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March 1996
NDC7002N
Dual N-Channel Enhancement Mode Field Effect Transistor
General Description
Features
0.51A, 50V, RDS(ON) = 2Ω @ VGS=10V
These dual N-Channel enhancement mode power field
effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This
very high density process has been designed to minimize
on-state resistance, provide rugged and reliable
performance and fast switching. These devices is
particularly suited for low voltage applications requiring a
low current high side switch.
High density cell design for low RDS(ON).
Proprietary SuperSOTTM-6 package design using copper
lead frame for superior thermal and electrical capabilities.
High saturation current.
____________________________________________________________________________________________
4
3
5
2
6
1
SOT-6 (SuperSOTTM-6)
Absolute Maximum Ratings T A = 25°C unless otherwise noted
Symbol
Parameter
NDC7002N
Units
VDSS
VGSS
Drain-Source Voltage
50
V
Gate-Source Voltage - Continuous
20
V
ID
Drain Current - Continuous
(Note 1a)
0.51
A
PD
Maximum Power Dissipation
(Note 1a)
0.96
- Pulsed
TJ,TSTG
1.5
(Note 1b)
0.9
(Note 1c)
0.7
Operating and Storage Temperature Range
W
-55 to 150
°C
(Note 1a)
130
°C/W
(Note 1)
60
°C/W
THERMAL CHARACTERISTICS
RθJA
Thermal Resistance, Junction-to-Ambient
RθJC
Thermal Resistance, Junction-to-Case
© 1997 Fairchild Semiconductor Corporation
NDC7002N.SAM
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
1
µA
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = 250 µA
IDSS
Zero Gate Voltage Drain Current
VDS = 40 V, VGS = 0 V
50
V
IGSSF
Gate - Body Leakage, Forward
VGS = 20 V, VDS = 0 V
100
nA
IGSSR
Gate - Body Leakage, Reverse
VGS = -20 V, VDS= 0 V
-100
nA
V
500
TJ = 125°C
ON CHARACTERISTICS (Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250 µA
TJ = 125°C
RDS(ON)
Static Drain-Source On-Resistance
1
1.9
2.5
0.8
1.5
2.2
VGS = 10 V, ID = 0.51 A
TJ = 125°C
VGS = 4.5 V, ID = 0.35 A
ID(on)
On-State Drain Current
VGS = 10 V, VDS = 10 V
gFS
Forward Transconductance
VDS = 10 V, ID = 0.51 A
Ω
1
2
1.7
3.5
1.6
4
1.5
A
400
mS
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25 V, VGS = 0 V,
f = 1.0 MHz
20
pF
13
pF
5
pF
SWITCHING CHARACTERISTICS (Note 2)
tD(on)
Turn - On Delay Time
tr
Turn - On Rise Time
VDD = 25 V, ID = 0.25 A,
VGS = 10 V, RGEN = 25 Ω
6
20
6
20
tD(off)
Turn - Off Delay Time
11
20
tf
Turn - Off Fall Time
5
20
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDS = 25 V,
ID = 0.51 A, VGS = 10 V
nS
1
nC
0.19
nC
0.33
nC
NDC7002N.SAM
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
0.51
A
1.5
A
1.2
V
DRAIN-SOURCE DIODE CHARACTERISTICS
IS
Maximum Continuous Source Current
ISM
Maximum Pulse Source Current (Note 2)
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = 0.51 A (Note 2)
0.8
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by
design while RθCA is determined by the user's board design.
P D (t ) =
T J−TA
R θJ A(t )
=
T J−TA
R θJ C+RθCA(t )
= I 2D (t ) × RDS(ON )
TJ
Typical RθJA for single device operation using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:
a. 130oC/W when mounted on a 0.125 in2 pad of 2oz cpper.
b. 140oC/W when mounted on a 0.005 in2 pad of 2oz cpper.
c. 180oC/W when mounted on a 0.0015 in2 pad of 2oz cpper.
1a
1b
1c
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
NDC7002N.SAM
Typical Electrical Characteristics
1.5
3
8.0 7.0
VGS = 3.5V
6.0
1.2
RDS(on) , NORMALIZED
5.5
5.0
0.9
4.5
0.6
4.0
3.5
0.3
DRAIN-SOURCE ON-RESISTANCE
I D , DRAIN-SOURCE CURRENT (A)
V GS =10V
3.0
5.0
6.0
1.5
2
3
4
, DRAIN-SOURCE VOLTAGE (V)
8.0
10
1
0.3
5
0.6
0.9
I D , DRAIN CURRENT (A)
1.2
1.5
Figure 2. On-Resistance Variation with Gate
Voltage and Drain Current.
2
2.5
V GS = 10V
R DS(on), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
I D = 0.51A
1.8
R DS(ON), NORMALIZED
7.0
0
1
VDS
DRAIN-SOURCE ON-RESISTANCE
5.5
0.5
Figure 1. On-Region Characteristics.
V GS = 10V
1.6
1.4
1.2
1
0.8
0.6
0.4
-50
2
TJ = 125°C
1.5
25°C
1
-55°C
0.5
-25
0
25
50
75
100
TJ , JUNCTION TEMPERATURE (°C)
125
0
150
0.3
I
Figure 3. On-Resistance Variation with
Temperature.
D
0.6
0.9
, DRAIN CURRENT (A)
1.2
1.5
Figure 4. On-Resistance Variation with Drain
Current and Temperature.
1.2
V DS = 10V
T
J
= -55°C
25°C
125°C
V th, NORMALIZED
1.2
0.9
0.6
0.3
0
1
2
3
4
5
6
V GS , GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
7
8
GATE-SOURCE THRESHOLD VOLTAGE
1.5
I D , DRAIN CURRENT (A)
4.5
2
0
0
4.0
2.5
V DS = V GS
I D = 250µA
1.1
1
0.9
0.8
0.7
-50
-25
0
25
50
75
100
TJ , JUNCTION TEMPERATURE (°C)
125
150
Figure 6. Gate Threshold Variation with
Temperature.
NDC7002N.SAM
1.16
I
D
1.5
1
= 250µA
1.12
1.04
1
0.96
0.92
0.88
-50
-25
0
25
50
75
100
TJ , JUNCTION TEMPERATURE (°C)
125
TJ = 125°C
-55°C
0.01
Figure 7. Breakdown Voltage Variation with
Temperature.
0.4
0.6
0.8
1
V SD , BODY DIODE FORWARD VOLTAGE (V)
1.2
Figure 8. Body Diode Forward Voltage Variation
with Current and Temperature.
10
100
VDS = 25V
V GS , GATE-SOURCE VOLTAGE (V)
50
C iss
CAPACITANCE (pF)
25°C
0.1
0.001
0.2
150
V GS = 0V
0.5
I S , REVERSE DRAIN CURRENT (A)
1.08
20
C oss
10
C rss
5
f = 1 MHz
2
V GS = 0 V
1
0.1
8
I D = 0.51A
6
4
2
0
0.2
0.5
1
2
5
10
20
50
V DS , DRAIN TO SOURCE VOLTAGE (V)
Figure 9. Capacitance Characteristics.
0
0.2
0.4
0.6
0.8
Q g , GATE CHARGE (nC)
1
1.2
Figure 10. Gate Charge Characteristics.
0.7
V DS = 10V
T
0.6
I D , DRAIN CURRENT (A)
BV DSS , NORMALIZED
DRAIN-SOURCE BREAKDOWN VOLTAGE
Typical Electrical Characteristics (continued)
0.5
J
= -55°C
25°C
0.4
125°C
0.3
0.2
0.1
0
0
0.3
V
GS
0.6
0.9
1.2
, GATE TO SOURCE VOLTAGE (V)
1.5
Figure 11. Transconductance Variation with Drain
Current and Temperature.
NDC7002N.SAM
Typical Thermal Characteristics
0.55
I D , STEADY-STATE DRAIN CURRENT (A)
STEADY-STATE POWER DISSIPATION (W)
1.2
1.1
1a
1
0.9
1b
0.8
1c
4.5"x5" FR-4 Board
0.7
o
TA = 2 5 C
Still Air
0.6
0
0.2
0.4
0.6
0.8
2oz COPPER MOUNTING PAD AREA (in 2 )
1
1a
0.5
1b
0.45 1c
0.4
4.5"x5" FR-4 Board
o
TA = 2 5 C
Still Air
VG S = 1 0 V
0.35
0
Figure 12. SOT-6 Dual Package Maximum
Steady-State Power Dissipation versus Copper
Mounting Pad Area.
0.025
0.05
0.075
0.1
2
2oz COPPER MOUNTING PAD AREA (in )
0.125
Figure 13. Maximum Steady-State Drain
Current versus Copper Mounting Pad
Area.
3
2
RD
S(O
N)
LIM
IT
10
0
1m us
s
0.5
10
0.2
10
0.1
V
0.05
GS
0m
ms
s
1s
= 10V
DC
SINGLE PULSE
R θJ A = See Note 1c
0.02
T A = 25°C
0.01
1
2
5
10
20
V DS , DRAIN-SOURCE VOLTAGE (V)
50
70
Figure 14. Maximum Safe Operating Area.
1
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
I D , DRAIN CURRENT (A)
1
0 .5
D = 0.5
0 .2
0.2
0 .1
R JA (t) = r(t) * R JA
θ
θ
R JA = See Note 1c
θ
0.1
P(pk)
0.05
t1
0.05
0.02
0.01
0.02
0.01
0 .0 0 0 1
= P * R JA (t)
θ
Duty Cycle, D = t 1 / t 2
A
Single Pulse
0 .001
t2
TJ - T
0 .0 1
0 .1
t 1, TIME (sec)
1
10
100
300
Figure 15. Transient Thermal Response Curve.
Note:
Thermal characterization performed using the conditions described in note 1c. Transient thermal response will change
depending on the circuit board design.
NDC7002N.SAM
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ISOPLANAR™
MICROWIRE™
POP™
PowerTrench
QFET™
QS™
Quiet Series™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
ACEx™
CoolFET™
CROSSVOLT™
E2CMOSTM
FACT™
FACT Quiet Series™
FAST®
FASTr™
GTO™
HiSeC™
SyncFET™
TinyLogic™
UHC™
VCX™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
2. A critical component is any component of a life
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. D
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
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