Gate Drivers, High-Speed,
Low-Side, Dual 4-A
FAN3223/FAN3224/FAN3225
Description
The FAN3223−25 family of dual 4 A gate drivers is designed to
drive N−channel enhancement−mode MOSFETs in low-side
switching applications by providing high peak current pulses during
the short switching intervals. The driver is available with either TTL
or CMOS input thresholds. Internal circuitry provides an
under−voltage lockout function by holding the output LOW until the
supply voltage is within the operating range. In addition, the drivers
feature matched internal propagation delays between A and B
channels for applications requiring dual gate drives with critical
timing, such as synchronous rectifiers. This also enables connecting
two drivers in parallel to effectively double the current capability
driving a single MOSFET.
The FAN322X drivers incorporate MillerDrive™ architecture for
the final output stage. This bipolar−MOSFET combination provides
high current during the Miller plateau stage of the MOSFET turn−on /
turn−off process to minimize switching loss, while providing
rail−to−rail voltage swing and reverse current capability.
The FAN3223 offers two inverting drivers and the FAN3224 offers
two non−inverting drivers. Each device has dual independent enable
pins that default to ON if not connected. In the FAN3225, each channel
has dual inputs of opposite polarity, which allows configuration as
non−inverting or inverting with an optional enable function using the
second input. If one or both inputs are left unconnected, internal
resistors bias the inputs such that the output is pulled LOW to hold the
power MOSFET OFF.
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1
8
1
•
•
•
•
•
•
•
•
•
Industry−Standard Pinouts
4.5 V to 18 V Operating Range
5 A Peak Sink/Source at VDD = 12 V
4.3 A Sink / 2.8 A Source at VOUT = 6 V
Choice of TTL or CMOS Input Thresholds
Three Versions of Dual Independent Drivers:
♦ Dual Inverting + Enable (FAN3223)
♦ Dual Non−Inverting + Enable (FAN3224)
♦ Dual−Inputs (FAN3225)
Internal Resistors Turn Driver Off If No Inputs
MillerDrive Technology
12 ns / 9 ns Typical Rise/Fall Times (2.2 nF Load)
Under 20 ns Typical Propagation Delay Matched within 1 ns to the
Other Channel
Double Current Capability by Paralleling Channels
8−Lead SOIC and 8−Lead SOIC Exposed Pad Package
Rated from –40°C to +125°C Ambient
Automotive Qualified to AEC-Q100
These are Pb−Free Devices
© Semiconductor Components Industries, LLC, 2020
April, 2020 − Rev. 1
1
SOIC−8 EP
CASE 751AC
MARKING DIAGRAMS
8
8
$Y&Z&2&K
FAN
XXXXX
XXXXX
AYWWG
G
1
1
SOIC8
SOIC−8 EP
XXX = Specific Device Code
A
= Assembly Lot Code
Y
= Year
WW = Work Week
G
= Pb−Free Package
Features
•
•
•
•
•
•
SOIC8
CASE 751EB
$Y
&Z
&2
&K
= ON Semiconductor Logo Graphic
= Assembly Plant Code
= 2−Digit Date Code (Year and Week)
= 2−Digit Lot Run Traceability Code
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information on page 21 of
this data sheet.
Applications
•
•
•
•
•
•
Switch−Mode Power Supplies
High-Efficiency MOSFET Switching
Synchronous Rectifier Circuits
DC-to-DC Converters
Motor Control
Automotive-Qualified Systems
Related Resources
• AN−6069 — Application Review and
Comparative Evaluation of Low−Side Gate
Drivers
Publication Order Number:
FAN3223−F085/D
FAN3223/FAN3224/FAN3225
PACKAGE OUTLINES
1
8
1
8
2
7
2
7
3
6
3
6
4
5
4
5
Figure 1. SOIC−8 (Top View)
Figure 2. SOIC−8−EP
(Top View)
THERMAL CHARACTERISTICS (Note 1)
QL
(Note 2)
QJT
(Note 3)
QJA
(Note 4)
YJB
(Note 5)
YJT
(Note 6)
Unit
8−Pin Small Outline Integrated Circuit (SOIC)
38
29
87
41
2.3
°C/W
8−Pin Small Outline Integrated Circuit with Exposed Pad
(SOIC−EP)
5.1
75
40
5.1
7
°C/W
Package
1. Estimates derived from thermal simulation; actual values depend on the application.
2. Theta_JL (QJL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads (including any thermal pad)
that are typically soldered to a PCB.
3. Theta_JT (QJT): Thermal resistance between the semiconductor junction and the top surface of the package, assuming it is held at a uniform
temperature by a top−side heatsink.
4. Theta_JA (QJA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking, and airflow. The value given
is for natural convection with no heatsink using a 2S2P board, as specified in JEDEC standards JESD51−2, JESD51−5, and JESD51−7,
as appropriate.
5. Psi_JB (YJB): Thermal characterization parameter providing correlation between semiconductor junction temperature and an application
circuit board reference point for the thermal environment defined in Note 4. For the SOIC−8−EP package, the board reference is defined
as the PCB copper connected to the thermal pad and protruding from either end of the package. For the SOIC−8 package, the board reference
is defined as the PCB copper adjacent to pin 6.
6. Psi_JT (YJT): Thermal characterization parameter providing correlation between the semiconductor junction temperature and the center of
the top of the package for the thermal environment defined in Note 4.
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FAN3223/FAN3224/FAN3225
ENA
1
INA
2
GND
3
INB
A
B
4
ENA
1
OUTA
INA
2
VDD
GND
3
8
ENB
7
6
5
INB
OUTB
4
A
B
8
ENB
INA− 1
7
OUTA
INB+
2
6
VDD
GND
3
5
OUTB
+
A
−
+
B
−
INB− 4
8
INA+
7
OUTA
6
VDD
5
OUTB
Figure 3. Pin Assignment
PIN DEFINITIONS
Name
Pin Description
ENA
Enable Input for Channel A. Pull pin LOW to inhibit driver A. ENA has TTL thresholds for both TTL and
CMOS INx threshold
ENB
Enable Input for Channel B. Pull pin LOW to inhibit driver B. ENB has TTL thresholds for both TTL and
CMOS INx threshold
GND
Ground. Common ground reference for input and output circuits
INA
Input to Channel A
INA+
Non−Inverting Input to Channel A. Connect to VDD to enable output
INA−
Inverting Input to Channel A. Connect to GND to enable output
INB
Input to Channel B
INB+
Non−Inverting Input to Channel B. Connect to VDD to enable output
INB−
Inverting Input to Channel B. Connect to GND to enable output
OUTA
Gate Drive Output A: Held LOW unless required input(s) are present and VDD is above UVLO threshold
OUTB
Gate Drive Output B: Held LOW unless required input(s) are present and VDD is above UVLO threshold
OUTA
Gate Drive Output A (inverted from the input): Held LOW unless required input is present and VDD is
above UVLO threshold
OUTB
Gate Drive Output B (inverted from the input): Held LOW unless required input is present and VDD is
above UVLO threshold
VDD
Supply Voltage. Provides power to the IC
OUTPUT LOGIC
FAN3223 (x = A or B)
FAN3224 (x = A or B)
FAN3225 (x = A or B)
ENx
INx
OUTx
ENx
INx
OUTx
INx+
INx−
OUTx
0
0
0
0
0 (Note 7)
0
0 (Note 7)
0
0
0
1 (Note 7)
0
0
1
0
0 (Note 7)
1 (Note 7)
0
1 (Note 7)
0
1
1 (Note 7)
0 (Note 7)
0
1
0
1
1 (Note 7)
1 (Note 7)
0
1 (Note 7)
1
1
1
1 (Note 7)
0
7. Default input signal if no external connection is made.
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FAN3223/FAN3224/FAN3225
BLOCK DIAGRAMS
VDD
VDD
100 kW
100 kW
ENA
1
8
ENB
7
OUTA
VDD
100 kW
INA
2
100 kW
GND
3
UVLO
VDD
6
VDD
5
OUTB
VDD_OK
100 kW
INB
4
100 kW
Figure 4. FAN3223 Block Diagram
VDD
VDD
100 kW
ENA
INA
100 kW
1
ENB
7
OUTA
2
100 kW
100 kW
GND
8
UVLO
3
6
VDD
VDD_OK
INB
4
5
100 kW
100 kW
Figure 5. FAN3224 Block Diagram
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4
OUTB
FAN3223/FAN3224/FAN3225
VDD
INA+ 8
100 kW
INA− 1
100 kW
7
OUTA
6
VDD
5
OUTB
100 kW
GND 3
VDD_OK
UVLO
VDD
INB+ 2
100 kW
INB− 4
100 kW
100 kW
Figure 6. FAN3225 Block Diagram
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Min.
Max.
Unit
−0.3
20.0
V
VDD
VDD to PGND
VEN
ENA and ENB to GND
GND − 0.3
VDD + 0.3
V
VIN
INA, INA+, INA–, INB, INB+ and INB– to GND
GND − 0.3
VDD + 0.3
V
OUTA and OUTB to GND
GND − 0.3
VDD + 0.3
V
+260
°C
VOUT
DC
TL
Lead Soldering Temperature (10 Seconds)
TJ
Junction Temperature
−55
+150
°C
TSTG
Storage Temperature
−65
+150
°C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
RECOMMENDED OPERATING CONDITIONS
Symbol
Min.
Max.
Unit
VDD
Supply Voltage Range
4.5
18.0
V
VDD
Supply Voltage Range (FAN3224TU only)
9.5
18.0
V
VEN
Enable Voltage ENA and ENB
0
VDD
V
VIN
Input Voltage INA, INA+, INA–, INB, INB+ and INB–
0
VDD
V
−2.0
VDD + 0.3
V
−40
+125
°C
VOUT
TA
Parameter
OUTA and OUTB to GND
Repetitive Pulse < 200 ns
Operating Ambient Temperature
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
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FAN3223/FAN3224/FAN3225
ELECTRICAL CHARACTERISTICS
(Unless otherwise noted, VDD = 12 V, TJ = −40°C to +125°C. Currents are defined as positive into the device and negative out of the device.)
Symbol
Parameter
Characteristic
Min
Typ
Max
Unit
SUPPLY [FAN322XT(MX/M1X)−F085, FAN322XCMX−F085]
VDD
Operating Range
18.0
V
IDD
Supply Current, Inputs /
EN Not Connected
All Except FAN3225C
4.5
0.70
1.20
mA
FAN3225C (Note 8)
0.21
0.35
mA
VON
Turn−On Voltage
INA = ENA = VDD, INB = ENB = 0 V
3.4
3.9
4.5
V
VOFF
Turn−Off Voltage
INA = ENA = VDD, INB = ENB = 0 V
3.2
3.7
4.3
V
SUPPLY [FAN3224TU(MX/M1X)−F085 (MODIFIED UVLO VERSION)]
VDD
Operating Range
IDD
Supply Current, Inputs / EN Not
Connected
9.5
VON
Turn−On Voltage
INA = ENA = VDD, INB = ENB = 0 V
VOFF
Turn−Off Voltage
INA = ENA = VDD, INB = ENB = 0 V
18.0
V
0.70
1.20
mA
8.0
9.1
10.2
V
7.0
8.2
9.3
V
0.8
1.2
INPUTS [FAN322XT(MX/M1X)−F085, FAN3224TU(MX/M1X)−F085]
VINL_T
INx Logic LOW Threshold
VINH_T
INx Logic HIGH Threshold
VHYS_T
TTL Logic Hysteresis Voltage
0.1
V
1.6
2.0
V
0.4
0.9
V
IINx_T
Non−inverting Input Current
IN = 0 V
−1.5
1.5
mA
IINx_T
Non−inverting Input Current
IN = VDD
80
120
175
mA
IINx_T
Inverting Input Current
IN = 0 V
−175
−120
−90
mA
IINx_T
Inverting Input Current
IN = VDD
−1.5
1.5
mA
INPUTS [FAN322XCMX−F085]
VINL_C
INx Logic Low Threshold
30
VINH_C
INx Logic High Threshold
55
VHYS_C
CMOS Logic Hysteresis Voltage
17
IINx_T
Non−Inverting Input Current
IN = 0 V
−1.5
IINx_T
Non−Inverting Input Current
IN = VDD
90
IINx_T
Inverting Input Current
IN = 0 V
−175
IINx_T
Inverting Input Current
IN = VDD
−1.5
38
%VDD
70
%VDD
%VDD
1.5
mA
120
175
mA
−120
−90
mA
1.5
mA
ENABLE [FAN3223(C/T)MX−F085, FAN3224(C/T/TU)(MX/M1X)−F085]
VENL
Enable Logic Low Threshold
EN from 5 V to 0 V
VENH
Enable Logic High Threshold
EN from 0 V to 5 V
VHYS_T
TTL Logic Hysteresis Voltage
(Note 10)
0.4
V
RPU
Enable Pull−Up Resistance
(Note 10)
100
kW
tD3
EN to Output Propagation
Delay (Note 11)
tD4
0.8
1.2
1.6
V
2.0
V
0 V to 5 V EN, 1 V/ns Slew Rate
6
17
34
ns
5 V to 0 V EN, 1 V/ns Slew Rate
6
19
31
ns
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FAN3223/FAN3224/FAN3225
ELECTRICAL CHARACTERISTICS
(Unless otherwise noted, VDD = 12 V, TJ = −40°C to +125°C. Currents are defined as positive into the device and negative out of the device.)
Symbol
Parameter
Characteristic
Min
Typ
Max
Unit
OUTPUTS [ALL EXCEPT FOR FAN3225(C/T)MX−F085]
tRISE
Output Rise Time (Note 12)
CLOAD = 2200 pF
12
20
ns
tFALL
Output Fall Time (Note 12)
CLOAD = 2200 pF
9
17
ns
Propagation Matching Between
Channels
INA = INB, OUTA and OUTB at 50%
Point
2
4
ns
tDEL.MATCH
IRVS
Output Reverse Current
Withstand (Note 10)
500
mA
tD1, tD2
Output Propagation Delay,
CMOS Inputs (Note 12)
0 – 12 VIN, 1 V/ns Slew Rate
9
18
34
ns
tD1, tD2
Output Propagation Delay,
TTL Inputs (Note 12)
0 – 5 VIN, 1 V/ns Slew Rate
6
16
30
ns
VOH
High Level Output Voltage
VOH = VDD–VOUT, IOUT = –1 mA
15
35
mV
VOL
Low Level Output Voltage
IOUT = 1 mA
10
25
mV
12
28
ns
[FAN3225(C/T)MX−F085]
tRISE
Output Rise Time (Note 12)
CLOAD = 2200 pF
tFALL
Output Fall Time (Note 12)
CLOAD = 2200 pF
9
26
ns
VOH
High Level Output Voltage
VOH = VDD–VOUT, IOUT = –1 mA
15
37
mV
VOL
Low Level Output Voltage
IOUT = 1 mA
10
25
mV
Propagation Matching Between
Channels
INA = INB, OUTA and OUTB at 50%
Point
2
4
ns
tDEL.MATCH
8. Lower supply current due to inactive TTL circuitry.
9. EN inputs have TTL thresholds; refer to the ENABLE section.
10. Not tested in production.
11. See Timing Diagrams of Figure 9 and Figure 10.
12. See Timing Diagrams of Figure 7 and Figure 8.
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FAN3223/FAN3224/FAN3225
TIMING DIAGRAMS
VINH
Input
VINH
Input
VINL
VINL
tD1
tD2
tRISE
tD1
tFALL
tD2
tRISE
tFALL
90%
90%
Output
Output
10%
10%
Figure 7. Non−Inverting (EN HIGH or Floating)
Figure 8. Inverting (EN HIGH or Floating)
HIGH
HIGH
Input
Input
LOW
LOW
Enable
Enable
VENH
VENL
tD3
VENH
VENL
tD3
tD4
tD4
tRISE
tRISE
tFALL
tFALL
90%
90%
Output
Output
10%
10%
Figure 9. Non−Inverting (IN HIGH)
Figure 10. Inverting (IN LOW)
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FAN3223/FAN3224/FAN3225
TYPICAL PERFORMANCE CHARACTERISTICS
Typical characteristics are provided at 25°C and VDD = 12 V unless otherwise noted.
Figure 11. IDD (Static) vs. Supply Voltage (Note 13)
Figure 12. IDD (Static) vs. Supply Voltage (Note 13)
Figure 13. IDD (Static) vs. Supply Voltage (Note 13)
Figure 14. IDD (No−Load) vs. Frequency
Figure 15. IDD (No−Load) vs. Frequency
Figure 16. IDD (2.2 nF Load) vs. Frequency
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FAN3223/FAN3224/FAN3225
TYPICAL PERFORMANCE CHARACTERISTICS
Typical characteristics are provided at 25°C and VDD = 12 V unless otherwise noted. (continued)
Figure 17. IDD (2.2 nF Load) vs. Frequency
Figure 18. IDD (Static) vs. Temperature (Note 13)
Figure 19. IDD (Static) vs. Temperature (Note 13)
Figure 20. IDD (Static) vs. Temperature (Note 13)
Figure 21. Input Thresholds vs. Supply Voltage
Figure 22. Input Thresholds vs. Supply Voltage
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FAN3223/FAN3224/FAN3225
TYPICAL PERFORMANCE CHARACTERISTICS
Typical characteristics are provided at 25°C and VDD = 12 V unless otherwise noted. (continued)
Figure 23. Input Threshold % vs. Supply Voltage
Figure 24. Input Thresholds vs. Temperature
Figure 25. Input Thresholds vs. Temperature
Figure 26. UVLO Thresholds vs. Temperature
Figure 27. UVLO Threshold vs. Temperature
Figure 28. UVLO Thresholds vs. Temperature
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FAN3223/FAN3224/FAN3225
TYPICAL PERFORMANCE CHARACTERISTICS
Typical characteristics are provided at 25°C and VDD = 12 V unless otherwise noted. (continued)
Figure 29. Propagation Delay vs. Supply Voltage
Figure 30. Propagation Delay vs. Supply Voltage
Figure 31. Propagation Delay vs. Supply Voltage
Figure 32. Propagation Delay vs. Supply Voltage
Figure 33. Propagation Delays vs. Temperature
Figure 34. Propagation Delays vs. Temperature
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FAN3223/FAN3224/FAN3225
TYPICAL PERFORMANCE CHARACTERISTICS
Typical characteristics are provided at 25°C and VDD = 12 V unless otherwise noted. (continued)
Figure 35. Propagation Delays vs. Temperature
Figure 36. Propagation Delays vs. Temperature
Figure 37. Fall Time vs. Supply Voltage
Figure 38. Rise Time vs. Supply Voltage
Figure 39. Rise and Fall Times vs. Temperature
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FAN3223/FAN3224/FAN3225
TYPICAL PERFORMANCE CHARACTERISTICS
Typical characteristics are provided at 25°C and VDD = 12 V unless otherwise noted. (continued)
Figure 40. Rise/Fall Waveforms with 2.2 nF Load
Figure 41. Rise/Fall Waveforms with 10 nF Load
Figure 42. Quasi−Static Source Current
with VDD = 12 V (Note 14)
Figure 43. Quasi−Static Sink Current with
VDD = 12 V (Note 14)
Figure 44. Quasi−Static Source Current
with VDD = 8 V (Note 14)
Figure 45. Quasi−Static Sink Current with
VDD = 8 V (Note 14)
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FAN3223/FAN3224/FAN3225
13. For any inverting inputs pulled low, non−inverting inputs pulled high, or outputs driven high, static IDD increases by the current flowing through
the corresponding pull−up/down resistor shown in the block diagram.
14. The initial spike in each current waveform is a measurement artifact caused by the stray inductance of the current−measurement loop.
TEST CIRCUIT
VDD
470 mF
Al. El.
4.7 mF
ceramic
Current Probe
LECROY AP015
IOUT
IN
1 kHz
1 mF
ceramic
VOUT
CLOAD
0.22 mF
Figure 46. Quasi−Static IOUT / VOUT Test Circuit
APPLICATIONS INFORMATION
Input Thresholds
slew rate, circuit noise could cause the driver input voltage
to exceed the hysteresis voltage and retrigger the driver
input, causing erratic operation.
In the FAN322xC, the logic input thresholds are
dependent on the VDD level and, with VDD of 12 V, the logic
rising edge threshold is approximately 55% of VDD and the
input falling edge threshold is approximately 38% of VDD.
The CMOS input configuration offers a hysteresis voltage of
approximately 17% of VDD. The CMOS inputs can be used
with relatively slow edges (approaching DC) if good
decoupling and bypass techniques are incorporated in the
system design to prevent noise from violating the input
voltage hysteresis window. This allows setting precise
timing intervals by fitting an R−C circuit between the
controlling signal and the IN pin of the driver. The slow
rising edge at the IN pin of the driver introduces a delay
between the controlling signal and the OUT pin of the driver.
Each member of the FAN322x driver family consists of
two identical channels that may be used independently at
rated current or connected in parallel to double the
individual current capacity. In the FAN3223 and FAN3224,
channels A and B can be enabled or disabled independently
using ENA or ENB, respectively. The EN pin has TTL
thresholds for parts with either CMOS or TTL input
thresholds. If ENA and ENB are not connected, an internal
pull−up resistor enables the driver channels by default. ENA
and ENB have TTL thresholds in parts with either TTL or
CMOS INx threshold.
If the channel A and channel B inputs and outputs are
connected in parallel to increase the driver current capacity,
ENA and ENB should be connected and driven together. In
addition, it is recommended to include an individual gate
resistance for each channel output to limit the shoot through
current possibly happening between the two channels due to
variations in propagation delay or in input threshold
between the two channels.
The FAN322x family offers versions in either TTL or
CMOS input thresholds. In the FAN322xT, the input
thresholds meet industry-standard TTL-logic thresholds
independent of the VDD voltage, and there is a hysteresis
voltage of approximately 0.4 V. These levels permit the
inputs to be driven from a range of input logic signal levels
for which a voltage over 2 V is considered logic HIGH. The
driving signal for the TTL inputs should have fast rising and
falling edges with a slew rate of 6 V/µs or faster, so a rise
time from 0 to 3.3 V should be 550 ns or less. With reduced
Static Supply Current
In the IDD (static) typical performance characteristics
(Figure 11 − Figure 13 and Figure 18 − Figure 20), the curve
is produced with all inputs/enables floating (OUT is low)
and indicates the lowest static IDD current for the tested
configuration. For other states, additional current flows
through the 100 kW resistors on the inputs and outputs
shown in the block diagram of each part (see Figure 4 −
Figure 6). In these cases, the actual static IDD current is the
value obtained from the curves plus this additional current.
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FAN3223/FAN3224/FAN3225
MillerDrive Gate Drive Technology
VDD Bypass Capacitor Guidelines
FAN322x gate drivers incorporate the MillerDrive
architecture shown in Figure 47. For the output stage, a
combination of bipolar and MOS devices provide large
currents over a wide range of supply voltage and
temperature variations. The bipolar devices carry the bulk of
the current as OUT swings between 1/3 to 2/3 VDD and the
MOS devices pull the output to the HIGH or LOW rail.
The purpose of the MillerDrive architecture is to speed up
switching by providing high current during the Miller
plateau region when the gate−drain capacitance of the
MOSFET is being charged or discharged as part of the
turn−on / turn−off process.
For applications that have zero voltage switching during
the MOSFET turn−on or turn−off interval, the driver
supplies high peak current for fast switching even though the
Miller plateau is not present. This situation often occurs in
synchronous rectifier applications because the body diode is
generally conducting before the MOSFET is switched ON.
The output pin slew rate is determined by VDD voltage and
the load on the output. It is not user adjustable, but a series
resistor can be added if a slower rise or fall time at the
MOSFET gate is needed.
To enable this IC to turn a device ON quickly, a local
high-frequency bypass capacitor, CBYP, with low ESR and
ESL should be connected between the VDD and GND pins
with minimal trace length. This capacitor is in addition to the
bulk electrolytic capacitance of 10 mF to 47 mF commonly
found on the driver and controller bias circuits.
A typical criterion for choosing the value of CBYP is to
keep the ripple voltage on the VDD supply to ≤5%. This is
often achieved with a value ≥20 times the equivalent load
capacitance CEQV, defined here as QGATE/VDD. Ceramic
capacitors of 0.1 mF to 1 mF or larger are common choices,
as are dielectrics, such as X5R and X7R with good
temperature characteristics and high pulse current
capability.
If circuit noise affects normal operation, the value of CBYP
may be increased to 50−100 times the CEQV, or CBYP may
be split into two capacitors. One should be a larger value,
based on equivalent load capacitance, and the other a smaller
value, such as 1−10 nF mounted closest to the VDD and
GND pins to carry the higher frequency components of the
current pulses. The bypass capacitor must provide the pulsed
current from both of the driver channels and, if the drivers
are switching simultaneously, the combined peak current
sourced from the CBYP would be twice as large as when a
single channel is switching.
VDD
Layout and Connection Guidelines
Input
stage
The FAN3223−25 family of gate drivers incorporates
fast-reacting input circuits, short propagation delays, and
powerful output stages capable of delivering current peaks
over 4 A to facilitate voltage transition times from under
10 ns to over 150 ns. The following layout and connection
guidelines are strongly recommended:
• Keep high−current output and power ground paths
separate logic and enable input signals and signal
ground paths. This is especially critical when dealing
with TTL−level logic thresholds at driver inputs and
enable pins
• Keep the driver as close to the load as possible to
minimize the length of high-current traces. This reduces
the series inductance to improve high-speed switching,
while reducing the loop area that can radiate EMI to the
driver inputs and surrounding circuitry
• If the inputs to a channel are not externally connected,
the internal 100 kΩ resistors indicated on block
diagrams command a low output. In noisy
environments, it may be necessary to tie inputs of an
unused channel to VDD or GND using short traces to
prevent noise from causing spurious output switching
VOUT
Figure 47. MillerDrive Output Architecture
Under−Voltage Lockout
The FAN322x startup logic is optimized to drive
ground-referenced N−channel MOSFETs with an
under−voltage lockout (UVLO) function to ensure that the
IC starts up in an orderly fashion. When VDD is rising, yet
below the UVLO level, this circuit holds the output LOW,
regardless of the status of the input pins. After the part is
active, the supply voltage must drop 0.2 V before the part
shuts down. This hysteresis helps prevent chatter when low
VDD supply voltages have noise from the power switching.
This configuration is not suitable for driving high−side
P−channel MOSFETs because the low output voltage of the
driver would turn the P−channel MOSFET ON with VDD
below the UVLO level.
www.onsemi.com
16
FAN3223/FAN3224/FAN3225
• Many high-speed power circuits can be susceptible to
•
•
•
VDD
noise injected from their own output or other external
sources, possibly causing output re−triggering. These
effects can be obvious if the circuit is tested in
breadboard or non−optimal circuit layouts with long
input, enable, or output leads.
For best results, make connections to all pins as short
and direct as possible
The FAN322x is compatible with many other
industry-standard drivers. In single input parts with
enable pins, there is an internal 100 kW resistor tied to
VDD to enable the driver by default; this should be
considered in the PCB layout
The turn−on and turn−off current paths should be
minimized, as discussed in the following section
The Exposed Pad of the SOIC8−EP package is
connected to the substrate of the die. It is recommended
to connect externally on the PCB the Exposed Pad
together with the Ground
CBYP
FAN322x
PWM
Figure 49. Current Path for MOSFET Turn−Off
Truth Table of Logic Operation
The FAN3225 truth table indicates the operational states
using the dual−input configuration. In a non−inverting
driver configuration, the IN− pin should be a logic LOW
signal. If the IN− pin is connected to logic HIGH, a disable
function is realized, and the driver output remains LOW
regardless of the state of the IN+ pin.
Figure 48 shows the pulsed gate drive current path when
the gate driver is supplying gate charge to turn the MOSFET
ON. The current is supplied from the local bypass capacitor,
CBYP, and flows through the driver to the MOSFET gate and
to ground. To reach the high peak currents possible, the
resistance and inductance in the path should be minimized.
The localized CBYP acts to contain the high peak current
pulses within this driver−MOSFET circuit, preventing them
from disturbing the sensitive analog circuitry in the PWM
controller.
VDD
VDS
IN+
IN−
OUT
0
0
0
0
1
0
1
0
1
1
1
0
In the non−inverting driver configuration in Figure 50, the
IN− pin is tied to ground and the input signal (PWM) is
applied to IN+ pin. The IN− pin can be connected to logic
HIGH to disable the driver and the output remains LOW,
regardless of the state of the IN+ pin.
VDS
VDD
CBYP
PWM
FAN322x
IN+
IN−
FAN3225
OUT
PWM
GND
Figure 48. Current Path for MOSFET Turn−On
Figure 49 shows the current path when the gate driver
turns the MOSFET OFF. Ideally, the driver shunts the
current directly to the source of the MOSFET in a small
circuit loop. For fast turn−off times, the resistance and
inductance in this path should be minimized.
Figure 50. Dual−Input Driver Enabled,
Non−Inverting Configuration
www.onsemi.com
17
FAN3223/FAN3224/FAN3225
In the inverting driver application in Figure 51, the IN+
pin is tied HIGH. Pulling the IN+ pin to GND forces the
output LOW, regardless of the state of the IN− pin.
VDD
Turn−on threshold
VDD
IN−
IN+
PWM
IN−
OUT
FAN3225
IN+
(VDD)
GND
Figure 51. Dual−Input Driver Enabled,
Inverting Configuration
OUT
Operational Waveforms
Figure 53. Inverting Startup Waveforms
At power-up, the driver output remains LOW until the
VDD voltage reaches the turn−on threshold. The magnitude
of the OUT pulses rises with VDD until steady−state VDD is
reached. The non−inverting operation illustrated in
Figure 52 shows that the output remains LOW until the
UVLO threshold is reached, then the output is in−phase with
the input.
VDD
Thermal Guidelines
Gate drivers used to switch MOSFETs and IGBTs at high
frequencies can dissipate significant amounts of power. It is
important to determine the driver power dissipation and the
resulting junction temperature in the application to ensure
that the part is operating within acceptable temperature
limits.
The total power dissipation in a gate driver is the sum of
two components, PGATE and PDYNAMIC:
Turn−on threshold
P TOTAL + P GATE ) P DYNAMIC
(eq. 1)
PGATE (Gate Driving Loss): The most significant power
loss results from supplying gate current (charge per unit
time) to switch the load MOSFET on and off at the switching
frequency. The power dissipation that results from driving
a MOSFET at a specified gate−source voltage, VGS, with
gate charge, QG, at switching frequency, fSW, is determined
by:
IN−
IN+
P GATE + Q G
V GS
f SW
n
(eq. 2)
where n is the number of driver channels in use (1 or 2).
PDYNAMIC (Dynamic Pre−Drive / Shoot−through
Current): A power loss resulting from internal current
consumption under dynamic operating conditions,
including pin pull−up / pull−down resistors. The internal
current consumption (IDYNAMIC) can be estimated using the
graphs in Figure 14 and Figure 15 of the Typical
Performance Characteristics to determine the current
IDYNAMIC drawn from VDD under actual operating
conditions:
OUT
Figure 52. Non−Inverting Startup Waveforms
For the inverting configuration of Figure 51, startup
waveforms are shown in Figure 53. With IN+ tied to VDD
and the input signal applied to IN–, the OUT pulses are
inverted with respect to the input. At power-up, the inverted
output remains LOW until the VDD voltage reaches the
turn−on threshold, then it follows the input with inverted
phase.
P DYNAMIC + I DYNAMIC
V DD
n
(eq. 3)
where n is the number of driver ICs in use. Note that n is
usually be one IC even if the IC has two channels, unless two
or more.driver ICs are in parallel to drive a large load.
www.onsemi.com
18
FAN3223/FAN3224/FAN3225
Once the power dissipated in the driver is determined, the
driver junction rise with respect to circuit board can be
evaluated using the following thermal equation, assuming
Y
JB was determined for a similar thermal design (heat
sinking and air flow):
T J + P TOTAL
y JB ) T B
P GATE + 120nC
7V
P DYNAMIC + 3.0 mA
300 kHz
12 V
2 + 0.504 W
1 + 0.036 W
P TOTAL + 0.540 W
(eq. 5)
(eq. 6)
(eq. 7)
The SOIC−8 has a junction−to−board thermal
characterization parameter of YJB = 42°C/W. In a system
application, the localized temperature around the device is
a function of the layout and construction of the PCB along
with airflow across the surfaces. To ensure reliable
operation, the maximum junction temperature of the device
must be prevented from exceeding the maximum rating of
150°C; with 80% derating, TJ would be limited to 120°C.
Rearranging Equation 4 determines the board temperature
required to maintain the junction temperature below 120°C:
(eq. 4)
where:
TJ = driver junction temperature;
YJB = (psi) thermal characterization parameter relating
temperature rise to total power dissipation; and
TB = board temperature in location as defined in the Thermal
Characteristics table.
To give a numerical example, assume for a 12 V VDD
(VBIAS) system, the synchronous rectifier switches of
Figure 56 have a total gate charge of 60 nC at
VGS = 7 V. Therefore, two devices in parallel would have
120 nC gate charge. At a switching frequency of 300 kHz,
the total power dissipation is:
T B, MAX + T J * P TOTAL
T B, MAX + 120°C * 0.54 W
www.onsemi.com
19
y JB
42°CńW + 97°C
(eq. 8)
(eq. 9)
FAN3223/FAN3224/FAN3225
TYPICAL APPLICATION DIAGRAMS
VIN
VOUT
PWM
Timing/
Isolation
1
8
2
7
3
6
4
5
FAN3224
A
2
3 GND
4
FAN3224
Figure 54. High Current Forward Converter
with Synchronous Rectification
VIN
ENB 8
1 ENA
Vbias
QC
QA
QD
QB
B
7
VDD 6
5
Figure 55. Center−Tapped Bridge Output with
Synchronous Rectifiers
FAN3224
PWM − A
FAN3225
SR− 1
PWM − B
Secondary
Phase Shift
Controller
SR− 2
PWM − C
FAN3225
PWM − D
Figure 56. Secondary Controlled Full Bridge with Current Doubler Output,
Synchronous Rectifiers (Simplified)
www.onsemi.com
20
FAN3223/FAN3224/FAN3225
ORDERING INFORMATION
Part Number
Logic
Input Threshold
Package
Packing Method
Quantity per Reel
Dual Inverting
Channels +
Dual Enable
CMOS
SOIC−8
Tape & Reel
2,500
TTL
SOIC−8
Tape & Reel
2,500
Dual Non−Inverting Channels +
Dual Enable
CMOS
SOIC−8
Tape & Reel
2,500
TTL
SOIC−8
Tape & Reel
2,500
FAN3224TM1X−F085
SOIC−8−EP
Tape & Reel
2,500
FAN3224TUMX−F085 (Note 15)
SOIC−8
Tape & Reel
2,500
FAN3224TUM1X−F085 (Note 15)
SOIC−8−EP
Tape & Reel
2,500
CMOS
SOIC−8
Tape & Reel
2,500
TTL
SOIC−8
Tape & Reel
2,500
FAN3223CMX-F085
FAN3223TMX-F085
FAN3224CMX-F085
FAN3224TMX-F085
FAN3225CMX-F085
FAN3225TMX-F085
Dual Channels of
Two−Input / One
−Output Drivers
15. Modified UVLO thresholds.
RELATED PRODUCTS
Type
Part Number
Gate Drive
(Note 17)
(Sink/Src)
Dual 2 A
FAN3216T
+2.4 A / −1.6 A
TTL
Dual Inverting Channels
SOIC8
Dual 2 A
FAN3217T
+2.4 A / −1.6 A
TTL
Dual Non−Inverting Channels
SOIC8
Dual 2 A
FAN3226C
+2.4 A / −1.6 A
CMOS
Dual Inverting Channels + Dual Enable
SOIC8
Dual 2 A
FAN3226T
+2.4 A / −1.6 A
TTL
Dual Inverting Channels + Dual Enable
SOIC8
Dual 2 A
FAN3227C
+2.4 A / −1.6 A
CMOS
Dual Non−Inverting Channels + Dual Enable
SOIC8
Dual 2 A
FAN3227T
+2.4 A / −1.6 A
TTL
Dual Non−Inverting Channels + Dual Enable
SOIC8
Dual 2 A
FAN3228C
+2.4 A / −1.6 A
CMOS
Dual Channels of Two−Input/One−Output,
Pin Config.1
SOIC8
Dual 2 A
FAN3228T
+2.4 A / −1.6 A
TTL
Dual Channels of Two−Input/One−Output,
Pin Config.1
SOIC8
Dual 2 A
FAN3229C
+2.4 A / −1.6 A
CMOS
Dual Channels of Two−Input/One−Output,
Pin Config.2
SOIC8
Dual 2 A
FAN3229T
+2.4 A / −1.6 A
TTL
Dual Channels of Two−Input/One−Output,
Pin Config.2
SOIC8
Dual 2 A
FAN3268T
+2.4 A / −1.6 A
TTL
20 V Non−Inverting Channel (NMOS) and
Inverting Channel (PMOS) + Dual Enables
SOIC8
Dual 4 A
FAN3213T
+4.3 A / −2.8 A
TTL
Dual Inverting Channels
SOIC8
Dual 4 A
FAN3214T
+4.3 A / −2.8 A
TTL
Dual Non−Inverting Channels
SOIC8
Dual 4 A
FAN3223C
+4.3 A / −2.8 A
CMOS
Dual Inverting Channels + Dual Enable
SOIC8
Dual 4 A
FAN3223T
+4.3 A / −2.8 A
TTL
Dual Inverting Channels + Dual Enable
SOIC8
Dual 4 A
FAN3224C
+4.3 A / −2.8 A
CMOS
Dual Non−Inverting Channels + Dual Enable
SOIC8
Dual 4 A
FAN3224T
+4.3 A / −2.8 A
TTL
Dual Non−Inverting Channels + Dual Enable
SOIC8, SOIC8−EP
Dual 4 A
FAN3225C
+4.3 A / −2.8 A
CMOS
Dual Channels of Two−Input/One−Output
SOIC8
Dual 4 A
FAN3225T
+4.3 A / −2.8 A
TTL
Dual Channels of Two−Input/One−Output
SOIC8
Single 9 A
FAN3121C
+9.7 A / −7.1 A
CMOS
Single Inverting Channel + Enable
SOIC8
Single 9 A
FAN3121T
+9.7 A / −7.1 A
TTL
Single Inverting Channel + Enable
SOIC8
Single 9 A
FAN3122T
+9.7 A / −7.1 A
TTL
Single Non−Inverting Channel + Enable
SOIC8, SOIC8−EP
Single 9 A
FAN3122C
+9.7 A / −7.1 A
CMOS
Single Non−Inverting Channel + Enable
SOIC8
Input
Threshold
Logic
Package
16. Typical currents with OUTx at 6 V and VDD = 12 V.
17. Thresholds proportional to an externally supplied reference voltage.
MillerDrive is trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries.
www.onsemi.com
21
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOIC−8 EP
CASE 751AC
ISSUE D
8
1
SCALE 1:1
DATE 02 APR 2019
GENERIC
MARKING DIAGRAM*
8
XXXXX
AYWWG
G
1
DOCUMENT NUMBER:
DESCRIPTION:
XXXXXX = Specific Device Code
A
= Assembly Location
Y
= Year
WW
= Work Week
G
= Pb−Free Package
98AON14029D
SOIC−8 EP
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”, may
or may not be present and may be in either
location. Some products may not follow the
Generic Marking.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2018
www.onsemi.com
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOIC8
CASE 751EB
ISSUE A
DOCUMENT NUMBER:
DESCRIPTION:
98AON13735G
SOIC8
DATE 24 AUG 2017
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
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