ESDM1031MX4T5G

ESDM1031MX4T5G

  • 厂商:

    MURATA-PS(村田)

  • 封装:

  • 描述:

    Isolated X4Dfn Vrwm=3.3V / Reel

  • 数据手册
  • 价格&库存
ESDM1031MX4T5G 数据手册
ESDM1031 3.3V ESD Protection Diodes Micro−packaged Diodes for ESD Protection The ESDM1031 is designed to protect voltage sensitive components from ESD. Excellent clamping capability, low leakage, and fast response time provide best in class protection on designs that are exposed to ESD. Because of its small size, it is suited for use in smartphone, smart−watch, or many other portable / wearable applications where board space comes at a premium. www.onsemi.com X4DFN2 (01005) CASE 718AA Features • Low Capacitance (30 pF Typ, I/O to GND) • Small Body Outline Dimensions − 01005 Size: 0.445 x 0.24 mm • Protection for the Following IEC Standards: • • MARKING DIAGRAM KM IEC 61000−4−2 (Level 4) Low ESD Clamping Voltage These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant K = Device Code M = Date Code PIN CONFIGURATION AND SCHEMATIC Applications • Audio Line Protection • SIM Card Protection • GPIO Protection 1 MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Rating Symbol Value Unit Operating Junction Temperature Range TJ −55 to +150 °C Storage Temperature Range Tstg −55 to +150 °C Lead Solder Temperature − Maximum (10 Seconds) TL 260 °C ±30 ±30 kV kV ESDM1031: IEC 61000−4−2 Contact IEC 61000−4−2 Air ESD 2 ORDERING INFORMATION See detailed ordering and shipping information on page 2 of this data sheet. Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. See Application Note AND8308/D for further description of survivability specs. © Semiconductor Components Industries, LLC, 2016 May, 2019 − Rev. 0 1 Publication Order Number: ESDM1031/D ESDM1031 ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified) Parameter Reverse Working Voltage Breakdown Voltage Symbol VRWM VBR Conditions Min Typ Max Unit 3.3 V 5.2 6.3 V 0.005 0.5 mA I/O Pin to GND IT = 1 mA, I/O Pin to GND 4.6 Reverse Leakage Current IR VRWM = 3.3 V, I/O Pin to GND Reverse Peak Pulse Current IPP IEC61000−4−5 (8x20 ms) Clamping Voltage VC IPP = 12 A, (8/20 ms pulse) 8.6 Clamping Voltage TLP (Note 1) VC IPP = 8 A IEC 61000−4−2 Level 2 equivalent (±4 kV Contact, ±8 kV Air) 7.4 IPP = 16 A IEC 61000−4−2 Level 2 equivalent (±8 kV Contact, ±16 kV Air) 9.1 Dynamic Resistance RDYN Junction Capacitance CJ I/O Pin to GND, 100 ns TLP VR = 0 V, f = 1 MHz 12 14 A 9.6 V 0.21 30 V W 33 pF Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 1. ANSI/ESD STM5.5.1 − Electrostatic Discharge Sensitivity Testing using Transmission Line Pulse (TLP) Model. TLP conditions: Z0 = 50 W, tp = 100 ns, tr = 1 ns, averaging window; t1 = 70 ns to t2 = 90 ns. ORDERING INFORMATION Device ESDM1031MX4T5G Package Shipping† X4DFN2 (Pb−Free) 10,000 / Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. www.onsemi.com 2 ESDM1031 30 10 25 5 20 0 15 −5 Voltage (V) 10 5 −10 −15 0 −20 −5 −25 −10 −20 0 20 40 60 80 100 120 −30 −20 140 0 20 40 Time (ns) 80 100 120 140 Figure 2. ESD Clamping Voltage Negative 8 kV Contact per IEC61000−4−2 10 20 10 18 9 18 9 16 8 16 8 14 7 14 7 12 6 12 6 10 5 10 5 8 4 8 4 6 3 6 3 4 2 4 2 2 1 2 1 0 0 7 8 9 10 11 12 13 14 15 16 0 0 1 2 3 4 5 6 ITLP (A) 20 VIEC Eq (kV) ITLP (A) Figure 1. ESD Clamping Voltage Positive 8 kV Contact per IEC61000−4−2 0 1 VCTLP (V) 5 6 7 8 0 9 10 11 12 13 14 15 16 Figure 4. Negative TLP I−V Curve 12 VC @ IPK (A) 11 10 9 8 7 6 5 4 3 2 1 0 2 3 4 VCTLP (V) Figure 3. Positive TLP I−V Curve VC @ IPK (A) 60 Time (ns) 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 12 11 10 9 8 7 6 5 4 3 2 1 0 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 IPK (A) IPK (A) Figure 5. Positive Clamping Voltage vs. Peak Pulse Current (tp = 8/20 ms) Figure 6. Negative Clamping Voltage vs. Peak Pulse Current (tp = 8/20 ms) www.onsemi.com 3 VIEC Eq (kV) Voltage (V) TYPICAL CHARACTERISTICS ESDM1031 TYPICAL CHARACTERISTICS 1E−03 1E−03 1E−04 1E−04 1E−05 1E−05 1E−06 IR (A) 1E−07 1E−07 1E−08 1E−11 1E−10 1E−11 1E−08 1E−09 1E−10 1E−09 1E−12 −6 −5 −4 −3 −2 −1 0 1 2 3 4 5 1E−13 −8 −7 −6 −5 −4 −3 −2 −1 0 1 2 3 4 5 6 VR (V) 6 VR (V) Figure 7. Breakdown Voltage Figure 8. Reverse Leakage Current 0.0 −0.2 −0.4 −0.6 S(2,1) Magnitude (dB) IR (A) 1E−06 −0.8 −1.0 −1.2 −1.4 −1.6 −1.8 −2.0 −2.2 −2.4 −2.6 −2.8 −3.0 1.0E+06 1.0E+07 1.0E+08 Frequency (Hz) Figure 9. Magnitude vs. Frequency www.onsemi.com 4 1.0E+09 7 8 ESDM1031 IEC61000−4−2 Waveform IEC 61000−4−2 Spec. Ipeak Level Test Voltage (kV) First Peak Current (A) Current at 30 ns (A) Current at 60 ns (A) 1 2 7.5 4 2 2 4 15 8 4 3 6 22.5 12 6 4 8 30 16 8 100% 90% I @ 30 ns I @ 60 ns 10% tP = 0.7 ns to 1 ns Figure 10. IEC61000−4−2 Spec Transmission Line Pulse (TLP) Measurement L Transmission Line Pulse (TLP) provides current versus voltage (I−V) curves in which each data point is obtained from a 100 ns long rectangular pulse from a charged transmission line. A simplified schematic of a typical TLP system is shown in Figure 11. TLP I−V curves of ESD protection devices accurately demonstrate the product’s ESD capability because the 10s of amps current levels and under 100 ns time scale match those of an ESD event. This is illustrated in Figure 12 where an 8 kV IEC 61000−4−2 current waveform is compared with TLP current pulses at 8 A and 16 A. A TLP I−V curve shows the voltage at which the device turns on as well as how well the device clamps voltage over a range of current levels. 50 W Coax Cable S Attenuator ÷ 50 W Coax Cable 10 MW IM VM DUT VC Oscilloscope Figure 11. Simplified Schematic of a Typical TLP System Figure 12. Comparison Between 8 kV IEC 61000−4−2 and 8 A and 16 A TLP Waveforms www.onsemi.com 5 ESDM1031 PACKAGE DIMENSIONS X4DFN2, 0.445x0.24, 0.27P CASE 718AA ISSUE A A B D Ç PIN 1 REFERENCE NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. EXPOSED COPPER ALLOWED AS SHOWN. DIM A A1 b D E e L E TOP VIEW A 0.03 C 0.03 C A1 SIDE VIEW C SEATING PLANE RECOMMENDED MOUNTING FOOTPRINT* e e/2 2 2X b 0.27 PITCH PIN 1 2X L MILLIMETERS MIN NOM MAX 0.15 0.18 0.21 −−− −−− 0.03 0.170 0.185 0.200 0.415 0.445 0.475 0.210 0.240 0.270 0.270 BSC 0.105 0.120 0.135 0.10 C A B 0.05 C 2X 0.21 1 NOTE 3 BOTTOM VIEW 2X 0.13 DIMENSIONS: MILLIMETERS See Application Note AND8398/D for more mounting details *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. 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