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ADC121S101

ADC121S101

  • 厂商:

    NSC

  • 封装:

  • 描述:

    ADC121S101 - Single Channel, 500 kSPS, 8-Bit A/D Converter - National Semiconductor

  • 数据手册
  • 价格&库存
ADC121S101 数据手册
ADC081S051 Single Channel, 500 kSPS, 8-Bit A/D Converter April 2005 ADC081S051 Single Channel, 500 kSPS, 8-Bit A/D Converter General Description The ADC081S051 is a low-power, single channel CMOS 8-bit analog-to-digital converter with a high-speed serial interface. Unlike the conventional practice of specifying performance at a single sample rate only, the ADC081S051 is fully specified over a sample rate range of 200 kSPS to 500 kSPS. The converter is based on a successiveapproximation register architecture with an internal trackand-hold circuit. The output serial data is straight binary, and is compatible with several standards, such as SPI™, QSPI™, MICROWIRE, and many common DSP serial interfaces. The ADC081S051 operates with a single supply that can range from +2.7V to +5.25V. Normal power consumption using a +3V or +5V supply is 2.9 mW and 10.5 mW, respectively. The power-down feature reduces the power consumption to as low as 2.6 µW using a +5V supply. The ADC081S051 is packaged in an 6-lead LLP package. Operation over the industrial temperature range of −40˚C to +85˚C is guaranteed. Features n n n n n Specified over a range of sample rates. 6-lead LLP package Variable power management Single power supply with 2.7V - 5.25V range SPI™/QSPI™/MICROWIRE/DSP compatible Key Specifications n n n n DNL INL SNR Power Consumption — 3V Supply — 5V Supply + 0.07 / −0.06 LSB (typ) + 0.06 / −0.07 LSB (typ) 49.6 dB (typ) 2.9 mW (typ) 10.5 mW (typ) Applications n Portable Systems n Remote Data Aquisitions n Instrumentation and Control Systems Pin-Compatible Alternatives by Resolution and Speed All devices are fully pin and function compatible. Resolution 50 to 200 kSPS 12-bit 10-bit 8-bit ADC121S021 ADC101S021 ADC081S021 Specified for Sample Rate Range of: 200 to 500 kSPS ADC121S051 ADC101S051 ADC081S051 500 kSPS to 1 MSPS ADC121S101 ADC081S101 ADC081S101 Connection Diagram 20145505 Ordering Information Order Code ADC081S051CISD ADC081S051CISDX Temperature Range −40˚C to +85˚C −40˚C to +85˚C Description 6-Lead LLP Package 6-Lead LLP Package, Tape & Reel Top Mark X6C X6C TRI-STATE ® is a trademark of National Semiconductor Corporation QSPI™ and SPI™ are trademarks of Motorola, Inc. © 2005 National Semiconductor Corporation DS201455 www.national.com ADC081S051 Block Diagram 20145507 Pin Descriptions and Equivalent Circuits Pin No. ANALOG I/O 3 DIGITAL I/O 4 5 6 POWER SUPPLY 1 2 VA GND Positive supply pin. This pin should be connected to a quiet +2.7V to +5.25V source and bypassed to GND with a 1 µF capacitor and a 0.1 µF monolithic capacitor located within 1 cm of the power pin. The ground return for the supply and signals. SCLK SDATA CS Digital clock input. This clock directly controls the conversion and readout processes. Digital data output. The output samples are clocked out of this pin on falling edges of the SCLK pin. Chip select. On the falling edge of CS, a conversion process begins. VIN Analog inputs. This signal can range from 0V to VA. Symbol Description www.national.com 2 ADC081S051 Absolute Maximum Ratings (Notes 1, 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Analog Supply Voltage VA Voltage on Any Pin to GND Input Current at Any Pin (Note 3) Package Input Current (Note 3) Power Consumption at TA = 25˚C ESD Susceptibility (Note 5) Human Body Model Machine Model Junction Temperature Storage Temperature −0.3V to 6.5V −0.3V to VA +0.3V Operating Ratings (Notes 1, 2) Operating Temperature Range VA Supply Voltage Digital Input Pins Voltage Range Clock Frequency Sample Rate Analog Input Voltage −40˚C ≤ TA ≤ +85˚C +2.7V to +5.25V −0.3V to VA 4 MHz to 10 MHz up to 500 kSPS 0V to VA ± 10 mA ± 20 mA See (Note 4) 3500V 300V +150˚C −65˚C to +150˚C Package Thermal Resistance Package 6-lead LLP θJA 78˚C / W Soldering process must comply with National Semiconductor’s Reflow Temperature Profile specifications. Refer to www.national.com/packaging. (Note 6) (Note 9) The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 4 MHz to 10 MHz, fSAMPLE = 200 kSPS to 500 kSPS, unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25˚C. Symbol Parameter Conditions Typical Limits (Note 9) 8 +0.06 −0.07 +0.07 −0.06 +0.03 +0.3 −0.3 +0.2 −0.2 Units ADC081S051 Converter Electrical Characteristics STATIC CONVERTER CHARACTERISTICS Resolution with No Missing Codes INL DNL VOFF GE TUE Integral Non-Linearity Differential Non-Linearity Offset Error Gain Error Total Unadjusted Error Bits LSB (max) LSB (min) LSB (max) LSB (min) LSB (max) LSB (max) LSB (max) LSB (min) ± 0.08 +0.8 −0.07 VA = +2.7 to 5.25V fIN = 100 kHz, −0.02 dBFS VA = +2.7 to 5.25V fIN = 100 kHz, −0.02 dBFS VA = +2.7 to 5.25V fIN = 100 kHz, −0.02 dBFS VA = +2.7 to 5.25V fIN = 100 kHz, −0.02 dBFS VA = +2.7 to 5.25V fIN = 100 kHz, −0.02 dBFS VA = +5.25V fa = 103.5 kHz, fb = 113.5 kHz VA = +5.25V fa = 103.5 kHz, fb = 113.5 kHz VA = +5V VA = +3V ± 0.2 ± 0.4 +0.2 −0.3 DYNAMIC CONVERTER CHARACTERISTICS SINAD SNR THD SFDR ENOB Signal-to-Noise Plus Distortion Ratio Signal-to-Noise Ratio Total Harmonic Distortion Spurious-Free Dynamic Range Effective Number of Bits Intermodulation Distortion, Second Order Terms Intermodulation Distortion, Third Order Terms -3 dB Full Power Bandwidth 49.6 49.6 −70 67 7.9 −68 −68 11 8 49 49 −65 65 7.8 dB (min) dB (min) dB (max) dB (min) Bits (min) dB dB MHz MHz IMD FPBW 3 www.national.com ADC081S051 ADC081S051 Converter Electrical Characteristics (Note 9) (Continued) The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 4 MHz to 10 MHz, fSAMPLE = 200 kSPS to 500 kSPS, unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25˚C. Parameter Conditions Typical Limits (Note 9) Units Symbol ANALOG INPUT CHARACTERISTICS VIN IDCL CINA Input Range DC Leakage Current Input Capacitance Track Mode Hold Mode VA = +5.25V VA = +5.25V VA = +3.6V VIN = 0V or VA 30 4 2.4 0.8 0.4 0 to VA V ±1 µA (max) pF pF V (min) V (max) V (max) µA (max) pF (max) V (min) V V (max) V DIGITAL INPUT CHARACTERISTICS VIH VIL IIN CIND Input High Voltage Input Low Voltage Input Current Digital Input Capacitance ISOURCE = 200 µA ISOURCE = 1 mA ISINK = 200 µA ISINK = 1 mA ± 0.1 2 VA − 0.03 VA − 0.1 0.03 0.1 ±1 4 VA − 0.2 0.4 DIGITAL OUTPUT CHARACTERISTICS VOH VOL IOZH, IOZL COUT Output High Voltage Output Low Voltage TRI-STATE ® Leakage Current TRI-STATE ® Output Capacitance Output Coding POWER SUPPLY CHARACTERISTICS (CL = 10 pF) VA Supply Voltage VA = +5.25V, fSAMPLE = 200 kSPS VA = +3.6V, fSAMPLE = 200 kSPS fSCLK= 0 MHz, VA = +5.25V fSAMPLE = 0 kSPS VA = +5.25V, fSCLK = 10MHz, fSAMPLE = 0 kSPS VA = +5.25V VA = +3.6V fSCLK = 0 MHz, VA = +5.25V fSAMPLE = 0 kSPS VA = +5.25V, fSCLK = 10 MHz, fSAMPLE = 0 kSPS 2.0 0.8 0.5 22 10.5 2.9 2.6 0.12 12.6 3.6 2.7 5.25 2.4 1.0 V (min) V (max) mA (max) mA (max) µA µA mW (max) mW (max) µW mW ± 0.1 2 ± 10 4 µA (max) pF (max) Straight (Natural) Binary Supply Current, Normal Mode (Operational, CS low) IA Supply Current, Shutdown (CS high) Power Consumption, Normal Mode (Operational, CS low) PD Power Consumption, Shutdown (CS high) AC ELECTRICAL CHARACTERISTICS fSCLK fS tCONV DC tACQ Clock Frequency Sample Rate Conversion Time SCLK Duty Cycle Track/Hold Acquisition Time Throughput Time www.national.com (Note 8) (Note 8) 50 4 10 200 500 16 40 60 400 20 MHz (min) MHz (max) kSPS (min) kSPS (max) SCLK cycles % (min) % (max) ns (max) SCLK cycles fSCLK = 10 MHz 50 Acquisition Time + Conversion Time 4 ADC081S051 ADC081S051 Converter Electrical Characteristics (Note 9) (Continued) The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 4 MHz to 10 MHz, fSAMPLE = 200 kSPS to 500 kSPS, unless otherwise noted. Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25˚C. Parameter Conditions Typical Limits (Note 9) 50 3 30 Units Symbol AC ELECTRICAL CHARACTERISTICS tQUIET tAD tAJ (Note 10) Aperture Delay Aperture Jitter ns (min) ns ps ADC081S051 Timing Specifications The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 4 MHz to 10 MHz, fSAMPLE = 200 kSPS to 500 kSPS, Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25˚C. Symbol tCS tSU tEN tACC tCL tCH tH Parameter Minimum CS Pulse Width CS to SCLK Setup Time Delay from CS Until SDATA TRI-STATE ® Disabled (Note 11) Data Access Time after SCLK Falling Edge (Note 12) SCLK Low Pulse Width SCLK High Pulse Width SCLK to Data Valid Hold Time VA = +2.7 to +3.6 VA = +4.75 to +5.25 VA = +2.7 to +3.6 VA = +4.75 to +5.25 1 VA = +2.7 to +3.6 VA = +4.75 to +5.25 Conditions Typical Limits 10 10 20 40 20 0.4 x tSCLK 0.4 x tSCLK 7 5 25 6 25 5 Units ns (min) ns (min) ns (max) ns (max) ns (max) ns (min) ns (min) ns (min) ns (min) ns (max) ns (min) ns (max) ns (min) µs tDIS SCLK Falling Edge to SDATA High Impedance (Note 13) Power-Up Time from Full Power-Down tPOWER-UP Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Note 2: All voltages are measured with respect to GND = 0V, unless otherwise specified. Note 3: When the input voltage at any pin exceeds the power supply (that is, VIN < GND or VIN > VA), the current at that pin should be limited to 10 mA. The 20 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 10 mA to two. The Absolute Maximum Rating specification does not apply to the VA pin. The current into the VA pin is limited by the Analog Supply Voltage specification. Note 4: The absolute maximum junction temperature (TJmax) for this device is 150˚C. The maximum allowable power dissipation is dictated by TJmax, the junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula PDMAX = (TJmax − TA)/θJA. The values for maximum power dissipation listed above will be reached only when the device is operated in a severe fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided. Note 5: Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through zero ohms Note 6: Reflow temperature profiles are different for lead-free and non-lead-free packages. Note 7: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 8: This is the frequency range over which the electrical performance is guaranteed. The device is functional over a wider range which is specified under Operating Ratings. Note 9: Data sheet min/max specification limits are guaranteed by design, test, or statistical analysis. Note 10: Minimum Quiet Time required by Bus relinquish and start of the next conversion. Note 11: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V. Note 12: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V or 2.0V. Note 13: tDIS is derived from the time taken by the output to change by 0.5V with the timing test circuit shown in Figure 1. The measured number is then adjusted to remove the effects of charging or discharging the 25 pF capacitor. This means that tDIS is the true bus relinquish time, independent of the bus loading. 5 www.national.com ADC081S051 Timing Diagrams 20145508 FIGURE 1. Timing Test Circuit 20145506 FIGURE 2. ADC081S051 Serial Timing Diagram www.national.com 6 ADC081S051 Specification Definitions ACQUISITION TIME is the time required to acquire the input voltage. That is, it is time required for the hold capacitor to charge up to the input voltage. APERTURE DELAY is the time between the fourth falling SCLK edge of a conversion and the time when the input signal is acquired or held for conversion. APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample. Aperture jitter manifests itself as noise in the output. CONVERSION TIME is the time required, after the input voltage is acquired, for the ADC to convert the input voltage to a digital word. DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB. DUTY CYCLE is the ratio of the time that a repetitive digital waveform is high to the total time of one period. The specification here refers to the SCLK. EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise and Distortion or SINAD. ENOB is defined as (SINAD − 1.76) / 6.02 and says that the converter is equivalent to a perfect ADC of this (ENOB) number of bits. FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental drops 3 dB below its low frequency value for a full scale input. GAIN ERROR is the deviation of the last code transition (111...110) to (111...111) from the ideal (VREF − 1.5 LSB), after adjusting for offset error. INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from negative full scale (1⁄2 LSB below the first code transition) through positive full scale (1⁄2 LSB above the last code transition). The deviation of any given code from this straight line is measured from the center of that code value. INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the power in the second and third order intermodulation products to the sum of the power in both of the original frequencies. IMD is usually expressed in dB. MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC081S051 is guaranteed not to have any missing codes. OFFSET ERROR is the deviation of the first code transition (000...000) to (000...001) from the ideal (i.e. GND + 0.5 LSB). SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal to the rms value of the sum of all other spectral components below one-half the sampling frequency, not including harmonics or d.c. SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of the input signal to the rms value of all of the other spectral components below half the clock frequency, including harmonics but excluding d.c. SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the input signal and the peak spurious signal where a spurious signal is any signal present in the output spectrum that is not present at the input, excluding d.c. TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dB or dBc, of the rms total of the first five harmonic components at the output to the rms level of the input signal frequency as seen at the output. THD is calculated as where Af1 is the RMS power of the input frequency at the output and Af2 through Af6 are the RMS power in the first 5 harmonic frequencies. THROUGHPUT TIME is the minimum time required between the start of two successive conversion. It is the acquisition time plus the conversion time. TOTAL UNADJUSTED ERROR is the worst deviation found from the ideal transfer function. As such, it is a comprehensive specification which includes full scale error, linearity error, and offset error. 7 www.national.com ADC081S051 Typical Performance Characteristics TA = +25˚C, fSAMPLE = 200 kSPS to 500 kSPS, fSCLK = 4 MHz to 10 MHz, fIN = 100 kHz unless otherwise stated. DNL vs Clock Frequency INL vs Clock Frequency 20145565 20145566 Total Adjusted Error vs Clock Frequency SNR vs Clock Frequency 20145567 20145563 SINAD vs. Clock Frequency Power Consumption vs. Throughput, fSCLK = 10 MHz 20145564 20145555 www.national.com 8 ADC081S051 Applications Information 1.0 ADC081S051 OPERATION The ADC081S051 are successive-approximation analog-todigital converters designed around a charge-redistribution digital-to-analog converter. Simplified schematics of the ADC081S051 in both track and hold operation are shown in Figures 3 and 4, respectively. In Figure 3, the device is in track mode: switch SW1 connects the sampling capacitor to the input, and SW2 balances the comparator inputs. The device is in this state until CS is brought low, at which point the device moves to hold mode. Figure 4 shows the device in hold mode: switch SW1 connects the sampling capacitor to ground, maintaining the sampled voltage, and switch SW2 unbalances the comparator. The control logic then instructs the charge-redistribution DAC to add or subtract fixed amounts of charge from the sampling capacitor until the comparator is balanced. When the comparator is balanced, the digital word supplied to the DAC is the digital representation of the analog input voltage. The device moves from hold mode to track mode on the 13th rising edge of SCLK. 20145509 FIGURE 3. ADC081S051 in Track Mode 20145510 FIGURE 4. ADC081S051 in Hold Mode 2.0 USING THE ADC081S051 The serial interface timing diagram for the ADC081S051 is shown in Figure 2. CS is chip select, which initiates conversions on the ADC081S051 and frames the serial data transfers. SCLK (serial clock) controls both the conversion process and the timing of serial data. SDATA is the serial data out pin, where a conversion result is found as a serial data stream. Basic operation of the ADC081S051 begins with CS going low, which initiates a conversion process and data transfer. Subsequent rising and falling edges of SCLK will be labelled with reference to the falling edge of CS; for example, "the third falling edge of SCLK" shall refer to the third falling edge of SCLK after CS goes low. At the fall of CS, the SDATA pin comes out of TRI-STATE, and the converter moves from track mode to hold mode. The input signal is sampled and held for conversion on the falling edge of CS. The converter moves from hold mode to track mode on the 13th rising edge of SCLK (see Figure 2). The SDATA pin will be placed back into TRI-STATE after the 16th falling edge of SCLK, or at the rising edge of CS, whichever occurs first. After a conversion is completed, the quiet time tQUIET must be satisfied before bringing CS low again to begin another conversion. Sixteen SCLK cycles are required to read a complete sample from the ADC081S051. The sample bits (including any leading or trailing zeroes) are clocked out on falling edges of SCLK, and are intended to be clocked in by a receiver on subsequent falling edges of SCLK. The ADC081S051 will produce three leading zero bits on SDATA, followed by eight data bits, most significant first. After the data bits, the ADC081S051 will clock out four trailing zeros. If CS goes low before the rising edge of SCLK, an additional (fourth) zero bit may be captured by the next falling edge of SCLK. 9 www.national.com ADC081S051 Applications Information 3.0 ADC081S051 TRANSFER FUNCTION (Continued) The output format of the ADC081S051 is straight binary. Code transitions occur midway between successive integer LSB values. The LSB width for the ADC081S051 is VA/256. The ideal transfer characteristic is shown in Figure 5. The transition from an output code of 0000 0000 to a code of 0000 0001 is at 1/2 LSB, or a voltage of VA/512. Other code transitions occur at steps of one LSB. 20145511 FIGURE 5. Ideal Transfer Characteristic 4.0 TYPICAL APPLICATION CIRCUIT A typical application of the ADC081S051 is shown in Figure 6. Power is provided in this example by the National Semiconductor LP2950 low-dropout voltage regulator, available in a variety of fixed and adjustable output voltages. The power supply pin is bypassed with a capacitor network located close to the ADC081S051. Because the reference for the ADC081S051 is the supply voltage, any noise on the supply will degrade device noise performance. To keep noise off the supply, use a dedicated linear regulator for this device, or provide sufficient decoupling from other circuitry to keep noise off the ADC081S051 supply pin. Because of the ADC081S051’s low power requirements, it is also possible to use a precision reference as a power supply to maximize performance. The four-wire interface is also shown connected to a microprocessor or DSP. 20145513 FIGURE 6. Typical Application Circuit www.national.com 10 ADC081S051 Applications Information 5.0 ANALOG INPUTS (Continued) An equivalent circuit for one of the ADC081S051’s input channels is shown in Figure 7. Diodes D1 and D2 provide ESD protection for the analog inputs. At no time should any input go beyond (VA + 300 mV) or (GND − 300 mV), as these ESD diodes will begin conducting, which could result in erratic operation. The capacitor C1 in Figure 7 has a typical value of 4 pF, and is mainly the package pin capacitance. Resistor R1 is the on resistance of the multiplexer and track / hold switch, and is typically 500 ohms. Capacitor C2 is the ADC081S051 sampling capacitor and is typically 26 pF. The ADC081S051 will deliver best performance when driven by a low-impedance source to eliminate distortion caused by the charging of the sampling capacitance. This is especially important when using the ADC081S051 to sample AC signals. Also important when sampling dynamic signals is a band-pass or low-pass filter to reduce harmonics and noise, improving dynamic performance. CS is pulled low. The device will enter shutdown mode if CS is pulled high before the tenth falling edge of SCLK after CS is pulled low, or will stay in normal mode if CS remains low. Once in shutdown mode, the device will stay there until CS is brought low again. By varying the ratio of time spent in the normal and shutdown modes, a system may trade-off throughput for power consumption. 7.1 Normal Mode The fastest possible throughput is obtained by leaving the ADC081S051 in normal mode at all times, so there are no power-up delays. To keep the device in normal mode continuously, CS must be kept low until after the 10th falling edge of SCLK after the start of a conversion (remember that a conversion is initiated by bringing CS low). If CS is brought high after the 10th falling edge, but before the 16th falling edge, the device will remain in normal mode, but the current conversion will be aborted, and SDATA will return to TRI-STATE (truncating the output word). Sixteen SCLK cycles are required to read all of a conversion word from the device. After sixteen SCLK cycles have elapsed, CS may be idled either high or low until the next conversion. If CS is idled low, it must be brought high again before the start of the next conversion, which begins when CS is again brought low. After sixteen SCLK cycles, SDATA returns to TRI-STATE. Another conversion may be started, after tQUIET has elapsed, by bringing CS low again. 7.2 Shutdown Mode Shutdown mode is appropriate for applications that either do not sample continuously, or it is acceptable to trade throughput for power consumption. When the ADC081S051 is in shutdown mode, all of the analog circuitry is turned off. To enter shutdown mode, a conversion must be interrupted by bringing CS back high anytime between the second and tenth falling edges of SCLK, as shown in Figure 8. Once CS has been brought high in this manner, the device will enter shutdown mode; the current conversion will be aborted and SDATA will enter TRI-STATE. If CS is brought high before the second falling edge of SCLK, the device will not change mode; this is to avoid accidentally changing mode as a result of noise on the CS line. 20145514 FIGURE 7. Equivalent Input Circuit 6.0 DIGITAL INPUTS AND OUTPUTS The ADC081S051 digital inputs (SCLK and CS) are not limited by the same absolute maximum ratings as the analog inputs. The digital input pins are instead limited to +6.5V with respect to GND, regardless of VA, the supply voltage. This allows the ADC081S051 to be interfaced with a wide range of logic levels, independent of the supply voltage. 7.0 MODES OF OPERATION The ADC081S051 has two possible modes of operation: normal mode, and shutdown mode. The ADC081S051 enters normal mode (and a conversion process is begun) when 20145516 FIGURE 8. Entering Shutdown Mode 11 www.national.com ADC081S051 Applications Information (Continued) 20145517 FIGURE 9. Entering Normal Mode To exit shutdown mode, bring CS back low. Upon bringing CS low, the ADC081S051 will begin powering up (power-up time is specified in the Timing Specifications table). This microsecond of power-up delay results in the first conversion result being unusable. The second conversion performed after power-up, however, is valid, as shown in Figure 9. If CS is brought back high before the 10th falling edge of SCLK, the device will return to shutdown mode. This is done to avoid accidentally entering normal mode as a result of noise on the CS line. To exit shutdown mode and remain in normal mode, CS must be kept low until after the 10th falling edge of SCLK. The ADC081S051 will be fully powered-up after 16 SCLK cycles. 8.0 POWER MANAGEMENT The ADC081S051 takes time to power-up, either after first applying VA, or after returning to normal mode from shutdown mode. This corresponds to one "dummy" conversion for any SCLK frequency within the specifications in this document. After this first dummy conversion, the ADC081S051 will perform conversions properly. Note that the tQUIET time must still be included between the first dummy conversion and the second valid conversion. When the VA supply is first applied, the ADC081S051 may power up in either of the two modes: normal or shutdown. As such, one dummy conversion should be performed after start-up, exactly as described in the previous paragraph. The part may then be placed into either normal mode or the shutdown mode, as described in Sections 7.1 and 7.2. When the ADC081S051 is operated continuously in normal mode, the maximum throughput is fSCLK/20. Throughput may be traded for power consumption by running fSCLK at its maximum 10.0 MHz and performing fewer conversions per unit time, putting the ADC081S051 into shutdown mode between conversions. A plot of typical power consumption versus throughput is shown in the Typical Performance Curves section. To calculate the power consumption for a given throughput, multiply the fraction of time spent in the normal mode by the normal mode power consumption and add the fraction of time spent in shutdown mode multiplied by the shutdown mode power consumption. Generally, the user will put the part into normal mode and then put the part back into shutdown mode. Note that the curve of power consumption vs. throughput is nearly linear. This is because the power consumption in the shutdown mode is so small that it can be ignored for all practical purposes. 9.0 POWER SUPPLY NOISE CONSIDERATIONS The charging of any output load capacitance requires current from the power supply, VA. The current pulses required from the supply to charge the output capacitance will cause voltage variations on the supply. If these variations are large enough, they could degrade SNR and SINAD performance of the ADC. Furthermore, discharging the output capacitance when the digital output goes from a logic high to a logic low will dump current into the die substrate, which is resistive. Load discharge currents will cause "ground bounce" noise in the substrate that will degrade noise performance if that current is large enough. The larger the output capacitance, the more current flows through the die substrate and the greater is the noise coupled into the analog channel, degrading noise performance. To keep noise out of the power supply, keep the output load capacitance as small as practical. If the load capacitance is greater than 25 pF, use a 100 Ω series resistor at the ADC output, located as close to the ADC output pin as practical. This will limit the charge and discharge current of the output capacitance and improve noise performance. www.national.com 12 ADC081S051 Single Channel, 500 kSPS, 8-Bit A/D Converter Physical Dimensions inches (millimeters) unless otherwise noted 6-Lead LLP Order Number ADC081S051CISD or ADC081S051CISDX NS Package Number SDB06A National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications. For the most current product information visit us at www.national.com. LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. BANNED SUBSTANCE COMPLIANCE National Semiconductor manufactures products and uses packing materials that meet the provisions of the Customer Products Stewardship Specification (CSP-9-111C2) and the Banned Substances and Materials of Interest Specification (CSP-9-111S2) and contain no ‘‘Banned Substances’’ as defined in CSP-9-111S2. National Semiconductor Americas Customer Support Center Email: new.feedback@nsc.com Tel: 1-800-272-9959 www.national.com National Semiconductor Europe Customer Support Center Fax: +49 (0) 180-530 85 86 Email: europe.support@nsc.com Deutsch Tel: +49 (0) 69 9508 6208 English Tel: +44 (0) 870 24 0 2171 Français Tel: +33 (0) 1 41 91 8790 National Semiconductor Asia Pacific Customer Support Center Email: ap.support@nsc.com National Semiconductor Japan Customer Support Center Fax: 81-3-5639-7507 Email: jpn.feedback@nsc.com Tel: 81-3-5639-7560 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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