B12
B11
B10
B9
B8
TCRIT
HIGH
LOW
Sign
128°C
64°C
32°C
16°C
B7
B6
B5
B4
B3
B2
B1
B0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
(Note 18)
0.125°C
(Note 18)
0.0625°C
(Note 18)
18. When supported − as defined by Capability Register bits TRES (1:0).
Bit
Description
B15
0: Temperature is below the TCRIT limit
1: Temperature is above the TCRIT limit
B14
0: Temperature is below the High limit
1: Temperature is above the High limit
B13
0: Temperature is above the Low limit
1: Temperature is below the Low limit
B12
0: Positive temperature
1: Negative temperature
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10
CAT34TS00
Register Data Format
Event Pin Functionality
The values used in the temperature data register and the 3
temperature trip point registers are expressed in two’s
complement format. The measured temperature value is
expressed with 12−bit resolution, while the 3 trip
temperature limits are set with 10−bit resolution. The total
temperature range is arbitrarily defined as 256°C, thus
yielding an LSB of 0.0625°C for the measured temperature
and 0.25°C for the 3 limit values. Bit B12 in all temperature
registers represents the sign, with a ‘0’ indicating a positive,
and a ‘1’ a negative value. In two’s complement format,
negative values are obtained by complementing their
positive counterpart and adding a ‘1’, so that the sum of
opposite signed numbers, but of equal absolute value, adds
up to zero.
Note that trailing ‘0’ bits, are ‘0’ irrespective of polarity.
Therefore the “don’t care” bits (B1 and B0) in the 10−bit
resolution temperature limit registers, are always ‘0’.
The EVENT output reacts to temperature changes as
illustrated in Figure 9, and according to the operating mode
defined by the Configuration register.
In Interrupt Mode, the (enabled) EVENT output will be
asserted every time the temperature crosses one of the alarm
window limits, and can be de−asserted by writing a ‘1’ to the
clear event bit (B5) in the configuration register. Once the
temperature exceeds the critical limit, the EVENT remains
asserted as long as the temperature stays above the critical
limit and cannot be cleared. A clear request sent to the
CAT34TS00 while the temperature is above the critical limit
will be acknowledged, but will be executed only after the
temperature drops below the critical limit.
In Comparator Mode, the EVENT output is asserted
outside the alarm window limits, while in Critical
Temperature Mode, EVENT is asserted only above the
critical limit. Clear requests are ignored in this mode. The
exact trip limits are determined by the 3 temperature limit
settings and the hysteresis offsets, as illustrated in Figure 10.
Following a TS shut−down request, the converter is
stopped and the most recently recorded temperature value
present in the TDR is frozen; the EVENT output will continue
to reflect the state immediately preceding the shut−down
command. Therefore, if the state of the EVENT output
creates an undesirable bus condition, appropriate action must
be taken either before or after shutting down the TS. This may
require clearing the event, disabling the EVENT output or
perhaps changing the EVENT output polarity.
In normal use, events are triggered by a change in
recorded temperature, but the CAT34TS00 will also respond
to limit register changes. Whereas recorded temperature
values are updated at sampling rate frequency, limits can be
modified at any time. The enabled EVENT output will react
to limit changes as soon as the respective registers are
updated. This feature may be useful during testing.
Table 14. 12−BIT TEMPERATURE DATA FORMAT
Binary (B12 to B0)
Hex
Temperature
1 1100 1001 0000
1C90
−55°C
1 1100 1110 0000
1CE0
−50°C
1 1110 0111 0000
1E70
−25°C
1 1111 1111 1111
1FFF
−0.0625°C
0 0000 0000 0000
000
0°C
0 0000 0000 0001
001
+0.0625°C
0 0001 1001 0000
190
+25°C
0 0011 0010 0000
320
+50°C
0 0111 1101 0000
7D0
+125°C
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11
CAT34TS00
TEMPERATURE
CRITICAL
HYSTERESIS AFFECTS
THESE TRIP POINTS
UPPER
ALARM
WINDOW
LOWER
TIME
EVENT in “INTERRUPT” Mode
EVENT in “INTERRUPT” Mode
EVENT in “INTERRUPT” Mode
EVENT in “COMPARATOR” Mode
EVENT in “CRITICAL TEMP ONLY” Mode
Clear request executed immediately
Clear request acknowledged but execution delayed until measured temperature drops below the active Critical Temperature limit
Figure 9. Event Detail
TH
TH − HYST
TL
TL − HYST
BELOW
WINDOW BIT
ABOVE
WINDOW BIT
Figure 10. Hysteresis Detail
ON Semiconductor is licensed by Philips Corporation to carry the I2C Bus Protocol.
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12
CAT34TS00
Example of Ordering Information
Device Order Number
CAT34TS00VP2GT4A
Specific Device Marking
Package Type
Shipping†
OTA
TDFN8
Tape & Reel,
4,000 Units / Reel
19. All packages are RoHS−compliant (Lead−free, Halogen−free)
20. The standard lead finish is NiPdAu.
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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13
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
TDFN8, 2x3, 0.5P
CASE 511AK
ISSUE B
1
DATE 18 MAR 2015
SCALE 2:1
PIN ONE
REFERENCE
0.10 C
B
A
D
L1
ÇÇ
ÇÇ
ÇÇ
DETAIL A
ALTERNATE
CONSTRUCTIONS
E
ÇÇ
ÇÇ
ÉÉ
EXPOSED Cu
0.10 C TOP VIEW
0.10 C
0.08 C
DIM
A
A1
A3
b
D
D2
E
E2
e
L
L1
MOLD CMPD
DETAIL B
A
DETAIL B
NOTE 4
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.15 AND 0.25MM FROM THE TERMINAL TIP.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
L
L
ALTERNATE
CONSTRUCTION
A3
A1
SIDE VIEW
GENERIC
MARKING DIAGRAM*
SEATING
PLANE
C
1
DETAIL A
1
D2
4
L
XXXXX
A
WL
Y
W
G
E2
8
5
8X
e
BOTTOM VIEW
b
0.10
M
C A B
0.05
M
C
MILLIMETERS
MIN
MAX
0.70
0.80
0.00
0.05
0.20 REF
0.20
0.30
2.00 BSC
1.30
1.50
3.00 BSC
1.20
1.40
0.50 BSC
0.20
0.40
−−−
0.15
XXXXX
AWLYWG
= Specific Device Code
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
NOTE 3
RECOMMENDED
SOLDERING FOOTPRINT*
1.56
8X
0.68
1.45 3.40
1
8X
0.50
PITCH
0.30
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
98AON34336E
TDFN8, 2X3, 0.5P
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
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