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N-Channel PowerTrench® MOSFET
80 V, 100 A, 3.9 mΩ
Features
Description
• RDS(on) = 3.2 mΩ (Typ.) @ VGS = 10 V, ID = 50 A
This N-Channel MOSFET is produced using ON Semiconductor’s advance PowerTrench® process that has been tailored
to minimize the on-state resistance while maintaining superior
switching performance.
• Low FOM RDS(on) *QG
• Low Reverse Recovery Charge, Qrr = 80 nC
• Soft Reverse Recovery Body Diode
• Enables Highly Efficiency in Synchronous Rectification
Applications
• Fast Switching Speed
• Synchronous Rectification for ATX / Server / Telecom PSU
• 100% UIL Tested
• Battery Protection Circuit
• RoHS Compliant
• Motor drives and Uninterruptible Power Supplies
Bottom
Top
S
D
D
D
Pin 1
S
S
G
D
D
5
4
G
D
6
3
S
D
7
2
S
D
8
1
S
Power 56
MOSFET Maximum Ratings TC = 25oC unless otherwise noted.
Symbol
VDSS
Drain to Source Voltage
Parameter
VGSS
Gate to Source Voltage
ID
Drain Current
- Continuous (TC = 25oC)
- Continuous (TA = 25oC)
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
- Pulsed
PD
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
Unit
V
±20
V
100
A
(Note 1a)
19.4
(Note 2)
400
A
(Note 3)
240
mJ
104
W
(TC = 25oC)
(TA = 25oC)
FDMS039N08B
80
(Note 1a)
2.5
W
-55 to +150
o
C
Thermal Characteristics
Symbol
Parameter
RθJC
Thermal Resistance, Junction to Case, Max.
RθJA
Thermal Resistance, Junction to Ambient, Max.
©2011 Semiconductor Components Industries, LLC.
October-2017, Rev. 3
FDMS039N08B
1.2
(Note 1a)
50
Unit
oC/W
Publication Order Number:
FDMS039N08B/D
FDMS039N08B — N-Channel PowerTrench® MOSFET
FDMS039N08B
Device Marking
FDMS039N08B
Device
FDMS039N08B
Package
Power 56
Reel Size
13 ”
Tape Width
12 mm
Quantity
3000 units
Electrical Characteristics TC = 25oC unless otherwise noted.
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
80
-
-
V
-
0.04
-
V/oC
Off Characteristics
BVDSS
ΔBVDSS
/ ΔTJ
IDSS
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
ID = 250 μA, VGS = 0 V
VDS = 64 V, VGS = 0 V
-
-
1
μA
IGSS
Gate to Body Leakage Current
VGS = ±20 V, VDS = 0 V
-
-
±100
nA
o
ID = 250 μA, Referenced to 25 C
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250 μA
2.5
-
4.5
V
Static Drain to Source On Resistance
VGS = 10 V, ID = 50 A
-
3.2
3.9
mΩ
gFS
Forward Transconductance
VDS = 10 V, ID = 50 A
-
100
-
S
VDS = 40 V, VGS = 0 V
f = 1 MHz
-
5715
7600
pF
-
881
1170
pF
pF
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Coss(er)
Engry Releted Output Capacitance
Qg(tot)
Total Gate Charge at 10V
Qgs
Gate to Source Gate Charge
Qgs2
Gate Charge Threshold to Plateau
Qgd
Gate to Drain “Miller” Charge
ESR
Equivalent Series Resistance
-
15
-
VDS = 40 V, VGS = 0 V
-
1646
-
pF
VDS = 40 V, ID = 50 A
VGS = 0 V to 10 V
-
77
100
nC
-
34
-
nC
-
13
-
nC
-
16
-
nC
-
1.2
-
Ω
-
42
94
ns
-
25
60
ns
-
48
106
ns
-
17
44
ns
(Note 4)
f = 1 MHz
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
VDD = 40 V, ID = 50 A
VGS = 10 V, RG = 4.7 Ω
(Note 4)
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
100
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
400
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0 V, ISD = 50 A
-
-
1.3
V
trr
Reverse Recovery Time
-
68
-
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, ISD = 50 A, VDD = 40 V
dIF/dt = 100 A/μs
-
80
-
nC
Notes:
1.RθJA is determined with the device mounted on a 1in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθCA is determined by
the user's board design.
a. 50 °C/W when mounted on a
1 in2 pad of 2 oz copper.
2. Repetitive rating: pulse-width limited by maximum junction temperature.
3. L = 0.3 mH, IAS = 40 A, starting TJ = 25°C.
4. Essentially independent of operating temperature typical characteristics.
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2
b. 125 °C/W when mounted on a
minimum pad of 2 oz copper.
FDMS039N08B — N-Channel PowerTrench® MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
400
400
100
10
VGS = 15.0V
10.0V
8.0V
7.0V
6.5V
6.0V
5.5V
*Notes:
1. 250μs Pulse Test
o
2. TC = 25 C
1
0.1
ID, Drain Current[A]
ID, Drain Current[A]
100
*Notes:
1. VDS = 10V
2. 250μs Pulse Test
1
VDS, Drain-Source Voltage[V]
o
25 C
10
o
-55 C
1
4
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
o
150 C
3
4
5
6
VGS, Gate-Source Voltage[V]
7
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
5.5
400
IS, Reverse Drain Current [A]
RDS(ON) [mΩ],
Drain-Source On-Resistance
5.0
4.5
VGS = 10V
4.0
3.5
3.0
VGS = 20V
2.5
100
o
o
150 C
25 C
10
*Notes:
1. VGS = 0V
o
2.0
*Note: TC = 25 C
0
50
100 150 200 250
ID, Drain Current [A]
300
1
0.2
350
Figure 5. Capacitance Characteristics
10
VGS, Gate-Source Voltage [V]
Capacitances [pF]
Ciss
1000
Coss
10
1.4
Figure 6. Gate Charge Characteristics
10000
100
2. 250μs Pulse Test
0.4
0.6
0.8
1.0
1.2
VSD, Body Diode Forward Voltage [V]
*Note:
1. VGS = 0V
2. f = 1MHz
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
5
0.1
1
10
VDS, Drain-Source Voltage [V]
Crss
80
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3
VDS = 16V
VDS = 40V
VDS = 64V
8
6
4
2
0
*Note: ID = 50A
0
20
40
60
Qg, Total Gate Charge [nC]
80
FDMS039N08B — N-Channel PowerTrench® MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
1.8
RDS(on), [Normalized]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.08
1.04
1.00
*Notes:
1. VGS = 0V
2. ID = 250μA
0.96
0.94
-100
-50
0
50
100
150
o
TJ, Junction Temperature [ C]
1.6
1.4
1.2
1.0
*Notes:
1. VGS = 10V
2. ID = 50A
0.8
0.6
-100
200
Figure 9. Maximum Safe Operating Area
-50
0
50
100
150
o
TJ, Junction Temperature [ C]
200
Figure 10. Maximum Drain Current
vs. Case Temperature
1000
120
100
ID, Drain Current [A]
ID, Drain Current [A]
VGS=10V
100
1ms
10
10ms
Operation in This Area
is Limited by R DS(on)
1
DC
*Notes:
0.1
100ms
o
1
10
VDS, Drain-Source Voltage [V]
0
25
100
RθJC=1.2 C/W
50
75
100
125
o
TC, Case Temperature [ C]
150
Figure 12. Eoss vs. Drain to Source Voltage
3.0
If R = 0
tAV = (L)(IAS)/(1.3*RATED BVDSS-VDD)
If R = 0
tAV = (L/R)In[(IAS*R)/(1.3*RATED BVDSS-VDD)+1]
2.5
EOSS, [μJ]
IAS, AVALANCHE CURRENT (A)
40
20
2. TJ = 150 C
3. Single Pulse
Figure 11. Unclamped Inductive
Switching Capability
100
60
o
1. TC = 25 C
o
0.01
0.1
80
o
STARTING TJ = 25 C
10
2.0
1.5
1.0
o
STARTING TJ = 150 C
1
0.01
0.1
1
10
100
tAV, TIME IN AVALANCHE (ms)
0.5
1000
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4
0.0
0
10
20
30
40
50
60
70
VDS, Drain to Source Voltage [V]
80
FDMS039N08B — N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
Figure 13. Transient Thermal Response Curve
2
Thermal Response, ZθJA(t)
Thermal
Response [ZθJA]
(Normalized)
1
0.5
0.2
0.1
0.1
PDM
0.05
t1
0.02
0.01
0.01
*Notes:
t2
o
1. ZθJA(t) = 125 C/W Max.
2. Duty Factor, D= t1/t2
3. TJM - TC = PDM * ZθJC(t)
Single pulse
0.001
-3
10
-2
10
-1
10
1
10
Pulse Duration [sec]
tRectangular
1, Rectangular Pulse Duration [sec]
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5
100
1000
FDMS039N08B — N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
FDMS039N08B — N-Channel PowerTrench® MOSFET
Figure 14. Gate Charge Test Circuit & Waveform
IG = const.
Figure 15. Resistive Switching Test Circuit & Waveforms
VDS
RG
VGS
10V
RL
VDS
90%
VDD
VGS
VGS
DUT
10%
td(on)
tr
t on
td(off)
tf
t off
Figure 16. Unclamped Inductive Switching Test Circuit & Waveforms
VGS
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6
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
Body Diode
Forward Voltage Drop
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7
VDD
FDMS039N08B — N-Channel PowerTrench® MOSFET
Figure 17. Peak Diode Recovery dv/dt Test Circuit & Waveforms
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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