CD4030M CD4030C Quad EXCLUSIVE-OR Gate
February 1988
CD4030M CD4030C Quad EXCLUSIVE-OR Gate
General Description
The EXCLUSIVE-OR gates are monolithic complementary MOS (CMOS) integrated circuits constructed with N- and Pchannel enhancement mode transistors All inputs are protected against static discharge with diodes to VDD and VSS
Applications
Y Y Y Y Y
Features
Y Y Y
Y Y
Y
Wide supply voltage range 3 0V to 15V Low power 100 nW (typ ) Medium speed tPHL e tPLH e 40 ns (typ ) operation at CL e 15 pF 10V supply High noise immunity 0 45 VCC (typ )
Automotive Data terminals Instrumentation Medical electronics Industrial controls Remote metering Computers
Schematic Diagram
TL F 5961 – 1
Connection Diagram
Dual-In-Line Package
TL F 5961 – 2
Order Number CD4030
C1995 National Semiconductor Corporation TL F 5961 RRD-B30M105 Printed in U S A
Absolute Maximum Ratings
If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications Voltage at Any Pin (Note 1) Operating Temperature Range CD4030M CD4030C VSS b0 3V to VSS a 15 5V
b 55 C to a 125 C b 40 C to a 85 C
Storage Temperature Range Power Dissipation (PD) Dual-In-Line Small Outline Operating VDD Range Lead Temperature (Soldering 10 seconds)
b 65 C to a 150 C
700 mW 500 mW VSS a 3 0V to VSS a 15V 260 C
DC Electrical Characteristics CD4030M
Limits Symbol Parameter Conditions Min IL PD VOL VOH VNL VNH IDN IDP II Quiescent Device Current Quiescent Device Dissipation Package Output Voltage Low Level Output Voltage High Level Noise Immunity (All Inputs) Noise Immunity (All Inputs) Output Drive Current N-Channel (Note 2) Output Drive Current P-Channel (Note 2) Input Current VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VI e 0V or VI e VDD 4 95 9 95 15 30 14 29 0 75 15
b 0 45 b 0 95 b 55 C a 25 C a 125 C
Units Max 30 60 150 600 0 05 0 05 mA mA mW mW V V V V V V V V mA mA mA mA pA
Typ
Max 05 10 25 10 0 05 0 05
Min
Typ 0 005 0 01 0 025 01 0 0
Max 05 10 25 10 0 05 0 05
Min
Typ
4 95 9 95 15 30 15 30 06 12
b0 3 b 0 65
50 10 2 25 45 2 25 45 12 24
b0 6 b1 3
4 95 9 95 14 29 15 30 0 45 09
b 0 21 b 0 45
10
DC Electrical Characteristics CD4030C
Limits Symbol Parameter Conditions Min IL PD VOL VOH VNL VNH IDN IDP II Quiescent Device Current Quiescent Device Dissipation Package Output Voltage Low Level Output Voltage High Level Noise Immunity (All Inputs) Noise Immunity (All Inputs) Output Drive Current N-Channel (Note 2) Output Drive Current P-Channel (Note 2) Input Current VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10 V VI e 0V or VI e VDD 4 95 9 95 15 30 14 29 0 35 07
b 0 21 b 0 45 b 40 C a 25 C a 85 C
Units Max 70 140 350 1 400 0 05 0 05 mA mA mW mW V V V V V V V V mA mA mA mA pA
Typ
Max 50 10 25 100 0 05 0 05
Min
Typ 0 05 01 0 25 10 0 0
Max 50 10 25 100 0 05 0 05
Min
Typ
4 95 9 95 15 30 15 30 03 06
b 0 15 b 0 32
50 10 2 25 45 2 25 45 12 24
b0 6 b1 3
4 95 9 95 14 29 15 30 0 25 05
b 0 12 b 0 25
10
2
AC Electrical Characteristics
Symbol tPHL tPLH tTHL tTLH CI Parameter Propagation Delay Time Propagation Delay Time Transition Time High to Low Level Transition Time Low to High Level Input Capacitance
CD4030M Conditions Min VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VI e 0V or VI e VDD Limits Typ 100 40 100 40 70 25 80 30 50 Max 200 100 200 100 150 75 150 75 ns ns ns ns ns ns ns ns pF Units
AC Parameters are guaranteed by DC correlated testing
AC Electrical Characteristics
Symbol tPHL tPLH tTHL tTLH CI Parameter Propagation Delay Time Propagation Delay Time Transition Time High to Low Level Transition Time Low to High Level Input Capacitance
CD4030C Conditions Min VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VI e 0V or VI e VDD Limits Typ 100 40 100 40 70 25 80 30 50 Max 300 150 300 150 300 150 300 150 ns ns ns ns ns ns ns ns pF Units
AC Parameters are guaranteed by DC correlated testing Note 1 This device should not be connected to circuits with power on because high transient voltages may cause permanent damage Note 2 IDN and IDP are tested one output at a time
Truth Table (For One of Four Identical Gates)
A 0 1 0 1 B 0 0 1 1 J 0 1 1 0
Where ‘‘1’’ e High Level ‘‘0’’ e Low Level
3
CD4030M CD4030C Quad EXCLUSIVE-OR Gate
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package (J) Order Number CD4030MJ or CD4030CJ NS Package Number J14A
Molded Dual-In-Line Package (N) Order Number CD4030MN or CD4030CN NS Package Number N14A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or systems which (a) are intended for surgical implant into the body or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user
National Semiconductor Corporation 1111 West Bardin Road Arlington TX 76017 Tel 1(800) 272-9959 Fax 1(800) 737-7018
2 A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness
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National does not assume any responsibility for use of any circuitry described no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications
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