2SK2498

DATA SHEET MOS FIELD EFFECT TRANSISTOR 2SK2498 SWITCHING N-CHANNEL POWER MOS FET INDUSTRIAL USE DESCRIPTION 2SK2498 is N-Channel MOS Field Effect Transistor designed for high current switching applications. PACKAGE DIMENSIONS (in millimeter) 10.0±0.3 4.5±0.2 2.7±0.2 FEATURES • Super Low On-State Resistance RDS (on)1 ≤ 9 mΩ (VGS = 10 V, ID = 25 A) RDS (on)2 ≤ 14 mΩ (VGS = 4 V, ID = 25 A) 3.2±0.2 4±0.2 • • • • 15.0±0.3 High Avalanche Capability Ratings Isolate TO-220 Package Buit-in G-S Protection Diode ABSOLUTE MAXIMUM RATINGS (TA = 25 ˚C) Drain to Source Voltage Gate to Source Voltage Drain Current (DC) Drain Current (pulse)* Total Power Dissipation (Tc = 25 ˚C) Total Power Dissipation (TA = 25 ˚C) Channel Temperature Storage Temperature Single Avalanche Current** Single Avalanche Energy** * PW ≤ 10 µs, Duty Cycle ≤ 1 % VDSS VGSS ID(DC) ID(pulse) PT1 PT2 Tch Tstg IAS EAS 60 ± 20 ± 50 ± 200 35 2.0 150 50 250 V V A A W W ˚C 123 2.54 0.7±0.1 1.3±0.2 1.5±0.2 2.54 13.5MIN. 12.0±0.2 Low Ciss Ciss = 3400 pF TYP. 3±0.1 2.5±0.1 0.65±0.1 1. Gate 2. Drain 3. Source –55 to +150 ˚C A mJ MP-45F (ISOLATED TO-220) Drain ** Starting Tch = 25 ˚C, RG = 25 Ω, VGS = 20 V → 0 Gate Body Diode Gate Protection Diode Source Document No. D10044EJ1V0DS00 (1st edition) Date Published July 1995 P Printed in Japan © 1995 2SK2498 ELECTRICAL CHARACTERISTICS (TA = 25 ˚C) CHARACTERISTIC Drain to Source On-Resistance SYMBOL RDS (on)1 RDS (on)2 Gate to Source Cutoff Voltage Forward Transfer Admittance Drain Leakage Current Gate to Source Leakage Current Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate to Source Charge Gate to Drain Charge Body Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS (off) | yfs | IDSS IGSS Ciss Coss Crss td (on) tr td (off) tf QG QGS QGD VF (S-D) trr Qrr 3400 1600 770 55 360 480 360 152 11 60 0.92 105 265 1.0 20 MIN. TYP. 7.3 11 1.5 58 10 ± 10 MAX. 9.0 14 2.0 UNIT mΩ mΩ V S TEST CONDITIONS VGS = 10 V, ID = 25 A VGS = 4 V, ID = 25 A VDS = 10 V, ID = 1 mA VDS = 10 V, ID = 25 A VDS = 60 V, VGS = 0 VGS = ± 20 V, VDS = 0 VDS = 10 V VGS = 0 f = 1 MHz ID = 2 5 A VGS(on) = 10 V VDD = 30 V RG = 1 0 Ω ID = 5 0 A VDD = 48 V VGS = 10 V IF = 50 A, VGS = 0 IF = 50 A, VGS = 0 di/dt = 100 A/µs µA nA pF pF pF ns ns ns ns nC nC nC V ns µC Test Circuit 1 Avalanche Capability Test Circuit 2 Switching Time D.U.T. D.U.T. RG = 25 Ω PG VGS = 20 → 0 V 50 Ω L RL PG. RG RG = 10 Ω VGS Wave Form VGS 0 10 % VGS (on) 90 % VDD VDD ID 90 % 90 % ID D Wave Form BVDSS IAS ID VDD VDS VGS 0 t t = 1 µs Duty Cycle ≤ 1 % I 0 10 % td (on) ton tr td (off) toff 10 % tf Starting Tch Test Circuit 3 Gate Charge D.U.T. IG = 2 mA PG. 50 Ω RL VDD The application circuits and their parameters are for references only and are not intended for use in actual design-in's. 2 2SK2498 TYPICAL CHARACTERISTICS (TA = 25 ˚C) DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA 70 dT - Percentage of Rated Power - % PT - Total Power Dissipation - W 100 80 60 40 20 60 50 40 30 20 10 0 20 40 60 80 100 120 140 160 TOTAL POWER DISSIPATION vs. CASE TEMPERATURE 0 20 40 60 80 100 120 140 160 TC - Case Temperature - ˚C TC - Case Temperature - ˚C DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE Pulsed =1 FORWARD BIAS SAFE OPERATING AREA 1000 PW 200 0 ID(pulse) ID - Drain Current - A 100 d ite V) Lim 10 ) on S = S( RD t VG (a 0 ID - Drain Current - A 10 s VGS = 20 V 160 VGS = 10 V 120 VGS = 4 V 80 40 µ ID(DC) Po w er s µ 1 10 Di ss ipa tio DC 10 m s 0m s 10 m s n 1 0.1 TC = 25 ˚C Single Pulse 1 Lim ite d 10 100 0 1 2 3 4 VDS - Drain to Source Voltage - V VDS - Drain to Source Voltage - V FORWARD TRANSFER CHARACTERISTICS 1000 Pulsed ID - Drain Current - A 100 10 TA = –25 ˚C 25 ˚C 125 ˚C 1 VDS = 10 V 0 2 4 6 8 VGS - Gate to Source Voltage - V 3 2SK2498 TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH 1 000 rth(t) - Transient Thermal Resistance - ˚C/W Rth(ch-a) = 62.5 ˚C/W 100 10 Rth(ch-c) = 3.57 ˚C/W 1 0.1 0.01 Single Pulse 0.001 10 µ 100 µ 1m 10 m 100 m 1 10 100 1 000 PW - Pulse Width - s FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT |yfs | - Forward Transfer Admittance - S 1000 VDS = 10 V Pulsed DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE 30 Pulsed RDS(on) - Drain to Source On-State Resistance - mΩ 100 20 10 10 ID = 25 A 1 1 10 100 1000 0 10 20 30 ID - Drain Current - A DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT VGS - Gate to Source Voltage - V GATE TO SOURCE CUTOFF VOLTAGE vs. CHANNEL TEMPERATURE RDS(on) - Drain to Source On-State Resistance - mΩ VGS(off) - Gate to Source Cutoff Voltage - V 30 Pulsed 2.0 VDS = 10 V ID = 1 mA 20 1.5 VGS = 4 V 10 VGS = 10 V 0 10 100 ID - Drain Current - A 1000 1.0 0.5 0 –50 0 50 100 150 Tch - Channel Temperature - ˚C 4 2SK2498 RDS(on) - Drain to Source On-State Resistance - mΩ DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE 20 SOURCE TO DRAIN DIODE FORWARD VOLTAGE Pulsed ISD - Diode Forward Current - A 100 15 VGS = 4 V 10 4V 1 VGS = 0 10 VGS = 10 V 5 ID = 25 A –50 0 50 100 150 0.1 0 0.5 1.0 1.5 0 Tch - Channel Temperature - ˚C CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE VSD - Source to Drain Voltage - V SWITCHING CHARACTERISTICS 1 000 td(on), tr, td(off), tf - Switching Time - ns td(off) 100 000 Ciss, Coss, Crss - Capacitance - pF VGS = 0 f = 1 MHz tf 100 tr td(on) 10 000 Ciss 1 000 Crss Coss 10 100 0.1 1 10 100 1.0 0.1 VDD = 30 V VGS = 10 V RG = 10 Ω 1.0 10 100 ID - Drain Current - A VDS - Drain to Source Voltage - V REVERSE RECOVERY TIME vs. DRAIN CURRENT 1000 trr - Reverse Recovery time - ns di/dt =100 A/µ s VGS = 0 VDS - Drain to Source Voltage - V 80 DYNAMIC INPUT/OUTPUT CHARACTERISTICS VDD = 48 V ID = 50 A 16 14 12 10 VDS 40 VGS 8 6 20 4 2 0 50 100 150 0 200 VGS - Gate to Source Voltage - V 60 100 10 1.0 0.1 1.0 10 100 ID - Drain Current - A Qg - Gate Charge - nC 5 2SK2498 SINGLE AVALANCHE CURRENT vs. INDUCTIVE LOAD 100 IAS - Single Avalanche Current - A EAS SINGLE AVALANCHE ENERGY DERATING FACTOR 160 Energy Derating Factor - % IAS = 50 A 10 140 120 100 80 60 40 20 =2 50 VDD = 30 V RG = 25 Ω VGS = 20 V → 0 IAS < 50 A mJ 1.0 VDD = 30 V VGS = 20 V → 0 0.1 RG = 25 Ω 10 µ 100 µ 1m 10 m 0 25 50 75 100 125 150 L - Inductive Load - H Starting Tch - Starting Channel Temperature - ˚C 6 2SK2498 REFERENCE Document Name NEC semiconductor device reliability/quality control system. Quality grade on NEC semiconductor devices. Semiconductor device mounting technology manual. Semiconductor device package manual. Guide to quality assurance for semiconductor devices. Semiconductor selection guide. Power MOS FET features and application switching power supply. Application circuits using Power MOS FET. Safe operating area of Power MOS FET. Document No. TEI-1202 IEI-1209 IEI-1207 IEI-1213 MEI-1202 MF-1134 TEA-1034 TEA-1035 TEA-1037 The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device is actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device. 7 2SK2498 [MEMO] No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: “Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on a customer designated “quality assurance program“ for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact NEC Sales Representative in advance. Anti-radioactive design is not implemented in this product. M4 94.11 8