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UPA1715G

UPA1715G

  • 厂商:

    NEC(日电电子)

  • 封装:

  • 描述:

    UPA1715G - SWITCHING P-CHANNEL POWER MOS FET INDUSTRIAL USE - NEC

  • 数据手册
  • 价格&库存
UPA1715G 数据手册
DATA SHEET MOS FIELD EFFECT TRANSISTOR µ PA1715 SWITCHING P-CHANNEL POWER MOS FET INDUSTRIAL USE DESCRIPTION This product is P-Channel MOS Field Effect Transistor designed for power management applications of notebook computers and Li-ion battery protection circuit. FEATURES • Low on-resistance RDS(on)1 = 8.5 mΩ TYP. (VGS = –10 V, ID = –6.0 A) RDS(on)2 = 11.0 mΩ TYP. (VGS = –4.5 V, ID = –6.0 A) RDS(on)3 = 12.0 mΩ TYP. (VGS = –4.0 V, ID = –6.0 A) • Low Ciss : Ciss = 3800 pF TYP. • Built-in G-S protection diode • Small and surface mount package (Power SOP8) PACKAGE DRAWING (Unit : mm) 8 5 1,2,3 ; Source ; Gate 4 5,6,7,8 ; Drain 1 4 5.37 Max. +0.10 –0.05 6.0 ±0.3 4.4 0.8 0.15 ORDERING INFORMATION PART NUMBER PACKAGE Power SOP8 1.8 Max. 1.44 0.05 Min. 0.5 ±0.2 0.10 1.27 0.78 Max. 0.40 +0.10 –0.05 µ PA1715G 0.12 M ABSOLUTE MAXIMUM RATINGS (TA = 25°C, All terminals are connected.) Drain to Source Voltage (VGS = 0 V) Gate to Source Voltage (VDS = 0 V) Drain Current (DC) Drain Current (pulse) Note1 Note2 EQUIVARENT CIRCUIT Drain VDSS VGSS ID(DC) ID(pulse) PT Tch Tstg –30 V V A A W °C °C Gate Protection Diode Gate # 20 #11 # 44 2.0 150 –55 to +150 Body Diode Total Power Dissipation (TA = 25°C) Channel Temperature Storage Temperature Source Notes 1. PW ≤ 10 µ s, Duty Cycle ≤ 1 % 2. Mounted on ceramic substrate of 1200 mm x 0.7 mm Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device. 2 The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. Not all devices/types available in every country. Please check with local NEC representative for availability and additional information. Document No. G13669EJ1V0DS00 (1st edition) Date Published March 1999 NS CP(K) Printed in Japan © 1998, 1999 µ PA1715 ELECTRICAL CHARACTERISTICS (TA = 25 °C, All terminals are connected.) CHARACTERISTICS Drain to Source On-state Resistance SYMBOL RDS(on)1 RDS(on)2 RDS(on)3 Gate to Source Cut-off Voltage Forward Transfer Admittance Drain Leakage Current Gate to Source Leakage Current Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate to Source Charge Gate to Drain Charge Body Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS(off) | yfs | IDSS IGSS Ciss Coss Crss td(on) tr td(off) tf QG QGS QGD VF(S-D) trr Qrr TEST CONDITIONS VGS = –10 V, ID = –6.0 A VGS = –4.5 V, ID = –6.0 A VGS = –4.0 V, ID = –6.0 A VDS = –10 V, ID = –1 mA VDS = –10 V, ID = –6.0 A VDS = –30 V, VGS = 0 V VGS = MIN. TYP. 8.5 11 12 MAX. 11.5 16 17.5 UNIT mΩ mΩ mΩ V S –1.0 10 –1.6 23 –2.5 –1 µA µA pF pF pF ns ns ns ns nC nC nC V ns nC # 20 V, VDS = 0 V 3800 1200 500 40 240 230 160 70 9 17 0.8 53 57 # 10 VDS = –10 V VGS = 0 V f = 1 MHz ID = –6.0 A VGS(on) = –10 V VDD = –15 V RG = 10 Ω ID = –11 A VDD = –24 V VGS = –10 V IF = 11 A, VGS = 0 V IF = 11 A, VGS = 0 V di/dt = 100 A/µ s TEST CIRCUIT 1 SWITCHING TIME D.U.T. RL VGS VGS Wave Form TEST CIRCUIT 2 GATE CHARGE D.U.T. IG = 2 mA 10 % 90 % 90 % ID VGS (on) 90 % RL VDD PG. RG RG = 10 Ω 0 ID VDD PG. 50 Ω VGS 0 τ τ = 1µ s Duty Cycle ≤ 1 % D Wave Form I 0 10 % td (on) ton tr td (off) toff 10 % tf 2 Data Sheet G13669EJ1V0DS00 µ PA1715 TYPICAL CHARACTERISTICS (TA = 25 °C) DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA 2.8 TOTAL POWER DISSIPATION vs. AMBIENT TEMPERATURE dT - Percentage of Rated Power - % PT - Total Power Dissipation - W 100 80 60 40 20 2.4 2.0 1.6 1.2 0.8 0.4 0 20 40 60 Mounted on ceramic substrate of 1200mm 2 x 0.7mm 0 20 40 60 80 100 120 140 160 80 100 120 140 160 TA - Ambient Temperature - ˚C TA - Ambient Temperature - ˚C FORWARD BIAS SAFE OPERATING AREA −100 ID(pulse) Remark Mounted on ceramic substrate of 1m s ID - Drain Current - A −10 ID(DC) 1200 mm x 0.7 mm 2 10 Po m 10 we rD iss s 0m s −1 ip at io n Li m TA = 25 ˚C −0.1 Single Pulse −0.1 −1 ite d −10 −100 VDS - Drain to Source Voltage - V TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH 1000 rth(t) - Transient Thermal Resistance - ˚C/W 100 Rth(ch-A) = 62.5˚C 10 1 Mounted on ceramic substrate of 1200 mm2 x 0.7 mm Single Pulse 0.1 100 µ 1m 10 m 100 m 1 10 100 1000 PW - Pulse Width - s Data Sheet G13669EJ1V0DS00 3 µ PA1715 FORWARD TRANSFER CHARACTERISTICS −100 Pulsed −50 TA = −50˚C −25˚C 25˚C 75˚C 125˚C 150˚C DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE Pulsed VGS = −10 V −4.5 V −4 V ID - Drain Current - A −10 ID - Drain Current - A −2.0 VDS = −10 V −3.0 −4.0 −40 −30 −20 −10 −1 −0.1 0 −1.0 0 −0.2 −0.4 −0.6 −0.8 VGS - Gate to Source Voltage - V VDS - Drain to Source Voltage - V |yfs| - Forward Transfer Admittance - S 10 TA = −50˚C −25˚C 25˚C 75˚C 125˚C 150˚C VDS = −10 V Pulsed RDS(on) - Drain to Source On-State Resistance - mΩ FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE Pulsed 30 20 ID = −11 A −6 A 1 10 −0.1 −1 −10 −100 0 −5 −10 −15 ID- Drain Current - A VGS - Gate to Source Voltage - V RDS(on) - Drain to Source On-state Resistance - mΩ DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT GATE TO SOURCE CUTOFF VOLTAGE vs. CHANNEL TEMPERATURE VGS(off) - Gate to Source Cut-off Voltage - V 20 Pulsed −2.0 VDS = −10 V ID = −1 mA 15 −1.5 VGS = −4 V −4.5 V −1.0 10 −10 V −0.5 5 −1 −10 ID - Drain Current - A −100 0 −50 0 50 100 150 Tch - Channel Temperature - ˚C 4 Data Sheet G13669EJ1V0DS00 µ PA1715 RDS(on) - Drain to Source On-state Resistance - mΩ DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE 20 18 16 14 12 10 8 6 4 −50 0 50 100 ID = −6 A 150 0 0.2 VGS = −4 V −4.5 V −10 V 100 SOURCE TO DRAIN DIODE FORWARD VOLTAGE Pulsed IF - Diode Forward Current - A VGS = −4.5 V 10 0V 1 0.1 0.4 0.6 0.8 1.0 1.2 1.4 Tch - Channel Temperature - ˚C VF - Source to Drain Voltage - V CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE 1 000 SWITCHING CHARACTERISTICS td(on), tr, td(off), tf - Switching Time - ns Ciss, Coss, Crss - Capacitance - pF tr td(off) tf 100 td(on) Ciss 1 000 Coss Crss 100 10 VDS = −15 V VGS = −10 V RG = 10Ω −10 −100 VGS = 0 V f = 1 MHz −0.1 −1 −10 −100 1 −0.1 −1 VDS - Drain to Source Voltage - V ID - Drain Current - A REVERSE RECOVERY TIME vs. DIODE CURRENT VDS - Drain to Source Voltage - V trr - Reverse Recovery Time - ns −30 VDS = −24 V −15 V −6 V VGS −12 −10 −8 −6 100 −20 10 −10 VDS 0 10 20 30 40 50 60 70 −4 −2 0 −0.1 −1 −10 −100 IF - Diode Current - A QG - Gate Charge - nC VGS - Gate to Source Voltage - V di/dt = 100 A/µ s VGS = 0 V DYNAMIC INPUT/OUTPUT CHARACTERISTICS −40 ID = −11.0 A Data Sheet G13669EJ1V0DS00 5 µ PA1715 [MEMO] 6 Data Sheet G13669EJ1V0DS00 µ PA1715 [MEMO] Data Sheet G13669EJ1V0DS00 7 µ PA1715 • The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. • N o part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. • NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. • D escriptions of circuits, software, and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software, and information in the design of the customer's equipment shall be done under the full responsibility of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third parties arising from the use of these circuits, software, and information. • While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. • N EC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. M7 98. 8
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