SCANH16512SM

SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs August 2002 SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs General Description The SCAN16512 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST). Features IEEE 1149.1 (JTAG) Compliant 2.7V to 3.6V VCC Operation TRI-STATE outputs for bus-oriented applications Dual byte-wide data for bus applications Power down high Impedance inputs and outputs Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16512, SCANH162512 versions) n Optional 25Ω series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162512, SCANH162512 versions) n Supports live insertion/withdrawal n Includes CLAMP and HIGHZ instructions n n n n n n Block Diagram 20026602 © 2002 National Semiconductor Corporation DS200266 www.national.com SCAN16512 Pin Descriptions Pin Name A10-A17, A20-A27 B10-B17, B20-B27 CLKAB1, CLKBA1, CLKAB2, CLKBA2 GND VCC LEAB1, LEBA1, LEAB2, LEBA2 OEAB1, OEBA1, OEAB2, OEBA2 TDO TMS TCK TDI Normal-function A-bus I/O ports. See function table for normal-mode logic. Normal-function B-bus I/O ports. See function table for normal-mode logic. Normal-function clock inputs.See function table for normal-mode logic. Description Ground Supply Voltage Normal-function latch enables. See function table for normal-mode logic. Normal-function output enables. See function table for normal-mode logic. The Test Data Output to support IEEE Std 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. The Test Mode Select input to support IEEE Std 1149.1-1990. TMS directs the device through it’s TAP controller states. An internal pull-up forces TMS high if left unconnected. The Test Clock input to support IEEE Std 1149.1-1990. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. The Test Data Input to support IEEE Std 1149.1-1990. TDI is the serial input to shift data through the instruction register or the selected data register. An internal pull-up resistor forces TDI high if left unconnected. The Test Reset Input to support IEEE Std 1149.1-1990. TRST is the asynchronous reset pin which will force the TAP controller to it’s initialization state when active. An internal pullup resistor forces TRST high if left unconnected. TRST BGA Pinout 1 A B C D E F G H A10 A11 TRST TMS TCK CLKBA1 B11 B10 2 A12 A13 CLKAB1 GND GND LEBA1 B13 B12 3 A14 A15 LEAB1 VCC VCC OEBA1 B15 B14 4 A16 A17 OEAB1 GND VCC GND B17 B16 5 A20 A21 GND VCC GND N/C B21 B20 6 A22 A23 CLKAB2 GND GND CLKBA2 B23 B22 7 A24 A25 LEAB2 TDI N/C LEBA2 B25 B24 8 A26 A27 OEAB2 TDO VCC OEBA2 B27 B26 www.national.com 2 SCAN16512 Connection Diagram 20026603 Top View See NS Package Number SLC64A Truth Table Function Table (Note 1) Inputs OEAB L L L L L H LEAB L L L H H X CLKAB L ↑ ↑ Outputs A X L H L H X B B0 (Note 2) L H L H Z X X X H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial (HIGH or LOW, inputs may not float) Z = High Impedance Note 1: A-to-B data flow is shown. B-to-A data flow is similar, but uses OEBA, LEBA, and CLKBA. Note 2: Output level before the indicated steady-state input conditions were established. Functional Description In the normal mode, these devices are 16-bit universal bus transceivers that combine D-type latches and D-type flipflops to allow data flow in transparent, latched, or clocked modes. They can be used as two 8-bit transceivers, or as one 16-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP may affect the normal functional operation of the universal bus transceivers. When the TAP is activated, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB is LOW, the B outputs are active. When OEAB is HIGH, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA, LEBA, and CLKBA inputs. Five dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), test clock (TCK), and test reset (TRST). All testing and scan operations are synchronized to the TAP interface. For details about the sequence of boundary scan cells in the SCAN16512, please refer to the BSDL (Boundary Scan Description Language) file available on our website. 3 www.national.com SCAN16512 Absolute Maximum Ratings Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V DC Output Diode Current (IOK) VO = −0.5V DC Input Voltage (VI) DC Output Voltage (VO) DC Output Source/Sink Current (IO) DC VCC or Ground Current Per Supply Pin Junction Temperature Storage Temperature Lead Temperature (Solder, 4sec) 64L BGA Thermal Resistance BGA θJA (Note 3) Package Derating ESD (Min) −0.5V to +4.6V −50 mA −50 mA −0.5V to 4.6V −0.5V to 4.6V 16.1mW/˚C above 25˚C 1000V Recommended Operating Conditions Supply Voltage (VCC) SCAN16512 Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Industrial −40˚C to +85˚C 2.7V to 3.6V 0V to 3.6V 0V to 3.6V ± 50 mA ± 100 mA +150˚C −65˚C to +150˚C 220 ˚C 62˚C/W Note 3: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of SCAN circuits outside databook specifications. DC Electrical Characteristics Symbol Parameter VCC (V) 2.7 3.6 VIL VOH Maximum Low Input Voltage Minimum High Output Voltage All Outputs, All Options Minimum High Output Voltage TDO Outputs, All Options 2.7 3.6 2.7 3.6 2.7 3.0 Minimum High Output Voltage A and B Ports: SCAN16512 and SCANH16512 options Minimum High Output Voltage A and B Ports: SCAN162512 and SCANH162512 options (25Ω series resistor options) VOL Maximum Low Output Voltage All Outputs, All Options Maximum Low Output Voltage TDO Outputs, All Options 2.7 3.0 2.7 3.0 2.7 3.6 2.7 3.0 Maximum Low Output Voltage A and B Ports: SCAN16512 and SCANH16512 Options 2.7 3.0 2.5 3.4 2.2 2.2 2.2 2.2 2.2 2.2 0.2 0.2 0.4 0.55 0.4 0.55 V V V V VIN = VIL or VIH, IOL = 12mA VIN = VIL or VIH, IOL = 24mA VIN = VIL or VIH, IOL = 12mA VIN = VIL or VIH, IOL = 24mA V V V V V V V VIN = VIL or VIH, IOH = −12mA VIN = VIL or VIH IOH = −24mA VIN = VIL or VIH IOH = −12mA VIN = VIL or VIH IOH = −24mA VIN = VIL or VIH IOH = -4mA VIN = VIL or VIH IOH = -12mA IOUT = 100 µA Industrial TA = −40˚C to +85˚C Min VIH Minimum High Input Voltage 2.0 2.0 0.8 0.8 V V Max V VOUT = 0.1V or VCC −0.1V VOUT = 0.1V or VCC −0.1V IOUT = −100 µA Units Conditions www.national.com 4 SCAN16512 DC Electrical Characteristics Symbol Parameter (Continued) VCC (V) 2.7 3.0 3.6 3.6 3.6 Industrial TA = −40˚C to +85˚C Min Max 0.4 0.6 V V µA µA µA VIN = VIL or VIH, IOL = 4mA VIN = VIL or VIH, IOL = 12mA VI = VCC, GND VIN = GND VI (OE) = VIL, VIH VI = VCC, GND VO = VCC, GND VI = 0.8V or 2.0V VI = 0 to 3.6V V µA µA mA VI = VCC–0.6V IIN = -18mA VO = VCC, GND Units Conditions Maximum Low Output Voltage A and B Ports: SCAN162512 and SCANH162512 Options (25Ω series resistor options) IIN IILR IOZ Maximum Input Leakage Current Input Low Current Maximum I/O Leakage Current ± 5.0 -200 ± 5.0 II(HOLD) VIKL IOFF ICC ICCt Bus Hold Input Minimum Drive Hold Current (Note 4) Input Clamp Diode Voltage Power-off Leakage Current Maximum Quiescent Supply Current Maximum ICC Per Input 2.7 3.6 2.7 0.0 3.6 3.6 ± 75 ± 625 -1.5 µA ± 10.0 20 0.5 Note 4: Applies to devices with Bus Hold feature only. Noise Specifications Applies to SCAN16512 and SCANH16512 options, CL = 30pF, RL = 500Ω to GND Symbol Parameter VCC (V) Industrial TA = 25˚C Typical Limits VOLP VOLV VOHP VOHV Quiet Output Maximum Dynamic VOL (Note 5) Quiet Output Minimum Dynamic VOL (Note 5) Quiet Output Maximum Dynamic VOH (Note 6) Quiet Output Minimum Dynamic VOH (Note 6) 3.3 3.3 3.3 3.3 1.2 -1.5 VOH + 0.9 VOH - 1.5 V V V V Units 5 www.national.com SCAN16512 Noise Specifications Applies to SCAN162512 and SCANH162512 options, CL = 30pF, RL = 500Ω to GND Symbol Parameter VCC (V) Industrial TA = 25˚C Typical Limits VOLP VOLV VOHP VOHV Quiet Output Maximum Dynamic VOL (Note 5) Quiet Output Minimum Dynamic VOL (Note 5) Quiet Output Maximum Dynamic VOH(Note 6) Quiet Output Minimum Dynamic VOH (Note 6) 3.3 3.3 3.3 3.3 0.6 -0.5 VOH + 0.5 VOH - 0.6 V V V V Units Note 5: Maximum number of outputs is defined as n. (n-1) outputs are switched LOW while the quiet output is monitored in a LOW (VOL) state. Also, (n-1) outputs are switched HIGH while the quiet output is monitored in a LOW (VOL) state. Note 6: Maximum number of outputs is defined as n. (n-1) outputs are switched LOW while the quiet output is monitored in a HIGH (VOH) state. Also, (n-1) outputs are switched HIGH while the quiet output is monitored in a HIGH (VOH) state. AC Electrical Characteristics Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCAN16512, SCANH16512 CL = 30 pF RL = 500Ω to GND Min tPLH, tPHL tPLH, tPHL tPLH, tPHL tPLZ, tPHZ tPZL, tPZH Enable Time, OEAB to B, OEBA to A Propagation Delay A to B, B to A Propagation Delay CLKAB to B, CLKBA to A Propagation Delay LEAB to B, LEBA to A Disable Time, OEAB to B, OEBA to A Max 5.5 5.5 6.0 6.0 6.0 6.0 7.5 7.5 7.5 7.5 ns ns ns ns ns Units AC Electrical Characteristics Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCAN162512 CL = 30 pF RL = 500Ω to GND Min tPLH, tPHL tPLH, tPHL tPLH, tPHL tPLZ, tPHZ tPZL, tPZH Enable Time, OEAB to B, OEBA to A Propagation Delay A to B, B to A Propagation Delay CLKAB to B, CLKBA to A Propagation Delay LEAB to B, LEBA to A Disable Time, OEAB to B, OEBA to A Max 6.0 6.0 6.5 6.5 6.5 6.5 7.5 7.5 7.5 7.5 ns ns ns ns ns Units www.national.com 6 SCAN16512 AC Electrical Characteristics Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified. Symbol Parameter SCANH162512 CL = 30 pF RL = 500Ω to GND Min tPLH, tPHL tPLH, tPHL tPLH, tPHL tPLZ, tPHZ tPZL, tPZH Enable Time, OEAB to B, OEBA to A Propagation Delay A to B, B to A Propagation Delay CLKAB to B, CLKBA to A Propagation Delay LEAB to B, LEBA to A Disable Time, OEAB to B, OEBA to A Max 6.0 6.0 6.5 6.5 6.5 6.5 7.5 7.5 8.0 8.0 ns ns ns ns ns Units AC Operating Requirements Normal Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified Symbol Parameter All Options TA = −40˚C to +85˚C CL = 30 pF, RL = 500Ω to GND Guaranteed Minimum tS tH tS tH tW tW fmax Setup Time, A to CLKAB or B to CLKBA Hold Time, A to CLKAB or B to CLKBA Setup Time, A to LEAB or B to LEBA Hold Time, A to LEAB or B to LEBA Pulse Width, CLKAB or CLKBA, high or low Pulse Width, LEAB or LEBA high Maximum CLKAB or CLKBA Clock Frequency 1.5 2.0 1.5 2.5 2.0 2.0 250 ns ns ns ns ns ns MHz Units AC Operating Requirements can Test Operation, over recommended operating supply voltage and temperature ranges unless otherwise specified Symbol Parameter All Options TA = −40˚C to +85˚C CL = 30 pF, RL = 500Ω to GND Guaranteed Minimum tS tH tS tH tW tW fmax tREC Setup Time, H or L, TMS to TCK Hold Time, H or L, TCK to TMS Setup Time, H or L, TDI to TCK Hold Time, H or L, TCK to TDI Pulse Width TCK High or Low Pulse Width TRST, Low Maximum TCK Clock Frequency Recovery Time, TRST to TCK 2.0 1.0 1.0 2.0 10 2.5 25 2.0 ns ns ns ns ns ns MHz ns Units 7 www.national.com SCAN16512 AC Loading and Waveforms 20026614 FIGURE 1. AC Test Circuit (CL includes probe and jig capacitance) VI VCC * 2 CL 30pF 20026610 20026611 Waveform for Inverting and Non-inverting Functions Tristate Output High Enable and Disable Times for Logic 20026613 Tristate Output Low Enable and Disable Times for Logic 20026612 Propagation Delay, Pulse Width and tREC Waveforms FIGURE 2. Timing Waveforms (Input Characteristics; f = 1MHz, tr = tf = 2.5ns) VCC 2.7 - 3.6V 1.5V 1.5V VOL + 0.3V VOH - 0.3V Symbol Vmi Vmo Vx Vy www.national.com 8 SCAN16512 Capacitance and I/O Characteristics Refer to National’s website for IBIS models at http://www.national.com/scan Device ID Register Ordering Code SCAN16512SM SCANH16512SM SCAN162512SM SCANH162512SM Features No bus hold, no series resistor With bus hold only With 25Ω series resistors in outputs With 25Ω series resistors and bus hold Device ID FC30 FC31 FC32 FC33 Manufacturer & LSB 01F 01F 01F 01F 9 www.national.com SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs Physical Dimensions Physical Dimensions unless otherwise noted inches (millimeters) 64-Lead Ball Grid Array Package Order Number SCAN16512SM, SCANH16512SM, SCAN162512SM, SCANH162512SM NS Package Number SLC64A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation Americas Email: support@nsc.com National Semiconductor Europe Fax: +49 (0) 180-530 85 86 Email: europe.support@nsc.com Deutsch Tel: +49 (0) 69 9508 6208 English Tel: +44 (0) 870 24 0 2171 Français Tel: +33 (0) 1 41 91 8790 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Asia Pacific Customer Response Group Tel: 65-2544466 Fax: 65-2504466 Email: ap.support@nsc.com National Semiconductor Japan Ltd. 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