CHIP MONOLITHIC CERAMIC CAPACITOR FOR GENERAL
GRM1535C1H471JDD5_ (0402, C0G, 470pF, 50Vdc)
_: packaging code
Reference Sheet
1.Scope
This product specification is applied to Chip Monolithic Ceramic Capacitor used for General Electronic equipment.
2.MURATA Part NO. System
(Ex.)
GRM
15
(1)L/W
Dimensions
3
5C
(2)T
Dimensions
1H
(3)Temperature
Characteristics
471
(4)DC Rated
Voltage
J
(5)Nominal (6)Capacitance
Tolerance
Capacitance
DD5
3. Type & Dimensions
L
W
T
e
g
e
(Unit:mm)
g
(1)-1 L
(1)-2 W
(2) T
e
1.0±0.05
0.5±0.05
0.3±0.03
0.1 to 0.3
0.4 min.
4.Rated value
(3) Temperature Characteristics
(Public STD Code):C0G(EIA)
Temp. coeff
Temp. Range
or Cap. Change
(Ref.Temp.)
0±30 ppm/°C
25 to 125 °C
(25 °C)
(4)
DC Rated
Voltage
50 Vdc
(6)
(5) Nominal
Capacitance
Capacitance
Tolerance
470 pF
±5 %
Specifications and Test
Methods
(Operationg
Temp. Range)
-55 to 125 °C
5.Package
mark
D
J
(8) Packaging
f180mm Reel
PAPER W8P2
f330mm Reel
PAPER W8P2
Packaging Unit
10000 pcs./Reel
50000 pcs./Reel
Product specifications in this catalog are as of Jan.24,2013,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
GRM1535C1H471JDD5-01
1
D
(7)Murata’s (8)Packaging
Code
Control Code
■SPECIFICATIONS AND TEST METHODS
Specification
No
Item
1 Operating
Temperature Range
Temperature
Compensating Type
-55℃ to 125℃
Test Method
High Dielectric
Constant Type
R6:-55℃ to 85℃
R7:-55℃ to 125℃
C8:-55℃ to 105℃
E4:10℃ to 85℃
F5:-30℃ to 85℃
L8/R9:-55℃ to 150℃
Reference Temperature : 25℃
2 Rated Voltage
See the previous pages.
The rated voltage is defined as the maximum voltage which may be applied
continuously to the capacitor.
When AC voltage is superimposed on DC voltage, VP-P or VO-P, whichever is
larger, should be maintained within the rated voltage range.
3 Appearance
No defects or abnormalities.
Visual inspection.
4 Dimension
Within the specified dimensions.
Using calipers. (GRM02 size is based on Microscope)
5 Dielectric Strength
No defects or abnormalities.
No failure should be observed when 300% of the rated voltage
(ΔC to7U and 1X) or 250% of the rated voltage (R6,R7,C8,E4,F5,L8 and R9)
is applied between the terminations for 1 to 5 seconds, provided the
charge/discharge current is less than 50mA.
6 Insulation
Resistance
More than 10,000MΩ or 500Ω ∙F
(whichever is smaller)
The insulation resistance should be measured with a DC voltage
not exceeding the rated voltage at 25℃ and 75%RH max.
and within 2 minutes of charging, provided the charge/discharge
current is less than 50mA.
7 Capacitance
Within the specified tolerance.
The capacitance/Q/D.F. should be measured at 25℃ at the frequency
and voltage shown in the table.
8 Q/Dissipation
Factor (D.F.)
30pF and over:Q≧1000
30pF and below:Q≧400+20C
C:Nominal Capacitance(pF)
9 Capacitance
Capacitance Within the specified
Temperature
Change
Characteristics
tolerance.(Table A-1)
[R6,R7,C8,L8]
W.V.:100V :0.025max.(C<0.068mF)
:0.05max.(C≧0.068mF)
W.V.:50V/25V :0.025max.
W.V.:16V/10V :0.035max.
W.V.:6.3V/4V :0.05max.(C<3.3mF)
:0.1max.(C≧3.3mF)
[R9]
W.V.:50V: 0.05max.
[E4]
W.V.:25Vmin: 0.025max.
[F5]
W.V.:25Vmin
:0.05max. (C<0.1mF)
:0.09max.(C≧0.1mF)
W.V.:16V/10V:0.125max.
W.V.:6.3V:0.15max.
Char.
Temp. Range
Reference
Cap. Change
Temp.
R6
-55C to +85C
Within ±15%
R7
-55C to +125C
Within ±15%
C8
-55C to +105C
Within ±22%
L8
-55C to +125C
+125C to+150C
25C
Within ±15%
Within+15/-40%
R9
-55C to+150C
Within ±15%
E4
+10C to +85C
Within+22/-56%
F5
-30C to +85C
Within+22/-82%
Temperature Within the specified
Coefficent
tolerance.(Table A-1)
(1)Temperature Compensating Type
Capacitance
C≦1000pF
C>1000pF
Frequency
1±0.1MHz
1±0.1kHz
Voltage
0.5 to 5Vrms
1±0.2Vrms
(2)High Dielectric Constant Type
Capacitance
C≦10μF
C>10μF
E4
Frequency
1±0.1kHz
120±24Hz
1±0.1kHz
Voltage
1±0.2Vrms
0.5±0.1Vrms
0.5±0.05Vrms
The capacitance change should be measured after 5min. at each
specified temp.stage.
(1)Temperature Compensating Type
The temperature coefficient is determind using the capacitance
measured in step 3 as a reference.
When cycling the temperature sequentially from step 1 through
5 (Δ C:+25℃ to +125℃,other temp.coeffs.:+25℃ to +85℃) the capacitance
should be within the specified tolerance for the temperature coefficient
and capacitance change as Table A-1.
The capacitance drift is caluculated by dividing the differences between
the maximum and minimum measured values in the step 1,3 and 5
by the cap.value in step 3.
Step
Temperature(C)
1
25±2
-55±3(for C to 7U/1X)
25±2
125±3(for Δ C),
85±3(for other TC)
25±2
2
3
Capacitance Within±0.2% or±0.05pF
Drift
(Whichever is larger.)
*Not apply to 1X/25V
4
5
(2)High Dielectric Constant Type
The ranges of capacitance change compared with the 25℃
value over the temperature ranges shown in the table should be
within the specified ranges.*
Step
1
2
3
4
5
Temperature(C)
25±2
-55±3(for R6/R7/C8/L8/R9)
-30±3(for F5)
10±3(for E4)
25±2
150±3(for L8/R9)
125±3(for R7)
105±3(for C8)
25±2
Initial measurement for high dielectric constant type
Perform a heat treatment at 150 +0/-10°C for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measure-ment.
10 Adhesive Strength
of Termination
JEMCGS-0015Q
No removal of the terminations or other defect should occur.
2
Solder the capacitor on the test jig (glass epoxy board)shown in
Fig.3 using a eutectic solder. Then apply 10N* force in parallel
with the test jig for 10±1sec.
The soldering should be done either with an iron or using the
reflow method and should be conducted with care so that the
soldering is uniform and free of defects such as heat shock.
*1N(GRM02),2N(GR□03),5N(GR□15,GRM18)
■SPECIFICATIONS AND TEST METHODS
No
Item
11 Vibration
Resistance
Appearance
Temperature
Compensating Type
No defects or abnormalities.
Specification
High Dielectric
Constant Type
Test Method
Solder the capacitor on the test jig (glass epoxy board) in the same
manner and under the same conditions as (10).
The capacitor should be subjected to a simple harmonic motion
having a total amplitude of 1.5mm, the frequency being varied
Capacitance Within the specified tolerance.
Q/D.F.
12 Deflection
Appearance
30pF and over:Q≧1000
[R6,R7,C8,L8]
30pF and beloow:Q≧400+20C W.V.:100V :0.025max.(C<0.068mF)
:0.05max.(C≧0.068mF)
C:Nominal Capacitance(pF)
W.V.:50V/25V :0.025max.
W.V.:16V/10V :0.035max.
W.V.:6.3V/4V :0.05max. (C<3.3mF)
:0.1max.(C≧3.3mF)
[R9]
W.V.:50V: 0.05max.
[E4]
W.V.:25V: 0.025max.
[F5]
W.V.:25Vmin
:0.05max. (C<0.1mF)
:0.09max. (C≧0.1mF)
W.V.:16V/10V:0.125max.
W.V.:6.3V:0.15max.
uniformly between the approximate limits of 10 and 55Hz. The
No defects or abnormalities.
Solder the capacitor on the test jig (glass epoxy board) shown in
Fig.1 using an eutectic solder. Then apply a force in the direction
shown in Fig 2 for 5±1 seconds. The soldering should be done
by the reflow method and should be conducted with care so that
the soldering is uniform and free of defects such as heat shock.
Capacitance Within ±5% or± 0.5pF
Change
(Whichever is larger)
Within ±10%
frequency range, from 10 to 55Hz and return to 10Hz, should be
traversed in approximately 1 minute. This motion should be
applied for a period of 2 hours in each 3 mutually perpendicular
directions(total of 6 hours).
13 Solderability
of Termination
75% of the terminations is to be soldered evenly and continuously.
Immerse the capacitor in a solution of ethanol (JIS-K-8101) and
rosin (JIS-K-5902) (25% rosin in weight propotion) .
Preheat at 80 to 120℃ for 10 to 30 seconds.
After preheating , immerse in an eutectic solder solution for
2±0.5 seconds at 230±5℃ or Sn-3.0Ag-0.5Cu solder solution
for 2±0.5 seconds at 245±5℃.
14 Resistance to
Soldering Heat
The measured and observed characteristics should satisfy
the specifications in the following table.
Preheat the capacitor at *120 to 150℃ for 1 minute.
Appearance
Capacitance
Change
Q/D.F.
No defects or abnormalities.
Within ±2.5% or± 0.25pF
(Whichever is larger)
30pF and over:Q≧1000
30pF and beloow:Q≧400+20C
C:Nominal Capacitance(pF)
I.R.
More than 10,000MW or 500W·F(Whichever is smaller)
Dielectric
Strength
No defects.
15 Temperature Cycle
Appearance
The measured and observed characteristics should satisfy
the specifications in the following table.
No defects or abnormalities.
Capacitance Within ±2.5% or± 0.25pF
Change
(Whichever is larger)
30pF and over:Q≧1000
Q/D.F.
30pF and beloow:Q≧400+20C
C:Nominal Capacitance(pF)
JEMCGS-0015Q
R6,R7,R9,C8,L8:Within ±7.5%
E4,F5
:Within ±20%
[R6,R7,C8,L8]
W.V.:100V :0.025max.(C<0.068mF)
:0.05max.(C≧0.068mF)
W.V.:50V/25V :0.025max.
W.V.:16V/10V :0.035max.
W.V.:6.3V/4V :0.05max. (C<3.3mF)
:0.1max.(C≧3.3mF)
[R9]
W.V.:50V: 0.05max.
[E4]
W.V.:25V: 0.025max.
[F5]
W.V.:25Vmin
:0.05max. (C<0.1mF)
:0.09max. (C≧0.1mF)
W.V.:16V/10V:0.125max.
W.V.:6.3V:0.15max.
R6,R7,R9,C8,L8:Within ±7.5%
E4,F5
:Within ±20%
[R6,R7,C8,L8]
W.V.:100V :0.025max.(C<0.068mF)
:0.05max.(C≧0.068mF)
W.V.:50V/25V :0.025max.
W.V.:16V/10V :0.035max.
W.V.:6.3V/4V :0.05max. (C<3.3mF)
:0.1max.(C≧3.3mF)
[R9]
W.V.:50V: 0.05max.
[E4]
W.V.:25V: 0.025max.
[F5]
W.V.:25Vmin
:0.05max. (C<0.1mF)
:0.09max. (C≧0.1mF)
W.V.:16V/10V:0.125max.
W.V.:6.3V:0.15max.
I.R.
More than 10,000MW or 500W·F(Whichever is smaller)
Dielectric
Strength
No defects.
3
Immerse the capacitor in an eutectic solder solution * or
Sn-3.0Ag-0.5Cu solder solution at 270±5℃ for 10±0.5 seconds.
Set at room temperature for 24±2 hours, then measure.
*Not apply to GRM02
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10C for one hour and then set
at room temperature for 24±2 hours.
Perform the initial measurement.
*Preheating for GRM32/43/55
Step
1
2
Temperature
100C to 120C
170C to 200C
Time
1 min.
1 min.
Fix the capacitor to the supporting jig in the same
manner and under the same conditions as (10).
Perform the five cycles according to the four heat
treatments shown in the following table.
Set for 24±2 hours at room temperature, then measure.
Step
Temp.(C)
1
Min.
Operating Temp.+0/-3
Time (min)
30±3
2
Room Temp
2 to 3
3
Max.
Operating Temp.+3/-0
30±3
4
Room Temp
2 to 3
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10C for one hour and then set
at room temperature for 24±2 hours.
Perform the initial measurement.
■SPECIFICATIONS AND TEST METHODS
Specification
No
16 Humidity
Steady
State
Item
Temperature
High Dielectric
Compensating Type
Constant Type
The measured and observed characteristics should satisfy
the specifications in the following table.
No defects or abnormalities.
Appearance
Capacitance Within ±5% or± 0.5pF
Change
(Whichever is larger)
30pF and over:Q≧350
Q/D.F.
10pF and over
30pF and below:Q≧275+5C/2
10pF and below:Q≧200+10C
C:Nominal Capacitance(pF)
R6,R7,R9,C8,L8:Within ±12.5%
E4,F5
:Within ±30%
[R6,R7,R9,C8,L8]
W.V.:100V :0.05max.( C<0.068mF)
:0.075max.(C≧0.068mF)
W.V.:50V/25V :0.05max.
W.V.:16V/10V :0.05max.
W.V.:6.3V/4V :0.075max.(C<3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[E4]
W.V.:25V: 0.05max.
[F5]
W.V.:25Vmin
:0.075max. (C<0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
I.R.
More than 1,000MW or 50W·F(Whichever is smaller)
Dielectric
Strength
No defects.
17 Humidity Load
The measured and observed characteristics should satisfy
the specifications in the following table.
Appearance No defects or abnormalities.
Capacitance Within ±7.5% or±0.75pF
Change
(Whichever is larger)
Q/D.F.
30pF and over:Q≧200
30pF and below:Q≧100+10C/3
C:Nominal Capacitance(pF)
R6,R7,R9,C8,L8:Within ±12.5%
E4 :Within ±30%
F5
:Within ±30%(W.V.>10V)
F5
:Within+30/-40%(W.V.≦10V)
[R6,R7,R9,C8,L8]
W.V.:100V :0.05max.( C<0.068mF)
:0.075max.(C≧0.068mF)
W.V.:50V/25V :0.05max.
W.V.:16V/10V :0.05max.
W.V.:6.3V/4V :0.075max.(C<3.3mF)
:0.125max.(C≧3.3mF)
[R9]
W.V.:50V: 0.075max.
[E4]
W.V.:25V: 0.05max.
[F5]
W.V.:25Vmin
:0.075max. (C<0.1mF)
:0.125max. (C≧0.1mF)
W.V.:16V/10V:0.15max.
W.V.:6.3V:0.2max.
I.R.
More than 500MΩ or 25Ω·F(Whichever is smaller)
Dielectric
Strength
No defects.
18 High Temperature
Load
The measured and observed characteristics should satisfy
the specifications in the following table.
Appearance No defects or abnormalities.
Capacitance Within ±3% or ±0.3pF
Change
(Whichever is larger)
Q/D.F.
R6,R7,R9,C8,L8:Within ±12.5%
E4
:Within ±30%
F5
:Within ±30%(Cap