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Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
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FDD770N15A
N-Channel PowerTrench® MOSFET
150 V, 18 A, 77 mΩ
Features
Description
• RDS(on) = 61 mΩ ( Typ.) @ VGS = 10 V, ID = 12 A
• Low Gate Charge
This N-Channel MOSFET is produced using Fairchild Semiconductor’s advanced PowerTrench® process that has been tailored to minimize the on-state resistance while maintaining
superior switching performance.
• High Performance Trench Technology for Extremely Low
RDS(on)
Applications
• High Power and Current Handling Capability
• DC to DC Converters
• RoHS Compliant
• Synchronous Rectification for Server / Telecom PSU
• Fast Switching Speed
• Battery Charger
• AC motor drives and Uninterruptible Power Supplies
• Off-line UPS
D
D
G
S
G
D-PAK
S
Absolute Maximum Ratings
TC = 25oC unless otherwise noted.
Symbol
VDSS
Drain to Source Voltage
Parameter
VGSS
Gate to Source Voltage
ID
Drain Current
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
dv/dt
Peak Diode Recovery dv/dt
FDD770N15A
150
- DC
±20
- AC
(f > 1 Hz)
- Continuous (TC = 25oC, Silicon Limited)
- Continuous (TC = 100oC, Silicon Limited)
- Pulsed
V
±30
18
A
11.4
(Note 1)
36
A
(Note 2)
31.7
mJ
6.0
V/ns
(Note 3)
(TC = 25oC)
PD
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering, 1/8” from Case for 5 Seconds
TL
Unit
V
- Derate Above 25oC
56.8
W
0.46
W/oC
-55 to +150
o
C
300
o
C
Thermal Characteristics
Symbol
Parameter
FDD770N15A
RθJC
Thermal Resistance, Junction to Case, Max.
2.2
RθJA
Thermal Resistance, Junction to Ambient, Max.
87
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
1
Unit
o
C/W
www.fairchildsemi.com
FDD770N15A — N-Channel PowerTrench® MOSFET
April 2015
Part Number
FDD770N15A
Top Mark
FDD770N15A
Package
DPAK
Packing Method
Tape and Reel
Reel Size
330 mm
Tape Width
16 mm
Quantity
2500 units
Electrical Characteristics TC = 25oC unless otherwise noted.
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
150
-
-
V
-
0.0824
-
V/oC
Off Characteristics
BVDSS
ΔBVDSS
/ ΔTJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate to Source Leakage Current
ID = 250 μA, VGS = 0 V
ID = 250 μA, Referenced to
25oC
VDS = 120 V, VGS = 0 V
-
-
1
VDS = 120 V, VGS = 0 V, TC = 125oC
-
-
500
VGS = ±20 V, VDS = 0 V
-
-
±100
2.0
-
4.0
V
-
61
77
mΩ
-
20
-
S
-
575
765
pF
-
64
85
pF
-
3.9
6
pF
-
113
-
pF
-
8.4
11
nC
-
2.7
-
nC
-
1.8
-
nC
-
5.7
-
V
-
6.9
-
nC
μA
nA
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250 μA
Static Drain to Source On Resistance
gFS
Forward Transconductance
VGS = 10 V, ID = 12 A
VDS = 10 V, ID = 12 A
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Coss(er)
Energy Related Output Capacitance
Qg(tot)
Total Gate Charge at 10V
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
Vplateau
Gate Plateau Volatge
Qsync
Total Gate Charge Sync.
VDS = 0 V, ID = 6 A
Qoss
Output Charge
VDS = 37.5 V, VGS = 0 V
-
14
-
nC
ESR
Equivalent Series Resistance (G-S)
f = 1 MHz
-
0.5
-
Ω
-
10.3
30.6
ns
-
3.1
16.2
ns
-
15.8
41.6
ns
-
2.8
15.6
ns
VDS = 75 V, VGS = 0 V,
f = 1 MHz
VDS = 75 V, VGS = 0 V
VDS = 75 V, ID = 12 A,
VGS = 10 V
(Note 4)
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
VDD = 75 V, ID = 12 A,
VGS = 10 V, RG = 4.7 Ω
(Note 4)
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
18
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
36
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0 V, ISD = 12 A
-
-
1.25
V
trr
Reverse Recovery Time
56.4
-
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, VDD = 75 V, ISD = 12 A,
dIF/dt = 100 A/μs
-
109
-
nC
Notes:
1. Repetitive rating: pulse-width limited by maximum junction temperature.
2. L = 3 mH, IAS = 4.6 A, starting TJ = 25°C.
3. ISD ≤ 12 A, di/dt ≤ 200 A/μs, VDD ≤ BVDSS, starting TJ = 25°C.
4. Essentially independent of operating temperature typical characteristics.
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
2
www.fairchildsemi.com
FDD770N15A — N-Channel PowerTrench® MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
50
VGS = 15.0V
10.0V
8.0V
7.0V
6.5V
6.0V
5.5V
10
*Notes:
1. VDS = 10V
2. 250μs Pulse Test
ID, Drain Current[A]
ID, Drain Current[A]
100
10
o
150 C
o
25 C
o
-55 C
*Notes:
1. 250μs Pulse Test
1
o
2. TC = 25 C
0.5
0.1
1
VDS, Drain-Source Voltage[V]
1
7
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
4
5
6
VGS, Gate-Source Voltage[V]
100
0.08
IS, Reverse Drain Current [A]
0.09
VGS = 10V
0.07
VGS = 20V
0.06
o
150 C
10
o
25 C
*Notes:
1. VGS = 0V
o
0.05
*Note: TC = 25 C
0
10
20
30
ID, Drain Current [A]
40
1
0.4
50
Figure 5. Capacitance Characteristics
2. 250μs Pulse Test
0.6
0.8
1.0
1.2
VSD, Body Diode Forward Voltage [V]
1.4
Figure 6. Gate Charge Characteristics
10
VGS, Gate-Source Voltage [V]
1000
Ciss
Capacitances [pF]
7
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
0.10
RDS(ON) [Ω],
Drain-Source On-Resistance
3
100
Coss
*Note:
1. VGS = 0V
2. f = 1MHz
10
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
1
0.1
1
10
VDS, Drain-Source Voltage [V]
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
VDS = 30V
VDS = 75V
VDS = 120V
8
6
4
2
Crss
0
100 200
3
*Note: ID = 12A
0
2
4
6
8
Qg, Total Gate Charge [nC]
10
www.fairchildsemi.com
FDD770N15A — N-Channel PowerTrench® MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
2.4
RDS(on), [Normalized]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.10
1.05
1.00
0.95
*Notes:
1. VGS = 0V
2. ID = 250μA
0.90
-80
-40
0
40
80
120
o
TJ, Junction Temperature [ C]
1.6
1.2
0.8
*Notes:
1. VGS = 10V
2. ID = 12A
0.4
-80
160
Figure 9. Maximum Safe Operating Area
-40
0
40
80
120
o
TJ, Junction Temperature [ C]
160
Figure 10. Maximum Drain Current
vs. Case Temperature
60
20
10
100μs
1
Operation in This Area
is Limited by R DS(on)
ID, Drain Current [A]
ID, Drain Current [A]
2.0
1ms
10ms
100ms
DC
SINGLE PULSE
0.1
o
TC = 25 C
15
VGS = 10V
10
5
o
TJ = 150 C
o
o
RθJC = 2.2 C/W
RθJC = 2.2 C/W
0.01
1
10
100
VDS, Drain-Source Voltage [V]
0
25
200
Figure 11. Eoss vs. Drain to Source Voltage
20
IAS, AVALANCHE CURRENT (A)
0.6
EOSS, [μJ]
150
Figure 12. Unclamped Inductive
Switching Capability
0.8
0.4
0.2
0.0
50
75
100
125
o
TC, Case Temperature [ C]
0
25
50
75
100
125
VDS, Drain to Source Voltage [V]
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
10
TJ = 25 oC
TJ = 125 oC
1
0.001
150
0.01
0.1
1
10
tAV, TIME IN AVALANCHE (ms)
4
www.fairchildsemi.com
FDD770N15A — N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
FDD770N15A — N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
Figure 13. Transient Thermal Response Curve
θJC
o
ZθJC
(t), Thermal
Response
Thermal
Response
[Z [ C/W]
]
2.5
1
0.5
0.2
PDM
0.1
t1
0.05
*Notes:
0.02
0.01
0.1
o
1. ZθJC(t) = 2.2 C/W Max.
2. Duty Factor, D= t1/t2
3. TJM - TC = PDM * ZθJC(t)
Single pulse
0.05
-5
10
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
t2
-4
10
-3
-2
10
10
Rectangular
Pulse
t1, Rectangular
PulseDuration
Duration [sec]
[sec]
5
-1
10
1
www.fairchildsemi.com
FDD770N15A — N-Channel PowerTrench® MOSFET
IG = const.
Figure 14. Gate Charge Test Circuit & Waveform
VDS
RG
RL
VDS
VDD
VGS
VGS
DUT
V
10V
GS
90%
10%
td(on)
tr
t on
td(off)
tf
t off
Figure 15. Resistive Switching Test Circuit & Waveforms
VGS
Figure 16. Unclamped Inductive Switching Test Circuit & Waveforms
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
6
www.fairchildsemi.com
FDD770N15A — N-Channel PowerTrench® MOSFET
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
VDD
Body Diode
Forward Voltage Drop
Figure 17. Peak Diode Recovery dv/dt Test Circuit & Waveforms
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
7
www.fairchildsemi.com
Driver
VGS
( Driver)
VGS
(DUT)
VDD
VRG
RG
t
10V
t
DUT
Qsync =
VGS
1
⋅ VR ( t ) dt
RG ∫ G
Figure 18. Total Gate Charge Qsync. Test Circuit & Waveforms
©2012 Fairchild Semiconductor Corporation
FDD770N15A Rev. 1.2
8
www.fairchildsemi.com
FDD770N15A — N-Channel PowerTrench® MOSFET
VCC
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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