This product complies with the RoHS Directive (EU 2002/95/EC).
PNJ4K01F
Bipolar Integrated Circuit with Photodetection Function
For brightness control systems
Features
Peak sensitivity wavelength: 560 nm
Output ratio of incandescent light and fluorescent light: 1.1 (typ.)
Small, thin type package: 1.55 mm × 1.5 mm × 0.53 mm
Surface-mouting type for reflow soldering
Absolute Maximum Ratings Ta = 25°C
Parameter
Operating supply voltage
Symbol
Rating
Unit
VCC
– 0.5 to +7.0
V
Power dissipation
PD
35
mW
Operating ambient temperature
Topr
–30 to +85
°C
Storage temperature
Tstg
–40 to +100
°C
Electro-Optical Characteristics Ta = 25°C±3°C, VCC = 3 V
Parameter
Symbol
Operating supply voltage
Conditions
Min
VCC
Saturation voltage *3
Typ
Max
Unit
5.5
V
2.94
3.00
V
480
920
mA
1.4
VO(sat)
EV = 100 lx, RL = 100 kW
Supply current *1
ICC
EV = 1 000 lx, RL = 1 kW
Output current 1 *1, *3
IO1
EV = 100 lx
29.0
48.0
90.0
mA
Output current 2 *2, *3
IO2
EV = 10 lx
2.5
4.3
7.9
mA
Output current 3 *2, *3
IO3
EV = 100 lx
25.0
43.0
79.0
mA
1.1
1.65
10
100
nA
Output current ratio
2.60
IO1 / IO3
Drain current
ID
Peak sensitivity wavelength
EV = 0 lx
λPD
560
Rise time *4
tr
100
1 000
ms
Fall time *4
tf
300
1 000
ms
Delay time *4
td
Storage time *4
ts
RL = 5.1 kW
nm
50
ms
5
ms
Note) *1: Light source is CIE standard A light source. (Incandescent lamp)
*2: Light source is fluorescence light.
*3: Output current measurement circuit
VCC
Light source
IOUT
PNJ4K01F
A
*4: Switching time measurement method
LED pulse
VCC
White LED
PNJ4K01F
IOUT
90%
10%
RL
td
Publication date: October 2010
Ver. AEK
tr
tf
ts
1
This product complies with the RoHS Directive (EU 2002/95/EC).
PNJ4K01F
Block Diagram
VCC
1
Current
Amp
2, 3, 4, 5
GND
2
Ver. AEK
6
IOUT
This product complies with the RoHS Directive (EU 2002/95/EC).
PNJ4K01F
Package (Unit: mm)
KPTFTN6K0001
Pin name
1: VCC
2: GND
3: GND
4: GND
5: GND
6: IOUT
Ver. AEK
3
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semiconductors described in this book
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defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure
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