DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µPA1890
N- AND P-CHANNEL MOS FIELD EFFECT TRANSISTOR FOR SWITCHING
DESCRIPTION
The µPA1890 is a switching device which can be driven directly by a 4.0-V power source. The µPA1890 features a low on-state resistance and excellent switching characteristics, and is suitable for applications such as power switch of portable machine and so on.
8
PACKAGE DRAWING (Unit : mm)
5 1 2, 3 4 5 6, 7 8 :Drain1 :Source1 :Gate1 :Gate2 :Source2 :Drain2
1.2 MAX. 1.0±0.05 0.25
° 3° +5° –3
FEATURES
• Can be driven by a 4.0-V power source • Low on-state resistance N-Channel RDS(on)1 = 27 mΩ MAX. (VGS = 10 V, ID = 3.0 A) RDS(on)2 = 37 mΩ MAX. (VGS = 4.5 V, ID = 3.0 A) RDS(on)3 = 47 mΩ MAX. (VGS = 4.0 V, ID = 3.0 A) P-Channel RDS(on)1 = 37 mΩ MAX. (VGS = –10 V, ID = –2.5 A) RDS(on)2 = 56 mΩ MAX. (VGS = –4.5 V, ID = –2.5 A) RDS(on)3 = 64 mΩ MAX. (VGS = –4.0 V, ID = –2.5 A) • Built-in G-S protection diode against ESD
0.1±0.05 1 4
0.5 0.6 +0.15 –0.1
0.145 ±0.055
3.15 ±0.15 3.0 ±0.1
6.4 ±0.2 4.4 ±0.1 1.0 ±0.2
0.65
0.8 MAX. 0.10 M
0.1
ORDERING INFORMATION
PART NUMBER PACKAGE Power TSSOP8
0.27 +0.03 –0.08
µPA1890GR-9JG
EQUIVALENT CIRCUIT
Drain1 Drain2
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
N-Channel / P-Channel Drain to Source Voltage Gate to Source Voltage Drain Current (DC) Drain Current (pulse)
Note1 Note2
VDSS VGSS ID(DC) ID(pulse) PT Tch Tstg
30/–30 ±20/ # 20 ±6.0/ # 5.0 ±24/ # 20 2.0 150 –55 to +150
V V A A W °C °C
Gate1
Body Diode
Gate2
Body Diode
Gate Protection Diode
Source1
Gate Protection Diode
Source2
Total Power Dissipation Channel Temperature Storage Temperature
N-Channel
P-Channel
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1 % 2 2. Mounted on ceramic substrate of 5000 mm x 1.1 mm Remark
To keep good radiate condition, it is recommended that all pins are soldering to print board.
The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for availability and additional information.
Document No. G14762EJ1V0DS00 (1st edition) Date Published March 2000 NS CP(K) Printed in Japan
©
2000
µPA1890
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
A) N-Channel
CHARACTERISTICS Drain Cut-off Current Gate Leakage Current Gate Cut-off Voltage Forward Transfer Admittance Drain to Source On-state Resistance SYMBOL I DSS IGSS VGS(off) | yfs | RDS(on)1 RDS(on)2 RDS(on)3 Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate to Source Charge Gate to Drain Charge Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Ciss Coss Crss td(on) tr td(off) tf QG QGS QGD VF(S-D) trr Qrr TEST CONDITIONS VDS = 30 V, VGS = 0 V VGS = ±16 V, VDS = 0 V VDS = 10 V, ID = 1 mA VDS = 10 V, ID = 3.0 A VGS = 10 V, ID = 3.0 A VGS = 4.5 V, ID = 3.0 A VGS = 4.0 V, ID = 3.0 A VDS = 10 V VGS = 0 V f = 1 MHz VDD = 15 V ID = 3.0 A VGS(on) = 10 V RG = 10 Ω VDD = 24 V ID = 6.0 A VGS = 10 V IF = 6.0 A, VGS = 0 V IF = 6.0 A, VGS = 0 V di/dt = 100 A / µs 1.5 3 1.8 7.6 18 24 27 748 227 107 20 80 48 30 14 1.9 3.8 0.82 31 32 27 37 47 MIN. TYP. MAX. –10 ±10 2.5 UNIT
µA µA
V S mΩ mΩ mΩ pF pF pF ns ns ns ns nC nC nC V ns nC
TEST CIRCUIT 1 SWITCHING TIME
TEST CIRCUIT 2 GATE CHARGE
D.U.T.
D.U.T. RL PG. RG VDD ID VGS 0 τ τ = 1 µs Duty Cycle ≤ 1 % ID
Wave Form
VGS VGS
Wave Form
IG = 2 mA VGS(on)
90 %
RL VDD
0
10 %
PG.
90 % 90 %
50 Ω
ID
0 10 % 10 %
td(on) ton
tr td(off) toff
tf
2
Data Sheet G14762EJ1V0DS00
µPA1890
B) P-Channel
CHARACTERISTICS Drain Cut-off Current Gate Leakage Current Gate Cut-off Voltage Forward Transfer Admittance Drain to Source On-state Resistance SYMBOL I DSS IGSS VGS(off) | yfs | RDS(on)1 RDS(on)2 RDS(on)3 Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate to Source Charge Gate to Drain Charge Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Ciss Coss Crss td(on) tr td(off) tf QG QGS QGD VF(S-D) trr Qrr TEST CONDITIONS VDS = –30 V, VGS = 0 V VGS = # 16 V, VDS = 0 V VDS = –10 V, ID = –1 mA VDS = –10 V, ID = –2.5 A VGS = –10 V, ID = –2.5 A VGS = –4.5 V, ID = –2.5 A VGS = –4.0 V, ID = –2.5 A VDS = –10 V VGS = 0 V f = 1 MHz VDD = –15 V ID = –2.5 A VGS(on) = –10 V RG = 10 Ω VDD = –24 V ID = –5.0 A VGS = –10 V IF = 5.0 A, VGS = 0 V IF = 5.0 A, VGS = 0 V di/dt = 50 A / µs –1.3 3 –1.8 7.8 28 42 47 851 279 128 17 52 84 73 15 1.9 4.2 0.83 38 35 37 56 64 MIN. TYP. MAX. –10
# 10
UNIT
µA µA
V S mΩ mΩ mΩ pF pF pF ns ns ns ns nC nC nC V ns nC
–2.3
TEST CIRCUIT 1 SWITCHING TIME
TEST CIRCUIT 2 GATE CHARGE
D.U.T.
D.U.T. RL PG. RG VDD ID ( − ) VGS (−) 0 τ τ = 1 µs Duty Cycle ≤ 1 % ID
Wave Form
VGS (−) VGS
Wave Form
IG = −2 mA VGS(on)
90 %
RL VDD
0
10 %
PG.
90 % 90 %
50 Ω
ID
0 10 % 10 %
td(on) ton
tr td(off) toff
tf
Data Sheet G14762EJ1V0DS00
3
µPA1890
TYPICAL CHARACTERISTICS (TA = 25°C)
A) N-Channel
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA 100 80
FORWARD BIAS SAFE OPERATING AREA 100
L n) S(o RD VGS ited im V) 0 =1
ID (pulse)
PW =1
dT - Derating Factor - %
ID - Drain Current - A
10
(@
ID (DC)
60
1
10 0m DC s
10 ms
ms
40
20
0.1
Single Pulse Mounted on Ceramic Substrate of 5000 mm2x 1.1 mm 0.01 PD(FET1):PD(FET2) = 1:1
0
30 60 90 120 TA - Ambient Temperature - ˚C
150
0.1
1
10
100
VDS - Drain to Source Voltage - V
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE 25 Pulsed VGS = 10 V
TRANSFER CHARACTERISTICS 100 10 VDS = 10 V
ID - Drain Current - A
ID - Drain Current - A
20
15
4.5 V 4.0 V
1 0.1 0.01 0.001 0.0001 TA = −25˚C 25˚C 75˚C 125˚C
10
5 0 0 0.2 0.4 0.6 0.8 1.0 VDS - Drain to Source Voltage - V
0.00001 0 1 2 3 4 VGS - Gate to Source Voltage - V
GATE TO SOURCE CUT-OFF VOLTAGE vs. CHANNEL TEMPERATURE
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT 100
VGS(off) - Gate to Source Cut-off Voltage - V
3
| yfs | - Forward Transfer Admittance - S
VDS = 10 V ID = 1 mA
VDS = 10 V TA = −25˚C 25˚C 75˚C 125˚C
10
2
1
1
0.1
0 −50 Tch
0
50 100 - Channel Temperature -˚C
150
0.01 0.01
0.1 1 10 ID - Drain Current - A
100
4
Data Sheet G14762EJ1V0DS00
µPA1890
RDS(on) - Drain to Source On-State Resistance - mΩ
50 40 30 20 10 0 0.1
TA = 125˚C 75˚C 25˚C 25˚C
RDS(on) - Drain to Source On-State Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT 60 VGS = 4.0 V
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT 50 VGS = 4.5 V 40
TA = 125˚C 75˚C 25˚C
30
20
25˚C
10 0 0.1
1.0
10
100
1.0
10
100
ID - Drain Current - A
ID - Drain Current - A
RDS(on) - Drain to Source On-State Resistance - mΩ
RDS (on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT 40 VGS = 10 V
DRAIN TO SOURCE ON STATE RESISTANCE vs. CHANNEL TEMPERATURE 50 ID = 3.0 A
30
TA = 125˚C 75˚C
40 VGS = 4.0 V 4.5 V 30 10 V 20
20
25˚C 25˚C
10
0 0.1
1.0
10
100
10 −50
ID - Drain Current - A
0 50 100 Tch - Channel Temperature -˚C
150
RDS (on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE
50
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE 10000
40
Ciss, Coss, Crss - Capacitance - pF
ID = 3.0 A
f = 1 MHz
1000 Ciss
30
20
100
Coss Crss
10 0
10
0 5 10 15 20
1
10 VDS - Drain to Source Voltage - V
100
VGS - Gate to Source Voltage - V
Data Sheet G14762EJ1V0DS00
5
µPA1890
SWITCHING CHARACTERISTICS
SOURCE TO DRAIN DIODE FORWARD VOLTAGE 100
td(on), tr, td(off), tf - Switching Time - ns
1000
IF - Source to Drain Current - A
VDD = 15 V VGS(on) = 10 V RG =10 Ω tf
10
100
tr td(off) td(on)
1
10
0.1
1 0.1
1 ID - Drain Current - A
10
0.01 0.4
VGS = 0 V 0.6 0.8 1.0 1.2 VF(S-D) - Source to Drain Voltage - V
DYNAMIC INPUT CHARACTERISTICS 10 ID = 6.0 A
VGS - Gate to Source Voltage - V
8 VDD = 6 V 15 V 24 V
6
4
2
0
0
2
4
6
8
10
12
QG - Gate Charge - nC
6
Data Sheet G14762EJ1V0DS00
µPA1890
B) P-Channel
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA 100 80
FORWARD BIAS SAFE OPERATING AREA −100
)L on = S( RD GS
dT - Derating Factor - %
ID - Drain Current - A
−10
d ite ) im 0 V −1
ID (pulse)
PW =1
V (@
ID (DC)
60
10 ms
ms
−1
DC
10 0m s
40
20
−0.1
0
Single Pulse Mounted on Ceramic Substrate of 5000 mm2x 1.1 mm −0.01 PD(FET1):PD(FET2) = 1:1
30 60 90 120 TA - Ambient Temperature - ˚C
150
−0.1
−1
−10
−100
VDS - Drain to Source Voltage - V
−20
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE Pulsed
TRANSFER CHARACTERISTICS −100 −10 VDS = −10 V
ID - Drain Current - A
−15
ID - Drain Current - A
VGS = −10 V −4.5 V −4.0 V
−1 −0.1 −0.01 −0.001 TA = −25˚C 25˚C 75˚C 125˚C
−10
−5
−0.0001 −0.00001 0 −0.2 −0.4 −0.6 −0.8 −1.0 0 VDS - Drain to Source Voltage - V −1 −2 −3 −4
0
VGS - Gate to Source Voltage - V
GATE TO SOURCE CUT-OFF VOLTAGE vs. CHANNEL TEMPERATURE
VGS(off) - Gate to Source Cut-off Voltage - V
−3
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT 100
| yfs | - Forward Transfer Admittance - S
VDS = −10 V ID = −1 mA
VDS = −10 V
−2
10 TA = −25˚C 25˚C 75˚C 125˚C 1
−1
0.1
0 −50 Tch
0
50 100 - Channel Temperature -˚C
150
0.01 −0.01
−0.1 −1 −10 ID - Drain Current - A
−100
Data Sheet G14762EJ1V0DS00
7
µPA1890
RDS(on) - Drain to Source On-State Resistance - mΩ
RDS(on) - Drain to Source On-State Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT 100 VGS = −4.0 V
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT 80 VGS = −4.5 V
TA = 125˚C 75˚C 25˚C
80
TA = 125˚C
60
60
75˚C 25˚C
40
25˚C
40
-25˚C
20
20 −0.1
−1.0
−10
−100
0 −0.1
−1.0
−10
−100
ID - Drain Current - A
ID - Drain Current - A
RDS(on) - Drain to Source On-State Resistance - mΩ
RDS (on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT 50 VGS = −10 V
TA = 125˚C
DRAIN TO SOURCE ON STATE RESISTANCE vs. CHANNEL TEMPERATURE 80 ID = −2.5 A VGS = −4.0 V 60 −4.5 V 40
40
75˚C
30
25˚C
−10 V
25˚C
20
20
10 −0.1
−1.0
−10
−100
0 −50
ID - Drain Current - A
0 50 100 Tch - Channel Temperature -˚C
150
RDS (on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE
80
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE 10000
60
Ciss, Coss, Crss - Capacitance - pF
ID = −2.5 A
f = 1 MHz
1000
Ciss
40
Coss 100 Crss
20
0
0
−5
−10
−15
−20
10 −1
−10 VDS - Drain to Source Voltage - V
−100
VGS - Gate to Source Voltage - V
8
Data Sheet G14762EJ1V0DS00
µPA1890
SWITCHING CHARACTERISTICS
SOURCE TO DRAIN DIODE FORWARD VOLTAGE 100
td(on), tr, td(off), tf - Switching Time - ns
10000
IF - Source to Drain Current - A
VDD = −15 V VGS(on) = −10 V RG =10 Ω td(off) tf tr td(on)
10
1000
1
100
0.1 VGS = 0 V
10 −0.1
−1 ID - Drain Current - A
−10
0.01 0.4
0.6
0.8
1.0
1.2
VF(S-D) - Source to Drain Voltage - V
DYNAMIC INPUT CHARACTERISTICS 10 ID = 5.0 A
VGS - Gate to Source Voltage - V
8 VDD = 6 V 15 V 24 V
6
4
2
0
0
2
4
6
8
10
12
14
16
QG - Gate Charge - nC
Data Sheet G14762EJ1V0DS00
9
µPA1890
C) Common
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH 1000
rth(t) - Transient Thermal Resistance - ˚C/W
100
62.5˚C/W
10
1
Mounted on Ceramic Substrate of 5000 mm2 x 1.1 mm Single Pulse PD(FET1):PD(FET2) = 1:1
0.1 1m
10m
100m
1
10
100
1000
PW - Pulse Width - S
10
Data Sheet G14762EJ1V0DS00
µPA1890
[MEMO]
Data Sheet G14762EJ1V0DS00
11
µPA1890
• The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. • N o part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. • NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. • D escriptions of circuits, software, and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software, and information in the design of the customer's equipment shall be done under the full responsibility of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third parties arising from the use of these circuits, software, and information. • While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. • NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance.
M7 98. 8