CF5026MLB

5026 series Crystal Oscillator Module ICs OVERVIEW The 5026 series are miniature crystal oscillator module ICs. They feature a damping resistor RD matched to the crystal's characteristics to reduce crystal current. They support fundamental oscillation and 3rd overtone oscillation modes. The 5026 series can be used to correspond to wide range of applications. FEATURES I I I I I I Miniature-crystal matched oscillator characteristics Operating supply voltage range • 2.5V operation: 2.25 to 2.75V • 3.0V operation: 2.7 to 3.6V Recommended operating frequency range • For fundamental oscillator - 5026AL×: 20MHz to 50MHz - 5026BL1: 20MHz to 100MHz • For 3rd overtone oscillator - 5026ML×: 70MHz to 133MHz −40 to 85°C operating temperature range Oscillator capacitor with excellent frequency characteristics built-in Oscillator circuit with damping resistor RD builtin for reduced crystal current I I I I I I I I I Standby function • High impedance in standby mode, oscillator stops Low standby current • Power-saving pull-up resistor built-in Oscillation detector function Frequency divider built-in (5026AL×) • Varies with version: fO, fO/2, fO/4, fO/8, fO/16, fO/32 CMOS output duty level (1/2VDD) 50 ± 5% output duty @ 1/2VDD 30pF output load Molybdenum-gate CMOS process Chip form (CF5026×L×) SERIES CONFIGURATION Version Operating supply voltage range [V] Oscillation mode Recommended Output operating frequency current range (fundamental (VDD = 2.5V) oscillation)*1 [MHz] [mA] Standby mode Output frequency fO fO/2 2.25 to 3.6 CF5026AL4 CF5026AL5 CF5026AL6 CF5026BL1*2 CF5026MLA CF5026MLB CF5026MLC 2.25 to 3.6 3rd overtone 2.25 to 3.6 Fundamental 20 to 100 70 to 80 80 to 100 90 to 133 8 fO CMOS Yes Hi-Z 8 Fundamental 20 to 50 4 fO/4 fO/8 fO/16 fO/32 fO CMOS Yes Hi-Z CMOS Yes Hi-Z Output duty level Oscillator stop function Output state CF5026AL1 CF5026AL2 CF5026AL3 *1. The recommended operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillator frequency band is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. The CF5026BL1 has a higher maximum operating frequency, hence the negative resistance is also larger than in the CF5026AL× devices. ORDERING INFORMATION Device CF5026×L×–3 Package Chip form SEIKO NPC CORPORATION —1 5026 series PAD LAYOUT (Unit: µm) (750,850) HA5026 Q Y VDD VSS INHN NPC XTN (0,0) X Chip size: 0.75 × 0.85mm Chip thickness: 180 ± 20µm PAD size: 90µm Chip base: VDD level XT PIN DESCRIPTION and PAD DIMENSIONS Pad dimensions [µm] Name I/O Description X INHN XT XTN VDD Q VSS I I O – O – Output state control input. High impedance when LOW (oscillator stops). Power-saving pull-up resistor built-in. Amplifier input Amplifier output Supply voltage Output. Output frequency determined by internal circuit to one of fO, fO/2, fO/4, fO/8, fO/16, fO/32. High impedance in standby mode Ground Crystal connection pins. Crystal is connected between XT and XTN. 605 579 171 131 131 618 Y 413 144 144 438 705 718 SEIKO NPC CORPORATION —2 5026 series BLOCK DIAGRAM For Fundamental Oscillator (5026AL×, 5026BL1) VDD VSS XTN CG CD RD XT Rf 1/2 1/2 1/2 1/2 1/2 Q INHN INHN = LOW active For 3rd Overtone Oscillator (5026ML×) VDD VSS XTN CG Rf 1 Cf CD RD XT Rf 2 Q INHN INHN = LOW active SEIKO NPC CORPORATION —3 5026 series SPECIFICATIONS Absolute Maximum Ratings VSS = 0V Parameter Supply voltage range Input voltage range Output voltage range Operating temperature range Storage temperature range Output current Symbol VDD VIN VOUT Topr TSTG IOUT Condition Rating −0.5 to +7.0 −0.5 to VDD + 0.5 −0.5 to VDD + 0.5 −40 to +85 −65 to +150 20 Unit V V V °C °C mA Recommended Operating Conditions VSS = 0V Rating Parameter Symbol 5026AL× 5026BL1 5026MLA Operating supply voltage VDD 5026MLB 5026MLC Input voltage Operating temperature VIN TOPR 5026AL× 5026BL1*2 Operating frequency*1 fO 5026MLA 5026MLB*2 5026MLC*2 Condition min CL ≤ 30pF CL ≤ 30pF f ≤ 80MHz, CL ≤ 30pF f ≤ 100MHz, CL ≤ 30pF f ≤ 100MHz, CL ≤ 30pF f ≤ 133MHz, CL ≤ 15pF 2.25 2.25 2.25 2.25 2.25 2.25 VSS −40 20 20 70 80 90 typ – – – – – – – – – – – – – max 3.6 3.6 3.6 3.6 3.6 3.6 VDD +85 50 100 80 100 133 V V V V V V V °C MHz MHz MHz MHz MHz Unit *1. The operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillator frequency band is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. When 2.5V operation, the ratings of switching characteristics are difference by the frequency or output load. Refer to “Switching Characteristics”. SEIKO NPC CORPORATION —4 5026 series Electrical Characteristics 5026AL× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter HIGH-level output voltage LOW-level output voltage HIGH-level input voltage LOW-level input voltage Output leakage current Symbol VOH VOL VIH VIL IZ Condition min Q: Measurement cct 1, VDD = 2.25V, IOH = 4mA Q: Measurement cct 2, VDD = 2.25V, IOL = 4mA INHN INHN Q: Measurement cct 2, INHN = LOW VOH = VDD VOL = VSS 5026AL1 5026AL2 Current consumption IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 50MHz 5026AL3 5026AL4 5026AL5 5026AL6 Standby current INHN pull-up resistance Feedback resistance Oscillator amplifier output resistance Built-in capacitance IST RUP1 RUP2 Rf RD CG CD Measurement cct 5 Design value. A monitor pattern on a wafer is tested. Measurement cct 3, INHN = LOW Measurement cct 4 20 50 340 6.8 Design value. A monitor pattern on a wafer is tested. 8.5 10 11.5 pF 100 – 400 8 200 150 460 9.2 1.65 – 0.7VDD – – – – – – – – – – 2 typ 1.95 0.3 – – – – 7 4.5 3.5 2.9 2.5 2.4 – 6 max – 0.4 – 0.3VDD 10 10 14 9 7 5.8 5.0 4.8 3 12 V V V V µA µA mA mA mA mA mA mA µA MΩ kΩ kΩ Ω pF Unit SEIKO NPC CORPORATION —5 5026 series 5026AL× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter HIGH-level output voltage LOW-level output voltage HIGH-level input voltage LOW-level input voltage Output leakage current Symbol VOH VOL VIH VIL IZ Condition min Q: Measurement cct 1, VDD = 2.7V, IOH = 4mA Q: Measurement cct 2, VDD = 2.7V, IOL = 4mA INHN INHN Q: Measurement cct 2, INHN = LOW VOH = VDD VOL = VSS 5026AL1 5026AL2 Current consumption IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 50MHz 5026AL3 5026AL4 5026AL5 5026AL6 Standby current INHN pull-up resistance Feedback resistance Oscillator amplifier output resistance Built-in capacitance IST RUP1 RUP2 Rf RD CG CD Measurement cct 5 Design value. A monitor pattern on a wafer is tested. Measurement cct 3, INHN = LOW Measurement cct 4 15 50 340 6.8 Design value. A monitor pattern on a wafer is tested. 8.5 10 11.5 pF 75 – 400 8 150 150 460 9.2 2.3 – 0.7VDD – – – – – – – – – – 2 typ 2.4 0.3 – – – – 8.5 5.5 4 3.3 2.9 2.7 – 4 max – 0.4 – 0.3VDD 10 10 17 11 8 6.6 5.8 5.4 5 8 V V V V µA µA mA mA mA mA mA mA µA MΩ kΩ kΩ Ω pF Unit SEIKO NPC CORPORATION —6 5026 series 5026BL1 (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter HIGH-level output voltage LOW-level output voltage HIGH-level input voltage LOW-level input voltage Output leakage current Symbol VOH VOL VIH VIL IZ IDD2 IST RUP1 RUP2 Feedback resistance Oscillator amplifier output resistance Built-in capacitance Rf RD CG CD Measurement cct 5 Design value. A monitor pattern on a wafer is tested. Condition min Q: Measurement cct 1, VDD = 2.25V, IOH = 8mA Q: Measurement cct 2, VDD = 2.25V, IOL = 8mA INHN INHN Q: Measurement cct 2, INHN = LOW VOH = VDD VOL = VSS Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 100MHz Measurement cct 3, INHN = LOW Measurement cct 4 20 50 170 6.8 Design value. A monitor pattern on a wafer is tested. 8.5 10 11.5 pF 100 – 200 8 200 150 230 9.2 1.65 – 0.7VDD – – – – – 2 typ 1.95 0.3 – – – – 14 – 6 max – 0.4 – 0.3VDD 10 10 28 3 12 V V V V µA µA mA µA MΩ kΩ kΩ Ω pF Unit Current consumption Standby current INHN pull-up resistance 5026BL1 (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter HIGH-level output voltage LOW-level output voltage HIGH-level input voltage LOW-level input voltage Output leakage current Symbol VOH VOL VIH VIL IZ IDD2 IST RUP1 RUP2 Feedback resistance Oscillator amplifier output resistance Built-in capacitance Rf RD CG CD Measurement cct 5 Design value. A monitor pattern on a wafer is tested. Condition min Q: Measurement cct 1, VDD = 2.7V, IOH = 8mA Q: Measurement cct 2, VDD = 2.7V, IOL = 8mA INHN INHN Q: Measurement cct 2, INHN = LOW VOH = VDD VOL = VSS Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 100MHz Measurement cct 3, INHN = LOW Measurement cct 4 15 50 170 6.8 Design value. A monitor pattern on a wafer is tested. 8.5 10 11.5 pF 75 – 200 8 150 150 230 9.2 2.3 – 0.7VDD – – – – – 2 typ 2.4 0.3 – – – – 19 – 4 max – 0.4 – 0.3VDD 10 10 38 5 8 V V V V µA µA mA µA MΩ kΩ kΩ Ω pF Unit Current consumption Standby current INHN pull-up resistance SEIKO NPC CORPORATION —7 5026 series 5026ML× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter HIGH-level output voltage LOW-level output voltage HIGH-level input voltage LOW-level input voltage Output leakage current Symbol VOH VOL VIH VIL IZ IDD1 Current consumption IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF Measurement cct 3, INHN = LOW Measurement cct 4 20 5026MLA AC feedback resistance Rf1 Design value. A monitor pattern on a wafer is tested. Measurement cct 5 Design value. A monitor pattern on a wafer is tested. Design value. A monitor pattern on a wafer is tested. 5026MLA CG Built-in capacitance 5026MLA CD Design value. A monitor pattern on a wafer is tested. 5026MLB 5026MLC 3.40 3.40 3.40 4 4 4 4.60 4.60 4.60 pF pF pF Design value. A monitor pattern on a wafer is tested. 5026MLB 5026MLC 5026MLB 5026MLC DC feedback resistance Oscillator amplifier output resistance AC feedback capacitance Rf2 RD Cf 3.99 2.29 2.97 50 85 8.5 1.70 1.70 0.85 100 4.7 2.70 3.5 – 100 10 2 2 1 200 5.41 3.11 4.03 150 115 11.5 2.30 2.30 1.15 Condition min Q: Measurement cct 1, VDD = 2.25V, IOH = 8mA Q: Measurement cct 2, VDD = 2.25V, IOL = 8mA INHN INHN Q: Measurement cct 2, INHN = LOW Measurement cct 3, load cct 1, INHN = open, CL = 15pF VOH = VDD VOL = VSS f = 133MHz f = 72MHz f = 100MHz f = 100MHz Standby current INHN pull-up resistance IST RUP1 RUP2 5026MLC 5026MLA 5026MLB 5026MLC 1.65 – 0.7VDD – – – – – – – – 2 typ 1.95 0.3 – – – – 15 11 15 15 – 6 max – 0.4 – 0.3VDD 10 10 30 22 30 30 3 12 V V V V µA µA mA mA mA mA µA MΩ kΩ kΩ kΩ kΩ kΩ Ω pF pF pF pF Unit SEIKO NPC CORPORATION —8 5026 series 5026ML× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter HIGH-level output voltage LOW-level output voltage HIGH-level input voltage LOW-level input voltage Output leakage current Symbol VOH VOL VIH VIL IZ IDD1 Current consumption IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF Measurement cct 3, INHN = LOW Measurement cct 4 15 5026MLA AC feedback resistance Rf1 Design value. A monitor pattern on a wafer is tested. Measurement cct 5 Design value. A monitor pattern on a wafer is tested. Design value. A monitor pattern on a wafer is tested. 5026MLA CG Built-in capacitance 5026MLA CD Design value. A monitor pattern on a wafer is tested. 5026MLB 5026MLC 3.40 3.40 3.40 4 4 4 4.60 4.60 4.60 pF pF pF Design value. A monitor pattern on a wafer is tested. 5026MLB 5026MLC 5026MLB 5026MLC DC feedback resistance Oscillator amplifier output resistance AC feedback capacitance Rf2 RD Cf 3.99 2.29 2.97 50 85 8.5 1.70 1.70 0.85 75 4.7 2.70 3.5 – 100 10 2 2 1 150 5.41 3.11 4.03 150 115 11.5 2.30 2.30 1.15 Condition min Q: Measurement cct 1, VDD = 2.7V, IOH = 8mA Q: Measurement cct 2, VDD = 2.7V, IOL = 8mA INHN INHN Q: Measurement cct 2, INHN = LOW Measurement cct 3, load cct 1, INHN = open, CL = 15pF VOH = VDD VOL = VSS f = 133MHz f = 72MHz f = 100MHz f = 100MHz Standby current INHN pull-up resistance IST RUP1 RUP2 5026MLC 5026MLA 5026MLB 5026MLC 2.3 – 0.7VDD – – – – – – – – 2 typ 2.4 0.3 – – – – 20 15 20 20 – 4 max – 0.4 – 0.3VDD 10 10 40 30 40 40 5 8 V V V V µA µA mA mA mA mA µA MΩ kΩ kΩ kΩ kΩ kΩ Ω pF pF pF pF Unit SEIKO NPC CORPORATION —9 5026 series Switching Characteristics 5026AL× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol tr1 tr2 Output fall time tf1 tf2 Output duty cycle*1 Output disable delay time*2 Output enable delay time*2 Duty1 Duty2 tPLZ tPZL Condition min Output rise time Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C, f = 50MHz CL = 15pF CL = 30pF CL = 15pF CL = 30pF CL = 15pF CL = 30pF – – – – 45 45 – – typ 3 5 3 5 – – – – max 6 10 6 10 55 55 100 100 ns ns ns ns % % ns ns Unit Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. 5026AL× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol tr1 tr2 Output fall time tf1 tf2 Output duty cycle*1 Output disable delay time*2 Output enable delay time*2 Duty1 Duty2 tPLZ tPZL Condition min Output rise time Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, f = 50MHz CL = 15pF CL = 30pF CL = 15pF CL = 30pF CL = 15pF CL = 30pF – – – – 45 45 – – typ 2.5 4.5 2.5 4.5 – – – – max 5 9 5 9 55 55 100 100 ns ns ns ns % % ns ns Unit Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. SEIKO NPC CORPORATION —10 5026 series 5026BL1 (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol tr1 Output rise time tr2 tr3 tf1 Output fall time tf2 tf3 Duty1 Output duty cycle*1 Duty2 Duty3 Output disable delay time*2 Output enable delay time*2 tPLZ tPZL Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C Condition min Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD Measurement cct 3, load cct 1, 0.2VDD to 0.8VDD Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD Measurement cct 3, load cct 1, 0.8VDD to 0.2VDD CL = 15pF CL = 30pF CL = 30pF CL = 15pF CL = 30pF CL = 30pF CL = 15pF f = 100MHz CL = 30pF f = 80MHz CL = 30pF f = 100MHz Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF – – – – – – 45 45 40 – – typ 2 3 2.5 2 3 2.5 – – – – – max 4 6 5 4 6 5 55 55 60 100 100 ns ns ns ns ns ns % % % ns ns Unit *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. 5026BL1 (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol tr1 tr2 Output fall time tf1 tf2 Output duty cycle*1 Output disable delay time*2 Output enable delay time*2 Duty1 Duty2 tPLZ tPZL Condition min Output rise time Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, f = 100MHz CL = 15pF CL = 30pF CL = 15pF CL = 30pF CL = 15pF CL = 30pF – – – – 45 45 – – typ 1.5 2.5 1.5 2.5 – – – – max 3 5 3 5 55 55 100 100 ns ns ns ns % % ns ns Unit Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. SEIKO NPC CORPORATION —11 5026 series 5026ML× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Parameter Symbol tr1 tr2 tf1 tf2 Duty1 Output duty cycle*1 Duty2 Output disable delay time*2 Output enable delay time*2 Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 30pF Condition Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF f = 72MHz f = 100MHz f = 133MHz f = 72MHz f = 100MHz f = 100MHz CL = 15pF CL = 30pF CL = 15pF CL = 30pF 5026MLA 5026MLB 5026MLC 5026MLA 5026MLB 5026MLC Rating min – – – – 45 45 45 45 40 40 – – typ 2 3 2 3 – – – – – – – – max 4 6 4 6 55 55 55 55 60 60 100 100 Unit ns ns ns ns % % % % % % ns ns Output rise time Output fall time tPLZ tPZL Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. 5026ML× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Parameter Symbol tr1 tr2 tf1 tf2 Duty1 Output duty cycle*1 Duty2 Condition Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 30pF f = 72MHz f = 100MHz f = 133MHz f = 72MHz f = 100MHz CL = 15pF CL = 30pF CL = 15pF CL = 30pF 5026MLA 5026MLB 5026MLC 5026MLA 5026MLB 5026MLC Rating min – – – – 45 45 45 45 45 45 – – typ 1.5 2.5 1.5 2.5 – – – – – – – – max 3 5 3 5 55 55 55 55 55 55 100 100 Unit ns ns ns ns % % % % % % ns ns Output rise time Output fall time Measurement cct 3, load cct 1, VDD = 3.3V, Ta = 25°C, CL = 30pF, f = 100MHz Output disable delay time*2 Output enable delay time*2 tPLZ tPZL Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. SEIKO NPC CORPORATION —12 5026 series Current consumption and Output waveform with NPC’s standard crystal R [ Ω] 16.12 − − Cb f [MHz] 50 72 100 L [mH] 6.88 − − Ca [fF] 1.48 − − Cb [pF] 1.18 − − L Ca R Note. The 72MHz and 100MHz crystal parameters are confidential. FUNCTIONAL DESCRIPTION Standby Function When INHN goes LOW, the oscillator stops and the oscillator output on Q becomes high impedance. Version 5026AL× 5026BL1, ML× 5026AL×, BL1, ML× INHN HIGH (or open) LOW Q Any fO, fO/2, fO/4, fO/8, fO/16 or fO/32 output frequency fO High impedance Stopped Oscillator Normal operation Power-saving Pull-up Resistor The INHN pull-up resistance changes in response to the input level (HIGH or LOW). When INHN goes LOW (standby state), the pull-up resistance becomes large to reduce the current consumption during standby. SEIKO NPC CORPORATION —13 5026 series MEASUREMENT CIRCUITS Measurement cct 1 Measurement cct 4 Signal Generator C1 XT R1 XTN INHN VDD Q VSS R2 XT XTN INHN VDD Q VSS RUP1 = VDD IPR (VPR = V SS) V VPR VDD VOH 0V IPR RUP2 = VDD VPR IPR (VPR = 0.7VDD) A Q output 2Vp-p, 10MHz sine wave input signal C1: 0.001µF R1: 50Ω R2: 5026AL× : 412Ω (2.5V operation) 575Ω (3.0V operation) 5026BL1, ML× : 206Ω (2.5V operation) 287Ω (3.0V operation) Measurement cct 5 Measurement cct 2 XT XTN INHN VDD Rf = Q Rf 2 = VSS VDD IRf VDD IRf IZ, IOL XT XTN INHN VDD Q VSS IZ A A IRf V VOH VOL Measurement cct 6 Measurement cct 3 Signal Generator C1 XT R1 XTN INHN VDD Q VSS A XT X'tal XTN INHN VDD IDD IST Q VSS 2Vp-p, 10MHz sine wave input signal C1: 0.001µF R1: 50Ω Load cct 1 Q output CL (Including probe capacitance) SEIKO NPC CORPORATION —14 5026 series Switching Time Measurement Waveform Output duty level, tr, tf 0.9VDD 0.8VDD 0.9VDD 0.8VDD 0.2VDD 0.1VDD Q output 0.2VDD 0.1VDD DUTY measurement voltage (0.5V DD ) tr3 tr1,tr2 Output duty cycle TW tf3 tf1,tf2 Q output TW T DUTY measurement voltage (0.5V DD) DUTY= TW/ T 100 (%) Output Enable/Disable Delay when the device is in standby, the oscillator stops. When standby is released, the oscillator starts and stable oscillator output occurs after a short delay. INHN VIL VIH tPLZ Q output INHN input waveform tr = tf tPZL 10ns SEIKO NPC CORPORATION —15 5026 series Please pay your attention to the following points at time of using the products shown in this document. The products shown in this document (hereinafter “Products”) are not intended to be used for the apparatus that exerts harmful influence on human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such use from SEIKO NPC CORPORATION (hereinafter “NPC”). Customers shall be solely responsible for, and indemnify and hold NPC free and harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties. Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document. Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products, and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 15-6, Nihombashi-kabutocho, Chuo-ku, Tokyo 103-0026, Japan Telephone: +81-3-6667-6601 Facsimile: +81-3-6667-6611 http://www.npc.co.jp/ Email: sales@npc.co.jp NC0413CE 2008.12 SEIKO NPC CORPORATION —16