5420

5420 DM5420 DM7420 Dual 4-Input NAND Gates June 1989 5420 DM5420 DM7420 Dual 4-Input NAND Gates General Description This device contains two independent gates each of which performs the logic NAND function Features Y Alternate Military Aerospace device (5420) is available Contact a National Semiconductor Sales Office Distributor for specifications Connection Diagram Dual-In-Line Package TL F 6506 – 1 Order Number 5420DMQB 5420FMQB DM5420J DM5420W or DM7420N See NS Package Number J14A N14A or W14B Function Table Y e ABCD Inputs A X X X L H B X X L X H C X L X X H D L X X X H Output Y H H H H L H e High Logic Level L e Low Logic Level X e Either Low or High Logic Level C1995 National Semiconductor Corporation TL F 6506 RRD-B30M105 Printed in U S A Absolute Maximum Ratings (Note) If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications Supply Voltage 7V Input Voltage 5 5V Operating Free Air Temperature Range b 55 C to a 125 C DM54 and 54 DM74 0 C to a 70 C Storage Temperature Range b 65 C to a 150 C Note The ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed The device should not be operated at these limits The parametric values defined in the ‘‘Electrical Characteristics’’ table are not guaranteed at the absolute maximum ratings The ‘‘Recommended Operating Conditions’’ table will define the conditions for actual device operation Recommended Operating Conditions Symbol VCC VIH VIL IOH IOL TA Parameter Min Supply Voltage High Level Input Voltage Low Level Input Voltage High Level Output Current Low Level Output Current Free Air Operating Temperature b 55 DM5402 Nom 5 Max 55 Min 4 75 2 08 b0 4 DM7402 Nom 5 Max 5 25 Units V V 08 b0 4 45 2 V mA mA C 16 125 0 16 70 Electrical Characteristics over recommended operating free air temperature range (unless otherwise noted) Symbol VI VOH VOL II IIH IIL IOS Parameter Input Clamp Voltage High Level Output Voltage Low Level Output Voltage Input Current Input Voltage Max Conditions VCC e Min II e b12 mA VCC e Min IOH e Max VIL e Max VCC e Min IOL e Max VIH e Min VCC e Max VI e 5 5V VCC e Max VI e 2 4V VCC e Max VI e 0 4V VCC e Max (Note 2) VCC e Max VCC e Max DM54 DM74 b 20 b 18 Min Typ (Note 1) Max b1 5 Units V V 24 34 02 04 1 40 b1 6 b 55 b 55 V mA mA mA mA High Level Input Current Low Level Input Current Short Circuit Output Current Supply Current with Outputs High Supply Current with Outputs Low ICCH ICCL 2 6 4 11 mA mA Switching Characteristics at VCC e 5V and TA e 25 C (See Section 1 for Test Waveforms and Output Load) Symbol tPLH tPHL Parameter Propagation Delay Time Low to High Level Output Propagation Delay Time High to Low Level Output Conditions CL e 15 pF RL e 400X Min Max 22 15 Units ns ns Note 1 All typicals are at VCC e 5V TA e 25 C Note 2 Not more than one output should be shorted at a time 2 Physical Dimensions inches (millimeters) 14-Lead Ceramic Dual-In-Line Package (J) Order Number 5420DMQB or DM5420J NS Package Number J14A 14-Lead Molded Dual-In-Line Package (N) Order Number DM7420N NS Package Number N14A 3 5420 DM5420 DM7420 Dual 4-Input NAND Gates Physical Dimensions inches (millimeters) (Continued) 14-Lead Ceramic Flat Package (W) Order Number 5420FMQB or DM5420W NS Package Number W14B LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or systems which (a) are intended for surgical implant into the body or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user National Semiconductor Corporation 1111 West Bardin Road Arlington TX 76017 Tel 1(800) 272-9959 Fax 1(800) 737-7018 2 A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness National Semiconductor Europe Fax (a49) 0-180-530 85 86 Email cnjwge tevm2 nsc com Deutsch Tel (a49) 0-180-530 85 85 English Tel (a49) 0-180-532 78 32 Fran ais Tel (a49) 0-180-532 93 58 Italiano Tel (a49) 0-180-534 16 80 National Semiconductor Hong Kong Ltd 13th Floor Straight Block Ocean Centre 5 Canton Rd Tsimshatsui Kowloon Hong Kong Tel (852) 2737-1600 Fax (852) 2736-9960 National Semiconductor Japan Ltd Tel 81-043-299-2309 Fax 81-043-299-2408 National does not assume any responsibility for use of any circuitry described no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications