DATA SHEET
MOS FIELD EFFECT TRANSISTOR
NP160N04TUG
SWITCHING N-CHANNEL POWER MOS FET
DESCRIPTION
The NP160N04TUG is N-channel MOS Field Effect Transistor designed for high current switching applications.
ORDERING INFORMATION
PART NUMBER NP160N04TUG-E1-AY NP160N04TUG-E2-AY
Note Note
LEAD PLATING Pure Sn (Tin)
PACKING Tape 800 p/reel
PACKAGE TO-263-7pin (MP-25ZT) typ. 1.5 g
Note Pb-free (This product does not contain Pb in the external electrode).
FEATURES
• Super low on-state resistance RDS(on) = 1.6 mΩ TYP. / 2.0 mΩ MAX. (VGS = 10 V, ID = 80 A) • High Current Rating ID(DC) = ±160 A (TO-263-7pin)
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V) Gate to Source Voltage (VDS = 0 V) Drain Current (DC) (TC = 25°C) Drain Current (pulse)
Note1
VDSS VGSS ID(DC) ID(pulse) PT1 PT2 Tch Tstg
40 ±20 ±160 ±640 220 1.8 175 −55 to +175 372 61 372
V V A A W W °C °C mJ A mJ
Total Power Dissipation (TC = 25°C) Total Power Dissipation (TA = 25°C) Channel Temperature Storage Temperature Single Avalanche Energy
Note2 Note3 Note3
EAS IAR EAR
Repetitive Avalanche Current Repetitive Avalanche Energy
Notes 1. PW ≤ 10 μs, Duty Cycle ≤ 1% 2. Starting Tch = 25°C, VDD = 20 V, RG = 25 Ω, VGS = 20 → 0 V, L = 100 μH 3. RG = 25 Ω, Tch(peak) ≤ 150°C
THERMAL RESISTANCE
Channel to Case Thermal Resistance Channel to Ambient Thermal Resistance Rth(ch-C) Rth(ch-A) 0.68 83.3 °C/W °C/W
The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics sales representative for availability and additional information.
Document No. D18754EJ1V0DS00 (1st edition) Date Published May 2007 NS CP(K) Printed in Japan
2007
NP160N04TUG
ELECTRICAL CHARACTERISTICS (TA = 25°C)
CHARACTERISTICS Zero Gate Voltage Drain Current Gate Leakage Current Gate to Source Threshold Voltage Forward Transfer Admittance
Note Note
SYMBOL IDSS IGSS VGS(th) | yfs | RDS(on) Ciss Coss Crss td(on) tr td(off) tf
TEST CONDITIONS VDS = 40 V, VGS = 0 V VGS = ±20 V, VDS = 0 V VDS = VGS, ID = 250 μA VDS = 5 V, ID = 40 A VGS = 10 V, ID = 80 A VDS = 25 V, VGS = 0 V, f = 1 MHz VDD = 20 V, ID = 80 A, VGS = 10 V, RG = 0 Ω
MIN.
TYP.
MAX. 1 ±100
UNIT
μA
nA V S
2.0 28
3.0 76 1.6 10500 980 630 47 67 94 19
4.0
Drain to Source On-state Resistance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge
Note
2.0 15750 1470 1140 110 170 190 50 270
mΩ pF pF pF ns ns ns ns nC nC nC
QG QGS QGD
Note
VDD = 32 V, VGS = 10 V, ID = 160 A IF = 160 A, VGS = 0 V IF = 160 A, VGS = 0 V, di/dt = 100 A/μs
178 44 61 0.92 50 75
Gate to Source Charge Gate to Drain Charge Body Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
VF(S-D) trr Qrr
1.5
V ns nC
Note Pulsed test
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T. RG = 25 Ω PG. VGS = 20 → 0 V 50 Ω
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L VDD PG. RG
RL VDD
VGS VGS
Wave Form
0
10%
VGS
90%
VDS
90% 90% 10% 10%
BVDSS IAS ID VDD VDS
VGS 0 τ τ = 1 μs Duty Cycle ≤ 1%
VDS VDS
Wave Form
0
td(on) ton
tr
td(off) toff
tf
Starting Tch
TEST CIRCUIT 3 GATE CHARGE
D.U.T. IG = 2 mA PG. 50 Ω
RL VDD
2
Data Sheet D18754EJ1V0DS
NP160N04TUG
TYPICAL CHARACTERISTICS (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
120 250
TOTAL POWER DISSIPATION vs. CASE TEMPERATURE
dT - Percentage of Rated Power - %
100 80 60 40 20 0 0 25 50 75 100 125 150 175
PT - Total Power Dissipation - W
200 150 100 50 0 0 25 50 75 100 125 150 175
TC - Case Temperature - °C FORWARD BIAS SAFE OPERATING AREA
TC - Case Temperature - °C
10000 1000 100 10 1
Tc = 25°C Single Pulse
it ed Lim ) n) S( o 0V RD = 1i GS (V ID(DC)
ID(pulse)
ID - Drain Current - A
PW
=1
i
00
μs
DC
co Se
1i m
i
s
1i 0
w Po D er
m
i
s
y ar nd br o ed ak w n
t io ip a iss
d it e im nL
d it e m Li
0.1 0.1 1 10 100
VDS - Drain to Source Voltage – V TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
rth(t) - Transient Thermal Resistance - °C/W
Rth(ch-A) = 83.3°C/Wi 10
1 Rth(ch-C) = 0.68°C/Wi 0.1
Single Pulse 0.01 100 μ
1m 10 m 100 m 1 10 100 1000
PW - Pulse Width - s
Data Sheet D18754EJ1V0DS
3
NP160N04TUG
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
700 600
ID - Drain Current - A
1000 100
ID - Drain Current - A
500 400 300 200 100 0 0 0.5 1 1.5 2 2.5 3 VDS - Drain to Source Voltage - V VGS = 10 V Pulsed
10 1 0.1 0.01 0.001 1 2 3 4 5 6 VGS - Gate to Source Voltage - V TA = −55°C 25°C 75°C 125°C 175°C VDS = 10 V Pulsed
GATE TO SOURCE THRESHOLD VOLTAGE vs. CHANNEL TEMPERATURE
VGS(th) - Gate to Source Threshold Voltage - V | yfs | - Forward Transfer Admittance - S
4 3.5 3 2.5 2 1.5 1 0.5 0 -75 -25 25 75 125 175 225 VDS = VGS ID = 250 μA 1000
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT
100
Tch = −55°C 25°C 75°C
10 150°C 175°C 0.1 1 10 VDS = 5 V Pulsed 100
1
Tch - Channel Temperature - °C
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
RDS(on) - Drain to Source On-state Resistance - mΩ
5 4 3 2 1 0 1 10 100 1000 VGS = 10 V Pulsed
DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE
RDS(on) - Drain to Source On-state Resistance - mΩ
10 8 6 4 2 0 0 5 10 15 20 ID = 8 0 A Pulsed
ID - Drain Current - A
VGS - Gate to Source Voltage - V
4
Data Sheet D18754EJ1V0DS
NP160N04TUG
DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE
RDS(on) - Drain to Source On-state Resistance - mΩ
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
100000
Ciss, Coss, Crss - Capacitance - pF
5 4 3 2 1 Pulsed 0 -75 -25 25 75 125 175 225 Tch - Channel Temperature - °C VGS = 10 V ID = 80 A
Ciss 10000 Coss
1000 VGS = 0 V f = 1 MHz 100 0.01 0.1 1
Crss
10
100
VDS - Drain to Source Voltage - V
SWITCHING CHARACTERISTICS 1000
VDS - Drain to Source Voltage - V td(on), tr, td(off), tf - Switching Time - ns
DYNAMIC INPUT/OUTPUT CHARACTERISTICS 40 35 30 25 20 15 10 5 0 VDS ID = 160 A Pulsed 150 0 200 3 VGS 6 VDD = 32 V 15 V 8V 12
VGS - Gate to Source Voltage - V
td(off) 100 td(on) 10 tr VDD = 20 V VGS = 10 V RG = 0 Ω 0.1 1 10 100 1000 tf
9
1
0
50
100
ID - Drain Current - A
QG - Gate Charge - nC
SOURCE TO DRAIN DIODE FORWARD VOLTAGE 1000
trr - Reverse Recovery Time - ns IF - Diode Forward Current - A
REVERSE RECOVERY TIME vs. DIODE FORWARD CURRENT 1000
100 VGS = 10 V 10 0V
100
10 di/dt = 100 A/μs VGS = 0 V 1 0.1 1 10 100 1000
1 Pulsed 0.1 0 0.5 1 1.5 VF(S-D) - Source to Drain Voltage - V
IF - Diode Forward Current - A
Data Sheet D18754EJ1V0DS
5
NP160N04TUG
PACKAGE DRAWING (Unit: mm)
TO-263-7pin (MP-25ZT)
EQUIVALENT CIRCUIT
Drain
Gate
Body Diode
Source
Remark Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred.
6
Data Sheet D18754EJ1V0DS
NP160N04TUG
TAPE INFORMATION
There are two types (-E1, -E2) of taping depending on the direction of the device.
Draw-out side
Reel side
MARKING INFORMATION
NEC 160N04 UG
Pb-free plating marking Abbreviation of part number Lot code
RECOMMENDED SOLDERING CONDITIONS
The NP160N04TUG should be soldered and mounted under the following recommended conditions. For soldering methods and conditions other than those recommended below, please contact an NEC Electronics sales representative. For technical information, see the following website. Semiconductor Device Mount Manual (http://www.necel.com/pkg/en/mount/index.html)
Soldering Method Infrared reflow
Soldering Conditions Maximum temperature (Package's surface temperature): 260°C or below Time at maximum temperature: 10 seconds or less Time of temperature higher than 220°C: 60 seconds or less Preheating time at 160 to 180°C: 60 to 120 seconds Maximum number of reflow processes: 3 times Maximum chlorine content of rosin flux (percentage mass): 0.2% or less
Recommended Condition Symbol
IR60-00-3
Partial heating
Maximum temperature (Pin temperature): 350°C or below Time (per side of the device): 3 seconds or less Maximum chlorine content of rosin flux: 0.2% (wt.) or less P350
Caution Do not use different soldering methods together (except for partial heating).
Data Sheet D18754EJ1V0DS
7
NP160N04TUG
• T he information in this document is current as of May, 2007. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC Electronics data sheets or data books, etc., for the most up-to-date specifications of NEC Electronics products. Not all products and/or types are available in every country. Please check with an NEC Electronics sales representative for availability and additional information. • No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Electronics. NEC Electronics assumes no responsibility for any errors that may appear in this document. • NEC Electronics does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC Electronics products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Electronics or others. • Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of a customer's equipment shall be done under the full responsibility of the customer. NEC Electronics assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. • While NEC Electronics endeavors to enhance the quality, reliability and safety of NEC Electronics products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC Electronics products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment and anti-failure features. • NEC Electronics products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to NEC Electronics products developed based on a customerdesignated "quality assurance program" for a specific application. The recommended applications of an NEC Electronics product depend on its quality grade, as indicated below. Customers must check the quality grade of each NEC Electronics product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots. "Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support). "Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. The quality grade of NEC Electronics products is "Standard" unless otherwise expressly specified in NEC Electronics data sheets or data books, etc. If customers wish to use NEC Electronics products in applications not intended by NEC Electronics, they must contact an NEC Electronics sales representative in advance to determine NEC Electronics' willingness to support a given application. (Note) (1) "NEC Electronics" as used in this statement means NEC Electronics Corporation and also includes its majority-owned subsidiaries. (2) "NEC Electronics products" means any product developed or manufactured by or for NEC Electronics (as defined above).
M8E 02. 11-1